CN216313046U

CN216313046U - Probe row structure for testing multi-wafer battery piece

Info

Publication number: CN216313046U
Application number: CN202122558467.6U
Authority: CN
Inventors: 不公告发明人
Original assignee: Suzhou Sanxi Intelligent Technology Co ltd
Current assignee: Suzhou Sanxi Intelligent Technology Co ltd
Priority date: 2021-10-22
Filing date: 2021-10-22
Publication date: 2022-04-15
Anticipated expiration: 2031-10-22

Abstract

The utility model discloses a probe row structure for testing a multi-segment battery piece, which consists of an insulating substrate and probe row units arranged on the insulating substrate, wherein each probe row unit consists of a plurality of probes inserted on the insulating substrate at intervals and a conductive layer positioned on the surface of the insulating substrate and electrically communicated with the probes, and a plurality of probe row units are distributed on the insulating substrate at intervals along the length direction in an insulating manner. According to the utility model, the plurality of probe row units are arranged on the insulating substrate at intervals along the length direction in an insulating manner, so that the multi-segment cell can be tested at one time, and the testing efficiency of the multi-segment cell is improved.

Description

Probe row structure for testing multi-wafer battery piece

Technical Field

The utility model relates to the technical field of solar cell measurement, in particular to a probe row structure of an IV (current and voltage) tester and an EL (electroluminescence) tester.

Background

At present, in the conventional battery piece production line, the battery piece is that the whole piece carries out the IV test, and current a probe row once can only test a slice battery piece, and when needs test the many slices battery piece, needs the test of a slice, can not once accomplish the test of many slices battery piece simultaneously, and efficiency of software testing is than low.

SUMMERY OF THE UTILITY MODEL

The utility model aims to solve the technical problem of providing a probe row structure for simultaneously testing multi-piece battery pieces at one time so as to overcome the defects in the prior art.

In order to solve the technical problems, the utility model adopts the following technical scheme:

the utility model provides a test probe row structure of many sub-chip battery pieces, by insulating substrate with establish probe row unit on insulating substrate constitutes, probe row unit by many interval cartridge probe on insulating substrate and be located insulating substrate surface and with the electrically conductive communicating conducting layer of probe constitutes which characterized in that: and a plurality of probe row units are distributed on the insulating substrate along the length direction at intervals in an insulating manner.

The probe row unit further includes a wiring portion on the conductive layer. The wiring portion facilitates connection of the probe row unit with a wire.

The probe is divided into a current probe and a voltage probe, the conducting layers are divided into a current conducting layer and a voltage conducting layer which are respectively arranged on two sides of the insulating substrate, the current conducting layer is in conductive communication with the current probe, and the voltage conducting layer is in conductive communication with the voltage probe. Such a probe bank structure can simultaneously measure and collect current and voltage of the battery cell.

In an embodiment of the present invention, two probe row units are distributed on the insulating substrate at intervals along the length direction, and the wire connecting portions are located at positions close to the ends of the insulating substrate.

In another embodiment of the present invention, three probe row units are distributed on the insulating substrate along the length direction at intervals.

In the utility model, the conducting layer is in conducting communication with each probe through the conducting hole corresponding to each probe position, the conducting layer is copper foil, the wiring part is a bonding pad or a plug connector, and the conducting plate formed by the insulating substrate and the conducting layer is made of a PCB (printed Circuit Board).

By adopting the technical scheme, the plurality of probe row units are distributed on the insulating substrate at intervals along the length direction in an insulating way, so that the test of the multi-segment battery piece can be completed at one time, and the test efficiency of the multi-segment battery piece is improved.

Drawings

The utility model is described in detail below with reference to the following figures:

FIG. 1 is a schematic front view of example 1;

FIG. 2 is a schematic reverse view of example 1;

FIG. 3 is a schematic front view of example 2;

FIG. 4 is a schematic reverse view of example 2.

Detailed Description

Since the whole battery piece is generally mainly cut into two sub-pieces and three sub-pieces, the probe row structure for testing the two sub-pieces of the battery piece and the probe row structure for testing the three sub-pieces of the battery piece are described in detail in the embodiment.

Example 1

The present embodiment is a probe row structure for testing two divided battery pieces, as shown in fig. 1 and 2, including an insulating substrate 100 and two probe units 200 distributed on the insulating substrate 100 along the length direction in an insulating and spacing manner. The two probe units 200 are equal in length.

The insulating substrate 100 is divided into a body portion 110 at the middle and end portions 120 at both ends. The main body 110 is provided with a probe unit 200, and the end 120 is fixedly mounted on a test apparatus.

Each probe unit 200 includes a probe and a conductive layer, which is a copper foil.

A plurality of probe holes extending from the upper end surface to the lower end surface are distributed on the insulating substrate 100 along the length direction, and the probes are inserted into the probe holes.

In order to simultaneously test the current and voltage of the battery cell, the probe 200 is divided into a current probe 211 and a voltage probe 212, and the conductive layer is divided into a current conductive layer 221 and a voltage conductive layer 222 which are separately provided on the front surface of the insulating substrate.

The current probes 211 in each probe unit 200 are equally spaced, the voltage probes 212 are equally spaced, and the number of voltage probes 211 is less than that of current probes 211.

Conductive holes 230 are further distributed on the insulating substrate corresponding to the probes, the conductive holes 230 are through holes, and conductive copper foils are arranged in the through holes to realize conductive communication between the probes and the conductive layers. In this embodiment, the conductive vias 230 are divided into two rows, one row for electrically connecting the current conductive layer 221 to the current probe 211 but spaced apart from the voltage probe 212, and the other row for electrically connecting the voltage conductive layer 222 to the voltage probe 212 but spaced apart from the current probe 211.

The two probe units 200 are insulated and spaced between the conductive layers on the same surface. In the present embodiment, the insulation interval means that the corresponding insulation interval position 400 is not covered with the conductive layer.

Each conductive layer is provided with a pad 240 adjacent to the end 120. Of course, the pad 240 may be replaced with a plug.

For the convenience of manufacture, the conductive plate formed by the insulating substrate and the conductive layer is directly manufactured by adopting a PCB with two conductive surfaces, then the surface is provided with a conductive hole and the end surface is provided with a probe hole, and insulation treatment is carried out at each insulation interval position as described above.

Example 2

As shown in fig. 3 and 4, in this embodiment, three probe units are arranged on an insulating substrate at equal intervals in the length direction. The three probe units 200 are equal in length.

The bonding pads of one probe unit are positioned at one end of the insulating substrate, and the bonding pads of the other two probe units are positioned at the other end of the insulating substrate. To achieve such a structure, in the middle probe cell, the current conducting layer and the voltage conducting layer each have an extension 501 extending toward the end of the insulating substrate, so that the pad of the middle probe cell can also be located near the end 120 of the insulating substrate.

In order to realize that the area of the current conducting layer is larger than that of the voltage conducting layer in the same probe unit, the resistance of the current conducting layer is relatively small, and the current collection is more facilitated. In the present embodiment, the voltage conductive layer of the left-side probe unit, the voltage conductive layer of the middle probe unit, and the current conductive layer of the right-side probe unit are located on the same plane of the insulating substrate (i.e., the front surface of the insulating substrate in the present embodiment); the current conducting layer of the left probe unit, the current conducting layer of the middle probe unit, and the voltage conducting layer of the right probe unit are located on the other side of the insulating substrate (i.e., the opposite side of the insulating substrate).

According to the utility model, the plurality of probe row units are arranged on the insulating substrate at intervals along the length direction in an insulating manner, so that the multi-segment cell can be tested at one time, and the testing efficiency of the multi-segment cell is improved.

However, those skilled in the art should realize that the above embodiments are illustrative only and not limiting to the present invention, and that changes and modifications to the above described embodiments are intended to fall within the scope of the appended claims, provided they fall within the true spirit of the present invention.

Claims

1. The utility model provides a test probe row structure of many sub-chip battery pieces, by insulating substrate with establish probe row unit on insulating substrate constitutes, probe row unit by many interval cartridge probe on insulating substrate and be located insulating substrate surface and with the electrically conductive communicating conducting layer of probe constitutes which characterized in that: and a plurality of probe row units are distributed on the insulating substrate along the length direction at intervals in an insulating manner.

2. The probe row structure for testing a multi-segmented battery piece according to claim 1, wherein: the probe row unit further includes a wiring portion on the conductive layer.

3. The probe row structure for testing multi-slice battery slices according to claim 2, wherein: the probe is divided into a current probe and a voltage probe, the conducting layers are divided into a current conducting layer and a voltage conducting layer which are respectively arranged on two sides of the insulating substrate, the current conducting layer is in conductive communication with the current probe, and the voltage conducting layer is in conductive communication with the voltage probe.

4. The probe row structure for testing multi-slice battery slices according to claim 2, wherein: the wiring portions are located at positions close to the ends of the insulating substrate.

5. The probe row structure for testing multi-slice battery slices as claimed in claim 3, wherein: two probe row units are distributed on the insulating substrate along the length direction at intervals in an insulating mode.

6. The probe row structure for testing multi-slice battery slices as claimed in claim 3, wherein: three probe row units are distributed on the insulating substrate along the length direction at intervals in an insulating mode.

7. The probe row structure for testing a multi-segmented battery piece according to claim 1, wherein: the conducting layer is in conducting communication with each probe through the conducting hole corresponding to each probe position.

8. The probe row structure for testing multi-slice battery slices according to claim 2, wherein: the conducting layer is a copper foil, and the wiring portion is a bonding pad or a plug connector.

9. The probe row structure for testing multi-slice battery slices as claimed in claim 3, wherein: in the same probe unit, the area of the current conducting layer is larger than that of the current conducting layer.

10. The probe row structure for testing multi-segment battery pieces according to claim 6, wherein: in the same probe unit, the area of the current conducting layer is larger than that of the current conducting layer, and the voltage conducting layer of the middle probe unit, the voltage conducting layer of one probe unit and the current conducting layer of the other probe unit are positioned on the same surface of the insulating substrate.