CN217332729U - Reliability analysis's test structure among integrated circuit - Google Patents

Reliability analysis's test structure among integrated circuit Download PDF

Info

Publication number
CN217332729U
CN217332729U CN202220832676.7U CN202220832676U CN217332729U CN 217332729 U CN217332729 U CN 217332729U CN 202220832676 U CN202220832676 U CN 202220832676U CN 217332729 U CN217332729 U CN 217332729U
Authority
CN
China
Prior art keywords
strip
base
test structure
slider
reliability analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN202220832676.7U
Other languages
Chinese (zh)
Inventor
韩春萌
陈文博
植济壮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shark Smart End Shenzhen Technology Co ltd
Original Assignee
Shark Smart End Shenzhen Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shark Smart End Shenzhen Technology Co ltd filed Critical Shark Smart End Shenzhen Technology Co ltd
Priority to CN202220832676.7U priority Critical patent/CN217332729U/en
Application granted granted Critical
Publication of CN217332729U publication Critical patent/CN217332729U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Tests Of Electronic Circuits (AREA)

Abstract

The utility model discloses a reliability analysis's test structure among integrated circuit, the on-line screen storage device comprises a base, the upper end symmetry of base is provided with two connecting strips, two the opposite face of connecting strip all is provided with the spout, two all be provided with gliding slider from top to bottom in the spout, two the equal fixedly connected with rectangle box of opposite side of slider, every the lower extreme and the inside of rectangle box are provided with buffer gear jointly, two set up stop gear jointly in the spout, the symmetry is provided with two strip chambeies, two in the base the strip intracavity all is provided with the elevating system who is used for going up and down to correspond the slider. This structure can be comparatively simple just can realize spacing to the circuit board, and spacing and subsequent spacing operation of relieving are all comparatively convenient, and the cooperation buffer gear can avoid damaging the condition appearance of circuit board.

Description

Reliability analysis's test structure among integrated circuit
Technical Field
The utility model relates to an integrated circuit board tests technical field, especially relates to a reliability analysis's test structure among integrated circuit.
Background
An integrated circuit is a microelectronic device or component. The transistor, the resistor, the capacitor, the inductor and other elements and wires required in a circuit are interconnected together by adopting a certain process, are manufactured on a small or a plurality of small semiconductor wafers or medium substrates, and are then packaged in a tube shell to form a micro structure with the required circuit function; wherein all elements are structurally integrated;
the test of reliability analysis among the present integrated circuit generally adopts a universal meter of using that detects to detect each position of circuit, and in the testing process, need carry on spacingly to the circuit board earlier, but the general operation of current spacing mode is comparatively troublesome, and spacing for rigid spacing, easily damages integrated circuit board.
SUMMERY OF THE UTILITY MODEL
The utility model aims at solving the shortcoming that exists among the prior art, and the test structure of reliability analysis among the integrated circuit who proposes, this structure can be comparatively simple just can realize carrying on spacingly to the circuit board, and spacing and subsequent spacing operation of removing is all comparatively convenient, and the condition that can avoid damaging the circuit board appears in cooperation buffer gear.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
the utility model provides a reliability analysis's test structure among integrated circuit, the on-line screen storage device comprises a base, the upper end symmetry of base is provided with two connecting strips, two the opposite face of connecting strip all is provided with the spout, two all be provided with gliding slider from top to bottom in the spout, two the equal fixedly connected with rectangle box in opposite side of slider, every the lower extreme and the inside of rectangle box are provided with buffer gear jointly, two set up stop gear jointly in the spout, the symmetry is provided with two strip chambeies, two the strip intracavity all is provided with the elevating system who is used for going up and down to correspond the slider.
Preferably, a sliding rod is fixedly connected between the upper inner wall and the lower inner wall of each sliding groove, and each sliding rod penetrates through the corresponding sliding block and is in sliding connection with the corresponding sliding block.
Preferably, the buffer mechanism comprises a sliding plate slidably connected in the rectangular box, the upper end of the sliding plate is elastically connected with the inner bottom of the rectangular box through a plurality of second springs, the lower end of the sliding plate is fixedly connected with a pressure column, and the lower end of the pressure column penetrates through the inner bottom of the rectangular box.
Preferably, a plurality of guide posts are fixedly connected to the upper end of the base.
Preferably, the lifting mechanism comprises a magnetic block which is slidably connected in the strip-shaped cavity, the lower end of the magnetic block is elastically connected with the inner bottom of the strip-shaped cavity through a first spring, the upper end of the magnetic block is connected with the inner top of the strip-shaped cavity through a first air bag, an electromagnet is embedded in the inner bottom of the strip-shaped cavity, and the electromagnet is repelled by like poles of adjacent surfaces of the corresponding magnetic blocks after being electrified.
Preferably, every be provided with the second gasbag in the lower extreme of slider all with the spout that corresponds between the bottom, every the second gasbag all passes through the connecting pipe intercommunication with the first gasbag that corresponds, touch delay switch is installed in the left side of base, touch delay switch and two electro-magnet electric connection.
Compared with the prior art, the utility model, its beneficial effect does:
1. be provided with touch delay switch and electro-magnet, under the cooperation through touch delay switch and electro-magnet, can be comparatively simple just can realize spacing the circuit board, it is all comparatively convenient with subsequent spacing operation of removing.
2. Through the setting of second spring, can avoid the rigid contact of pressurization post with the collection dirt circuit board, when spacing collection dirt circuit board, also protected it.
Drawings
Fig. 1 is a schematic structural diagram of a test structure for reliability analysis in an integrated circuit according to the present invention;
FIG. 2 is an enlarged view of FIG. 1 at A;
fig. 3 is a state diagram of the electromagnet in fig. 1 after being electrified.
In the figure: the device comprises a base 1, a strip cavity 2, a touch delay switch 3, a magnetic block 4, a first air bag 5, a first spring 6, an electromagnet 7, a guide column 8, a connecting strip 9, a sliding chute 10, a sliding rod 11, a sliding block 12, a rectangular box 13, a sliding plate 14, a pressurizing column 15, a second spring 16, a second air bag 17 and a connecting pipe 18.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.
Referring to fig. 1-3, a test structure for reliability analysis in an integrated circuit includes a base 1, a plurality of guide posts 8 are fixedly connected to the upper end of the base 1, two connecting strips 9 are symmetrically arranged on the upper end of the base 1, sliding grooves 10 are respectively arranged on the opposite surfaces of the two connecting strips 9, sliding blocks 12 capable of sliding up and down are respectively arranged in the two sliding grooves 10, a sliding rod 11 is fixedly connected between the upper inner wall and the lower inner wall of each sliding groove 10, each sliding rod 11 penetrates through the corresponding sliding block 12 and is slidably connected with the corresponding sliding block 12, and rectangular boxes 13 are respectively fixedly connected to the opposite sides of the two sliding blocks 12;
wherein, the lower end and the interior of each rectangular box 13 are provided with a buffer mechanism together, the buffer mechanism comprises a sliding plate 14 which is connected in the rectangular box 13 in a sliding way, the upper end of the sliding plate 14 is elastically connected with the inner bottom of the rectangular box 13 through a plurality of second springs 16, the lower end of the sliding plate 14 is fixedly connected with a pressure column 15, and the lower end of the pressure column 15 penetrates through the inner bottom of the rectangular box 13;
wherein, the two chutes 10 are internally provided with a limiting mechanism together, the base 1 is internally provided with two strip cavities 2 symmetrically, the two strip cavities 2 are internally provided with a lifting mechanism used for lifting the corresponding slide block 12, the lifting mechanism comprises a magnetic block 4 which is connected in the strip cavities 2 in a sliding way, the front side and the rear side of the magnetic block 4 are provided with damping layers, so that the downward moving speed is not too high when the magnetic block moves downwards continuously, the lower end of the magnetic block 4 is elastically connected with the inner bottom of the strip cavity 2 through a first spring 6, the upper end of the magnetic block 4 is connected with the inner top of the strip cavity 2 through a first air bag 5, the inner bottom of the strip cavity 2 is embedded with an electromagnet 7, the electromagnet 7 is repelled with the same polarity on the adjacent surface of the corresponding magnetic block 4 after being electrified, a second air bag 17 is arranged between the lower end of each slide block 12 and the inner bottom of the corresponding chute 10, each second air bag 17 is communicated with the corresponding first air bag 5 through a connecting pipe 18, touch delay switch 3 is installed in the left side of base 1, touch delay switch 3 and two electro-magnet 7 electric connection, and there is a power in addition here, and power, touch delay switch 3 and two electro-magnet 7 form a return circuit, and touch delay switch 3 is for having the technique, and it is touched the back, can let the circuit switch on a terminal time after, self-closing circuit.
The utility model discloses in, when using, touch time delay switch 3 earlier, at this moment two electro-magnets 7 can switch on a terminal time, in this period of time, receive the repulsion effect, two magnetic blocks 4 can shift up, and tensile two first springs 6, two magnetic blocks 4 move up the back, and compress and correspond first gasbag 5, through connecting pipe 18, can let two second gasbags 17 expand, and drive slider 12 and shift up, be in the state of fig. 3, at this moment, align the pore at dust collecting circuit board edge with corresponding guide post 8, then place on base 1, touch time delay switch 3 outage at this moment, receive the elastic action of first spring 6, at this moment can resume the state of fig. 1 again, two pressure post 15 pressurize on dust collecting circuit board, realize spacing;
the second spring 16 can avoid the hard contact between the pressure column 15 and the dust collecting circuit board, protect the dust collecting circuit board when limiting the dust collecting circuit board, touch the time delay switch 3 again after the test is finished, and then the dust collecting circuit board is in the state shown in figure 3, and then the dust collecting circuit board is taken down and put into a new integrated circuit board.
The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.

Claims (6)

1. The utility model provides a reliability analysis's test structure among integrated circuit, includes base (1), its characterized in that, the upper end symmetry of base (1) is provided with two connecting strip (9), two the opposite face of connecting strip (9) all is provided with spout (10), two all be provided with gliding slider (12) from top to bottom in spout (10), two the equal fixedly connected with rectangle box (13) of opposite side of slider (12), every the lower extreme and the inside of rectangle box (13) are provided with buffer gear jointly, two set up stop gear jointly in spout (10), the symmetry is provided with two strip chambeies (2) in base (1), two all be provided with the elevating system who is used for going up and down to correspond slider (12) in strip chamber (2).
2. The test structure for reliability analysis in integrated circuits according to claim 1, wherein a sliding rod (11) is fixedly connected between the upper inner wall and the lower inner wall of each sliding groove (10), and each sliding rod (11) penetrates through the corresponding sliding block (12) and is slidably connected with the corresponding sliding block (12).
3. The test structure of reliability analysis in integrated circuit according to claim 1, wherein the buffer mechanism comprises a sliding plate (14) slidably connected inside the rectangular box (13), the upper end of the sliding plate (14) is elastically connected to the inner bottom of the rectangular box (13) through a plurality of second springs (16), the lower end of the sliding plate (14) is fixedly connected with a pressure column (15), and the lower end of the pressure column (15) penetrates through the inner bottom of the rectangular box (13).
4. The test structure for reliability analysis in integrated circuits according to claim 1, wherein a plurality of guide posts (8) are fixedly connected to the upper end of the base (1).
5. The test structure for reliability analysis in integrated circuits according to claim 1, wherein the lifting mechanism comprises a magnetic block (4) slidably connected in the strip-shaped cavity (2), the lower end of the magnetic block (4) is elastically connected with the inner bottom of the strip-shaped cavity (2) through a first spring (6), the upper end of the magnetic block (4) is connected with the inner top of the strip-shaped cavity (2) through a first air bag (5), an electromagnet (7) is embedded in the inner bottom of the strip-shaped cavity (2), and the electromagnet (7) is repelled with the same polarity on the adjacent surface of the corresponding magnetic block (4) after being electrified.
6. The structure of claim 5, wherein a second air bag (17) is disposed between the lower end of each slider (12) and the bottom of the corresponding sliding groove (10), each second air bag (17) is communicated with the corresponding first air bag (5) through a connecting pipe (18), a touch delay switch (3) is installed on the left side of the base (1), and the touch delay switch (3) is electrically connected with the two electromagnets (7).
CN202220832676.7U 2022-04-12 2022-04-12 Reliability analysis's test structure among integrated circuit Expired - Fee Related CN217332729U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202220832676.7U CN217332729U (en) 2022-04-12 2022-04-12 Reliability analysis's test structure among integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202220832676.7U CN217332729U (en) 2022-04-12 2022-04-12 Reliability analysis's test structure among integrated circuit

Publications (1)

Publication Number Publication Date
CN217332729U true CN217332729U (en) 2022-08-30

Family

ID=82947426

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202220832676.7U Expired - Fee Related CN217332729U (en) 2022-04-12 2022-04-12 Reliability analysis's test structure among integrated circuit

Country Status (1)

Country Link
CN (1) CN217332729U (en)

Similar Documents

Publication Publication Date Title
CN108957179A (en) Fingerprint mould group pressure test device
CN217332729U (en) Reliability analysis's test structure among integrated circuit
CN111750219A (en) Digital product support based on capacitance change control
CN115097294B (en) Detection apparatus for chip resistant extreme value with earth leakage detection protect function
CN110988412A (en) Detection box for detecting current and voltage of circuit
CN108922575B (en) Thimble test fixture of PCIE solid state hard drives
CN207742317U (en) A kind of device being suitable for quickly detection multiple battery management system
CN215119426U (en) Inter-board connector for communication
WO2023070652A1 (en) Relay contact voltage drop test fixture
CN207670475U (en) A kind of switch module of steering wheel multi-buffer
CN217060416U (en) Reliability analysis's test structure among integrated circuit
CN107068489B (en) The mechanism loading of relay
CN212160009U (en) Chip testing device with limiting structure
CN210198875U (en) Fragrant pear simulation detection device that falls to detect a flaw
CN114236370B (en) Capacitor capacity value detection device for flexible direct-current transmission converter valve submodule
CN215415675U (en) State detection equipment for electronic module after storage and transportation
CN218938367U (en) Control box for instantaneously capturing discharge residual voltage
CN219016514U (en) PCBA switches on detection device
CN111642919A (en) Instant stabilization method for household drawer
CN217385669U (en) Pressure control mechanism
CN219936051U (en) High-efficiency voltage-withstanding testing device for switch leakage test bench
CN218674228U (en) Switch detection mechanism
CN220490635U (en) High stability filtering capability tester
CN220295275U (en) Plug force checking and sorting device for electric connector contact
CN209349817U (en) A kind of mechanization buckle device processed automatically

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20220830