CN216387146U - Clamp for COS test - Google Patents
Clamp for COS test Download PDFInfo
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- CN216387146U CN216387146U CN202122906538.7U CN202122906538U CN216387146U CN 216387146 U CN216387146 U CN 216387146U CN 202122906538 U CN202122906538 U CN 202122906538U CN 216387146 U CN216387146 U CN 216387146U
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Abstract
The application discloses anchor clamps for COS test. The fixture is suitable for fixing an auxiliary heat sink used for placing and connecting a chip in the COS, wherein the first contact piece comprises a first contact pin and a second contact pin which are arranged at the lower end of the first contact piece, and the bottom surfaces of the first contact pin and the second contact pin are planes; the second contact piece comprises a third contact pin and a fourth contact pin which are arranged at the lower end of the second contact piece, and the bottom surfaces of the third contact pin and the fourth contact pin are planes; the top surface of the heat dissipation plate is used for being connected with the bottom surface of the auxiliary heat sink; one end of the pressing block is connected with the top surfaces of the first contact element and the second contact element, and the pressing block is made of insulating materials; the supporting shoe sets up on the top surface of heating panel, and the other end of briquetting can set up on the supporting shoe with vertical removal. This application circular telegram contact tightness when can promoting the chip test improves the stability of test to test equipment's such as compatible photoelectricity capability test, long-term stability test and life test connection has fine practicality and commonality.
Description
Technical Field
This application belongs to chip test technical field, concretely relates to anchor clamps for COS test.
Background
COS (Chip on Submount, a high power semiconductor laser Chip with an auxiliary heat sink) generally performs two types of tests in the performance characterization process: firstly, measuring various parameters of COS, such as threshold current, working voltage, light-emitting power, emergent wavelength, photoelectric conversion efficiency, polarization degree, divergence angle and the like by using photoelectric performance testing equipment, and comprehensively evaluating the photoelectric performance of a chip; and secondly, evaluating the long-term stability and the service life of the chip by using aging test equipment, transmitting current to the COS to enable the COS to continuously work, and evaluating the long-term stability and the service life of the chip product by monitoring, testing and analyzing parameters such as the light-emitting power, the light-emitting wavelength and the like of the chip in a long-time working process.
In addition, because the power ratio of the chip is higher, a large amount of heat energy is generated in the working process, once the temperature exceeds the working upper limit of the chip, the chip can be irreversibly failed, therefore, the bottom of the COS is generally required to be contacted with a metal plate, and the metal plate is cooled by air cooling or water cooling to achieve the purpose of heat dissipation,
there are two problems with the current industry for the above measurements: firstly, along with the light-emitting power of the chip is higher and higher, the corresponding electrode contact requirement is more and more strict, once the electrode contact cannot meet the requirement, if the contact tightness is not enough, or the contact area is changed, the contact resistance can be greatly improved, the electro-optic conversion efficiency is reduced, and simultaneously, a large amount of heat aggregation is brought to cause irreversible damage to the chip; and secondly, related measurement adopts COS as a minimum unit, the COS needs to be disassembled and installed on a clamp or a jig for another test after one test is finished, the COS is extremely easy to be damaged in the disassembling and installing process, such as cavity surface damage or dirt, irreversible damage is caused to a product, the testing efficiency is reduced, and meanwhile, a sample is damaged, so that economic loss is caused.
SUMMERY OF THE UTILITY MODEL
The technical problems that the power-on contact tightness is not enough and an existing clamp does not have universality when a chip is tested can be solved to a certain degree. To this end, the present application provides a fixture for COS testing.
The technical scheme of the application is as follows:
the application provides a anchor clamps for COS test is adapted to and is used for placing and connect the supplementary heat sink of chip in the fixed COS, anchor clamps include:
the first contact piece comprises a first contact pin and a second contact pin which are arranged at the lower end of the first contact piece, the bottom surfaces of the first contact pin and the second contact pin are respectively used for being correspondingly connected with two contact surfaces of the anode of the top surface of the auxiliary heat sink, and the bottom surfaces of the first contact pin and the second contact pin are planes;
the second contact piece comprises a third contact pin and a fourth contact pin which are arranged at the lower end of the second contact piece, the bottom surfaces of the third contact pin and the fourth contact pin are respectively used for being correspondingly connected with the two contact surfaces of the cathode of the top surface of the auxiliary heat sink, and the bottom surfaces of the third contact pin and the fourth contact pin are planes;
the top surface of the heat dissipation plate is used for being connected with the bottom surface of the auxiliary heat sink, and the first contact piece and the second contact piece are oppositely arranged on the heat dissipation plate;
one end of the pressing block is connected with the top surfaces of the first contact piece and the second contact piece, and the pressing block is made of an insulating material;
the supporting block is arranged on the top surface of the heat dissipation plate, and the other end of the pressing block is arranged on the supporting block in a vertically movable mode.
Furthermore, the supporting block is vertically provided with a sliding groove, and the other end of the pressing block is arranged in the sliding groove in a sliding manner.
Further, the clamp further comprises a bolt, a threaded hole is formed in the other end of the pressing block, and the bolt penetrates through the sliding groove and is connected with the threaded hole.
Further, an arc-shaped notch is formed in the lower end of the first contact piece, and the first contact pin and the second contact pin are arranged on two sides of the arc-shaped notch respectively.
Further, an arc-shaped notch is formed in the lower end of the second contact piece, and the third contact pin and the fourth contact pin are arranged on two sides of the arc-shaped notch respectively.
Furthermore, the fixture further comprises two connecting plates, the top surfaces of the first contact element and the second contact element are respectively connected with the bottom surface of one connecting plate, and the connecting plates are made of conductive materials.
Further, an insulating plate is connected between the two connecting plates.
Further, the top surface of connecting plate is connected with the bottom surface of briquetting.
Furthermore, an interface used for being detachably connected with the test equipment is arranged on the connecting plate.
Further, the lower end of the supporting block is welded on the top surface of the heat dissipation plate.
The embodiment of the application has at least the following beneficial effects:
the clamp for the COS test comprises a first contact pin and a second contact pin which are arranged at the lower end of a first contact piece, the bottom surfaces of the first contact pin and the second contact pin are respectively used for being correspondingly connected with two contact surfaces of an anode of the top surface of an auxiliary heat sink, the bottom surfaces of the first contact pin and the second contact pin are planes, the second contact piece comprises a third contact pin and a fourth contact pin which are arranged at the lower end of the second contact piece, the bottom surfaces of the third contact pin and the fourth contact pin are respectively used for being correspondingly connected with two contact surfaces of a cathode of the top surface of the auxiliary heat sink, the bottom surfaces of the third contact pin and the fourth contact pin are planes, and the first contact piece and the second contact piece are oppositely arranged on a heat dissipation plate, so that when a test device is connected with the first contact piece and the second contact piece, the contact areas between the first contact piece and the second contact piece and the auxiliary heat sink are larger, can promote the circular telegram contact compactness when the chip test, and can reduce resistance in order to reduce the temperature, because the top surface of heating panel is connected with supplementary heat sink's bottom surface, the one end of briquetting is connected with the top surface of first contact and second contact, the briquetting is insulating material, the supporting shoe sets up on the top surface of heating panel, the other end of briquetting can set up on the supporting shoe with vertical removal, thereby compress tightly first contact and second contact on supplementary heat sink's top surface through removing the briquetting, with this circular telegram contact compactness when further promoting the chip test.
To sum up, the anchor clamps for COS test that this application shows can promote the circular telegram contact compactness when the chip tests, improves the stability of test, has fine practicality.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a fixture for COS test according to an embodiment of the present disclosure.
Reference numerals:
1-chip; 2-auxiliary heat sink; 3-a first contact; 4-a second contact; 5-a heat dissipation plate; 6-briquetting; 7-a support block; 8-connecting plates; 9-an insulating plate.
Detailed Description
The technical solutions in the embodiments of the present application will be described clearly and completely with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Moreover, the present application may repeat reference numerals and/or letters in the various examples, such repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed. In addition, examples of various specific processes and materials are provided herein, but one of ordinary skill in the art may recognize applications of other processes and/or use of other materials.
The application is described below with reference to specific embodiments in conjunction with the following drawings:
fig. 1 is a fixture for COS test according to an embodiment of the present application, which includes a first contact 3, a second contact 4, a heat dissipation plate 5, a pressing block 6, and a supporting block 7, in combination with fig. 1.
The first contact member 3 in the embodiment of the present application includes a first contact pin and a second contact pin arranged at the lower end thereof, bottom surfaces of the first contact pin and the second contact pin are respectively used for being correspondingly connected with two contact surfaces of an anode on the top surface of the auxiliary heat sink 2, and the bottom surfaces of the first contact pin and the second contact pin are planes; the second contact element 4 comprises a third contact pin and a fourth contact pin which are arranged at the lower end of the second contact element, the bottom surfaces of the third contact pin and the fourth contact pin are respectively used for being correspondingly connected with two contact surfaces of the cathode of the top surface of the auxiliary heat sink 2, and the bottom surfaces of the third contact pin and the fourth contact pin are planes; the top surface of the heat dissipation plate 5 is used for being connected with the bottom surface of the auxiliary heat sink 2, and the first contact piece 3 and the second contact piece 4 are oppositely arranged on the heat dissipation plate 5; one end of the pressing block 6 is connected with the top surfaces of the first contact element 3 and the second contact element 4, and the pressing block 6 is made of insulating materials; the supporting block 7 is provided on the top surface of the heat radiating plate 5, and the other end of the press block 6 is vertically movably provided on the supporting block 7.
Specifically, referring to fig. 1, since the first contact member 3 includes a first contact leg and a second contact leg disposed at a lower end thereof, bottom surfaces of the first contact leg and the second contact leg are respectively used for corresponding connection with two contact surfaces of an anode of the top surface of the auxiliary heat sink 2, the bottom surfaces of the first contact leg and the second contact leg are flat surfaces, the second contact member 4 includes a third contact leg and a fourth contact leg disposed at a lower end thereof, the bottom surfaces of the third contact leg and the fourth contact leg are respectively used for corresponding connection with two contact surfaces of a cathode of the top surface of the auxiliary heat sink 2, the bottom surfaces of the third contact leg and the fourth contact leg are flat surfaces, the first contact member 3 and the second contact member 4 are oppositely disposed on the heat dissipation plate 5, so that when a test apparatus is connected with the first contact member 3 and the second contact member 4, a large contact area is provided between the first contact member 3 and the second contact member 4 and the auxiliary heat sink 2, can promote the circular telegram contact compactness when chip 1 tests, and can reduce resistance in order to reduce the temperature, because the top surface of heating panel 5 is connected with supplementary heat sink 2's bottom surface, the one end of briquetting 6 is connected with the top surface of first contact 3 and second contact 4, briquetting 6 is insulating material, supporting shoe 7 sets up on heating panel 5's top surface, the other end of briquetting 6 can set up on supporting shoe 7 with vertical removal, thereby compress tightly first contact 3 and second contact 4 on supplementary heat sink 2's top surface through removing briquetting 6, with this circular telegram contact compactness when further promoting chip 1 test.
In this application embodiment, supporting shoe 7 can be provided with the spout along vertical, and the other end of briquetting 6 can slide and set up in the spout, certainly, also can adopt other modes to realize the vertical migration of the other end of briquetting 6 on supporting shoe 7, for example the other end of briquetting 6 can overlap and locate on supporting shoe 7 in order to realize vertical migration, and this application embodiment does not do the restriction to this.
Further, the clamp can further comprise a bolt, the other end of the pressing block 6 can be provided with a threaded hole, the bolt penetrates through the sliding groove to be connected with the threaded hole, so that the pressing block 6 is ensured to be fixed on the supporting block 7 by screwing the bolt after the first contact element 3 and the second contact element 4 are tightly pressed on the top surface of the auxiliary heat sink 2, and the power-on contact tightness is further improved.
In the embodiment of the application, because the chip 1 is installed on the auxiliary heat sink 2, the anode and the cathode on the auxiliary heat sink 2 are distributed on two sides of the chip 1 in the length direction, and the connecting lines for connecting the auxiliary heat sink 2 are also arranged on two sides of the chip 1 in the length direction, therefore, the connecting lines need to be avoided when the lower ends of the first contact element 3 and the second contact element 4 are connected with the auxiliary heat sink 2, and only the contact surfaces at two ends of the chip 1 in the length direction are connected, so as to avoid damaging the connection of the chip 1 on the auxiliary heat sink 2.
Further, with reference to fig. 1, an arc-shaped notch may be formed in the lower end of the first contact element 3, the first contact pin and the second contact pin are respectively disposed on two sides of the arc-shaped notch of the first contact element 3, the arc-shaped notch may be formed in the lower end of the second contact element 4, the third contact pin and the fourth contact pin are respectively disposed on two sides of the arc-shaped notch of the second contact element 4, of course, the avoiding notch at the lower end of the first contact element 3 and the lower end of the second contact element 4 may be disposed in other shapes, such as a triangle, a rectangle, etc., which is not limited in the embodiment of the present application.
Further, with reference to fig. 1, the fixture further includes two connecting plates 8 and an insulating plate 9, top surfaces of the first contact 3 and the second contact 4 are respectively connected to a bottom surface of one connecting plate 8, the connecting plate 8 is made of a conductive material, the insulating plate 9 is connected between the two connecting plates 8, and a top surface of the connecting plate 8 is connected to a bottom surface of the pressing block 6, so that the first contact 3, the second contact 4, the two connecting plates 8 and the insulating plate 9 are fixed as a whole, and the tightness of electrical contact is improved.
With reference to fig. 1, the connection board 8 is provided with an interface for detachable connection with a testing device, so that electrodes of different testing devices can be connected to the first contact member 3 and the second contact member 4, for example, a device for testing photoelectric performance, a device for testing long-term stability and a device for testing service life, and the universality of the fixture is realized.
In this application embodiment, the electrode of the testing device may be provided with an alligator clip for clamping an interface on the connecting plate 8, and of course, the electrode of the testing device may also be provided with a connection mode in which a plug is used for inserting an interface on the connecting plate 8, and this application embodiment is not limited thereto.
In the embodiment of the present application, the lower end of the supporting block 7 may be welded on the top surface of the heat dissipation plate 5, and of course, the supporting block 7 and the heat dissipation plate 5 may also be integrally formed, which is not limited in the embodiment of the present application.
To sum up, the anchor clamps for COS test that this application shows can promote the circular telegram contact compactness when the chip tests, improves the stability of test to compatible test equipment's such as photoelectric property test, long-term stability test and life test connection has fine practicality and commonality.
In this application, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise direct contact of the first and second features, or may comprise contact of the first and second features not directly but through another feature in between. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
In the description of the present application, it is to be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise" indicate orientations or positional relationships based on the orientation or positional relationships illustrated in the drawings, and are used merely for convenience in describing the present application and for simplicity in description, and do not indicate or imply that the referenced device or element must have a particular orientation, be constructed in a particular orientation, and be operated, and therefore should not be considered as limiting the present application.
It should be noted that all the directional indications in the embodiments of the present application are only used to explain the relative position relationship, the motion situation, and the like between the components in a certain posture, and if the certain posture is changed, the directional indication is changed accordingly.
In this application, unless expressly stated or limited otherwise, the terms "connected," "secured," and the like are to be construed broadly, and for example, "secured" may be a fixed connection, a removable connection, or an integral part; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as appropriate.
In addition, descriptions in this application as to "first", "second", etc. are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicit to the number of technical features indicated. Thus, features defined as "first", "second", may explicitly or implicitly include one or more of the described features. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.
In the description herein, reference to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples described in this specification can be combined and combined by those skilled in the art.
In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present application.
While embodiments of the present application have been shown and described, it will be understood by those of ordinary skill in the art that: numerous changes, modifications, substitutions and alterations can be made to the embodiments without departing from the principles and spirit of the application, the scope of which is defined by the claims and their equivalents.
Claims (10)
1. A fixture for COS test adapted to hold an auxiliary heat sink (2) in the COS for placement and attachment of a chip (1), said fixture comprising:
the first contact piece (3) comprises a first contact pin and a second contact pin which are arranged at the lower end of the first contact piece, the bottom surfaces of the first contact pin and the second contact pin are respectively used for being correspondingly connected with two contact surfaces of an anode on the top surface of the auxiliary heat sink (2), and the bottom surfaces of the first contact pin and the second contact pin are planes;
the second contact piece (4) comprises a third contact pin and a fourth contact pin which are arranged at the lower end of the second contact piece, the bottom surfaces of the third contact pin and the fourth contact pin are respectively used for being correspondingly connected with the two contact surfaces of the cathode of the top surface of the auxiliary heat sink (2), and the bottom surfaces of the third contact pin and the fourth contact pin are planes;
the top surface of the heat dissipation plate (5) is used for being connected with the bottom surface of the auxiliary heat sink (2), and the first contact piece (3) and the second contact piece (4) are oppositely arranged on the heat dissipation plate (5);
a pressing block (6), wherein one end of the pressing block (6) is connected with the top surfaces of the first contact element (3) and the second contact element (4), and the pressing block (6) is made of an insulating material;
and the supporting block (7) is arranged on the top surface of the heat dissipation plate (5), and the other end of the pressing block (6) is arranged on the supporting block (7) in a vertically movable manner.
2. The fixture for COS test as recited in claim 1, wherein the supporting block (7) is vertically provided with a sliding slot, and the other end of the pressing block (6) is slidably arranged in the sliding slot.
3. The clamp for the COS test as recited in claim 2, wherein the clamp further comprises a bolt, a threaded hole is formed at the other end of the pressing block (6), and the bolt penetrates through the sliding groove and is connected with the threaded hole.
4. The fixture for testing COS as claimed in claim 1, wherein the lower end of the first contact member (3) is formed with an arc-shaped notch, and the first contact pin and the second contact pin are respectively disposed at both sides of the arc-shaped notch.
5. The fixture for testing COS as claimed in claim 1, wherein the second contact member (4) has an arc-shaped notch formed at a lower end thereof, and the third contact pin and the fourth contact pin are respectively disposed at both sides of the arc-shaped notch.
6. A jig for COS test as set forth in claim 1, further comprising two connection plates (8), wherein the top surfaces of said first contact (3) and said second contact (4) are each connected to the bottom surface of one of said connection plates (8), respectively, and said connection plates (8) are of a conductive material.
7. A fixture for COS test according to claim 6, wherein an insulating plate (9) is connected between two of the connection plates (8).
8. The jig for COS test as claimed in claim 6, wherein the top surface of the connection plate (8) is connected with the bottom surface of the pressing block (6).
9. A fixture for COS test according to claim 6, wherein the connection plate (8) is provided with an interface for detachable connection with a test device.
10. The jig for COS test as claimed in any one of claims 1 to 9, wherein the lower end of the supporting block (7) is welded on the top surface of the heat radiating plate (5).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122906538.7U CN216387146U (en) | 2021-11-23 | 2021-11-23 | Clamp for COS test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122906538.7U CN216387146U (en) | 2021-11-23 | 2021-11-23 | Clamp for COS test |
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| Publication Number | Publication Date |
|---|---|
| CN216387146U true CN216387146U (en) | 2022-04-26 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202122906538.7U Active CN216387146U (en) | 2021-11-23 | 2021-11-23 | Clamp for COS test |
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| CN (1) | CN216387146U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117147920A (en) * | 2023-08-29 | 2023-12-01 | 武汉永力睿源科技有限公司 | Chip clamp for aging test |
-
2021
- 2021-11-23 CN CN202122906538.7U patent/CN216387146U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117147920A (en) * | 2023-08-29 | 2023-12-01 | 武汉永力睿源科技有限公司 | Chip clamp for aging test |
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