CN108922575B

CN108922575B - Thimble test fixture of PCIE solid state hard drives

Info

Publication number: CN108922575B
Application number: CN201810376761.5A
Authority: CN
Inventors: 王再国; 张胤; 张黎斌
Original assignee: Foxwell Electronic Technology Bozhou Co ltd
Current assignee: Foxwell Electronic Technology Bozhou Co ltd
Priority date: 2018-04-25
Filing date: 2018-04-25
Publication date: 2021-05-25
Anticipated expiration: 2038-04-25
Also published as: CN108922575A

Abstract

The invention discloses a thimble test fixture of a PCIE solid state disk, which comprises a test fixture whole, wherein the test fixture whole comprises an operation board and a placing board, a plurality of embedding openings are formed in a slide rail, the operation board is connected with a fixed rod and a movable rod, and the fixed rod is movably connected with a thimble group; a communicating groove is formed in the side wall of the piston cavity between the first piston blocks, a second piston block is movably arranged in the communicating groove, and the second piston block is fixedly connected to the thimble group; the piston block I is fixedly connected with a connecting rod, the connecting rod is provided with a spring groove, a spring is arranged in the spring groove, the spring is connected with a fixed rod, and one side of the operating plate, which is close to the fixed rod, is provided with an insertion hole. The invention provides a thimble test fixture for a PCIE solid state disk, which has the advantages that the pressure of a thimble can be buffered and limited, the solid state disk cannot be damaged due to misoperation, meanwhile, the position of the thimble can be moved according to needs, and the application range is larger.

Description

Thimble test fixture of PCIE solid state hard drives

Technical Field

The invention relates to the technical field of test jigs, in particular to a thimble test jig of a PCIE solid state disk.

Background

At present, a solid state disk as a novel storage product has a series of advantages of high speed, long service life, low power consumption and the like compared with a traditional mechanical hard disk, and the solid state disk is formed by mounting a high-capacity Flash IC on a circuit board through an SM (short message) process technology, and is convenient for computer assembly due to small volume; when a PCIE solid state disk product is tested, four data lines, a 5V power line and a grounding line need to be connected, and after the test is finished, the lines need to be dismantled, so that the test efficiency is too low, the process is complex, and the working time is wasted.

In the prior art, an ejector PIN testing jig of a PCIE solid state disk with application number "201520102326.5" includes a support and a testing board, the support is fixed on the testing board, a fixing frame is disposed on the support, a fixing ring is disposed on the fixing frame, a hand pressing handle is inserted into the fixing ring, a lifting handle is connected to the hand pressing handle, the bottom end of the hand pressing handle is fixedly connected to a support frame, the support frame includes an upper acrylic plate and a lower acrylic plate, a fixing frame of an integrated circuit board is disposed on the testing board, a plurality of fixing grooves are disposed in the fixing frame, a plurality of limiting blocks are disposed at the edge of the fixing frame, the four data lines, a power line and a grounding line are integrated into the jig together, a PIN ejector PIN is connected; through with the pressure welding data line of hand, promote efficiency of software testing, save cost of manufacture and human cost.

However, the method still has the obvious defects in the using process: 1. a device for buffering the contact pressure degree of the thimble is not provided, and the fixed hard disk can be damaged if too much force is applied during testing; 2. the position of the thimble is immovable, and the use is limited.

Disclosure of Invention

The invention aims to provide a thimble test fixture for a PCIE solid state disk, which is used for solving the problems in the background technology.

In order to achieve the purpose, the invention provides the following technical scheme:

a thimble test fixture of a PCIE solid state hard disk comprises a test fixture whole body, wherein the test fixture whole body comprises an operation plate and a placing plate, the placing plate is fixed on a connecting plate, the operation plate is movably arranged on a slide rail, the slide rail is fixed on the connecting plate, a plurality of embedding openings are formed in the slide rail, the operation plate is connected with a fixed rod and a movable rod, and the fixed rod is movably connected with a thimble group;

a piston cavity is formed in the fixed rod, first piston blocks are symmetrically arranged in the piston cavity, a communicating groove is formed in the side wall of the piston cavity between the first piston blocks, a second piston block is movably arranged in the communicating groove, and the second piston block is fixedly connected to the thimble group;

the piston block I is fixedly connected with a connecting rod, the connecting rod is provided with a spring groove, a spring is arranged in the spring groove, the spring is connected with a fixed rod, and one side of the operating plate, which is close to the fixed rod, is provided with an insertion hole.

Preferably, the thimble group is provided with a plurality of groups, and each group comprises seven thimbles, namely four testing thimbles, a ground wire thimble and two power line thimbles.

Preferably, the blocking blocks are symmetrically arranged on the outer sides of the second piston blocks.

Preferably, one end of the piston block, which is far away from the connecting rod, is connected with a touch pressure rod, an alarm switch is arranged on the inner wall of one side, which is close to the touch pressure rod, of the fixed rod, a touch pressure spring is arranged on the alarm switch, and a vent is formed in one side, which is close to the alarm switch, of the fixed rod.

Preferably, one end of the piston block, which is far away from the connecting rod, is symmetrically provided with movable rod slide rails, and the movable rods are movably arranged on the movable rod slide rails.

Preferably, the placing plate is provided with a transverse sliding rail and a longitudinal sliding rail, and two ends of the transverse sliding rail and two ends of the longitudinal sliding rail are provided with limiting blocks.

Compared with the prior art, the invention has the beneficial effects that:

1. the buffer device can buffer the pressure of the thimble on the solid state disk, so that the solid state disk is prevented from being damaged by improper force application during testing;

2. the position of thimble can remove, is fit for testing the solid state hard drives of different sizes, and application range is wide.

The invention provides a thimble test fixture for a PCIE solid state disk, which has the advantages that the pressure of a thimble can be buffered and limited, the solid state disk cannot be damaged due to misoperation, meanwhile, the position of the thimble can be moved according to needs, and the application range is larger.

Drawings

FIG. 1 is an overall block diagram of the present invention;

FIG. 2 is a detail view of a fixation rod of the present invention;

FIG. 3 is a top cross-sectional detail view of the operator panel of the present invention;

FIG. 4 is an enlarged view of area A of the present invention;

fig. 5 is a detailed view of the slide rail of the present invention.

In the figure: the test fixture comprises a test fixture body 1, an operation board 2, a placing board 3, a connecting board 4, a sliding rail 5, a fixing rod 6, a thimble group 7, a piston cavity 8, a communicating groove 9, a blocking block 10, a connecting rod 11, a spring groove 12, a spring 13, a fixing rod 14, a plug-in hole 15, an embedded inlet 16, a movable rod 17, a movable rod sliding rail 18, a touch and press rod 19, an alarm switch 20, a touch and press spring 21, a vent 22, a transverse sliding rail 23, a longitudinal sliding rail 24, a limiting block 25, a piston block I81 and a piston block II 82.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Referring to fig. 1-5, the present invention provides a technical solution:

the utility model provides a thimble test fixture of PCIE solid state hard drives, including test fixture whole 1, test fixture whole 1 includes operation panel 2 and places board 3, it fixes on connecting plate 4 to place

board

3, 2 activities of operation panel set up on slide rail 5, slide rail 5 fixes on connecting plate 4, operation panel 2 can move on slide rail 5, a plurality of inlets 16 that inlay have been seted up on slide rail 5, operation panel 2 is connected with dead lever 6 and

movable rod

17, 6 swing joint of dead lever has thimble group 7, thimble group 7 is used for being tested by solid state hard drives.

A piston cavity 8 is formed in the fixed rod 6, piston liquid, piston oil and the like are filled in the piston cavity 8, piston blocks 81 are symmetrically arranged in the piston cavity 8, a communicating groove 9 is formed in the side wall of the piston cavity 8 between the piston blocks 81, a piston block II 82 is movably arranged in the communicating groove 9, and the piston block II 82 is fixedly connected to the thimble group 7.

A piston block 81 is fixedly connected with a connecting rod 11, the connecting rod 11 is provided with a spring groove 12, a spring 13 is arranged in the spring groove 12, the spring 13 is connected with a fixing rod 14, one side of the operating panel 2, which is close to the fixing rod 14, is provided with an insertion hole 15, when the connecting rod 11 moves towards the insertion hole 15, the fixing rod 14 can be driven to move along with the insertion hole 15, and the fixing rod 14 can penetrate through the insertion hole 15, so that the fixing rod 6 is fixed by the slide rail 5.

Preferably, the thimble group 7 is provided with a plurality of groups, each group includes seven thimbles, namely four testing thimbles, a ground wire thimble and two power line thimbles, the testing thimbles are connected with the data line and used for testing the solid state disk, the ground wire thimble is connected with the ground wire and used for releasing static electricity or electric leakage, and the power line thimbles are connected with the power line.

Preferably, the two piston blocks 82 are symmetrically provided with the blocking blocks 10 on the outer sides, so that the piston cavities are prevented from failing.

Preferably, one end of the piston block I81, which is far away from the connecting rod 11, is connected with a touch and press rod 19, the inner wall of one side, which is close to the touch and press rod 19, of the fixing rod 6 is provided with an alarm switch 20, the alarm switch 20 is provided with a touch and press spring 21, the touch and press rod 19 extrudes the touch and press spring 21, the touch and press spring 21 triggers the alarm switch 20 to remind an operator of not continuously extruding a detected product, and one side, which is close to the alarm switch 20, of the fixing rod 6 is provided with a vent 22, so that air at two ends of a piston.

Preferably, the end of the first piston block 81 away from the connecting rod 11 is symmetrically provided with movable rod slide rails 18, the movable rod 17 is movably arranged on the movable rod slide rails 18, and the position of the movable rod 17 on the movable rod slide rails 18 can be adjusted according to actual needs.

As a preferred, place and seted up horizontal slide rail 23 and vertical slide rail 24 on the board 3, the both ends of horizontal slide rail 23 and vertical slide rail 24 all are provided with stopper 25, and stopper 25 is used for fixing the position of the article of being surveyed, prevents that the article of being surveyed from taking place to shift in test process, influences test effect.

The working principle is as follows: when the solid state disk needs to be tested, the tested object is firstly placed on the placing plate 3, then the limiting block 25 is adjusted to fix the tested object, and the tested object is prevented from shifting in the testing process. Then, the operation board 2 is pushed to drive the thimble group 7 on the operation board 2 to contact with the test site of the tested product, the thimble just contacts with the test site to be tested, if the tester continuously extrudes the tested product through the thimble during operation, the buffer protection and pressure limiting device is started, specifically, when the thimble group 7 continuously extrudes the tested product, the thimble group 7 pushes the piston cavity 8 through the second piston block 82 to push the connecting rod 11 to move, the connecting rod 11 drives the fixed rod 14 to move along with the connecting rod 11 in the movement process, the fixed rod 14 passes through the insertion hole 15 and then passes through the corresponding insertion hole 16, so that the slide rail 5 of the fixed rod 6 is fixed, at this time, the tester cannot continuously press the operation board 2, and the tested product is prevented from being excessively extruded to form damage.

If the contacted tested object is continuously extruded, the touch rod 19 connected with the first piston block 81 also moves to extrude the touch spring 21, the touch spring 21 is extruded to trigger the alarm switch 20 to remind a tester not to continuously extrude the tested object, and after the touch spring 21 is triggered, the elastic potential energy of the touch spring 21 is converted into kinetic energy to push the touch rod 19 to return to the original position.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides a thimble test fixture of PCIE solid state hard drives, includes that test fixture is whole (1), its characterized in that: the test fixture whole body (1) comprises an operation plate (2) and a placing plate (3), wherein the operation plate (2) and the placing plate (3) are arranged horizontally, the placing plate (3) is fixed on a connecting plate (4), the operation plate (2) is movably arranged on a sliding rail (5), the sliding rail (5) is fixed on the connecting plate (4), a plurality of embedding openings (16) are formed in the sliding rail (5), the operation plate (2) is connected with a fixed rod (6) and a movable rod (17), and the fixed rod (6) and the movable rod (17) are movably connected with a thimble group (7);

a piston cavity (8) is formed in the fixed rod (6), a first piston block (81) and a third piston block (81 ') are symmetrically arranged in the piston cavity (8), a communicating groove (9) is formed in the side wall, close to one end of the thimble group (7), of the piston cavity (8) and between the first piston block (81) and the third piston block (81'), a second piston block (82) is movably arranged in the communicating groove (9), the second piston block (82) can move up and down along the inner wall of the communicating groove (9), and the second piston block (82) is fixedly connected to the thimble group (7);

piston piece (81) fixedly connected with connecting rod (11), spring recess (12) have been seted up in connecting rod (11), be provided with spring (13) in spring recess (12), spring (13) are connected with dead lever (14), inserted hole (15) have been seted up to one side that operation panel (2) are close to dead lever (14), inserted hole (15) and the position of inlaying mouth (16) are corresponding.

2. The ejector pin testing jig for the PCIE solid state disk is characterized in that the ejector pin group (7) is provided with a plurality of groups, each group comprises seven ejector pins, namely four testing ejector pins, one ground wire ejector pin and two power wire ejector pins.

3. The ejector pin test fixture for PCIE solid state disks as claimed in claim 1, wherein the outside of the second piston block (82) is symmetrically provided with a blocking block (10).

4. The ejector pin testing jig for the PCIE solid state disk is characterized in that one end, far away from the connecting rod (11), of the piston block III (81') is connected with a touch-press rod (19), an alarm switch (20) is arranged on the inner wall of one side, close to the touch-press rod (19), of the fixed rod (6), a touch-press spring (21) is arranged on the alarm switch (20), and a vent hole (22) is formed in one side, close to the alarm switch (20), of the fixed rod (6).

5. The ejector pin testing jig for the PCIE solid state disk is characterized in that one end, far away from the connecting rod (11), of the piston block I (81) is symmetrically provided with a movable rod slide rail I (18) and a movable rod slide rail II (18 '), and the movable rod (17) is movably arranged on the movable rod slide rail I (18) and the movable rod slide rail II (18').

6. The ejector pin testing jig for the PCIE solid state disk is characterized in that a transverse slide rail (23) and a longitudinal slide rail (24) are arranged on the placing plate (3), and two ends of the transverse slide rail (23) and two ends of the longitudinal slide rail (24) are provided with limiting blocks (25).