CN216485179U

CN216485179U - Probe holder

Info

Publication number: CN216485179U
Application number: CN202122577177.6U
Authority: CN
Inventors: 许崇毅; 万铜锤; 张晋
Original assignee: Shenzhen Sunson Intelligent Equipment Co ltd
Current assignee: Shenzhen Shengshi Intelligent Equipment Co ltd
Priority date: 2021-10-25
Filing date: 2021-10-25
Publication date: 2022-05-10
Anticipated expiration: 2031-10-25

Abstract

The utility model discloses a probe holder which comprises a mounting seat, a probe mounting assembly, an elastic sheet and a contact pressure adjusting assembly. The probe mounting assembly comprises a probe and a mounting plate, and the probe is fixed on the mounting plate; one end of the elastic sheet is fixedly connected with the mounting plate, and the other end of the elastic sheet is fixedly connected with the mounting seat; the contact pressure adjusting assembly comprises an adjusting screw and a first elastic piece, the adjusting screw is in threaded connection with the mounting seat, one end of the first elastic piece is connected with the adjusting screw, and the other end of the first elastic piece is connected with the mounting plate.

Description

Probe holder

Technical Field

The utility model relates to the technical field of chip detection, in particular to a probe holder.

Background

In the chip sealing and testing process, the chip needs to be electrified to detect the performance of the chip. In the related art, the pressure at the time when the probe for energizing the chip contacts the chip is difficult to adjust, and if the pressure of the probe against the chip is too large, the chip is damaged, causing unnecessary loss.

SUMMERY OF THE UTILITY MODEL

The present invention is directed to solving at least one of the problems of the prior art. Therefore, the utility model provides a probe frame which can adjust the pressure when a probe contacts a chip.

A probe holder according to an embodiment of the present invention includes:

a mounting base;

the probe mounting assembly comprises a probe and a mounting plate, and the probe is fixed on the mounting plate;

one end of the elastic sheet is fixedly connected with the mounting plate, the other end of the elastic sheet is fixedly connected with the mounting seat, and the elastic sheet is used for generating elastic force for offsetting the gravity of the probe mounting assembly;

contact pressure adjusting part, including adjusting screw and first elastic component, adjusting screw with mount pad threaded connection, the one end of first elastic component with adjusting screw connects, the other end of first elastic component with the mounting panel is connected, first elastic component is used for giving a decurrent elastic force of mounting panel, adjusting screw is used for adjusting the deformation volume of first elastic component.

The probe rack provided by the embodiment of the utility model at least has the following beneficial effects: the probe frame generates elastic force through the elastic sheet arranged between the mounting plate and the mounting seat, and is used for offsetting the gravity of the probe mounting assembly, so that too much pressure is applied to a chip when the probe is electrified, and the probability of damage to the chip is reduced; in addition, contact pressure when contact pressure adjusting part can also adjust the probe power supply, specifically is through the cooperation of adjusting screw and first elastic component for first elastic component produces downward elastic force, and adjusting screw controls the size of downward elastic force through the deformation volume of adjusting first elastic component, thereby reaches the pressure that gives the chip when adjusting the probe power supply, realizes that probe pressure is adjustable.

According to some embodiments of the utility model, the probe mounting assembly further comprises:

the fixing seat is connected with the mounting plate;

one end of the fixing column is fixed on the fixing seat, the fixing column is provided with a first through hole, and the probe is inserted into the first through hole;

the second elastic piece is sleeved on the fixed column, and one end of the second elastic piece is abutted against the fixed seat;

the movable block is provided with a second through hole, the fixed column penetrates through the second through hole, the movable block abuts against the other end of the second elastic piece, and the probe can be clamped tightly by the movable block and the fixed column under the action of the second elastic piece.

According to some embodiments of the utility model, a fixed block is arranged at the other end of the fixed column, and the fixed block can limit the movable block which is separated from the probe and abuts against the movable block.

According to some embodiments of the utility model, one end of the movable block is provided with a groove, and the probe is arranged in the groove in a penetrating mode.

According to some embodiments of the utility model, the fixing column is provided with a third through hole, and the fixing block is arranged in the third through hole in a penetrating manner.

According to some embodiments of the present invention, the mounting base further comprises a third elastic member, the third elastic member is sleeved on the adjusting screw, the adjusting screw comprises a head, one end of the third elastic member abuts against the head, and the other end of the third elastic member abuts against the mounting base.

According to some embodiments of the utility model, the first elastic member comprises a spring, one end of the spring abuts against the adjusting screw, and the other end of the spring abuts against the mounting plate.

According to some embodiments of the utility model, the adjusting screw is provided with a housing hole in which the spring is inserted.

According to some embodiments of the utility model, the adjusting device further comprises a nut, the nut is in threaded fit with the adjusting screw, and the nut abuts against the mounting seat.

According to some embodiments of the utility model, further comprising:

the connecting plate is fixed on the mounting plate;

the contact is fixed on the mounting seat and positioned below the connecting plate;

the indicating lamp is electrically connected with the connecting plate and the contact, the indicating lamp is turned off when the connecting plate is contacted with the contact, and the indicating lamp is turned on when the connecting plate is separated from the contact.

Additional aspects and advantages of the utility model will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the utility model.

Drawings

The utility model is further described with reference to the following figures and examples, in which:

FIG. 1 is a schematic front view of an embodiment of the present invention;

FIG. 2 is a schematic top view of a partial structure according to an embodiment of the present invention;

FIG. 3 is a schematic view of a partial structure of a probe mounting assembly according to an embodiment of the utility model;

FIG. 4 is an enlarged top view of a movable block of the probe mounting assembly in accordance with an embodiment of the present invention;

fig. 5 is a schematic diagram of an indicator light circuit according to an embodiment of the present invention.

Reference numerals: a mounting base 100;

the probe mounting assembly 200, the probe 210, the mounting plate 220, the fixing base 230, the fixing column 240, the fixing block 241, the first through hole 242, the third through hole 243, the second elastic element 250, the movable block 260, the groove 261 and the second through hole 262;

a spring plate 300;

a contact pressure adjusting assembly 400, an adjusting screw 410, a first elastic member 420;

a third elastic member 500;

a connection plate 600;

a contact 700;

an indicator light 800.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention.

In the description of the present invention, it should be understood that the orientation or positional relationship referred to in the description of the orientation, such as the upper, lower, front, rear, left, right, etc., is based on the orientation or positional relationship shown in the drawings, and is only for convenience of description and simplification of description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention.

In the description of the present invention, the meaning of a plurality is one or more, the meaning of a plurality is two or more, and larger, smaller, larger, etc. are understood as excluding the present numbers, and larger, smaller, inner, etc. are understood as including the present numbers. If the first and second are described for the purpose of distinguishing technical features, they are not to be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.

In the description of the present invention, unless otherwise explicitly limited, terms such as arrangement, installation, connection and the like should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific contents of the technical solutions.

In the description of the present invention, reference to the description of the terms "one embodiment," "some embodiments," "an illustrative embodiment," "an example," "a specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

Referring to fig. 1, in some embodiments of the present invention, a probe holder includes a mount 100, a probe mounting assembly 200, a spring 300, and a contact pressure adjusting assembly 400. The probe mounting assembly 200 includes a probe 210 and a mounting plate 220, the probe 210 being secured to the mounting plate 220. One end of the elastic sheet 300 is fixedly connected to the mounting plate 220, the other end of the elastic sheet 300 is fixedly connected to the mounting base 100, and the elastic sheet 300 is used for generating an elastic force to counteract the gravity of the probe mounting assembly 200. The contact pressure adjusting assembly 400 includes an adjusting screw 410 and a first elastic member 420, the adjusting screw 410 is screw-coupled to the mounting base 100, one end of the first elastic member 420 is coupled to the adjusting screw 410, the other end of the first elastic member 420 is coupled to the mounting plate 220, the first elastic member 420 is for giving a downward elastic force to the mounting plate 220, and the adjusting screw 410 is for adjusting a deformation amount of the first elastic member 420.

According to the probe holder of the embodiment of the utility model, the elastic sheet 300 arranged between the mounting plate 220 and the mounting seat 100 generates elastic force for counteracting the gravity of the probe mounting assembly 200, so that the probe 210 is prevented from giving too much pressure to the chip when contacting the chip, and the probability of damaging the chip is reduced. In addition, the contact pressure adjusting assembly 400 can also adjust the contact pressure when the probe 210 contacts the chip, specifically, by the cooperation of the adjusting screw 410 and the first elastic member 420, the adjusting screw 410 enables the first elastic member 420 to generate a downward elastic force, and the adjusting screw 410 controls the magnitude of the downward elastic force by adjusting the deformation amount of the first elastic member 420, so that the pressure applied to the chip when the probe 210 contacts the chip is adjusted, and the contact pressure of the probe 210 can be adjusted.

Referring to fig. 1, 3 and 4, in some embodiments, the probe mounting assembly 200 further includes a fixing base 230, a fixing post 240, a second elastic member 250 and a movable block 260. The fixing base 230 is connected with the mounting plate 220, one end of the fixing column 240 is fixed on the fixing base 230, the fixing column 240 is provided with a first through hole 242, and the probe 210 is inserted into the first through hole 242. The second elastic member 250 is sleeved on the fixing post 240, and one end of the second elastic member 250 abuts against the fixing base 230. The movable block 260 is provided with a second through hole 262, the fixed column 240 is arranged in the second through hole 262 in a penetrating manner, the movable block 260 abuts against the other end of the second elastic member 250, and under the action of the second elastic member 250, the movable block 260 and the fixed column 240 can clamp the probe 210.

It should be noted that the second elastic member 250 includes a spring or an elastic sleeve, and the second elastic member can be sleeved on the surface of the fixed pillar 240 to limit the movable block 260.

In some embodiments, the first elastic member 420 includes a spring, one end of which abuts against the adjusting screw 410, and the other end of which abuts against the mounting plate 220. Further, the adjustment screw 410 is provided with a receiving hole (not shown) in which the spring is inserted. In the present embodiment, the first spring is inserted into the receiving hole of the adjustment screw 410, and is not easily detached from the adjustment screw 410 when the adjustment screw 410 adjusts the amount of spring deformation.

In addition, the first elastic member 420 may be an elastic sleeve (e.g., a rubber sleeve or a silicone sleeve), and the amount of deformation may be changed. Similarly, one end of the elastic sleeve abuts against the adjusting screw 410, and the other end of the elastic sleeve abuts against the mounting plate 220.

According to the probe holder of the embodiment of the utility model, the probe 210 is fixed by the probe mounting assembly 200 through the second elastic member 250 and the movable block 260, and when the probe 210 needs to be detached, the movable block 260 compresses the second elastic member 250, so that the probe 210 is easily detached from the first through hole 242.

Referring to fig. 1 and 3, in some embodiments, a fixing block 241 is disposed at the other end of the fixing column 240, and the fixing block 241 can limit the movable block 260 that is separated from the probe 210. In this embodiment, when the probe 210 is separated from the first through hole 242, the movable block 260 is separated from the fixed post 240 by the second elastic member 250, and therefore, the fixed block 241 is disposed at the other end of the fixed post 240, so that the movable block 260 is limited on the fixed post 240 by the fixed block 241 and the second elastic member 250.

Referring to fig. 1 and 3, in some embodiments, the fixed column 240 is provided with a third through hole 243, and the fixed block 241 is inserted into the third through hole 243, so that the fixed block 241 is convenient to be detached, and further the movable block 260, the second elastic element 250 and other devices are convenient to be detached from the fixed column 240.

Referring to fig. 2 and 3, in some embodiments, a groove 261 is formed at one end of the movable block 260, and the probe 210 is inserted into the groove 261.

Referring to fig. 1, in some embodiments, the probe holder further includes a third elastic member 500. The third elastic member 500 is sleeved on the adjusting screw 410, the adjusting screw 410 includes a head, one end of the third elastic member 500 abuts against the head, and the other end of the third elastic member 500 abuts against the mounting base 100. Therefore, the head of the adjusting screw 410 is pressed by the third elastic member 500, and in the process that the probe 210 moves up and down, repeatedly contacts with and separates from the chip, the adjusting screw 410 is easily rotated relative to the mounting base 100, and the head of the adjusting screw 410 is pressed by the third elastic member 500, so that the deformation amount of the first elastic member 420 can be kept stable, and further, the pressure when the probe 210 contacts with the chip can be kept stable.

It should be noted that the third elastic member 500 includes a spring or an elastic sleeve, etc., and can be sleeved on the adjusting screw 410 to fix the adjusting screw 410 on the mounting base 100.

In some embodiments, the adjusting screw 410 may be fixed by a nut, which is screwed with the adjusting screw 410 and abuts against the mounting seat 100, so as to reduce the probability of loosening of the adjusting screw 410.

Referring to fig. 1, 5, in some embodiments, the probe holder further includes a connection board 600, contacts 700, and indicator lights 800. The connecting plate 600 is fixed on the mounting plate 220; the contact 700 is fixed on the mounting base 100, and the contact 700 is positioned below the connecting plate 600; the indicator lamp 800 is electrically connected to the connection plate 600 and the contact 700, and when the connection plate 600 is in contact with the contact 700 (i.e., when the switch of fig. 5 is in the off state), the indicator lamp 800 is turned off, and when the connection plate 600 is separated from the contact 700 (i.e., when the switch of fig. 5 is in the on state), the indicator lamp 800 is turned on. In an embodiment, when the probe 210 is not used, the connection board 600 and the contact 700 are contacted under the action of gravity, the indicator light 800 is turned off, when the probe 210 is used for detecting a chip, the probe 210 is lifted, the connection board 600 and the contact 700 are separated, the indicator light 800 is turned on, whether the probe 210 is lifted is indicated by turning on and off the indicator light 800, and then whether the probe 210 is contacted with the chip is indicated, so that the effect of the probe 210 for supplying power to the chip can be observed conveniently.

The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge of those skilled in the art without departing from the gist of the present invention. Furthermore, the embodiments of the present invention and the features of the embodiments may be combined with each other without conflict.

Claims

1. A probe holder, comprising:

a mounting seat;

2. The probe holder of claim 1, wherein the probe mounting assembly further comprises:

the fixing seat is connected with the mounting plate;

3. The probe holder as claimed in claim 2, wherein a fixed block is provided at the other end of the fixed column, and the fixed block can limit the movable block which is separated from the probe.

4. The probe holder according to claim 2, wherein one end of the movable block is provided with a groove, and the probe is inserted into the groove.

5. The probe holder as claimed in claim 3, wherein the fixing posts are provided with third through holes, and the fixing blocks are inserted into the third through holes.

6. The probe holder as claimed in claim 1, further comprising a third elastic member, wherein the third elastic member is sleeved on the adjusting screw, the adjusting screw comprises a head, one end of the third elastic member abuts against the head, and the other end of the third elastic member abuts against the mounting base.

7. The probe holder according to claim 1, wherein the first elastic member comprises a spring, one end of the spring abuts against the adjusting screw, and the other end of the spring abuts against the mounting plate.

8. The probe holder as claimed in claim 7, wherein the adjustment screw is provided with a receiving hole, the spring being inserted in the receiving hole.

9. The probe holder as claimed in claim 1, further comprising a nut, wherein the nut is in threaded engagement with the adjustment screw, and the nut abuts against the mounting base.

10. The probe holder of claim 1, further comprising:

the connecting plate is fixed on the mounting plate;

the indicating lamp is electrically connected with the connecting plate and the contact, when the connecting plate is contacted with the contact, the indicating lamp is turned off, and when the connecting plate is separated from the contact, the indicating lamp is turned on.