CN217739259U - Integrated circuit test tool - Google Patents

Abstract

The utility model discloses an integrated circuit test fixture, the limiting plate and the first hold-down mechanism of this integrated circuit test fixture all set up in first supporting seat, and the limiting plate can limit the position of circuit board, and first test panel slides and sets up in first supporting seat, and first hold-down mechanism can compress tightly first test panel in the circuit board; the second test board and the second pressing mechanism are arranged on the second support seat, the terminal module can be inserted into a slot of the second test board, and the second pressing mechanism can press the terminal module onto the second test board; the measuring instrument is electrically connected with the first test board through a lead, and the first test board is also electrically connected with the second test board through a lead. The reworking phenomenon caused by poor working performance of the terminal module and/or the circuit board after the terminal module and the circuit board are welded is avoided, the testing efficiency is effectively improved, labor is saved, and meanwhile, the integrated circuit testing tool is simple in structure, convenient to operate and high in practicability.

Description

Integrated circuit test tool

Technical Field

The utility model relates to a spare part test technical field especially relates to an integrated circuit test fixture.

Background

For integrated circuits, it is common to solder terminal modules to circuit boards. In order to avoid the rework phenomenon caused by poor working performance of the terminal module and/or the circuit board after welding, before the terminal module is welded to the circuit board, the working performance of the terminal module and the circuit board is generally tested.

In the prior art, the method for testing the working performance of the terminal module and the circuit board generally tests the terminal module and the circuit board independently, the operation is complex, and the test efficiency is low.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide an integrated circuit test fixture to can't test terminal module and circuit board simultaneously among the solution prior art, the problem that the operation is complicated and efficiency of software testing is low.

To achieve the purpose, the utility model adopts the following technical proposal:

an integrated circuit test fixture for testing circuit boards and terminal modules, comprising:

the circuit board positioning device comprises a first test board, a limiting board and a first pressing mechanism, wherein the limiting board and the first pressing mechanism are arranged on a first supporting seat, the limiting board can limit the position of the circuit board, the first test board is arranged on the first supporting seat in a sliding mode, and the first pressing mechanism can press the first test board on the circuit board;

the terminal module can be inserted into a slot of the second test board, and the second pressing mechanism can press the terminal module onto the second test board;

the measuring instrument is electrically connected with the first testing board through a lead, and the first testing board is also electrically connected with the second testing board through a lead.

Preferably, the limiting plate is provided with a limiting groove, and the circuit board is inserted in the limiting groove.

Preferably, the first test board is fixedly provided with a plurality of first probes, the circuit board is provided with a plurality of contacts, the plurality of first probes and the plurality of contacts are arranged in a one-to-one correspondence manner, and the first pressing mechanism can press the free ends of the first probes against the contacts of the circuit board;

the other end of the first probe is electrically connected with the measuring instrument through a lead and is also electrically connected with the second test board through a lead.

Preferably, the second test board is fixedly provided with a plurality of second probes, the number of the slots is multiple, the slots and the second probes are arranged in a one-to-one correspondence manner, free ends of the second probes are located in the slots, and the other ends of the second probes are electrically connected with the first probes through leads;

the terminal module is provided with a plurality of conductive terminals, the conductive terminals and the slots are arranged in a one-to-one correspondence mode, the conductive terminals and the second probes are arranged in a one-to-one correspondence mode, the conductive terminals can be inserted into the slots, and the second pressing mechanism can press the conductive terminals to the free ends of the second probes.

Preferably, the first probe is a spring probe; the second probe is a spring probe.

Preferably, the first pressing mechanism comprises a first connecting plate, a first rod piece, a second rod piece and a third rod piece, wherein the first connecting plate, the first rod piece, the second rod piece and the third rod piece are fixedly arranged on the first supporting seat, one end of the first rod piece is rotatably connected with the first connecting plate, one end of the second rod piece is rotatably connected with the first rod piece, the other end of the second rod piece is rotatably connected with the third rod piece, and the other end of the third rod piece is slidably connected with the first connecting plate and can be abutted against the first testing plate.

As preferred, integrated circuit test fixture still include two interval distribution in the direction subassembly of first supporting seat, the direction subassembly include the elastic component and fixed set up in the guide bar of first supporting seat, first survey test panel slip cap is located the guide bar, the elastic component cover is located the guide bar, just the both ends of elastic component respectively with first survey test panel with first supporting seat fixed connection.

Preferably, the second hold-down mechanism comprises a second connecting plate, a fourth rod, a fifth rod and a sixth rod, the second connecting plate, the fourth rod, the fifth rod and the sixth rod are fixedly connected to the second supporting seat, one end of the fourth rod is rotatably connected to the second connecting plate, one end of the fifth rod is rotatably connected to the second connecting plate, the other end of the fourth rod and the fifth rod are also rotatably connected to the sixth rod, and a pressing block is fixedly arranged at the other end of the fifth rod.

Preferably, at least a portion of the press block contacting the terminal module is provided with an elastic cushion.

Preferably, a switch is further provided on a lead between the measuring instrument and the first test board.

The utility model has the advantages that:

an object of the utility model is to provide an integrated circuit test fixture, this integrated circuit test fixture are used for testing the working property of terminal module and circuit board before welding the terminal module in the circuit board, and wherein, this integrated circuit test fixture survey test fixture and survey test panel, second hold-down mechanism and measuring apparatu including first survey test panel, limiting plate, first hold-down mechanism, second. Specifically, when the working performance of the terminal module and the circuit board is tested through the integrated circuit testing tool, the circuit board is firstly arranged on the limiting plate, the setting position of the circuit board is limited, the terminal module is inserted into a slot of the second testing board to preliminarily limit the setting position of the terminal module, the first testing board is pressed on the circuit board through the first pressing mechanism so that the circuit board is connected with the first testing board, the terminal module is pressed on the second testing board through the second pressing mechanism, the terminal module and the slot are inserted in place so that the terminal module is connected with the second testing board, the measuring instrument is electrically connected with the first testing board through a lead, the first testing board is also electrically connected with the second testing board through a lead, after the circuit board is electrified, the first testing board, the terminal module, the second testing board and the measuring instrument are all electrically connected to form a passage, therefore the working parameters of the circuit board and the terminal module are tested through the measuring instrument, and the working performance of the circuit board and the terminal module is judged through the working parameters. This integrated circuit test fixture tests terminal module and circuit board simultaneously, has effectively avoided the rework phenomenon that is harmfully caused by terminal module and/or circuit board self working property with terminal module and circuit board welding back, has effectively improved efficiency of software testing, uses manpower sparingly, this integrated circuit test fixture simple structure simultaneously, convenient operation, the practicality is strong.

Drawings

Fig. 1 is a first schematic structural diagram of an integrated circuit testing tool according to an embodiment of the present invention;

fig. 2 is a schematic structural diagram of a test fixture for an integrated circuit according to an embodiment of the present invention;

fig. 3 is a schematic structural diagram of a part of an integrated circuit testing tool according to an embodiment of the present invention;

fig. 4 is a schematic structural diagram of a conductive terminal of an integrated circuit testing tool according to an embodiment of the present invention;

fig. 5 is a schematic structural diagram of a first pressing mechanism of an integrated circuit testing tool according to an embodiment of the present invention.

In the figure:

100. a circuit board; 200. a terminal module; 210. a conductive terminal;

1. a first test board; 11. a first probe;

2. a limiting plate; 21. a limiting groove;

3. a first hold-down mechanism; 31. a first connecting plate; 32. a first bar member; 321. a first handle; 33. a second bar member; 34. a third bar member;

4. a first support base;

5. a second test board; 51. a slot; 52. a second probe;

6. a second hold-down mechanism; 61. a second connecting plate; 62. a fourth bar member; 63. a fifth bar member; 64. a sixth bar member; 641. a second handle; 65. briquetting;

7. a guide assembly; 71. an elastic member; 72. a guide bar;

8. and a second support seat.

Detailed Description

In order to make the technical problem solved by the present invention, the technical solutions adopted by the present invention and the technical effects achieved by the present invention clearer, the following will be described in further detail with reference to the accompanying drawings, and obviously, the described embodiments are only some embodiments of the present invention, but not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by the skilled in the art without creative work belong to the protection scope of the present invention.

In the description of the present invention, unless expressly stated or limited otherwise, the terms "connected," "connected," and "fixed" are to be construed broadly, e.g., as meaning permanently connected, detachably connected, or integral to one another; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

In the present application, unless expressly stated or limited otherwise, the recitation of a first feature "on" or "under" a second feature may include the recitation of the first and second features being in direct contact, and may also include the recitation of the first and second features not being in direct contact, but being in contact with another feature between them. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.

The utility model provides an integrated circuit test fixture, as shown in fig. 1-3, this integrated circuit test fixture is used for test circuit board 100 and terminal module 200, and this integrated circuit test fixture includes that the first test panel 1, limiting plate 2, first hold-down mechanism 3, second test panel 5, second hold-down mechanism 6 and measuring apparatu of surveying. The limiting plate 2 and the first pressing machine 3 are arranged on the first supporting seat 4, the limiting plate 2 can limit the position of the circuit board 100, the first test board 1 is arranged on the first supporting seat 4 in a sliding mode, and the first pressing mechanism 3 can press the first test board 1 on the circuit board 100; the second test board 5 and the second pressing mechanism 6 are both arranged on the second support seat 8, the terminal module 200 can be inserted into the slot 51 of the second test board 5, and the second pressing mechanism 6 can press the terminal module 200 onto the second test board 5; the measuring instrument is electrically connected with the first test board 1 through a lead, and the first test board 1 is also electrically connected with the second test board 5 through a lead.

As shown in fig. 1-3, when the working performance of the terminal module 200 and the circuit board 100 is tested by the ic testing tool, the circuit board 100 is firstly disposed on the limiting plate 2 to define the disposed position of the circuit board 100, the terminal module 200 is inserted into the slot 51 of the second testing board 5 to preliminarily define the disposed position of the terminal module 200, the first testing board 1 is pressed against the circuit board 100 by the first pressing mechanism 3 to connect the circuit board 100 with the first testing board 1, the terminal module 200 is pressed against the second testing board 5 by the second pressing mechanism 6, the terminal module 200 and the slot 51 are inserted in place to connect the terminal module 200 with the second testing board 5, wherein the measuring instrument is electrically connected to the first testing board 1 through a lead, the first testing board 1 is further electrically connected to the second testing board 5 through a lead, after the circuit board 100, the first testing board 1, the terminal module 200, the second testing board 5 and the measuring instrument are electrically connected to form a passage, so as to test the working parameters of the circuit board 100 and the terminal module 200 by the measuring instrument, and judge the working performance of the circuit board 100 and the terminal module 200 by the working parameters. This integrated circuit test fixture tests terminal module 200 and circuit board 100 simultaneously, has effectively avoided the rework phenomenon who is harmfully caused by terminal module 200 and/or circuit board 100 self working property with terminal module 200 and circuit board 100 welding back, has effectively improved efficiency of software testing, uses manpower sparingly, this integrated circuit test fixture simple structure simultaneously, convenient operation, the practicality is strong.

In fig. 2, the first pressing mechanism 3 presses the first test board 1 to the circuit board 100, and the second pressing mechanism 6 presses the terminal module 200 to the second test board 5.

As shown in fig. 3, the limiting plate 2 is provided with a limiting groove 21, and the circuit board 100 is inserted into the limiting groove 21. So disposed as to define the disposed position of the circuit board 100. Specifically, in the present embodiment, the circuit board 100 is rectangular, and the limiting groove 21 is also rectangular.

Further specifically, the limiting plate 2 is further provided with a groove communicated with the limiting groove 21, and the limiting plate 2 is further provided with a notch communicated with the groove and the limiting groove 21. So configured, it is convenient to assemble or disassemble the circuit board 100.

As shown in fig. 1 to 3, a plurality of first probes 11 are fixedly disposed on the first test board 1, a plurality of contacts are disposed on the circuit board 100, the plurality of first probes 11 and the plurality of contacts are disposed in a one-to-one correspondence, and the first pressing mechanism 3 can press the free ends of the first probes 11 against the contacts of the circuit board 100; the other end of the first probe 11 is electrically connected to the measuring instrument through a lead wire and also electrically connected to the second test board 5 through a lead wire. The free end of the first probe 11 is pressed on a contact of the circuit board 100 through the first pressing mechanism 3, the other end of the first probe 11 is electrically connected with the measuring instrument through a lead and is also electrically connected with the second testing board 5 through a lead, and after the circuit board 100, the first testing board 1, the terminal module 200, the second testing board 5 and the measuring instrument are all electrically connected to form a passage after being electrified, so that the working parameters of the circuit board 100 and the terminal module 200 are tested through the measuring instrument, and the working performance of the circuit board 100 and the terminal module 200 is judged through the working parameters.

In particular, the first probe 11 is a spring probe. With such an arrangement, when the first pressing mechanism 3 presses the free end of the first probe 11 against the contact of the circuit board 100, the free end of the first probe 11 can be ensured to be in contact with the circuit board 100, and the structure of the circuit board 100 is not damaged. The specific structure of the elastic probe belongs to the prior art, and is not described herein again.

Specifically, as shown in fig. 1 to 3 and fig. 5, the first pressing mechanism 3 includes a first connecting plate 31, a first rod 32, a second rod 33 and a third rod 34 fixedly disposed on the first supporting seat 4, one end of the first rod 32 is rotatably connected to the first connecting plate 31, one end of the second rod 33 is rotatably connected to the first rod 32, the other end of the second rod is rotatably connected to the third rod 34, and the other end of the third rod 34 is slidably connected to the first connecting plate 31 and can abut against the first testing board 1. Specifically, the other end of the first rod 32 is a first handle 321, the first handle 321 is used for applying force to the first handle 321, so that the first handle 321 drives the first rod 32, the second rod 33 and the third rod 34 to be linked, the third rod 34 moves towards the direction close to the first test board 1 until the other end of the third rod 34 abuts against the first test board 1, and then the force is continuously applied to the first handle 321 to drive the first test board 1 to approach the circuit board 100 until the free end of the first probe 11 of the first test board 1 is pressed against the contact of the circuit board 100. Specifically, the direction of the first test board 1 approaching the circuit board 100 is parallel to the pressing direction of the free ends of the first probes 11 pressing the contacts of the circuit board 100, and is perpendicular to the surface of the circuit board 100.

Further specifically, as shown in fig. 1-3, the integrated circuit testing tool further includes two guiding assemblies 7 spaced apart from each other and disposed on the first supporting seat 4, each guiding assembly 7 includes an elastic member 71 and a guiding rod 72 fixedly disposed on the first supporting seat 4, the first testing board 1 is slidably sleeved on the guiding rod 72, the elastic member 71 is sleeved on the guiding rod 72, and two ends of the elastic member 71 are respectively fixedly connected to the first testing board 1 and the first supporting seat 4. Through the arrangement of the guide component 7, the first test board 1 is limited to slide only along the extension direction of the guide rod 72, so that the deviation of the motion path of the first test board 1 in the process of driving the first test board 1 to approach the circuit board 100 by the first pressing component is avoided, the free end of the first probe 11 of the first test board 1 can be ensured to be accurately contacted with a contact on the circuit board 100, and it can be understood that the elastic member 71 is compressed in the process; after the test is completed, a force is applied to the first handle 321 again, so that the first handle 321 drives the first rod 32, the second rod 33 and the third rod 34 to move in a linkage manner, and drives the third rod 34 to move in a direction away from the first test board 1, at this time, the elastic restoring force of the elastic member 71 drives the first test board 1 to move away from the circuit board 100 along the extending direction of the guide rod 72, so as to separate the free end of the first probe 11 from the contact of the circuit board 100. The extending direction of the wire guide rods is parallel to the direction of the first testing board 1 approaching the circuit board 100. Specifically, in the present embodiment, the elastic member 71 is a spring.

As shown in fig. 1 to 4, the second test board 5 is fixedly provided with a plurality of second probes 52, the number of the slots 51 is multiple, the plurality of slots 51 and the plurality of second probes 52 are arranged in a one-to-one correspondence, free ends of the second probes 52 are located in the slots 51, and the other ends of the second probes 52 are electrically connected with the first probes 11 through leads; the terminal module 200 has a plurality of conductive terminals 210, the conductive terminals 210 are disposed in one-to-one correspondence with the slots 51, the conductive terminals 210 are disposed in one-to-one correspondence with the second probes 52, the conductive terminals 210 can be inserted into the slots 51, and the second pressing mechanism 6 can press the conductive terminals 210 against the free ends of the second probes 52. Firstly, the conductive terminals 210 of the terminal module 200 are inserted into the slots 51 in a one-to-one correspondence manner, then the conductive terminals 210 of the terminal module 200 are pressed against the free ends of the second probes 52 in the slots 51 by the second pressing mechanism 6, the other ends of the second probes 52 are electrically connected with the first probes 11 through leads, and after the circuit board 100, the first test board 1, the terminal module 200, the second test board 5 and the measuring instrument are all electrically connected to form a passage after being electrified, so that the working parameters of the circuit board 100 and the terminal module 200 are tested through the measuring instrument, and the working performance of the circuit board 100 and the terminal module 200 is judged through the working parameters.

Specifically, the second probe 52 is a spring probe. With such an arrangement, when the second pressing mechanism 6 presses the conductive terminals 210 against the free ends of the second probes 52, the structure of the conductive terminals 210 of the terminal module 200 is not damaged while the free ends of the second probes 52 are in contact with the terminal module 200. The specific structure of the elastic probe belongs to the prior art, and is not described herein again.

Specifically, as shown in fig. 1 to 3, the second pressing mechanism 6 includes a second connecting plate 61 fixedly connected to the second supporting seat 8, a fourth rod 62, a fifth rod 63, and a sixth rod 64, one end of the fourth rod 62 is rotatably connected to the second connecting plate 61, one end of the fifth rod 63 is rotatably connected to the second connecting plate 61, the other end of the fourth rod 62 and the fifth rod 63 are also rotatably connected to the sixth rod 64, and a pressing block 65 is fixedly disposed at the other end of the fifth rod 63. Specifically, the other end of the sixth rod 64 is a second handle 641, and by applying a force to the second handle 641, the second handle 641 drives the fourth rod 62, the fifth rod 63 and the sixth rod 64 to move together, so that the fifth rod 63 approaches the terminal module 200 and presses the conductive terminal 210 against the free end of the second probe 52; after the test is completed, a force is applied to the second handle 641, and the second handle 641 drives the fourth rod 62, the fifth rod 63, and the sixth rod 64 to move in a linkage manner, so that the pressing block 65 is far away from the terminal module 200. Further specifically, the other end of the fifth rod 63 and the pressing block 65 are detachably connected by a bolt, so that the pressing block 65 is convenient to assemble, disassemble or replace.

More specifically, at least a portion of the pressing block 65 contacting the terminal module 200 is provided with an elastic cushion. So set up, can avoid briquetting 65 fish tail or scratch terminal module 200, and can exert the power in terminal module 200 through briquetting 65 through the cushion of elasticity.

Wherein, a switch is also arranged on the lead between the measuring instrument and the first test board 1. The switches are arranged so as to connect or disconnect the circuit formed by the circuit board 100, the first test board 1, the terminal module 200, the second test board 5 and the measuring instrument.

The specific structure of the measuring instrument belongs to the prior art, and is not described herein again.

It is obvious that the above embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.

Claims (10)

1. An integrated circuit test fixture for testing a circuit board (100) and a terminal module (200), comprising:

the circuit board testing device comprises a first testing board (1), a limiting board (2) and a first pressing mechanism (3), wherein the limiting board (2) and the first pressing mechanism (3) are arranged on a first supporting seat (4), the limiting board (2) can limit the position of the circuit board (100), the first testing board (1) is arranged on the first supporting seat (4) in a sliding mode, and the first pressing mechanism (3) can press the first testing board (1) on the circuit board (100);

the second test board (5) and the second pressing mechanism (6) are arranged on a second support seat (8), the terminal module (200) can be inserted into a slot (51) of the second test board (5), and the second pressing mechanism (6) can press the terminal module (200) onto the second test board (5);

the measuring instrument is electrically connected with the first testing plate (1) through a lead, and the first testing plate (1) is also electrically connected with the second testing plate (5) through a lead.

2. The integrated circuit testing tool according to claim 1, wherein the limiting plate (2) is provided with a limiting groove (21), and the circuit board (100) is inserted into the limiting groove (21).

3. The integrated circuit testing tool according to claim 1, wherein the first testing board (1) is fixedly provided with a plurality of first probes (11), the circuit board (100) is provided with a plurality of contacts, the plurality of first probes (11) and the plurality of contacts are arranged in a one-to-one correspondence manner, and the first pressing mechanism (3) can press the free ends of the first probes (11) against the contacts of the circuit board (100);

the other end of the first probe (11) is electrically connected with the measuring instrument through a lead and is also electrically connected with the second test board (5) through a lead.

4. The integrated circuit testing tool according to claim 3, wherein a plurality of second probes (52) are fixedly arranged on the second testing board (5), the number of the slots (51) is multiple, the slots (51) and the second probes (52) are arranged in a one-to-one correspondence manner, free ends of the second probes (52) are located in the slots (51), and the other ends of the second probes (52) are electrically connected with the first probes (11) through leads;

the terminal module (200) is provided with a plurality of conductive terminals (210), the conductive terminals (210) are arranged in one-to-one correspondence with the slots (51), the conductive terminals (210) are arranged in one-to-one correspondence with the second probes (52), the conductive terminals (210) can be inserted into the slots (51), and the second pressing mechanism (6) can press the conductive terminals (210) against the free ends of the second probes (52).

5. The integrated circuit test tool of claim 4, wherein the first probe (11) is a spring probe; the second probe (52) is a spring probe.

6. The integrated circuit testing tool according to any one of claims 1 to 5, wherein the first pressing mechanism (3) comprises a first connecting plate (31), a first rod member (32), a second rod member (33) and a third rod member (34) which are fixedly arranged on the first supporting seat (4), one end of the first rod member (32) is rotatably connected with the first connecting plate (31), one end of the second rod member (33) is rotatably connected with the first rod member (32), the other end of the second rod member is rotatably connected with the third rod member (34), and the other end of the third rod member (34) is slidably connected with the first connecting plate (31) and can be abutted against the first testing plate (1).

7. The integrated circuit test fixture according to any one of claims 1-5, wherein the integrated circuit test fixture further comprises two guide members (7) spaced apart from each other and disposed on the first support base (4), each guide member (7) comprises an elastic member (71) and a guide rod (72) fixedly disposed on the first support base (4), the guide rod (72) is slidably sleeved on the first test plate (1), the guide rod (72) is sleeved on the elastic member (71), and two ends of the elastic member (71) are respectively fixedly connected to the first test plate (1) and the first support base (4).

8. The integrated circuit testing tool according to any one of claims 1 to 5, wherein the second pressing mechanism (6) comprises a second connecting plate (61), a fourth rod (62), a fifth rod (63) and a sixth rod (64), the second connecting plate (61), the fourth rod (62), the fifth rod (63) and the sixth rod (64) are fixedly connected to the second supporting seat (8), one end of the fourth rod (62) is rotatably connected to the second connecting plate (61), one end of the fifth rod (63) is rotatably connected to the second connecting plate (61), the other end of the fourth rod (62) and the fifth rod (63) are also rotatably connected to the sixth rod (64), and a pressing block (65) is fixedly arranged at the other end of the fifth rod (63).

9. The integrated circuit test tool of claim 8, wherein at least a portion of the press block (65) contacting the terminal module (200) is provided with an elastic cushion.

10. The integrated circuit testing tool according to any one of claims 1 to 5, wherein a switch is further disposed on a lead between the measuring instrument and the first testing board (1).

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