CN212159861U

CN212159861U - High-low temperature test device for storage products

Info

Publication number: CN212159861U
Application number: CN202020244000.7U
Authority: CN
Inventors: 李虎; 谭少鹏
Original assignee: Shenzhen Demingli Electronics Co Ltd
Current assignee: Shenzhen Demingli Electronics Co Ltd
Priority date: 2020-03-02
Filing date: 2020-03-02
Publication date: 2020-12-15
Anticipated expiration: 2030-03-02

Abstract

The utility model discloses a high low temperature test's of storage product testing arrangement is applied to the proof box, and the proof box lateral wall has the bellying, including PCB board, first backup pad, second backup pad, third backup pad, first mounting, second mounting and third mounting. The PCB is connected with a first supporting plate through a first fixing piece; the third supporting plate is positioned at one end of the convex part close to the side wall; the second supporting plate and the third supporting plate are arranged oppositely and are positioned at one end of the protruding part far away from the side wall; one end of the second supporting plate is connected with the third supporting plate through a third fixing piece; the PCB, the first supporting plate and the second supporting plate are connected through the second fixing piece to form an accommodating space, and the second fixing piece is located at one end, far away from the third fixing piece, of the second supporting plate. This scheme has not only improved tester's efficiency of software testing, and the data signal of data line transmission is stable, and does not have the original structure that changes the proof box, fine protection the structure of original proof box, and the transformation cost is low.

Description

High-low temperature test device for storage products

Technical Field

The utility model relates to the storage device field especially involves a high low temperature test's of storage product testing arrangement.

Background

The programmable constant temperature and humidity tester is a necessary test device in the fields of electrician and electrical appliances, aviation, automobiles, household appliances, coatings, chemical engineering, scientific research and the like, and is used for testing and determining parameters and performances of electrician, electronics and other products and materials after the temperature environment changes in high temperature, low temperature, humidity and heat or constant test.

When the existing programmable constant temperature and humidity testing machine is used for testing, the testing wire is drawn out from the data wire hole, and the storage product to be tested is inserted into the interface on the data wire for testing. As shown in fig. 1, a plurality of data lines are disposed in the data line hole 83, and the data lines correspond to different interfaces to test different types of storage products. When a tester conducts a test, the tester needs to find corresponding test interfaces from a plurality of disordered data lines, and the test is very inconvenient.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing a high low temperature test's of storage product testing arrangement aims at solving and makes things convenient for the tester to find the test interface that needs, improves efficiency of software testing.

The utility model provides a high low temperature test's of storage product testing arrangement, the device is applied to the proof box, and the lateral wall of proof box has the bellying, include: the PCB comprises a PCB board, a first supporting plate, a second supporting plate, a third supporting plate, a first fixing piece, a second fixing piece and a third fixing piece;

the PCB comprises an interface area, wherein the interface area is integrated with a first SATA interface, a second SATA interface, a power module, a USB interface and a PCIE interface, wherein the power module is electrically connected with the first SATA interface, the second SATA interface, the USB interface and the PCIE interface, and the first SATA interface, the second SATA interface, the USB interface and the PCIE interface are distributed in an array;

the part of the first supporting plate, which is opposite to the interface area of the PCB, is a hollow area;

the PCB is connected to the first supporting plate through a first fixing piece;

the third supporting plate is positioned on one end face of the convex part close to the side wall;

the second supporting plate and the third supporting plate are arranged oppositely and are positioned on one end face, far away from the side wall, of the protruding part;

one end of the second supporting plate is connected to the third supporting plate through a third fixing piece;

the PCB, the first supporting plate and the second supporting plate are connected through the second fixing piece to form an accommodating space, and the second fixing piece is located at one end, far away from the third fixing piece, of the second supporting plate.

Preferably, the first support plate, the second support plate and the third support plate are all bakelite plates.

Preferably, the thickness of the first supporting plate and the thickness of the second supporting plate are both 8 mm;

the thickness of the third support plate is 4 mm.

Preferably, the second fixing part is a hexagonal copper pillar isolation pillar.

Preferably, the USB interface supports USB2.0 protocol and USB3.0 protocol.

The beneficial effects of the utility model reside in that: this scheme has not only improved tester's efficiency of software testing, and the data signal of data line transmission is stable, and testing arrangement does not have the original structure that changes the proof box, fine protection the structure of original proof box, and the transformation cost is low.

Drawings

FIG. 1 is a side wall structure of a conventional high and low temperature test chamber;

fig. 2 is a schematic diagram of the overall structure of the testing device for high and low temperature tests of the storage product of the present invention;

FIG. 3 is a schematic front view of a PCB of the testing apparatus for testing high and low temperature tests of the storage product in FIG. 2;

FIG. 4 is a schematic diagram of a back side structure of a PCB of the testing device for high and low temperature tests of the storage product in FIG. 2;

fig. 5 is a schematic structural diagram of a first support plate, a second support plate and a third support plate of the testing device for high and low temperature tests of the storage product in fig. 2.

Description of reference numerals:

1. a PCB board; 11. a first SATA interface; 12. a second SATA interface; 13. a power supply module; 14. a USB interface; 15. a PCIE interface; 16. a first opening; 17. a second opening;

2. a first support plate; 21. a hollow-out area; 22. a third opening; 23. a fourth opening;

3. a second support plate; 31. fifth opening; 32. a sixth opening;

4. a third support plate; 41. a seventh opening;

5. a first fixing member; 6. a second fixing member; 7. a third fixing member;

8. a side wall; 81. a boss portion; 82. grooving; 83. a data line hole; 84. and a data line.

The objects, features and advantages of the present invention will be further described with reference to the accompanying drawings.

Detailed Description

It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

Referring to fig. 1 to 5, the utility model relates to a test device of high low temperature test of storage product, the device is applied to the proof box, the lateral wall of proof box has bellying 81, include: the PCB comprises a PCB (printed circuit board) 1, a first supporting plate 2, a second supporting plate 3, a third supporting plate 4, a first fixing piece 5, a second fixing piece 6 and a third fixing piece 7;

the PCB 1 comprises an interface area, wherein the interface area is integrated with a first SATA interface 11, a second SATA interface 12, a power module 13, a USB interface 14 and a PCIE interface 15, wherein the power module 13 is electrically connected with the first SATA interface 11, the second SATA interface 12, the USB interface 14 and the PCIE interface 15, and the first SATA interface 11, the second SATA interface 12, the USB interface 14 and the PCIE interface 15 are distributed in an array;

the part of the first supporting plate 2, which is opposite to the interface area of the PCB 1, is a hollow area 21;

the PCB 1 is connected to the first supporting plate 2 through a first fixing piece 5;

the third supporting plate 4 is positioned on one end face of the convex part 81 close to the side wall 8;

the second support plate 3 is arranged opposite to the third support plate 4 and is positioned on one end face, far away from the side wall 8, of the protruding part 81;

one end of the second supporting plate 3 is connected to the third supporting plate 4 through a third fixing part 7;

the PCB board 1, the first supporting board 2 and the second supporting board 3 are connected by a second fixing member 6 to form an accommodating space, and the second fixing member 6 is located at one end of the second supporting board 3 far away from the third fixing member 7.

In the embodiment of the present invention, referring to fig. 1, fig. 1 is a side wall structure of a conventional test chamber, a side wall 8 has a protrusion 81, the protrusion 81 has a hollow structure, and a slot 82 is formed in the middle of the protrusion 81. Referring to fig. 2 to 4, the testing device of the present embodiment includes a PCB board 1, a first supporting plate 2, a second supporting plate 3, a third supporting plate 4, a first fixing member 5, a second fixing member 6, and a third fixing member 7. The PCB 1 comprises an interface area, wherein the interface area is integrated with a first SATA interface 11, a second SATA interface 12, a power module 13, a USB interface 14 and a PCIE interface 15, wherein the power module 13 is electrically connected with the first SATA interface 11, the second SATA interface 12, the USB interface 14 and the PCIE interface 15, and the first SATA interface 11, the second SATA interface 12, the USB interface 14 and the PCIE interface 15 are distributed in an array. In the embodiment of the present invention, the first SATA interface 11 is a serial SATA interface, including a signal interface of 7pin and a power interface of 15pin, and the second SATA interface 12 is a signal interface of 7 pin. Referring to fig. 4, in the embodiment of the present invention, a portion of the first supporting plate 2 corresponding to the interface area of the PCB 1 is a hollow area 21, so as to facilitate the wiring of the PCB 1; the PCB board 1 is connected to the first support plate 2 by a first fixing member 5. Specifically, the PCB board 1 has a first opening 16 and a second opening 17, and the first support plate 2 has a third opening 22 and a fourth opening 23. The first fixing member 5 is a screw and a nut, and the screw passes through a connection passage formed by the first opening 16 and the third opening 22, so that the PCB 1 is fixed to the first support plate 2 by means of screw connection. In the embodiment of the present invention, the third supporting plate 4 passes through the slot 82 and is placed on an end surface of the protruding portion 81 close to the side wall 8. The second support plate 3 has a fifth opening 31 and a sixth opening 32, and the third support plate 4 has a seventh opening 41. Second backup pad 3 sets up with third backup pad 4 relatively, is located a terminal surface that lateral wall 8 was kept away from to bellying 81, because bellying 81 is close to a terminal surface of lateral wall 8 and is equipped with the screw, through third mounting 7 (the screw), passes fifth trompil 31 and seventh trompil 41, is fixed in test box lateral wall 8 with third backup pad 4, is fixed in the bellying 81 of test box with second backup pad 3. After the second supporting plate 3 is fixed, the second opening 17, the fourth opening 23 and the seventh opening 41 are oppositely arranged to form a connecting channel, the second fixing member 6 penetrates through the connecting channel, the PCB board 1, the first supporting plate 2 and the second supporting plate 3 form an accommodating space, and the accommodating space is used for placing the data cable 84, wherein the second fixing member 6 is a hexagonal copper column isolating column and plays a good role in supporting, isolating and fastening. Through the arrangement, the scheme not only improves the test efficiency of testers, the data signals transmitted by the data lines 84 are stable, the test device has no original structure for changing the test box, the structure of the original test box is well protected, and the improvement cost is low.

Referring to fig. 5, the first support plate 2, the second support plate 3, and the third support plate 4 are all bakelite plates.

In the embodiment of the utility model provides an in, the bakelite plate is because of having insulating, not producing static, consequently does not produce the test procedure of storage product and disturbs. In addition, due to the characteristics of wear resistance and high temperature resistance of the bakelite plate, the service life of the testing device is greatly prolonged.

Referring to fig. 5, the first support plate 2 and the second support plate 3 each have a thickness of 8 mm;

the thickness of the third support plate 4 is 4 mm.

In the embodiment of the present invention, the thickness of the first supporting plate 2 and the second supporting plate 3 is 8 mm, and the thickness of the third supporting plate 4 is 4 mm. Through the arrangement, materials are saved on the premise that the stability of the testing device is guaranteed.

Further, the USB interface 14 supports a USB2.0 protocol and a USB3.0 protocol, so that the testing apparatus can test more types of storage products, and the universality of the testing apparatus is improved.

The above only is the preferred embodiment of the present invention, not limiting the scope of the present invention, all the equivalent structures or equivalent flow changes made by the contents of the specification and the drawings, or directly or indirectly applied to other related technical fields, are included in the same way in the protection scope of the present invention.

Claims

1. A test device for high and low temperature tests of stored products, the device being applied to a test chamber, a side wall of the test chamber having a projection, the device comprising: the PCB comprises a PCB board, a first supporting plate, a second supporting plate, a third supporting plate, a first fixing piece, a second fixing piece and a third fixing piece;

the PCB is connected to the first supporting plate through the first fixing piece;

the second support plate and the third support plate are arranged oppositely and are positioned on one end face, far away from the side wall, of the protruding part;

one end of the second supporting plate is connected to the third supporting plate through the third fixing piece;

the PCB board the first supporting plate and the second supporting plate are connected through the second fixing piece to form an accommodating space, and the second fixing piece is located at one end, far away from the third fixing piece, of the second supporting plate.

2. The device for testing high and low temperature tests of storage products according to claim 1, wherein the first support plate, the second support plate and the third support plate are all bakelite plates.

3. The apparatus for testing high and low temperature tests of stored products according to claim 2, wherein the first support plate and the second support plate each have a thickness of 8 mm;

the thickness of the third supporting plate is 4 mm.

4. The device for testing high and low temperature tests of storage products according to claim 1, wherein the second fixing member is a hexagonal copper cylinder isolation column.

5. The device for testing high and low temperature tests of storage products according to claim 1, wherein the USB interface supports a USB2.0 protocol and a USB3.0 protocol.