CN215894830U - SMA encapsulation diode capability test device - Google Patents
SMA encapsulation diode capability test device Download PDFInfo
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- CN215894830U CN215894830U CN202122288578.XU CN202122288578U CN215894830U CN 215894830 U CN215894830 U CN 215894830U CN 202122288578 U CN202122288578 U CN 202122288578U CN 215894830 U CN215894830 U CN 215894830U
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- conveying belt
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Abstract
The utility model provides a performance testing device for an SMA (shape memory alloy) packaged diode, which relates to the technical field of diode detection and comprises a base, a conveying mechanism and a detection mechanism; the conveying mechanism comprises a mounting seat fixed on the base; the mounting seat is fixedly connected with a first rotating shaft; the first rotating shaft is rotatably connected with the first rotating disc; the first rotating disc is provided with a belt groove; a conveying belt is connected in the belt groove; a plurality of fixed blocks are arranged in the middle of the conveying belt at equal intervals; a clamping groove is arranged on the fixing block; an SMA encapsulation diode is clamped in the clamping groove; a plurality of limiting holes are formed in the conveying belt above the fixing block at equal intervals; a limiting pin corresponding to the limiting hole is arranged in the belt groove; the conveyer belt is connected with a driving device. The performance testing device for the SMA encapsulated diode can automatically complete the detection of the SMA encapsulated diode; the detection efficiency is high; the operation is stable.
Description
Technical Field
The utility model relates to the technical field of diode detection, in particular to a performance testing device for an SMA (shape memory alloy) packaged diode.
Background
A diode is a commonly used electronic component, and its largest characteristic is unidirectional conductivity. After the diode is packaged by the SMA, the unidirectional conductivity of the diode needs to be tested in a manner that two electrodes are connected with a detection instrument; determining whether the performance of the diode is normal by detecting the forward and reverse resistance, if the forward resistance is small; the requirement is met when the reverse resistance is large.
The existing detection is usually carried out manually, and the manual detection mode is low in efficiency and wastes time and labor. Therefore, an SMA package diode performance testing apparatus is needed to improve the detection efficiency.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide a device for testing the performance of an SMA (shape memory alloy) packaged diode, which aims to solve the technical problem.
In order to achieve the purpose, the performance testing device for the SMA encapsulation diode comprises a base, a conveying mechanism and a detection mechanism, wherein the conveying mechanism is arranged on the base;
the conveying mechanism comprises a mounting seat fixed on the base; the mounting seat is fixedly connected with a first rotating shaft; the first rotating shaft is rotatably connected with the first rotating disc; the first rotating disc is provided with a belt groove; a conveying belt is connected in the belt groove; a plurality of fixed blocks are arranged in the middle of the conveying belt at equal intervals; a clamping groove is arranged on the fixing block; an SMA encapsulation diode is clamped in the clamping groove; a plurality of limiting holes are formed in the conveying belt above the fixing block at equal intervals; a limiting pin corresponding to the limiting hole is arranged in the belt groove; the conveying belt is connected with a driving device;
the detection mechanism comprises an installation table fixed with the base; the upper end of the mounting table is provided with a guide rail; the guide rail is connected with a sliding block in a sliding way; the upper end of the sliding block is connected with the pushing block; the push block is fixedly connected with the mounting block; one side of the mounting block, which is close to the conveying belt, is provided with two detection terminals; the two detection terminals respectively correspond to the two electrodes of the SMA packaging diode; the two detection terminals are connected with a detection instrument through a lead; one end of the push block, which is far away from the conveying belt, is connected with the movable end of the air cylinder; the cylinder is arranged on the mounting table; a connecting plate fixed with the mounting table is arranged above the mounting block; the upper end of the connecting plate is obliquely provided with a pneumatic positioning pin; the pneumatic positioning pin and the air cylinder are connected with an air source through the same pipeline.
Furthermore, two sides of the first rotating disk are provided with limiting wheels; the limiting wheel is attached to the conveying belt; the limiting wheel is provided with a first groove corresponding to the limiting pin; the limiting wheel is provided with a second groove corresponding to the fixing block; the limiting wheel is rotationally connected with the second rotating shaft; the second rotating shaft is fixed on the connecting rod, and the connecting rod is fixed on the connecting block through a bolt.
Further, the driving device comprises a second rotating disc connected with the conveying belt; the second rotating disc is fixedly connected with a third rotating shaft; the third rotating shaft is connected with the movable end of the servo motor.
In addition, the performance test device for the SMA encapsulation diode is controlled by the controller to operate.
Advantageous effects
The performance testing device for the SMA encapsulated diode can automatically complete the detection of the SMA encapsulated diode; the detection efficiency is high; the operation is stable.
Drawings
Fig. 1 is a schematic overall structure diagram of an SMA package diode performance testing apparatus.
Fig. 2 is a schematic diagram of a conveyor belt, an SMA encapsulated diode and related structures.
Fig. 3 is a schematic structural diagram of the first rotating disk.
Fig. 4 is a schematic top view of the performance testing device for the SMA package diode.
Fig. 5 is a schematic view of an installation structure of the limiting wheel.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings of the present invention, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention. Unless defined otherwise, technical or scientific terms used herein shall have the ordinary meaning as understood by one of ordinary skill in the art to which this invention belongs. As used herein, the word "comprising" and similar words are intended to mean that the element or item listed before the word covers the element or item listed after the word and its equivalents, but does not exclude other elements or items.
Aiming at the problems in the prior art, the embodiment of the utility model provides a device for testing the performance of an SMA (shape memory alloy) packaged diode.
Examples
A performance testing device for an SMA (shape memory alloy) packaged diode comprises a base 1, a conveying mechanism and a detection mechanism;
the conveying mechanism comprises a mounting seat 2 fixed on the base 1; the mounting base 2 is fixedly connected with a first rotating shaft 3; the first rotating shaft 3 is rotationally connected with the first rotating disc 4; the first rotating disc 4 is provided with a belt groove 5; a conveying belt 6 is connected in the belt groove 5; a plurality of fixed blocks 7 are arranged in the middle of the conveying belt 6 at equal intervals; a clamping groove is arranged on the fixed block 7; an SMA encapsulation diode 8 is clamped in the clamping groove; a plurality of limiting holes 9 are formed in the conveying belt 6 above the fixing block 7 at equal intervals; a limiting pin 10 corresponding to the limiting hole 9 is arranged in the belt groove 5; the conveying belt 6 is connected with a driving device;
the detection mechanism comprises a mounting table 11 fixed with the base 1; the upper end of the mounting table 11 is provided with a guide rail 12; the guide rail 12 is connected with a slide block 13 in a sliding way; the upper end of the sliding block 13 is connected with a pushing block 14; the push block 14 is fixedly connected with the mounting block 15; two detection terminals 16 are arranged on one side of the mounting block 15 close to the conveying belt 6; the two detection terminals 16 respectively correspond to two electrodes 17 of the SMA encapsulation diode 8; the two detection terminals 16 are connected with a detection instrument (not shown in the figure) through leads; one end of the push block 14 far away from the conveying belt 6 is connected with the movable end of the air cylinder 18; the cylinder 18 is mounted on the mounting table 11; a connecting plate 19 fixed with the mounting table 11 is arranged above the mounting block 15; the upper end of the connecting plate 19 is obliquely provided with a pneumatic positioning pin 20; the pneumatic positioning pin 20 and the air cylinder 18 are connected with an air source (not shown in the figure) through the same pipeline; this ensures that the pneumatic locating pin 20 and the cylinder 18 are kept moving synchronously; the pneumatic positioning pin 20 is arranged for finely adjusting the position of the SMA encapsulated diode 8, so that the two detection terminals 16 can be more accurately aligned with the two electrodes 17 of the SMA encapsulated diode 8; the reason why the position of the SMA encapsulated diode 8 deviates is mainly that the conveyer belt 6 is made of soft material, so that the deviation is easy to occur when the pretightening force is insufficient or the machine runs unstably, and in addition, the heat effect in the running process can also cause weak deviation.
Two sides of the first rotating disk 4 are provided with limiting wheels 21; the limiting wheel 21 is attached to the conveying belt 6; the limiting wheel 21 is provided with a first groove 22 corresponding to the limiting pin 10; a second groove 23 corresponding to the fixing block 7 is arranged on the limiting wheel 21; the limiting wheel 21 is rotatably connected with the second rotating shaft 24; the second rotating shaft 24 is fixed on a connecting rod 25, and the connecting rod 25 is fixed on a connecting block 26 through a bolt. The degree of attachment between the first rotating disk 4 and the conveying belt 6 can be adjusted through the limiting wheel 21, and the position accuracy of the SMA encapsulation diode 8 can be guaranteed.
The driving means comprise a second rotating disc 27 connected to the conveyor belt 6; the second rotating disk 27 is fixedly connected with a third rotating shaft 28; the third rotating shaft 28 is connected with the movable end of the servo motor 29.
The performance testing device for the SMA packaging diode of the embodiment is controlled by the controller to operate.
When the performance testing device for the SMA encapsulated diode works, the servo motor 29 drives the second rotating disc 27 to rotate, so that the conveying belt 6 is driven to rotate on the first rotating disc 4 and the second rotating disc 27; the conveyer belt 6 rotates to align two electrodes 17 of the SMA encapsulation diode 8 with two detection terminals 16; the air cylinder 18 and the pneumatic positioning pin 20 are ventilated and synchronously run; the position of the SMA encapsulation diode 8 is finely adjusted by the pneumatic positioning pin 20; the air cylinder 18 drives the push block 14; the sliding block 13 at the lower end of the pushing block 14 slides along the guide rail 12; the mounting block 15 above the push block 14 is close to the SMA encapsulation diode 8; two detection terminals 16 on the mounting block 15 are contacted with two electrodes 17 of the SMA encapsulation diode 8, and a detection circuit of the detection instrument is connected, so that the SMA encapsulation diode 8 is detected.
Although the embodiments of the present invention have been described in detail hereinabove, it is apparent to those skilled in the art that various modifications and variations can be made to these embodiments. However, it is to be understood that such modifications and variations are within the scope and spirit of the present invention as set forth in the following claims. Moreover, the utility model as described herein is capable of other embodiments and of being practiced or of being carried out in various ways.
Claims (3)
1. A performance testing device for an SMA (shape memory alloy) packaged diode is characterized by comprising a base, a conveying mechanism and a detection mechanism;
the conveying mechanism comprises a mounting seat fixed on the base; the mounting seat is fixedly connected with a first rotating shaft; the first rotating shaft is rotatably connected with the first rotating disc; the first rotating disc is provided with a belt groove; a conveying belt is connected in the belt groove; a plurality of fixed blocks are arranged in the middle of the conveying belt at equal intervals; a clamping groove is arranged on the fixing block; an SMA encapsulation diode is clamped in the clamping groove; a plurality of limiting holes are formed in the conveying belt above the fixing block at equal intervals; a limiting pin corresponding to the limiting hole is arranged in the belt groove; the conveying belt is connected with a driving device;
the detection mechanism comprises an installation table fixed with the base; the upper end of the mounting table is provided with a guide rail; the guide rail is connected with a sliding block in a sliding way; the upper end of the sliding block is connected with the pushing block; the push block is fixedly connected with the mounting block; one side of the mounting block, which is close to the conveying belt, is provided with two detection terminals; the two detection terminals respectively correspond to the two electrodes of the SMA packaging diode; the two detection terminals are connected with a detection instrument through a lead; one end of the push block, which is far away from the conveying belt, is connected with the movable end of the air cylinder; the cylinder is arranged on the mounting table; a connecting plate fixed with the mounting table is arranged above the mounting block; the upper end of the connecting plate is obliquely provided with a pneumatic positioning pin; the pneumatic positioning pin and the air cylinder are connected with an air source through the same pipeline.
2. The device for testing the performance of the SMA encapsulated diode according to claim 1, wherein limiting wheels are arranged on two sides of the first rotating disk; the limiting wheel is attached to the conveying belt; the limiting wheel is provided with a first groove corresponding to the limiting pin; the limiting wheel is provided with a second groove corresponding to the fixing block; the limiting wheel is rotationally connected with the second rotating shaft; the second rotating shaft is fixed on the connecting rod, and the connecting rod is fixed on the connecting block through a bolt.
3. The device for testing the performance of the SMA encapsulated diode as recited in claim 1, wherein the driving device comprises a second rotating disk connected with a conveyer belt; the second rotating disc is fixedly connected with a third rotating shaft; the third rotating shaft is connected with the movable end of the servo motor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122288578.XU CN215894830U (en) | 2021-09-22 | 2021-09-22 | SMA encapsulation diode capability test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122288578.XU CN215894830U (en) | 2021-09-22 | 2021-09-22 | SMA encapsulation diode capability test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215894830U true CN215894830U (en) | 2022-02-22 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202122288578.XU Active CN215894830U (en) | 2021-09-22 | 2021-09-22 | SMA encapsulation diode capability test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215894830U (en) |
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2021
- 2021-09-22 CN CN202122288578.XU patent/CN215894830U/en active Active
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