CN216927012U - Integrated operational amplifier comprehensive parameter tester - Google Patents
Integrated operational amplifier comprehensive parameter tester Download PDFInfo
- Publication number
- CN216927012U CN216927012U CN202220330163.6U CN202220330163U CN216927012U CN 216927012 U CN216927012 U CN 216927012U CN 202220330163 U CN202220330163 U CN 202220330163U CN 216927012 U CN216927012 U CN 216927012U
- Authority
- CN
- China
- Prior art keywords
- operational amplifier
- tested
- electromagnetic relay
- single chip
- chip microcomputer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Abstract
The utility model discloses an integrated operational amplifier comprehensive parameter tester, which mainly comprises a single chip microcomputer, an operational amplifier, a multi-path A/D acquisition unit, a sine wave generator, an LCD (liquid crystal display), a resistor, a capacitor, an electromagnetic relay, a triode, a light emitting diode and a power supply. The single chip microcomputer is used as a main controller and is respectively connected with the multi-path A/D acquisition unit, the sine wave generator, the LCD and the test circuit. Various parameters of the tested operational amplifier can be automatically tested and displayed through the automatic control and calculation of the single chip microcomputer. The utility model has simple structure, convenient operation, accurate measurement, convenient debugging and maintenance, high integration level and high automation. The measurement of the input offset voltage, the input offset current, the common mode rejection ratio and the open loop voltage gain of the operational amplifier to be tested can be realized. The base which is easy to pull and insert is adopted, so that the operational amplifier to be tested can be quickly replaced.
Description
Technical Field
The utility model belongs to the technical field of semiconductor integrated circuit testing, and particularly relates to an integrated operational amplifier comprehensive parameter testing device.
Background
The operational amplifier is a multi-stage direct-coupled amplifier circuit with high open-loop amplification and deep negative feedback. It is used in electronic analog computer as basic operation unit to complete addition, subtraction, multiplication, division, integral, differential and other mathematical operations. Early operational amplifiers were built with electronic transistors and later replaced with transistor discrete component operational amplifiers. With the development of semiconductor integration technology, since the first integrated operational amplifier appeared in the early sixties, the application of operational amplifiers has been far beyond the limit of analog computers, and the operational amplifiers have been widely applied in signal operation, signal processing, signal measurement, waveform generation and the like. The integrated operational amplifier has the characteristics of low price, excellent performance and the like, and is widely applied to the fields of personal data assistants, communication, automotive electronics, sound products, instruments and meters, sensors and the like. With the continuous progress of digital technology and the development of the integrated circuit market; SOC or hybrid integrated circuits with both analog and digital integrated circuits will be increasingly appreciated.
Meanwhile, the measurement of the integrated operational amplifier parameters also puts higher requirements on developers and technical instruments, and the traditional calibration scheme of the operational amplifier tester cannot meet the requirements of the market, particularly national defense and military industry. Calibration of operational amplifier testers presents significant challenges. Therefore, the key problem to be solved in the future is to improve the testing precision of the operational amplifier tester and ensure the accuracy of the operational amplifier device.
SUMMERY OF THE UTILITY MODEL
Aiming at the problems, the utility model provides an integrated operational amplifier comprehensive parameter tester. The experimental instrument can effectively measure the input offset voltage, the input offset current, the common mode rejection ratio and the open loop voltage gain of the operational amplifier to be measured by automatically controlling the on-off of the electromagnetic relay through the singlechip. The testing instrument is simple to operate, high in integration level and small in occupied space, automatic reading and automatic calculation can be achieved by connecting the A/D sampling unit for collecting signals, the relay and the single chip microcomputer, the trouble of manual calculation is reduced, and the automatic control switch facilitates experimental operation.
In order to achieve the above object, the present invention adopts the following technical solutions
An integrated operational amplifier comprehensive parameter tester, the experimental device mainly comprises: the device comprises a generator for generating sine wave signals, an A/D sampling unit for receiving the sine wave signals, a single chip used as a main controller, a peripheral control circuit, an LCD display for displaying test results and a key. The singlechip is used as a central controller and is respectively connected with an electromagnetic relay of a controller circuit, an A/D sampling unit for collecting signals, a sine wave signal generator, a power supply and an LCD display. The signal generator is respectively connected with the single chip microcomputer and the control circuit; the A/D sampling unit for receiving sine wave signals is connected with the test circuit and the singlechip respectively.
In the peripheral control circuit, a tested operational amplifier (u2) is controlled by a first electromagnetic relay (K1) on the left side and is connected with a sixth resistor (R6) in series on the right side, then the tested operational amplifier (u2) is connected with a seventh resistor (R7) and is connected with the non-inverting input end of the tested operational amplifier (u2) respectively, the inverting input end and the output end of the tested operational amplifier are connected with a ninth resistor (R9) in series and are grounded in the middle, the output end of the tested operational amplifier is connected with a tenth resistor (R10) in series and then is connected with an A/D sampling unit line for receiving sine wave signals, and a capacitor is placed in the middle and is grounded. The signals of the sine wave signal generator are respectively controlled and input by a second electromagnetic relay (K2) and a third electromagnetic relay (K3), and the input directions are the non-inverting input end and the inverting input end of the operational amplifier to be tested; the voltage is directly input into the non-inverting input end of the operational amplifier to be tested through a seventh resistor (R7).
Preferably, a first electromagnetic relay, a second electromagnetic relay and a third electromagnetic relay are additionally arranged on the peripheral control circuit, and the ADC voltage signal acquisition carried by the single chip microcomputer is connected to the output end on the right side of the peripheral control circuit.
Preferably, the operational amplifier to be tested and the peripheral power supply of +/-12V owned by the operational amplifier to be tested are used for supplying power to the electromagnetic relay, and the conduction of the circuit is controlled by the singlechip and the triode.
The utility model has the beneficial effects that:
firstly, compared with the traditional operation mode, the experimental method has the following characteristics: the operation is simple, and through the closing of the electromagnetic relay, the following can be measured on the device: the input offset voltage, the input offset current, the common mode rejection ratio and the open loop voltage gain of the operational amplifier to be tested. The automatic test can effectively improve the experimental efficiency.
Second, compare with traditional artifical manual experimental apparatus, through adding electromagnetic relay, the AD sampling unit of gathering signal etc. and be connected them with the singlechip as central processing unit, can directly accomplish automatic reading and calculate through button control singlechip during the measurement, avoided the trouble of artifical reading calculation, improved precision efficiency.
Thirdly, the device related to the experimental method can meet the requirement of testing experiments, save the space of a laboratory and simplify the operation steps, and the test result is more accurate.
Drawings
To illustrate the technical solutions of the embodiments of the present invention more clearly, the drawings of the embodiments will be briefly introduced, and it is obvious that the drawings in the following description only relate to some embodiments of the present invention, and are not to limit the present invention.
FIG. 1 is a schematic logic diagram of the apparatus;
FIG. 2 is a schematic diagram of a peripheral control circuit of the integrated operational amplifier comprehensive parameter tester according to the present invention;
in fig. 2: r1, R2, R3, R4, R5, R6, R7, R8, R9, R10, R11, R12, R13-first to thirteenth resistors, R2, R8625f-resistance, C-capacitance, K1, K2, K3-first to third electromagnetic relays, Q1, Q2, Q3-first to third triodes, u 1-operational amplifier under test, u 2-operational amplifier under test, D1, D2, D3-first to third diodes.
FIG. 3 is a schematic diagram of a single chip microcomputer of the integrated operational amplifier comprehensive parameter tester of the present invention;
FIG. 4 is a schematic diagram of a signal source of an integrated operational amplifier comprehensive parameter tester according to the present invention;
FIG. 5 is a schematic diagram of a key principle of an integrated operational amplifier comprehensive parameter tester according to the present invention;
Detailed Description
The utility model is further illustrated with reference to the following figures and examples:
as shown in the attached drawings, the integrated operational amplifier comprehensive parameter tester mainly comprises: the device comprises a generator for generating sine wave signals, an A/D sampling unit for receiving the sine wave signals, a single chip used as a main controller, a peripheral control circuit, an LCD display for displaying test results and a key. The singlechip is used as a central controller and is respectively connected with an electromagnetic relay of a controller circuit, an A/D sampling unit for collecting signals, a sine wave signal generator, a power supply and an LCD display. The signal generator is respectively connected with the single chip microcomputer and the control circuit; the A/D sampling unit for receiving sine wave signals is connected with the test circuit and the singlechip respectively.
In the peripheral control circuit, a tested operational amplifier (u2) is controlled by a first electromagnetic relay (K1) on the left side and is connected with a sixth resistor (R6) in series on the right side, then the tested operational amplifier (u2) is connected with a seventh resistor (R7) and is connected with the non-inverting input end of the tested operational amplifier (u2) respectively, the inverting input end and the output end of the tested operational amplifier are connected with a ninth resistor (R9) in series and are grounded in the middle, the output end of the tested operational amplifier is connected with a tenth resistor (R10) in series and then is connected with an A/D sampling unit line for receiving sine wave signals, and a capacitor is placed in the middle and is grounded. The signal of the sine wave signal generator is controlled and input by a second electromagnetic relay (K2) and a third electromagnetic relay (K3) respectively, and the input directions are the non-inverting input end and the inverting input end of the operational amplifier to be tested; the voltage is directly input to the non-inverting input end of the operational amplifier to be tested through a seventh resistor (R7).
The circuit is automatically controlled by connecting a first electromagnetic relay (K1), a second electromagnetic relay (K2) and a third electromagnetic relay (K3) with a single chip microcomputer, wherein the first electromagnetic relay (K1) controls whether the non-inverting input end and the inverting input end of an operational amplifier to be tested are respectively connected with a third resistor (R3) and a fourth resistor (R4) in series; the second electromagnetic relay (K2) controls the non-inverting and inverting input ends of the operational amplifier to be tested to be connected with a signal source or grounded; and a third electromagnetic relay (K3) controls whether the non-inverting input end of the operational amplifier to be tested is connected to a signal source or grounded.
The model of the singlechip is an STM32F103VET6 chip; the signal source model is an AD9851 chip; the model of the operational amplifier to be tested is AD 620; the first electromagnetic relay K1 is a double-pole double-throw switch with the model number of HK19F-DC 12V; the second electromagnetic relay K2 and the third electromagnetic relay K3 are both single-pole single-throw switches with model number of HK19F-DC 12V; the types of the first diode, the second diode and the third diode are 1N 4007; the models of the first triode, the second triode and the third triode are TS 4141; the sizes of the resistor and the capacitor are shown in figure 1.
The above description is only for the specific embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive of modifications or substitutions within the technical scope of the present invention, and shall be covered by the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the appended claims.
The operation of the utility model is as follows:
the peripheral control circuit is controlled by a double-pole double-throw relay K1 and two single-pole relays K2 and K3. The opening and closing of the relay are controlled by a single chip microcomputer. When the switch is fully opened (set reset switch is pressed) at the beginning of the operation, the electromagnetic relays k2 and k3 make the line grounded.
After pressing the start switch, the whole test circuit will start the following operations:
various functions are initialized, AD conversion is initialized, a signal source is initialized, and a DDS signal source starts generating a 4V, 5Hz sine wave signal.
1. Detecting input offset voltage VIO：
The singlechip inputs a high level at the end in1 to close the first electromagnetic relay K1, inputs low levels in2 and in3 to ground the second and third electromagnetic relays K2 and K3, and receives the output voltage VL0 from the tested operational amplifier through the AD conversion circuit. The single chip microcomputer runs the following calculation formula after receiving the signals:
R1＝R2 (2)
R3＝R4 (3)
VIO: inputting offset voltage V;
R1: a first resistance, Ω;
Rf: resistance, Ω;
VL0: the output end voltage V of the operational amplifier to be tested;
and displaying the final result on an LCD display screen, namely inputting the offset voltage VIO. And recorded.
2. Detecting input misalignmentCurrent IIO：
Firstly, the input ends in2 and in3 input low level to make the triode not be conducted, the second electromagnetic relay K2 and the third electromagnetic relay K3 are closed, the signal source is not conducted, the singlechip controls the first electromagnetic relay K1 to be closed, and the voltage V is measured at the output end of the amplifier to be measuredL0。
Keeping the above conditions unchanged, switching off the first electromagnetic relay K1, switching in the third and fourth resistors R3 and R4, and measuring the voltage V of the output end of the operational amplifier to be measured againL1.
The calculation formula is as follows:
IIO: inputting offset voltage V;
R1: a first resistance, Ω;
R3: a third resistance, Ω;
Rf: resistance, Ω;
VL0、VL1: the output end voltage V of the operational amplifier to be tested;
display the result on the display screen- "input offset current IIO”。
3. Detecting open loop gain AVD：
The singlechip inputs high level to close the first electromagnetic relay K1, the third and fourth resistors R3 and R4 are short-circuited at the moment, the second electromagnetic relay K2 is grounded (disconnected), the third electromagnetic relay K3 is closed, a signal source signal enters the control circuit through the third electromagnetic relay at the moment, and the output voltage detected at the output end of the operational amplifier to be detected is V0. Wherein VSThe amplitude of the voltage is 1.8V for the signal source.
The calculation formula is as follows:
AVD: open loop gain, dB;
VS: the voltage amplitude, V, of the signal source;
R1: a first resistance, Ω;
Rf: resistance, Ω;
VS: the voltage amplitude, V, of the signal source;
V0: the output voltage, V, is detected by the output of the operational amplifier under test.
The "open loop voltage gain" is displayed on the display.
4. Testing common mode rejection ratio KCMR
The first electromagnetic relay K1 is electrified to short circuit the third and fourth resistors R1 and R2, and the second electromagnetic relay K2 is closed to enable the alternating current common mode signal voltage V emitted by the signal sourceSWhen the voltage of the tested operational amplifier enters the tested operational amplifier, the switch K3 is disconnected from the ground, and the output voltage of the tested operational amplifier is measured to be V0，VSIt was 1.8V.
The calculation formula is as follows:
KCMR: common mode rejection ratio, dB;
VS: the voltage amplitude, V, of the signal source;
R1: a first resistance, Ω;
Rf: resistance, Ω;
VS: the voltage amplitude, V, of the signal source;
displaying the common mode rejection ratio K on the displayCMR”。
And finally displaying all the test data on a screen. Although the present invention has been described with reference to a preferred embodiment, it should be understood that various changes, substitutions and alterations can be made herein without departing from the spirit and scope of the utility model as defined by the appended claims.
Claims (4)
1. An integrated operational amplifier comprehensive parameter tester, the experimental device comprises: the device comprises a generator for generating sine wave signals, an A/D sampling unit for receiving the sine wave signals, a single chip microcomputer serving as a main controller, a peripheral control circuit, an LCD (liquid crystal display) for displaying test results and keys, wherein the single chip microcomputer serves as a central controller and is respectively connected with an electromagnetic relay of a controller circuit, the A/D sampling unit for acquiring the signals, the sine wave signal generator, a power supply and the LCD, and the signal generator is respectively connected with the single chip microcomputer and the control circuit; the A/D sampling unit for receiving sine wave signal is connected with the test circuit and the single chip microcomputer respectively,
the method is characterized in that: in the peripheral control circuit, the left side of an operational amplifier (u2) to be tested is controlled by a first electromagnetic relay (K1) and then is connected with a seventh resistor (R7) in series with a sixth resistor (R6) in series at the right side, the reverse-phase input end and the output end of the operational amplifier (u2) to be tested are connected with the non-inverting input end of the operational amplifier to be tested respectively, the reverse-phase input end and the output end of the operational amplifier are connected with a ninth resistor (R9) in series and grounded in the middle, the output end of the operational amplifier is connected with a tenth resistor (R10) in series and then is connected with an A/D sampling unit line for receiving sine wave signals, a capacitor is placed in the middle and grounded, signals of a sine wave signal generator are controlled and input by a second electromagnetic relay (K2) and a third electromagnetic relay (K3) respectively, and the input directions are the non-inverting input end and the reverse-phase input end of the operational amplifier to be tested; the voltage is directly input into the non-inverting input end of the operational amplifier to be tested through a seventh resistor (R7).
2. The integrated operational amplifier comprehensive parameter tester according to claim 1, characterized in that: the single chip microcomputer is used as a master controller and is connected with a generator for generating sine wave signals, an A/D sampling unit for receiving the sine wave signals, the single chip microcomputer used as a master controller, a peripheral control circuit, an LCD display for displaying test results and keys, the single chip microcomputer calculates after required parameters are obtained, and finally the results are displayed on the LCD display.
3. The integrated operational amplifier comprehensive parameter tester according to claim 1, characterized in that: the circuit is automatically controlled by connecting a first electromagnetic relay (K1), a second electromagnetic relay (K2) and a third electromagnetic relay (K3) with a single chip microcomputer, wherein the first electromagnetic relay (K1) controls whether the non-inverting input end and the inverting input end of an operational amplifier to be tested are respectively connected with a third resistor (R3) and a fourth resistor (R4) in series; the second electromagnetic relay (K2) controls the non-inverting and inverting input ends of the operational amplifier to be tested to be connected with a signal source or grounded; and a third electromagnetic relay (K3) controls whether the non-inverting input end of the operational amplifier to be tested is connected to a signal source or grounded.
4. The integrated operational amplifier comprehensive parameter tester according to claim 1, characterized in that: two keys are used for controlling the single chip microcomputer, wherein the key 1 is a reset key, and the key 2 is a test start key.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220330163.6U CN216927012U (en) | 2022-02-13 | 2022-02-13 | Integrated operational amplifier comprehensive parameter tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220330163.6U CN216927012U (en) | 2022-02-13 | 2022-02-13 | Integrated operational amplifier comprehensive parameter tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216927012U true CN216927012U (en) | 2022-07-08 |
Family
ID=82267182
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202220330163.6U Active CN216927012U (en) | 2022-02-13 | 2022-02-13 | Integrated operational amplifier comprehensive parameter tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN216927012U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117092484A (en) * | 2023-07-04 | 2023-11-21 | 江苏润石科技有限公司 | High-speed operational amplifier test circuit and test method thereof |
-
2022
- 2022-02-13 CN CN202220330163.6U patent/CN216927012U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117092484A (en) * | 2023-07-04 | 2023-11-21 | 江苏润石科技有限公司 | High-speed operational amplifier test circuit and test method thereof |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101299062B (en) | Device for checking zinc oxide lightning arrester block property current tester | |
| CN216927012U (en) | Integrated operational amplifier comprehensive parameter tester | |
| CN110389290A (en) | The system and method and device of a kind of electronic component noise testing and life appraisal | |
| CN205103374U (en) | Relay parameter testing appearance | |
| JP5423953B2 (en) | Battery simulator | |
| CN108106747A (en) | A kind of temperature sensor based on capacitive digital converter | |
| CN205785606U (en) | Digital pressure measuring instrument circuit | |
| CN203012023U (en) | A LCR tester | |
| CN106645590B (en) | Gas concentration measuring device based on differential acquisition | |
| CN202093715U (en) | Automatic control principle experiment box | |
| CN112180176A (en) | Capacitance value measuring circuit and method based on constant current source | |
| CN201780323U (en) | Small-signal measuring instrument | |
| CN106291065B (en) | Voltage sampling circuit | |
| CN105510674A (en) | Microcurrent measuring circuit | |
| CN104270632A (en) | Measuring instrument and method for screen parameters of television set | |
| CN104198920B (en) | Power amplifier direct current working point detector | |
| CN211123153U (en) | Simple triode amplifying circuit parameter and fault testing device | |
| CN213423040U (en) | Plant liquid flow monitoring device | |
| CN207866381U (en) | A kind of temperature sensor based on capacitive digital converter | |
| CN206945919U (en) | Electric quantity of lithium battery test device | |
| CN203275640U (en) | Portable calibration instrument of electric energy meter | |
| CN206740861U (en) | A kind of Milliohm resistance tester | |
| CN107942221B (en) | A kind of transistor output characteristic curve graphic instrument based on virtual instrument | |
| CN219142950U (en) | Microcurrent circuit for detecting energy storage BMS (battery management system) products | |
| CN111459078A (en) | Control circuit of simple circuit tester for teaching experiment and testing method thereof |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |