CN216484326U

CN216484326U - Semiconductor load testing device with data analysis function

Info

Publication number: CN216484326U
Application number: CN202122647096.9U
Authority: CN
Inventors: 李睿; 成树华; 李龙; 蒋中能
Original assignee: Chengdu Fangsheng Technology Co ltd
Current assignee: Chengdu Fangsheng Technology Co ltd
Priority date: 2021-11-01
Filing date: 2021-11-01
Publication date: 2022-05-10
Anticipated expiration: 2031-11-01

Abstract

The utility model discloses a semiconductor load testing device with data analysis, which comprises a workbench, a fixed frame is fixedly arranged on the workbench, a screw rod is rotatably arranged between the fixed frame and the workbench, a connecting plate is fixedly connected on a screw rod seat of the screw rod, the lower end of the connecting plate is provided with a detection head through a connecting rod, a base is fixedly arranged on the workbench, a pressure sensor is arranged on the base, a supporting seat is arranged on the pressure sensor, the supporting seat is provided with a groove, two groups of L-shaped brackets are arranged on the supporting seat in a sliding way, the inner wall of the bracket is provided with the pressing plate in a sliding way, the utility model improves the clamping and limiting effect on the semiconductor during the semiconductor load test, the offset of the semiconductor in the process of pressing down the detection head is reduced to a greater extent, and the precision of the test result is further improved.

Description

Semiconductor load testing device with data analysis function

Technical Field

The utility model relates to the technical field of load testing, in particular to a semiconductor load testing device with data analysis function.

Background

The load test is a test method which respectively applies axial pressure, axial uplift force or horizontal force at the consistent position of the bottom surface elevation of a pile foundation bearing platform step by step according to the use function of the pile, observes the settlement, uplift displacement or horizontal displacement generated by corresponding detection points of the pile along with time, and judges the corresponding vertical compression bearing capacity, vertical uplift bearing capacity or horizontal bearing capacity of the single pile according to the relation (namely Q-S curve) of load and displacement. Furthermore, when a load is applied to a member, the strength properties of the material will also differ if the magnitude of the load is constantly changing periodically, and the stress under such a load is referred to as alternating stress.

In the prior art, a load testing device for a semiconductor has a poor clamping and limiting effect on the semiconductor when testing the load of the semiconductor, and the semiconductor may have position deviation in the process of pressing down a detection head, so that the precision of a test result is reduced, and therefore a semiconductor load testing device with data analysis is required to be provided.

SUMMERY OF THE UTILITY MODEL

The utility model aims to provide a semiconductor load testing device with data analysis, which improves the clamping and limiting effect on a semiconductor during semiconductor load testing, reduces the offset generated by the semiconductor in the process of pressing down a detection head to a greater extent, and further improves the precision of a test result so as to solve the problems in the background art.

In order to achieve the purpose, the utility model provides the following technical scheme: the utility model provides a semiconductor load testing arrangement with data analysis, includes the workstation, fixed mounting has the mount on the workstation, rotate between mount and the workstation and install the lead screw, fixedly connected with connecting plate on the lead screw seat of lead screw, the lower extreme of connecting plate is installed through the connecting rod and is detected the head, fixed mounting has the base on the workstation, install pressure sensor on the base, the last supporting seat that is provided with of pressure sensor, set up flutedly on the supporting seat, slidable mounting has the support of two sets of L shapes on the supporting seat, the inner wall slidable mounting of support has the clamp plate.

Preferably, the lower end of the workbench is fixedly provided with a motor, and one end of an output shaft of the motor is fixedly connected to the end part of the screw rod through a coupler.

Preferably, the lateral part of connecting plate fixedly connected with lantern ring, fixedly connected with stand between mount and the workstation, lantern ring sliding sleeve locates on the stand.

Preferably, a second sliding groove is formed in the supporting seat, a second sliding block is fixedly connected to the lower end of the support, and the second sliding block is slidably mounted inside the second sliding groove.

Preferably, a first sliding groove is formed in the inner wall of the support, a first sliding block is fixedly connected to the side portion of the pressing plate, and the first sliding block is slidably mounted inside the first sliding groove.

Preferably, the pressure plate is rotatably connected with a screw through a bearing, the bracket is provided with a threaded hole, and the screw is rotatably installed inside the threaded hole.

Preferably, one side fixed mounting of mount has display screen and PLC controller, PLC controller respectively with display screen and pressure sensor electric connection.

Compared with the prior art, the utility model has the beneficial effects that:

through the design of the support, the pressing plate and the screw rod, the support is arranged to be an L-shaped support, the support is pushed to enable the two groups of supports to move in opposite directions, the second sliding block is slidably mounted inside the second sliding groove, the second sliding block is arranged to be a sliding block with a trapezoidal section and is prevented from being separated from the second sliding groove in the sliding process, the semiconductor is prevented from abutting against the inner wall of the support, the screw rod drives the pressing plate to move downwards, the pressing plate tightly abuts against the surface of the semiconductor and plays a limiting role for the semiconductor, and the rubber pad is mounted at the bottom of the pressing plate to increase the limiting effect for the semiconductor.

Drawings

FIG. 1 is a schematic front view of the present invention;

FIG. 2 is an enlarged view of the portion A of FIG. 1 according to the present invention;

FIG. 3 is a schematic structural view of the groove, the bracket, the screw, the pressing plate and the second sliding groove of the present invention.

In the figure: 1. a work table; 2. a motor; 3. a screw rod; 4. a display screen; 5. a connecting plate; 6. a collar; 7. a column; 8. a connecting rod; 9. a detection head; 10. a fixed mount; 11. a base; 12. a pressure sensor; 13. a supporting seat; 14. a groove; 15. a support; 16. a screw; 17. pressing a plate; 18. a first slider; 19. a first chute; 20. a second slider; 21. a second runner.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

The same reference numbers in different drawings identify the same or similar elements; it should be further understood that terms such as "first," "second," "third," "upper," "lower," "front," "back," "inner," "outer," "end," "portion," "section," "width," "thickness," "region," and the like are used herein for convenience only and to aid the reader in describing the utility model with reference to the figures, and are not limiting.

Referring to fig. 1-3, the present invention provides a technical solution: a semiconductor load testing device with data analysis comprises a workbench 1, wherein a fixed frame 10 is fixedly installed on the workbench 1, the fixed frame 10 is a U-shaped fixed frame, a lead screw 3 is rotatably installed between the fixed frame 10 and the workbench 1, the lead screw 3 is vertically arranged, a motor 2 is fixedly installed at the lower end of the workbench 1, the motor 2 is a forward and reverse rotating motor, one end of an output shaft of the motor 2 is fixedly connected to the end part of the lead screw 3 through a coupler, and the lead screw 3 is driven to rotate by the motor 2;

a connecting plate 5 is fixedly connected to a screw rod seat of the screw rod 3, the screw rod 3 drives the connecting plate 5 to move up and down, a detection head 9 is mounted at the lower end of the connecting plate 5 through a connecting rod 8, a lantern ring 6 is fixedly connected to the side part of the connecting plate 5, an upright post 7 is fixedly connected between the fixing frame 10 and the workbench 1, the lantern ring 6 is slidably sleeved on the upright post 7, and the lantern ring 6 is driven to slide on the upright post 7 in the process of moving up and down of the connecting plate 5;

a base 11 is fixedly installed on the workbench 1, a pressure sensor 12 is installed on the base 11, a display screen 4 and a PLC controller are fixedly installed on one side of a fixing frame 10, the PLC controller is respectively and electrically connected with the display screen 4 and the pressure sensor 12, a signal conversion module is arranged in the PLC controller, an electric signal transmitted by the pressure sensor 12 can be converted into a digital signal and transmitted to the display screen 4, the display screen 4 can display a change curve of a pressure value received by a semiconductor, a supporting seat 13 is arranged on the pressure sensor 12, a groove 14 is formed in the supporting seat 13, the groove 14 and a detection head 9 are correspondingly arranged, and two groups of L-shaped supports 15 are slidably installed on the supporting seat 13;

the second sliding groove 21 is formed in the supporting seat 13, the second sliding block 20 is fixedly connected to the lower end of the support 15, the second sliding block 20 is slidably mounted inside the second sliding groove 21, the second sliding block 20 is set to be a sliding block with a trapezoidal section, the second sliding block is prevented from being separated from the second sliding groove 21 in the sliding process, the pressing plate 17 is slidably mounted on the inner wall of the support 15, a rubber pad is mounted at the bottom of the pressing plate 17, the limiting effect on a semiconductor is improved, the first sliding groove 19 is formed in the inner wall of the support 15, the first sliding block 18 is fixedly connected to the lateral portion of the pressing plate 17, the first sliding block 18 is slidably mounted inside the first sliding groove 19, the screw rod 16 is rotatably connected to the pressing plate 17 through a bearing, a threaded hole is formed in the support 15, the screw rod 16 is rotatably mounted inside the threaded hole, and the screw rod 16 can drive the pressing plate 17 to move up and down.

In use of the device, a semiconductor to be tested is placed on the support base 13, and the semiconductor is covered on the recess 14, then the supports 15 are pushed, so that the two sets of supports 15 move towards each other, the semiconductor is abutted against the inner walls of the supports 15, then the screw 16 is screwed, the screw 16 drives the pressing plate 17 to move downwards, and the pressing plate 17 tightly abuts against the surface of the semiconductor, the motor 2 is started, the motor 2 drives the screw rod 3 to rotate, the screw rod 3 drives the connecting plate 5 to move downwards, the connecting plate 5 drives the detection head 9 to move downwards through the connecting rod 8, the detection head 9 gradually approaches to the semiconductor, and the semiconductor is pressed downwards all the time, the semiconductor is deformed and bent, at the moment, a change curve of a pressure value applied to the semiconductor is displayed on the display screen 4 until the semiconductor is broken, and the measured pressure value is recorded to be the load of the semiconductor.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.

Claims

1. A semiconductor load testing device with data analysis, comprising a table (1), characterized in that: fixed mounting has mount (10) on workstation (1), it installs lead screw (3) to rotate between mount (10) and workstation (1), fixedly connected with connecting plate (5) on the lead screw seat of lead screw (3), the lower extreme of connecting plate (5) is installed through connecting rod (8) and is detected head (9), fixed mounting has base (11) on workstation (1), install pressure sensor (12) on base (11), be provided with supporting seat (13) on pressure sensor (12), recess (14) have been seted up on supporting seat (13), slidable mounting has support (15) of two sets of L shapes on supporting seat (13), the inner wall slidable mounting of support (15) has clamp plate (17).

2. A semiconductor load testing device with data analysis according to claim 1, characterized in that: the lower extreme fixed mounting of workstation (1) has motor (2), motor (2) output shaft one end passes through shaft coupling fixed connection in the tip of lead screw (3).

3. A semiconductor load testing device with data analysis according to claim 1, characterized in that: the side part of connecting plate (5) fixedly connected with lantern ring (6), fixedly connected with stand (7) between mount (10) and workstation (1), lantern ring (6) sliding sleeve is located on stand (7).

4. A semiconductor load testing device with data analysis according to claim 1, characterized in that: a second sliding groove (21) is formed in the supporting seat (13), a second sliding block (20) is fixedly connected to the lower end of the support (15), and the second sliding block (20) is slidably mounted inside the second sliding groove (21).

5. A semiconductor load testing device with data analysis according to claim 1, characterized in that: first spout (19) have been seted up to the inner wall of support (15), the lateral part fixedly connected with first slider (18) of clamp plate (17), first slider (18) slidable mounting is in the inside of first spout (19).

6. A semiconductor load testing device with data analysis according to claim 1, characterized in that: the pressing plate (17) is rotatably connected with a screw rod (16) through a bearing, the support (15) is provided with a threaded hole, and the screw rod (16) is rotatably installed inside the threaded hole.

7. A semiconductor load testing device with data analysis according to claim 1, characterized in that: one side fixed mounting of mount (10) has display screen (4) and PLC controller, PLC controller respectively with display screen (4) and pressure sensor (12) electric connection.