CN217034161U - High-low temperature box for chip test - Google Patents
High-low temperature box for chip test Download PDFInfo
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- CN217034161U CN217034161U CN202220295789.8U CN202220295789U CN217034161U CN 217034161 U CN217034161 U CN 217034161U CN 202220295789 U CN202220295789 U CN 202220295789U CN 217034161 U CN217034161 U CN 217034161U
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Abstract
The utility model discloses a high-low temperature box for chip testing, which comprises a box body and a disc changing device, wherein the box body is provided with a temperature-adjustable cavity, the cavity is used for accommodating a chip to be tested and enabling the chip to be tested to be at a testing temperature, one side of the box body is provided with an openable material taking hole, and the material taking hole is communicated with the cavity; the disc changing device is arranged in the cavity and comprises a disc changing driving mechanism and a carrying frame, a plurality of layers of bearing brackets are arranged on the carrying frame at intervals, the bearing brackets are used for bearing the chip discs, a plurality of chips to be tested are placed on the chip discs, and the disc changing driving mechanism is used for driving the carrying frame to move upwards or downwards so that one of the chip discs is opposite to the material taking port. The high-low temperature box is adopted to test the chip, thereby being beneficial to shortening the whole test time and improving the test efficiency of the chip.
Description
Technical Field
The utility model relates to the field of chip testing, in particular to a high-low temperature box for chip testing.
Background
At present, most of tests on chips can be carried out through automatic test equipment, but a small number of chips cannot be directly led into the automatic test equipment because of the need of carrying out normal temperature, low temperature and high temperature complex tests, and the part of chips need to be manually tested.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide a high-low temperature box for chip testing, which is beneficial to shortening the whole testing time and improving the testing efficiency of chips.
In order to achieve the purpose, the utility model discloses a high-low temperature box for chip testing, which comprises a box body and a disc changing device, wherein the box body is provided with a temperature-adjustable cavity, the cavity is used for accommodating a chip to be tested and enabling the chip to be tested to be at a testing temperature, one side of the box body is provided with an openable material taking hole, and the material taking hole is communicated with the cavity; the disc changing device is arranged in the cavity and comprises a disc changing driving mechanism and a material loading frame, a plurality of layers of bearing brackets are arranged on the material loading frame at intervals, the bearing brackets are used for bearing a chip disc, a plurality of chips to be tested are placed on the chip disc, the disc changing driving mechanism is used for driving the material loading frame to move upwards or downwards so that one of the chips disc is opposite to the material taking port.
The utility model comprises a box body and a disc changing device, wherein a cavity of the box body can contain a chip to be tested and enable the chip to be tested to be at a test temperature, the disc changing device comprises a disc changing driving mechanism and a material carrying frame, the material carrying frame is arranged in the cavity, a plurality of chips to be tested are placed on the chip discs, a plurality of layers of supporting brackets are arranged on the material carrying frame at intervals, the supporting brackets can support a plurality of chip discs, so that the chips to be tested on the chip discs are at the test temperature, the problem that a tester needs to wait for heating or cooling the chip to be tested by a high-low temperature box for a plurality of times is solved, the disc changing driving mechanism can drive the material carrying frame to move up and down to enable one chip disc to be opposite to a material taking port of the box body, the tester can take out the chip discs at different positions on the material carrying frame conveniently, the arrangement of the material carrying frame and the disc changing driving mechanism is beneficial to shortening the whole test time, and the test efficiency of the chips is improved.
Optionally, each layer of the supporting bracket includes two supporting portions respectively disposed at two opposite sides of the carrier frame, and the two supporting portions are respectively used for supporting two opposite sides of the chip tray.
Optionally, the material loading frame comprises a top plate, a bottom plate and two side plates arranged between the top plate and the bottom plate, two pairs of opposite bearing parts are convexly arranged on the inner sides of the two side plates in an opposite direction, and through holes are formed in the top plate and/or the bottom plate.
Optionally, the chip tray is configured to partially extend beyond an end of the material loading rack away from the material taking port, and a detection sensor is arranged in the cavity and used for detecting whether the chip tray opposite to the material taking port is placed in place.
Optionally, a reset sensor is arranged in the cavity and used for sensing the position of the carrier, and the disc changing driving mechanism drives the carrier to move and reset according to the information sensed by the reset sensor.
Optionally, the disc changer further comprises a support frame, the support frame includes a guide pillar extending vertically, the outer side of the material carrying frame is connected with a connecting structure, the connecting structure is provided with a guide hole and a threaded hole, the guide pillar penetrates through the guide hole, the disc changer driving mechanism includes a rotary driving assembly and a lead screw extending vertically, the lead screw is in threaded connection with the threaded hole, and the lead screw rotates under the action of the rotary driving assembly to drive the material carrying frame to move up or down along the guide pillar.
Optionally, the support frame further includes an upper plate and a lower plate, a plurality of guide pillars are fixedly connected between the upper plate and the lower plate, the material loading frame includes a top plate and a bottom plate, the top plate and the bottom plate respectively extend outward to form a connecting portion, a plurality of guide sleeves are respectively fixedly arranged on the connecting portions of the top plate and the bottom plate, the guide holes are formed in the guide sleeves, lead screw nuts are fixedly arranged on the connecting portions of the bottom plate, the threaded holes are formed in the lead screw nuts, and the connecting structure includes the connecting portions, the guide sleeves and the lead screw nuts.
Optionally, the rotation driving assembly includes a main gear, a sub-gear and a gear driver, the main gear is installed at an output end of the gear driver, the main gear is engaged with the sub-gear, the sub-gear is fixedly connected to the lead screw, and the gear driver is configured to drive the main gear to rotate so as to drive the sub-gear and the lead screw to rotate.
Optionally, the high-low temperature box further comprises a sealing device, the sealing device comprises an opening and closing driving device and a sealing piece, and the sealing piece is driven by the opening and closing driving device to be in sealing connection with or separated from the material taking port, so that the material taking port is switched between a closed state and an open state.
Optionally, the drive arrangement that opens and shuts includes sealed actuating mechanism and removal actuating mechanism, the sealing member is installed sealed actuating mechanism's output, remove actuating mechanism and be used for driving sealed actuating mechanism removes so that the sealing member with get the material mouth and correspond or stagger, sealed actuating mechanism is used for driving the sealing member removes so that the sealing member at least part is stuffed into get the material mouth or with get the material mouth separation.
Drawings
Fig. 1 is a perspective view of a high-low temperature box according to an embodiment of the present invention.
Fig. 2 is a perspective view of fig. 1 from another perspective.
Fig. 3 is a perspective structural view of a disc changer and a support frame in an embodiment of the present invention.
Fig. 4 is a three-dimensional exploded structural view of a disc changer and a support frame according to an embodiment of the present invention.
Detailed Description
In order to explain the technical contents, structural features, objects and effects of the present invention in detail, the following description is made in conjunction with the embodiments and the accompanying drawings.
Referring to fig. 1 to 4, the present invention discloses a high and low temperature box 100 for chip testing, which includes a box body 1 and a disc changer 2, wherein the box body 1 has a temperature adjustable chamber 11, the chamber 11 is used for accommodating a chip to be tested and keeping the chip to be tested at a testing temperature, one side of the box body 1 has a material taking port 12 which can be opened and closed, and the material taking port 12 is communicated with the chamber 11; the disc changer 2 is arranged in the chamber 11, the disc changer 2 includes a disc changer driving mechanism 21 and a carrier 22, the carrier 22 is provided with a plurality of layers of carrier brackets 221 at intervals, the carrier brackets 221 are used for supporting the chip disc 10, a plurality of chips to be tested are placed on the chip disc 10, and the disc changer driving mechanism 21 is used for driving the carrier 22 to move up or down so as to enable one of the chip discs 10 to be opposite to the material taking port 12.
The utility model comprises a box body 1 and a disc changer 2, a cavity 11 of the box body 1 can contain chips to be tested and enable the chips to be tested to be at a test temperature, the disc changer 2 comprises a disc changing driving mechanism 21 and a carrying frame 22, the carrying frame 22 is arranged in the cavity 11, a plurality of chips to be tested are placed on chip trays 10, a plurality of layers of bearing brackets 221 are arranged on the carrying frame 22 at intervals, the bearing brackets 221 can bear a plurality of chip trays 10 so as to enable the chips to be tested on the chip trays 10 to be at the test temperature, thereby avoiding the situation that a tester needs to wait for heating or cooling the chips to be tested by the high-low temperature box 100 for a plurality of times, the disc changing driving mechanism 21 can drive the carrying frame 22 to move upwards or downwards so as to enable one of the chip trays 10 to be opposite to a material taking port 12 of the box body 1, so that the tester can take out the chip trays 10 at different positions on the carrying frame 22, and the arrangement of the disc changing frame 22 and the disc driving mechanism 21 is beneficial to shortening the whole test time, the test efficiency of the chip is improved.
Referring to fig. 1 to 4, each layer of the supporting bracket 221 includes two supporting portions 2211 respectively disposed on two opposite sides of the carrier 22, the two supporting portions 2211 are respectively used for supporting two opposite sides of the chip tray 10, and the arrangement of the supporting portions 2211 makes the air circulation inside the carrier 22 good, which is beneficial for the temperature of the whole chip to be tested to be at the testing temperature.
Referring to fig. 1 to 4, the carrier 22 includes a top plate 222 and a bottom plate 223, and two side plates 224 disposed between the top plate 222 and the bottom plate 223, two opposite supporting portions 2211 are protruded from inner sides of the two side plates 224, and a through hole 225 is disposed on the top plate 222 and/or the bottom plate 223. The carrier frame 22 has good structural stability.
Specifically, in the present embodiment, the top plate 222 is provided with a plurality of through holes 225 for facilitating heat exchange between the air in the chamber 11 and the chip to be tested, but is not limited thereto, for example, the bottom plate 223 may also be provided with a plurality of through holes 225.
Referring to fig. 1 to 4, the chip tray 10 is partially disposed beyond an end of the carrier frame 22 away from the material extracting opening 12, and the detecting sensor 3 is disposed in the cavity 11, and the detecting sensor 3 is used for detecting whether the chip tray 10 opposite to the material extracting opening 12 is in place, so as to facilitate stable placement of the chip tray 10 on the carrier frame 22.
Specifically, in the present embodiment, the chip tray 10 partially extends beyond an end of one side plate 224 of the carrier 22 away from the loading opening 12, but is not limited thereto. The detection sensor 3 is disposed at the same height as the material taking port 12 and judges whether the tester places the chip tray 10 in place by detecting the portion of the chip tray 10 that is over.
Referring to fig. 1 to 4, a reset sensor 4 is disposed in the chamber 11, the reset sensor 4 is used for sensing the position of the carrier frame 22, the disc-changing driving mechanism 21 drives the carrier frame 22 to move and reset according to the sensing information of the reset sensor 4, and the reset sensor 4 is disposed to facilitate the carrier frame 22 to accurately reset.
Specifically, in this embodiment, the reset sensor 4 is disposed at a position corresponding to the bottom of the carrier frame 22 after being reset, and when the disc changer drive mechanism 21 drives the carrier frame 22 to move to the reset position, the disc changer 2 receives the sensing information sent by the reset sensor 4, and the disc changer drive mechanism 21 stops driving the carrier frame 22 to move, but not limited thereto, for example, the reset sensor 4 may also detect a moving distance of the carrier frame 22 to determine whether the carrier frame 22 moves to the reset position.
Referring to fig. 1 to 4, the disc changer 2 further includes a supporting frame 5, the supporting frame 5 includes a guide post 51 extending vertically, a connecting structure 227 is connected to an outer side of the loading frame 22, the connecting structure 227 is provided with a guide hole 2271 and a threaded hole 2272, the guide post 51 penetrates through the guide hole 2271, the disc changing driving mechanism 21 includes a rotary driving assembly 211 and a screw rod 212 extending vertically, the screw rod 212 is in threaded connection with the threaded hole 2272, and the screw rod 212 rotates under the action of the rotary driving assembly 211 to drive the loading frame 22 to move up or down along the guide post 51. The cooperation between the connecting structure 227 and the guide post 51 and the screw 212 is beneficial to realize automatic switching of the chip trays 10 opposite to the material taking opening 12, so that the tester can take out the chip trays 10 at different positions on the material loading frame 22.
Specifically, in the present embodiment, the high-low temperature chamber 100 is further provided with a switch for controlling the actuation of the disk-changing driving mechanism 21, so that a tester can manually control the disk-changing driving mechanism 21 to switch the next chip disk 10 to be opposite to the material taking port 12 after testing the current chip disk 10.
Referring to fig. 1 to 4, the supporting frame 5 further includes an upper plate 52 and a lower plate 53, a plurality of guide posts 51 are fixedly connected between the upper plate 52 and the lower plate 53, the material loading frame 22 includes a top plate 222 and a bottom plate 223, the top plate 222 and the bottom plate 223 respectively extend outward to form a connecting portion 2273, a plurality of guide sleeves 2274 are fixedly arranged on the connecting portions 2273 of the top plate 222 and the bottom plate 223 respectively, a guide hole 2271 is formed on the guide sleeves 2274, a lead screw nut 2275 is fixedly arranged on the connecting portion 2273 of the bottom plate 223, a threaded hole 2272 is formed on the lead screw nut 2275, and the connecting structure 2273 includes a connecting portion 2273, a guide sleeve 2274 and a lead screw nut 2275. The cooperation between the guide post 51 and the guide sleeve 2274 is beneficial to improving the connection stability of the material loading frame 22 and the support frame 5, and the cooperation between the lead screw 212 and the lead screw nut 2275 is beneficial to realizing automatic switching of the chip tray.
Specifically, in the present embodiment, the two sides of the bottom plate 223 are respectively extended outward to form a connecting portion 2273, the lead screw nut 2275 is formed at the connecting portion 2273 on one side of the bottom plate 223, and the side of the top plate 222 close to the lead screw 212 is extended outward to form a connecting portion 227, but is not limited thereto.
Referring to fig. 1 to 4, the rotation driving assembly 211 includes a main gear 2111, a sub-gear 2112 and a gear driver 2113, the main gear 2111 is mounted at an output end of the gear driver 2113, the main gear 2111 and the sub-gear 2112 are engaged with each other, the sub-gear 2112 is fixedly connected to the lead screw 212, and the gear driver 2113 is configured to drive the main gear 2111 to rotate so as to drive the sub-gear 2112 and the lead screw 212 to rotate.
Specifically, in the present embodiment, the gear driver 2113 is mounted on the lower surface of the upper plate 52, and the main gear 2111 and the sub-gear 2112 are provided on the upper surface of the upper plate 52, but is not limited thereto. The two ends of the screw 212 are respectively sleeved with a connecting ring 2120 and fixedly connected with the upper plate 52 and the lower plate 53 through the connecting rings 2120.
Referring to fig. 1 and 2, the high-low temperature box 100 further includes a sealing device 6, the sealing device 6 further includes an opening and closing driving device 61 and a sealing member 62, and the sealing member 62 is driven by the opening and closing driving device 61 to be in sealing connection with or separated from the material taking port 12, so that the material taking port 12 is switched between a closed state and an open state. In this embodiment, the high-low temperature box 100 is further provided with a switch for controlling the actuation of the opening and closing driving device 61, so that the tester can manually control the opening and closing driving device 61 when taking out and replacing the chip tray 10, which is beneficial for the chip to be tested to be kept at the testing temperature.
Referring to fig. 1 and fig. 2, the opening and closing driving device 61 includes a sealing driving mechanism 611 and a moving driving mechanism 612, the sealing member 62 is installed at an output end of the sealing driving mechanism 611, the moving driving mechanism 612 is used for driving the sealing driving mechanism 611 to move so that the sealing member 62 corresponds to or is staggered with the material taking port 12, and the sealing driving mechanism 611 is used for driving the sealing member 62 to move so that the sealing member 62 is at least partially inserted into the material taking port 12 or separated from the material taking port 12.
Specifically, in this embodiment, the moving driving mechanism 612 includes a moving driver 6121, a moving member 6122 installed at an output end of the moving driver 6121, and two fixed sliding rails 6123 that are arranged oppositely, two opposite ends of the moving member 6122 are respectively connected with the two fixed sliding rails 6123 in a sliding manner, the sealing driving mechanism 611 is installed on the moving member 6122, and the moving driver 6121 is configured to drive the moving member 6122 to slide along the fixed sliding rails 6123 so as to drive the sealing driving mechanism 611 to move.
The above disclosure is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the scope of the present invention, therefore, the present invention is not limited by the appended claims.
Claims (10)
1. A high and low temperature chamber for chip testing, comprising:
the chip testing device comprises a box body, a chip testing device and a testing device, wherein the box body is provided with a temperature-adjustable cavity, the cavity is used for accommodating a chip to be tested and enabling the chip to be tested to be at a testing temperature, one side of the box body is provided with a material taking port which can be opened and closed, and the material taking port is communicated with the cavity;
the disc changing device is arranged in the cavity and comprises a disc changing driving mechanism and a loading frame, a plurality of layers of bearing brackets are arranged on the loading frame at intervals, the bearing brackets are used for bearing the chip discs, a plurality of chips to be tested are placed on the chip discs, the disc changing driving mechanism is used for driving the loading frame to move upwards or downwards so that one of the chip discs is opposite to the material taking port.
2. The high and low temperature chamber for chip testing as claimed in claim 1, wherein each layer of the supporting bracket includes two supporting portions respectively disposed at two opposite sides of the carrier frame, and the two supporting portions are respectively used for supporting two opposite sides of the chip tray.
3. The high and low temperature chamber for chip testing as claimed in claim 2, wherein the material loading frame comprises a top plate, a bottom plate and two side plates arranged between the top plate and the bottom plate, the inner sides of the two side plates are provided with two opposite supporting parts in a protruding manner, and the top plate and/or the bottom plate are provided with through holes.
4. The high and low temperature chamber for chip testing as claimed in claim 1, wherein the chip tray is disposed partially beyond an end of the carrier remote from the material pick-up port, and a detection sensor is disposed in the chamber for detecting whether the chip tray opposite to the material pick-up port is in place.
5. The high and low temperature cabinet for chip testing according to claim 1, wherein a reset sensor is disposed in the chamber, the reset sensor is used for sensing the position of the carrier, and the disc-changing driving mechanism drives the carrier to move and reset according to the information sensed by the reset sensor.
6. The high and low temperature chamber for chip testing according to claim 1, wherein the tray changer further comprises a supporting frame, the supporting frame comprises a guide pillar extending vertically, a connecting structure is connected to the outer side of the tray carrier, the connecting structure is provided with a guide hole and a threaded hole, the guide pillar penetrates through the guide hole, the tray changer driving mechanism comprises a rotary driving assembly and a screw rod extending vertically, the screw rod is in threaded connection with the threaded hole, and the screw rod rotates under the action of the rotary driving assembly to drive the tray carrier to move up or down along the guide pillar.
7. The high and low temperature box for chip testing as claimed in claim 6, wherein the supporting frame further comprises an upper plate and a lower plate, a plurality of the guide posts are fixedly connected between the upper plate and the lower plate, the carrying frame comprises a top plate and a bottom plate, the top plate and the bottom plate respectively extend outwards to form a connecting portion, a plurality of guide sleeves are fixedly arranged on the connecting portions of the top plate and the bottom plate respectively, the guide holes are formed on the guide sleeves, lead screw nuts are fixedly arranged on the connecting portions of the bottom plate, the threaded holes are formed on the lead screw nuts, and the connecting structure comprises the connecting portions, the guide sleeves and the lead screw nuts.
8. The high and low temperature chamber for testing chips as claimed in claim 6, wherein said rotary driving assembly comprises a main gear, a sub-gear and a gear driver, said main gear is mounted at the output end of said gear driver, said main gear and said sub-gear are engaged, said sub-gear is fixedly connected to said lead screw, said gear driver is used for driving said main gear to rotate so as to drive said sub-gear and said lead screw to rotate.
9. The high and low temperature box for chip testing according to claim 1, further comprising a sealing device, wherein the sealing device comprises an opening and closing driving device and a sealing member, and the sealing member is driven by the opening and closing driving device to be in sealing connection with or separated from the material taking port, so that the material taking port is switched between a closed state and an open state.
10. The high and low temperature chamber for chip testing according to claim 9, wherein the opening and closing driving device comprises a sealing driving mechanism and a moving driving mechanism, the sealing member is installed at an output end of the sealing driving mechanism, the moving driving mechanism is used for driving the sealing driving mechanism to move so that the sealing member corresponds to or is staggered with the material taking port, and the sealing driving mechanism is used for driving the sealing member to move so that the sealing member is at least partially inserted into or separated from the material taking port.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220295789.8U CN217034161U (en) | 2022-02-14 | 2022-02-14 | High-low temperature box for chip test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220295789.8U CN217034161U (en) | 2022-02-14 | 2022-02-14 | High-low temperature box for chip test |
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| Publication Number | Publication Date |
|---|---|
| CN217034161U true CN217034161U (en) | 2022-07-22 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202220295789.8U Active CN217034161U (en) | 2022-02-14 | 2022-02-14 | High-low temperature box for chip test |
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| Country | Link |
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| CN (1) | CN217034161U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116106722A (en) * | 2022-12-19 | 2023-05-12 | 上海赢朔电子科技股份有限公司 | Chip high-low temperature test machine |
-
2022
- 2022-02-14 CN CN202220295789.8U patent/CN217034161U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116106722A (en) * | 2022-12-19 | 2023-05-12 | 上海赢朔电子科技股份有限公司 | Chip high-low temperature test machine |
| CN116106722B (en) * | 2022-12-19 | 2023-12-15 | 上海赢朔电子科技股份有限公司 | Chip high-low temperature test machine |
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