CN109342020A - Bogey is used in a kind of test of display panel - Google Patents
Bogey is used in a kind of test of display panel Download PDFInfo
- Publication number
- CN109342020A CN109342020A CN201811383548.3A CN201811383548A CN109342020A CN 109342020 A CN109342020 A CN 109342020A CN 201811383548 A CN201811383548 A CN 201811383548A CN 109342020 A CN109342020 A CN 109342020A
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- Prior art keywords
- display panel
- probe
- pcb
- plate
- rotating plate
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- 238000012360 testing method Methods 0.000 title claims abstract description 51
- 239000000523 sample Substances 0.000 claims abstract description 72
- 239000002184 metal Substances 0.000 claims abstract description 33
- 229910052751 metal Inorganic materials 0.000 claims abstract description 33
- 238000001514 detection method Methods 0.000 claims abstract description 23
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 12
- 239000000741 silica gel Substances 0.000 claims description 12
- 229910002027 silica gel Inorganic materials 0.000 claims description 12
- 238000003825 pressing Methods 0.000 claims description 10
- 208000027418 Wounds and injury Diseases 0.000 abstract description 7
- 230000006378 damage Effects 0.000 abstract description 7
- 208000014674 injury Diseases 0.000 abstract description 7
- 238000002788 crimping Methods 0.000 abstract description 6
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 abstract description 3
- 239000000047 product Substances 0.000 description 10
- 238000000034 method Methods 0.000 description 9
- 230000001934 delay Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000033001 locomotion Effects 0.000 description 3
- 239000006227 byproduct Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 230000011664 signaling Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
Abstract
The present invention relates to a kind of display panel test bogeys.The bogey, including carrier and testing base, it is connected by the connector of PCB signal rotating plate and display panel, the detection signal of display panel is transferred on the metal lattice of PCB signal rotating plate, when detection, display panel can be detected by being directly connected with the metal lattice of PCB signal rotating plate, reduce and injury caused by crimping is repeated several times to product；The metal lattice for directly detecting PCB signal rotating plate simultaneously, the connector for avoiding display panel cause testing result inaccurate since conducting is unsuccessful.It is equipped with support column in the quadrangle of pedestal, carrier is held for positioning, docks it accurately；It drives probe assembly to move up and down by cylinder, completes being turned on or off for signal, easy to operate, conducting success rate is high, and detection efficiency is high.Structure of the invention is compatible can not test station use.
Description
Technical field
The present invention relates to display panel testing fields, are specifically a kind of display panel test bogeys.
Background technique
In the production process of display panel, need to detect the different performance of display panel.Currently, to display surface
When the different performance of the same process stage of plate is detected, need using different detection signals and different detection devices,
It in detection process, is directly crimped to the connector of display panel to be measured mostly；A process stage is completed, is generally required
The repetitious connector to display panel to be measured crimps, such connector repeatedly crimped repeatedly to display panel
Caused by injury greatly, serious conditions even cause entire display panel to scrap；And after crimping is repeated several times, it also be easy to cause inspection
It crimps bad during surveying, causes testing result inaccurate, or even be unable to complete detection.
Summary of the invention
In order to solve the above problem, the present invention provides a kind of display panel test bogey, and display panel test is used
Bogey only need to the connector to display panel once crimped, the inspection of the different performance of a process stage can be completed
It surveys, is significantly reduced the injury to display panel connector.
The technical solution adopted by the present invention is that: a kind of display panel test bogey, including carrier and testing base,
It is characterized by: the carrier includes the PCB signal rotating plate for placing the supporting plate of display panel He being arranged on supporting plate, it is described
PCB signal rotating plate is equipped with the metal lattice for signal detection, the connector make-up company of the PCB signal rotating plate and display panel
It connects, the signal of display panel is transferred to metal lattice by PCB signal rotating plate, and the test surfaces of supporting plate are arranged in the metal lattice
On；
The testing base includes bottom plate, the cylinder being fixed on bottom plate, contacts the probe be connected with metal lattice
Component and support column for holding supporting plate, the cylinder body of the cylinder are fixed on bottom plate, the piston rod and probe of the cylinder
Component is connected, and the probe on the cylinder driving probe assembly contacts conducting with the metal lattice on PCB signal rotating plate.
Preferably, the PCB signal rotating plate includes the PCB-A rotating plate being fixed on supporting plate product mounting surface and is fixed on
PCB-B rotating plate on supporting plate test surfaces, an interface of the PCB-A rotating plate and the connector of display panel connect, described
Another interface of PCB-A rotating plate is connect with PCB-B rotating plate, and the metal lattice is arranged on PCB-B rotating plate.
Further, the product mounting surface of the supporting plate is equipped with the groove for placing display panel and is used to show
Panel limits the position-limit mechanism in groove.
Further, the position-limit mechanism includes the fastening button that groove one end is arranged in, the groove other end and
Two sides are equipped with silica gel block, and the bumping post for fastening button stretches out the one end for pushing down display panel, the display panel it is another
One end and two sides pass through the limit correcting of silica gel block.
Further, the fastening button is arranged in the button mounting groove on supporting plate, including setting is installed in button
The telescopic baffle of trench bottom, the keypad being arranged on telescopic baffle and key cap, the button mounting groove are communicated with groove,
The telescopic baffle is equipped with inclined-plane slideway by groove side, and the keypad bottom is equipped with the idler wheel slided on inclined-plane slideway,
The upper end of the keypad is pierced by outside the limit hole of key cap, and the key cap and button mounting groove medial surface fasten；Institute
It states and is equipped with spring between end face of the telescopic baffle far from groove and button installation groove sidewall, the telescopic baffle is close to the end of groove
Face is equipped with the bumping post for pushing down display panel.
Further, the probe assembly includes probe supporting plate, the pcb board being fixed on probe supporting plate and is arranged in PCB
Probe on plate, probe supporting plate bottom are fixedly connected with the piston rod of cylinder, are successively arranged on the pcb board for clamping
The probe A clamping plate and probe B clamping plate of probe, the probe B clamping plate are equipped with probe and delay pressing plate, and the cylinder is driven by piston rod
Dynamic probe supporting plate moves upwards, and probe delays from probe to be stretched out in pressing plate and contact conducting with the metal lattice on PCB signal rotating plate.
Further, it is equipped with guide hole on the quadrangle of the probe supporting plate, the bottom plate is equipped with to be cooperated with guide hole
Guide post.
Preferably, the quadrangle of the bottom plate is equipped with support column, electromagnet, the supporting plate are equipped on the support column
Test surfaces be equipped with magnet with electromagnetic actuation.
Preferably, the quadrangle of the bottom plate is equipped with support column, wherein two diagonal support columns are equipped with positioning column,
The supporting plate is equipped with the location hole cooperated with positioning column.
Preferably, the cylinder block is equipped with for the high position cylinder inductor of detection probe module position and low
Position cylinder inductor.
The beneficial effect that the present invention obtains is: being connected by the connector of PCB signal rotating plate and display panel, by display surface
The detection signal of plate, is transferred on the metal lattice of PCB signal rotating plate, when detection, the direct metal lattice with PCB signal rotating plate
Conducting can detect display panel, reduce and injury caused by crimping is repeated several times to product；PCB is directly detected simultaneously
The metal lattice of signal rotating plate, the connector for avoiding display panel cause testing result inaccurate since conducting is unsuccessful.It is aobvious
Show that panel is placed in the groove of supporting plate, display panel is caused and limited by fastening button and silica gel block, is operated
Simply, easy to use.PCB signal rotating plate is by the way of PCB-A rotating plate and PCB-B rotating plate snapping, PCB-A rotating plate and display surface
The connector of plate connects, and metal lattice is arranged on PCB-B rotating plate, and when replacement only needs replacing PCB-B rotating plate, further
Reduce the injury caused by product.
It is equipped with support column in the quadrangle of pedestal, carrier is held for positioning, docks it accurately；It is driven and is visited by cylinder
Needle assemblies move up and down, and complete being turned on or off for signal, easy to operate, and conducting success rate is high, and detection efficiency is high；On support column
Equipped with the electromagnet being attracted with carrier, when energization, is attracted, and when power-off disconnects, and is guaranteed in test process, it is firm to connect with carrier.
The configuration of the present invention is simple, it is easy for operation, it is compatible can not test station use.Simultaneously only to the injury of product
Once, it greatly reduces because artificial origin, detection error are injury caused by product.
Detailed description of the invention
Fig. 1 is the structural diagram of the present invention；
Fig. 2 is the explosive view of Fig. 1；
Fig. 3-4 is carrier structure schematic diagram；
Fig. 5-6 is PCB signal rotating plate and display panel connector connection schematic diagram；
Fig. 7 is the scheme of installation for fastening button on supporting plate；
Fig. 8-9 is the structural schematic diagram of testing base.
Specific embodiment
The present invention will be further explained in the following with reference to the drawings and specific embodiments.
As shown in Figs. 1-2, a kind of display panel of the invention test bogey, including carrier 1 and testing base 2,
Display panel 3 to be measured is placed in the groove 1111 of 1 supporting plate 111 of carrier, the connector 31 and PCB signal rotating plate of display panel 3
13 connections, the detection signal of display panel 3 are transmitted on the metal lattice 1321 of PCB signal rotating plate 13, in testing base 2
Probe 246 on probe assembly 24 contacts conducting with metal lattice 1321, and probe 246 with connector 31 without being directly connected to, both
Protect product, guaranteed conducting success rate, structure is simple, easy for operation, it is compatible can not test station use.
As shown in Figure 3-4, carrier 1 includes for placing the supporting plate 11 of display panel 3 and the PCB being arranged on supporting plate 11 letter
Number rotating plate 13, display panel 3 is placed in the groove 111 on 11 product mounting surface of supporting plate, by 11 product mounting surface of supporting plate
Silica gel block 15 and position-limit mechanism 14 correcting and limit are carried out to the display panel 3 in groove 111.PCB signal rotating plate 13 is solid
It is scheduled on supporting plate 11, PCB signal rotating plate 13 is connect with 31 make-up of connector of display panel 3, by the detection signal of display panel 3
It is transferred on the metal lattice 1321 of PCB signal rotating plate 13, realizes the transmitting of signal, such as need to detect the different function of display panel 3
Can, the metal lattice 1321 on PCB signal rotating plate 13 need to be only examined, is avoided in different function detection process to display panel
The multiplicating plug of 3 connector 31, effectively protects display panel 3；And the signaling point of metal lattice 1321 is compared to aobvious
Show the connector 31 of panel 3 detect it is more convenient be easy, avoid in detection process, due to artificial origin cause crimping not at
Function, caused detection error.Metal lattice 1321 is located on the test surfaces of supporting plate 11 that (test surfaces and product mounting surface are located at supporting plate
Opposite two face on, upper surface in Fig. 3 is product mounting surface, and the upper surface in Fig. 4 is test surfaces).
As seen in figs. 5-6, PCB signal rotating plate 13 includes PCB-A rotating plate 131 and PCB-B rotating plate 132, PCB-A rotating plate 131
It is fixed by screws on 11 product mounting surface of supporting plate, PCB-B rotating plate 132 is fixed by screws on 11 test surfaces of supporting plate, gold
Belong to dot matrix 1321 to be arranged on PCB-B rotating plate 132；One interface of PCB-A rotating plate 131 and the connector 31 of display panel 3 connect
It connects, another interface of PCB-A rotating plate 131 is connect with PCB-B rotating plate 132, and 31 signal of connector of display panel 3 passes through PCB-
After A rotating plate 131 and PCB-B rotating plate 132, it is transmitted on metal lattice 1321.PCB-A rotating plate 131 uses the pcb board of resistance to plug,
PCB-B rotating plate 132 uses common pcb board, when replacement, as long as replacement PCB-B rotating plate 132, does not need to replace entire PCB letter
Number rotating plate 13 saves cost；PCB-B rotating plate 132 is not directly connected to the connector 31 of display panel 3, is further protected aobvious
Show panel 3.
As shown in fig. 7, position-limit mechanism 14 includes the fastening button that 111 one end of groove is arranged in, 111 other end of groove and two
Side is equipped with silica gel block 15, in figure, fastens button and is mounted in the button mounting groove 114 on supporting plate 11, fasten the gear of button
Column 1411 stretches out the one end for pushing down display panel 3, and the other end of display panel 3 is pushed down by one piece of silica gel block 15, display surface
The two sides of plate 3 pass through three pieces of (one piece of the side connecting with PCB-A rotating plate, two pieces of the other side) silica gel block 15 limits.Silica gel gear
Block 15 is mounted in the U-type groove hole of 11 groove of supporting plate, 111 surrounding by bolt, and adjustable silica gel block 15 is in U-type groove hole
Interior position, finely tunes position of the display panel 3 in groove 111, carries out correcting to display panel 3 and FPC.
In the present embodiment, fastens button and include the telescopic baffle 141 that 114 bottom of button mounting groove is set, be arranged and stretching
Keypad 142 and key cap 143 on contracting baffle 141, button mounting groove 114 are communicated with groove 111, and telescopic baffle 141 leans on
111 side of groove is equipped with inclined-plane slideway, and 142 bottom of keypad is equipped with the idler wheel 1421 slided on inclined-plane slideway, keypad 142
Upper end be pierced by outside the limit hole 1431 of key cap 143, key cap 143 and 114 medial surface of button mounting groove fasten, button
Key cap 143 is limited in slot by the inner sidewall of mounting groove 114；End face of the telescopic baffle 141 far from groove 111 and button are pacified
Spring is equipped between 114 side wall of tankage, spring is mounted in the spring mounting groove 1412 of telescopic baffle 141, and telescopic baffle 141 leans on
The end face of nearly groove 14 is equipped with the bumping post 1411 for pushing down display panel 3.
Keypad 142 is pressed down on, the idler wheel 1421 of 142 lower end of keypad is opposite in the inclined-plane slideway of telescopic baffle 141
Movement, since key cap 143 is limited in button mounting groove 114, keypad 142 cannot move in the horizontal plane, therefore roll
For wheel 1421 in inclined-plane slideway relative motion, driving telescopic baffle 141 drives bumping post 1411 to far from 111 1 Slideslip of groove
It is retracted into button mounting groove 114, spring is compressed.Keypad 142 is unclamped, under the action of the restoring force of spring, promotion is stretched
Contracting baffle 141 is moved to 111 side of groove, is driven bumping post 1411 to stretch out, is extend into groove 111, push down display panel 3.
As Figure 8-9, testing base 2 is used cooperatively with carrier 1, it is compatible can not test station use, testing base
2 include bottom plate 21, support column 22, cylinder 23 and probe assembly 24, is equipped with support column 22 on four angles of bottom plate 21, wherein
Two diagonal support columns 22 are equipped with positioning column 221, and supporting plate 11 is equipped with the location hole 112 cooperated with positioning column 221, support
Column 22 is inserted into corresponding location hole 112, realizes accurate positionin when testing base 2 and carrier 1 are assembled.It is set on support column 22
There is electromagnet 222, supporting plate 11 is equipped with magnet 113, and electromagnet 222 and magnet 113 are attracted after energization, and supporting plate 11 cannot be from support
It removes on column 22, can just be removed after power-off, play the role of detection process protection.The cylinder body 231 of cylinder 23 is fixed on bottom plate 21
On, piston rod 232 and the probe assembly 24 of cylinder 23 are fixedly linked, and drive probe 246 and metal lattice on probe assembly 24
1321 contact conductings, light display panel 3.
As shown in figure 9, probe assembly 24 includes probe supporting plate 241, the pcb board 242 being fixed on probe supporting plate 241 and sets
The probe 246 on pcb board 242 is set, 241 bottom of probe supporting plate is fixedly connected with the piston rod 232 of cylinder 23, on pcb board 242
It is successively arranged probe A clamping plate 243 and probe B clamping plate 244,244 collective effect of probe A clamping plate 243 and probe B clamping plate from bottom to top
Probe 246 is clamped, probe B clamping plate 244 is equipped with probe and delays pressing plate 245, and when crimping, cylinder 23 is driven by piston rod 232
Probe supporting plate 241 moves upwards, and probe delays pressing plate 245 and compressed, and probe 246 delays in pressing plate 245 from probe to be stretched out, with metal dots
Battle array 1321 is connected, and after the completion of crimping, when the slow pressing plate 245 of probe does not stress, probe 246 is retracted into probe and delays in pressing plate 245.
In the present embodiment, guide hole 411 is equipped on the quadrangle of probe supporting plate 241, bottom plate 21 is equipped with to be cooperated with guide hole 411
Guide post 27, guide hole 411 and guide post 27 cooperate, and when cylinder 23 drives probe assembly 24 to move, plays the role of guiding, raising is led
Logical success rate.
23 cylinder body 231 of cylinder is equipped with high position cylinder inductor 25 and lower position for 24 position of detection probe component
Cylinder inductor 26 prevents 24 stroke of probe assembly inadequate, and probe 246 is not contacted with metal lattice 1321 or probe assembly 24
Stroke is excessive, and device is destroyed.
Operating principle of the invention is: pressing the button plate 142, the idler wheel 1421 of 142 lower end of keypad is in telescopic baffle 141
Inclined-plane slideway on move, overcome acting force of the spring make telescopic baffle 141 retract (movement of principle groove side)；By display to be measured
Panel 3 is put to groove 111, and groove 111 and silica gel block 15 carry out correcting to display panel 3 and FPC；Key is unclamped, is stretched
Baffle 141 pops up under the effect of spring-return power, and bumping post 1411 is pushed down screen and clasped；At this time by the connection on PCB-A rotating plate 131
31 make-up of device and 3 connector of display panel, signal is transferred to metal lattice 1321 at this time, completes accurately to place display panel 3
Onto carrier 1；3 support of display panel can be placed into testing base 2 well by carrier 1, and support column 22 is inserted into corresponding fixed
In the hole 112 of position, accurate positionin when testing base 2 and carrier 1 are assembled is realized, electromagnet 222 and magnet 113 are attracted after energization,
Examination pedestal 2 is firmly pulled together with carrier 1, and cylinder 23 drives the probe 246 on probe assembly 24 to connect with metal lattice 1321
Display panel 3 is lighted in touching conducting, and more different tests need, and carries out different station detection.
Basic principle and key structural feature of the invention has been shown and described above.The present invention is not by the limit of examples detailed above
System, without departing from the spirit and scope of the present invention, various changes and improvements may be made to the invention, these changes and improvements
It both falls in the range of claimed invention.The claimed scope of the invention is by appended claims and its equivalent
It defines.
Claims (10)
1. a kind of display panel test bogey, including carrier (1) and testing base (2), it is characterised in that: the carrier
(1) include for placing the supporting plate of display panel (3) (11) and PCB signal rotating plate (13) on supporting plate (11) being arranged, it is described
PCB signal rotating plate (13) is equipped with the metal lattice for signal detection, the PCB signal rotating plate (13) and display panel (3)
The signal of the connection of connector (31) make-up, display panel (3) is transferred to metal lattice (1321) by PCB signal rotating plate (13),
The metal lattice (1321) is arranged on the test surfaces of supporting plate (11)；
The testing base (2) includes bottom plate (21), the cylinder (23) being fixed on bottom plate (21), contacts with metal lattice
The cylinder body (231) of the probe assembly (24) of conducting and support column (22) for holding supporting plate (21), the cylinder (23) is fixed
On bottom plate (21), the piston rod (232) of the cylinder (23) is connected with probe assembly (24), and the cylinder (23) drives probe
Probe (246) on component (24) contacts conducting with the metal lattice (1321) on PCB signal rotating plate (23).
2. display panel test bogey according to claim 1, it is characterised in that: the PCB signal rotating plate
(13) include the PCB-A rotating plate (131) that is fixed on supporting plate (11) product mounting surface and be fixed on supporting plate (11) test surfaces
PCB-B rotating plate (132), an interface of the PCB-A rotating plate (131) is connect with the connector (31) of display panel (3), described
Another interface of PCB-A rotating plate (131) is connect with PCB-B rotating plate (132), and the metal lattice (1321) is arranged in PCB-B
On rotating plate (132).
3. display panel test bogey according to claim 1 or 2, it is characterised in that: the supporting plate (11)
Product mounting surface is equipped with the groove (111) for placing display panel (3) and is used to limit display panel (3) in groove
(111) position-limit mechanism (14) in.
4. display panel test bogey according to claim 3, it is characterised in that: position-limit mechanism (14) packet
Setting is included in the fastening button of groove (111) one end, groove (111) other end and two sides are equipped with silica gel block (15),
The bumping post (1411) for fastening button stretches out the one end for pushing down display panel (3), the other end and two of the display panel (3)
Side limits correcting by silica gel block (15).
5. display panel test bogey according to claim 4, it is characterised in that: the fastening button setting exists
In button mounting groove (114) on supporting plate (11), including be arranged button mounting groove (114) bottom telescopic baffle (141), set
Set keypad (142) and key cap (143) on telescopic baffle (141), the button mounting groove (114) and groove
(111) it communicates, the telescopic baffle (141) is equipped with inclined-plane slideway by groove (111) side, and keypad (142) bottom is set
There is the idler wheel (1421) slided on inclined-plane slideway, the upper end of the keypad (142) is pierced by the limit hole of key cap (143)
(1431) outside, the key cap (143) and button mounting groove (114) medial surface fasten；The telescopic baffle (141) is far from recessed
Spring is equipped between the end face and button mounting groove (114) side wall of slot (111), the telescopic baffle (141) is close to groove (111)
End face be equipped with bumping post (1411) for pushing down display panel (3).
6. display panel test bogey according to claim 3, it is characterised in that: probe assembly (24) packet
Include probe supporting plate (241), the pcb board (242) that is fixed on probe supporting plate (241) and the probe being arranged on pcb board (242)
(246), probe supporting plate (241) bottom is fixedly connected with the piston rod (232) of cylinder (23), on the pcb board (242) according to
It is secondary to be equipped with probe A clamping plate (243) and probe B clamping plate (244) for clamping probe (246), on the probe B clamping plate (244)
Delay pressing plate (245) equipped with probe, the cylinder (23) is moved upwards by piston rod (232) driving probe supporting plate (241), probe
(246) delay metal lattice (1321) the contact conducting stretched out in pressing plate (245) and on PCB signal rotating plate (23) from probe.
7. display panel test bogey according to claim 6, it is characterised in that: the probe supporting plate (241)
Quadrangle on be equipped with guide hole (2411), the bottom plate (21) is equipped with the guide post (27) that cooperates with guide hole (2411).
8. display panel test bogey according to claim 1, it is characterised in that: the quadrangle of the bottom plate (21)
It is equipped with support column (22), is equipped with electromagnet (222) on the support column (22), the test surfaces of the supporting plate (11) are equipped with
The magnet (113) being attracted with electromagnet (222).
9. display panel test bogey according to claim 1, it is characterised in that: the quadrangle of the bottom plate (21)
Support column (22) are equipped with, wherein two diagonal support columns (22) are equipped with positioning column (221), the supporting plate (11) is equipped with
With the location hole (112) of positioning column cooperation.
10. display panel test bogey according to claim 1, it is characterised in that: cylinder (23) cylinder body
(231) high position cylinder inductor (25) and the lower position cylinder inductor for detection probe component (24) position are equipped with
(26)。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811383548.3A CN109342020A (en) | 2018-11-20 | 2018-11-20 | Bogey is used in a kind of test of display panel |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811383548.3A CN109342020A (en) | 2018-11-20 | 2018-11-20 | Bogey is used in a kind of test of display panel |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109342020A true CN109342020A (en) | 2019-02-15 |
Family
ID=65316642
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811383548.3A Pending CN109342020A (en) | 2018-11-20 | 2018-11-20 | Bogey is used in a kind of test of display panel |
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| Country | Link |
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| CN (1) | CN109342020A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109738445A (en) * | 2019-03-05 | 2019-05-10 | 武汉精毅通电子技术有限公司 | A kind of display panel cell sections of detection jig |
| CN111866252A (en) * | 2020-07-17 | 2020-10-30 | 苏州精濑光电有限公司 | Mobile phone screen detection equipment |
| CN112187348A (en) * | 2020-10-15 | 2021-01-05 | 郭天强 | Portable carrying box for optical time domain reflectometer |
| CN113851065A (en) * | 2020-06-09 | 2021-12-28 | 华为技术有限公司 | Display panel testing device and display panel testing box |
| CN114364195A (en) * | 2020-10-12 | 2022-04-15 | 成都极米科技股份有限公司 | Signal transmission method, mechanism, device and storage medium |
| CN117368802A (en) * | 2023-12-06 | 2024-01-09 | 深圳市鼎维尔科技有限公司 | Mobile phone motherboard and touch-sensitive screen conduction test frock |
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| CN113851065A (en) * | 2020-06-09 | 2021-12-28 | 华为技术有限公司 | Display panel testing device and display panel testing box |
| CN113851065B (en) * | 2020-06-09 | 2023-08-22 | 华为技术有限公司 | Display panel testing device and display panel testing box |
| CN111866252A (en) * | 2020-07-17 | 2020-10-30 | 苏州精濑光电有限公司 | Mobile phone screen detection equipment |
| CN114364195A (en) * | 2020-10-12 | 2022-04-15 | 成都极米科技股份有限公司 | Signal transmission method, mechanism, device and storage medium |
| CN112187348A (en) * | 2020-10-15 | 2021-01-05 | 郭天强 | Portable carrying box for optical time domain reflectometer |
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| CN117368802A (en) * | 2023-12-06 | 2024-01-09 | 深圳市鼎维尔科技有限公司 | Mobile phone motherboard and touch-sensitive screen conduction test frock |
| CN117368802B (en) * | 2023-12-06 | 2024-03-19 | 深圳市鼎维尔科技有限公司 | Mobile phone motherboard and touch-sensitive screen conduction test frock |
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