CN216956254U

CN216956254U - Chip testing system

Info

Publication number: CN216956254U
Application number: CN202123063120.0U
Authority: CN
Inventors: 陈超村; 郑挺; 郑朝生; 张亦锋
Original assignee: Guangdong Leadyo Ic Testing Co ltd
Current assignee: Guangdong Leadyo Ic Testing Co ltd
Priority date: 2021-12-07
Filing date: 2021-12-07
Publication date: 2022-07-12
Anticipated expiration: 2031-12-07

Abstract

The utility model discloses a chip testing system, which comprises testing equipment and a chip turnover device, wherein the testing equipment comprises a testing box, one side of the testing box is provided with a placing opening, a containing frame is placed in the testing box, and a plurality of layers of first bearing brackets are arranged at intervals up and down on the containing frame; the chip turnover device comprises a turnover frame and a traveling mechanism arranged at the bottom of the turnover frame, wherein a plurality of layers of second support brackets are arranged on the turnover frame at intervals up and down, and at least part of the plurality of layers of second support brackets and at least part of the plurality of layers of first support brackets can be arranged to be opposite to each other; under the action of the travelling mechanism, at least one part of the second bracket with multiple layers can be respectively butted to or correspondingly close to at least one part of the first bracket with multiple layers, so that the test plate on the second bracket can be completely slid to the first bracket along the second bracket and the first bracket. The chip testing system can improve the efficiency of transferring the testing board.

Description

Chip testing system

Technical Field

The utility model relates to the technical field of chip testing equipment, in particular to a chip testing system.

Background

The chip needs to be subjected to performance testing after the production is completed. The existing steps for testing the chip are as follows: the tester will survey test panel and place the material loading in order to carry out the chip on the material loading machine earlier, the survey test panel of accomplishing the material loading can be deposited on the turnover frame, treat that the turnover frame is deposited with sufficient survey test panel after, the tester just begins to carry the survey test panel to the test box on the turnover frame, in order to utilize the test box to test the chip, but turnover frame and test box setting are in different positions, when testing at every turn, all need the tester to carry the survey test panel to the test box piece by piece on the turnover frame, the artifical inefficiency that shifts the survey test panel, and the position height that the survey test panel was placed to turnover frame and test box differs, the tester is difficult to take out and put into the survey test panel, the operation degree of difficulty that has increased the transfer survey test panel, influence holistic efficiency of software testing.

SUMMERY OF THE UTILITY MODEL

The utility model aims to provide a chip testing system which can improve the efficiency of transferring a testing board.

In order to achieve the purpose, the utility model discloses a chip testing system which is used for testing a chip placed on a testing board and comprises testing equipment and a chip turnover device, wherein the testing equipment comprises a testing box, one side of the testing box is provided with a placing port, the placing port can be switched between an open state and a closed state, a containing frame is placed in the testing box, the containing frame is configured to be placed corresponding to the placing port, and a plurality of layers of first bearing brackets are arranged at intervals up and down on the containing frame; the chip turnover device comprises a turnover frame and a travelling mechanism arranged at the bottom of the turnover frame, wherein multiple layers of second bearing brackets are arranged on the turnover frame at intervals up and down, and at least part of the multiple layers of second bearing brackets and at least part of the multiple layers of first bearing brackets can be arranged to be opposite to each other in pairs; under the action of the travelling mechanism, at least parts of the multiple layers of the second support brackets can be respectively butted to or correspondingly close to at least parts of the multiple layers of the first support brackets so that the test plates on the second support brackets can be completely slid to the first support brackets along the second support brackets and the first support brackets.

The chip transfer device is arranged to transfer the test boards to the test boxes, a plurality of layers of first bearing brackets are arranged on a containing frame in each test box at intervals up and down, each chip transfer device comprises a transfer frame and a traveling mechanism arranged at the bottom of the transfer frame, a plurality of layers of second bearing brackets are arranged on the transfer frame at intervals up and down, the transfer frame can convey a plurality of test boards at one time, the test boards are prevented from being conveyed one by one, the plurality of layers of second bearing brackets and the plurality of layers of first bearing brackets are arranged to be opposite to each other, and under the action of the traveling mechanisms, the plurality of layers of second bearing brackets can be respectively butted with or correspondingly close to the plurality of layers of first bearing brackets, so that the test boards on the second bearing brackets can completely slide to the first bearing brackets along the second bearing brackets and the first bearing brackets, the operation of putting the test boards into the test boxes is simplified, and the efficiency of transferring the test boards is improved.

Optionally, each layer of the second supporting bracket includes two first brackets respectively disposed on two opposite sides of the revolving rack, and the two first brackets are respectively used for supporting two opposite sides of the testing board.

Optionally, the first support comprises a bottom plate extending in a longitudinal direction and a side plate connected to an outer side of the bottom plate, the bottom plate is used for supporting the test plate, and the side plate is used for limiting outward movement of the test plate.

Optionally, the first bracket includes a discharge end for sliding out of the test board and a material limiting end far away from the discharge end, the material limiting end is provided with a limiting part, and the limiting part is used for limiting backward sliding of the test board.

Optionally, the first bracket includes a discharge end for sliding out the test board, and the discharge end is formed with a guide slope for guiding the test board to slide toward the corresponding first support bracket.

Optionally, the turnover frame comprises a base, two vertical support frames and a plurality of transverse supports, two ends of each transverse support frame are respectively fixedly connected with the two vertical support frames, the two vertical support frames are fixedly connected with the base, and a plurality of first support frames are arranged on one side, opposite to the vertical support frames, of the corresponding vertical support frames at intervals.

Optionally, the multiple layers of the second support brackets respectively include discharge ends, and the discharge ends exceed the vertical support frames in the discharge direction of the test board; running gear is including setting up linking bridge, two at least first pulleys and the second pulley of the bottom of base, linking bridge with the second pulley is installed respectively the base is followed both ends around the ejection of compact direction, linking bridge is in surpass in the ejection of compact direction the base, first pulley is installed respectively linking bridge, wherein at least one first pulley is installed linking bridge is in surpass in the ejection of compact direction the position of base, linking bridge part removes extremely the below of test box.

Optionally, each layer of the first supporting bracket comprises two oppositely arranged second brackets, and the second brackets are used for supporting two opposite ends of the test board entering the containing frame; the second supports which are arranged oppositely are respectively provided with a channel which extends along the longitudinal direction, the outer side of each channel forms a limiting wall, the inner side of each channel is opened, and when the test board slides into the first support bracket from the second support bracket, the two sides of the test board respectively slide into the channels.

Optionally, the second bracket comprises an upper plate and a lower plate which are oppositely arranged up and down, the channel is formed between the upper plate and the lower plate, an upward inclined guide surface is formed at one end of the upper plate close to the placing opening, and a downward inclined guide surface is formed at one end of the lower plate close to the placing opening; one end of the second support, which is far away from the placing opening, is provided with a stop structure used for limiting the test board to slide.

Optionally, an adsorption device is disposed on one side of the test box having the placing opening, corresponding to the turnover frame, and when the turnover frame moves to the test box and the second support bracket is in butt joint with the first support bracket, the adsorption device can adsorb and fix the turnover frame.

Drawings

Fig. 1 is a three-dimensional structure diagram of a chip testing system according to an embodiment of the utility model.

FIG. 2 is an exploded view of a chip test system according to an embodiment of the present invention.

Fig. 3 is a three-dimensional structural diagram of a chip transfer device in an embodiment of the utility model.

Fig. 4 is a three-dimensional structure diagram of the containing frame in the embodiment of the utility model.

FIG. 5 is a sectional view of the container rack according to the embodiment of the present invention.

Detailed Description

In order to explain technical contents, structural features, and objects and effects of the present invention in detail, the following detailed description is given with reference to the accompanying drawings in conjunction with the embodiments.

Referring to fig. 1 to 5, the utility model discloses a chip testing system for testing a chip placed on a testing board 100, which includes a testing device 200 and a chip transferring device 300, wherein the testing device 200 includes a testing box 1, a placing port 11 is provided at one side of the testing box 1, the placing port 11 can be switched between an open state and a closed state, a containing frame 2 is placed in the testing box 1, the containing frame 2 is configured to be placed corresponding to the placing port 11, and a plurality of layers of first supporting brackets 3 are arranged at intervals above and below the containing frame 2; the chip turnover device 300 comprises a turnover frame 4 and a travelling mechanism 5 arranged at the bottom of the turnover frame 4, wherein multiple layers of second bearing brackets 6 are arranged on the turnover frame 4 at intervals up and down, at least part of the multiple layers of second bearing brackets 6 and at least part of the multiple layers of first bearing brackets 3 can be arranged to be opposite to each other in pairs (the second bearing brackets 6 and the first bearing brackets 3 are correspondingly arranged at the same height); under the action of the traveling mechanism 5, at least a portion of the plurality of tiers of second brackets 6 may be respectively docked to or brought into close proximity with at least a portion of the plurality of tiers of first brackets 3 to enable the test panels 100 on the second brackets 6 to slide completely along the second brackets 6 and the first brackets 3 to the first brackets 3.

The utility model is provided with a chip transfer device 300 for transferring a test board 100 to a test box 1, a plurality of layers of first bearing brackets 3 are arranged at intervals up and down on a containing frame 2 in the test box 1, the chip transfer device 300 comprises a transfer frame 4 and a traveling mechanism 5 arranged at the bottom of the transfer frame 4, a plurality of layers of second bearing brackets 6 are arranged at intervals up and down on the transfer frame 4, the transfer frame 4 can convey a plurality of test boards 100 at one time, the test boards 100 are prevented from being carried one by one, the plurality of layers of second bearing brackets 6 and the plurality of layers of first bearing brackets 3 are arranged in pairs opposite, under the action of the traveling mechanism 5, the plurality of layers of second bearing brackets 6 can be respectively butted to or correspondingly close to the plurality of layers of first bearing brackets 3, so that the test boards 100 on the second bearing brackets 6 can completely slide to the first bearing brackets 3 along the second bearing brackets 6 and the first bearing brackets 3, thereby simplifying the operation of putting the test boards 100 into the test box 1, the efficiency of transferring the test board 100 is improved.

In this embodiment, the testing board 100 is provided with a plurality of chip testing seats 1000, and the chip testing seats 101 are used for testing chips. The test box 1 is an oven, but not limited thereto, which can make the temperature of the chip tested on the chip test socket 101 at the corresponding test temperature.

Referring to fig. 1 to 3, each layer of the second supporting brackets 6 includes two first brackets 61 respectively disposed on two opposite sides of the revolving rack 4, and the two first brackets 61 are respectively used for supporting two opposite sides of the testing board 100. The two first brackets 61 arranged oppositely are simple in structure and easy to install, but are not limited thereto, for example, each layer of the second support bracket 6 may also be a horizontally arranged support plate.

Referring to fig. 1 to 3, the first support 61 includes a bottom plate 62 and a side plate 63 extending along a longitudinal direction, the side plate 63 is connected to an outer side of the bottom plate 62, the bottom plate 62 is used for supporting the test board 100, and the side plate 63 is used for limiting the outward movement of the test board 100, so as to facilitate the stable placement of the test board 100 in the turnover frame 4. Specifically, in the present embodiment, the cross section of the first bracket 61 is L-shaped, but is not limited thereto.

Referring to fig. 1 to 3, the first bracket 61 includes a discharging end 64 for sliding the test board 100 out and a material limiting end 65 far away from the discharging end 64, the material limiting end 65 is provided with a limiting member 651, and the limiting member 651 is used for limiting the backward sliding of the test board 100. The limiting member is arranged to prevent the test board 100 from sliding out of the limiting end 65 when the transfer rack 4 moves.

Specifically, before moving the turnover frame 4 to the test box 1, the tester needs to put the test board 100 that has completed loading into the turnover frame 4, and the position-limiting member 651 can perform positioning.

Referring to fig. 1 to 3, the first rack 61 includes a discharging end 64 for sliding the test board 100 out, the discharging end 64 is formed with a guiding inclined plane 641, and the guiding inclined plane 641 is used for guiding the test board 100 to slide towards the corresponding first bracket 3. Specifically, the bottom plate 62 of the first bracket 61 and the discharge end 64 of the side plate 63 are respectively provided with a guide slope 641, and the two guide slopes 641 are inclined along the direction that the test board 100 slides out of the peripheral frame 4, so that the test board 100 can smoothly slide to the corresponding first bracket 3.

In this embodiment, when the tester puts the test board 100 that has completed loading into the turnover frame 4, the guide slope 641 can also play a role in guiding the test board 100 to slide into the first bracket 61, which is beneficial to reducing the operation difficulty of the tester putting the test board 100 into the turnover frame 4.

Referring to fig. 1 to 3, the turnover frame 4 includes a base 41, two vertical support frames 42 and a plurality of horizontal supports 43, two ends of the horizontal supports 43 are respectively fixedly connected with the two vertical support frames 42, the two vertical support frames 42 are fixedly connected to the base 41, and a plurality of first supports 61 are arranged on one side of the two vertical support frames 42 opposite to each other at intervals, so that a plurality of test boards 100 can be placed on the turnover frame 4, and the efficiency of transporting the test boards 100 is improved.

Specifically, in this embodiment, the two vertical supporting frames 42 respectively include two vertical brackets 44 and a plurality of vertical brackets 45, two ends of each vertical bracket 45 are respectively fixedly connected to the two vertical brackets 44, and one end of each vertical bracket 44 extends toward the base 41 and is fixedly connected to the base 41. The test carriage 4 further comprises a connecting frame 46 having a rectangular frame structure, the connecting frame 46 being arranged at the discharge end 64 of the first support 61, a part of the longitudinal supports 45 extending in the direction in which the test panel 100 slides out of the test carriage 4 and being fixedly connected to the connecting frame 46. The two ends of the first bracket 61 are fixedly connected with the connecting frame 46 and the vertical bracket 44 respectively.

More specifically, two vertical supporting frames 42 are fixedly connected to one side of the upper surface of the base 41, and a tester can stand on the other side to push the test board 100 on the second support bracket 6 to slide to the first support bracket 3. The turnover frame 4 is further provided with two first handles 47, and the two first handles 47 are respectively arranged on the two vertical supporting frames 42 so that a tester can push the turnover frame 4 to move.

Referring to fig. 1 to 3, the plurality of second support brackets 6 respectively include a discharge end 64, the discharge end 64 exceeding the vertical support frame 42 in the discharge direction of the test board 100; the traveling mechanism 5 comprises a connecting bracket 51, at least two first pulleys 52 and a second pulley 53 which are arranged at the bottom of the base 41, the connecting bracket 51 and the second pulley 53 are respectively arranged at the front end and the rear end of the base 41 along the discharging direction, the connecting bracket 51 exceeds the base 41 in the discharging direction, the first pulleys 52 are respectively arranged on the connecting bracket 51, at least one first pulley 52 is arranged at the position where the connecting bracket 51 exceeds the base 41 in the discharging direction, and the connecting bracket 51 partially moves to the lower part of the test box 1. The part of above-mentioned second bracket 6 surpasss vertical support frame 42 makes it can stretch into test box 1 through placing mouthful 11, be favorable to the cooperation between second bracket 6 and the first bracket 3, so that the survey test panel 100 on the second bracket 6 can slide to first bracket 3 smoothly, but also can lead to the focus of turnover frame 4 to lean on forward simultaneously, and the focus of turnover frame 4 can be adjusted in the setting of linking bridge 51 and first pulley 52, be favorable to turnover frame 4 whole keep balance, promote structural stability.

Specifically, in the present embodiment, the traveling mechanism 5 includes two connecting brackets 51 and two second pulleys 53 disposed on opposite sides of the bottom of the base 41, the two connecting brackets 51 are respectively provided with two first pulleys 52, and the first pulleys 52 and the second pulleys 53 are universal wheels with brakes, but are not limited thereto.

Referring to fig. 2 and 4, each layer of the first support bracket 3 includes two second supports 31 disposed opposite to each other, and the second supports 31 are used for supporting opposite ends of the test board 100 entering the receiving rack 2. The second support 31 that sets up relatively simple structure, easily installation, and be favorable to the inside air of test box 1 to circulate in holding frame 2.

Referring to fig. 2 and 4, the two oppositely disposed second brackets 31 are respectively formed with a slot 311 extending along the longitudinal direction, the outer side of the slot 311 forms a limiting wall, the inner side of the slot 311 is open, when the test board 100 slides into the first bracket 3 from the second bracket 6, both sides of the test board 100 respectively slide into the slot 311, the slot 311 enables the test board 100 to accurately slide to the first bracket 3, and can limit the movement of the test board 100 after sliding into the first bracket 3, so as to improve the stability of the test board 100 placed in the accommodating frame 2.

Specifically, in the present embodiment, the second bracket 31 is a C-shaped groove, but is not limited thereto.

Referring to fig. 2 and 4, the second support 31 includes an upper plate 312 and a lower plate 313 oppositely disposed up and down, a channel 311 is formed between the upper plate 312 and the lower plate 313, an end of the upper plate 312 near the placing opening 11 is formed with a guide surface 314 inclined upward, an end of the lower plate 313 near the placing opening 11 is formed with a guide surface 314 inclined downward, and the guide surface 314 is disposed to facilitate the test board 100 to smoothly slide from the first support bracket 3 to the second support bracket 6; one end of the second bracket 31, which is away from the placing opening 11, is provided with a stop structure for limiting the sliding of the test board 100, so as to prevent the test board 100 from sliding out of the slot 311 during chip testing, thereby improving the stability of placing the test board 100 on the accommodating frame 2.

Specifically, the stop structure is a limiting plate 32, but not limited thereto, in this embodiment, two ends of the limiting plate 32 vertically extend and are fixedly connected to the accommodating frame 2, and after the testing board 100 completely slides to the first bracket 3, one end of the testing board 100 away from the placing opening 11 abuts against the limiting plate 32.

More specifically, the test board 100 is provided with two second handles 101 along the direction sliding out of the circulating frame 4, so as to facilitate the tester to carry the test board 100 and push the test board 100 to move, the end of the test board 100 close to the position-limiting plate 32 is further provided with a positioning pin 102 and a communication connector 103, the position-limiting plate 32 is correspondingly provided with an opening 321, a positioning hole 322 and a communication port 323, when the test board 100 completely slides to the first carrier 3, the second handle 101 on the test board 100 close to the position-limiting plate 32 passes through the opening 321, the positioning pin 102 passes through the positioning hole 322 to position the test board 100, and the communication connector 103 passes through the communication port 323 and is connected with the test box 1 to transmit the test information.

Referring to fig. 2, 4 and 5, in this embodiment, the accommodating frame 2 is a rectangular frame structure, the accommodating frame 2 includes a vertical accommodating support 21, a vertical accommodating support 22 and a horizontal accommodating support 23, which are connected to each other at the ends, and such a frame structure is favorable for the internal air of the test box 1 to flow through the accommodating frame 2, so that the chips at different positions on the test board 100 can both perform sufficient heat exchange, thereby reducing the temperature deviation between the chips and improving the accuracy of chip testing. Specifically, the vertical accommodating support 21, the longitudinal accommodating support 22 and the transverse accommodating support 23 are stainless steel pipes and are respectively provided with four stainless steel pipes, the respective ends of the stainless steel pipes are fixed by welding, and the overall structural stability of the accommodating frame 2 is good.

Referring to fig. 1 and 2, an adsorption device 12 is disposed on one side of the test box 100 having the placement opening 11 corresponding to the turnover frame 4, and when the turnover frame 4 moves to the test box 1 and the second support bracket 6 is in butt joint with the first support bracket 3, the adsorption device 12 can adsorb and fix the turnover frame 4, so as to prevent the position of the chip turnover device 300 from shifting when the tester transfers the test board 100.

Specifically, in the present embodiment, the suction device 12 is an electromagnet device, when the transfer rack 4 is moved to the proper position and the second support bracket 6 is in butt joint with the first support bracket 3, a travel switch of the electromagnet device is activated, the electromagnet device generates magnetism to suck and fix the transfer rack 4, and the electromagnet device can be manually controlled to stop sucking the transfer rack 4 through a button switch.

The above disclosure is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the scope of the present invention, therefore, the present invention is not limited by the appended claims.

Claims

1. A chip testing system for testing a chip placed on a test board, comprising:

the test device comprises a test box, wherein a placing opening is formed in one side of the test box and can be switched between an open state and a closed state, a containing frame is placed in the test box and configured to be placed corresponding to the placing opening, and a plurality of layers of first bearing brackets are arranged at intervals up and down on the containing frame;

the chip turnover device comprises a turnover frame and a travelling mechanism arranged at the bottom of the turnover frame, wherein multiple layers of second bearing brackets are arranged on the turnover frame at intervals up and down, and at least part of the multiple layers of second bearing brackets and at least part of the multiple layers of first bearing brackets can be arranged to be opposite to each other in pairs;

under the action of the travelling mechanism, at least parts of the multiple layers of the second support brackets can be respectively butted to or correspondingly close to at least parts of the multiple layers of the first support brackets so that the test plates on the second support brackets can be completely slid to the first support brackets along the second support brackets and the first support brackets.

2. The system for testing chips of claim 1, wherein each of said second supporting brackets includes two first brackets respectively disposed at two opposite sides of said circulating frame, and said two first brackets are respectively used for supporting two opposite sides of the testing board.

3. The chip test system according to claim 2, wherein the first frame includes a bottom plate and a side plate extending in a longitudinal direction, the side plate being connected to an outer side of the bottom plate, the bottom plate supporting the test plate, the side plate limiting outward movement of the test plate.

4. The chip testing system according to claim 2, wherein the first bracket comprises a discharging end for sliding out the testing board and a material limiting end far away from the discharging end, the material limiting end is provided with a limiting member for limiting the backward sliding of the testing board.

5. The chip testing system according to claim 2, wherein the first frame includes a discharging end for sliding out the test board, the discharging end being formed with a guide slope for guiding the test board to slide toward the corresponding first carrier.

6. The chip testing system of claim 2, wherein the turnover frame comprises a base, two vertical supporting frames and a plurality of transverse supports, two ends of each transverse support are respectively and fixedly connected with the two vertical supporting frames, the two vertical supporting frames are fixedly connected with the base, and a plurality of first supports are arranged on one side, opposite to the two vertical supporting frames, of the two vertical supporting frames at intervals up and down.

7. The chip test system according to claim 6,

the plurality of layers of second bearing brackets respectively comprise discharge ends, and the discharge ends exceed the vertical supporting frames in the discharge direction of the test board;

running gear is including setting up linking bridge, two at least first pulleys and the second pulley of the bottom of base, linking bridge with the second pulley is installed respectively the base is followed both ends around the ejection of compact direction, linking bridge is in surpass in the ejection of compact direction the base, first pulley is installed respectively linking bridge, wherein at least one first pulley is installed linking bridge is in surpass in the ejection of compact direction the position of base, linking bridge part removes extremely the below of test box.

8. The chip test system of claim 1, wherein each of said first support brackets includes two oppositely disposed second supports for holding opposite ends of a test board entering said receiving rack; the two oppositely arranged second supports are respectively provided with a channel extending along the longitudinal direction, the outer sides of the channels form limiting walls, the inner sides of the channels are open, and when the test board slides into the first bearing bracket from the second bearing bracket, the two sides of the test board respectively slide into the channels.

9. The chip testing system according to claim 8, wherein the second frame comprises an upper plate and a lower plate which are oppositely arranged up and down, the channel is formed between the upper plate and the lower plate, an end of the upper plate close to the placing opening is formed with an upward inclined guide surface, and an end of the lower plate close to the placing opening is formed with a downward inclined guide surface; and one end of the second support, which is far away from the placing opening, is provided with a stop structure for limiting the test board to slide.

10. The chip testing system according to claim 1, wherein a suction device is disposed on a side of the testing box having the placing opening corresponding to the transferring rack, and the suction device can suck and fix the transferring rack when the transferring rack moves to the testing box and the second support bracket is in butt joint with the first support bracket.