CN218445577U

CN218445577U - Semiconductor device test seat with adhesive surface

Info

Publication number: CN218445577U
Application number: CN202221843984.6U
Authority: CN
Inventors: 卢彦; 卢朝; 卢小品; 栗帅
Original assignee: Kunshan Jieyuxing Precision Machinery Co ltd
Current assignee: Kunshan Jieyuxing Precision Machinery Co ltd
Priority date: 2022-07-18
Filing date: 2022-07-18
Publication date: 2023-02-03
Anticipated expiration: 2032-07-18

Abstract

The utility model discloses a semiconductor device test seat with a stickable surface, which comprises a base, wherein the upper end of the base is connected with a soft pad, the surface of the soft pad is provided with a placing hole, the two ends of the soft pad are connected with a clamping hook, the inside of the base is connected with a clamping block, the upper end of the base is connected with an X-direction slide rail, the upper end of the X-direction slide rail is connected with a Y-direction slide rail, the upper end of the X-direction slide rail is connected with an X-direction limiting block, the upper end of the Y-direction slide rail is connected with a Y-direction limiting block, the two ends of the Y-direction slide rail are connected with a first knob, the upper end of the Y-direction slide rail is connected with a slide seat, one end of the slide seat is connected with an extension plate, and the upper end of the slide seat is connected with a second knob; the utility model discloses in, through slip Y to slide rail and slide, can conveniently change the position of block rubber, come to carry out the centre gripping to semiconductor device, applicable in the semiconductor device of equidimension specification not, secondly semiconductor device can steadily put in the top of soft backing plate, conveniently detects semiconductor device.

Description

Semiconductor device test seat with adhesive surface

Technical Field

The utility model relates to a semiconductor testing field especially relates to a semiconductor device test seat that surface can paste.

Background

The semiconductor is one of the most commonly used electronic components in electronic products, and the semiconductor refers to a material with the conductivity between a conductor and an insulator at normal temperature, has wide application in the electronic and electrical industry, and is an indispensable electronic component for industrial production intellectualization.

There are the following problems:

for the existing semiconductor device test seat, the semiconductor device is not convenient to be flatly placed on the test seat, the subsequent detection is possibly inconvenient, and secondly, the semiconductor device test seat is not convenient to adjust and only can be used for a single product or a part of products, so that the applicability of the equipment is low.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the defects existing in the prior art and providing a semiconductor device testing seat with a surface capable of being pasted.

In order to achieve the above purpose, the utility model adopts the following technical scheme: the utility model provides a semiconductor device test seat that surface can paste, includes the base, the upper end of base is connected with soft backing plate, the surface of soft backing plate is provided with the arrangement hole, the both ends of soft backing plate are connected with the trip, the internal connection of base has the fixture block, the upper end of base is connected with X to the slide rail, X is connected with Y to the slide rail to the upper end of slide rail, X is connected with X to the stopper to the upper end of slide rail, Y is connected with Y to the stopper to the upper end of slide rail, Y is connected with first knob to the both ends of slide rail, Y is connected with the slide to the upper end of slide rail, the one end of slide is connected with the extension board, the upper end of slide is connected with the second knob, the upper end of extension board is connected with the third knob, the bottom of third knob is connected with the block rubber.

As a further description of the above technical solution:

the upper end joint of base is at the both ends of soft backing plate, the both ends fixed connection of soft backing plate is in the one end of trip, the quantity of trip has four groups.

As a further description of the above technical solution:

the number of the placing holes is provided with a plurality of groups, the placing holes are distributed in an array mode about the surface of the soft base plate, one end of the clamping hook is clamped at the bottom end of the clamping block, and the number of the clamping blocks is four.

As a further description of the above technical solution:

the upper end fixed connection of base is in X to the bottom of slide rail, X has two sets ofly to the quantity of slide rail, X is to the bottom of Y to the upper end sliding connection of slide rail, Y has two sets ofly to the quantity of slide rail.

As a further description of the above technical solution:

y is to the upper end sliding connection of slide rail in the bottom of slide, there are four groups in the quantity of slide, the inboard fixed connection of slide is in the one end of extension board.

As a further description of the above technical solution:

x is to the bottom of the upper end fixed connection of slide rail X to the stopper, Y is to the bottom of the upper end fixed connection of slide rail Y to the stopper, the upper end threaded connection of extension board is in the one end of third knob, the bottom fixed connection of third knob is in the upper end of block rubber.

As a further description of the above technical solution:

the Y is to the one end of both ends threaded connection at first knob of slide rail, the upper end threaded connection of slide is in the bottom of second knob, the quantity of second knob has four groups, the quantity of first knob has four groups.

Compared with the prior art, the beneficial effects of the utility model are that:

on original basis, through slip Y to slide rail and slide, can conveniently change the position of block rubber, come to carry out the centre gripping to semiconductor device, applicable in the semiconductor device of different size specifications, secondly semiconductor device can steadily put in the top of soft backing plate, conveniently detects semiconductor device.

Drawings

Fig. 1 is a schematic view of an overall structure of a semiconductor device test socket with a surface-attachable structure according to the present invention;

fig. 2 is a schematic diagram of a hook clamping of a semiconductor device test socket with a surface capable of being stuck according to the present invention;

fig. 3 is an enlarged effect diagram of the area a of the semiconductor device test socket with a surface capable of being pasted according to the present invention.

Illustration of the drawings:

1. a base; 2. a soft cushion plate; 3. placing the hole; 4. a rubber block; 5. a hook is clamped; 6. a clamping block; 7. an X-direction slide rail; 8. a Y-direction slide rail; 9. a slide base; 10. an extension plate; 11. a first knob; 12. a second knob; 13. a third knob; 14. an X-direction limiting block; 15. y is to the stopper.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts all belong to the protection scope of the present invention.

In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance, and furthermore, unless otherwise explicitly stated or limited, the terms "mounted," "connected," and "connected" are to be construed broadly and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood as a specific case by those skilled in the art.

Referring to fig. 1-3, the present invention provides an embodiment: the utility model provides a semiconductor device test seat that surface can paste, including base 1, the upper end of base 1 is connected with soft backing plate 2, the surface of soft backing plate 2 is provided with arrangement hole 3, the both ends of soft backing plate 2 are connected with trip 5, the internal connection of base 1 has fixture block 6, the upper end of base 1 is connected with X to slide rail 7, X is connected with Y to slide rail 8 to the upper end of slide rail 7, X is connected with X to stopper 14 to the upper end of slide rail 7, Y is connected with Y to stopper 15 to the upper end of slide rail 8, Y is connected with first knob 11 to the both ends of slide rail 8, Y is connected with slide 9 to the upper end of slide rail 8, the one end of slide 9 is connected with extension board 10, the upper end of slide 9 is connected with second knob 12, the upper end of extension board 10 is connected with third knob 13, the bottom of third knob 13 is connected with block rubber 4.

The upper end of the base 1 is clamped at two ends of the soft cushion plate 2, two ends of the soft cushion plate 2 are fixedly connected at one end of the clamping hooks 5, the number of the clamping hooks 5 is four, wherein the clamping hooks 5 are used for clamping and fixing the soft cushion plate 2, and a semiconductor device is placed above the soft cushion plate 2; the number of the placing holes 3 is provided with a plurality of groups, the placing holes 3 are distributed in an array manner relative to the surface of the soft cushion plate 2, one end of the clamping hook 5 is clamped at the bottom end of the clamping block 6, the number of the clamping blocks 6 is four, the clamping block 6 finishes the clamping connection of the clamping hook 5, the placing holes 3 can accommodate the protruding part of a semiconductor device, and the semiconductor can be stably placed above the soft cushion plate 2; the upper end of the base 1 is fixedly connected to the bottom ends of the X-direction slide rails 7, the number of the X-direction slide rails 7 is two, the upper end of the X-direction slide rails 7 is slidably connected to the bottom ends of the Y-direction slide rails 8, the number of the Y-direction slide rails 8 is two, and the Y-direction slide rails 8 can slide under the action of the X-direction slide rails 7; the upper end of the Y-direction slide rail 8 is connected to the bottom end of the slide seat 9 in a sliding manner, four groups of slide seats 9 are arranged, the inner side of each slide seat 9 is fixedly connected to one end of the extension plate 10, and the slide seats 9 can slide under the action of the Y-direction slide rail 8; the upper end of the X-direction slide rail 7 is fixedly connected to the bottom end of the X-direction limiting block 14, the upper end of the Y-direction slide rail 8 is fixedly connected to the bottom end of the Y-direction limiting block 15, the upper end of the extension plate 10 is in threaded connection with one end of a third knob 13, the bottom end of the third knob 13 is fixedly connected to the upper end of the rubber block 4, the third knob 13 is used for driving the rubber block 4 to lift, the rubber block 4 is enabled to fix the semiconductor device, and the X-direction limiting block 14 and the Y-direction limiting block 15 play a role in limiting the Y-direction slide rail 8 and the slide seat 9; two ends of the Y-direction slide rail 8 are in threaded connection with one end of the first knob 11, the upper end of the slide carriage 9 is in threaded connection with the bottom end of the second knob 12, the number of the second knob 12 is four, the number of the first knob 11 is four, the first knob 11 plays a role in fixing the Y-direction slide rail 8, and the second knob 12 plays a role in fixing the slide carriage 9.

And (3) description of a work flow: place semiconductor device in the top of bolster 2, the convex part of its semiconductor can block in the inside of placing hole 3, let semiconductor device can steadily put on bolster 2, later according to semiconductor device's size, it fixes its Y to slide rail 8 and slide 9 to suitable position and rotate first knob 11 and second knob 12 to slide rail 8 and slide 9 to remove Y, rotate third knob 13 at last, drive the laminating of block rubber 4 in one side of semiconductor device, fix semiconductor device in the top of bolster 2, accomplish fixing to semiconductor device, after long-time use, the condition of deformation and damage can appear in bolster 2, press trip 5, it can to change to extract out bolster 2.

Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some technical features, and any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A surface-stickable semiconductor device test socket comprises a base (1), and is characterized in that: the utility model discloses a soft backing plate, including base (1), be connected with soft backing plate (2), the surface of soft backing plate (2) is provided with arrangement hole (3), the both ends of soft backing plate (2) are connected with trip (5), the internal connection of base (1) has fixture block (6), the upper end of base (1) is connected with X to slide rail (7), X is connected with Y to slide rail (8) to the upper end of slide rail (7), X is connected with X to stopper (14) to the upper end of slide rail (7), Y is connected with Y to stopper (15) to the upper end of slide rail (8), Y is connected with first knob (11) to the both ends of slide rail (8), Y is connected with slide (9) to the upper end of slide rail (8), the one end of slide (9) is connected with extension board (10), the upper end of slide (9) is connected with second knob (12), the upper end of extension board (10) is connected with third knob (13), the bottom of third knob (13) is connected with rubber block (4).

2. A surface-mountable semiconductor device test socket as defined in claim 1, wherein: the upper end joint of base (1) is at the both ends of soft backing plate (2), the both ends fixed connection of soft backing plate (2) is in the one end of trip (5), the quantity of trip (5) has four groups.

3. A surface-mountable semiconductor device test socket as claimed in claim 1, wherein: the number of the arrangement holes (3) is provided with a plurality of groups, the arrangement holes (3) are distributed in an array mode about the surface of the soft base plate (2), one end of the clamping hook (5) is clamped at the bottom end of the clamping block (6), and the number of the clamping blocks (6) is four.

4. A surface-mountable semiconductor device test socket as claimed in claim 1, wherein: the upper end fixed connection of base (1) is in X to the bottom of slide rail (7), X has two sets ofly to the quantity of slide rail (7), X is to the bottom of the upper end sliding connection of slide rail (7) Y to slide rail (8), Y has two sets ofly to the quantity of slide rail (8).

5. A surface-mountable semiconductor device test socket as claimed in claim 1, wherein: y is to the bottom of the upper end sliding connection of slide rail (8) in slide (9), the quantity of slide (9) has four groups, the inboard fixed connection of slide (9) is in the one end of extension board (10).

6. A surface-mountable semiconductor device test socket as claimed in claim 1, wherein: x is to the upper end fixed connection of slide rail (7) in X to the bottom of stopper (14), Y is to the upper end fixed connection of slide rail (8) in Y to the bottom of stopper (15), the upper end threaded connection of extension board (10) is in the one end of third knob (13), the bottom fixed connection of third knob (13) is in the upper end of block rubber (4).

7. A surface-mountable semiconductor device test socket as defined in claim 1, wherein: the Y is to the one end of both ends threaded connection in first knob (11) of slide rail (8), the upper end threaded connection of slide (9) is in the bottom of second knob (12), the quantity of second knob (12) has four groups, the quantity of first knob (11) has four groups.