CN216209352U

CN216209352U - Probe module and crimping tool

Info

Publication number: CN216209352U
Application number: CN202122600271.9U
Authority: CN
Inventors: 王希; 浦佳; 杨述威
Original assignee: Wuhan Jingce Electronic Group Co Ltd; Wuhan Jingli Electronic Technology Co Ltd
Current assignee: Wuhan Jingce Electronic Group Co Ltd; Wuhan Jingli Electronic Technology Co Ltd
Priority date: 2021-10-27
Filing date: 2021-10-27
Publication date: 2022-04-05
Anticipated expiration: 2031-10-27

Abstract

The utility model discloses a probe module and a crimping jig, and belongs to the technical field of probes. The probe module comprises a fixing component and a plurality of thin-sheet probes. The fixing component comprises a mold core fixing seat, and a plurality of slice probes are inserted into the mold core fixing seat at intervals in parallel. Each slice probe all includes body, at least one first conduction portion and at least one second conduction portion, and each first conduction portion and each second conduction portion are located the both ends of corresponding body respectively, and each first conduction portion and each second conduction portion protrusion mold core fixing base respectively arrange, to two arbitrary adjacent slice probes, first conduction portion and second conduction portion dislocation arrangement respectively. The probe module provided by the embodiment of the utility model can increase the arrangement distance between two ends of the thin-sheet probe, thereby increasing the distance between a product and test points of a PCB/FPC and the like and reducing the processing difficulty of the product and the PCB/FPC.

Description

Probe module and crimping tool

Technical Field

The utility model belongs to the technical field of probes, and particularly relates to a probe module and a crimping jig.

Background

The panel, integrated circuit, products such as semiconductor, in order to guarantee the product quality, can carry on various tests in the course of production, in these test processes, need use various crimping units, the test point of the probe module one end contact product on these crimping units, the test point on the other end contact PCB/FPC etc., PCB/FPC etc. are connected with other transmission units or test equipment again, thus realize the conduction to the product.

The degree that becomes more and more high of present crimping unit is more and more refined, and a plurality of thin slice probes in the probe module are arranged along the straight line for the interval of thin slice probe is less, leads to product and PCB FPC etc. corresponding test point interval less, has increased product and PCB FPC's the processing degree of difficulty.

SUMMERY OF THE UTILITY MODEL

Aiming at the defects or the improvement requirements of the prior art, the utility model provides a probe module and a crimping jig, aiming at increasing the arrangement distance between two ends of a slice probe, so that the distance between a product and test points of a PCB/FPC and the like is increased, and the processing difficulty of the product and the PCB/FPC is reduced.

In a first aspect, the present invention provides a probe module, which includes a fixing member and a plurality of thin-sheet probes;

the fixing component comprises a die core fixing seat, and a plurality of sheet probes are inserted into the die core fixing seat in parallel at intervals;

each slice probe comprises a body, at least one first conduction part and at least one second conduction part, each first conduction part and each second conduction part are respectively located at two ends of the corresponding body, each first conduction part and each second conduction part respectively protrude out of the die core fixing seat to be arranged, and for any two adjacent slice probes, the first conduction parts and the second conduction parts are respectively arranged in a staggered mode.

Optionally, the die core fixing seat includes a fixing seat and a cover plate, the fixing seat and the cover plate are detachably connected together, the cover plate has a plurality of through holes, the body of each sheet probe is inserted into the fixing seat, and the second conduction portion of each sheet probe passes through the corresponding through hole.

Optionally, the fixing seat includes a seat body and an insertion block, the seat body and the cover plate are detachably connected together, the insertion block is interposed between the seat body and the cover plate, and the plurality of bodies are all inserted into the insertion block.

Optionally, the insert block includes a first U-shaped housing and a second U-shaped housing, the first U-shaped housing and the second U-shaped housing respectively have a plurality of positioning slots arranged at intervals, one side of each body is inserted into one of the positioning slots of the first U-shaped housing, the other side of each body is inserted into one of the positioning slots of the second U-shaped housing, and the first U-shaped housing and the second U-shaped housing are sandwiched between the seat body and the cover plate.

Optionally, the insert block includes a plurality of spacers, a first U-shaped housing and a second U-shaped housing, two side edges of each spacer are respectively inserted into the first U-shaped housing and the second U-shaped housing, each body is clamped between two adjacent spacers, and the first U-shaped housing and the second U-shaped housing are clamped between the seat body and the cover plate.

Optionally, a plurality of connecting screws are inserted into the cover plate to connect the base.

Optionally, the fixing assembly further comprises a floating plate, the floating plate and the die core fixing seat are connected together through a spring, and the floating plate is provided with a jack which is arranged opposite to the first conduction parts.

Optionally, the mold core fixing seat is provided with a guide rod which is vertically arranged, the guide rod penetrates through the floating plate, and the top of the guide rod is provided with a limiting sleeve which limits the floating plate.

Optionally, a plurality of magnets for attracting the connectors of the products are inserted on the floating plate, and the plurality of magnets are arranged at intervals along the floating plate.

In a second aspect, the present invention provides a crimping jig, which includes the probe module according to the first aspect.

The technical scheme provided by the embodiment of the utility model has the following beneficial effects:

for the probe module provided by the embodiment of the utility model, the plurality of sheet probes are inserted into the die core fixing seat in parallel at intervals, so that the sheet probes are mutually independent. And each first conduction part and each second conduction part are respectively positioned at two ends of the corresponding body, and each first conduction part and each second conduction part respectively protrude out of the mold core fixing seat for arrangement, so that the top of the sheet probe is used for communicating a test point of a product, and the bottom of the sheet probe can be used for connecting a test point of a PCB/FPC.

Further, for any two adjacent thin slice probes, the first conduction part and the second conduction part are arranged in a staggered mode respectively, so that the first conduction part or the second conduction part can be prevented from being arranged on a straight line, the arrangement distance of the first conduction part and the second conduction part is increased, further test points of products and PCB/FPC and the like are arranged in a staggered mode, the distance between the products and the test points of PCB/FPC and the like can be increased, and the processing difficulty of the products and PCB/FPC is reduced.

That is to say, the probe module provided by the embodiment of the utility model can increase the arrangement space between the two ends of the sheet probe, thereby increasing the space between the product and the test points of the PCB/FPC and the like, and reducing the processing difficulty of the product and the PCB/FPC.

Drawings

Fig. 1 is a schematic structural diagram of a probe module according to an embodiment of the present invention;

FIG. 2 is a schematic diagram of the arrangement of a lamella probe provided by an embodiment of the present invention;

FIG. 3 is a schematic structural diagram of a first wafer probe provided in an embodiment of the present invention;

FIG. 4 is a schematic structural diagram of a second wafer probe provided in the embodiments of the present invention;

FIG. 5 is a schematic structural diagram of a third wafer probe provided in the embodiment of the present invention;

FIG. 6 is an exploded view of a probe module according to an embodiment of the present invention;

fig. 7 is a schematic structural diagram of a first insert block according to an embodiment of the present invention;

FIG. 8 is a schematic structural diagram of a second insert block according to an embodiment of the present invention;

FIG. 9 is a schematic structural diagram of a third insert provided in the embodiments of the present invention;

fig. 10 is an exploded view of a third insert according to an embodiment of the present invention.

The symbols in the drawings represent the following meanings:

1. a fixing assembly; 11. a mold core fixing seat; 111. a fixed seat; 1111. a base body; 1112. inserting a block; 1113. a first U-shaped housing; 1114. a second U-shaped housing; 1115. positioning a groove; 1116. a spacer; 1117. a middle housing; 1118. a via hole; 1119. a nut; 112. a cover plate; 1121. a connecting screw; 12. a floating plate; 121. a spring; 122. a guide bar; 1221. a limiting sleeve; 123. a magnet; 2. a sheet probe; 21. a body; 22. a first conduction part; 23. a second conduction part; 100. and testing the points.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the utility model and are not intended to limit the utility model. In addition, the technical features involved in the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.

Fig. 1 is a schematic structural diagram of a probe module according to an embodiment of the present invention, and as shown in fig. 1, the probe module includes a fixing assembly 1 and a plurality of thin-sheet probes 2.

The fixed component 1 comprises a die core fixing seat 11, and a plurality of sheet probes 2 are inserted in the die core fixing seat 11 at intervals in parallel.

Each slice probe 2 comprises a body 21, at least one first conduction part 22 and at least one second conduction part 23, each first conduction part 22 and each second conduction part 23 are respectively located at two ends of the corresponding body 21, each first conduction part 22 and each second conduction part 23 are respectively protruded out of the die core fixing seat 11 and are arranged, and for any two adjacent slice probes 2, the first conduction parts 22 and the second conduction parts 23 are respectively arranged in a staggered mode.

For the probe module provided by the embodiment of the utility model, the plurality of sheet probes 2 are inserted into the die core fixing seat 11 in parallel at intervals, so that the sheet probes 2 are independent from each other. And each first conduction part 22 and each second conduction part 23 are respectively positioned at two ends of the corresponding body 21, and each first conduction part 22 and each second conduction part 23 respectively protrude out of the mold core fixing seat 11 for arrangement, so that the top of the sheet probe 2 is used for communicating a test point of a product, and the bottom of the sheet probe 2 can be used for connecting a test point of a PCB/FPC.

Further, for any two adjacent sheet probes 2, the first conduction part 22 and the second conduction part 23 are respectively arranged in a staggered manner (see fig. 2), so that the first conduction part 22 or the second conduction part 23 can be prevented from being arranged on a straight line, the arrangement distance between the first conduction part 22 and the second conduction part 23 is increased, further, the test points 100 of a product and a PCB/FPC and the like are arranged in a staggered manner, the distance between the product and the test points 100 of the PCB/FPC and the like can be increased, and the processing difficulty of the product and the PCB/FPC is reduced.

That is to say, the probe module provided by the embodiment of the utility model can increase the arrangement space between the two ends of the sheet probe 2, thereby increasing the space between the product and the test points 100 such as the PCB/FPC and reducing the processing difficulty of the product and the PCB/FPC.

In the present embodiment, the sheet probe 2 has three types, and the first type sheet probe 2 has one first conduction part 22 (located on the right side of the top of the body 21, see fig. 3) and a second conduction part 23 (located on the right side of the bottom of the body 21) for conducting the test signal; the second type wafer probe 2 has a first conduction part 22 (located at the middle of the top of the body 21, see fig. 4) and a second conduction part 23 (located at the left side of the bottom of the body 21) for conducting the test signal; the third type chip probe 2 has 4

first conduction parts

22 and 2 second conduction parts 23 (see fig. 5) for conducting a ground signal.

Fig. 6 is an exploded schematic view of a probe module according to an embodiment of the present invention, and as shown in fig. 6, the die core holder 11 includes a holder 111 and a cover plate 112, the holder 111 and the cover plate 112 are detachably connected together, the cover plate 112 has a plurality of through holes, the body 21 of each thin-sheet probe 2 is inserted into the holder 111, and the second conduction portion 23 of each thin-sheet probe 2 passes through the corresponding through hole.

In the above embodiment, the cover plate 112 has a limiting function for the plurality of sheet probes 2 inserted into the fixing base 111, and prevents the sheet probes 2 from falling downward.

Specifically, the fixing base 111 includes a base 1111 and an insertion block 1112, the base 1111 and the cover 112 are detachably connected together, the insertion block 1112 is interposed between the base 1111 and the cover 112, and the plurality of bodies 21 are all inserted into the insertion block 1112.

In the above embodiment, the socket 1112 can be fixed by the connection between the base 1111 and the cover plate 112, and the plurality of chip probes 2 can be fixed.

Illustratively, the first conduction part 22 penetrates through the seat body 1111.

Illustratively, a plurality of connection screws 1121 are inserted into the cover plate 112 to connect the housing 1111, so that the cover plate 112 and the housing 1111 can be assembled. When the slice probe 2 needs to be replaced, the limit of the connection screw 1121 is released, the insertion block 1112 is removed, and then the slice probe 2 is taken out, so that the slice probe 2 can be conveniently detached.

In a first implementation of the utility model: fig. 7 is a schematic structural view of a first insert block according to an embodiment of the present invention, and as shown in fig. 7, a plurality of spacers 1116 are detachably inserted into an insert block 1112, each body 21 is interposed between two adjacent spacers 1116, and the first conduction portion 22 of each sheet probe 2 passes through the through hole 1118 of the insert block 1112.

In a second implementation of the utility model: fig. 8 is a schematic structural diagram of a second insert block according to an embodiment of the present invention, as shown in fig. 8, the insert block 1112 includes a first U-shaped housing 1113 and a second U-shaped housing 1114, the first U-shaped housing 1113 and the second U-shaped housing 1114 respectively have a plurality of positioning slots arranged at intervals, one side 1115 of each body 21 is inserted into one positioning slot 1115 of the first U-shaped housing 1113, the other side of each body 21 is inserted into one positioning slot 1115 of the second U-shaped housing 1114, and the first U-shaped housing 1113 and the second U-shaped housing 1114 are inserted between the base body 1111 and the cover plate 112.

In the above embodiment, the first U-shaped housing 1113 and the second U-shaped housing 1114 can easily insert and fix the sheet probe 2, and the through hole 1118 does not need to be additionally provided in the insert 1112.

Illustratively, the first U-shaped housing 1113 and the second U-shaped housing 1114 form a "mouth" shaped structure. The insert block 1112 further includes a middle housing 1117, the middle housing 1117 is sandwiched between the first U-shaped housing 1113 and the second U-shaped housing 1114, and both sides of the middle housing 1117 are respectively provided with a plurality of positioning slots 1115, so that one side of each body 21 of one group of sheet probes 2 is inserted into the positioning slot 1115 of the first U-shaped housing 1113, and the other side of each body 21 of one group of sheet probes 2 is inserted into the positioning slot 1115 of the middle housing 1117. And both side edges of each body 21 of the other set of sheet probes 2 are respectively inserted into positioning grooves 1115 of the second U-shaped housing 1114 and positioning grooves 1115 of the middle housing 1117. The arrangement of two sets of laminar probes 2 can also be achieved simultaneously.

In a third implementation of the utility model: fig. 9 is a schematic structural diagram of a third insert block according to an embodiment of the present invention, fig. 10 is an exploded schematic view of the third insert block according to the embodiment of the present invention, and referring to fig. 9 and 10, the insert block 1112 includes a plurality of spacers 1116, a first U-shaped housing 1113, and a second U-shaped housing 1114, both side edges of each spacer 1116 are respectively inserted into the first U-shaped housing 1113 and the second U-shaped housing 1114, each body 21 is interposed between two adjacent spacers 1116, and the first U-shaped housing 1113 and the second U-shaped housing 1114 are interposed between the base body 1111 and the cover plate 112.

In the above embodiment, the fixing of the thin-plate probe 2 can also be easily achieved by inserting a plurality of spacers 1116.

Similarly, the insert 1112 also includes an intermediate housing 1117.

The thin-chip probe 2 has a small thickness and is smaller than the spacer 1116, and therefore, the positioning groove 1115 is difficult to process, and the positioning groove into which the spacer 1116 is inserted is difficult to process, which results in a lower cost of the present embodiment.

Referring again to fig. 6, the fixing assembly 1 further includes a floating plate 12, the floating plate 12 and the core holder 11 are connected together by a spring 121, and the floating plate 12 has insertion holes therein, which are disposed opposite to the plurality of first conduction parts 22.

In the above embodiment, the floating plate 12 serves as a buffer for the connector of the product, and prevents the sheet probe 2 from being bent due to an excessive force.

Illustratively, a connector of a product is placed on the floating plate 12, the connector faces the jack, and the first conduction part 22 conducts with the connector through the jack during crimping.

Illustratively, the core holder 11 has a vertically arranged guide rod 122, the guide rod 122 penetrates through the floating plate 12, and the top of the guide rod 122 has a position-limiting sleeve 1221 for limiting the floating plate 12.

In the above embodiment, the guide rods 122 guide the floating of the floating plate 12, and the stopper 1221 prevents the floating plate 12 from being detached from the guide rods 122.

Illustratively, the housing 1111 has a nut 1119 thereon, and the guide rod 122 is inserted into the nut 1119 and threadedly engaged with the nut 1119.

Illustratively, a plurality of magnets 123 for attracting the connectors of the products are inserted on the floating plate 12, and the plurality of magnets 123 are arranged at intervals along the floating plate 12.

It is easy to understand that the magnetic steel sheet on the connector of the product can effectively prevent the connector from tilting by attracting the steel sheet by the magnet 123.

The embodiment of the utility model also provides a crimping jig which comprises the probe module.

It will be understood by those skilled in the art that the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the utility model, and that any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the present invention.

Claims

1. A probe module, characterized in that the probe module comprises a fixing component (1) and a plurality of thin-sheet probes (2);

the fixing component (1) comprises a mold core fixing seat (11), and a plurality of sheet probes (2) are parallelly inserted into the mold core fixing seat (11) at intervals;

each thin-sheet probe (2) comprises a body (21), at least one first conduction part (22) and at least one second conduction part (23), each first conduction part (22) and each second conduction part (23) are located at two ends of the corresponding body (21), each first conduction part (22) and each second conduction part (23) protrude out of the die core fixing seat (11) to be arranged, and for any two adjacent thin-sheet probes (2), the first conduction parts (22) and the second conduction parts (23) are arranged in a staggered mode.

2. The probe module as claimed in claim 1, wherein the core holder (11) comprises a holder (111) and a cover plate (112), the holder (111) and the cover plate (112) are detachably connected together, the cover plate (112) has a plurality of through holes, the body (21) of each wafer probe (2) is inserted into the holder (111), and the second conduction portion (23) of each wafer probe (2) passes through the corresponding through hole.

3. The probe module as claimed in claim 2, wherein the fixing base (111) comprises a base body (1111) and an insert block (1112), the base body (1111) and the cover plate (112) are detachably connected together, the insert block (1112) is sandwiched between the base body (1111) and the cover plate (112), and the plurality of bodies (21) are inserted into the insert block (1112).

4. A probe module according to claim 3, wherein the insert block (1112) comprises a first U-shaped housing (1113) and a second U-shaped housing (1114), the first U-shaped housing (1113) and the second U-shaped housing (1114) respectively have a plurality of positioning slots (1115) arranged at intervals, one side of each body (21) is inserted into one of the positioning slots (1115) of the first U-shaped housing (1113), the other side of each body (21) is inserted into one of the positioning slots (1115) of the second U-shaped housing (1114), and the first U-shaped housing (1113) and the second U-shaped housing (1114) are clamped between the housing body (1111) and the cover plate (112).

5. A probe module according to claim 3, wherein the insert block (1112) comprises a plurality of spacers (1116), a first U-shaped housing (1113) and a second U-shaped housing (1114), both side edges of each spacer (1116) are respectively inserted into the first U-shaped housing (1113) and the second U-shaped housing (1114), each body (21) is sandwiched between two adjacent spacers (1116), and the first U-shaped housing (1113) and the second U-shaped housing (1114) are sandwiched between the base body (1111) and the cover plate (112).

6. The probe module as claimed in claim 3, wherein a plurality of connection screws (1121) are inserted into the cover plate (112) for connecting to the housing (1111).

7. The probe module as set forth in claim 1, wherein the holder assembly (1) further comprises a floating plate (12), the floating plate (12) and the core holder (11) are connected together by a spring (121), and the floating plate (12) has a hole formed therein, the hole being disposed opposite to the plurality of first conduction parts (22).

8. The probe module as claimed in claim 7, wherein the core holder (11) has vertically arranged guide rods (122), the guide rods (122) penetrate through the floating plate (12), and the tops of the guide rods (122) have stop collars (1221) for stopping the floating plate (12).

9. A probe module according to claim 7, wherein a plurality of magnets (123) for attracting connectors of products are inserted on the floating plate (12), and a plurality of the magnets (123) are arranged at intervals along the floating plate (12).

10. A crimping jig, characterized in that, the crimping jig comprises the probe module according to any one of claims 1-9.