CN217639273U - four-Hall chip-single MCU-single CAN current sensor - Google Patents
four-Hall chip-single MCU-single CAN current sensor Download PDFInfo
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- CN217639273U CN217639273U CN202221359119.4U CN202221359119U CN217639273U CN 217639273 U CN217639273 U CN 217639273U CN 202221359119 U CN202221359119 U CN 202221359119U CN 217639273 U CN217639273 U CN 217639273U
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Abstract
The application relates to a four hall chip-single MCU-single CAN current sensor, include: an MCU micro control unit; two high-range Cheng Huoer chips, wherein one high-range Hall chip is electrically connected to the MCU, and the other high-range Hall chip directly outputs a high-range test analog signal to the automobile BMS; one low-range Hall chip is electrically connected with the MCU, and the other low-range Hall chip directly outputs a low-range test analog quantity signal to the automobile BMS; and the MCU is used for performing analog-to-digital conversion on the signals and outputting the signals to the automobile BMS through the CAN transceiver. The application has the following technical effects: when any one Hall chip fails, the other path of signal output can be ensured, the normal operation of the function of the Hall chip is ensured, and the safety is higher.
Description
Technical Field
The application relates to the technical field of automobile current sensors, in particular to a four-Hall-chip single-MCU single-CAN current sensor.
Background
The current sensor is a detection device which can sense the information of the current to be detected and convert the sensed information into an electric signal meeting certain standards or other information in required forms according to a certain rule for output so as to meet the requirements of information transmission, processing, storage, display, record, control and the like. At present, a current sensor is widely used on an electric vehicle to monitor the running current of the vehicle, so that the normal running of the electric vehicle is ensured.
The existing automobile current sensor generally only comprises a Hall chip and an MCU (micro control unit), no matter how high the functional safety level of the Hall chip and the MCU is, even though ASIL D level is achieved, when the only Hall chip fails due to faults, the current sensor can not normally output signals to the automobile BMS, safety accidents are easily caused, the problem of low safety exists generally, and the improvement is needed.
SUMMERY OF THE UTILITY MODEL
The application provides a four-Hall chip-single MCU-single CAN current sensor to improve following technical problem: when the only Hall chip fails due to faults, the current sensor can not normally output signals to the automobile BMS, safety accidents are easily caused, and the problem of low safety exists generally.
The application provides a four hall chips-single MCU-single CAN current sensor, adopts following technical scheme:
a four-Hall chip-single MCU-single CAN current sensor, comprising:
an MCU micro control unit;
one of the high-range Hall chips is electrically connected to the MCU for transmitting a high-range test analog quantity signal, and the other high-range Hall chip directly outputs the high-range test analog quantity signal to the automobile BMS for processing;
one low-range Hall chip is electrically connected with the MCU for transmitting a low-range test analog quantity signal, and the other low-range Hall chip directly outputs the low-range test analog quantity signal to the automobile BMS for processing;
and the MCU micro control unit performs analog-to-digital conversion on the received high-range test analog quantity signals and low-range test analog quantity signals, and then outputs the signals to an automobile BMS (battery management system) for processing through the CAN transceiver.
Through adopting above-mentioned technical scheme, a high volume Cheng Huoer chip and a low-range hall chip are direct to be handled analog signal output for car BMS, another high volume Cheng Huoer chip and another low-range hall chip are for analog signal output for MCU little the control unit, through the analog-to-digital conversion, then export for car BMS through the CAN transceiver and handle, and four hall chips are each other redundant and reserve, CAN ensure when arbitrary one hall chip became invalid, will have another way signal output all the time, ensure its function normal operating, the security is higher.
Optionally, the functional safety levels of the two high-range hall chips are both ASIL C levels.
By adopting the technical scheme, the ASIL C-grade high-magnitude Cheng Huoer chip is low in safety and low in purchase cost, and the production cost of the current sensor can be greatly reduced.
Optionally, the functional safety levels of the two low-range hall chips are both ASIL C levels.
By adopting the technical scheme, the safety of the ASIL C-level low-range Hall chip is not low, the purchase cost is not high, and the production cost of the current sensor can be greatly reduced.
Optionally, the functional safety level of the MCU micro-control unit is ASIL D level.
By adopting the technical scheme, the functional safety level of the MCU is relatively high, and the safety of the current sensor can be indirectly improved.
Optionally, the current detection range of the high-magnitude Cheng Huoer chip is 200-1500A.
By adopting the technical scheme, the high-quantity Cheng Huoer chip with the parameters is low in purchase cost, can just adapt to the working current range of the electric vehicle between 200 and 1500A when the electric vehicle works, and is more practical.
Optionally, the current detection range of the low-range hall chip is 100 to 300A.
By adopting the technical scheme, the low-range Hall chip with the parameters is low in purchase cost, can just adapt to the working current range of the electric vehicle between 100 and 300A when the electric vehicle works, and is more practical.
Optionally, the input power supply of the current sensor is a direct current power supply, and the voltage of the input power supply is between 4.8 and 5.2V.
By adopting the technical scheme, the direct current power supply of about 5V is more stable, and the stable and durable work of the current sensor is facilitated.
Optionally, the current sensor has a functional safety level not lower than ASIL C level.
By adopting the technical scheme, the functional safety level of the current sensor is not ASIL A level and ASIL B level, but ASIL C level and ASIL D level with higher safety, and the current sensor is more suitable for electric vehicles.
In summary, the present application includes at least one of the following beneficial technical effects:
1. one high-range Cheng Huoer chip and one low-range hall chip directly output analog signals to the automobile BMS for processing, the other high-range Cheng Huoer chip and the other low-range hall chip output analog signals to the MCU micro control unit, the analog signals are output to the automobile BMS for processing through the CAN transceiver through analog-to-digital conversion, and the four hall chips are mutually redundant and standby, so that when any one hall chip fails, the other way of signal output CAN be realized, the normal operation of the function of the hall chip is ensured, and the safety is higher;
the safety of the ASIL C-level low-range Hall chip and the high-range Cheng Huoer chip is not low, the purchase cost is not high, and the production cost of the current sensor can be greatly reduced.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a four-hall chip-single MCU-single CAN current sensor according to an embodiment of the present application.
Description of reference numerals:
101. an MCU micro control unit; 102. a high-range Hall chip; 103. a low-range Hall chip; 104. a CAN transceiver.
Detailed Description
In order to make the technical problems, technical solutions and advantageous effects to be solved by the present application clearer, the present application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.
It will be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like, as used herein, refer to an orientation or positional relationship indicated in the drawings that is solely for the purpose of facilitating the description and simplifying the description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be considered as limiting the present application.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.
The present application is described in further detail below with reference to fig. 1.
The embodiment of the application discloses a four-Hall chip-single MCU-single CAN current sensor. Referring to fig. 1, the four hall chips-single MCU-single CAN current sensor includes: an MCU microcontrol unit 101; two high-range Hall chips 102, wherein one high-range Hall chip 102 Cheng Huoer is electrically connected to the MCU 101 for transmitting a high-range test analog quantity signal, and the other high-range Hall chip 102 Cheng Huoer directly outputs the high-range test analog quantity signal to the automobile BMS for processing; one of the two low-range hall chips 103 is electrically connected to the MCU micro-control unit 101 for transmitting a low-range test analog signal, and the other one of the low-range hall chips 103 directly outputs the low-range test analog signal to the car BMS for processing; a CAN transceiver 104, the CAN transceiver 104 is electrically connected with the MCU 101, the MCU 101 performs analog-to-digital conversion on the received high-range test analog quantity signal and low-range test analog quantity signal, and then outputs the signals to the automobile BMS for processing through the CAN transceiver 104; the two high-magnitude Cheng Huoer chips 102 and the two low-range hall chips 103 are redundant to each other.
The functional safety levels of the two high-quantity Cheng Huoer chips 102 are ASIL C levels, the safety of the ASIL C-level high-quantity Cheng Huoer chip 102 is not low, the purchase cost is not high, and the production cost of the current sensor can be greatly reduced.
The functional safety levels of the two low-range hall chips 103 are both ASIL C levels, the safety of the ASIL C level low-range hall chip 103 is not low, the purchase cost is not high, and the production cost of the current sensor can be greatly reduced.
The functional safety level of the MCU 101 is ASIL D level, the functional safety level of the MCU 101 is relatively high, and the safety of the current sensor can be indirectly improved.
The current detection range of the high-quantity Cheng Huoer chip 102 is 200-1500A, the high-quantity Cheng Huoer chip 102 with the parameters is low in purchase cost, and the high-quantity Cheng Huoer chip can just adapt to the working current range of 200-1500A when the electric vehicle works, so that the high-quantity Cheng Huoer chip is more practical.
The current detection range of the low-range Hall chip 103 is 100-300A, the low-range Hall chip 103 with the parameters has low purchase cost, can just adapt to the working current range of the electric vehicle between 100-300A when the electric vehicle works, and is more practical.
The input power supply of the current sensor is a direct current power supply, the voltage of the input power supply is 5V, and the direct current power supply with the voltage of 4.8V or about 5.2V and 5V in other embodiments is more stable, so that the stable and durable work of the current sensor is facilitated.
The functional safety level of the current sensor is not lower than ASIL C level, the functional safety level of the current sensor is not higher than ASIL A level and ASIL B level, but higher ASIL C level and ASIL D level, and the current sensor is more suitable for electric vehicles.
The implementation principle of the four-Hall chip-single MCU-single CAN current sensor in the embodiment of the application is as follows:
one high-range Cheng Huoer chip 102 and one low-range hall chip 103 directly output the analog quantity signal to the automobile BMS for processing, the other high-range hall chip 102 and the other low-range hall chip 103 output the analog quantity signal to the MCU micro control unit 101, through analog-to-digital conversion, and then output to the automobile BMS for processing through the CAN transceiver 104, and the four hall chips are mutually redundant and standby, when any one hall chip fails, another signal output CAN be realized, the normal operation of the function of the hall chip is ensured, and the safety is higher.
The above description is only a preferred embodiment of the present application and should not be taken as limiting the present application, and any modifications, equivalents, improvements, etc. made within the spirit and principle of the present application should be included in the scope of the present application.
Claims (8)
1. The utility model provides a four hall chip-single MCU-single CAN current sensor which characterized in that includes:
an MCU micro control unit (101);
the high-range Hall chip (102) is electrically connected with the MCU (101) for transmitting a high-range test analog quantity signal, and the other high-range Hall chip (102) directly outputs the high-range test analog quantity signal to the automobile BMS for processing;
the system comprises two low-range Hall chips (103), wherein one low-range Hall chip (103) is electrically connected to the MCU (micro control unit) (101) and used for transmitting a low-range test analog signal, and the other low-range Hall chip (103) directly outputs the low-range test analog signal to the automobile BMS for processing;
and the CAN transceiver (104) is electrically connected with the MCU (101), and the MCU (101) performs analog-to-digital conversion on the received high-range test analog quantity signal and low-range test analog quantity signal, and then outputs the signals to the automobile BMS for processing through the CAN transceiver (104).
2. The four-hall chip-single-MCU-single-CAN current sensor of claim 1, wherein both of the functional safety levels of the two high-range hall chips (102) are ASIL C levels.
3. The four-hall chip-single MCU-single CAN current sensor of claim 1, wherein both of the low range hall chips (103) are ASIL C grade in functional safety.
4. The four-hall chip-single MCU-single CAN current sensor according to claim 1, wherein the functional safety level of the MCU micro control unit (101) is ASIL D level.
5. The four-Hall-chip-single-MCU-single-CAN current sensor according to claim 1, wherein the high-range Hall chip (102) has a current detection range of 200-1500A.
6. The four-Hall-chip-single-MCU-single-CAN current sensor according to claim 1, wherein the low-range Hall chip (103) has a current detection range of 100-300A.
7. The four-Hall-chip-single-MCU-single-CAN current sensor according to claim 1, wherein the input power of the current sensor is a DC power supply, and the voltage of the input power is between 4.8-5.2V.
8. The four-Hall chip-single MCU-single CAN current sensor of claim 1, wherein the current sensor has a functional safety rating not lower than ASIL C rating.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117572051A (en) * | 2023-12-05 | 2024-02-20 | 上海深启半导体科技有限公司 | Current detection method with detection accuracy and reliability |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117572051A (en) * | 2023-12-05 | 2024-02-20 | 上海深启半导体科技有限公司 | Current detection method with detection accuracy and reliability |
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