CN217376465U

CN217376465U - Test unloader of laser instrument

Info

Publication number: CN217376465U
Application number: CN202123450283.4U
Authority: CN
Inventors: 王泰山; 刘文斌; 蓝清锋; 程珠敏
Original assignee: Shenzhen Raybow Optoelectronics Co ltd
Current assignee: Shenzhen Raybow Optoelectronics Co ltd
Priority date: 2021-12-31
Filing date: 2021-12-31
Publication date: 2022-09-06
Anticipated expiration: 2031-12-31

Abstract

The utility model relates to a semiconductor laser chip test technical field especially relates to a test unloader of laser instrument. The test blanking device of the laser comprises a first clamping seat, an elastic clamping piece, a second clamping seat and a clamping hole; the first end of the elastic clamping piece is integrally formed on the first clamping seat, the second clamping seat and the second end of the elastic clamping piece are integrally formed, the second clamping seat is in clamping connection with the first clamping seat through the elastic clamping piece, and a separation groove is formed among the first clamping seat, the elastic clamping piece and the second clamping seat; the clamping hole is formed between the first clamping seat and the second clamping seat, the separation groove is in penetrating connection with the clamping hole, and the clamping hole is used for placing a laser. The application discloses test unloader of laser instrument: the blanking after the laser is tested is convenient, the contact area between the laser and a test heat dissipation plate jig does not need to be sacrificed, and the operation is simple.

Description

Test unloader of laser instrument

Technical Field

The application relates to the technical field of semiconductor laser chip testing, in particular to a testing and blanking device of a laser.

Background

The semiconductor laser chip is a core part of the semiconductor laser and has a name of a semiconductor laser "CPU". The most common package form of a semiconductor laser chip is cos (chip On subassembly), TO (trasistout-line), and the like. TO packages are generally referred TO as coaxial devices, which have dominated the optical device market because of ease of manufacture and cost advantages. Adopt TO encapsulated semiconductor laser, on the one hand, because higher heat dissipation requirement, test heating panel tool need be hugged closely TO TO encapsulated semiconductor laser, and on the other hand, TO encapsulated semiconductor laser whole size is less, and the difficult operation TO encapsulated semiconductor laser of itself again because test heating panel tool need be hugged closely TO TO encapsulated semiconductor laser, causes TO accomplish after the test, TO encapsulated semiconductor laser is difficult TO carry out the unloading from test heating panel tool, seriously influences efficiency of software testing. The conventional solution is TO sacrifice the contact area between the TO-packaged semiconductor laser and a test heat dissipation plate jig and leave a blanking space, and the test heat dissipation performance of the TO-packaged semiconductor laser can be sacrificed by the solution, so that the accuracy and reliability of the represented performance parameters are affected.

SUMMERY OF THE UTILITY MODEL

The application provides a test unloader of laser instrument both makes things convenient for the unloading after the laser instrument test, need not to sacrifice the area of contact of laser instrument and test heating panel tool again to easy operation.

In order to achieve the above object, the present application provides a test blanking device for a laser, including: the clamping device comprises a first clamping seat, an elastic clamping piece, a second clamping seat and a clamping hole; the first end of the elastic clamping piece is integrally formed on the first clamping seat, the second clamping seat and the second end of the elastic clamping piece are integrally formed, the second clamping seat is in clamping connection with the first clamping seat through the elastic clamping piece, and a separation groove is formed among the first clamping seat, the elastic clamping piece and the second clamping seat; the clamping hole is formed between the first clamping seat and the second clamping seat, the separation groove is in penetrating connection with the clamping hole, and the clamping hole is used for placing a laser.

As an improvement of the above scheme, the test blanking device for the laser further includes a first protection member, and the first protection member is convexly provided on the side wall of the first holder facing the laser and/or the side wall of the second holder facing the laser.

As an improvement of the above scheme, the test blanking device for the laser further includes a protection hole, the protection hole is formed in the side wall of the first holder facing the laser and/or the side wall of the second holder facing the laser, and the first protection piece is arranged in the protection hole.

As an improvement of the above scheme, at least two of the protection holes are provided, and a plurality of the protection holes are uniformly distributed around the radial circumferential direction of the clamp hole.

As an improvement of the above scheme, the separation groove includes a first separation groove and a second separation groove, the first separation groove intersects and communicates with the second separation groove, the first separation groove is located between the first holder, the elastic clamping member and the second holder, and the second separation groove is located between the first holder and the second holder.

As an improvement of the scheme, the clamping hole is step-shaped, and the inlet end of the clamping hole is the end with the largest inner diameter.

As an improvement of the above scheme, the test blanking device of the laser further comprises an auxiliary piece, and the auxiliary piece is arranged on the side wall of the first clamping seat and/or the side wall of the second clamping seat.

As an improvement of the above scheme, the auxiliary member is disposed on a side wall of the first holder near the inlet end of the clamping hole and/or a side wall of the second holder near the inlet end of the clamping hole.

As an improvement of the above scheme, the first holder is provided with a first side wall and a second side wall extending from the first side wall, the second holder is provided with a third side wall and a fourth side wall extending from the third side wall, the separation groove is located between the second side wall and the fourth side wall, the first side wall and the fourth side wall are arranged in a right-to-left manner, and the first side wall and the fourth side wall are both provided with the auxiliary member.

As an improvement of the above scheme, the test blanking device of the laser further comprises a second protection piece, and the second protection piece is fixed on the hole wall of the clamping hole in a surrounding mode.

Compare in prior art, the test unloader of a laser instrument of this application is equipped with first holder, elasticity holder, second holder and double-layered hole: utilize the double-layered hole to place the laser instrument, recycle the second holder and pass through the elasticity holder and be connected with first holder centre gripping, realize the test unloader of laser instrument and the loading and the dismantlement of laser instrument utilize first holder and second holder person of facilitating the use to take the laser instrument, avoid leading to the problem that the laser instrument is difficult to the unloading from above the test heating panel tool because the size of laser instrument is less, also need not to sacrifice the area of contact of laser instrument and test heating panel tool, guaranteed the performance parameter accuracy, the reliability of sign to easy operation.

Drawings

The present application will now be described with reference to the accompanying drawings. The drawings in the present application are for the purpose of illustrating embodiments only. Other embodiments can be readily made by those skilled in the art from the following description of the steps described without departing from the principles of the present application.

Fig. 1 is an assembly schematic diagram of a test blanking device of a laser according to the present application.

Fig. 2 is a schematic use view of a test blanking device of a laser according to the present application.

Fig. 3 is a cross-sectional view of a laser test blanking apparatus of the present application.

Fig. 4 is a bottom view of a laser test blanking apparatus of the present application.

Description of the main structure and symbols:

10. a test blanking device of the laser; 11. a first holder; 111. a first side wall; 112. a second side wall; 12. an elastic clamping member; 13. a second holder; 131. a third side wall; 132. a fourth side wall; 14. a clipping hole; 15. a separation tank; 151. a first partition groove; 152. a second partition groove; 16. a first guard; 17. a protective aperture; 18. an auxiliary member; 19. a second guard; 20. a laser; 30. the heat dissipation plate jig is tested.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. It is to be understood that the specific embodiments described herein are merely illustrative of the application and are not limiting of the application. It should be further noted that, for the convenience of description, only some of the structures related to the present application are shown in the drawings, not all of the structures. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

The terms "first", "second", etc. in this application are used to distinguish different objects, and are not used to describe a particular order. Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.

Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.

Example 1:

referring to fig. 1 to 4, an embodiment of the present application provides a test blanking device 10 for a laser, where the test blanking device 10 for a laser includes: the clamping device comprises a first clamping seat 11, an elastic clamping piece 12, a second clamping seat 13 and a clamping hole 14; the first end of the elastic clamping piece 12 is integrally formed on the first clamping seat 11, the second clamping seat 13 is integrally formed with the second end of the elastic clamping piece 12, the second clamping seat 13 is connected with the first clamping seat 11 in a clamping manner through the elastic clamping piece 12, and a separation groove 15 is formed among the first clamping seat 11, the elastic clamping piece 12 and the second clamping seat 13; the clamping hole 14 is arranged between the first clamping seat 11 and the second clamping seat 13, the separation groove 15 is connected with the clamping hole 14 in a penetrating manner, and the clamping hole 14 is used for placing a laser 20.

Specifically, the first clamping seat 11 and the second clamping seat 13 are broken TO enlarge the radial area of the clamping hole 14, the head of the TO-packaged semiconductor laser 20 is placed in the clamping hole 14, the radial area of the clamping hole 14 is reduced by pinching the outer walls of the first clamping seat 11 and the second clamping seat 13, the head of the TO-packaged semiconductor laser 20 is clamped in the clamping hole 14, the tail of the TO-packaged semiconductor laser 20 is conveniently installed on a test heat dissipation plate jig 30 or loaded and unloaded from the test heat dissipation plate jig 30, the TO-packaged semiconductor laser 20 is placed in the clamping hole 14, the second clamping seat 13 is clamped and connected with the first clamping seat 11 through an elastic clamping piece 12, the loading and unloading of the TO-packaged semiconductor laser 20 and the test unloading device 10 of the laser are realized, the TO-packaged semiconductor laser 20 is conveniently taken by a user through the first clamping seat 11 and the second clamping seat 13, avoid because the less semiconductor laser 20 that leads TO the TO encapsulation of size is difficult TO the problem of unloading from testing heating panel tool 30 upper face, also need not TO sacrifice the semiconductor laser 20 of TO encapsulation and test heating panel tool 30 area of contact, guaranteed the performance parameter accuracy of sign, reliability, utilize the first end integrated into one piece of elasticity holder 12 in first holder 11, second holder 13 and the 12 second end integrated into one piece of elasticity holder, make the test unloader 10 of laser instrument's simple structure easily operates. Specifically, the shape of the clip hole 14 is adapted TO the head of the TO packaged semiconductor laser 20.

Referring to fig. 1 to 3, the elastic clamping member 12 is in a sheet shape, so as to realize the molding connection between the first clamping seat 11 and the second clamping seat 13, and the elastic clamping member 12 is in a sheet shape, so that when the first clamping seat 11 and the second clamping seat 13 are clamped by force, the first clamping seat 11 and the second clamping seat 13 can be elastically deformed to form a clamping force.

Referring to fig. 1, 3 and 4, the laser test blanking apparatus 10 further includes a first protection member 16, the first protection member 16 is convexly disposed on a side wall of the first holder 11 facing the laser 20 and/or a side wall of the second holder 13 facing the laser 20, that is, both the side wall of the first holder 11 facing the laser 20 and the side wall of the second holder 13 facing the laser 20 are convexly disposed with the first protection member 16, and one of the side wall of the first holder 11 facing the laser 20 and the side wall of the second holder 13 facing the laser 20 is convexly disposed with the first protection member 16.

Specifically, the first protection part 16 is used to prevent the test blanking device 10 of the laser from directly touching the test heat sink jig 30, and prevent the test blanking device 10 of the laser from damaging the test heat sink jig 30 during the blanking process.

Further, the first protection part 16 is made of a silicone material or a plastic material, so that the test blanking device 10 of the laser device is effectively prevented from damaging the test heat dissipation plate jig 30 in the blanking process.

Referring to fig. 4, the testing and blanking device 10 for a laser further includes a protection hole 17, the protection hole 17 is disposed on a side wall of the first holder 11 facing the laser 20 and/or a side wall of the second holder 13 facing the laser 20, that is, both the side wall of the first holder 11 facing the laser 20 and the side wall of the second holder 13 facing the laser 20 are provided with the protection hole 17, one of the side wall of the first holder 11 facing the laser 20 and the side wall of the second holder 13 facing the laser 20 is provided with the protection hole 17, and the first protection member 16 is disposed in the protection hole 17.

Specifically, the first protection part 16 is installed and fixed by using the protection hole 17, the depth of the protection hole 17 is greater than the height of the first protection part 16, so that the first protection part 16 can be exposed out of the protection hole 17, the test blanking device 10 of the laser is prevented from directly touching the test cooling plate jig 30, and the test blanking device 10 of the laser is prevented from damaging the test cooling plate jig 30 in the blanking process.

Referring to fig. 4, at least two protection holes 17 are provided, and the protection holes 17 are uniformly distributed around the radial circumferential direction of the clamping hole 14.

Specifically, the protection holes 17 are uniformly distributed around the radial circumferential direction of the clamp hole 14, so that the first protection pieces 16 are uniformly distributed on the first clamp seat 11 and the bottom wall formed by splicing the first clamp seat 11, and the clamping area of the head of the TO-packaged semiconductor laser 20 and the test blanking device 10 of the laser is prevented from being affected.

Referring to fig. 1 to 4, the separation groove 15 includes a first separation groove 151 and a second separation groove 152, the first separation groove 151 intersects and communicates with the second separation groove 152, the first separation groove 151 is located between the first holder 11, the elastic clamping member 12 and the second holder 13, and the second separation groove 152 is located between the first holder 11 and the second holder 13. In particular, a clamping connection of the first holder 11 with the second holder 13 is achieved.

Referring to fig. 1, 3 and 4, the clamping hole 14 is stepped, and the inlet end of the clamping hole 14 is the end with the largest inner diameter. The definition of the clamping hole 14 with the head of the TO packaged semiconductor laser 20 is achieved.

Referring to fig. 1 to 4, the test blanking device 10 of the laser further includes an auxiliary component 18, where the auxiliary component 18 is disposed on a side wall of the first clamping seat 11 and/or a side wall of the second clamping seat 13, that is, the auxiliary component 18 is disposed on both the side wall of the first clamping seat 11 and the side wall of the second clamping seat 13, or the auxiliary component 18 is disposed on one of the side wall of the first clamping seat 11 and the side wall of the second clamping seat 13.

Specifically, the use of the auxiliary member 18 facilitates the user TO enlarge the radial dimension of the separation groove 15, i.e., TO make the radial dimension of the clip hole 14, TO facilitate the placement of the head of the TO-packaged semiconductor laser 20 into the clip hole 14.

Referring to fig. 1 to 4, the auxiliary element 18 is disposed on a sidewall of the first holder 11 near the inlet end of the clamping hole 14 and/or a sidewall of the second holder 13 near the inlet end of the clamping hole 14. In particular, the radial dimension of the separating channel 15 can be easily enlarged by the user without applying excessive pulling force to the auxiliary element 18.

Referring to fig. 1 and fig. 2, the first holder 11 has a first sidewall 111 and a second sidewall 112 extending from the first sidewall 111, the second holder 13 has a third sidewall 131 and a fourth sidewall 132 extending from the third sidewall 131, the separation groove 15 is located between the second sidewall 112 and the fourth sidewall 132, the first sidewall 111 is opposite to the fourth sidewall 132, and the first sidewall 111 and the fourth sidewall 132 are both provided with the auxiliary component 18.

In particular, by providing the auxiliary member 18 on both the first side wall 111 and the fourth side wall 132, the user can further enlarge the radial dimension of the separation groove 15.

Referring to fig. 1, 3 and 4, the test blanking device 10 of the laser further includes a second protection member 19, and the second protection member 19 is fixed around the hole wall of the clamping hole 14. The second protection piece 19 is used for preventing the test blanking device 10 of the laser from damaging the TO packaged semiconductor laser 20.

The working principle of the testing and blanking device 10 of the laser device is as follows: the first clamping seat 11 and the second clamping seat 13 are broken off TO enlarge the radial area of the clamping hole 14, the head of the TO-packaged semiconductor laser 20 is placed in the clamping hole 14, the radial area of the clamping hole 14 is reduced by tightly pinching the outer walls of the first clamping seat 11 and the second clamping seat 13, the head of the TO-packaged semiconductor laser 20 is clamped in the clamping hole 14, the tail of the TO-packaged semiconductor laser 20 is conveniently installed on a test heat dissipation plate jig 30 or loaded and unloaded from the test heat dissipation plate jig 30, the TO-packaged semiconductor laser 20 is placed in the clamping hole 14, the second clamping seat 13 is connected with the first clamping seat 11 in a clamping mode through an elastic clamping piece 12, the loading and the unloading device 10 of the laser and the TO-packaged semiconductor laser 20 are achieved, a user can conveniently take the TO-packaged semiconductor laser 20 by using the first clamping seat 11 and the second clamping seat 13, avoid because the less problem that leads TO the semiconductor laser 20 of TO encapsulation from testing heat dissipation plate tool 30 top TO the unloading of the less semiconductor laser 20 that leads TO of TO encapsulation, also need not TO sacrifice the area of contact of the semiconductor laser 20 of TO encapsulation and testing heat dissipation plate tool 30, guaranteed the performance parameter accuracy of sign, reliability, utilize the first end integrated into one piece of elasticity holder 12 in first holder 11, second holder 13 and the second end integrated into one piece of elasticity holder 12, make the test unloader 10 of laser instrument's simple structure easily operates.

The above are only preferred embodiments of the present application, and not intended to limit the scope of the present application, and all equivalent structures or equivalent processes performed by the present application and the contents of the attached drawings, which are directly or indirectly applied to other related technical fields, are also included in the scope of the present application.

Claims

1. The utility model provides a test unloader of laser instrument which characterized in that includes:

a first holder;

the first end of the elastic clamping piece is integrally formed on the first clamping seat;

the second clamping seat and the second end of the elastic clamping piece are integrally formed, the second clamping seat is connected with the first clamping seat in a clamping mode through the elastic clamping piece, and a separation groove is formed among the first clamping seat, the elastic clamping piece and the second clamping seat;

the clamping hole is formed between the first clamping seat and the second clamping seat, the separation groove is in penetrating connection with the clamping hole, and the clamping hole is used for placing a laser.

2. The test blanking device for the laser device as claimed in claim 1, further comprising a first protection member protruding from the side wall of the first holder facing the laser device and/or the side wall of the second holder facing the laser device.

3. The laser testing and blanking device of claim 2, further comprising a protection hole, wherein the protection hole is formed in the side wall of the first holder facing the laser and/or the side wall of the second holder facing the laser, and the first protection member is arranged in the protection hole.

4. The laser test blanking device of claim 3, wherein at least two of the protection holes are provided, and a plurality of the protection holes are uniformly distributed around a radial circumferential direction of the clamping hole.

5. The laser test blanking device of any one of claims 1 to 4, wherein the separation groove comprises a first separation groove and a second separation groove, the first separation groove intersects with and communicates with the second separation groove, the first separation groove is located among the first holder, the elastic clamping member and the second holder, and the second separation groove is located between the first holder and the second holder.

6. The test blanking device for the laser device according to any one of claims 1 to 4, wherein the clamping hole is stepped, and an inlet end of the clamping hole is an end with a largest inner diameter.

7. The laser test blanking device of any one of claims 1 to 4, further comprising an auxiliary member, wherein the auxiliary member is disposed on a side wall of the first holder and/or a side wall of the second holder.

8. The laser test blanking device of claim 7, wherein the auxiliary member is disposed on a side wall of the first holder near the inlet end of the hole and/or a side wall of the second holder near the inlet end of the hole.

9. The blanking apparatus for testing laser device of claim 8, wherein the first holder has a first sidewall and a second sidewall extending from the first sidewall, the second holder has a third sidewall and a fourth sidewall extending from the third sidewall, the separating groove is located between the second sidewall and the fourth sidewall, the first sidewall and the fourth sidewall are opposite to each other, and the first sidewall and the fourth sidewall are both provided with the auxiliary member.

10. The laser test blanking device of any one of claims 1 to 4, further comprising a second protection member circumferentially fixed to a wall of the clamping hole.