CN203786165U - Passive near-field test probe - Google Patents
Passive near-field test probe Download PDFInfo
- Publication number
- CN203786165U CN203786165U CN201420116673.9U CN201420116673U CN203786165U CN 203786165 U CN203786165 U CN 203786165U CN 201420116673 U CN201420116673 U CN 201420116673U CN 203786165 U CN203786165 U CN 203786165U
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- CN
- China
- Prior art keywords
- probe
- field test
- concentric cable
- pcb board
- passive near
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model discloses a passive near-field test probe, belonging to the technical field of EMC near-field test. The passive near-field test probe comprises a probe body, a PCB, a coaxial cable and a shielding housing, wherein the probe body is fixed at the front end of the PCB, and comprises a probe sleeve and a probe head; a spring is mounted in the probe sleeve, and one end of the probe head presses the spring; the coaxial cable is connected to the rear end of the PCB; and the PCB is positioned in the shielding housing, and provided with a coupling capacitor through which the probe body is connected with the coaxial cable. The passive near-field test probe is simple in structure, convenient, practical, and easy to manually manufacture or industrially product; and in an EMC rectification test, the probe makes contact with an object to be tested to determine the network which generates radiation.
Description
Technical field
The utility model relates to EMC near-field test technical field, specifically a kind of passive near-field test probe.
Background technology
At present, EMC near-field test is an effectively method of location EMC radiation source, but the near-field test instrument using mostly at present is, answers formula probe.This probe is by electromagnetic induction, tests its external radiation event in the situation that not contacting measurand; So can only locate radiation source in certain region with this probe, and cannot judge definitely the radiation that specifically that network produces.
Summary of the invention
For above-mentioned technical matters, for can better locating the place of radiation source, specifically find the network that produces radiation, the utility model provides a kind of passive near-field test probe.
The utility model is achieved through the following technical solutions: a kind of passive near-field test probe, comprises probe, pcb board, concentric cable and screening can; Described probe is fixed on pcb board front end, and probe comprises needle guard and syringe needle; In described needle guard, spring is housed, syringe needle one end is pressed on spring; Described concentric cable is connected to pcb board rear end; Described pcb board is positioned at screening can, which is provided with the coupling capacitance of linking probe and concentric cable.
It is further: the heart yearn of described concentric cable is welded in coupling capacitance, and the screen layer of concentric cable is welded on the ground wire of PCB.
Described screening can is metal shell, and its outside surface is provided with insulation course; Together with the screen layer of screening can and concentric cable is crimped on; The place that described probe contacts with shield shell is provided with insulation sleeve.
This apparatus structure is simple, convenient and practical, is easy to make by hand or commercial production; This device is popped one's head in and is contacted with measured object in EMC rectification test, can judge the radiation that specifically that network produces.
Accompanying drawing explanation
Fig. 1 is the utility model structural representation.
In figure: 1, probe; 11, needle guard; 12, syringe needle; 13, spring; 2, pcb board; 21, coupling capacitance; 3, concentric cable; 31, heart yearn; 32, screen layer; 4, shield shell.
Embodiment
Be below a specific embodiment of the present utility model, now by reference to the accompanying drawings the utility model be described further.
As shown in Figure 1, a kind of passive near-field test probe, comprises probe 1, pcb board 2, concentric cable 3 and screening can 4; Described probe 1 is fixed on pcb board 2 front ends, and probe 1 comprises needle guard 11 and syringe needle 12; In described needle guard 11, spring 13 is housed, syringe needle 12 one end are pressed on spring 13, after syringe needle 12 is pressed on measured object, spring 13 compressions, making has certain pressure between measured point and probe 1, guarantee that contact is good, spring 13 has again the effect of compensator or trimmer pressure simultaneously, has avoided overexerting probe 1 is damaged; Described concentric cable 3 is connected to pcb board 2 rear ends; Described pcb board 2 is positioned at screening can 4, which is provided with the coupling capacitance 21 of linking probe 1 and concentric cable 3, pcb board mainly works to install all parts, and coupling capacitance 21 plays the electrical noise of the tested network of coupling on the one hand, is transferred to spectrum analyzer for test; Block on the other hand the flip-flop on tested network, prevent that spectrum analyzer from damaging; Because the electric capacity of different capacitances is different to the decay of different frequency, in order to obtain sensitivity better, for different noise frequencies, can adopt different capacitances.
The heart yearn 31 of concentric cable 3 is welded in coupling capacitance 21, and the screen layer 32 of concentric cable 3 is welded on the ground wire of pcb board 2, and concentric cable 3, for connecting PCB board 2 and spectrum analyzer, plays signal transmitting effect.
Screening can 4 is metal shells, plays the effect of shielding and protection main element, and its outside surface is provided with insulation course, while preventing from using, contacts with the direct of human body; Together with the screen layer 32 of screening can 4 and concentric cable 3 is crimped on; Described probe 1 is provided with insulation sleeve with the place that shield shell 4 contacts, and prevents short circuit between shield shell 4 and probe 1.
Claims (3)
1. a passive near-field test probe, comprises probe (1), pcb board (2), concentric cable (3) and screening can (4); It is characterized in that: described probe (1) is fixed on pcb board (2) front end, probe (1) comprises needle guard (11) and syringe needle (12); Spring (13) is housed in described needle guard (11), and syringe needle (12) one end is pressed on spring (13); Described concentric cable (3) is connected to pcb board (2) rear end; Described pcb board (2) is positioned at screening can (4), which is provided with the coupling capacitance (21) of linking probe (1) and concentric cable (3).
2. passive near-field test probe according to claim 1, is characterized in that: it is upper that the heart yearn (31) of described concentric cable (3) is welded on coupling capacitance (21), and the screen layer (32) of concentric cable (3) is welded on the ground wire of pcb board (2).
3. passive near-field test probe according to claim 2, is characterized in that: described screening can (4) is metal shell, and its outside surface is provided with insulation course; The screen layer (32) of screening can (4) and concentric cable (3) is crimped on together; Described probe (1) is provided with insulation sleeve with the place that shield shell (4) contacts.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420116673.9U CN203786165U (en) | 2014-03-14 | 2014-03-14 | Passive near-field test probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420116673.9U CN203786165U (en) | 2014-03-14 | 2014-03-14 | Passive near-field test probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203786165U true CN203786165U (en) | 2014-08-20 |
Family
ID=51322339
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420116673.9U Expired - Fee Related CN203786165U (en) | 2014-03-14 | 2014-03-14 | Passive near-field test probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203786165U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106093597A (en) * | 2016-05-28 | 2016-11-09 | 河北工业大学 | Utilize the photo-electric electric field near field probes that printed circuit board makes |
| CN107703386A (en) * | 2017-09-27 | 2018-02-16 | 深圳市科卫泰实业发展有限公司 | A kind of method for measuring product E MC problem particular locations |
-
2014
- 2014-03-14 CN CN201420116673.9U patent/CN203786165U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106093597A (en) * | 2016-05-28 | 2016-11-09 | 河北工业大学 | Utilize the photo-electric electric field near field probes that printed circuit board makes |
| CN106093597B (en) * | 2016-05-28 | 2018-08-17 | 河北工业大学 | The photo-electric electric field near field probes made using printed circuit board |
| CN107703386A (en) * | 2017-09-27 | 2018-02-16 | 深圳市科卫泰实业发展有限公司 | A kind of method for measuring product E MC problem particular locations |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140820 Termination date: 20200314 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |