CN216350826U

CN216350826U - Detection clamp for LED backlight module

Info

Publication number: CN216350826U
Application number: CN202122747601.7U
Authority: CN
Inventors: 屈界胜
Original assignee: Suzhou Nanyiyang Electronic Technology Co ltd
Current assignee: Suzhou Nanyiyang Electronic Technology Co ltd
Priority date: 2021-11-10
Filing date: 2021-11-10
Publication date: 2022-04-19
Anticipated expiration: 2031-11-10

Abstract

The utility model discloses a detection clamp of an LED backlight module, which comprises a bottom plate, wherein an upright post is fixedly arranged on the bottom plate, a driving plate is sleeved on the upright post, a driving part is arranged above the driving plate and can drive the driving plate to move along the direction of the upright post, a test plate is arranged below the driving plate through a buffer component and is parallel to the driving plate, the test plate and the driving plate can approach or depart from each other along the buffer component under the action of external force, a test component is arranged on the test plate and comprises a contact switch, the contact switch is arranged between the test plate and the driving plate, and the contact switch is triggered in the approach process of the test plate and the driving plate. Through having invented this detection anchor clamps can carry out the detection of big and quick LED backlight unit in batches, utilize contact switch and buffer unit's cooperation to set up simultaneously, the miniature probe that makes does not switch on when the contact, and the electricity detects only after the complete contact, has prevented to have the damage that impedance leads to the golden finger because of half contact state.

Description

Detection clamp for LED backlight module

Technical Field

The utility model relates to the field of LED detection equipment, in particular to a detection clamp of an LED backlight module.

Background

The light emitting diode, abbreviated as LED, is a commonly used light emitting device, emits light by energy released by recombination of electrons and holes, and is widely applied in the field of illumination, such as illumination, flat panel display, medical devices, and the like, especially in some electronic products, such as LED backlight modules on mobile phones and notebooks.

With the continuous development of science and technology, LED products are developed towards miniaturization and miniaturization, for example, an LED backlight module used in a notebook or a mobile phone is composed of a strip-shaped circuit board and a gold finger arranged on the circuit board, and in order to ensure the quality of light emission, the LED backlight module needs to be detected to detect the light emission effect. However, because the test is carried out by miniaturized golden fingers, a micro probe of 0.2-0.3 is selected for testing, but if the contact test is directly carried out, half contact occurs, and the impedance in the half contact state can damage the golden fingers, so that the products to be tested are damaged.

Therefore, the present invention is directed to a detection fixture for an LED backlight module.

SUMMERY OF THE UTILITY MODEL

In order to overcome the above disadvantages, an object of the present invention is to provide a testing fixture for an LED backlight module.

In order to achieve the above purposes, the utility model adopts the technical scheme that: the utility model provides a LED backlight unit's detection anchor clamps, includes the bottom plate, the fixed stand that sets up on the bottom plate, the initiative board is established to the cover on the stand, the top of initiative board sets up the driving piece, just the driving piece can drive the initiative board and remove along the stand direction, survey the board through buffering subassembly setting in the below of initiative board, survey the board and be parallel with the initiative board, and under the exogenic action, survey test board and initiative board and can be close to or keep away from along buffering subassembly, be in simultaneously set up the test subassembly on surveying the board, the test subassembly includes contact switch, and simultaneously contact switch sets up survey between board and the initiative board, and survey the in-process that board and initiative board are close to, trigger contact switch.

Preferably, the test assembly still includes the probe mounting panel, the probe mounting panel with survey the board and be connected, just set up probe installation piece on the probe mounting panel, and set up a plurality of miniature probes on the probe installation piece, it is a plurality of the test end of miniature probe is located the bottom plate directly over, miniature probe all is connected with contact switch. The on-off of the micro probe is controlled through the contact switch, when the test is carried out, the whole body moves downwards under the driving of the driving piece, the test end of the micro probe is in contact with the golden finger of the LED backlight module to be tested, the contact switch is not triggered at the moment, the distance between the driving plate and the test plate can be reduced along with the continuous driving of the driving piece, and the contact switch is triggered in the reducing process to complete the test of the LED backlight module.

Preferably, the probe installation block is further provided with a limiting block, the limiting block is located between the test board and the driving board, and the height of the limiting block is higher than that of the micro probe. The micro-probe is protected, and the micro-probe is prevented from being damaged by the test board and the active board in the approaching process.

Preferably, the driving part is a push-pull type clamp, the driving part is arranged on a vertical plate, the vertical plate is fixedly arranged on a bottom plate, and meanwhile, the working end of the driving part is connected with the driving plate through a clamping block. The push-pull type clamp realizes the movement of the driving plate, and can also complete the driving through a vertically arranged air cylinder or electric cylinder or screw rod assembly, but compared with the push-pull type clamp, the structure is simpler, the operation is easier, and the cost is lower.

Preferably, a waist-shaped hole is formed in the vertical plate, the push-pull type clamp is connected through the waist-shaped hole, and the waist-shaped hole is vertically arranged. The arrangement of the waist-shaped hole can ensure that the position of the push-pull type clamp can be finely adjusted, and the test is convenient to carry out.

Preferably, the driving plate is provided with a linear shaft sleeve, and the column is sleeved in the linear shaft sleeve. Namely, the stable up-and-down movement of the driving plate is ensured.

Preferably, the buffering subassembly includes buffer beam and buffer spring, the buffer beam runs through and surveys test panel and initiative board to set up the nut respectively at both ends and carry on spacingly, buffer spring is established to the cover on the buffer beam, and buffer spring's both ends support respectively to survey test panel and initiative board. The two ends of the buffer rod are provided with nuts for limiting, so that the driving plate and the test plate can only move between the two nuts, and the driving plate and the test plate are far away from each other through the arrangement of the buffer spring.

Preferably, the bottom plate is further provided with a test position, the test position is internally provided with a positioning hole, and the positioning column is arranged in the positioning hole. A plurality of positioning holes can be formed in the attached drawing, and the golden fingers to be tested are clamped through a plurality of positioning columns, so that efficient and frequent testing is conveniently achieved.

The detection clamp for the LED backlight module has the advantages that the detection clamp can be used for detecting the LED backlight module rapidly in large batch, meanwhile, the micro probe is not electrified when in contact by utilizing the matched arrangement of the contact switch and the buffer component, and is electrified for detection after being completely contacted, so that the damage of golden fingers caused by impedance in a half-contact state is prevented.

Drawings

Fig. 1 is a schematic cross-sectional structure view of a detection fixture of an LED backlight module.

Fig. 2 is a partially enlarged schematic view of fig. 1.

FIG. 3 is a schematic diagram of the positions of the active board and the test board.

Fig. 4 is a schematic view of the contact during testing.

Fig. 5 is a schematic diagram of the position of the contact switch during testing.

FIG. 6 is a schematic view of a kidney shaped aperture.

In the figure:

1. a bottom plate, 2, a column, 3, a driving plate, 4, a driving piece, 5, a buffer component, 6, a testing plate, 7, a testing component, 8, a vertical plate, 9 and a linear shaft sleeve,

11. a test position, 12, a positioning hole,

51. the damping rod, 52, the damping spring,

71. a contact switch 72, a probe mounting plate 73, a probe mounting block 74, a micro probe 75 and a limit block,

81. a waist-shaped hole.

Detailed Description

The following detailed description of the preferred embodiments of the present invention, taken in conjunction with the accompanying drawings, will make the advantages and features of the utility model easier to understand by those skilled in the art, and thus will clearly and clearly define the scope of the utility model.

Referring to fig. 1-6, in the embodiment, a detection fixture for an LED backlight module includes a bottom plate 1, a column 2 is fixedly disposed on the bottom plate 1, a driving plate 3 is sleeved on the column 2, a driving member 4 is disposed above the driving plate 3, and the driving member 4 can drive the driving plate 3 to move along the direction of the column 2, a testing plate 6 is disposed below the driving plate 3 through a buffering component 5, the testing plate 6 is parallel to the driving plate 3, and under the action of an external force, the testing plate 6 and the driving plate 3 can approach or move away from each other along the buffering component 5, a testing component 7 is disposed on the testing plate 6, the testing component 7 includes a contact switch 71, and the contact switch 71 is disposed between the testing plate 6 and the driving plate 3, and triggers the contact switch 71 in the process of approaching the testing plate 6 and the driving plate 3.

Referring to fig. 3 and 4, the testing assembly 7 further includes a probe mounting plate 72, the probe mounting plate 72 is connected to the testing board 6, a probe mounting block 73 is disposed on the probe mounting plate 72, a plurality of micro probes 74 are disposed on the probe mounting block 73, testing ends of the micro probes 74 are located right above the base plate 1, and the micro probes 74 are all connected to the contact switch 71. The on-off of the micro probe 74 is controlled by the contact switch 71, when a test is performed, the whole body moves downwards under the driving of the driving part 4, the testing end of the micro probe 74 contacts the golden finger of the LED backlight module to be tested, at the moment, the contact switch 71 is not triggered, the distance between the driving plate 3 and the testing plate 6 becomes smaller along with the continuous driving of the driving part 4, and the contact switch 71 is triggered in the process of reducing, so that the test on the LED backlight module is completed. The trigger state is shown in figure 5.

The probe mounting block 73 is further provided with a limiting block 75, the limiting block 75 is located between the test board 6 and the active board 3, and the height of the limiting block is higher than that of the micro probe 74. I.e., the micro-probes 74 are protected, preventing the micro-probes 74 from being damaged by the test board 6 and the active board 3 during the approach.

The driving part 4 is a push-pull type clamp, the driving part 4 is arranged on the vertical plate 8, the vertical plate 8 is fixedly arranged on the bottom plate 1, and meanwhile, the working end of the driving part 4 is connected with the driving plate 3 through the clamping block. The push-pull type clamp realizes the movement of the driving plate 3, and certainly can complete the driving through a vertically arranged air cylinder or electric cylinder or screw rod assembly, but compared with the push-pull type clamp, the structure is simpler, the operation is easier, and the cost is lower.

Referring to fig. 6, a waist-shaped hole 81 is formed in the vertical plate 8, and the push-pull type clamp is connected through the waist-shaped hole 81, and the waist-shaped hole 81 is vertically arranged. The arrangement of the waist-shaped hole 81 can ensure the position of the push-pull type clamp to be finely adjusted, and the test is convenient to carry out.

The driving plate 3 is provided with a linear shaft sleeve 9, and the upright post 2 is sleeved in the linear shaft sleeve 9. I.e. a stable up and down movement of the active plate 3 is ensured.

Buffering subassembly 5 includes buffer beam 51 and buffer spring 52, and buffer beam 51 runs through and surveys test panel 6 and initiative board 3 to set up the nut respectively at both ends and carry on spacingly, buffer spring 52 is established to the cover on buffer beam 51, and buffer spring 52's both ends support respectively to lean on and survey test panel 6 and initiative board 3. That is, since the buffer rods 51 are limited by nuts at both ends, the active board 3 and the test board 6 can move only between the nuts, and are separated from each other by the buffer springs 52.

The base plate 1 is further provided with a test position 11, a positioning hole 12 is arranged in the test position 11, and a positioning column is arranged in the positioning hole 12. A plurality of positioning holes 12 are formed in the attached drawing, and the golden fingers to be tested are clamped through a plurality of positioning columns, so that efficient and frequent testing is conveniently realized.

The utility model provides a LED backlight unit's detection anchor clamps's beneficial effect is, can carry out the detection of big and quick LED backlight unit in batches through inventing this detection anchor clamps, utilizes contact switch 71 and buffer component 5's cooperation setting simultaneously, and the miniature probe 74 that makes does not switch on when the contact, and the power-on detects after the complete contact, has prevented because of the damage that half contact state has the impedance to lead to the golden finger.

The above embodiments are merely illustrative of the technical concept and features of the present invention, and the present invention is not limited thereto, and any equivalent changes or modifications made according to the spirit of the present invention should be included in the scope of the present invention.

Claims

1. The utility model provides a LED backlight unit's detection anchor clamps which characterized in that: the motor driving device comprises a base plate, the fixed stand that sets up on the bottom plate, the initiative board is established to the cover on the stand, the top of initiative board sets up the driving piece, just the driving piece can drive the initiative board and remove along the stand direction, survey the board through buffering subassembly setting in the below of initiative board, survey the board parallel with the initiative board, and under the exogenic action, survey test board and initiative board and can be close to or keep away from along buffering subassembly, be in simultaneously set up test component on surveying the board, test component includes contact switch, and simultaneously contact switch sets up survey between board and the initiative board, and survey the in-process that board and initiative board are close to, trigger contact switch.

2. The detecting clamp for LED backlight module according to claim 1, wherein: the test assembly still includes the probe mounting panel, the probe mounting panel with survey the board and be connected, just set up probe installation piece on the probe mounting panel, and set up a plurality of miniature probes on the probe installation piece, it is a plurality of the test end of miniature probe is located the bottom plate directly over, miniature probe all is connected with contact switch.

3. The detecting clamp for LED backlight module according to claim 2, wherein: the probe installation block is further provided with a limiting block, the limiting block is located between the test board and the driving board, and the height of the limiting block is higher than that of the micro probe.

4. The detecting clamp for LED backlight module according to claim 1, wherein: the driving part is a push-pull type clamp, the driving part is arranged on the vertical plate, the vertical plate is fixedly arranged on the bottom plate, and meanwhile, the working end of the driving part is connected with the driving plate through the clamping block.

5. The detecting clamp for LED backlight module according to claim 4, wherein: the vertical plate is provided with a waist-shaped hole, the push-pull type clamp is connected with the waist-shaped hole through the waist-shaped hole, and the waist-shaped hole is vertically arranged.

6. The detecting clamp for LED backlight module according to claim 1, wherein: the driving plate is provided with a linear shaft sleeve, and the vertical column is sleeved in the linear shaft sleeve.

7. The detecting clamp for LED backlight module according to claim 1, wherein: the buffer assembly comprises a buffer rod and buffer springs, the buffer rod penetrates through the test board and the driving board, nuts are arranged at two ends of the buffer rod respectively for limiting, the buffer springs are sleeved on the buffer rod, and two ends of each buffer spring are abutted to the test board and the driving board respectively.

8. The detecting clamp for LED backlight module according to claim 1, wherein: the base plate is further provided with a test position, the test position is provided with a positioning hole, and a positioning column is arranged in the positioning hole.