CN205103374U - Relay parameter testing appearance - Google Patents

Relay parameter testing appearance Download PDF

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Publication number
CN205103374U
CN205103374U CN201520650556.5U CN201520650556U CN205103374U CN 205103374 U CN205103374 U CN 205103374U CN 201520650556 U CN201520650556 U CN 201520650556U CN 205103374 U CN205103374 U CN 205103374U
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CN
China
Prior art keywords
relay
controller
voltage
circuit
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201520650556.5U
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Chinese (zh)
Inventor
王益
徐进
朱汉敏
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Suzhou Institute of Trade and Commerce
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Suzhou Institute of Trade and Commerce
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Priority to CN201520650556.5U priority Critical patent/CN205103374U/en
Application granted granted Critical
Publication of CN205103374U publication Critical patent/CN205103374U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model provides a relay parameter testing appearance, including controller, detector and display, the controller constitutes for the singlechip that can realize timing function, and this singlechip and a relay drive circuit link to each other. Wherein, the singlechip passes through the time -recorder timing. When the high level signal of singlechip output, relay drive circuit drives the dynamic relay actuation to trigger the time -recorder, the voltage signal that detection circuitry gathered in the relay obtains actuation voltage, when the low level signal of singlechip output, relay release triggers the time -recorder, and the voltage signal that detection circuitry gathered in the relay obtains the release voltage. And the detector includes actuation resistance test circuit, calculates the actuation resistance value that obtains the relay promptly according to reference resistance and the magnitude of voltage that records. The main performance parameter of the testable relay of this relay parameter testing appearance can carry out the multiple metering and average. This tester can realize the relay parameter quick, synthesize and measure, and convenient operation, to handle the precision higher.

Description

A kind of relay parameter tester
Technical field
The utility model relates to technology of instrument and meter field, particularly a kind of relay parameter tester.
Background technology
When detecting relay product quality, the parameters such as the pickup time of measuring relay, release time, minimum operate voltage, release voltage are needed to test.At present, some relay manufacturers still rely on manual adjustments supply voltage, go to judge that the on off operating mode of contact and armature position assess these parameters with human eye.But manual test is too many by the impact of human factor, and its error rate is high, wayward, seriously constrains the raising of production efficiency, is unfavorable for the production in enormous quantities of product.Other producer comparatively depends on import equipment, but import equipment encounters problems to relay test and is difficult to obtain technical support and the maintenance of dissimilar relay contact analog control system.And the test macro of domestic-developed, generally all involve great expense, test process is loaded down with trivial details.
Utility model content
The purpose of this utility model is to provide a kind of relay parameter tester, to realize the object of quick, the composite measurement to relay performance parameter.
For achieving the above object, the utility model provides a kind of relay parameter tester, comprising:
Controller, is connected with a relay drive circuit, for by described relay drive circuit for relay provides drive singal, and to process testing the voltage signal that obtains;
Detecting device, for gathering the voltage signal in described relay, and sends this voltage signal and processes to controller;
Display, the test result after processing for display controller;
Wherein, described controller comprises a timer, when described controller exports high level signal, described relay drive circuit provides rated voltage to described relay, relay adhesive, and triggering described timer initiation, the voltage signal in described testing circuit collection relay now, obtains the pick-up voltage of relay; When described controller output low level signal, relay discharges, and trigger described timer initiation, the voltage signal in described testing circuit collection relay now, obtains the release voltage of relay.
Preferably, also comprise D/A change-over circuit, described D/A change-over circuit is connected with described controller, described controller provides voltage control signal to the described D/A change-over circuit automatically raised or automatically reduce to be converted to simulating signal, and simulating signal is supplied to described relay to drive relay work again after an operational amplifier amplifies.
Preferably, described detecting device comprises adhesive resistance test circuit and signal acquisition circuit, described adhesive resistance test circuit comprises a constant current source, reference resistance and some operational amplifiers, described constant current source provides reference power supply for described some operational amplifiers and amplifies rear output by operational amplifier, the output terminal of described adhesive resistance test circuit is connected with described relay, described signal acquisition circuit is for gathering the voltage signal in relay, and voltage signal is sent to described controller, described controller is according to described voltage signal, the enlargement factor of reference resistance and operational amplifier calculates the adhesive resistance of relay.
Preferably, described display comprises LCD chip and peripheral circuit thereof, and the input pin of described LCD chip is connected with described controller, and when the signal that described controller outputs test result is to described LCD chip, described LCD chip shows test result.
Preferably, relay parameter tester also comprises reset circuit, and described reset circuit is connected with controller, comprises electric capacity and the resistance of series connection mutually, described electric capacity is in parallel with a reset key, and the tie point between described electric capacity and resistance is for exporting reset signal to controller.
Preferably, relay parameter tester also comprises crystal oscillating circuit, and described crystal oscillating circuit is connected with controller, and described crystal oscillating circuit is used for providing standard clock signal for described controller.
The relay parameter tester that the utility model provides comprises controller, detecting device and display, and controller is that the single-chip microcomputer that can realize clocking capability is formed, and this single-chip microcomputer is connected with a relay drive circuit.Wherein, when single-chip microcomputer is by timer.When single-chip microcomputer exports high level signal, relay drive circuit provides rated voltage to relay, relay adhesive, and triggered timer starts, and the voltage signal in testing circuit collection relay now, obtains the pick-up voltage of relay; When single-chip microcomputer output low level signal, relay discharges, and triggered timer starts, and the voltage signal in testing circuit collection relay now, obtains the release voltage of relay.And detecting device comprises adhesive resistance test circuit, by arranging reference resistance, the adhesive resistance value of relay can be calculated by single-chip microcomputer according to the magnitude of voltage change recorded.This relay parameter tester can the Specifeca tion speeification of busy relay as pick-up voltage, release voltage, pickup time, release time and adhesive resistance etc., and can take multiple measurements and average.This tester can realize quick, the composite measurement of relay parameter, and easy to operate, processing accuracy is higher.
Accompanying drawing explanation
The relay parameter tester composition structural representation that Fig. 1 provides for the utility model;
Fig. 2 is the relay drive circuit structural drawing of the utility model preferred embodiment;
Fig. 3 is the D/A converting circuit structure figure of the utility model preferred embodiment;
Fig. 4 is the detecting device composition structural drawing of the utility model preferred embodiment;
Fig. 5 is the display composition structural drawing of the utility model preferred embodiment;
Fig. 6 is reset circuit and the crystal oscillating circuit of the utility model preferred embodiment;
Fig. 7 is the A/D converting circuit structure power of the utility model preferred embodiment;
The software flow figure of the relay parameter tester single-chip microcomputer that Fig. 8 provides for the utility model;
The voltage measurement subroutine flow chart of the single-chip microcomputer that Fig. 9 provides for the utility model.
Embodiment
For better the utility model being described, hereby with a preferred embodiment, and accompanying drawing is coordinated to elaborate to the utility model, specific as follows:
As shown in Figure 1, be the relay parameter tester composition structural representation that the present embodiment provides, it comprises controller 101, detecting device 102, display 103.Wherein, controller 101 is connected with relay 105 to be tested by relay drive circuit 104.Controller 101, and to be processed testing the voltage signal that obtains for relay 105 provides drive singal by relay drive circuit 104.Detecting device 103 gathers the voltage signal in relay 105, and sends this voltage signal and process to controller 101.Test result after display 103 display controller 101 processes.
Controller 101 comprises a timer 106, when controller 101 exports high level signal, relay drive circuit 104 provides rated voltage to relay 105, relay 105 adhesive, and triggered timer 106 starts to obtain pickup time, detecting device 103 gathers the voltage signal in relay now, obtains the pick-up voltage of relay 105; When controller 101 output low level signal, relay 105 discharges, and triggered timer 106 starts to obtain release time, and detecting device 103 gathers the voltage signal in relay 105 now, obtains the release voltage of relay 105.
In the present embodiment, controller 101 is the single-chip microcomputer U1 of AT89S52 model, and the P1.0 mouth of single-chip microcomputer provides the drive singal of relay drive circuit 104.Wherein, relay drive circuit 104 as shown in Figure 2, when the P1.0 mouth of single-chip microcomputer is provided as the voltage signal of high level, compared by the operational amplifier U3A of this relay drive circuit, comparator/operational amplifier exports high level, and the transistor turns of relay drive circuit 104, for relay K 1 provides the rated voltage of 12V, timer 106 simultaneously in trigger controller 101 starts, and measures the pickup time of relay.When the P1.0 mouth of single-chip microcomputer provides low level voltage signal, relay contact discharges, and the timer 106 simultaneously in trigger controller 101 starts, and measures the release time of relay.
As shown in Figure 3, this relay parameter tester also comprises D/A change-over circuit, D/A change-over circuit is chip DAC0832, the p0 mouth of data in pin DI0 ~ DI7 and the AT89S52 single-chip microcomputer of DAC0832 is connected, the voltage control signal of rising and reduction automatically is automatically exported to DAC0832 by p0 mouth, the digital signal of input is converted to simulating signal by DAC0832, direct use single-chip microcomputer D/A changes output voltage, amplified by external circuit and certain doubly count to required voltage scope, simulating signal is amplified by the output pin input operational amplifier U3B of DAC0832, operational amplifier U3B is connected with the drive end of relay K 1, simulating signal after D/A changes provides the voltage automatically raised and automatically reduce to carry out adhesive and disconnection to relay to drive it into relay K 1 after amplifying.Detecting device 102 module also comprises A/D change-over circuit such as Fig. 7, A/D change-over circuit and comprises AD0809 chip, gathers the secondary adhesive on relay road and release voltage by AD0809 chip, and is converted to digital signal and sends to single-chip microcomputer to process.
As shown in Figure 4, detecting device comprises adhesive resistance test circuit and signal acquisition circuit, adhesive resistance test circuit comprises the composition chip MC1403 of constant current source and operational amplifier, provides 2.5V reference power supply to operational amplifier U1A by chip MC1403, and it provides current value to be
I = 2.5 R 1
Wherein, R 1for reference resistance, resistance is 500 Ω, and therefore the electric current of constant current source is 5mA.Carry out after differential amplify 400 times through operational amplifier U2A, U2B and U1B of signal acquisition circuit, the voltage difference between gathering 1 and 2 of relay by single-chip microcomputer, draws the voltage U at relay two ends 12.Then, the adhesive resistance that can calculate relay by single-chip microcomputer U1 according to following formula is:
R = U 12 400 I = U 12 2 .
As shown in Figure 5, display part adopts LCD1602 chip and peripheral circuit thereof, data-in port DB0 ~ the DB7 of LCD1602 is connected with the delivery outlet D0 ~ D7 of single-chip microcomputer U1, when single-chip microcomputer U1 calculates the resistance of relay and is subject to pick-up voltage value and the release voltage value of self-detector, P1, P2 port of single-chip microcomputer U1 controls to show above-mentioned measurement result to LCD1602.
As shown in Figure 6, relay parameter tester also comprises reset circuit and crystal oscillating circuit.Reset circuit is connected with AT89S52 single board computer, and comprise electric capacity C2 and the resistance R17 of series connection mutually, electric capacity C2 is in parallel with reset key S1, and the tie point between electric capacity C2 with resistance R17 is connected with the reset terminal of single-chip microcomputer, for exporting reset signal to single-chip microcomputer.Crystal oscillating circuit is connected with AT89S52 single board computer, and crystal oscillating circuit comprises the crystal oscillator that a frequency is 11.05926Hz, and this crystal oscillator is used for providing standard clock signal for single-chip microcomputer.
As shown in Figure 7, when the carrying out of this relay parameter tester is tested, after startup, first initialization is completed, whether triggered by the keys interrupt procedure identification button of single-chip microcomputer subsequently, and the foundation of corresponding mark as function selection is set, and completes survey voltage according to touch potential and survey time delay two kinds of functions.During test, the automatic busy relay parameters of Single Chip Microcomputer (SCM) system, and at test 10 times calculating mean value automatically afterwards, control display and show the average measured for 10 times.Wherein, the pick-up voltage in the present embodiment refers to that the voltage of relay coil is from 0V, progressively increases voltage, until the magnitude of voltage of contact just energy adhesive.Release voltage refers to from relay coil rated voltage, progressively reduces voltage, until the firm releasable magnitude of voltage in contact.Pickup time shows relay coil to add rated voltage and start, the time required to during the adhesive of contact.Release time is when referring to that relay contact is in attracting state, from cancellation coil adds rated voltage, and the time required when disconnecting to contact.Single Chip Microcomputer (SCM) system is by identifying that the change in voltage of test can judge whether relay is in attracting state.
As shown in Figure 8, during voltage measurement, the voltage exported when the D/A change-over circuit of single-chip microcomputer slowly raises, single-chip microcomputer judges relay whether adhesive, as not having adhesive, continues to judge relay status, as adhesive, then read magnitude of voltage by detecting device, and deliver to display place and show.
Certainly, in other preferred embodiments, above-mentioned D/A change-over circuit and A/D change-over circuit can replace with other forms of D/A change-over circuit and A/D change-over circuit.
The above; be only embodiment of the present utility model; but protection domain of the present utility model is not limited thereto; any those skilled in the art is in the technical scope that the utility model discloses; the distortion do the utility model or replacement, all should be encompassed within protection domain of the present utility model.Therefore, protection domain of the present utility model should be as the criterion with the protection domain of described claim.

Claims (6)

1. a relay parameter tester, is characterized in that, comprising:
Controller, is connected with a relay drive circuit, for by described relay drive circuit for relay provides drive singal, and to process testing the voltage signal that obtains;
Detecting device, for gathering the voltage signal in described relay, and sends this voltage signal and processes to controller;
Display, the test result after processing for display controller;
Wherein, described controller comprises a timer, when described controller exports high level signal, described relay drive circuit provides rated voltage to described relay, relay adhesive, and triggering described timer initiation, the voltage signal in described detecting device collection relay now, obtains the pick-up voltage of relay; When described controller output low level signal, relay discharges, and trigger described timer initiation, the voltage signal in described detecting device collection relay now, obtains the release voltage of relay.
2. relay parameter tester according to claim 1, it is characterized in that, also comprise D/A change-over circuit, described D/A change-over circuit is connected with described controller, described controller provides voltage control signal to the described D/A change-over circuit automatically raised or automatically reduce to be converted to simulating signal, and simulating signal is supplied to described relay to drive relay work again after an operational amplifier amplifies.
3. relay parameter tester according to claim 1, it is characterized in that, described detecting device comprises adhesive resistance test circuit and signal acquisition circuit, described adhesive resistance test circuit comprises a constant current source, reference resistance and some operational amplifiers, described constant current source provides reference power supply for described some operational amplifiers and amplifies rear output by operational amplifier, the output terminal of described adhesive resistance test circuit is connected with described relay, described signal acquisition circuit is for gathering the voltage signal in relay, and voltage signal is sent to described controller, described controller is according to described voltage signal, the enlargement factor of reference resistance and operational amplifier calculates the adhesive resistance of relay.
4. relay parameter tester according to claim 1, it is characterized in that, described display comprises LCD chip and peripheral circuit thereof, the input pin of described LCD chip is connected with described controller, when the signal that described controller outputs test result is to described LCD chip, described LCD chip shows test result.
5. relay parameter tester according to claim 1, it is characterized in that, relay parameter tester also comprises reset circuit, described reset circuit is connected with controller, comprise electric capacity and the resistance of series connection mutually, described electric capacity is in parallel with a reset key, and the tie point between described electric capacity and resistance is for exporting reset signal to controller.
6. relay parameter tester according to claim 1, is characterized in that, relay parameter tester also comprises crystal oscillating circuit, and described crystal oscillating circuit is connected with controller, and described crystal oscillating circuit is used for providing standard clock signal for described controller.
CN201520650556.5U 2015-08-26 2015-08-26 Relay parameter testing appearance Expired - Fee Related CN205103374U (en)

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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105891690A (en) * 2016-04-25 2016-08-24 广东电网有限责任公司佛山供电局 Signal generating device
CN106772023A (en) * 2017-03-02 2017-05-31 南京南瑞继保电气有限公司 It is a kind of to avoid the relay test system of magnetic interference based on improving guide rail
CN106980086A (en) * 2017-05-17 2017-07-25 格力电器(武汉)有限公司 The detection device and method of a kind of air conditioner electrical box
CN107966656A (en) * 2017-11-30 2018-04-27 蒋小辉 A kind of matrix form electromagnetic relay intelligent comprehensive parameter detection device
CN110261767A (en) * 2019-07-05 2019-09-20 瑞纳智能设备股份有限公司 A kind of detection device and detection method in on-off switch service life
CN111624901A (en) * 2019-02-28 2020-09-04 施耐德电器工业公司 Control method and control device
CN113466562A (en) * 2021-07-26 2021-10-01 天津市易控科技发展有限公司 Relay resistance value pre-testing system
CN114114000A (en) * 2021-11-23 2022-03-01 成都飞机工业(集团)有限责任公司 Time relay calibrating device based on SOPC

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105891690A (en) * 2016-04-25 2016-08-24 广东电网有限责任公司佛山供电局 Signal generating device
CN106772023A (en) * 2017-03-02 2017-05-31 南京南瑞继保电气有限公司 It is a kind of to avoid the relay test system of magnetic interference based on improving guide rail
CN106980086A (en) * 2017-05-17 2017-07-25 格力电器(武汉)有限公司 The detection device and method of a kind of air conditioner electrical box
CN107966656A (en) * 2017-11-30 2018-04-27 蒋小辉 A kind of matrix form electromagnetic relay intelligent comprehensive parameter detection device
CN111624901A (en) * 2019-02-28 2020-09-04 施耐德电器工业公司 Control method and control device
CN111624901B (en) * 2019-02-28 2024-03-01 施耐德电器工业公司 Control method and control device
CN110261767A (en) * 2019-07-05 2019-09-20 瑞纳智能设备股份有限公司 A kind of detection device and detection method in on-off switch service life
CN113466562A (en) * 2021-07-26 2021-10-01 天津市易控科技发展有限公司 Relay resistance value pre-testing system
CN114114000A (en) * 2021-11-23 2022-03-01 成都飞机工业(集团)有限责任公司 Time relay calibrating device based on SOPC

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GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20160323

Termination date: 20170826