CN218382904U - Chip detection clamp - Google Patents
Chip detection clamp Download PDFInfo
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- CN218382904U CN218382904U CN202221952852.7U CN202221952852U CN218382904U CN 218382904 U CN218382904 U CN 218382904U CN 202221952852 U CN202221952852 U CN 202221952852U CN 218382904 U CN218382904 U CN 218382904U
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Abstract
A chip detection clamp relates to the technical field of chip detection, and the adopted technical scheme comprises a shell, a test bottom plate, an installation base and a chip clamp, wherein the chip clamp comprises an installation groove arranged on the installation base, a needle seat, a floating seat and a chip limiting seat, which are sequentially arranged on the installation groove from bottom to top, a compression spring connected between the floating seat and the needle seat, a plurality of double-headed probes arranged on the needle seat, a shielding frame arranged on the installation base, a shielding cover hinged on the shielding frame, and a rotary pressing device arranged on the shielding cover, wherein the needle seat, the shielding frame and the shielding cover are all made of metal, and an insulating interlayer is arranged between the double-headed probes and the needle seat; the testing bottom plate is in signal connection with the SIM card seat and a signal testing interface. The utility model discloses whether can detect and wait to detect the chip and be the yields, can test moreover and wait to detect the received signal quality of chip.
Description
Technical Field
The utility model relates to a chip detects technical field, especially relates to a chip detects anchor clamps.
Background
With the development of the communication field, the 4G module has completely replaced the 2G module in the field of internet of things. Chip detection of the 4G module is an important process, but in current chip detection of the 4G module, the chip detection device only has the function of detecting whether a chip body is a good product or not, but does not have the function of testing the quality of radio frequency LTE and Bluetooth receiving signals of the chip.
SUMMERY OF THE UTILITY MODEL
Do not contain the problem to the test function of chip radio frequency LTE and bluetooth received signal quality among the prior art scheme, the utility model provides a chip detects anchor clamps.
The utility model provides a following technical scheme: a chip detection clamp comprises a shell, a testing bottom plate arranged in a groove in the top surface of the shell, an installation base arranged at the top of the shell and covering the testing bottom plate, and a chip clamp, wherein the chip clamp comprises an installation groove arranged on the installation base, a needle seat, a floating seat and a chip limiting seat which are sequentially arranged on the installation groove from bottom to top, a compression spring connected between the floating seat and the needle seat, a plurality of double-headed probes arranged on the needle seat, a shielding frame arranged on the installation base, a shielding cover hinged on the shielding frame, and a rotary pressing device arranged on the shielding cover; the outer walls of the floating seat and the chip limiting seat are in clearance fit with the inner wall of the shielding frame, the chip limiting seat is provided with a chip limiting groove, probe holes with the pore diameters larger than those of the double-headed probe are formed in the bottoms of the floating seat and the chip limiting groove, one end of the double-headed probe penetrates through the mounting groove to be in contact with the contact on the test bottom plate, and the other end of the double-headed probe corresponds to the probe holes; the needle seat, the shielding frame and the shielding cover are all made of metal, and an insulating interlayer is arranged between the double-head probe and the needle seat; the testing bottom plate is in signal connection with an SIM card seat and a signal testing interface, and the signal testing interface comprises a Bluetooth interface and an LTE interface.
Preferably, a retraction groove is formed at the intersection of two adjacent side walls of the chip limiting groove, and at least one side wall is provided with a taking and placing groove extending outwards.
Preferably, the double-ended probe is a double-ended spring probe.
Preferably, the rotary pressing device comprises a threaded through groove arranged on the shielding cover, a stud in threaded connection with the threaded through groove, a knob arranged at one end of the stud and a pressing block rotatably connected to the other end of the stud.
Preferably, the shielding cover is further rotatably connected with a buckle, and the shielding frame is provided with a bayonet corresponding to the buckle.
Preferably, the test base plate is further provided with a USB interface.
Preferably, the mounting base, the needle seat, the floating seat and the chip limiting seat are all provided with anti-reverse holes.
The beneficial effects of the utility model are that: the chip clamp can detect whether the chip to be detected is a good product or not, and can also test the quality of a received signal of the chip to be detected; the needle seat, the shielding frame and the shielding cover form a metal shell shielding layer, and after the metal shell shielding layer is grounded, external signals can be shielded, and interference on a chip to be detected is avoided.
Drawings
Fig. 1 is a three-dimensional schematic diagram of an embodiment of the present invention.
Fig. 2 is a top view of an embodiment of the present invention.
Fig. 3 is a side view of an embodiment of the present invention.
Fig. 4 is a top view of an embodiment of the housing of the present invention.
Fig. 5 is a top view of an embodiment of the mounting base of the present invention.
Fig. 6 is a top view of an embodiment of the needle holder of the present invention.
Fig. 7 is a top view of an embodiment of the floating platform of the present invention.
Fig. 8 is a top view of an embodiment of the chip spacing block of the present invention.
Reference numerals: 1-shell, 11-groove, 2-installation base, 21-installation groove, 3-needle seat, 31-double-head probe, 32-insulating layer, 4-floating seat, 5-chip limiting seat, 51-chip limiting groove, 52-probe hole, 53-indentation groove, 54-pick-and-place groove, 6-shielding frame, 7-shielding cover, 71-buckle, 8-rotary pressing device, 81-knob and 82-extrusion block.
Detailed Description
The embodiments of the present invention will be described in more detail below with reference to the accompanying drawings and reference numerals, so that those skilled in the art can implement the embodiments after studying the specification. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the invention.
The utility model provides a chip testing clamp as shown in figures 1-3, including casing 1, the test bottom plate of setting in casing 1 top surface recess 11, the installation base 2 and the chip anchor clamps that set up at casing 1 top and will test the bottom plate and cover. The shell 1 can be made of bakelite; the mounting base 2 can be made of glass fiber; the test bottom plate can adopt a PCBA board and is provided with a plurality of contacts corresponding to the chip contacts to be detected. As shown in fig. 4, the top surface of the casing 1 is fixed in the groove 11 by bolts, the mounting base 2 covers the groove, and the mounting groove 21 is a through groove to expose the contact corresponding to the chip to be tested on the testing bottom plate.
Chip anchor clamps are including setting up mounting groove 21 on the installation base 2, from supreme setting gradually down needle file 3 on the mounting groove 21, float seat 4 and the spacing seat of chip 5, connect the compression spring between float seat 4 and needle file 3, set up a plurality of double-end probes 31 on needle file 3 and set up shielding frame 6 on installation base 3, articulate shielding cover 7 on the shielding frame 6, set up rotatory push-down device 8 on shielding cover 7, float seat 4, the spacing seat of chip 5's outer wall with the inner wall clearance fit of shielding frame 6, the spacing seat of chip 5 is provided with chip spacing groove 51, float seat 4, chip spacing groove 51 bottom all are provided with the probe hole 52 that the aperture is greater than the double-end probe, the one end of double-end probe 31 pass mounting groove 21 with contact and the other end on the test bottom plate with probe hole 52 corresponds.
The double-headed probe 31 is used for connecting the testing bottom plate and the corresponding contact on the chip to be detected, and the plurality of double-headed probes 31 are integrated on the needle seat 3, so that the overhaul and the replacement are convenient. The floating seat 4 is connected with the needle seat 3 through a plurality of compression springs, when the compression springs are in a reset state, one end of the double-ended probe 31 is located in the probe hole 52 to play a role in protection, and when the chip limiting seat 5 and the floating seat 4 move towards the needle seat 3 under the pressure effect of the rotary pressing device 8, the double-ended probe 31 extends out of the probe hole 52 to be in contact with a contact of a chip to be detected, so that the chip to be detected and the test bottom plate are communicated. The chip limiting seat 5 is provided with a chip limiting groove 51 which is in clearance fit with the chip to be detected and is used for limiting the chip to be detected and preventing the chip to be detected from moving in the detection process. The floating seat 4 can be made of a quartz steel plate, and the chip limiting seat 5 can be made of polyphenylene sulfide (PPS). The mounting base 2, the needle seat 3, the floating seat 4 and the chip limiting seat 5 are respectively shown in figures 5 to 8.
The needle stand 3, the shielding frame 6 and the shielding cover 7 are all made of metal, and an insulating interlayer 32 is arranged between the double-headed probe 31 and the needle stand 3. Specifically, needle file 3, shielding frame 6 and shielding lid 7 can adopt the english steel sheet preparation, and when waiting to detect the chip and arrange chip spacing groove 51 in, shielding lid 7 closure is on shielding frame 6, and needle file 3, shielding frame 6 and shielding lid 7 form metal casing shielding layer, with its ground connection back, can shield external signal, avoid treating to detect the chip and cause the interference.
The signal testing device comprises a testing bottom plate and a testing base plate, wherein the testing bottom plate is in signal connection with an SIM card base and a signal testing interface, and the signal testing interface comprises a Bluetooth interface and an LTE interface and is used for testing the quality of a received signal of a chip to be tested. Specifically, the SIM card holder is used for inserting a SIM card, and is matched with LTE signal testing, and the SIM card holder may be arranged on a side wall of the housing 1; the Bluetooth interface and the LTE interface can be respectively inserted into a Bluetooth calibration radio frequency antenna and an LTE calibration radio frequency line and then are connected to a testing machine to test the quality of a received signal of a chip to be detected, and the testing machine can adopt a CMW500 type broadband wireless communication tester.
The utility model discloses when using, can at first will wait to detect the chip and put into chip spacing groove 51, then closed shielding lid 7 utilizes rotatory push-down device 8 will wait to detect chip, the spacing seat of chip 5, float seat 4 and press to needle file 3, makes double-end probe 31 protrusion probe hole and wait to detect the chip contact, makes and wait to detect chip and test bottom plate and accomplish the communication, treats the received signal quality who detects the chip by the test machine again and detects.
Preferably, a reduction groove 53 is formed at the intersection of two adjacent side walls of the chip limiting groove 51, and at least one side wall is provided with a taking and placing groove 54 extending outwards. The indentation groove 53 is used for preventing the collision between the four corners of the chip to be detected and the chip limiting groove 51 caused by the processing problem, and the picking and placing groove 54 is convenient for picking the chip to be detected.
Preferably, the double-ended probe is a double-ended spring probe. Both ends of the double-ended spring probe have telescopic capacity, can be better matched with the contact, and prevent the probe from not contacting with some contacts due to uneven contact surface caused by processing problems.
Preferably, the rotary pressing device 8 comprises a threaded through groove arranged on the shielding cover 7, a stud in threaded connection with the threaded through groove, a knob 81 arranged at one end of the stud, and a pressing block 82 rotatably connected at the other end of the stud. The knob 81 drives the stud to rotate, so that the extrusion block 82 is displaced along the axial direction of the stud.
Preferably, the shielding cover 7 is further rotatably connected with a buckle 71, and the shielding frame 6 is provided with a bayonet corresponding to the buckle 71 for fixing the shielding cover 7 on the shielding frame 6.
Preferably, the test base plate is further provided with a USB interface. The USB interface is connected to the testing machine through a USB cable, and whether the chip to be detected has production defects or not is tested so as to judge whether the chip to be detected is a good product or not.
Preferably, the mounting base 2, the needle seat 3, the floating seat 4 and the chip limiting seat 5 are all provided with anti-reverse holes to prevent reverse installation.
The foregoing is directed to one or more embodiments of the present invention, which are described in some detail and detail, but are not to be construed as limiting the scope of the invention. It should be noted that, for those skilled in the art, without departing from the concept of the present invention, several variations and modifications can be made, which all fall within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the appended claims.
Claims (7)
1. The utility model provides a chip detection anchor clamps, includes casing (1), sets up test bottom plate in casing (1) top surface recess (11), sets up at casing (1) top and with installation base (2) and the chip anchor clamps that test bottom plate covers, its characterized in that:
the chip clamp comprises a mounting groove (21) arranged on the mounting base (2), a needle seat (3), a floating seat (4) and a chip limiting seat (5) which are sequentially arranged on the mounting groove (21) from bottom to top, a compression spring connected between the floating seat (4) and the needle seat (3), a plurality of double-headed probes (31) arranged on the needle seat (3), a shielding frame (6) arranged on the mounting base (2), a shielding cover (7) hinged on the shielding frame (6), and a rotary pressing device (8) arranged on the shielding cover (7); the outer walls of the floating seat (4) and the chip limiting seat (5) are in clearance fit with the inner wall of the shielding frame (6), the chip limiting seat (5) is provided with a chip limiting groove (51), probe holes (52) with the aperture larger than that of a double-ended probe are arranged at the bottoms of the floating seat (4) and the chip limiting groove (51), one end of the double-ended probe (31) penetrates through the mounting groove (21) to be in contact with a contact on the test bottom plate, and the other end of the double-ended probe corresponds to the probe holes (52); the needle seat (3), the shielding frame (6) and the shielding cover (7) are all made of metal, and an insulating interlayer (32) is arranged between the double-head probe (31) and the needle seat (3);
the testing bottom plate is in signal connection with an SIM card seat and a signal testing interface, and the signal testing interface comprises a Bluetooth interface and an LTE interface.
2. The chip detection jig of claim 1, wherein: an indentation groove (53) is arranged at the intersection of two adjacent side walls of the chip limiting groove (51), and a taking and placing groove (54) extending outwards is arranged on at least one side wall.
3. The chip detection jig according to claim 1, wherein: the double-ended probe is a double-ended spring probe.
4. The chip detection jig of claim 1, wherein: the rotary pressing device (8) comprises a threaded through groove arranged on the shielding cover (7), a stud in threaded connection with the threaded through groove, a knob (81) arranged at one end of the stud and an extrusion block (82) rotatably connected to the other end of the stud.
5. The chip detection jig according to claim 1, wherein: the shielding cover (7) is further rotatably connected with a buckle (71), and the shielding frame (6) is provided with a bayonet corresponding to the buckle (71).
6. The chip detection jig of claim 1, wherein: the test bottom plate is also provided with a USB interface.
7. The chip detection jig of claim 1, wherein: the mounting base (2), the needle seat (3), the floating seat (4) and the chip limiting seat (5) are all provided with anti-reverse holes.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN202221952852.7U CN218382904U (en) | 2022-07-27 | 2022-07-27 | Chip detection clamp |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN202221952852.7U CN218382904U (en) | 2022-07-27 | 2022-07-27 | Chip detection clamp |
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CN218382904U true CN218382904U (en) | 2023-01-24 |
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CN202221952852.7U Active CN218382904U (en) | 2022-07-27 | 2022-07-27 | Chip detection clamp |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117092491A (en) * | 2023-10-18 | 2023-11-21 | 苏州微飞半导体有限公司 | Chip test seat applied to large-order pins and manufacturing method |
-
2022
- 2022-07-27 CN CN202221952852.7U patent/CN218382904U/en active Active
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117092491A (en) * | 2023-10-18 | 2023-11-21 | 苏州微飞半导体有限公司 | Chip test seat applied to large-order pins and manufacturing method |
CN117092491B (en) * | 2023-10-18 | 2024-04-05 | 苏州微飞半导体有限公司 | Chip test seat applied to large-order pins and manufacturing method |
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