CN218382889U

CN218382889U - Adjustable antenna chip flip test socket

Info

Publication number: CN218382889U
Application number: CN202220944512.3U
Authority: CN
Inventors: 王伟君; 钟程程; 白伟; 赵达君; 朱渊
Original assignee: Shanghai Xinyiheng Technology Co ltd
Current assignee: Shanghai Xinyiheng Technology Co ltd
Priority date: 2022-04-22
Filing date: 2022-04-22
Publication date: 2023-01-24
Anticipated expiration: 2032-04-22

Abstract

The utility model provides an adjustable antenna chip inverted test socket, which comprises a first test part (1) and a second test part (2); the first test part (1) is internally provided with a first circuit board (101) and a test antenna (202), the first circuit board (101) is provided with a first connecting terminal (102) connected with a test machine circuit, and the first test part (1) is also internally provided with a chip slot; a second circuit board (201) is arranged in the second testing part (2); the second circuit board (201) is provided with a second connecting terminal used for being connected with the first connecting terminal (102) and a third connecting terminal (203) used for being connected with a tested chip circuit; the test antenna (202) is arranged at the bottom of the chip slot and has a gap (204) with the chip slot.

Description

Adjustable antenna chip flip test socket

Technical Field

The utility model relates to a chip testing technique field, concretely relates to antenna chip flip-chip test socket with adjustable.

Background

In 5G millimeter wave communication, an antenna and a chip body are packaged into a whole to form a current potential technical route, the test of the packaging form is different from the traditional contact test, a new test fixture is needed to realize an empty test, and the empty test fixture has a great influence on the quality and the production cost of a final product.

In the prior art, the packaging mode is one-side welding disc and one-side antenna array, the welding disc surface needs to be tested for power supply signals and the like, and the antenna surface is used for receiving and transmitting the near-far field of the antenna. It is the testing that the chip is just being tested to be common in the industry, and the test is put directly over to the antenna, though can satisfy some test requirements, but the volume production environment is difficult general, and the transformation cost is high.

Therefore, a chip flip test socket is urgently needed, which can realize mass production test of chips and can ensure the consistency of receiving and sending tests.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing an antenna chip flip-chip test socket with adjustable.

The utility model provides an adjustable antenna chip flip test socket, which comprises a first test part (1) and a second test part (2); a first circuit board (101) and a test antenna (202) are arranged in the first test part (1), a first connecting terminal (102) which is connected with a test machine circuit is arranged on the first circuit board (101), and a chip slot is also arranged in the first test part (1); a second circuit board (201) is arranged in the second testing part (2); the second circuit board (201) is provided with a second connecting terminal used for being connected with the first connecting terminal (102) and a third connecting terminal (203) used for being connected with a tested chip circuit; the test antenna (202) is arranged at the bottom of the chip slot and has a gap (204) with the chip slot. The chip slot comprises a slot frame (103), a filling block (107) and a filling support frame (106); a first groove (104) is formed in the top of the slot frame (103), a second groove (105) is formed in the bottom of the slot frame (103), and the first groove (104) is communicated with the second groove (105); the filling support frame (106) is fixed in the second groove (105), and the filling block (107) is fixed in a space enclosed by the filling support frame (106). The utility model provides an adjustable antenna chip flip-chip test socket still is equipped with a suction cup formula arm (not shown in the figure). The second test section (2) further comprises a housing (205), the housing (205) being arranged on top of the second circuit board (201). A plurality of elastic gaskets (206) which are uniformly distributed are arranged between the shell (205) and the second circuit board (201). The casing (205) is equipped with first through-hole (207), be equipped with second through-hole (208) on second circuit board (201), first through-hole (207) and second through-hole (208) all with the central point of first recess (104) put coaxial setting. The area of the filling block (107) is larger than the area of the first groove (104). The first test part (1) further comprises a wave-absorbing sponge (108), and the wave-absorbing sponge (108) is rectangular and square and fixed at the bottom of the first circuit board (101).

The utility model provides an antenna chip flip-chip test socket with adjustable, the beneficial effect who brings: 1. the problem of space limitation during the antenna near-far field volume production test is solved;

2. making air blowing holes in the space around the socket probe for high and low temperature test;

3. when the structure relates to multi-level signal transmission, the flatness and consistency of chip compression joint during testing can be ensured through the floating adjustment of the gasket or the spring

Drawings

Fig. 1 is a front view of an adjustable antenna chip flip test socket according to the present invention;

fig. 2 is a front view of a side chip of the adjustable antenna chip flip test socket of the present invention;

fig. 3 is a top view of the antenna under test of the side chip of the adjustable antenna chip flip test socket according to the present invention;

fig. 4 is a top view of the package pad of the side chip of the adjustable antenna chip flip test socket according to the present invention;

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

As shown in fig. 1 to 4, the present embodiment provides an adjustable antenna chip flip-chip test socket, which includes a first test part (1) and a second test part (2); a first circuit board (101) and a test antenna (202) are arranged in the first test part (1), a first connecting terminal (102) which is connected with a test machine circuit is arranged on the first circuit board (101), and a chip slot is also arranged in the first test part (1); a second circuit board (201) is arranged in the second testing part (2); the second circuit board (201) is provided with a second connecting terminal used for being connected with the first connecting terminal (102) and a third connecting terminal (203) used for being connected with a tested chip circuit; the test antenna (202) is arranged at the bottom of the chip slot and has a gap (204) with the chip slot. Those skilled in the art can understand that the adjustable antenna chip flip test socket provided in the embodiment can be used for testing a tested antenna (301) packaged in a chip, and since a gap (204) is formed between a chip socket and a test antenna (202), the test antenna (202) and the tested chip can transmit signals to each other to realize an air interface test. As can be understood by those skilled in the art, the antenna is usually packaged at the side far away from the packaging pad (302) of the chip, so that during testing, the chip is placed in a chip slot in a mode that the antenna (301) to be tested faces downwards and the packaging pad (302) faces upwards, then the second testing part (2) is covered and pressed on the top of the first testing part (1), and the chip and the first circuit board (101) are electrically connected with the second circuit board (201) through the packaging pad (302) and the third connecting terminal (203); the second circuit board (201) is in circuit connection with the first circuit board (101) through the second connecting terminal and the first connecting terminal, and therefore circuit connection between the chip and the testing machine is finally achieved.

Further, the chip slot comprises a slot frame (103), a filling block (107) and a filling support frame (106); a first groove (104) is formed in the top of the slot frame (103), a second groove (105) is formed in the bottom of the slot frame (103), and the first groove (104) is communicated with the second groove (105); the filling support frame (106) is fixed in the second groove (105), and the filling block (107) is fixed in a space enclosed by the filling support frame (106). As can be understood by those skilled in the art, the first groove (104) is used for accommodating a chip to be tested, the second groove (105) is used for accommodating a supporting frame and a filling block (107), the gap (204) is located between the filling block (107) and the test antenna (202), the gap (204) is a test clearance area, and the thickness of the filling block (107) and the size of the clearance area can be configured according to test requirements. As can be appreciated by those skilled in the art, the present embodiment provides an adjustable antenna chip flip-chip test socket, and the size of the gap (204) can be adjusted by adjusting the position of the test antenna (202), so as to achieve the effect of adjusting the size of the clearance area and adjusting the near-far field test distance. As can be understood by those skilled in the art, the support frame can also be arranged below the first circuit board (101). As will be understood by those skilled in the art, the filling block (107) is formed by filling a material with a low dielectric constant, and is used for supporting the chip under test on one hand and minimizing the signal attenuation between the antenna under test (301) and the test antenna (202) on the other hand, thereby ensuring the test accuracy. Those skilled in the art will appreciate that the antenna under test (301) and the antenna under test (202) may each be a patch antenna, a microstrip antenna, or other antenna packaged on a chip; the package pad may be a solder ball or a gold-plated pad.

Further, the adjustable antenna chip flip test socket provided in this embodiment further includes a chuck type mechanical arm (not shown in the figure). As can be appreciated by those skilled in the art, the package pads (302) are disposed along a periphery near the edge of the chip, and the inside surrounded by the package pads (302) is a relatively flat surface of the chip, and the suction cup on the robot arm can be used to suck the position to realize that the chip is taken out of the sorting machine and placed in the first groove (104) for testing.

Further, the second testing part (2) further comprises a shell (205), and the shell (205) is arranged on the top of the second circuit board (201). As will be appreciated by those skilled in the art, the housing (205) serves to support and protect the second circuit board (201).

Furthermore, a plurality of elastic gaskets (206) which are uniformly distributed are arranged between the shell (205) and the second circuit board (201). Those skilled in the art will appreciate that the adjustment by the resilient pads (206) ensures flatness and consistency of the die crimp during testing. It will be understood by those skilled in the art that the resilient pad may be replaced with a spring.

Furthermore, the shell (205) is provided with a first through hole (207), the second circuit board (201) is provided with a second through hole (208), and the first through hole (207) and the second through hole (208) are coaxially arranged with the center of the first groove (104). As will be understood by those skilled in the art, a pipeline for introducing gas with a set temperature can be inserted into the first through hole (207) and the second through hole (208), so that the gas can be blown onto the chip, and the adjustable antenna chip flip-chip test socket provided by the embodiment can be used for performing high-temperature and low-temperature tests on the chip.

Further, the area of the filling block (107) is larger than that of the first groove (104). As can be understood by those skilled in the art, the supporting and anti-attenuation effects are better, and in addition, only low dielectric constant materials and air are ensured to be arranged in the radiation angle of the chip antenna, and no other materials influence the transmission quality of the antenna.

Furthermore, the first test part (1) further comprises a wave-absorbing sponge (108), and the wave-absorbing sponge (108) is rectangular and square and fixed at the bottom of the first circuit board (101). As can be understood by those skilled in the art, the wave-absorbing foam is arranged to absorb the emitted signal waves diffused to the periphery and prevent the reflection of the emitted signal waves from influencing the test precision, so that the test precision is improved.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art will understand that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention in its corresponding aspects.

Claims

1. An adjustable antenna chip flip-chip test socket is characterized by comprising a first test part (1) and a second test part (2); a first circuit board (101) and a test antenna (202) are arranged in the first test part (1), a first connecting terminal (102) which is connected with a test machine circuit is arranged on the first circuit board (101), and a chip slot is also arranged in the first test part (1); a second circuit board (201) is arranged in the second testing part (2); the second circuit board (201) is provided with a second connecting terminal used for being connected with the first connecting terminal (102) and a third connecting terminal (203) used for being connected with a tested chip circuit; the test antenna (202) is arranged at the bottom of the chip slot and has a gap (204) with the chip slot.

2. The adjustable antenna chip flip-chip test socket of claim 1, wherein the chip socket comprises a socket bezel (103), a fill block (107), and a fill support shelf (106); a first groove (104) is formed in the top of the slot frame (103), a second groove (105) is formed in the bottom of the slot frame (103), and the first groove (104) is communicated with the second groove (105); the filling support frame (106) is fixed in the second groove (105), and the filling block (107) is fixed in a space enclosed by the filling support frame (106).

3. The adjustable antenna chip flip test socket of claim 2, further comprising a chuck type mechanical arm.

4. The adjustable antenna chip flip-chip test socket according to claim 3, characterized in that the second test part (2) further comprises a housing (205), the housing (205) being arranged on top of the second circuit board (201).

5. The adjustable antenna chip flip-chip test socket according to claim 4, wherein a plurality of uniformly arranged resilient pads (206) are provided between the housing (205) and the second circuit board (201).

6. The adjustable antenna chip flip-chip test socket according to claim 5, wherein the housing (205) is provided with a first through hole (207), the second circuit board (201) is provided with a second through hole (208), and the first through hole (207) and the second through hole (208) are coaxially arranged with a center position of the first groove (104).

7. The adjustable antenna chip flip-chip test socket of claim 6, wherein the area of the filler block (107) is larger than the area of the first recess (104).

8. The adjustable antenna chip flip-chip test socket according to claim 7, wherein the first test part (1) further comprises a wave-absorbing sponge (108), and the wave-absorbing sponge (108) is rectangular and square and fixed on the bottom of the first circuit board (101).