CN215833553U - Analog integrated circuit tester with 64-channel digital channels - Google Patents
Analog integrated circuit tester with 64-channel digital channels Download PDFInfo
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- CN215833553U CN215833553U CN202121473738.1U CN202121473738U CN215833553U CN 215833553 U CN215833553 U CN 215833553U CN 202121473738 U CN202121473738 U CN 202121473738U CN 215833553 U CN215833553 U CN 215833553U
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- connecting rod
- integrated circuit
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- mounting plate
- test controller
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Abstract
The utility model discloses an analog integrated circuit tester with 64 paths of digital channels, which comprises a base, springs and control boxes, wherein the control boxes are arranged on the left side and the right side above the base; a hydraulic rod installed above the console box; a top plate disposed above the hydraulic rod; a shock absorbing assembly disposed below the top plate; the shock-absorbing component comprises: a connecting rod; the spring is sleeved on the outer side of the connecting rod; the mounting plate is arranged on the outer side of the connecting rod, and the connecting rod penetrates through the mounting plate; a nut provided at one end of the connecting rod; a test controller mounted below the mounting plate; a probe disposed below the test controller. This simulation integrated circuit test machine with 64 digital channel can prevent through the spring that the mounting panel from producing vibrations, and the test controller is 64 digital channel formulas, can carry out quick analysis to integrated circuit through the test controller.
Description
Technical Field
The utility model relates to the technical field of integrated circuit testing machines, in particular to an analog integrated circuit testing machine with 64 digital channels.
Background
An integrated circuit tester is a technological test instrument used in the technical fields of information science and system science, electronics and communication, the integrated circuit is an electronic element comprising a silicon substrate, at least one circuit, a fixed seal ring, a grounding ring and at least one protection ring, and the integrated circuit tester is widely applied in the integrated circuit processing process.
The existing analog integrated circuit tester can not well prevent the vibration phenomenon generated in the integrated circuit testing process in the using process and can not well and quickly test the integrated circuit, and therefore an analog integrated circuit tester with 64 channels of digital channels is provided.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide an analog integrated circuit tester with 64 channels of digital channels, which aims to solve the problems that the existing analog integrated circuit tester cannot well prevent the vibration phenomenon in the integrated circuit testing process and cannot well and quickly test the integrated circuit in the background technology.
In order to achieve the purpose, the utility model provides the following technical scheme: an analog integrated circuit tester having 64 digital channels, comprising:
a base;
further comprising:
the control boxes are arranged on the left side and the right side above the base;
a hydraulic rod installed above the console box;
a top plate disposed above the hydraulic rod;
a shock absorbing assembly disposed below the top plate;
the shock-absorbing component comprises:
a connecting rod;
the spring is sleeved on the outer side of the connecting rod;
the mounting plate is arranged on the outer side of the connecting rod, and the connecting rod penetrates through the mounting plate;
a nut provided at one end of the connecting rod;
a test controller mounted below the mounting plate;
a probe disposed below the test controller;
support plates installed at left and right ends of the test controller;
the spraying head is arranged below the supporting plate;
the storage assemblies are arranged at the front end and the rear end of the base;
a bracket disposed above the base;
a frame mounted above the support;
a conveyor belt disposed inside the frame;
and the limiting groove is formed in the outer surface of the conveying belt.
Preferably, the control box is fixedly connected with the base, and the top plate and the control box form a lifting structure through a hydraulic rod.
Preferably, the connecting rods are fixedly connected with the top plate, and the connecting rods are symmetrically distributed around the center of the top plate.
Preferably, the mounting plate is movably connected with the connecting rod, and the nut is in threaded connection with the connecting rod.
Preferably, the test controller is fixedly connected with the mounting plate, and the code spraying head and the test controller form a fixed structure through the support plate.
Preferably, the storage assembly comprises:
a storage box;
a recess opened at an inner side of the storage box.
Preferably, the storage boxes are symmetrically distributed about the center of the base, and the grooves are equidistantly distributed on the inner side of the storage boxes.
The utility model provides an analog integrated circuit tester with 64 digital channels, which has the following beneficial effects: the spring props up the mounting panel, when the roof is at the removal in-process, can prevent through the spring that the mounting panel from producing vibrations, test controller is 64 way digital channel formulas, can carry out quick analysis to integrated circuit through test controller, when unqualified, spout the pier and can spout the sign indicating number to unqualified integrated circuit, the follow-up processing of being convenient for, integrated circuit places in depositing the case through the recess, be convenient for to integrated circuit detection time measuring take, and collect integrated circuit after the detection.
1. According to the utility model, through the arrangement of the control box, the hydraulic rod, the top plate, the connecting rod, the spring and the mounting plate, an operator can control the device through the control box, the top plate can perform lifting motion with the control box through the hydraulic rod, the spring supports the mounting plate, the nut and the connecting rod are in threaded mounting, the nut is used for limiting, and when the top plate moves, the spring can prevent the mounting plate from vibrating.
2. According to the utility model, through the arrangement of the test controller, the probe, the supporting plate and the spraying head, the test controller and the mounting plate are fixedly mounted, the test controller drives the probe to move up and down along with the top plate, the integrated circuit can be tested through the probe, the test controller is in a 64-channel digital channel type, the integrated circuit can be rapidly analyzed through the test controller, and when the integrated circuit is unqualified, the spraying head can spray codes on the unqualified integrated circuit, so that the subsequent processing is facilitated.
3. According to the utility model, through the arrangement of the storage box, the groove, the frame, the conveyor belt and the limiting groove, an operator can place the integrated circuit in the storage box through the groove, so that the integrated circuit can be conveniently taken during detection, and collected after detection is finished, the support supports the frame, the conveyor belt is arranged on the inner side of the frame, the integrated circuit can be conveyed through the conveyor belt, the limiting groove can limit the integrated circuit, and the integrated circuit can be favorably moved to the position under the probe.
Drawings
FIG. 1 is a schematic diagram of an analog integrated circuit tester with 64 digital channels according to the present invention;
FIG. 2 is a diagram of a test structure of an analog integrated circuit tester with 64 digital channels according to the present invention;
FIG. 3 is a schematic perspective view of a storage box of an analog integrated circuit tester with 64 digital channels according to the present invention.
In the figure: 1. a base; 2. a control box; 3. a hydraulic lever; 4. a top plate; 5. a shock absorbing assembly; 501. a connecting rod; 502. a spring; 503. mounting a plate; 504. a nut; 6. a test controller; 7. a probe; 8. A support plate; 9. spraying the wharf; 10. storing the assembly; 1001. a storage box; 1002. a groove; 11. a support; 12. a frame; 13. a conveyor belt; 14. a limiting groove.
Detailed Description
As shown in fig. 2, an analog integrated circuit tester having 64 digital channels includes: a base 1; further comprising: the control boxes 2 are arranged on the left side and the right side above the base 1; a hydraulic rod 3 installed above the console box 2; the top plate 4 is arranged above the hydraulic rod 3, the control box 2 is fixedly connected with the base 1, and the top plate 4 and the control box 2 form a lifting structure through the hydraulic rod 3; a damper assembly 5 disposed below the top plate 4; the damper assembly 5 includes: the connecting rod 501 is fixedly connected with the top plate 4, and the connecting rods 501 are symmetrically distributed around the center of the top plate 4; a spring 502 sleeved outside the connecting rod 501; a mounting plate 503 disposed outside the connecting rod 501, the connecting rod 501 penetrating the mounting plate 503; the nut 504 is arranged at one end of the connecting rod 501, the mounting plate 503 is movably connected with the connecting rod 501, the nut 504 is in threaded connection with the connecting rod 501, an operator can control the device through the control box 2, the top plate 4 is lifted up and down through the hydraulic rod 3 and the control box 2, the spring 502 supports the mounting plate 503, the nut 504 is in threaded installation with the connecting rod 501, the nut 504 is used for limiting, and when the top plate 4 moves, the mounting plate 503 can be prevented from vibrating through the spring 502; a test controller 6 mounted below the mounting plate 503; a probe 7 disposed below the test controller 6; support plates 8 installed at left and right ends of the test controller 6; spout pier 9, it sets up the below in backup pad 8, be fixed connection between test controller 6 and the mounting panel 503, and spout pier 9 and constitute fixed knot through backup pad 8 and test controller 6, test controller 6 carries out fixed mounting with mounting panel 503, test controller 6 drives probe 7 and follows roof 4 and carry out elevating movement, can test integrated circuit through probe 7, test controller 6 is 64 way digital channel formulas, can carry out quick analysis to integrated circuit through test controller 6, when unqualified, spout pier 9 and can spout the sign indicating number to unqualified integrated circuit, the subsequent processing of being convenient for.
As shown in fig. 1 and 3, a storage module 10 is installed at both front and rear ends of a base 1, and the storage module 10 includes: a storage box 1001; grooves 1002 formed inside the storage box 1001, the storage box 1001 being symmetrically distributed with respect to the center position of the base 1, the grooves 1002 being equidistantly distributed inside the storage box 1001; a bracket 11 disposed above the base 1; a frame 12 mounted above the bracket 11; a conveyor belt 13 disposed inside the frame 12; spacing groove 14, its surface of seting up at conveyer belt 13, operating personnel can place integrated circuit in depositing case 1001 through recess 1002, be convenient for to integrated circuit detection time measuring take, and collect integrated circuit after the detection, support 11 supports frame 12, conveyer belt 13 is installed in the inboard of frame 12, can carry integrated circuit through conveyer belt 13, spacing groove 14 can be spacing to integrated circuit, be favorable to guaranteeing that integrated circuit removes under probe 7.
In conclusion, when the tester for the analog integrated circuits with 64 channels of the digital channels is used, firstly, an operator can control the device through the control box 2, the operator can place the integrated circuits in the storage box 1001 through the grooves 1002 to be convenient for taking the integrated circuits during detection, and collect the integrated circuits after the detection is finished, the bracket 11 supports the frame 12, the conveyor belt 13 is installed on the inner side of the frame 12, the integrated circuits can be conveyed through the conveyor belt 13, the limiting groove 14 can limit the integrated circuits, so that the integrated circuits can be conveniently ensured to move to be under the probes 7, the top plate 4 can move up and down with the control box 2 through the hydraulic rod 3, the spring 502 supports the mounting plate 503, the nut 504 and the connecting rod 501 are installed in a threaded manner and limited through the nut 504, when the top plate 4 moves, the mounting plate 503 can be prevented from vibrating through the spring 502, test controller 6 carries out fixed mounting with mounting panel 503, test controller 6 drives probe 7 and follows roof 4 and carry out elevating movement, can test integrated circuit through probe 7, test controller 6 is 64 way digital channel formulas, can carry out rapid analysis to integrated circuit through test controller 6, when unqualified, spout the sign indicating number head 9 and can spout the sign indicating number to unqualified integrated circuit, the subsequent processing of being convenient for, this is exactly the theory of operation of this simulation integrated circuit test machine that has 64 way digital channel.
Claims (7)
1. An analog integrated circuit tester having 64 digital channels, comprising:
a base (1);
it is characterized by also comprising:
the control boxes (2) are arranged on the left side and the right side above the base (1);
a hydraulic rod (3) mounted above the console box (2);
a top plate (4) disposed above the hydraulic rod (3);
a shock-absorbing assembly (5) disposed below the top plate (4);
the shock-absorbing assembly (5) comprises:
a connecting rod (501);
a spring (502) sleeved on the outer side of the connecting rod (501);
a mounting plate (503) which is arranged outside the connecting rod (501), wherein the connecting rod (501) penetrates through the mounting plate (503);
a nut (504) provided at one end of the connecting rod (501);
a test controller (6) mounted below the mounting plate (503);
a probe (7) disposed below the test controller (6);
support plates (8) mounted on both left and right ends of the test controller (6);
a spray head (9) arranged below the support plate (8);
storage assemblies (10) mounted at both front and rear ends of the base (1);
a bracket (11) disposed above the base (1);
a frame (12) mounted above the bracket (11);
a conveyor belt (13) disposed inside the frame (12);
and the limiting groove (14) is formed in the outer surface of the conveying belt (13).
2. The testing machine for the analog integrated circuits with 64 channels of the digital signals as claimed in claim 1, wherein the control box (2) is fixedly connected with the base (1), and the top plate (4) forms a lifting structure with the control box (2) through the hydraulic rod (3).
3. The testing machine for the analog integrated circuits with 64 digital channels as claimed in claim 1, wherein the connecting rods (501) are fixedly connected with the top plate (4), and the connecting rods (501) are symmetrically distributed about the center of the top plate (4).
4. The machine according to claim 1, wherein the mounting plate (503) is movably connected to the connecting rod (501), and the nut (504) is screwed to the connecting rod (501).
5. The testing machine for the analog integrated circuits with 64 digital channels as claimed in claim 1, wherein the testing controller (6) is fixedly connected with the mounting plate (503), and the code spraying head (9) forms a fixed structure with the testing controller (6) through the supporting plate (8).
6. The analog integrated circuit tester with 64 digital channels according to claim 1, characterized in that said storage assembly (10) comprises:
a storage box (1001);
a recess (1002) opening inside the storage box (1001).
7. The testing machine for the analog integrated circuits with 64 digital channels according to claim 6, characterized in that the storage boxes (1001) are symmetrically distributed about the center of the base (1), and the grooves (1002) are equidistantly distributed on the inner side of the storage boxes (1001).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121473738.1U CN215833553U (en) | 2021-06-30 | 2021-06-30 | Analog integrated circuit tester with 64-channel digital channels |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121473738.1U CN215833553U (en) | 2021-06-30 | 2021-06-30 | Analog integrated circuit tester with 64-channel digital channels |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215833553U true CN215833553U (en) | 2022-02-15 |
Family
ID=80190981
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121473738.1U Active CN215833553U (en) | 2021-06-30 | 2021-06-30 | Analog integrated circuit tester with 64-channel digital channels |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215833553U (en) |
-
2021
- 2021-06-30 CN CN202121473738.1U patent/CN215833553U/en active Active
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