CN217639488U - Device for testing - Google Patents
Device for testing Download PDFInfo
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- CN217639488U CN217639488U CN202220761660.1U CN202220761660U CN217639488U CN 217639488 U CN217639488 U CN 217639488U CN 202220761660 U CN202220761660 U CN 202220761660U CN 217639488 U CN217639488 U CN 217639488U
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Abstract
The utility model relates to a device for test, include: the test terminals are used for being connected with an external component to be tested; the detection port is used for being connected with a corresponding detection instrument; a test line selection switch having a plurality of test line bits; the testing circuit comprises a plurality of testing sub-circuits, each testing terminal is communicated with one corresponding testing sub-circuit in the plurality of sub-circuits, and the testing circuit comprises: the selected test sub-circuit is adapted to communicate with the corresponding test terminal and the test port based on different test line positions of the test line selection switch. Based on the scheme, the test process can be simple and effective, the test time is shortened, and meanwhile, the fault caused by direct test misoperation is avoided.
Description
Technical Field
The embodiment of the utility model provides a relate to the electricity field, especially relate to a device for test.
Background
A plurality of power connectors exist in the product design of Radixact equipment (spiral tomography system) produced by the existing company, whether the voltage output of a part of the connectors is correct or not needs to be tested in order to ensure the performance of the equipment, but the exposed and leaked part of the pins of the connectors is short, the number of the pins is large and dense, the specific pins are not easy to position when the voltage of the connectors is tested by using a universal meter, and the working test time is directly prolonged; in addition, the number of test paths is large, and error tests are easily caused; moreover, the pin pitch is small, which easily causes short circuits during direct testing, resulting in device failure and inconvenience in troubleshooting related power failures.
SUMMERY OF THE UTILITY MODEL
To alleviate or solve at least one aspect of the above-mentioned problems in the prior art, the following technical solutions are proposed.
An apparatus for testing, comprising:
a plurality of test terminals for connecting to an external device under test;
the detection port is used for being connected with a corresponding detection instrument;
a test line selection switch having a plurality of test line bits;
a test circuit including a plurality of test sub-circuits, each of the test terminals being communicated with a corresponding one of the plurality of sub-circuits,
wherein:
based on different test line positions of the test line selection switch, the selected test sub-line is adapted to communicate with the corresponding test terminal and the detection port.
Optionally, the apparatus includes a single device external connector, the device external connector is provided with the plurality of test terminals, and the device external connector is used for being connected with an external component to be tested; the device also comprises a detection instrument external piece which is used for being connected with a corresponding detection instrument, and the detection instrument external piece is provided with the detection port.
Further optionally, a plurality of reference terminals are further arranged in the device external connector, the detection instrument external connector is further provided with reference ports, and the number of the reference terminals is the same as that of the test terminals; and the apparatus further comprises: a single reference line selection switch having a plurality of reference line bits in one-to-one correspondence with a plurality of test line bits; and a reference line including a plurality of reference sub-lines, each reference terminal of the device external connector being communicated with a corresponding one of the plurality of reference sub-lines, wherein: the selected reference sub-line is adapted to communicate with a corresponding reference terminal in the device enclosure and a reference port in the test instrument enclosure based on different reference line positions of the reference line selection switch.
Optionally, the apparatus includes: the device comprises n equipment external parts, a test terminal and a control module, wherein the n equipment external parts are used for being connected with an external part to be tested respectively, at least one test terminal is arranged in each equipment external part, and n is a natural number greater than 1; the detection instrument external connector is used for connecting with a corresponding detection instrument and is provided with the detection port; a component-under-test selection switch having n component bits corresponding to different external components-under-test; n test line selection switches, each test line selection switch having a plurality of test line bits, wherein: based on different part positions of the part selection switch to be tested and different test line positions of the test line selection switch, the selected sub-circuit is suitable for being communicated with a corresponding test terminal in the equipment external piece and a detection port of the detection instrument external piece.
Further optionally, each device external connector is further provided with at least one reference terminal, the detection instrument external connector is further provided with reference ports, and the number of the reference terminals in a single device external connector is the same as the number of the test terminals; and the apparatus further comprises: a plurality of reference line selection switches, each reference line selection switch having at least one reference line bit, each reference line bit corresponding one-to-one to a test line bit for each component bit; and a reference line including a plurality of reference sub-lines, each of reference terminals of the device external connector communicating with a corresponding one of the plurality of reference sub-lines, wherein: the selected reference sub-line is adapted to communicate with a corresponding reference terminal in the device enclosure and a reference port in the test instrument enclosure based on different reference line positions of the reference line selection switch.
Optionally, the test line selection switch is a rotary switch, the rotary switch has a plurality of rotary positions, and each rotary position corresponds to a test line position one to one.
Optionally, the reference line selection switch is a rotary switch, the rotary switch has a plurality of rotation positions, and each rotation position corresponds to a reference line position. Further optionally, the test line selection switch and the corresponding reference line selection switch together form a double-layer rotary switch.
Optionally, the external connector of the detection instrument is a multimeter interface.
Optionally, the device external connector is adapted to interface with a power connector of a Radixact device.
Optionally, the device is a device for low voltage testing.
Optionally, the device is in the shape of a box body, the test circuit is located in the box body, and the switch and the external part are both arranged on the wall of the box body.
Optionally, a label for clearly indicating the test sub-line is arranged on the box body.
Based on the technical scheme, the test process can be simpler and more effective, the test time is shortened, and meanwhile, the fault caused by direct test misoperation is avoided.
Drawings
These and other features and advantages of the various embodiments of the present disclosure will become better understood with regard to the following description, appended claims, and accompanying drawings where like reference numerals refer to like parts throughout and in which:
fig. 1 is a schematic structural diagram of an apparatus for testing according to an exemplary embodiment of the present invention;
fig. 2 is a schematic structural view of an apparatus for testing according to another exemplary embodiment of the present invention;
fig. 3 is an exemplary schematic diagram of a test circuit within the apparatus of fig. 1.
Detailed Description
The following description of the embodiments of the present invention with reference to the drawings is intended to explain the general inventive concept and should not be construed as limiting the invention. Some, but not all embodiments of the invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art all belong to the protection scope of the present invention.
Based on the technical problem that submits in the background art, the technical scheme of the utility model in a specific embodiment for solve the inconvenience of Radixact equipment part power connector low pressure test, make the testing process simple more effective and direct, shorten when testing, avoid simultaneously because the fault that direct test maloperation arouses, can be effective, safe and accurate realization Radixact low pressure test flow.
In one embodiment, the utility model discloses a testing arrangement adopts box body formula structure, convenient to use. However, the present invention is not limited to this, and may be an arrangement structure or an appearance.
FIG. 1 shows a specific example of a testing device, namely a low-voltage testing device, in FIG. 1, an AFC/OBC/DAS external connector is arranged on a box body and is used for being connected with an AFC/OBC/DAS external connector respectively; an AFC path knob switch, an OBC path knob switch and a DAS path knob switch are respectively arranged; a knob switch of a component to be tested for selecting AFC/OBC/DAS is arranged; a measurement port for a multimeter is provided.
In practice, for Radixact devices (corresponding to external devices under test), the voltage values on 3 power connectors are tested, each requiring a different path to be tested. The utility model discloses an in the embodiment, adopt the knob switch of different numbers to select different testing path on different parts and the part that awaits measuring. The AFC/OBC/DAS of the power connector to be tested is selected through a knob switch of a component to be tested, and then a specific testing path on the power connector is selected through the AFC knob switch \ OBC knob switch \ DAS knob switch (see fig. 3 specifically).
Fig. 2 is a schematic structural diagram of an apparatus for testing according to another exemplary embodiment of the present invention. In fig. 2, the apparatus for testing includes a plurality of component input ports, i.e., a component 1 input port, a component 2 input port, a component 3 input port, etc., each of which is required to test a different path. The apparatus for testing further includes a plurality of component test path knob switches, i.e., a component 1 test path knob switch, a component 2 test path knob switch, a component 3 test path knob switch, etc., by each of which a specific test path on a component is selected. The apparatus for testing further includes a part under test knob for selecting a part, by which the part to be tested is selected. The apparatus for testing further includes a multimeter measurement port.
In one embodiment of the present invention, the external interface of the case is selected to connect the connections of the Radixact device power connector (if the device connector is a male connector, then the female connector is selected, and if the device connector is a female connector, then the male connector is selected) to the internal cable of the case.
In one embodiment of the present invention, a BNC connector is selected for connecting to a multimeter for reading the test values.
In one embodiment of the present invention, a stab type crimp terminal is selected for the internal cable connecting the connector to the knob switch and the knob switch to the BNC connector.
In one embodiment of the present invention, knob buttons with different numbers of bits are selected for selecting different power connectors and different test paths within each connector.
In an embodiment of the present invention, a label may be further attached to the box body for indicating the testing position and path, or for clearly indicating the testing sub-line.
In specific operation, the voltage values of different paths are selectively tested by using a knob switch. The power connectors on the device can be connected directly to the test apparatus by first selecting the power connector to be tested via the rotary switch and then selecting the path to be tested via the rotary switch, and connecting the multimeter to the BNC connector for reading.
By adopting the testing device and the testing process, the low-voltage testing can be conveniently, quickly, safely and effectively carried out, the point-by-point positioning and testing are not needed, and the probability of damaging equipment due to direct testing is reduced.
The operation process is simple and clear, and in addition, the label on the box body can obviously indicate the testing path, so that the testing time in the production process is further saved. Meanwhile, the scheme is safer and more effective.
A specific test procedure is exemplified below with reference to fig. 3.
If the power connector DAS of the Radixact device is connected to the DAS interface on the case, as shown in FIG. 3, the test terminals 2,3,6,7 in the DAS interface will be connected or communicated to corresponding terminals in the DAS, and the reference terminals 1,4,5,8,9, and 10 in the DAS interface will be connected or communicated to corresponding terminals in the DAS.
Next, in the left input knob switch in fig. 3, the position of the left knob is selected to be 3, and the reference position on the right is selected to be 3.
Then, at the DAS knob switch on the lower side of the middle portion of fig. 3, the knob is rotated to a position 1 corresponding to the test sub-line 1 in the test sub-lines 1-6 and the reference sub-line 1 in the reference sub-lines 1-6.
Thereafter, the voltage signal is measured using the potential measurement stage on the lower left side in fig. 3, and it is determined whether the voltage of the line 1 of the DAS, which is the power connector of the Radixact device, is appropriate.
And sequentially measuring and judging whether the voltages of the lines 2-6 of the DAS of the power connector of the Radixact equipment are proper or not along with the sequential turning of the DAS knob switch to 2-6.
Measurements may also be made for the power connectors OBC and AFC of the Radixact device in a manner similar to that described above.
In the diagram shown in fig. 3, the selection of the reference sub-line and the selection of the detector sub-line are realized synchronously by a double-layer knob, but as can be appreciated, they may be realized separately by separate knobs.
In the above embodiments, the measurement of three power connectors AFC/OBC/DAS on the Radixact device is taken as an example for illustration, and as can be understood, the solution of the present invention can also be used for the measurement of only one of the power connectors, that is, the cartridge in fig. 1 is provided with only the DAS interface, and is not provided with the AFC interface and the OBC interface.
In addition, the technical scheme can be used for measuring not only the voltage but also the on-off of a line or other electrical parameters, correspondingly, a reference terminal is not required to be arranged, and correspondingly, a reference line and a reference line knob are not required to be arranged.
The utility model discloses in, measuring instrument is also not limited to the universal meter.
Based on above, the utility model provides a device for test, it includes:
the test terminals are used for being connected with an external component to be tested;
the detection port is used for being connected with a corresponding detection instrument;
a test line selection switch having a plurality of test line bits;
a test circuit including a plurality of test sub-circuits, each of the test terminals being communicated with a corresponding one of the plurality of sub-circuits,
wherein:
the selected test sub-circuit is adapted to communicate with the corresponding test terminal and the test port based on different test line positions of the test line selection switch.
Although embodiments of the present invention have been shown and described, it would be appreciated by those skilled in the art that changes may be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the claims and their equivalents.
Claims (14)
1. An apparatus for testing, comprising:
the test terminals are used for being connected with an external component to be tested;
the detection port is used for being connected with a corresponding detection instrument;
a test line selection switch having a plurality of test line bits;
a test circuit including a plurality of test sub-circuits, each of the test terminals being communicated with a corresponding one of the plurality of test sub-circuits,
wherein:
based on different test line positions of the test line selection switch, the selected test sub-line is adapted to communicate with the corresponding test terminal and the detection port.
2. The apparatus of claim 1, wherein:
the device comprises a single equipment external piece, wherein the equipment external piece is provided with a plurality of test terminals and is used for being connected with an external part to be tested;
the device also comprises a detection instrument external piece which is used for being connected with a corresponding detection instrument, and the detection instrument external piece is provided with the detection port.
3. The apparatus of claim 2, wherein:
the equipment external piece is also internally provided with a plurality of reference terminals, the detection instrument external piece is also provided with reference ports, and the number of the reference terminals is the same as that of the test terminals; and is provided with
The device further comprises:
a single reference line selection switch having a plurality of reference line bits in one-to-one correspondence with the plurality of test line bits; and
a reference line including a plurality of reference sub-lines, each of the reference terminals of the device external is communicated with a corresponding one of the plurality of reference sub-lines,
wherein:
the selected reference sub-line is adapted to communicate with a corresponding reference terminal in the device enclosure and a reference port in the test instrument enclosure based on different reference line positions of the reference line selection switch.
4. The apparatus of claim 1, wherein the apparatus comprises:
the device comprises n equipment external parts, a test terminal and a control module, wherein the n equipment external parts are used for being connected with an external part to be tested respectively, at least one test terminal is arranged in each equipment external part, and n is a natural number greater than 1;
the detection instrument external piece is used for being connected with a corresponding detection instrument and is provided with the detection port;
a component under test selection switch having n component positions corresponding to different external components under test;
n test line selection switches, each test line selection switch having a plurality of test line bits,
wherein:
based on different component positions of the to-be-tested component selection switch and different test line positions of the test line selection switch, the selected sub-line is suitable for being communicated with a corresponding test terminal in the equipment external piece and a detection port of the detection instrument external piece.
5. The apparatus of claim 4, wherein:
each equipment external piece is also internally provided with at least one reference terminal, the detection instrument external piece is also provided with reference ports, and the number of the reference terminals in each equipment external piece is the same as that of the test terminals; and is
The device further comprises:
a plurality of reference line selection switches, each reference line selection switch having at least one reference line bit, each reference line bit corresponding one-to-one to a test line bit for each component bit; and
a reference line including a plurality of reference sub-lines, each of reference terminals of a device external connector communicating with a corresponding one of the plurality of reference sub-lines,
wherein:
the selected reference sub-line is adapted to communicate with a corresponding reference terminal in the device enclosure and a reference port in the test instrument enclosure based on different reference line positions of the reference line selection switch.
6. The apparatus of claim 1, wherein:
the test circuit selection switch is a knob switch, the knob switch is provided with a plurality of rotation positions, and each rotation position corresponds to the test circuit position one by one.
7. The apparatus of claim 3 or 5, wherein:
the reference line selection switch is a knob switch, the knob switch is provided with a plurality of rotation positions, and each rotation position corresponds to the reference line position one by one.
8. The apparatus of claim 7, wherein:
the test circuit selection switch and the corresponding reference circuit selection switch form a double-layer knob switch together.
9. The apparatus of claim 2 or 4, wherein:
the external connector of the detection instrument is a universal meter interface.
10. The apparatus of claim 2 or 4, wherein:
the equipment external connector is suitable for being connected with a power connector of Radixact equipment.
11. The apparatus of claim 1, wherein:
the device is used for low-voltage testing.
12. The apparatus of claim 2 or 4, wherein:
the device is used for low-voltage testing;
the device external connector is suitable for being connected with a power connector of Radixact equipment.
13. The apparatus according to any one of claims 2-5, wherein:
the device is the shape of box body, the test circuit is located the box body, switch and external component all set up on the box body wall.
14. The apparatus of claim 13, wherein:
the box body is provided with a label for clearly indicating the test sub-circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220761660.1U CN217639488U (en) | 2022-04-02 | 2022-04-02 | Device for testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220761660.1U CN217639488U (en) | 2022-04-02 | 2022-04-02 | Device for testing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217639488U true CN217639488U (en) | 2022-10-21 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202220761660.1U Active CN217639488U (en) | 2022-04-02 | 2022-04-02 | Device for testing |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217639488U (en) |
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2022
- 2022-04-02 CN CN202220761660.1U patent/CN217639488U/en active Active
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