CN221124643U - Test fixture - Google Patents

Test fixture Download PDF

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Publication number
CN221124643U
CN221124643U CN202322494118.1U CN202322494118U CN221124643U CN 221124643 U CN221124643 U CN 221124643U CN 202322494118 U CN202322494118 U CN 202322494118U CN 221124643 U CN221124643 U CN 221124643U
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China
Prior art keywords
test
guide
testing
test fixture
probe
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CN202322494118.1U
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Chinese (zh)
Inventor
夏科
樊增虎
李武岐
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Zhejiang Sunwoda Electronics Co Ltd
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Zhejiang Sunwoda Electronics Co Ltd
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Priority to CN202322494118.1U priority Critical patent/CN221124643U/en
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Abstract

本实用新型提供了一种测试治具,测试治具包括:基座,设置有用于放置待测试件的测试位;竖向连接部;连接在基座上;测试部,可移动地设置在竖向连接部上,测试部具有测试端,测试端具有靠近测试位的测试位置以及远离测试位的分离位置;驱动部,设置在基座上并与测试部驱动配合以带动测试端在测试位置和分离位置之间进行移动;拉伸缓冲部,连接在竖向连接部和测试部之间或者连接在驱动部和测试部之间,以向测试部施加朝向远离所述测试位方向的缓冲力。本申请的技术方案能够有效地解决相关技术中的待测试件易被压坏的问题。

The utility model provides a test fixture, which includes: a base, provided with a test position for placing a test piece; a vertical connection part connected to the base; a test part, movably arranged on the vertical connection part, the test part having a test end, the test end having a test position close to the test position and a separation position away from the test position; a drive part, arranged on the base and drivingly cooperated with the test part to drive the test end to move between the test position and the separation position; a stretching buffer part, connected between the vertical connection part and the test part or between the drive part and the test part, to apply a buffer force to the test part in a direction away from the test position. The technical solution of the present application can effectively solve the problem that the test piece is easily crushed in the related art.

Description

Test fixture
Technical Field
The utility model relates to the technical field of testing, in particular to a testing jig.
Background
With the continuous development of automated processing technology, in the process of manufacturing electronic products using automated equipment, there is a step of testing the manufactured electronic products. In the related art, it is generally required to perform a conductivity test on an electronic product by using a probe test device, so as to determine whether the electronic product meets a factory requirement and has a required function.
As the volume of current electronic products is increasingly shrinking, the size of test probes has to be reduced accordingly, and the mechanisms of the probe test apparatus are also required to be finer to meet the test requirements. In the related art, the test probe is often pressed too much by the probe test device, so that the test piece to be tested is easily crushed by the probe test or the probe test is damaged. Therefore, there is a problem in the related art that the test piece to be tested is easily crushed.
Disclosure of utility model
The utility model mainly aims to provide a test fixture for solving the problem that a test piece to be tested in the related technology is easy to crush.
In order to achieve the above object, the present utility model provides a test fixture, comprising: the base is provided with a test position for placing a test piece to be tested; the vertical connecting part is connected to the base; the test part is movably arranged on the vertical connecting part and is provided with a test end, and the test end is provided with a test position close to the test position and a separation position far away from the test position; the driving part is arranged on the vertical connecting part and is in driving fit with the testing part to drive the testing end to move between the testing position and the separating position; and a stretching buffer part connected between the vertical connection part and the test part or between the driving part and the test part to apply a buffer force to the test part in a direction away from the test position.
Further, the test fixture also comprises an elastic telescopic piece arranged at the bottom of the test part, one end of the elastic telescopic piece is connected with the test part, and the other end of the elastic telescopic piece can be in propping fit with the test piece to be tested.
Further, the elastic telescopic piece comprises an elastic telescopic rod and a pressing block, and the elastic telescopic rod is connected between the test part and the pressing block.
Further, the elastic telescopic rod comprises a first rod body, a second rod body and an elastic piece, wherein the first rod body is movably arranged in the second rod body in a penetrating mode, and the elastic piece is arranged in the second rod body to apply external acting force to the first rod body.
Further, the test fixture further comprises a first guide part and a second guide part, wherein the first guide part is arranged on the base, and the second guide part is arranged on the test part and is in guide fit with the first guide part.
Further, one of the first guide part and the second guide part is a guide pin, and the other of the first guide part and the second guide part is a guide pin sleeve which can be in plug fit with the guide pin.
Further, the test portion includes fixed block, test board and probe platform, and the test board sets up between fixed block and probe platform, and fixed block and drive portion drive cooperation are provided with the test probe of being connected with the test board on the probe platform, and the test probe extends and stretches out in the probe platform towards the test position.
Further, the test fixture further comprises a test supporting seat arranged at the test position, a groove structure corresponding to the test probe is arranged on the test supporting seat, and the groove structure is used for placing a test piece to be tested.
Further, the upper surface of test supporting seat is provided with a plurality of guide blocks, and a plurality of guide blocks enclose and establish in groove structure's border department, and the guide block has the direction inclined plane towards groove structure.
Further, the test fixture further comprises positioning pins for positioning the fixing block, the test board and the probe platform and/or the test fixture further comprises fasteners for connecting the fixing block, the test board and the probe platform.
Further, the test fixture further comprises a limit position detection assembly, the limit position detection assembly comprises a trigger piece and a sensing piece, one of the trigger piece and the sensing piece is arranged on the test part, and the other of the trigger piece and the sensing piece is arranged on the vertical connecting part or the driving part; and/or, the test fixture further comprises a sliding guide structure arranged between the driving part and the test part, the sliding guide structure comprises a sliding groove and a sliding block in sliding fit with the sliding groove, the sliding groove is arranged on one of the test part and the driving part, and the sliding block is arranged on the other of the test part and the driving part.
By applying the technical scheme of the utility model, the vertical connecting part is connected to the base, the driving part is fixedly connected with the vertical connecting part, the testing part is movable relative to the vertical connecting part, the testing part is provided with the testing end, and the driving part can drive the testing part to move so as to drive the testing end to move between a testing position close to the testing position and a separating position far away from the testing position; the upper end of tensile buffering portion links firmly with drive portion or vertical connecting portion, and the lower extreme of tensile buffering portion links firmly with test portion, and when tensile buffering portion was in tensile state, the lower extreme of tensile buffering portion can exert ascending buffer force to test portion for the pushing down motion of test portion slows down, and then makes the test end be close to the test piece that awaits measuring slowly when being close to the test position and its pressure is less when contacting with the test piece that awaits measuring, has consequently reduced the risk that the test piece that awaits measuring appears damaging because of contact pressure is too big. Therefore, the technical scheme of the utility model can effectively solve the problem that the test piece to be tested in the related technology is easy to be crushed.
Drawings
The accompanying drawings, which are included to provide a further understanding of the utility model and are incorporated in and constitute a part of this specification, illustrate embodiments of the utility model and together with the description serve to explain the utility model. In the drawings:
FIG. 1 is a schematic perspective view of a test fixture according to an embodiment of the utility model;
FIG. 2 shows an enlarged schematic view of portion A of the test fixture of FIG. 1;
FIG. 3 shows a side view of the test fixture of FIG. 1;
FIG. 4 is a perspective view of a main body portion of a test portion of the test fixture of FIG. 1;
FIG. 5 shows an enlarged schematic view of portion B of the test section of FIG. 4;
FIG. 6 shows an exploded schematic view of the test section of FIG. 4;
FIG. 7 shows a schematic cross-sectional view of a driving portion of the test fixture of FIG. 1;
fig. 8 shows a schematic perspective view of a test board of the test fixture of fig. 1.
Wherein the above figures include the following reference numerals:
1. a test piece to be tested;
10. a base;
20. a vertical connection;
30. A test section; 31. a fixed block; 32. a test board; 321. a lead pad; 322. a probe pad; 33. a probe platform; 34. a test probe;
40. A driving section; 41. a driving cylinder; 42. a piston rod;
50. A stretching buffer portion;
60. an elastic expansion piece; 61. an elastic telescopic rod; 62. pressing the block;
70. a first guide part; 71. a guide pin sleeve;
80. A second guide part; 81. a guide pin;
90. A test support seat; 91. a groove structure; 92. a guide block; 921. a guide slope;
100. a positioning pin;
110. a limit position detection assembly; 111. a trigger; 112. an induction member;
120. And a connecting seat.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. The following description of at least one exemplary embodiment is merely exemplary in nature and is in no way intended to limit the utility model, its application, or uses. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of exemplary embodiments according to the present application. As used herein, the singular is also intended to include the plural unless the context clearly indicates otherwise, and furthermore, it is to be understood that the terms "comprises" and/or "comprising" when used in this specification are taken to specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof.
The relative arrangement of the components and steps, numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present utility model unless it is specifically stated otherwise. Meanwhile, it should be understood that the sizes of the respective parts shown in the drawings are not drawn in actual scale for convenience of description. Techniques, methods, and apparatus known to one of ordinary skill in the relevant art may not be discussed in detail, but should be considered part of the specification where appropriate. In all examples shown and discussed herein, any specific values should be construed as merely illustrative, and not a limitation. Thus, other examples of the exemplary embodiments may have different values. It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further discussion thereof is necessary in subsequent figures.
As shown in fig. 1 to 3, the present application provides a test fixture, and an embodiment of the test fixture of the present application includes: a base 10 provided with a test site for placing a test piece 1 to be tested; a vertical connection part 20 connected to the base 10; the test part 30 is movably arranged on the vertical connecting part 20, the test part 30 is provided with a test end, and the test end is provided with a test position close to the test position and a separation position far away from the test position; the driving part 40 is arranged on the vertical connecting part 20 and is in driving fit with the testing part 30 to drive the testing end to move between the testing position and the separating position; the tensile buffering portion 50 is connected between the vertical connection portion 20 and the test portion 30 or between the driving portion 40 and the test portion 30 to apply a buffering force to the test portion 30 in a direction away from the test site.
By applying the technical scheme of the embodiment, the vertical connecting part 20 is connected to the base 10, the driving part 40 is fixedly connected with the vertical connecting part 20, the testing part 30 is movable relative to the vertical connecting part 20, the testing part 30 is provided with a testing end, and the driving part 40 can drive the testing part to move so as to drive the testing end to move between a testing position close to the testing position and a separating position far away from the testing position; the upper end of the stretching buffer portion 50 is fixedly connected with the driving portion 40 or the vertical connecting portion 20, the lower end of the stretching buffer portion 50 is fixedly connected with the testing portion 30, when the stretching buffer portion 50 is in a stretching state, the lower end of the stretching buffer portion 50 can apply an upward buffer force to the testing portion 30, so that the downward pressing motion of the testing portion 30 is slowed down, the testing end is slowly close to the test piece 1 to be tested when approaching to the testing position, the pressure when the testing end contacts with the test piece 1 to be tested is small, and therefore the risk of damage to the test piece 1 to be tested due to overlarge contact pressure is reduced. Therefore, the technical scheme of the embodiment can effectively solve the problem that the test piece 1 to be tested in the related technology is easy to be crushed.
In this embodiment, the vertical connection portion 20 is vertically disposed on the base 10, the upper end of the stretching buffer portion 50 is fixedly connected with the upper end of the driving portion 40, the lower end of the stretching buffer portion 50 is fixedly connected with the test portion 30, the stretching buffer portion 50 is a tension spring, and when the tension spring is in a stretched state, the lower end of the stretching buffer portion 50 applies an upward buffer force to the test portion 30. Of course, in other embodiments, the tension cushioning portion may be another structure that can generate an upward cushioning force, such as a bungee cord. The tensile buffer portion 50 may also reduce the shock impact of the driving portion 40 during movement, thereby improving the service life of the test probe 34 (mentioned later).
It should be noted that, in describing the embodiments of the present application, the azimuth words "up" and "down" used refer to "up" and "down" when the test jig is placed in the posture shown in fig. 3; "vertical" refers to the vertical direction in fig. 3 and a direction at an angle (e.g., 0 deg. to 15 deg.) to the vertical direction. Specifically, as shown in fig. 3, in the present embodiment, the above-mentioned "test position" refers to a position where the test end is close to the test position in the vertical direction, and the above-mentioned "separation position" refers to a position where the test end is far from the test position in the vertical direction, wherein the separation position of the test end is located above the test position.
As shown in fig. 1 to 6, the test fixture further includes an elastic telescopic member 60 disposed at the bottom of the test portion 30, one end of the elastic telescopic member 60 is connected to the test portion 30, and the other end of the elastic telescopic member 60 can be in abutting fit with the test piece 1 to be tested. In this embodiment, the test terminal of the test piece 1 to be tested (only the test terminal of the test piece 1 to be tested is shown in fig. 2) is placed in the groove structure 91 (mentioned later) of the test supporting seat 90, the upper end of the elastic telescopic member 60 is connected with the bottom of the test portion 30, and the lower end can be in abutting fit with the test terminal of the test piece 1 to be tested; in the downward moving process of the test part 30, when the lower end of the elastic telescopic piece 60 contacts with the test terminal of the test piece 1 to be tested, the elastic telescopic piece 60 can apply an upward buffering force to the test part 30, so that the test end is further enabled to be slowly close to the test piece 1 to be tested when approaching to the test position, the pressure of the test end in contact with the test piece 1 to be tested is small, and the risk of damage to the test piece 1 to be tested due to overlarge contact pressure is further reduced.
It should be noted that, the "bottom of the test portion 30" refers to a portion of the test portion 30 corresponding to the lower portion in fig. 3, that is, a portion of the test portion 30 near the test site in fig. 3.
As shown in fig. 1 to 6, the elastic extension member 60 includes an elastic extension rod 61 and a pressing block 62, and the elastic extension rod 61 is connected between the test portion 30 and the pressing block 62. When the pressing block 62 contacts with the test terminal of the test piece 1 to be tested, the elastic telescopic rod 61 is in a compressed state, and the elastic telescopic rod 61 applies an upward buffering force to the test portion 30. So set up for the simple structure of elastic extension piece 60, the cost is lower.
In this embodiment, the elastic telescopic rod 61 includes a first rod body, a second rod body and an elastic member, where the first rod body is movably inserted into the second rod body, and the elastic member is disposed in the second rod body to apply an outward moving force to the first rod body. The second rod body is a hollow rod, the first rod body is arranged in the first rod body in a penetrating way, the elastic piece is arranged in the hollow pipe, one end of the first rod body is abutted with the elastic piece, and the other end of the first rod body is connected with the test part or the pressing block; when the pressing block 62 presses the test piece 1 to be tested, the elastic telescopic rod 61 is pressed upwards, so that the first rod body retracts relative to the second rod body, and the elastic piece is pressed to apply an outward moving acting force to the first rod body.
As shown in fig. 1 and 3, the test fixture further includes a first guide portion 70 and a second guide portion 80, where the first guide portion 70 is disposed on the base 10, and the second guide portion 80 is disposed on the test portion 30 and is in guiding fit with the first guide portion 70. The first guiding portion 70 and the second guiding portion 80 are in guiding fit, so that the movement of the testing portion 30 relative to the base 10 is more accurate, and the possibility of offset of the contact between the testing end and the test piece 1 to be tested is reduced.
As shown in fig. 1 and 3, one of the first guide portion 70 and the second guide portion 80 is a guide pin 81, and the other of the first guide portion 70 and the second guide portion 80 is a guide pin sleeve 71 capable of being inserted and fitted with the guide pin 81. In this embodiment, the first guide portion 70 is a guide pin sleeve 71, the second guide portion 80 is a guide pin 81, and the guide pin 81 is in guide engagement with the guide pin sleeve 71. This arrangement makes the structures of the first guide 70 and the second guide 80 simple. In addition, in other embodiments, one of the first guide portion and the second guide portion may also be a bump, and the other of the first guide portion and the second guide portion may also be a groove, with which the bump is guidably engaged; one of the first guide part and the second guide part can also be a sliding block, the other one of the first guide part and the second guide part can also be a sliding rail, and the sliding block is in guide fit with the sliding rail.
As shown in fig. 1 to 6 and 8, the test section 30 includes a fixing block 31, a test board 32 and a probe platform 33, the test board 32 is disposed between the fixing block 31 and the probe platform 33, the fixing block 31 is in driving engagement with the driving section 40, the probe platform 33 is provided with a test probe 34 connected to the test board 32, and the test probe 34 extends toward the test site and extends out of the probe platform 33. One end of the test plate 32 may be electrically connected to the detection device and the other end may be electrically connected to the test probes 34; when the driving part 40 drives the fixing block 31 to move downwards, the test probe 34 can be in electrical contact with the test terminal of the test piece 1 to be tested, so that the detection device is electrically connected with the test piece 1 to be tested, and when the driving part 40 drives the fixing block 31 to move upwards, the test probe 34 can be out of contact with the test piece 1 to be tested, and at the moment, the test piece 1 to be tested can be replaced. The probe platform 33 has a protruding portion protruding downward, and the test probe 34 is disposed in the protruding portion so that the probe platform 33 can function to protect the test probe 34.
As shown in fig. 8, one end of the test board 32 is provided with a lead pad 321, and the lead pad 321 is electrically connected to the inspection device; the other end is provided with a probe pad 322, and the probe pad 322 is electrically connected to the test probe 34.
As shown in fig. 1 to 3, the test fixture further includes a test support seat 90 disposed at the test site, and a groove structure 91 corresponding to the test probe 34 is disposed on the test support seat 90, where the groove structure 91 is used for placing the test piece 1 to be tested. The circumferential inner contour of the groove structure 91 is adapted to the outer contour of the test terminal of the test piece 1 to be tested, so that the test terminal of the test piece 1 to be tested can be stably placed in the groove structure 91. Compared with the manual alignment mode, the groove structure 91 is arranged, so that the test terminal of the test piece 1 to be tested is not easy to shake in the groove structure 91, and the risk of scratch of the test terminal of the test piece 1 to be tested caused by inaccurate plugging is reduced.
As shown in fig. 1 to 3, the upper surface of the test support base 90 is provided with a plurality of guide blocks 92, the plurality of guide blocks 92 are enclosed at the edge of the groove structure 91, and the guide blocks 92 have guide slopes 921 facing the groove structure 91. When the test terminal of the test piece 1 to be tested is placed in the groove structure 91, the guiding inclined plane 921 can guide the test terminal of the test piece 1 to be tested, so that the test terminal of the test piece 1 to be tested can be smoothly placed in the groove structure 91.
In addition, a connection seat is further provided between the test support seat 90 and the base 10.
As shown in fig. 4 to 6, the test fixture further includes positioning pins 100 for positioning the fixing block 31, the test board 32, and the probe platform 33. In this embodiment, the positioning pins 100 are disposed at the bottom of the fixing block 31, and the positioning holes for the positioning pins 100 to pass through are disposed on the test board 32 and the probe platform 33, so that the fixing block 31, the test board 32 and the probe platform 33 are positioned.
It should be noted that, the "bottom of the fixing block 31" refers to a portion of the fixing block 31 corresponding to the lower portion in fig. 3, that is, a portion of the fixing block 31 near the test site in fig. 3.
In addition, the fixed block can be provided with positioning holes, and the positioning pins can be penetrated through the positioning holes of the three parts; or the locating pin can be arranged at the top of the probe platform, and locating holes for the locating pin to pass through are arranged on the test board and the fixed block.
It should be noted that, the "top of the probe platform" refers to a portion of the probe platform 33 corresponding to the upper portion in fig. 6, that is, a portion of the probe platform 33 away from the test site. As shown in fig. 4 to 6, the test fixture further includes fasteners for connecting the fixing block 31, the test plate 32, and the probe platform 33. The bottom of fixed block 31 is provided with the installation blind hole, is provided with the mounting hole on test board 32 and the probe platform 33, and the fastener passes mounting hole and installation blind hole from bottom to top, makes fixed block 31, test board 32 and probe platform 33 can fastening connection. The arrangement makes the installation of the three parts more stable and compact, and is not easy to deviate.
It should be noted that, the "bottom of the fixing block 31" refers to a portion of the fixing block 31 corresponding to the lower portion in fig. 3, that is, a portion of the fixing block 31 near the test site in fig. 3. As shown in fig. 1, 3 and 7, the driving section 40 includes a driving cylinder 41 and a piston rod 42, and the testing section 30 is connected to the free end of the piston rod 42. The driving cylinder 41 can make the piston rod 42 move up and down along the vertical direction, and further can drive the test part 30 to move up and down along the vertical direction. The free end refers to an end of the piston rod 42 located outside the driving cylinder 41. In addition, the driving part may also include a telescopic motor.
As shown in fig. 1 and 3, the test fixture further includes a limit position detecting assembly 110, where the limit position detecting assembly 110 includes a trigger 111 and a sensing member 112, one of the trigger 111 and the sensing member 112 is disposed on the test portion 30, and the other of the trigger 111 and the sensing member 112 is disposed on the vertical connection portion 20 or the driving portion 40. In the present embodiment, the trigger 111 is disposed on the test part 30, the sensing member 112 is disposed on the vertical connection part 20, and when the test part 30 moves to the limit position, the trigger 111 contacts the sensing member 112, and the sensing member 112 is triggered and sends a control signal to the driving cylinder 41 such that the piston rod 42 stops moving downward. In an embodiment not shown in the drawings, the triggering member may be a bump structure and the sensing member may be a sensing switch.
As shown in fig. 1 and 3, the test fixture further includes a sliding guide structure disposed between the driving part 40 and the test part 30, the sliding guide structure including a sliding slot disposed on one of the test part 30 and the driving part 40 and a slider slidably fitted with the sliding slot, the slider disposed on the other of the test part 30 and the driving part 40. In this embodiment, the sliding guide structure includes a sliding slot and a slider slidingly engaged with the sliding slot, the sliding slot is disposed on the test portion 30, the slider is disposed on the driving portion 40, and the sliding guide structure enables the test portion 30 to move in a vertical direction.
The test procedure of the test jig is described:
S1, a driving part 40 works to drive a testing part 30 to move upwards, so that a testing end of the testing part 30 moves to a separation position;
s2, electrically connecting the detection device with a lead pad 321 of the test board 32;
S3, placing a test terminal of the test piece 1 to be tested in a test position;
S4, the driving part 40 works to drive the testing part 30 to move downwards, so that the testing end of the testing part 30 moves to a testing position;
S5, after the test of the test piece 1 to be tested is completed, the test piece 1 to be tested is taken down, and the steps S1 to S4 are repeated to test the subsequent test piece 1 to be tested.
In the description of the present utility model, it should be understood that the azimuth or positional relationships indicated by the azimuth terms such as "front, rear, upper, lower, left, right", "lateral, vertical, horizontal", and "top, bottom", etc., are generally based on the azimuth or positional relationships shown in the drawings, merely to facilitate description of the present utility model and simplify the description, and these azimuth terms do not indicate and imply that the apparatus or elements referred to must have a specific azimuth or be constructed and operated in a specific azimuth, and thus should not be construed as limiting the scope of protection of the present utility model; the orientation word "inner and outer" refers to inner and outer relative to the contour of the respective component itself.
Spatially relative terms, such as "above … …," "above … …," "upper surface on … …," "above," and the like, may be used herein for ease of description to describe one device or feature's spatial location relative to another device or feature as illustrated in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as "above" or "over" other devices or structures would then be oriented "below" or "beneath" the other devices or structures. Thus, the exemplary term "above … …" may include both orientations "above … …" and "below … …". The device may also be positioned in other different ways (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.
In addition, the terms "first", "second", etc. are used to define the components, and are only for convenience of distinguishing the corresponding components, and the terms have no special meaning unless otherwise stated, and therefore should not be construed as limiting the scope of the present utility model.
The above description is only of the preferred embodiments of the present utility model and is not intended to limit the present utility model, but various modifications and variations can be made to the present utility model by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present utility model should be included in the protection scope of the present utility model.

Claims (11)

1.一种测试治具,其特征在于,包括:1. A test fixture, comprising: 基座(10),设置有用于放置待测试件(1)的测试位;A base (10) is provided with a test position for placing the test piece (1); 竖向连接部(20),连接在所述基座(10)上;A vertical connection portion (20) connected to the base (10); 测试部(30),可移动地设置在所述竖向连接部(20)上,所述测试部(30)具有测试端,所述测试端具有靠近所述测试位的测试位置以及远离所述测试位的分离位置;A testing portion (30) is movably arranged on the vertical connection portion (20), the testing portion (30) having a testing end, the testing end having a testing position close to the testing position and a separation position away from the testing position; 驱动部(40),设置在所述竖向连接部(20)上并与所述测试部(30)驱动配合以带动所述测试端在所述测试位置和所述分离位置之间进行移动;A driving portion (40) disposed on the vertical connection portion (20) and drivingly cooperated with the testing portion (30) to drive the testing end to move between the testing position and the separation position; 拉伸缓冲部(50),连接在所述竖向连接部(20)和所述测试部(30)之间或者连接在所述驱动部(40)和所述测试部(30)之间,以向所述测试部(30)施加朝向远离所述测试位方向的缓冲力。A stretching buffer portion (50) is connected between the vertical connection portion (20) and the test portion (30) or between the drive portion (40) and the test portion (30) to apply a buffer force to the test portion (30) in a direction away from the test position. 2.根据权利要求1所述的测试治具,其特征在于,所述测试治具还包括设置在所述测试部(30)的底部的弹性伸缩件(60),所述弹性伸缩件(60)的一端与所述测试部(30)连接,所述弹性伸缩件(60)的另一端能够与所述待测试件(1)抵顶配合。2. The test fixture according to claim 1 is characterized in that the test fixture also includes an elastic telescopic member (60) arranged at the bottom of the test part (30), one end of the elastic telescopic member (60) is connected to the test part (30), and the other end of the elastic telescopic member (60) can be abutted against the test piece (1). 3.根据权利要求2所述的测试治具,其特征在于,所述弹性伸缩件(60)包括弹性伸缩杆(61)以及压合块(62),所述弹性伸缩杆(61)连接在所述测试部(30)和所述压合块(62)之间。3. The test fixture according to claim 2 is characterized in that the elastic telescopic member (60) comprises an elastic telescopic rod (61) and a pressing block (62), and the elastic telescopic rod (61) is connected between the test part (30) and the pressing block (62). 4.根据权利要求3所述的测试治具,其特征在于,所述弹性伸缩杆(61)包括第一杆体、第二杆体和弹性件,所述第一杆体可移动地穿设在所述第二杆体内,所述弹性件设置在所述第二杆体内以向所述第一杆体施加外移的作用力。4. The test fixture according to claim 3 is characterized in that the elastic telescopic rod (61) includes a first rod body, a second rod body and an elastic member, the first rod body is movably inserted into the second rod body, and the elastic member is arranged in the second rod body to apply an outward force to the first rod body. 5.根据权利要求1所述的测试治具,其特征在于,所述测试治具还包括第一导向部(70)和第二导向部(80),所述第一导向部(70)设置在所述基座(10)上,所述第二导向部(80)设置在所述测试部(30)上并与所述第一导向部(70)导向配合。5. The test fixture according to claim 1 is characterized in that the test fixture further comprises a first guide portion (70) and a second guide portion (80), the first guide portion (70) being arranged on the base (10), and the second guide portion (80) being arranged on the test portion (30) and cooperating with the first guide portion (70) for guiding. 6.根据权利要求5所述的测试治具,其特征在于,所述第一导向部(70)和所述第二导向部(80)中的一个为导向销(81),所述第一导向部(70)和所述第二导向部(80)中的另一个为能够与所述导向销(81)插接配合的导向销套(71)。6. The test fixture according to claim 5, characterized in that one of the first guide portion (70) and the second guide portion (80) is a guide pin (81), and the other of the first guide portion (70) and the second guide portion (80) is a guide pin sleeve (71) that can be plugged into and fit with the guide pin (81). 7.根据权利要求1至6中任一项所述的测试治具,其特征在于,所述测试部(30)包括固定块(31)、测试板(32)以及探针平台(33),所述测试板(32)设置在所述固定块(31)与所述探针平台(33)之间,所述固定块(31)与所述驱动部(40)驱动配合,所述探针平台(33)上设置有与所述测试板(32)连接的测试探针(34),所述测试探针(34)朝向所述测试位延伸并伸出于所述探针平台(33)。7. The test fixture according to any one of claims 1 to 6 is characterized in that the test part (30) includes a fixed block (31), a test board (32) and a probe platform (33), the test board (32) is arranged between the fixed block (31) and the probe platform (33), the fixed block (31) is driven and cooperated with the driving part (40), and a test probe (34) connected to the test board (32) is arranged on the probe platform (33), and the test probe (34) extends toward the test position and extends out of the probe platform (33). 8.根据权利要求7所述的测试治具,其特征在于,所述测试治具还包括设置在所述测试位处的测试支撑座(90),所述测试支撑座(90)上设置有与所述测试探针(34)对应的凹槽结构(91),所述凹槽结构(91)用以放置所述待测试件(1)。8. The test fixture according to claim 7 is characterized in that the test fixture also includes a test support seat (90) arranged at the test position, and the test support seat (90) is provided with a groove structure (91) corresponding to the test probe (34), and the groove structure (91) is used to place the test piece (1). 9.根据权利要求8所述的测试治具,其特征在于,所述测试支撑座(90)的上表面设置有多个导向块(92),多个所述导向块(92)围设在所述凹槽结构(91)的边沿处,所述导向块(92)具有朝向所述凹槽结构(91)的导向斜面(921)。9. The test fixture according to claim 8 is characterized in that a plurality of guide blocks (92) are provided on the upper surface of the test support seat (90), the plurality of guide blocks (92) are arranged around the edge of the groove structure (91), and the guide blocks (92) have a guide slope (921) facing the groove structure (91). 10.根据权利要求7所述的测试治具,其特征在于,所述测试治具还包括用于定位所述固定块(31)、所述测试板(32)和所述探针平台(33)的定位销(100);和/或,所述测试治具还包括用于连接所述固定块(31)、所述测试板(32)和所述探针平台(33)的紧固件。10. The test fixture according to claim 7, characterized in that the test fixture further comprises a positioning pin (100) for positioning the fixed block (31), the test board (32) and the probe platform (33); and/or the test fixture further comprises a fastener for connecting the fixed block (31), the test board (32) and the probe platform (33). 11.根据权利要求1至6中任一项所述的测试治具,其特征在于,11. The test fixture according to any one of claims 1 to 6, characterized in that: 所述测试治具还包括极限位置检测组件(110),所述极限位置检测组件(110)包括触发件(111)和感应件(112),所述触发件(111)和所述感应件(112)中的一个设置在所述测试部(30)上,所述触发件(111)和所述感应件(112)中的另一个设置在所述竖向连接部(20)或者所述驱动部(40)上;和/或,The test fixture further comprises an extreme position detection component (110), the extreme position detection component (110) comprising a triggering member (111) and a sensing member (112), one of the triggering member (111) and the sensing member (112) being arranged on the test portion (30), and the other of the triggering member (111) and the sensing member (112) being arranged on the vertical connection portion (20) or the driving portion (40); and/or, 所述测试治具还包括设置在所述驱动部(40)和所述测试部(30)之间的滑动导向结构,所述滑动导向结构包括滑槽以及与所述滑槽滑动配合的滑块,所述滑槽设置在所述测试部(30)和所述驱动部(40)中的一个上,所述滑块设置在所述测试部(30)和所述驱动部(40)中的另一个上。The test fixture also includes a sliding guide structure arranged between the driving part (40) and the testing part (30), the sliding guide structure including a slide groove and a slider slidably matched with the slide groove, the slide groove is arranged on one of the testing part (30) and the driving part (40), and the slider is arranged on the other of the testing part (30) and the driving part (40).
CN202322494118.1U 2023-09-13 2023-09-13 Test fixture Active CN221124643U (en)

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