CN217981680U

CN217981680U - Capacitor testing device

Info

Publication number: CN217981680U
Application number: CN202221705252.0U
Authority: CN
Inventors: 陶志勇; 杨神龙; 张廷珏; 何武
Original assignee: Changsha Huilaishi Intelligent Technology Co ltd
Current assignee: Hubei Huilaishi Intelligent Equipment Co ltd
Priority date: 2022-07-04
Filing date: 2022-07-04
Publication date: 2022-12-06
Anticipated expiration: 2032-07-04

Abstract

The utility model discloses a capacitor testing arrangement, include: a capacitor tray and a test unit; the capacitor material tray comprises a material tray main body, a first material tray probe assembly and a second material tray probe assembly, wherein the first material tray probe assembly and the second material tray probe assembly are arranged on two opposite sides of the material tray main body; the test unit comprises a charging test mechanism, an electric leakage test mechanism and a discharging test mechanism, the charging test mechanism, the electric leakage test mechanism and the discharging test mechanism are sequentially arranged along a preset direction, the charging test mechanism comprises a first probe assembly and a second probe assembly arranged at an interval with the first probe assembly, the electric leakage test mechanism comprises a third probe assembly and a fourth probe assembly arranged at an interval with the third probe assembly, and the discharging test mechanism comprises a fifth probe assembly and a sixth probe assembly arranged at an interval with the fifth probe assembly. The capacitor testing device can improve the working efficiency of the charging test, the discharging test and the electric leakage test of the capacitor.

Description

Capacitor testing device

Technical Field

The utility model relates to a condenser production technical field, in particular to condenser testing arrangement.

Background

In the field of capacitor production technology, a conventional capacitor testing device usually puts a single capacitor into a three-in-one mold for charging, discharging and leakage tests to complete the charging, discharging and leakage tests. A single capacitor takes more than five minutes to complete the entire process, resulting in inefficiencies in completing the entire process.

SUMMERY OF THE UTILITY MODEL

The utility model discloses aim at solving one of the technical problem that exists among the prior art at least. Therefore, the utility model provides a capacitor testing device can improve the work efficiency of the test procedure that charges, the test procedure that discharges and the electric leakage test procedure of condenser.

According to the utility model discloses capacitor testing arrangement, include: a capacitor tray and a test unit; the capacitor tray comprises a tray main body, a first tray probe assembly and a second tray probe assembly, wherein the first tray probe assembly and the second tray probe assembly are arranged on two opposite sides of the tray main body; the testing unit comprises a charging testing mechanism, an electric leakage testing mechanism and a discharging testing mechanism, wherein the charging testing mechanism, the electric leakage testing mechanism and the discharging testing mechanism are sequentially arranged along a preset direction, the charging testing mechanism comprises a first probe assembly and a second probe assembly arranged at an interval with the first probe assembly, the electric leakage testing mechanism comprises a third probe assembly and a fourth probe assembly arranged at an interval with the third probe assembly, and the discharging testing mechanism comprises a fifth probe assembly and a sixth probe assembly arranged at an interval with the fifth probe assembly; wherein, the condenser charging tray can be followed predetermine the direction and arrive in proper order and charge test station, electric leakage test station and discharge test station the condenser charging tray reachs under the condition of test station charges, first charging tray probe assembly with first probe subassembly contact, second charging tray probe assembly with second probe subassembly contact the condenser charging tray reachs under the condition of electric leakage test station, first charging tray probe assembly with third probe subassembly contact, second charging tray probe assembly with fourth probe subassembly contact the condenser charging tray reachs under the condition of test station discharges, first charging tray probe assembly with fifth probe subassembly contact, second charging tray probe assembly with sixth probe subassembly contact.

According to the utility model discloses capacitor testing arrangement has following beneficial effect at least:

in the capacitor testing device, when the capacitor needs to be tested, the capacitor is inserted into the tray main body, and then the capacitor tray can sequentially reach the charging testing station, the electric leakage testing station and the discharging testing station along the preset direction, so that the capacitor can be tested. When the capacitor charging tray reaches the charging test station, the first charging tray probe assembly of the capacitor charging tray can be in contact with the first probe assembly of the charging test mechanism, so that the first charging tray probe assembly of the capacitor charging tray is electrified, the second charging tray probe assembly of the capacitor charging tray can be in contact with the second probe assembly of the charging test mechanism, so that the second charging tray probe assembly of the capacitor charging tray is electrified, and therefore a current path can be formed when the capacitor charging tray reaches the charging test station, so that the positive electrode and the negative electrode of the capacitor are electrified, and at the moment, the capacitor can be subjected to charging test on the charging test station. When the capacitor charging tray reaches the electric leakage testing station, the first charging tray probe assembly of the capacitor charging tray can be in contact with the third probe assembly of the electric leakage testing mechanism, so that the first charging tray probe assembly of the capacitor charging tray is electrified, the second charging tray probe assembly of the capacitor charging tray can be in contact with the fourth probe assembly of the electric leakage testing mechanism, so that the second charging tray probe assembly of the capacitor charging tray is electrified, and therefore a current path can be formed when the capacitor charging tray reaches the electric leakage testing station, so that the positive electrode and the negative electrode of the capacitor are electrified, and at the moment, the electric leakage testing of the capacitor can be carried out on the electric leakage testing station. When the capacitor charging tray reaches the discharging test station, the first charging tray probe assembly of the capacitor charging tray can be in contact with the fifth probe assembly of the discharging test mechanism, so that the first charging tray probe assembly of the capacitor charging tray is electrified, the second charging tray probe assembly of the capacitor charging tray can be in contact with the sixth probe assembly of the discharging test mechanism, so that the second charging tray probe assembly of the capacitor charging tray is electrified, a current path can be formed when the capacitor charging tray reaches the discharging test station, so that the positive electrode and the negative electrode of the capacitor are electrified, and at the moment, the capacitor can be subjected to discharging test on the discharging test station. Thus, the charging test, the leakage test and the discharging test of the capacitor can be completed.

In the process, as the charging test mechanism, the leakage test mechanism and the discharging test mechanism are sequentially arranged along the preset direction, when the charging test, the leakage test and the discharging test are carried out on the capacitor, when one capacitor finishes the charging test, the charging test station can be released to enable the next capacitor to carry out the charging test, similarly, when one capacitor finishes the leakage test, the leakage test station can be released to enable the next capacitor to carry out the leakage test, when one capacitor finishes the discharging test, the discharging test station can be released to enable the next capacitor to carry out the discharging test, and in the whole test process, the staying time of the capacitor on each test station can be reduced, so that the working efficiency of the charging test procedure, the discharging test procedure and the leakage test procedure of the capacitor can be improved.

According to some embodiments of the present invention, the charging test mechanism further comprises a first driving assembly, the first driving assembly is in driving connection with the first probe assembly, and the first driving assembly is used for driving the first probe assembly to approach or depart from the first tray probe assembly when the capacitor tray reaches the charging test station;

the charging test mechanism further comprises a second driving assembly, the second driving assembly is in driving connection with the second probe assembly, and the second driving assembly is used for driving the second probe assembly to be close to or far away from the second tray probe assembly when the capacitor tray reaches the charging test station.

According to some embodiments of the utility model, first probe subassembly includes first probe mounting and a plurality of first probe, first probe mounting with first drive assembly drive is connected, and is a plurality of first probe is followed predetermine the direction and arrange on the first probe mounting, first charging tray probe subassembly includes a plurality of first charging tray probes, and is a plurality of first charging tray probe is followed predetermine the direction and arrange one side of charging tray main part the condenser charging tray reachs under the condition of the test station that charges, every first probe and every first charging tray probe one-to-one, just first drive assembly is used for the drive first probe mounting is close to or keeps away from the condenser charging tray.

According to some embodiments of the utility model, the second probe subassembly includes second probe mounting and a plurality of second probe, the second probe mounting with the drive of second drive assembly is connected, and is a plurality of the second probe is followed preset direction arranges on the second probe mounting, the second charging tray probe subassembly with the first charging tray probe subassembly along with preset direction vertically direction side by side and interval setting, the second charging tray probe subassembly includes a plurality of second charging tray probes, and is a plurality of the second charging tray probe is followed preset direction arranges the condenser charging tray is kept away from one side of first charging tray probe subassembly under the condition of charging test station, every the second probe with every the second charging tray probe one-to-one, just the second drive assembly is used for the drive the second probe mounting is close to or keeps away from the condenser charging tray.

According to some embodiments of the present invention, the leakage testing mechanism further comprises a third driving assembly, the third driving assembly is in driving connection with the third probe assembly, and the third driving assembly is used for driving the third probe assembly to approach or leave the first tray probe assembly when the capacitor tray reaches the leakage testing station;

the electric leakage test mechanism further comprises a fourth driving assembly, the fourth driving assembly is in driving connection with the fourth probe assembly, the capacitor material disc reaches under the condition of the electric leakage test station, the fourth driving assembly is used for driving the fourth probe assembly to be close to or far away from the second material disc probe assembly.

According to some embodiments of the utility model, the third probe subassembly includes third probe mounting and a plurality of third probe, third probe mounting is connected with the drive of third drive assembly, and is a plurality of the third probe is followed preset direction arranges on the third probe mounting, first charging tray probe subassembly includes a plurality of first charging tray probes, and is a plurality of first charging tray probe is followed preset direction arranges one side of condenser charging tray the condenser charging tray reachs under the condition of electric leakage test station, every third probe and every first charging tray probe one-to-one, just third drive assembly is used for the drive third probe mounting is close to or keeps away from the condenser charging tray.

According to some embodiments of the utility model, the fourth probe subassembly includes fourth probe mounting and a plurality of fourth probe spare, the fourth probe mounting with fourth drive assembly drive is connected, and is a plurality of fourth probe spare is followed preset direction arranges on the fourth probe mounting, second charging tray probe subassembly with first charging tray probe subassembly along with preset direction vertically direction side by side and interval setting, second charging tray probe subassembly includes a plurality of second charging tray probes, and is a plurality of second charging tray probe is followed preset direction arranges one side of first charging tray probe subassembly is kept away from to the condenser charging tray reachs under the condition of electric leakage test station, every fourth probe spare and every second charging tray probe one-to-one, just fourth drive assembly is used for the drive the fourth probe mounting is close to or keeps away from the condenser charging tray.

According to some embodiments of the present invention, the discharge testing mechanism further comprises a fifth driving assembly, the fifth driving assembly is in driving connection with the fifth probe assembly, and the fifth driving assembly is used for driving the fifth probe assembly to approach or be away from the first tray probe assembly when the capacitor tray reaches the discharge testing station;

the discharge testing mechanism further comprises a sixth driving assembly, the sixth driving assembly is in driving connection with the sixth probe assembly, and the sixth driving assembly is used for driving the sixth probe assembly to be close to or far away from the second tray probe assembly when the capacitor tray reaches the discharge testing station.

According to some embodiments of the utility model, the fifth probe subassembly includes fifth probe mounting and a plurality of fifth probe, fifth probe mounting is connected with the drive of fifth drive assembly, and is a plurality of the fifth probe is followed preset direction arranges on the fifth probe mounting, first charging tray probe subassembly includes a plurality of first charging tray probes, and is a plurality of first charging tray probe is followed preset direction arranges one side of condenser charging tray the condenser charging tray reachs under the condition of discharge test station, every fifth probe and every first charging tray probe one-to-one, just fifth drive assembly is used for the drive fifth probe mounting is close to or keeps away from the condenser charging tray.

According to some embodiments of the utility model, sixth probe subassembly includes sixth probe mounting and a plurality of sixth probe, sixth probe mounting with sixth drive assembly drive is connected, and is a plurality of the sixth probe is followed predetermine the direction and arrange on the sixth probe mounting, second charging tray probe subassembly with first charging tray probe subassembly along with predetermine direction vertically direction and parallel and interval setting, second charging tray probe subassembly includes a plurality of second charging tray probes, and is a plurality of the second charging tray probe is followed predetermine the direction and arrange the condenser charging tray is kept away from one side of first charging tray probe subassembly the condenser charging tray reachs under the condition of discharge test station, every sixth probe and every the second charging tray probe one-to-one, just sixth drive assembly is used for the drive the sixth probe mounting is close to or keeps away from the condenser charging tray.

Drawings

The invention will be further described with reference to the following drawings and examples, in which:

fig. 1 is a schematic structural diagram of a capacitor testing apparatus according to an embodiment of the present invention;

fig. 2 is a schematic structural diagram of a charging test mechanism according to an embodiment of the present invention;

fig. 3 is a schematic structural diagram of a leakage test mechanism according to an embodiment of the present invention;

fig. 4 is a schematic structural diagram of a discharge testing mechanism according to an embodiment of the present invention;

fig. 5 is a schematic structural diagram of a capacitor tray according to an embodiment of the present invention.

Reference numerals:

100. a capacitor tray; 110. a tray main body; 120. a first tray probe assembly; 121. a first tray probe; 130. a second tray probe assembly; 131. a second tray probe; 140. a capacitor jack;

200. a charging test mechanism; 210. a first probe assembly; 211. a first probe fixing member; 212. a first probe; 220. a second probe assembly; 221. a second probe fixing member; 222. a second probe; 230. a first drive assembly; 231. a first driving member; 232. a first connecting member; 240. a second drive assembly; 241. a second driving member; 242. a second connecting member;

300. a leakage test mechanism; 310. a third probe assembly; 311. a third probe fixing member; 312. a third probe; 320. a fourth probe assembly; 321. a fourth probe fixing member; 322. a fourth probe; 330. a third drive assembly; 331. a third driving member; 332. a third connecting member; 340. a fourth drive assembly; 341. a fourth drive; 342. a fourth connecting member;

400. a discharge test mechanism; 410. a fifth probe assembly; 411. a fifth probe fixing member; 412. a fifth probe; 420. a sixth probe assembly; 421. a sixth probe fixing member; 422. a sixth probe; 430. a fifth drive assembly; 431. a fifth driving member; 432. a fifth connecting member; 440. a sixth drive assembly; 441. a sixth driving member; 442. and a sixth connecting member.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary only for the purpose of explaining the present invention, and should not be construed as limiting the present invention.

In the description of the present invention, it should be understood that the orientation or positional relationship referred to in the description of the orientation, such as the upper and lower directions, is the orientation or positional relationship shown on the drawings, and is only for convenience of description and simplification of description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed in a specific orientation, and be operated, and therefore should not be construed as limiting the present invention.

In the description of the present invention, a plurality means two or more. If the first and second are described for the purpose of distinguishing technical features, they are not to be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.

In the description of the present invention, unless there is an explicit limitation, the words such as setting, installation, connection, etc. should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above words in combination with the specific contents of the technical solution.

Referring to fig. 1 and 5, the present invention provides a capacitor testing apparatus, including: a capacitor tray 100 and a test unit.

Specifically, the capacitor tray 100 includes a tray main body 110, a first tray probe assembly 120, and a second tray probe assembly 130, the first tray probe assembly 120 and the second tray probe assembly 130 being disposed on opposite sides of the tray main body 110; the testing unit comprises a charging testing mechanism 200, an electric leakage testing mechanism 300 and a discharging testing mechanism 400, wherein the charging testing mechanism 200, the electric leakage testing mechanism 300 and the discharging testing mechanism 400 are sequentially arranged along a preset direction, the charging testing mechanism 200 comprises a first probe assembly 210 and a second probe assembly 220 arranged at intervals with the first probe assembly 210, the electric leakage testing mechanism 300 comprises a third probe assembly 310 and a fourth probe assembly 320 arranged at intervals with the third probe assembly 310, and the discharging testing mechanism 400 comprises a fifth probe assembly 410 and a sixth probe assembly 420 arranged at intervals with the fifth probe assembly 410; the capacitor tray 100 can sequentially reach a charging test station, an electric leakage test station and a discharging test station along a preset direction, when the capacitor tray 100 reaches the charging test station, the first tray probe assembly 120 is in contact with the first probe assembly 210, the second tray probe assembly 130 is in contact with the second probe assembly 220, when the capacitor tray 100 reaches the electric leakage test station, the first tray probe assembly 120 is in contact with the third probe assembly 310, the second tray probe assembly 130 is in contact with the fourth probe assembly 320, when the capacitor tray 100 reaches the discharging test station, the first tray probe assembly 120 is in contact with the fifth probe assembly 410, and the second tray probe assembly 130 is in contact with the sixth probe assembly 420.

Further, the capacitor testing apparatus further includes a conveying device (not shown), and the capacitor tray 100 can sequentially reach the charging testing station, the leakage testing station, and the discharging testing station on the conveying device along a preset direction.

Wherein the conveying means may be a conveyor belt.

Specifically, the predetermined direction is the direction indicated by X in fig. 1.

Further, the capacitor tray 100 further includes a capacitor socket 140, and when the capacitor needs to be tested, the capacitor can be inserted into the capacitor socket 140, so that the positive electrode of the capacitor is electrically conductive with the positive electrode of the capacitor socket 140.

In the capacitor testing device, when the capacitor needs to be tested, the capacitor is inserted into the tray main body 110, and then the capacitor tray 100 can sequentially reach the charging testing station, the leakage testing station and the discharging testing station along the preset direction, so that the capacitor can be tested. When the capacitor tray 100 reaches the charging test station, the first tray probe assembly 120 of the capacitor tray 100 can contact with the first probe assembly 210 of the charging test mechanism 200, so that the first tray probe assembly 120 of the capacitor tray 100 is electrified, the second tray probe assembly 130 of the capacitor tray 100 can contact with the second probe assembly 220 of the charging test mechanism 200, so that the second tray probe assembly 130 of the capacitor tray 100 is electrified, and thus, a current path can be formed when the capacitor tray 100 reaches the charging test station, so that the positive electrode and the negative electrode of the capacitor are electrified, and at the moment, the charging test of the capacitor can be carried out on the charging test station. When the capacitor tray 100 reaches the electric leakage testing station, the first tray probe assembly 120 of the capacitor tray 100 can contact with the third probe assembly 310 of the electric leakage testing mechanism 300, so that the first tray probe assembly 120 of the capacitor tray 100 is electrified, the second tray probe assembly 130 of the capacitor tray 100 can contact with the fourth probe assembly 320 of the electric leakage testing mechanism 300, so that the second tray probe assembly 130 of the capacitor tray 100 is electrified, and therefore, a current path can be formed when the capacitor tray 100 reaches the electric leakage testing station, so that the positive electrode and the negative electrode of the capacitor are electrified, and at the moment, the electric leakage test of the capacitor can be carried out on the electric leakage testing station. When the capacitor tray 100 reaches the discharging test station, the first tray probe assembly 120 of the capacitor tray 100 can contact with the fifth probe assembly 410 of the discharging test mechanism 400, so that the first tray probe assembly 120 of the capacitor tray 100 is electrified, the second tray probe assembly 130 of the capacitor tray 100 can contact with the sixth probe assembly 420 of the discharging test mechanism 400, so that the second tray probe assembly 130 of the capacitor tray 100 is electrified, and thus, a current path can be formed when the capacitor tray 100 reaches the discharging test station, so that the positive electrode and the negative electrode of the capacitor are electrified, and at the moment, the discharging test of the capacitor can be carried out on the discharging test station. Thus, the charging test, the leakage test and the discharging test of the capacitor can be completed.

In this process, since the charging test mechanism 200, the leakage test mechanism 300, and the discharging test mechanism 400 are sequentially arranged along the preset direction, when a capacitor is subjected to the charging test, the leakage test, and the discharging test, when one capacitor completes the charging test, the charging test station can be released, so that the next capacitor can perform the charging test, similarly, when one capacitor completes the leakage test, the leakage test station can be released, so that the next capacitor can perform the leakage test, and when one capacitor completes the discharging test, the discharging test station can be released, so that the next capacitor can perform the discharging test.

Referring to fig. 1 and 2, it can be understood that the charging test mechanism 200 further includes a first driving assembly 230, the first driving assembly 230 is in driving connection with the first probe assembly 210, and the first driving assembly 230 is used for driving the first probe assembly 210 to be close to or far from the first tray probe assembly 120 when the capacitor tray 100 reaches the charging test station; the charging test mechanism 200 further includes a second drive assembly 240, the second drive assembly 240 being drivingly connected to the second probe assembly 220, the second drive assembly 240 being configured to drive the second probe assembly 220 toward or away from the second tray probe assembly 130 upon the capacitor tray 100 reaching the charging test station.

Thus, when the capacitor needs to be charged and tested, the capacitor is inserted into the tray main body 110, and then the capacitor tray 100 can sequentially reach the charging test station along the preset direction, at this time, the first driving assembly 230 can be used for driving the first probe assembly 210 to be close to the first tray probe assembly 120, so that the first probe assembly 210 is in contact with the first tray probe assembly 120, the first tray probe assembly 120 of the capacitor tray 100 is powered, and meanwhile, the second driving assembly 240 is used for driving the second probe assembly 220 to be close to the second tray probe assembly 130, so that the second probe assembly 220 is in contact with the second tray probe assembly 130, and the second tray probe assembly 130 of the capacitor tray 100 is powered. At this time, the capacitor tray 100 can form a current path when it reaches the charging test station to energize the positive and negative electrodes of the capacitor so that the capacitor can be subjected to a charging test at the charging test station.

When the capacitor completes the charging test, the first probe assembly 210 is driven by the first driving assembly 230 to be away from the first tray probe assembly 120, so that the first probe assembly 210 is separated from the first tray probe assembly 120, so that the first tray probe assembly 120 of the capacitor tray 100 loses power, and the second probe assembly 220 is driven by the second driving assembly 240 to be away from the second tray probe assembly 130, so that the second probe assembly 220 is separated from the second tray probe assembly 130, so that the second tray probe assembly 130 of the capacitor tray 100 loses power. After the first probe assembly 210 is disengaged from the first tray probe assembly 120 and the second probe assembly 220 is disengaged from the second tray probe assembly 130, the capacitor tray 100 can leave the charging test station and enter the leakage test station in a predetermined direction.

Referring to fig. 1 and 2, it can be understood that the first probe assembly 210 includes a first probe fixing member 211 and a plurality of first probes 212, the first probe fixing member 211 is connected to the first driving assembly 230 in a driving manner, the plurality of first probes 212 are arranged on the first probe fixing member 211 along a preset direction, the first tray probe assembly 120 includes a plurality of first tray probes 121, the plurality of first tray probes 121 are arranged on one side of the tray main body 110 along the preset direction, when the capacitor tray 100 reaches the charging test station, each first probe 212 corresponds to each first tray probe 121 one by one, and the first driving assembly 230 is configured to drive the first probe fixing member 211 to approach or leave the capacitor tray 100.

Specifically, the first driving assembly 230 includes a first driving member 231 and a first connecting member 232, and the first connecting member 232 is fixedly connected to the first driving member 231 and the first probe fixing member 211, respectively.

More specifically, the first driving member 231 is a cylinder, and the first connecting member 232 is fixedly connected to a piston of the cylinder.

Thus, when the capacitor needs to be charged and tested, the capacitor is inserted into the tray main body 110, and then the capacitor tray 100 can sequentially reach the charging test station along the preset direction, at this time, the first driving member 231 can be utilized to drive the first connecting member 232 to be close to the first tray probe assembly 120, so that the first connecting member 232 drives the first probe fixing member 211 to be close to the first tray probe assembly 120, and thus the first probe fixing member 211 drives the plurality of first probes 212 to be close to the plurality of first tray probes 121 in a one-to-one correspondence manner, and each first probe 212 is in contact with each first tray probe 121, so that each first tray probe 121 of the capacitor tray 100 is powered.

When the capacitor completes the charging test, the first driving member 231 is used to drive the first connecting member 232 to be away from the first tray probe assembly 120, so that the first connecting member 232 drives the first probe fixing member 211 to be away from the first tray probe assembly 120, and the first probe fixing member 211 drives the plurality of first probes 212 to be away from the plurality of first tray probes 121, so that each first probe 212 is separated from each first tray probe 121, and each first tray probe 121 of the capacitor tray 100 loses power.

Referring to fig. 1 and 2, it can be understood that the second probe assembly 220 includes a second probe fixing member 221 and a plurality of second probes 222, the second probe fixing member 221 is connected to the second driving assembly 240 in a driving manner, the plurality of second probes 222 are arranged on the second probe fixing member 221 along a preset direction, the second tray probe assembly 130 and the first tray probe assembly 120 are arranged in parallel and at intervals along a direction perpendicular to the preset direction, the second tray probe assembly 130 includes a plurality of second tray probes 131, the plurality of second tray probes 131 are arranged on a side of the capacitor tray 100 away from the first tray probe assembly 120 along the preset direction, each second probe 222 corresponds to each second tray probe 131 one-to-one when the capacitor tray 100 reaches the charging test station, and the second driving assembly 240 is configured to drive the second probe fixing member 221 to approach or depart from the capacitor tray 100.

Specifically, the second driving assembly 240 includes a second driving member 241 and a second connecting member 242, and the second connecting member 242 is fixedly connected to the second driving member 241 and the second probe fixing member 221, respectively.

More specifically, the second driving member 241 is a cylinder, and the second connecting member 242 is fixedly connected to a piston of the cylinder.

Further, referring to fig. 2 and 5, 72 capacitor sockets 140 are provided on the capacitor tray 100, and 38 first tray probes 121 and 38 first probes 212 are provided; among the 38 first tray probes 121, there are 2 positive tray probes and 36 negative tray probes, among the 38 first probes 212, the first probe 212 corresponding to the 2 positive tray probes is electrified positively, and among the 38 first probes 212, the first probe 212 corresponding to the 36 negative tray probes is electrified negatively. 38 second tray probes 131 and second probes 222 are provided; among the 38 second tray probes 131, there are 2 positive tray probes and 36 negative tray probes, among the 38 second probes 222, the second probe 222 corresponding to the 2 positive tray probes is electrified positively, and among the 38 second probes 222, the second probe 222 corresponding to the 36 negative tray probes is electrified negatively. 2 anodal charging tray probes of first charging tray probe 121 and 2 anodal charging tray probes of second charging tray probe 131 establish ties 72 capacitor socket 140's positive pole, and 36 negative pole charging tray probes of 36 negative poles charging tray probes of first charging tray probe 121 and second charging tray probe 131 are connected with 72 capacitor socket 140's negative pole one-to-one. When the first probe 212 contacts with the first tray probe 121 and the second probe 222 contacts with the second tray probe 131, the positive electrodes and the negative electrodes of the 72 capacitor sockets 140 on the capacitor tray 100 are electrified.

In this way, the second driving member 241 drives the second connecting member 242 to be close to the second tray probe assembly 130, so that the second connecting member 242 drives the second probe fixing member 221 to be close to the second tray probe assembly 130, and thus the second probe fixing member 221 drives the plurality of second probes 222 to be close to the plurality of second tray probes 131 in a one-to-one correspondence manner, so that each second probe 222 is in contact with each second tray probe 131, and each second tray probe 131 of the capacitor tray 100 is powered. Therefore, when each first tray probe 121 of the capacitor tray 100 is electrified, each second tray probe 131 of the capacitor tray 100 is electrified, at the moment, a current path can be formed when the capacitor tray 100 reaches a charging test station, so that the positive electrode and the negative electrode of the capacitor are electrified, and the capacitor can be subjected to charging test on the charging test station.

The second driving member 241 can be used to drive the second connecting member 242 away from the second tray probe assembly 130, so that the second connecting member 242 drives the second probe fixing member 221 away from the second tray probe assembly 130, so that the second probe fixing member 221 drives the plurality of second probes 222 away from the plurality of second tray probes 131, and each second probe 222 is separated from each second tray probe 131, so that each second tray probe 131 of the capacitor tray 100 loses power. Therefore, when each first tray probe 121 of the capacitor tray 100 loses power, each second tray probe 131 of the capacitor tray 100 loses power, and the capacitor tray 100 can leave the charging test station and enter the electric leakage test station along the preset direction after the first probe 212 is separated from the first tray probe 121 and the second probe 222 is separated from the second tray probe 131.

Referring to fig. 1 and 3, it can be understood that the electrical leakage testing mechanism 300 further comprises a third driving assembly 330, the third driving assembly 330 is in driving connection with the third probe assembly 310, and the third driving assembly 330 is used for driving the third probe assembly 310 to be close to or far from the first tray probe assembly 120 when the capacitor tray 100 reaches the electrical leakage testing station; the creepage test mechanism 300 also includes a fourth drive assembly 340, the fourth drive assembly 340 being in driving connection with the fourth probe assembly 320, the fourth drive assembly 340 being for driving the fourth probe assembly 320 closer to or farther from the second tray probe assembly 130 with the capacitor tray 100 arriving at the creepage test station.

Thus, when the leakage test of the capacitor is required, the capacitor is inserted into the tray body 110, and then the capacitor tray 100 can sequentially reach the leakage test station along the preset direction, at this time, the third driving assembly 330 can be used to drive the third probe assembly 310 to be close to the first tray probe assembly 120, so that the third probe assembly 310 is in contact with the first tray probe assembly 120, so that the first tray probe assembly 120 of the capacitor tray 100 is powered, and meanwhile, the fourth driving assembly 340 is used to drive the fourth probe assembly 320 to be close to the second tray probe assembly 130, so that the fourth probe assembly 320 is in contact with the second tray probe assembly 130, so that the second tray probe assembly 130 of the capacitor tray 100 is powered. At this time, the capacitor tray 100 can form a current path when reaching the leakage testing station, so that the positive and negative electrodes of the capacitor are electrified, and the capacitor can be subjected to leakage testing on the leakage testing station.

When the capacitor completes the electrical leakage test, the third driving assembly 330 can be used to drive the third probe assembly 310 away from the first tray probe assembly 120, so that the third probe assembly 310 is separated from the first tray probe assembly 120, so that the first tray probe assembly 120 of the capacitor tray 100 loses power, and the fourth driving assembly 340 is used to drive the fourth probe assembly 320 away from the second tray probe assembly 130, so that the fourth probe assembly 320 is separated from the second tray probe assembly 130, so that the second tray probe assembly 130 of the capacitor tray 100 loses power. After the third probe assembly 310 disengages from the first tray probe assembly 120 and the fourth probe assembly 320 disengages from the second tray probe assembly 130, the capacitor tray 100 leaves the leakage test station and enters the discharge test station in a predetermined direction.

Referring to fig. 1 and 3, the third probe assembly 310 includes a third probe fixing member 311 and a plurality of third probes 312, the third probe fixing member 311 is in driving connection with a third driving assembly 330, the plurality of third probes 312 are arranged on the third probe fixing member 311 along a preset direction, the first tray probe assembly 120 includes a plurality of first tray probes 121, the plurality of first tray probes 121 are arranged on one side of the capacitor tray 100 along the preset direction, each third probe 312 corresponds to each first tray probe 121 one by one when the capacitor tray 100 reaches the leakage test station, and the third driving assembly 330 is used for driving the third probe fixing member 311 to approach or leave the capacitor tray 100.

Specifically, the third driving assembly 330 includes a third driving member 331 and a third connecting member 332, and the third connecting member 332 is fixedly connected to the third driving member 331 and the third probe fixing member 311, respectively.

More specifically, the third driving member 331 is a cylinder, and the third connecting member 332 is fixedly connected to a piston of the cylinder.

Thus, when the leakage test of the capacitor is required, the capacitor is inserted into the tray main body 110, and then the capacitor tray 100 can sequentially reach the leakage test station along the preset direction, at this time, the third driving member 331 can be utilized to drive the third connecting member 332 to be close to the first tray probe assembly 120, so that the third connecting member 332 drives the third probe fixing member 311 to be close to the first tray probe assembly 120, and thus the third probe fixing member 311 drives the plurality of third probes 312 to be close to the plurality of first tray probes 121 in a one-to-one correspondence manner, so that each third probe 312 is in contact with each first tray probe 121, and each first tray probe 121 of the capacitor tray 100 is powered on.

When the capacitor completes the leakage test, the third driving member 331 can be used to drive the third connecting member 332 to be away from the first tray probe assembly 120, so that the third connecting member 332 drives the third probe fixing member 311 to be away from the first tray probe assembly 120, and thus the third probe fixing member 311 drives the third probes 312 to be away from the first tray probes 121, and each third probe 312 is separated from each first tray probe 121, so that each first tray probe 121 of the capacitor tray 100 loses power.

Referring to fig. 1 and 3, it can be understood that the fourth probe assembly 320 includes a fourth probe fixing member 321 and a plurality of fourth probe 322 members, the fourth probe fixing member 321 is in driving connection with a fourth driving assembly 340, the plurality of fourth probe 322 members are arranged on the fourth probe fixing member 321 along a preset direction, the second tray probe assembly 130 and the first tray probe assembly 120 are arranged side by side and at intervals along a direction perpendicular to the preset direction, the second tray probe assembly 130 includes a plurality of second tray probes 131, the plurality of second tray probes 131 are arranged on a side of the capacitor tray 100 away from the first tray probe assembly 120 along the preset direction, each of the fourth probe 322 members corresponds to each of the second tray probes 131 one by one when the capacitor tray 100 reaches the electrical leakage test station, and the fourth driving assembly 340 is configured to drive the fourth probe fixing member 321 to approach or leave the capacitor tray 100.

Specifically, the fourth driving assembly 340 includes a fourth driving member 341 and a fourth connecting member 342, and the fourth connecting member 342 is fixedly connected to the fourth driving member 341 and the fourth probe fixing member 321, respectively.

More specifically, the fourth driving member 341 is a cylinder, and the fourth connecting member 342 is fixedly connected to a piston of the cylinder.

Further, as shown in fig. 3 and 5, there are 38 third probes 312, wherein the third probe 312 corresponding to 2 positive tray probes among the 38 third probes 312 is energized positively, and the third probe 312 corresponding to 36 negative tray probes among the 38 third probes 312 is energized negatively. The number of the fourth probes 322 is 38, wherein the fourth probe 322 corresponding to 2 positive tray probes in the 38 fourth probes 322 is electrified positively, and the fourth probe 322 corresponding to 36 negative tray probes in the 38 fourth probes 322 is electrified negatively. When the third probe 312 contacts with the first tray probe 121 and the fourth probe 322 contacts with the second tray probe 131, the positive electrodes and the negative electrodes of the 72 capacitor sockets 140 on the capacitor tray 100 are electrified.

In this way, the fourth driving member 341 drives the fourth connecting member 342 to approach the second tray probe assembly 130, so that the fourth connecting member 342 drives the fourth probe fixing member 321 to approach the second tray probe assembly 130, so that the fourth probe fixing member 321 drives the plurality of fourth probes 322 to approach the plurality of second tray probes 131 in a one-to-one correspondence manner, and each fourth probe 322 contacts with each second tray probe 131, so that each second tray probe 131 of the capacitor tray 100 is powered. Therefore, when each first tray probe 121 of the capacitor tray 100 is electrified, each second tray probe 131 of the capacitor tray 100 is electrified, at the moment, a current path can be formed when the capacitor tray 100 reaches the leakage testing station, so that the positive electrode and the negative electrode of the capacitor are electrified, and the capacitor can be subjected to leakage testing on the leakage testing station.

The fourth driving part 341 can be used to drive the fourth connecting part 342 away from the second tray probe assembly 130, so that the fourth connecting part 342 drives the fourth probe fixing part 321 away from the second tray probe assembly 130, so that the fourth probe fixing part 321 drives the plurality of fourth probes 322 away from the plurality of second tray probes 131, and each fourth probe 322 is separated from each second tray probe 131, so as to power down each second tray probe 131 of the capacitor tray 100. Therefore, when each first tray probe 121 of the capacitor tray 100 loses power, each second tray probe 131 of the capacitor tray 100 loses power, and the capacitor tray 100 can leave the electric leakage test station and enter the electric discharge test station along the preset direction after the third probe 312 is separated from the first tray probe 121 and the fourth probe 322 is separated from the second tray probe 131.

Referring to fig. 1 and 4, the discharging test mechanism 400 further includes a fifth driving assembly 430, the fifth driving assembly 430 is in driving connection with the fifth probe assembly 410, and the fifth driving assembly 430 is used for driving the fifth probe assembly 410 to be close to or far from the first tray probe assembly 120 when the capacitor tray 100 reaches the discharging test station; the discharge testing mechanism 400 further includes a sixth drive assembly 440, the sixth drive assembly 440 being in driving connection with the sixth probe assembly 420, the sixth drive assembly 440 being configured to drive the sixth probe assembly 420 closer to or farther from the second tray probe assembly 130 with the capacitor tray 100 arriving at the discharge testing station.

Thus, when the capacitor needs to be subjected to a discharge test, the capacitor is inserted into the tray main body 110, and then the capacitor tray 100 can sequentially reach a discharge test station along a preset direction, at this time, the fifth driving assembly 430 can be used for driving the fifth probe assembly 410 to be close to the first tray probe assembly 120, so that the fifth probe assembly 410 is in contact with the first tray probe assembly 120, the first tray probe assembly 120 of the capacitor tray 100 is powered, and meanwhile, the sixth driving assembly 440 is used for driving the sixth probe assembly 420 to be close to the second tray probe assembly 130, so that the sixth probe assembly 420 is in contact with the second tray probe assembly 130, and the second tray probe assembly 130 of the capacitor tray 100 is powered. At this time, the capacitor tray 100 can form a current path when reaching the discharge test station to electrify the positive and negative electrodes of the capacitor, so that the capacitor can be subjected to discharge test on the discharge test station.

When the capacitor completes the discharge test, the fifth probe assembly 410 is driven by the fifth driving assembly 430 to be away from the first tray probe assembly 120, so that the fifth probe assembly 410 is separated from the first tray probe assembly 120, so that the first tray probe assembly 120 of the capacitor tray 100 loses power, and the sixth probe assembly 420 is driven by the sixth driving assembly 440 to be away from the second tray probe assembly 130, so that the sixth probe assembly 420 is separated from the second tray probe assembly 130, so that the second tray probe assembly 130 of the capacitor tray 100 loses power. The capacitor tray 100 can exit the discharge test station after the fifth probe assembly 410 disengages from the first tray probe assembly 120 and the sixth probe assembly 420 disengages from the second tray probe assembly 130.

Referring to fig. 1 and 4, it can be understood that the fifth probe assembly 410 includes a fifth probe fixing member 411 and a plurality of fifth probes 412, the fifth probe fixing member 411 is connected to a fifth driving assembly 430 in a driving manner, the plurality of fifth probes 412 are arranged on the fifth probe fixing member 411 along a preset direction, the first tray probe assembly 120 includes a plurality of first tray probes 121, the plurality of first tray probes 121 are arranged on one side of the capacitor tray 100 along the preset direction, each of the fifth probes 412 corresponds to each of the first tray probes 121 one by one when the capacitor tray 100 reaches a discharging test station, and the fifth driving assembly 430 is configured to drive the fifth probe fixing member 411 to approach to or be away from the capacitor tray 100.

Specifically, the fifth driving assembly 430 includes a fifth driving member 431 and a fifth connecting member 432, and the fifth connecting member 432 is fixedly connected to the fifth driving member 431 and the fifth probe fixing member 411, respectively.

More specifically, the fifth driving member 431 is a cylinder, and the fifth connecting member 432 is fixedly connected to a piston of the cylinder.

Thus, when the capacitor needs to be subjected to a discharge test, the capacitor is inserted into the tray main body 110, and then the capacitor tray 100 can sequentially reach a discharge test station along a preset direction, at this time, the fifth driving member 431 can be used to drive the fifth connecting member 432 to be close to the first tray probe assembly 120, so that the fifth connecting member 432 drives the fifth probe fixing member 411 to be close to the first tray probe assembly 120, and thus the fifth probe fixing member 411 drives the plurality of fifth probes 412 to be close to the plurality of first tray probes 121 in a one-to-one correspondence manner, so that each fifth probe 412 is in contact with each first tray probe 121, and each first tray probe 121 of the capacitor tray 100 is powered on.

When the capacitor completes the discharge test, the fifth driving member 431 can be used to drive the fifth connecting member 432 to be away from the first tray probe assembly 120, so that the fifth connecting member 432 drives the fifth probe fixing member 411 to be away from the first tray probe assembly 120, so that the fifth probe fixing member 411 drives the fifth probes 412 to be away from the first tray probes 121, and each fifth probe 412 is separated from each first tray probe 121, so that each first tray probe 121 of the capacitor tray 100 loses power.

Referring to fig. 1 and 4, it can be understood that the sixth probe assembly 420 includes a sixth probe holder 421 and a plurality of sixth probes 422, the sixth probe holder 421 is connected to the sixth driving assembly 440 in a driving manner, the plurality of sixth probes 422 are arranged on the sixth probe holder 421 along a preset direction, the second tray probe assembly 130 and the first tray probe assembly 120 are arranged in parallel and at intervals along a direction perpendicular to the preset direction, the second tray probe assembly 130 includes a plurality of second tray probes 131, the plurality of second tray probes 131 are arranged on a side of the capacitor tray 100 away from the first tray probe assembly 120 along the preset direction, each of the sixth probes 422 corresponds to each of the second tray probes 131 one-to-one when the capacitor tray 100 reaches the discharge test station, and the sixth driving assembly 440 is configured to drive the sixth probe holder 421 to approach to or depart from the capacitor tray 100.

Specifically, the sixth driving assembly 440 includes a sixth driving element 441 and a sixth connecting element 442, and the sixth connecting element 442 is fixedly connected to the sixth driving element 441 and the sixth probe fixing element 421, respectively.

More specifically, the sixth driving member 441 is a cylinder, and the sixth connecting member 442 is fixedly connected to a piston of the cylinder.

Further, referring to fig. 3 and 5, there are 38 fifth probes 412, wherein the 38 fifth probes 412 corresponding to 2 positive tray probes are energized, and the 38 fifth probes 412 corresponding to 36 negative tray probes are energized. The number of the sixth probes 422 is 38, wherein the sixth probe 422 corresponding to 2 positive tray probes in the 38 sixth probes 422 is electrified positively, and the sixth probe 422 corresponding to 36 negative tray probes in the 38 sixth probes 422 is electrified negatively. When the fifth probe 412 contacts with the first tray probe 121 and the sixth probe 422 contacts with the second tray probe 131, the positive electrodes and the negative electrodes of the 72 capacitor sockets 140 on the capacitor tray 100 are electrified.

In this way, the sixth driving element 441 drives the sixth connecting element 442 to approach the second tray probe assembly 130, so that the sixth connecting element 442 drives the sixth probe fixing element 421 to approach the second tray probe assembly 130, and thus the sixth probe fixing element 421 drives the plurality of sixth probes 422 to approach the plurality of second tray probes 131 in a one-to-one correspondence manner, so that each sixth probe 422 contacts with each second tray probe 131, and each second tray probe 131 of the capacitor tray 100 is powered on. Therefore, when each first tray probe 121 of the capacitor tray 100 is electrified, each second tray probe 131 of the capacitor tray 100 is electrified, at the moment, a current path can be formed when the capacitor tray 100 reaches the discharging test station, so that the positive electrode and the negative electrode of the capacitor are electrified, and the discharging test of the capacitor can be carried out on the discharging test station.

The sixth driving member 441 can be used to drive the sixth connecting member 442 away from the second tray probe assembly 130, so that the sixth connecting member 442 drives the sixth probe fixing member 421 away from the second tray probe assembly 130, so that the sixth probe fixing member 421 drives the plurality of sixth probes 422 away from the plurality of second tray probes 131, so that each sixth probe 422 is separated from each second tray probe 131, and each second tray probe 131 of the capacitor tray 100 loses power. Therefore, when each first tray probe 121 of the capacitor tray 100 loses power, each second tray probe 131 of the capacitor tray 100 loses power, and the capacitor tray 100 can leave the discharge testing station after the fifth probe 412 is separated from the first tray probe 121 and the sixth probe 422 is separated from the second tray probe 131.

The working principle of the capacitor testing device is as follows: when the capacitor needs to be tested, the capacitor can be inserted into the capacitor jack 140 of the capacitor tray 100, and the capacitor tray 100 firstly enters the charging test station, at this time, the first driving assembly 230 is used to drive the first probe assembly 210 to be close to the first tray probe assembly 120, so that the first probe 212 of the first probe assembly 210 is in contact with the first tray probe 121 of the first tray probe assembly 120, so that the first tray probe 121 of the capacitor tray 100 is powered on the charging test station, and simultaneously, the second driving assembly 240 is used to drive the second probe assembly 220 to be close to the second tray probe assembly 130, so that the second probe 222 of the second probe assembly 220 is in contact with the second tray probe 131 of the second tray probe assembly 130, so that the second tray probe 131 of the capacitor tray 100 is powered on the charging test station. At this time, the capacitor tray 100 can form a current path when it reaches the charging test station to energize the positive and negative electrodes of the capacitor so that the capacitor can be subjected to a charging test at the charging test station. When the capacitor is subjected to a charging test on a charging test station, an external power supply (not shown) charges the capacitor, and meanwhile, an external electric quantity test instrument (not shown) monitors the electric quantity in the capacitor. When the capacitor is fully charged, the first probe assembly 210 is driven by the first driving assembly 230 to be away from the first tray probe assembly 120, so that the first probes 212 of the first probe assembly 210 are separated from the first tray probes 121 of the first tray probe assembly 120, so that the first tray probes 121 of the capacitor tray 100 are powered off, and the second probe assembly 220 is driven by the second driving assembly 240 to be away from the second tray probe assembly 130, so that the second probes 222 of the second probe assembly 220 are separated from the second tray probes 131 of the second tray probe assembly 130, so that the second tray probes 131 of the capacitor tray 100 are powered off. After the first probe 212 is separated from the first tray probe 121 and the second probe 222 is separated from the second tray probe 131, the capacitor tray 100 leaves the charging test station and enters the leakage test station along the preset direction.

After the capacitor tray 100 enters the electrical leakage testing station along the preset direction, the third driving assembly 330 is used to drive the third probe assembly 310 to approach the first tray probe assembly 120, so that the third probe 312 of the third probe assembly 310 contacts with the first tray probe 121 of the first tray probe assembly 120, so that the first tray probe 121 of the capacitor tray 100 gets power on the electrical leakage testing station, and the fourth driving assembly 340 is used to drive the fourth probe assembly 320 to approach the second tray probe assembly 130, so that the fourth probe 322 of the fourth probe assembly 320 contacts with the second tray probe 131 of the second tray probe assembly 130, so that the second tray probe 131 of the capacitor tray 100 gets power on the electrical leakage testing station. At this time, the capacitor tray 100 can form a current path when reaching the leakage testing station, so that the positive and negative electrodes of the capacitor are electrified, and the capacitor can be subjected to leakage testing on the leakage testing station. When the capacitor is subjected to leakage test on a leakage test station, an external leakage test instrument (not shown) monitors the leakage condition in the capacitor, if the capacitor has no leakage, the capacitor can enter a discharging test stage, and if the capacitor has the leakage condition, the capacitor enters a defective product hopper (not shown). When the capacitor completes the leakage test, the third driving assembly 330 can be used to drive the third probe assembly 310 to be away from the first tray probe assembly 120, so that the third probe 312 of the third probe assembly 310 is separated from the first tray probe 121 of the first tray probe assembly 120, so as to de-energize the first tray probe 121 of the capacitor tray 100, and the fourth driving assembly 340 is used to drive the fourth probe assembly 320 to be away from the second tray probe assembly 130, so that the fourth probe 322 of the fourth probe assembly 320 is separated from the second tray probe 131 of the second tray probe assembly 130, so as to de-energize the second tray probe 131 of the capacitor tray 100. After the third probe 312 is separated from the first tray probe 121 and the fourth probe 322 is separated from the second tray probe 131, the capacitor tray 100 is separated from the leakage testing station and enters the discharging testing station along the preset direction.

After the capacitor tray 100 enters the discharging test station along the preset direction, the fifth driving assembly 430 is used to drive the fifth probe assembly 410 to approach the first tray probe assembly 120, so that the fifth probe 412 of the fifth probe assembly 410 contacts with the first tray probe 121 of the first tray probe assembly 120, so that the first tray probe 121 of the capacitor tray 100 is powered on the discharging test station, and the sixth driving assembly 440 is used to drive the sixth probe assembly 420 to approach the second tray probe assembly 130, so that the sixth probe 422 of the sixth probe assembly 420 contacts with the second tray probe 131 of the second tray probe assembly 130, so that the second tray probe 131 of the capacitor tray 100 is powered on the discharging test station. At this time, the capacitor tray 100 can form a current path when reaching the discharge test station to electrify the positive and negative electrodes of the capacitor, so that the capacitor can be subjected to discharge test on the discharge test station. When the capacitor is subjected to a charging test at a charging test station, the capacitor is discharged by an external resistor (not shown), and meanwhile, the electric quantity in the capacitor is monitored by an external electric quantity test instrument (not shown). When the capacitor completes the discharge test, the fifth probe assembly 410 is driven by the fifth driving assembly 430 to be away from the first tray probe assembly 120, so that the fifth probe 412 of the fifth probe assembly 410 is separated from the first tray probe 121 of the first tray probe assembly 120, so that the first tray probe 121 of the capacitor tray 100 loses power, and the sixth probe assembly 420 is driven by the sixth driving assembly 440 to be away from the second tray probe assembly 130, so that the sixth probe 422 of the sixth probe assembly 420 is separated from the second tray probe 131 of the second tray probe assembly 130, so that the second tray probe 131 of the capacitor tray 100 loses power. The capacitor tray 100 can leave the discharge testing station after the fifth probe 412 disengages from the first tray probe 121 and the sixth probe 422 disengages from the second tray probe 131. Thus, the capacitor can complete the charging test, the discharging test and the electric leakage test.

The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made without departing from the spirit of the present invention within the knowledge of those skilled in the art.

Claims

1. A capacitor testing device is characterized by comprising a capacitor tray and a testing unit;

the capacitor tray comprises a tray main body, a first tray probe assembly and a second tray probe assembly, wherein the first tray probe assembly and the second tray probe assembly are arranged on two opposite sides of the tray main body;

the testing unit comprises a charging testing mechanism, an electric leakage testing mechanism and a discharging testing mechanism, the charging testing mechanism, the electric leakage testing mechanism and the discharging testing mechanism are sequentially arranged along a preset direction, the charging testing mechanism comprises a first probe assembly and a second probe assembly arranged at an interval with the first probe assembly, the electric leakage testing mechanism comprises a third probe assembly and a fourth probe assembly arranged at an interval with the third probe assembly, and the discharging testing mechanism comprises a fifth probe assembly and a sixth probe assembly arranged at an interval with the fifth probe assembly;

wherein, the condenser charging tray can be followed predetermine the direction and arrive in proper order and charge test station, electric leakage test station and discharge test station the condenser charging tray reachs under the condition of test station charges, first charging tray probe assembly with first probe subassembly contact, second charging tray probe assembly with second probe subassembly contact the condenser charging tray reachs under the condition of electric leakage test station, first charging tray probe assembly with third probe subassembly contact, second charging tray probe assembly with fourth probe subassembly contact the condenser charging tray reachs under the condition of test station discharges, first charging tray probe assembly with fifth probe subassembly contact, second charging tray probe assembly with sixth probe subassembly contact.

2. The capacitor testing apparatus of claim 1, wherein the charging test mechanism further comprises a first drive assembly in driving connection with the first probe assembly for driving the first probe assembly toward or away from the first tray probe assembly with the capacitor tray arriving at the charging test station;

3. The capacitor testing device according to claim 2, wherein the first probe assembly includes a first probe fixing member and a plurality of first probes, the first probe fixing member is in driving connection with the first driving assembly, the plurality of first probes are arranged on the first probe fixing member along the preset direction, the first tray probe assembly includes a plurality of first tray probes, the plurality of first tray probes are arranged on one side of the tray main body along the preset direction, each first probe corresponds to each first tray probe one-to-one when the capacitor tray reaches the charging test station, and the first driving assembly is used for driving the first probe fixing member to approach to or be away from the capacitor tray.

4. The capacitor testing device according to claim 2, wherein the second probe assembly includes a second probe holder and a plurality of second probes, the second probe holder is drivingly connected to the second driving assembly, the plurality of second probes are arranged on the second probe holder along the predetermined direction, the second tray probe assembly is juxtaposed and spaced from the first tray probe assembly along a direction perpendicular to the predetermined direction, the second tray probe assembly includes a plurality of second tray probes, the plurality of second tray probes are arranged on a side of the capacitor tray away from the first tray probe assembly along the predetermined direction, each of the plurality of second probes corresponds to each of the plurality of second tray probes one to one when the capacitor tray reaches the charging test station, and the second driving assembly is configured to drive the second probe holder to approach or leave the capacitor tray.

5. The capacitor testing apparatus of claim 1, wherein the electrical leakage testing mechanism further comprises a third drive assembly in driving connection with the third probe assembly for driving the third probe assembly closer to or farther from the first tray probe assembly with the capacitor tray reaching the electrical leakage testing station;

the leakage test mechanism further comprises a fourth driving assembly, the fourth driving assembly is in driving connection with the fourth probe assembly, and the fourth driving assembly is used for driving the fourth probe assembly to be close to or far away from the second tray probe assembly when the capacitor tray reaches the leakage test station.

6. The capacitor testing device according to claim 5, wherein the third probe assembly includes a third probe fixing member and a plurality of third probes, the third probe fixing member is drivingly connected to a third driving assembly, the plurality of third probes are arranged on the third probe fixing member along the preset direction, the first tray probe assembly includes a plurality of first tray probes, the plurality of first tray probes are arranged on one side of the capacitor tray along the preset direction, each of the third probes corresponds to each of the first tray probes one-to-one when the capacitor tray reaches the electrical leakage testing station, and the third driving assembly is configured to drive the third probe fixing member to approach to or be away from the capacitor tray.

7. The capacitor testing device according to claim 5, wherein the fourth probe assembly includes a fourth probe holder and a plurality of fourth probe pieces, the fourth probe holder is drivingly connected to the fourth driving assembly, the plurality of fourth probe pieces are arranged on the fourth probe holder along the predetermined direction, the second tray probe assembly and the first tray probe assembly are arranged in parallel and at an interval along a direction perpendicular to the predetermined direction, the second tray probe assembly includes a plurality of second tray probes, the plurality of second tray probes are arranged on a side of the capacitor tray away from the first tray probe assembly along the predetermined direction, each of the fourth probe pieces corresponds to each of the second tray probes in a one-to-one manner when the capacitor tray reaches the electrical leakage testing station, and the fourth driving assembly is configured to drive the fourth probe pieces to approach or depart from the capacitor tray.

8. The capacitor testing apparatus of claim 1, wherein the discharge testing mechanism further comprises a fifth drive assembly in driving connection with the fifth probe assembly for driving the fifth probe assembly toward or away from the first tray probe assembly with the capacitor tray arriving at the discharge testing station;

9. The capacitor testing device according to claim 8, wherein the fifth probe assembly includes a fifth probe fixing member and a plurality of fifth probes, the fifth probe fixing member is in driving connection with a fifth driving assembly, the plurality of fifth probes are arranged on the fifth probe fixing member along the preset direction, the first tray probe assembly includes a plurality of first tray probes, the plurality of first tray probes are arranged on one side of the capacitor tray along the preset direction, each fifth probe corresponds to each first tray probe one by one when the capacitor tray reaches the discharge testing station, and the fifth driving assembly is configured to drive the fifth probe fixing member to approach to or be away from the capacitor tray.

10. The capacitor testing device according to claim 8, wherein the sixth probe assembly includes a sixth probe holder and a plurality of sixth probes, the sixth probe holder is drivingly connected to the sixth driving assembly, the plurality of sixth probes are arranged on the sixth probe holder along the predetermined direction, the second tray probe assembly is juxtaposed and spaced from the first tray probe assembly along a direction perpendicular to the predetermined direction, the second tray probe assembly includes a plurality of second tray probes, the plurality of second tray probes are arranged on a side of the capacitor tray away from the first tray probe assembly along the predetermined direction, each of the sixth probes corresponds to each of the second tray probes one to one when the capacitor tray reaches the discharge testing station, and the sixth driving assembly is configured to drive the sixth probe holder to approach or separate from the capacitor tray.