CN217385605U

CN217385605U - Miniature probe test module

Info

Publication number: CN217385605U
Application number: CN202122866919.7U
Authority: CN
Inventors: 刘伟利
Original assignee: Shanghai Youyida Electromechanical Co ltd
Current assignee: Shanghai Youyida Electromechanical Co ltd
Priority date: 2021-11-22
Filing date: 2021-11-22
Publication date: 2022-09-06
Anticipated expiration: 2031-11-22

Abstract

The utility model discloses a miniature probe test module, the one end of standard connector is connected with the circuit board, one side of circuit board is fixed with the double-end probe, one side of double-end probe is provided with the direction subassembly, the one end of connecting wire is provided with the protection piece, one side threaded connection of protection piece has the connecting block, the outer wall of connecting block is fixed with the ring flange, circuit board and double-end probe are located the connecting block, the outer wall of connecting block is provided with the buffering protection spring; the utility model discloses a set up the protection piece and protect the connecting wire, make the probe module be convenient for with the external mounting through setting up the ring flange, make the device receive buffer protection through setting up the spring, through the feedback that realizes probe detection information with probe and circuit board switching, make the probe have automatic function of eccentric adjustment through setting up the direction subassembly, make the probe whereabouts smooth, reach and reduce the mosaic piece wearing and tearing, improve the effect of probe life-span.

Description

Miniature probe test module

Technical Field

The utility model relates to a connection test of miniature probe of high densification on circuit substrate and miniature interval connector's connection test technical field specifically are a miniature probe test module.

Background

At present, most of open-short circuit tests of miniature connectors on FPC (flexible printed circuit) boards pass Socket tests, but the test life of miniature probes in the Socket tests is short, the test life of the miniature probes is about 10K-30K times generally, and more test misjudgments exist, so that a device capable of automatically correcting positions during probe detection is needed, dislocation is avoided, meanwhile, abrasion of probe modules is reduced, and the maintenance period is prolonged.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a miniature probe test module, through setting up the direction subassembly, make the probe when being connected with miniature connector, the probe if have small the deflection can make the probe automatic correction position through the effort with the guide block cambered surface, avoid the dislocation.

In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a miniature probe test module, includes standard connector, standard connector's one end is connected with the circuit board, one side of circuit board is fixed with double-ended probe, one side of double-ended probe is provided with the direction subassembly, standard connector includes the connecting wire, the one end of connecting wire is provided with the protection piece, one side threaded connection of protection piece has the connecting block, the outer wall of connecting block is fixed with the ring flange, the circuit board is located the connecting block with double-ended probe, the outer wall of connecting block is provided with buffering protection spring.

Preferably, the guide assembly comprises a probe mosaic block, one end of the mosaic block is provided with two clamping grooves, and contact PINs are inserted into the two clamping grooves respectively.

Preferably, the one end of contact PIN is fixed with the fixed plate, one side of fixed plate is fixed with a plurality of contact PIN, and is a plurality of the contact PIN is the linear array setting, the contact PIN is provided with two sets ofly.

Preferably, adjacent two be provided with the guide block between the contact PIN, the both sides of guide block are the slope setting, the one end of mosaic block is provided with the fixed block.

Preferably, a notch for the guide block to be clamped in is formed in one side of the fixing block, and the inner wall of the notch is arranged in an arc shape.

Preferably, a shell is fixed on the outer side of the fixing plate through screws, and the shell is located on one side of the mosaic block.

Compared with the prior art, the beneficial effects of the utility model are that:

the utility model discloses a setting up fixed block and draw-in groove and making miniature probe test module be card PIN formula contact method to the PIN of miniature probe with miniature connector, simultaneously to all can using of different Pin numbers and interval, application scope is wide, through guide way automatically regulated function, the vertical motion is smooth and easy, not block, and then promote the life of probe, and reduce because of the wearing and tearing of the inserted block that the card led to the fact, the frequency of changing miniature probe test module guide way has been reduced, realize the high life of miniature test probe module.

Drawings

Fig. 1 is an isometric view of the present invention;

FIG. 2 is a schematic side view of the guide groove of the present invention;

fig. 3 is a schematic structural view of the fixing block of the present invention;

fig. 4 is a schematic view of the sectional structure of the fixing block of the present invention;

fig. 5 is a schematic structural diagram of the guide block of the present invention.

In the figure: 1. a connecting wire; 2. a protection block; 3. connecting blocks; 4. a flange plate; 5. a spring; 6. a guide assembly; 7. a circuit board; 8. a probe; 9. a fixing plate; 10. a housing; 11. contacting the PIN; 12. embedding blocks; 13. a card slot; 15. a guide block; 16. and (5) fixing blocks.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts all belong to the protection scope of the present invention.

Referring to fig. 1-5, the present invention provides a technical solution: a miniature probe test module comprises a standard connector, one end of the standard connector is connected with a circuit board 7, one side of the circuit board 7 is fixed with a double-ended probe 8, one side of the double-ended probe 8 is provided with a guide component 6, the standard connector comprises a connecting wire 1, one end of the connecting wire 1 is provided with a protection block 2, one side of the protection block 2 is in threaded connection with a connecting block 3, the outer wall of the connecting block 3 is fixed with a flange plate 4, the circuit board 7 and the double-ended probe 8 are positioned in the connecting block 3, the outer wall of the connecting block 3 is provided with a buffer protection spring 5, a switching PCB is connected through the standard connector, a high-density miniature double-ended probe 8 is connected through the switching PCB, the opening short circuit of a high-density connector Pin test connector to be tested and the testing of parts of the connecting wire 1 are guided to be connected, and the device has buffer protection through the spring 5;

the guide assembly 6 comprises a probe 8 mosaic block 12, one end of the mosaic block 12 is provided with two clamping grooves 13, contact PIN11 are inserted into the two clamping grooves 13 respectively, when the probe 8 extends out, the arc-shaped surface of the fixed block 16 is contacted with the inclined surface of the guide block 15, and one end of the fixed block 16 is contacted with the fixed plate 9 to enable the fixed plate 9 to be flush;

a fixing plate 9 is fixed at one end of each contact PIN11, a plurality of contact PINs 11 are fixed at one side of the fixing plate 9, the contact PINs 11 are arranged in a linear array, two groups of contact PINs 11 are arranged, every two contact PINs 11 form a pair, and two inclined surfaces of the fixing plate 9 face the two contact PINs 11 respectively;

a guide block 15 is arranged between two adjacent contact PINs 11, two sides of the guide block 15 are obliquely arranged, and one end of the mosaic block 12 is provided with a fixed block 16;

a notch for the guide block 15 to be clamped in is formed in one side of the fixed block 16, and the inner wall of the notch is arranged in an arc shape;

a shell 10 is fixed on the outer side of the fixing plate 9 through screws, and the shell 10 is positioned on one side of the insert 12;

during the use, set up to the arc through the inner wall with the 16 notches of fixed block, be 36 degrees angle settings with the both sides of guide block 15 and make the arcwall face of fixed block 16 flush with two probes 8 with the inclined plane contact of guide block 15 messenger fixed plate 9, make probes 8 can not misplace, bind through miniature probe 8 and fixed module, can test a plurality of test positions on the circuit substrate simultaneously.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides a miniature probe test module, includes standard connector, its characterized in that: the one end of standard connector is connected with circuit board (7), one side of circuit board (7) is fixed with double-end probe (8), one side of double-end probe (8) is provided with direction subassembly (6), standard connector includes connecting wire (1), the one end of connecting wire (1) is provided with protection piece (2), one side threaded connection of protection piece (2) has connecting block (3), the outer wall of connecting block (3) is fixed with ring flange (4), circuit board (7) and double-end probe (8) are located connecting block (3), the outer wall of connecting block (3) is provided with buffering protection spring (5).

2. The miniature probe test module set of claim 1, wherein: the guide assembly (6) comprises a probe (8) mosaic block (12), one end of the mosaic block (12) is provided with two clamping grooves (13), and the two clamping grooves (13) are respectively spliced with contact PIN (11).

3. The miniature probe test module set of claim 2, wherein: the one end of contact PIN (11) is fixed with fixed plate (9), one side of fixed plate (9) is fixed with a plurality of contact PIN (11), and is a plurality of contact PIN (11) are the linear array setting, contact PIN (11) are provided with two sets ofly.

4. The miniature probe test module set of claim 3, wherein: adjacent two be provided with guide block (15) between contact PIN (11), the both sides of guide block (15) are the slope setting, the one end of mosaic block (12) is provided with fixed block (16).

5. The microprobe test module according to claim 4, wherein: the notch that supplies guide block (15) card to go into is seted up to one side of fixed block (16), the inner wall of notch is the arc setting.

6. The miniature probe test module set of claim 5, wherein: the outer side of the fixing plate (9) is fixed with a shell (10) through screws, and the shell (10) is located on one side of the mosaic block (12).