CN216209350U - Probe module, crimping tool and crimping testing arrangement - Google Patents
Probe module, crimping tool and crimping testing arrangement Download PDFInfo
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- CN216209350U CN216209350U CN202122572958.6U CN202122572958U CN216209350U CN 216209350 U CN216209350 U CN 216209350U CN 202122572958 U CN202122572958 U CN 202122572958U CN 216209350 U CN216209350 U CN 216209350U
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Abstract
The utility model discloses a probe module, a crimping jig and a crimping testing device, and belongs to the technical field of probes. The probe module comprises a fixing component and a plurality of probes. The fixing component comprises a fixing seat and a cover plate, the fixing seat and the cover plate are detachably connected together, and a cavity is formed between the fixing seat and the cover plate. Each probe is Z shape structure, and a plurality of probe interval arrangement are in the cavity, and each probe all runs through fixing base and apron, and the interval of the one end of two arbitrary adjacent probes is greater than the interval of the other end of two probes. The probe module provided by the embodiment of the utility model can increase the arrangement distance between one ends of the probes, thereby realizing the conduction of the test points on the PCB/FPC and further realizing the conduction of the product.
Description
Technical Field
The utility model belongs to the technical field of probes, and particularly relates to a probe module, a crimping jig and a crimping testing device.
Background
The panel, integrated circuit, products such as semiconductor, in order to guarantee the product quality, can carry on various tests in the course of production, in these test processes, need use various crimping units, the test point of the probe module one end contact product on these crimping units, the test point on the other end contact PCB/FPC etc., PCB/FPC etc. are connected with other transmission units or test equipment again, thus realize the conduction to the product.
At present, the refinement degree of products such as panels, integrated circuits and semiconductors is higher and higher, the size is smaller and smaller, the distance between the corresponding test points on the PCB/FPC is smaller and smaller, and due to the limitation of the self processing and manufacturing process, the processing difficulty is high, so that the distance between the test points on the PCB/FPC is larger, and the PCB/FPC cannot be matched with the distance between the test points on the products such as panels, integrated circuits and semiconductors, and the products cannot be conducted.
SUMMERY OF THE UTILITY MODEL
Aiming at the defects or the improvement requirements of the prior art, the utility model provides a probe module, a crimping jig and a crimping test device, aiming at increasing the arrangement distance between one ends of probes so as to realize the conduction of test points on a PCB/FPC and further realize the conduction of products.
In a first aspect, the present invention provides a probe module, which includes a fixing assembly and a plurality of probes;
the fixing assembly comprises a fixing seat and a cover plate, the fixing seat and the cover plate are detachably connected together, and a cavity is formed between the fixing seat and the cover plate;
each probe is of a Z-shaped structure, the probes are arranged in the cavity at intervals, two ends of each probe penetrate through the fixing seat and the cover plate respectively, and the distance between one ends of any two adjacent probes is larger than that between the other ends of the two probes.
Optionally, the fixing seat and the cover plate are provided with a plurality of through holes arranged at intervals, the plurality of through holes correspond to the plurality of probes one to one, and two ends of each probe are inserted into the corresponding through holes.
Optionally, the fixing seat is of a square structure or a circular structure.
Optionally, the fixing assembly further includes a plurality of probe sheet plates, each of the probe sheet plates is inserted into the fixing seat in parallel at intervals, each of the probe sheet plates is of a Z-shaped structure, and each of the probe sheet plates and the plurality of probes are connected together through an insulating member.
Optionally, each probe sheet plate includes two plate bodies arranged at intervals, the plurality of probes are symmetrically arranged between the two plate bodies, and the two plate bodies and the plurality of probes are bonded together through insulating glue.
Optionally, each of the probe sheet plates and each of the probes includes a first end portion, a middle portion and a second end portion, the first end portion and the second end portion are vertically arranged, and both ends of the middle portion are respectively connected with the first end portion and the second end portion.
Optionally, each probe includes a body, an elastic portion and a needle tail, which are connected in sequence, and the elastic portion is an elastic structure.
Optionally, the distance between any two adjacent one ends of the probes is 0.2-1mm, and the distance between any two adjacent other ends of the probes is 0.05-0.2 mm.
In a second aspect, the present invention further provides a crimping jig, which includes the probe module according to the first aspect.
In a third aspect, the present invention further provides a crimping test apparatus, where the crimping test apparatus includes the probe module according to the first aspect.
The technical scheme provided by the embodiment of the utility model has the following beneficial effects:
for the probe module provided by the embodiment of the utility model, firstly, each probe is installed in the cavity of the fixed seat. Then, the cover plate is installed on the fixed seat, and two ends of the probe respectively extend out of the fixed seat and the cover plate. At this time, the top of the probe can be used for communicating with the test point of the product, and the bottom of the probe can be used for connecting the test point of the PCB/FPC.
Furthermore, each probe is Z-shaped structure, a plurality of probes are arranged in the cavity at intervals, the distance between one ends of any two adjacent probes is larger than the distance between the other ends of the two probes (in the X-axis direction and the Y-axis direction), so that the distance between the bottoms of the probes is larger than the distance between the tops of the probes, the distance between the bottoms of the probes can be increased, the requirement for setting the distance between the test points on the PCB/FPC is reduced, the processing difficulty of the PCB/FPC is reduced, and the conduction of products is met.
That is to say, the probe module provided by the embodiment of the utility model can increase the arrangement distance between one ends of the probes, thereby realizing conduction of the test points on the PCB/FPC and further realizing conduction of the product.
Drawings
Fig. 1 is a schematic structural diagram of a probe module according to an embodiment of the present invention;
fig. 2 is a cross-sectional view of a probe module according to an embodiment of the utility model;
FIG. 3 is a first view of another probe module according to an embodiment of the present invention;
FIG. 4 is a second view of another probe module provided in accordance with an embodiment of the present invention;
FIG. 5 is a schematic structural diagram of a probe card board provided in an embodiment of the present invention;
FIG. 6 is an enlarged view of a portion of FIG. 3;
FIG. 7 is an enlarged view of a portion of FIG. 4;
FIG. 8 is a side view of FIG. 5;
fig. 9 is a partially enlarged view of fig. 5.
The symbols in the drawings represent the following meanings:
1. a fixing assembly; 11. a fixed seat; 12. a cover plate; 13. a through hole; 14. a probe sheet plate; 141. a plate body; 142. a limiting part; 2. a probe; 21. a body; 22. an elastic portion; 23. needle tail; 3. a first end portion; 4. an intermediate portion; 5. a second end portion.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the utility model and are not intended to limit the utility model. In addition, the technical features involved in the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
Fig. 1 is a schematic structural diagram of a probe module according to an embodiment of the present invention, and fig. 2 is a cross-sectional view of the probe module according to the embodiment of the present invention, which is shown in fig. 1 and 2, and includes a fixing member 1 and a plurality of probes 2.
The fixing assembly 1 comprises a fixing seat 11 and a cover plate 12, wherein the fixing seat 11 and the cover plate 12 are detachably connected together, and a cavity is formed between the fixing seat 11 and the cover plate 12.
Each probe 2 is Z shape structure, and a plurality of 2 interval arrangements of probe are in the cavity, and the both ends of each probe 2 run through fixing base 11 and apron 12 respectively, and the interval of the one end of two arbitrary adjacent probes 2 is greater than the interval of the other end of two probes 2.
For the probe module provided by the embodiment of the utility model, firstly, each probe 2 is installed in the cavity of the fixing base 11. Then, the cover plate 12 is mounted on the holder 11 such that both ends of the probe 2 come out of the holder 11 and the cover plate 12, respectively. At this time, the top of the probe 2 can be used to connect with the test point of the product, and the bottom of the probe 2 can be used to connect with the test point of the PCB/FPC.
Further, each probe 2 is Z shape structure, a plurality of 2 interval arrangements of probe are in the cavity, and the interval of the one end of two arbitrary adjacent probes 2 is greater than the interval (in X axle direction and Y axle direction) of the other end of two probe 2, make the interval of the bottom of probe 2 all be greater than the interval at the top of probe 2 like this, just so can increase the interval of the bottom of probe 2, reduce the requirement that test point set up the interval on PCB/FPC, thereby reduce PCB/FPC's the processing degree of difficulty, satisfy leading to the product.
That is to say, the probe module provided by the embodiment of the utility model can increase the arrangement distance between the ends of the probes 2, thereby realizing the conduction of the test points on the PCB/FPC and further realizing the conduction of the product.
It should be noted that the top of the probe 2 may be circular or rectangular.
Illustratively, one end of any two adjacent probes 2 is spaced from 0.2 to 1mm, and the other end of any two adjacent probes 2 is spaced from 0.05 to 0.2 mm.
For example: the pitch of the bottom of the probes 2 is 0.2mm, and the pitch of the top of the probes 2 is 0.05 mm.
In one implementation of this embodiment: the fixing seat 11 and the cover plate 12 are provided with a plurality of through holes 13 arranged at intervals, the through holes 13 correspond to the probes 2 one by one, and two ends of each probe 2 are inserted into the corresponding through holes 13.
In the above embodiment, the through holes 13 function to insert the probes 2, and the plurality of probes 2 can be separated from each other by the through holes 13 so that the probes 2 are independent from each other.
For example, the fixing base 11 may have a square structure or a circular structure, which is not limited in the embodiment of the present invention.
In another implementation of this embodiment: fig. 3 is a first view of another probe module provided by an embodiment of the present invention, fig. 4 is a second view of another probe module provided by an embodiment of the present invention, fig. 5 is a schematic structural view of a probe sheet plate provided by an embodiment of the present invention, and referring to fig. 3, fig. 4 and fig. 5, the fixing assembly 1 further includes a plurality of probe sheet plates 14, each probe sheet plate 14 is inserted into the fixing base 11 in parallel and at intervals, each probe sheet plate 14 is in a Z-shaped structure, and each probe sheet plate 14 and the plurality of probes 2 are connected together through an insulating member.
In the above embodiment, on the one hand, the probe sheet plate 14 functions to connect the plurality of probes 2 and is inserted into the holder 11. On the other hand, can be with a plurality of probes 2 be the row through probe piece board 14 and arrange, the equipment a probe piece board 14 just means assembled many probes 2, and this kind of mode greatly reduced the equipment degree of difficulty and the work load of probe 2, also had very big promotion to packaging efficiency. In addition, the insulating member functions to separate and insulate each probe 2.
FIG. 6 is a partially enlarged view of FIG. 3, FIG. 7 is a partially enlarged view of FIG. 4, and as shown in connection with FIGS. 6 and 7, the distance M between the bottoms of the probes 2 in the Y-axis direction2Greater than the spacing M of the tips of the probes 21The distance L between the bottoms of the probes 2 in the X-axis direction2Greater than the spacing L of the tips of the probes 21This makes the intervals of the X-axis and Y-axis directions in the plane of the bottom of the probe 2 larger than the intervals of the X-axis and Y-axis directions in the plane of the top of the probe 2.
Illustratively, the fixing base 11 has a square hole therein, and each probe sheet plate 14 is inserted on the inner wall of the square hole.
Specifically, each probe card plate 14 includes two plate bodies 141 arranged at intervals, the plurality of probes 2 are symmetrically arranged between the two plate bodies 141, and the two plate bodies 141 and the plurality of probes 2 are bonded together by insulating glue.
In the above embodiment, the two plate bodies 141 support the probe 2 more stably. The insulating part can be insulating cement for each probe 2 becomes independent body, and each is not continuous, corresponds different test points respectively and carries out switching conduction.
Illustratively, the two plate bodies 141 are respectively inserted into two sides of the square hole.
Exemplarily, both ends of each plate body 141 are provided with a limiting portion 142, the inner wall of the square hole is provided with a plurality of limiting grooves, the plurality of limiting portions 142 correspond to the plurality of limiting grooves one to one, and each limiting portion 142 is inserted into the corresponding limiting groove.
Fig. 8 is a side view of fig. 5, and as shown in fig. 8, each probe sheet plate 14 and each probe 2 respectively include a first end portion 3, a middle portion 4 and a second end portion 5, the first end portion 3 and the second end portion 5 are vertically arranged, and two ends of the middle portion 4 are respectively connected with the first end portion 3 and the second end portion 5, so that the characteristic of "top-close and bottom-close combing" of the probe 2 is realized, and the processing difficulty of the PCB/FPC is reduced.
It should be noted that the intermediate portion 4 may be curved or linear, which is not required by the present invention.
Fig. 9 is a partial enlarged view of fig. 5, and as shown in fig. 9, each probe 2 includes a body 21, an elastic portion 22, and a needle tail 23 connected in sequence, and the elastic portion 22 has an elastic structure.
In the above embodiment, the elastic portion 22 can be compressed to generate elastic force, so as to avoid hard contact between the pin tail 23 and the test point of the PCB/FPC.
The embodiment of the utility model also provides a crimping jig which comprises the probe module.
The embodiment of the utility model also provides a crimping test device which comprises the probe module.
It will be understood by those skilled in the art that the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the utility model, and that any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (10)
1. A probe module, characterized in that it comprises a fixed assembly (1) and a plurality of probes (2);
the fixing assembly (1) comprises a fixing seat (11) and a cover plate (12), the fixing seat (11) and the cover plate (12) are detachably connected together, and a cavity is formed between the fixing seat (11) and the cover plate (12);
each probe (2) is of a Z-shaped structure, the probes (2) are arranged in the cavity at intervals, two ends of each probe (2) penetrate through the fixing seat (11) and the cover plate (12) respectively, and the distance between one ends of any two adjacent probes (2) is larger than the distance between the other ends of the two probes (2).
2. The probe module as claimed in claim 1, wherein the fixing base (11) and the cover plate (12) have a plurality of through holes (13) arranged at intervals, the plurality of through holes (13) and the plurality of probes (2) are in one-to-one correspondence, and two ends of each probe (2) are inserted into the corresponding through holes (13).
3. A probe module according to claim 2, wherein the fixing base (11) has a square structure or a circular structure.
4. The probe module as claimed in claim 1, wherein the fixing assembly (1) further comprises a plurality of probe card plates (14), each probe card plate (14) is inserted into the fixing base (11) in parallel and spaced, each probe card plate (14) is in a Z-shaped structure, and each probe card plate (14) and the plurality of probes (2) are connected together through an insulating member.
5. The probe module according to claim 4, wherein each probe card board (14) comprises two board bodies (141) arranged at intervals, the plurality of probes (2) are symmetrically arranged between the two board bodies (141), and the two board bodies (141) and the plurality of probes (2) are bonded together by insulating glue.
6. A probe module according to claim 4, characterized in that each probe card plate (14) and each probe (2) comprises a first end portion (3), a middle portion (4) and a second end portion (5), the first end portion (3) and the second end portion (5) are arranged vertically, and two ends of the middle portion (4) are respectively connected with the first end portion (3) and the second end portion (5).
7. The probe module according to any one of claims 1 to 6, wherein each probe (2) comprises a body (21), an elastic part (22) and a needle tail (23) which are connected in sequence, and the elastic part (22) is of an elastic structure.
8. A probe module according to any one of claims 1 to 6, characterized in that the distance between one end of any two adjacent probes (2) is 0.2 to 1mm, and the distance between the other end of two adjacent probes (2) is 0.05 to 0.2 mm.
9. A crimping jig, characterized in that, the crimping jig comprises the probe module according to any one of claims 1 to 8.
10. A crimp testing apparatus, comprising the probe module according to any one of claims 1 to 8.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122572958.6U CN216209350U (en) | 2021-10-25 | 2021-10-25 | Probe module, crimping tool and crimping testing arrangement |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122572958.6U CN216209350U (en) | 2021-10-25 | 2021-10-25 | Probe module, crimping tool and crimping testing arrangement |
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| Publication Number | Publication Date |
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| CN216209350U true CN216209350U (en) | 2022-04-05 |
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| CN202122572958.6U Active CN216209350U (en) | 2021-10-25 | 2021-10-25 | Probe module, crimping tool and crimping testing arrangement |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113848356A (en) * | 2021-10-25 | 2021-12-28 | 武汉精毅通电子技术有限公司 | Probe module and preparation method thereof |
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- 2021-10-25 CN CN202122572958.6U patent/CN216209350U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113848356A (en) * | 2021-10-25 | 2021-12-28 | 武汉精毅通电子技术有限公司 | Probe module and preparation method thereof |
| CN113848356B (en) * | 2021-10-25 | 2024-05-03 | 武汉精毅通电子技术有限公司 | Probe module and preparation method thereof |
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