CN217156694U - Tray structure for test equipment, test module and test equipment - Google Patents

Abstract

The present disclosure relates to a tray structure for a test apparatus, a test module and a test apparatus. The tray structure comprises a placing frame, a mounting frame, a base, a first driving mechanism and a second driving mechanism, wherein the base is used for being fixed in a testing bin of testing equipment, the mounting frame is movably mounted on the base along a first direction, the first driving mechanism is used for driving the mounting frame to move along the first direction, the placing frame is used for placing electronic products to be tested, the placing frame is movably mounted on the mounting frame along the first direction, and the second driving mechanism is used for driving the placing frame to move along the first direction. Based on this, because the rack can remove along the first direction on the mounting bracket, can increase the test station of electronic product, through quantity, type and the position of rationally arranging the test unit on test equipment, can increase the quantity of the project that test equipment can test to can satisfy the demand that current electronic product test project increases, make test equipment's compatibility strengthen greatly.

Description

Tray structure for test equipment, test module and test equipment

Technical Field

The present disclosure relates to the field of electronic product performance testing, and in particular, to a tray structure, a test module, and a test apparatus for the test apparatus.

Background

With the increasing functions and precision requirements of electronic products (such as watches, bracelets, and the like), sensors on the electronic products are increasing, the testing requirements for the sensors on the electronic products are increasing, and in the related art, the number of items that can be tested by testing equipment is small, and the testing requirements of the current electronic products cannot be met.

SUMMERY OF THE UTILITY MODEL

To overcome the problems in the related art, the present disclosure provides a tray structure for a test apparatus, a test module, and a test apparatus.

According to a first aspect of the embodiments of the present disclosure, a tray structure for a test device is provided, which includes a rack, a mounting rack, a base, a first driving mechanism and a second driving mechanism; the base is used for being fixed in a test bin of test equipment, the mounting rack is movably mounted on the base along a first direction, and the first driving mechanism is used for driving the mounting rack to move along the first direction; the rack is used for placing electronic products to be tested, the rack is movably mounted on the mounting rack along the first direction, and the second driving mechanism is used for driving the rack to move along the first direction.

Optionally, the second driving mechanism includes a motor, a driving wheel, a driven wheel and a transmission belt, the output end of the motor is connected with the driving wheel in a transmission manner, the driving wheel and the driven wheel are arranged at intervals in the first direction, the two ends of the transmission belt are respectively sleeved on the driving wheel and the driven wheel, and the transmission belt is connected with the placing frame so as to drive the placing frame to move in the first direction when the transmission belt rotates.

Optionally, one of the rack and the mounting rack is provided with a slide rail extending along the first direction, and the other is provided with a sliding groove in sliding fit with the slide rail.

Optionally, the mounting bracket includes a pair of first roof beam, second roof beam and end plate, the both ends of second roof beam are connected respectively the one end of a pair of first roof beam, the relative both ends of end plate are connected respectively the other end of a pair of first roof beam, first roof beam is followed first direction extends, be provided with on the first roof beam the spout or the slide rail, the rack is followed movably the connection of first direction is in on the first roof beam, the end plate is used for covering the opening of test chamber of test equipment.

Optionally, the first driving mechanism includes a cylinder, the cylinder includes a cylinder body and a piston rod movably disposed in the cylinder body along the first direction, the cylinder body is mounted on the base, and the piston rod of the cylinder is connected to the mounting bracket.

Optionally, the tray structure comprises a guide member mounted to the base, one of the guide member and the mounting frame is provided with a guide rail, and the other is provided with a guide groove cooperating with the guide rail.

Optionally, the rack is provided with at least two placing positions, and each placing position is used for placing at least one electronic product to be tested.

According to a second aspect of the embodiments of the present disclosure, a test module is provided, which includes a test unit group and the tray structure, where the test unit group includes a plurality of test units, and the plurality of test units are used to perform corresponding performance tests on an electronic product to be tested.

Optionally, the test unit group includes at least two of an NFC white card test unit, an NFC card reader test unit, a light emitting panel test unit, a wearing function test unit, a PPG plugging test unit, a PPG noise floor test unit, a PPG gray card test unit, a body fat test unit, and a charging current test unit.

According to a third aspect of the embodiments of the present disclosure, a testing apparatus is provided, which includes a housing and the testing module mentioned above, wherein a testing chamber is disposed in the housing, and the testing module is disposed in the testing chamber.

Optionally, the electronic product to be tested is an intelligent wearable device, and the testing device is a device for testing the intelligent wearable device.

The technical scheme provided by the embodiment of the disclosure can have the following beneficial effects: in the tray structure that this disclosure provided, because the rack can move on the mounting bracket along the first direction, can increase the test station of electronic product, through quantity, type and the position of rationally arranging the test unit on test equipment, can increase the quantity of the project that test equipment can test to can satisfy the demand that current electronic product test project increases, make test equipment's compatibility strengthen greatly.

It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and together with the description, serve to explain the principles of the disclosure.

FIG. 1 is a schematic perspective view of a test apparatus shown in an exemplary embodiment of the present disclosure;

FIG. 2 is a schematic perspective view of a portion of a test apparatus shown in an exemplary embodiment of the present disclosure, wherein the tray structure is not shown;

FIG. 3 is a schematic perspective view of a test module of a test apparatus according to an exemplary embodiment of the disclosure;

fig. 4 is a schematic perspective view illustrating a tray structure of a test module according to an exemplary embodiment of the present disclosure, wherein a mounting rack is located at a position for taking and placing electronic products;

fig. 5 is a schematic perspective view illustrating a tray structure of a test module according to an exemplary embodiment of the disclosure;

FIG. 6 is a schematic perspective view of a portion of a structure of a pallet structure shown in an exemplary embodiment of the present disclosure, wherein the base and the like are not shown;

FIG. 7 is a perspective view of a testing unit set and a frame of a testing module assembly shown in an exemplary embodiment of the present disclosure in an assembled state;

fig. 8 is a schematic diagram illustrating a test module for performing a project test on an electronic product according to an exemplary embodiment of the disclosure, in which a part of test units of a test unit group is shown.

Description of the reference numerals

1000-test equipment; 100-a test module; 10-a tray structure; 11-placing a rack; 111-place bit; 12-a mounting frame; 121-a first beam; 122-a second beam; 123-end plate; 13-a base; 141-a motor; 142-a driving wheel; 143-driven wheels; 144-a drive belt; 145-a clamping member; 151-cylinder; 16-a guide; 17-a buffer; 18-Z-direction limiting wheels; 19-a spacing wheel mount; 20-test unit group; 30-a frame; 200-a housing; 211-test chamber; a-first direction.

Detailed Description

Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, like numbers in different drawings represent the same or similar elements unless otherwise indicated. The implementations described in the exemplary embodiments below are not intended to represent all implementations consistent with the present disclosure. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the present disclosure, as detailed in the appended claims.

In the present disclosure, unless otherwise stated, the directional words "up and down" are defined based on the drawing direction of the drawings, and may alternatively be the same as the directions indicated by the up and down directions of the test device 1000 when the test device is in the installation position, and "inside and outside" refer to the inside and outside of the relevant parts. Furthermore, the terms "first, second, etc. are used merely to distinguish one description from another, and are not to be construed as indicating or implying relative importance.

In addition, throughout the description of the present disclosure, it is further noted that, unless otherwise expressly specified or limited, the terms "disposed," "connected," and "mounted" are to be construed broadly, e.g., as meaning fixedly connected, detachably connected, or integrally connected; the two components can be directly connected or indirectly connected through an intermediate medium, and the two components can be communicated with each other, so that the specific meanings of the above terms in the disclosure can be understood by those skilled in the art.

In the related art test apparatus, when performing an item test of a sensor of an electronic product, the general procedure is as follows: the tray of the testing equipment is pulled out from the testing bin of the testing equipment, the tray is positioned at the position for taking and placing the electronic products, then the electronic products to be tested (such as a watch, a bracelet and the like) are placed on the tray, and then the tray structure is pushed into the fixed position (namely, the testing position) in the testing bin for testing. The position of the tray in the test bin is unchanged, and the tray only has two positions, namely a position for taking electron products and a fixed test position. The limited number of test units (devices for testing corresponding functions of electronic products) that can be arranged in the area of the test site corresponding to the tray structure in the test apparatus results in fewer items that can be tested by the test apparatus in the related art.

In view of this, referring to fig. 1 to 8, according to an aspect of the present disclosure, there is provided a tray structure 10 for a test apparatus 1000, the tray structure 10 including a rack 11, a mounting frame 12, a base 13, a first driving mechanism, and a second driving mechanism. The mounting frame 12 is movably mounted to the base 13 along a first direction a, and the first driving mechanism is configured to drive the mounting frame 12 to move along the first direction a, that is, the first driving mechanism is configured to drive the mounting frame 12 to move on the base 13 along the first direction a. The rack 11 is used for placing electronic products to be tested, the rack 11 is movably mounted on the mounting rack 12 along a first direction a, and the second driving mechanism is used for driving the rack 11 to move along the first direction a, that is, the second driving mechanism is used for driving the rack 11 to move on the mounting rack 12 along the first direction a.

When the tray structure 10 provided by the present disclosure is applied to the test apparatus 1000, the process of the sensor test of the electronic product is as follows: the tray structure 10 is pulled out from the testing chamber 211 of the testing apparatus 1000, the tray structure 10 is located at a position for taking and placing the electronic product, then the electronic product to be tested (watch, bracelet, etc.) is placed on the placing frame 11, then the first driving mechanism is utilized to drive the mounting frame 12 to move on the base 13 in a direction towards the direction entering the testing chamber 211 so as to enter a first position in the testing chamber 211, and then, the testing of a part of items of the electronic product is performed. Then, the placing rack 11 is driven by the second driving mechanism to move on the mounting rack 12 along the first direction a toward a direction away from the opening of the testing chamber 211, so that the electronic product on the placing rack 11 moves to a position corresponding to another testing unit in the testing device 1000 for performing another project test.

It can be seen that, in the tray structure 10 provided by the present disclosure, since the placing frame 11 can move on the mounting frame 12 along the first direction a, the test stations of the electronic products can be increased, and the number, types and positions of the test units can be reasonably arranged on the test equipment 1000, so that the number of items that can be tested by the test equipment 1000 can be increased, thereby meeting the demand of increasing the test items of the current electronic products, and greatly enhancing the compatibility of the test equipment 1000. For example, in the related art, the number of items that can be tested is small, and is usually at most 5, and in the present disclosure, testing of 13 items of an electronic product can be achieved.

Here, the test unit is a component for performing a corresponding performance test on a sensor of an electronic product, and different test items correspond to different types of test units.

The present disclosure does not limit the specific structure of the second driving mechanism as long as the rack 11 can be driven to move on the mounting frame 12 along the first direction a. Alternatively, as shown in fig. 1 to 4, in an embodiment of the present disclosure, the second driving mechanism may include a motor 141, a driving wheel 142, a driven wheel 143, and a transmission belt 144, an output end of the motor 141 is in transmission connection with the driving wheel 142, the driving wheel 142 and the driven wheel 143 are arranged at intervals along the first direction a, two ends of the transmission belt 144 are respectively sleeved on the driving wheel 142 and the driven wheel 143, and the transmission belt 144 is connected to the rack 11 to drive the rack 11 to move along the first direction a when the transmission belt 144 rotates. Because the transmission belt 144 is arranged along the first direction a and is connected with the placing rack 11, during operation, the motor 141 drives the driving wheel 142 to rotate, and drives the transmission belt 144 to rotate, so as to drive the placing rack 11 to move along the first direction a, and then drive the electronic product on the placing rack 11 to move along the first direction a.

In this embodiment, the rotation of the motor 141 and the transmission belt 144 has at least the following two advantages: firstly, the transmission structures of the motor 141 and the transmission belt 144 are simple; secondly, the driving belt 144 facilitates long-distance driving, which is beneficial to increase the travel of the rack 11 moving on the mounting rack 12 along the first direction a, thereby being beneficial to increase the testing positions of the electronic products.

The present disclosure does not limit the specific value of the stroke of the rack 11 moving on the mounting frame 12 in the first direction a. Alternatively, the stroke may be between 0-400 mm.

It is understood that in other embodiments of the present disclosure, the second driving mechanism may include an electric push rod, the push rod of the electric push rod is arranged along the first direction a, and the push rod is connected to the placing rack 11, and the placing rack 11 is driven to move on the mounting rack 12 by the telescopic motion of the push rod in the first direction a.

Alternatively, as shown in fig. 4 and 5, the second driving mechanism may further include a clamping member 145, one end of the clamping member 145 being clamped to the belt 144, and the other end being mounted to the rack 11. That is, the belt 144 is connected to the rack 11 by the clamp member 145. By providing the clamping member 145, the belt 144 and the rack 11 can be easily detached from each other when the belt 144 or the rack 11 needs to be replaced, while the connection between the belt 144 and the rack 11 is facilitated.

Alternatively, in other embodiments of the present disclosure, the rack 11 may be directly connected to the belt 144, for example, a connecting portion may be specially designed on the rack 11 and then connected to the belt 144.

In order to facilitate the movement of the placing frame 11 on the mounting frame 12, optionally, in an embodiment of the present disclosure, one of the placing frame 11 and the mounting frame 12 is provided with a sliding rail extending along the first direction a, and the other is provided with a sliding chute in sliding fit with the sliding rail, and the placing frame 11 and the mounting frame 12 are matched through the sliding rail and the sliding chute, so that when the placing frame 11 is moved on the mounting frame 12, the placing frame 11 can also be guided, and the placing frame 11 is moved according to the preset first direction a.

The present disclosure is not limited to a particular shape or configuration of the tray structure 10. Alternatively, as shown in fig. 4 to 6, in an embodiment of the present disclosure, the mounting frame 12 may include a pair of first beams 121, a second beam 122, and an end plate 123, two ends of the second beam 122 are respectively connected to one ends of the pair of first beams 121, two opposite ends of the end plate 123 are respectively connected to the other ends of the pair of first beams 121, the first beams 121 extend along the first direction a, sliding grooves or sliding rails are disposed on the first beams 121, the placing frame 11 is slidably connected to the first beams 121 along the first direction a, and the end plate 123 is configured to cover an opening of the testing chamber 211 of the testing apparatus 1000, that is, when the mounting frame 12 is located at the first position of the testing chamber, the end plate 123 of the mounting frame 12 covers the opening of the testing chamber 211 for the door of the testing chamber 211. In the present embodiment, the pair of first beams 121, the pair of second beams 122 and the end plate 123 enclose the frame 30 structure to form a hollow structure, and the rack 11 is disposed over the pair of first beams 121, so that the structure is simple, and the hollow structure is also beneficial to reducing the weight of the tray, and is convenient for the mounting rack 12 to move on the base 13.

Also, the present disclosure does not limit the specific structure of the first driving mechanism as long as the mounting frame 12 can be driven to move along the first direction a. Alternatively, as shown in fig. 4 and 5, in an embodiment of the present disclosure, the first driving mechanism includes a cylinder 151, the cylinder 151 includes a cylinder body and a piston rod movably disposed in the cylinder body along the first direction a, the cylinder body is mounted on the base 13, and the piston rod of the cylinder 151 is connected to the mounting frame 12. The air cylinder 151 is adopted for driving, the structure is simple, the work is reliable, and the actual operation is simple.

In other embodiments of the present disclosure, the first driving mechanism may adopt the same structure as the second driving mechanism, that is, adopt a structure of a motor and a transmission belt, for example, a motor 141, a driving wheel 142, a driven wheel 143 and a transmission belt 144 are additionally disposed to connect the transmission with the mounting frame 12, and the transmission belt 144 is driven to rotate by the motor 141, the driving wheel 142 and the driven wheel 143, so as to drive the mounting frame 12 to move in the first direction a. Alternatively, the first driving mechanism may also be an electric push rod, and the push rod of the electric push rod is connected to the mounting frame 12 to drive the mounting frame 12 to move along the first direction a.

Optionally, as shown in fig. 4, the tray structure 10 may further include a buffer 17, and the buffer 17 is disposed on the base 13 for buffering the mounting frame 12 during the warehousing process. Specifically, the buffer end of the buffer 17 faces the inner side of the end plate 123 of the mounting frame 12, when the tray structure 10 enters the first position in the test chamber 211, due to the driving of the cylinder 151, the tray structure 10 has an inertia force, and at this time, the buffer 17 can be used to abut against and buffer the end plate 123, so as to buffer the tray structure 10.

In order to facilitate the movement of the mounting frame 12 on the base 13, the tray structure 10 may optionally further include a guide 16 mounted on the base 13, as shown in fig. 4, one of the guide 16 and the mounting frame 12 is provided with a guide rail, and the other is provided with a guide groove matched with the guide rail. The mounting frame 12 and the base 13 are matched through a guide rail and a guide groove, so that the mounting frame 12 can be conveniently moved on the base 13, and meanwhile, the mounting frame 12 can also be guided, and the mounting frame 12 can be moved according to a specified first direction A.

Alternatively, when the mounting frame 12 is formed in the structure shown in fig. 4, a guide rail may be provided on the first beam 121 of the mounting frame 12, and a guide groove may be provided on a surface of the guide 16 facing the first beam 121. Wherein the lower end of the guide member 16 can be directly or through other parts connected to the base 13, and the guide groove is provided near the upper end of the guide member 16.

In order to improve the testing efficiency, optionally, as shown in fig. 6, in an embodiment of the present disclosure, the placing rack 11 has at least two placing locations 111 thereon, and each placing location 111 is used for placing at least one electronic product to be tested. Thus, when the placing rack 11 is located at the same position, the function test can be performed on a plurality of electronic products, and therefore the test efficiency can be improved. Especially, in the scheme that the placing frame 11 has a plurality of testing positions in the present disclosure, the project testing can be performed simultaneously at the same testing position, the improvement of the testing efficiency is particularly obvious, and a certain amount of cost can be saved. For example, if the capacity is calculated according to 200 ten thousand, about 31 thousand of investment cost can be saved;

alternatively, as shown in fig. 4 to 6, the base 13 may be formed in a plate-like structure to simplify the structure.

Alternatively, as shown in fig. 4 and 5, the mounting frame 12 and the base 13 are spaced in the Z-direction, and the tray structure 10 may further include a Z-direction limiting wheel 18 and a limiting wheel mounting 19 for mounting the Z-direction limiting wheel 18 on the base 13, wherein the Z-direction limiting wheel 18 limits the bottom of the mounting frame 12 so that the mounting frame 12 keeps moving in a plane during moving in the first direction a. Specifically, the Z-direction limiting wheel 18 can perform Z-direction limiting on the first beam 121 of the mounting frame 12.

As shown in fig. 3, 4, 7 and 8, according to another aspect of the present disclosure, a test module 100 is provided, the test module 100 includes a test unit group 20 and the tray structure 10, where the test unit group 20 includes a plurality of test units for performing corresponding performance tests on electronic products to be tested.

Alternatively, as shown in fig. 7, a plurality of test units are arranged in the first direction a to correspond to the positions of the tray structure 10 in the first direction a.

The number and specific type of the test units are not limited in the present disclosure, and may be specifically determined according to the requirements of the electronic product. As shown in fig. 8, in an embodiment of the present disclosure, the test unit group 20 may include at least two of an NFC white card test unit 201, an NFC card reader test unit 202, a light emitting panel test unit 203, a wearing function test unit 204, a PPG occlusion test unit 205, a PPG noise floor test unit 206, a PPG grey card test unit 207, a body fat test unit 208, and a charging current test unit 209.

The testing unit group 20 is used for providing a simulation environment for the electronic product to be tested, so as to test whether the corresponding function on the electronic product is normal. Specifically, the NFC white card testing unit 201 is configured to provide an NFC white card to test whether a corresponding sensor of an electronic product can read data on the NFC white card. The NFC reader testing unit 202 is configured to provide an NFC reader to read data on an electronic product, so as to test whether the electronic product can transmit related data. The light emitting panel test unit 203 is used to provide light emitting panels to provide different light environments for electronic products, for example, the light emitting panels emit light providing light environments of 200lux and 500 lux. The wearing function test unit 204 is used to provide a simulated wearing environment, for example, a copper plate is provided to simulate a wrist wearing condition. PPG (optics heart rate sensor) comprises four kinds of luminous LED of red, green, infrared, ambient light and PD receiving terminal, when carrying out PPG shutoff test, can test whether there is the interference situation to take place when four kinds of inside LED of electronic product are luminous, can keep apart with adiactinic sealing washer between the inside luminous LED of PPG, and test environment need have the cotton shutoff of the cotton bubble of adiacticity to the backshell lens, and PPG shutoff test unit 205 can provide the bubble cotton that is used for the shutoff. When the PPG noise floor test is performed, that is, whether the circuit has noise floor interference when the LED does not emit light is tested, a full dark environment needs to be provided, and the PPG noise floor test unit 206 can be used to provide a darkroom to provide a full dark environment. And performing a PPG gray card test, wherein the LED is required to emit light to irradiate the gray card to test the value of the PD receiving end, and the PPG gray card test unit 207 is used to provide the gray card. The body fat test unit 208 is used for providing a body fat electrode to simulate a skin environment so as to test whether a body fat test sensor of an electronic product can work normally. The charging current testing unit 209 is used to provide a charger, such as a charging cradle, to assist in testing the charging current of the electronic product during charging.

Optionally, on the testing device, scenes such as air pressure, ambient temperature and the like can be provided, so as to test functions of a body temperature sensor and a barometer of the electronic product. In addition, the satellite search test of the GPS can be carried out. Meanwhile, a photoelectric knob can be provided to provide a friction source for testing the rotation precision of the electronic product.

Alternatively, in one embodiment of the present disclosure, the test cell group 20 may include the test cells described above to set up as many test cells as possible to meet the increasing project test requirements for electronic yield.

The present disclosure does not limit the arrangement order among the test cells in the test cell group 20. Alternatively, referring to FIG. 7, a portion of the test cells of the set of test cells 20 is shown.

Optionally, as shown in fig. 8, the test unit set 20 may further include a code scanning unit 210 for identifying a barcode on the electronic product to store and collect data of the corresponding electronic product.

Optionally, the test module 100 may further include a frame 30, the test unit group 20 may be mounted on the frame 30, the frame 30 may be connected to the base 13, and the frame 30 may be configured to be fixed in the test chamber 211 of the test apparatus 1000.

As shown in fig. 1 and 2, according to another aspect of the present disclosure, there is provided a test apparatus 1000, the test apparatus 1000 comprising a housing 200 and the test module 100, the housing 200 having a test chamber 211 therein, the test module 100 being disposed in the test chamber 211.

Alternatively, the electronic product to be tested may be an intelligent wearable device, and the testing device 1000 may be a device for testing the intelligent wearable device. Here, the smart wearable device may be a watch or a bracelet, etc., which is not limited by this disclosure. Taking a watch and a bracelet as an example, the watch and the bracelet can be placed in the placing position 111 shown in fig. 4 to 6 during specific testing. When the wrist watch is placed in a specific mode, the placing position 111 is provided with a structure similar to a concave cavity, the main body part of the wrist watch or the bracelet (the part of the wrist watch or the bracelet, which is removed from the wrist band) can be placed in the concave cavity, and a clamping device can be arranged to play an auxiliary fixing role for the main body part of the wrist watch or the hand.

Wherein, the housing 200 may be provided with a display, a keyboard, an indicator light, a button and other human-computer interaction devices.

In the present disclosure, the testing apparatus 1000 may be used in an online manner, which may be: the device comprises one or more devices, a router, a server, a network and a cloud end, and the connection medium can be a network cable.

Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure. This application is intended to cover any variations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only.

It will be understood that the present disclosure is not limited to the precise arrangements described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

Claims (11)

1. A tray structure for testing equipment is characterized by comprising a placing frame (11), a mounting frame (12), a base (13), a first driving mechanism and a second driving mechanism;

the base (13) is used for being fixed in a test chamber (211) of the test device (1000), the mounting frame (12) is movably mounted on the base (13) along a first direction (A), and the first driving mechanism is used for driving the mounting frame (12) to move along the first direction (A);

the rack (11) is used for placing electronic products to be tested, the rack (11) is movably mounted on the mounting rack (12) along the first direction (A), and the second driving mechanism is used for driving the rack (11) to move along the first direction (A).

2. The tray structure according to claim 1, wherein the second driving mechanism comprises a motor (141), a driving wheel (142), a driven wheel (143), and a transmission belt (144);

the output of motor (141) with action wheel (142) transmission is connected, action wheel (142) with driven wheel (143) are followed first direction (A) interval arrangement, the both ends of drive belt (144) are established respectively the cover and are in action wheel (142) with on driven wheel (143), drive belt (144) with rack (11) link to each other, with drive belt (144) drive when rotating rack (11) are followed first direction (A) removes.

3. A pallet structure according to claim 1, characterized in that one of the placing frame (11) and the mounting frame (12) is provided with a slide rail extending in the first direction (a), and the other is provided with a slide groove in sliding engagement with the slide rail.

4. A pallet structure according to claim 3, characterized in that said mounting frame (12) comprises a pair of first beams (121), second beams (122) and end plates (123);

two ends of the second beam (122) are respectively connected to one ends of the pair of first beams (121), and two opposite ends of the end plate (123) are respectively connected to the other ends of the pair of first beams (121);

the first beam (121) extends along the first direction (A), the sliding groove or the sliding rail is arranged on the first beam (121), the placing frame (11) is movably connected to the first beam (121) along the first direction (A), and the end plate (123) is used for covering an opening of a testing bin (211) of the testing device (1000).

5. A pallet structure according to any one of claims 1-4, characterized in that the first driving mechanism comprises a cylinder (151), the cylinder (151) comprising a cylinder body and a piston rod movably arranged in the cylinder body in the first direction (A), the cylinder body being mounted to the base (13), the piston rod of the cylinder (151) being connected to the mounting frame (12).

6. A tray structure according to any one of claims 1-4, characterized in that the tray structure (10) comprises a guide (16) mounted to the base (13), one of the guide (16) and the mounting frame (12) being provided with a guide rail, the other being provided with a guide groove cooperating with the guide rail.

7. Tray structure according to any one of claims 1 to 4, characterized in that said rack (11) has at least two placement locations (111) thereon, each of said placement locations (111) being intended to place at least one electronic product to be tested.

8. A test module, characterized by comprising a test unit group (20) and a tray structure (10) according to any one of claims 1-7, the test unit group (20) comprising a plurality of test units for performing corresponding performance tests on electronic products to be tested.

9. The test module according to claim 8, wherein the test unit set (20) comprises at least two of an NFC white card test unit (201), an NFC card reader test unit (202), a light emitting panel test unit (203), a wearing function test unit (204), a PPG plugging test unit (205), a PPG noise floor test unit (206), a PPG grey card test unit (207), a body fat test unit (208), and a charging current test unit (209).

10. Testing device, comprising a housing (200) and a testing module according to claim 8 or 9, wherein a testing chamber (211) is arranged in the housing (200) and the testing module (100) is arranged in the testing chamber (211).

11. The testing device according to claim 10, wherein the electronic product to be tested is a smart wearable device, and the testing device (1000) is a device for testing a smart wearable device.

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