CN215728338U

CN215728338U - Novel needle plate structure

Info

Publication number: CN215728338U
Application number: CN202121333803.0U
Authority: CN
Inventors: 蔡桂鑫; 郗旭斌; 李峰; 周天树
Original assignee: Intelligent Automation Equipment Zhuhai Co Ltd
Current assignee: Intelligent Automation Equipment Zhuhai Co Ltd
Priority date: 2021-06-16
Filing date: 2021-06-16
Publication date: 2022-02-01
Anticipated expiration: 2031-06-16

Abstract

The utility model aims to provide a novel needle plate structure which has few parts, is convenient to install and can be changed in shape. The probe needle comprises an upper needle plate, a lower needle plate and a plurality of probes, wherein a boss matched with the upper needle plate is arranged on the lower needle plate, a first hollow groove is formed in the boss, and a plurality of stepped holes matched with the ends of the probes are formed in the upper needle plate and the lower needle plate. The utility model is applied to the technical field of needle plate structures.

Description

Novel needle plate structure

Technical Field

The utility model is applied to the technical field of needle plate structures, and particularly relates to a novel needle plate structure.

Background

The probe is a contact medium for electrical test and is a high-end precise electronic hardware component. The conventional test pin die generally adopts a three-layer structure of an upper pin plate, a lower pin plate and a tail pin plate as a fixing structure of the probes, wherein the tail pin plate is used for fixing the probes, and the upper pin plate and the lower pin plate are both used for guiding the probes, which is relatively complex. Due to the limitation of the length and the diameter of the probe, the thickness of the plate is increased after the number of the plates is reduced, but the aperture cannot be expanded, and the drilling equipment is easy to break, so that the processing requirement is high in order to ensure the depth of the pinhole step for fixing the probe, and the material and processing cost are correspondingly high. Meanwhile, the traditional needle die is not beneficial to changing the types, and usually, a group of needle plates can only be used for butting single test products, so that the types cannot be changed.

SUMMERY OF THE UTILITY MODEL

The utility model aims to solve the technical problem of overcoming the defects of the prior art and provides a novel needle plate structure which has few parts, is convenient to install and can be changed in shape.

The technical scheme adopted by the utility model is as follows: the probe needle comprises an upper needle plate, a lower needle plate and a plurality of probes, wherein a boss matched with the upper needle plate is arranged on the lower needle plate, a first hollow groove is formed in the boss, and a plurality of stepped holes matched with the ends of the probes are formed in the upper needle plate and the lower needle plate.

According to the scheme, the probes are limited through the stepped holes of the lower needle plate, and then the purpose is achieved. The probe is clamped and fixed, and the probe is guided by the upper needle plate. Through setting up first fretwork groove with go up the faller cooperation vacuole formation, reduce the degree of depth of shoulder hole, and then reduce the processing degree of difficulty, guarantee to reduce the processing cost under the condition of effectively fixed probe. The end part of the probe is limited through the stepped hole, and one end of the probe is clamped and fixed.

Preferably, a second hollow groove matched with the first hollow groove is formed in the bottom of the upper needle plate.

According to the scheme, the second hollowed-out groove is arranged to reduce the quality of the upper needle plate, so that the assembly is facilitated, and meanwhile, the processing of the stepped hole on the upper needle plate is facilitated.

According to a preferable scheme, the lower needle plate is provided with a plurality of positioning pins, and the upper needle plate is provided with a plurality of limiting holes matched with the plurality of positioning pins.

According to the scheme, the guide limiting of the upper needle plate is performed through the positioning pin, so that the mounting precision of the upper needle plate is improved, and the guide of the probe is accurately performed.

A further preferred scheme is that the upper needle plate comprises a fixing plate and at least one adjusting plate, a plurality of probes are arranged on the fixing plate and the adjusting plate, the plurality of probes connected to the fixing plate are used for conducting a core circuit, and the positions of the plurality of probes on the adjusting plate are arranged corresponding to the positions of contacts of the test module.

According to the scheme, the upper needle plate is formed by two or more plates, so that the conduction connection of components required by the test or work of the probes connected with the fixing plate is realized, the positions of the needle holes on the adjusting plate are determined by the components to be tested, and the matching and the rapid model changing are realized according to the types and functions of the components to be tested or the circuit board. The edge shapes of the fixed plate and the adjusting plate are matched, and a flat plate surface is formed under the limit of the positioning pin. Meanwhile, during maintenance, the corresponding plate can be opened according to the fault part for maintenance without being completely opened.

Still further preferably, the fixing plate and the adjusting plate are both connected to at least one of the positioning pins.

According to the scheme, the fixing plate and the adjusting plate are limited through the corresponding positioning pins, so that the mounting accuracy of the fixing plate and the adjusting plate is improved, and the matching degree of the fixing plate and the adjusting plate is improved.

Preferably, the lower needle plate is also provided with a plurality of guide pins matched with the edges of the products to be connected.

According to the scheme, the guide pin is arranged to guide and limit the edges of the products to be connected.

Drawings

FIG. 1 is a schematic view of a first configuration of the present invention;

FIG. 2 is a second schematic structural view of the present invention;

FIG. 3 is a cross-sectional view of the present invention;

fig. 4 is an enlarged view of a portion a in fig. 3.

Detailed Description

As shown in fig. 1 to 4, in this embodiment, the present invention includes an upper needle plate 1, a lower needle plate 2, and a plurality of probes 3, a boss 4 adapted to the upper needle plate 1 is disposed on the lower needle plate 2, a first hollow groove 5 is disposed in the boss 4, and a plurality of stepped holes 6 adapted to end portions of the probes 3 are disposed on both the upper needle plate 1 and the lower needle plate 2.

In this embodiment, the bottom of the upper needle plate 1 is provided with a second hollow-out groove 7 matched with the first hollow-out groove 5.

In this embodiment, be provided with a plurality of locating pins 8 on the faller 2 down, be equipped with on the last faller 1 with a plurality of the spacing hole of 8 looks adaptations of locating pin.

In this embodiment, the upper needle plate 1 includes a fixed plate 1a and at least one adjusting plate 1b, the fixed plate 1a with all be provided with a plurality of on the adjusting plate 1b the probe 3, a plurality of connecting on the fixed plate 1a the probe 3 is used for switching on of core circuit, a plurality of on the adjusting plate 1b the position of probe 3 corresponds the contact position setting of test module.

In this embodiment, each of the fixing plate 1a and the adjusting plate 1b is connected to at least one of the positioning pins 8.

In this embodiment, the lower needle board 2 is further provided with a plurality of guide pins 9 which are matched with the edges of the products to be connected.

Claims

1. A novel faller structure which is characterized in that: it includes faller (1), faller (2) and a plurality of probe (3) down, be provided with down on faller (2) with boss (4) of going up faller (1) looks adaptation, be equipped with first fretwork groove (5) in boss (4), go up faller (1) with all be provided with down on faller (2) a plurality of with shoulder hole (6) of probe (3) tip looks adaptation.

2. A novel faller bar construction as claimed in claim 1 wherein: and a second hollow groove (7) matched with the first hollow groove (5) is arranged at the bottom of the upper needle plate (1).

3. A novel faller bar construction as claimed in claim 1 wherein: a plurality of positioning pins (8) are arranged on the lower needle plate (2), and a plurality of limiting holes matched with the positioning pins (8) are formed in the upper needle plate (1).

4. A novel faller bar construction as claimed in claim 3 wherein: go up faller (1) including fixed plate (1 a) and at least one adjusting plate (1 b), fixed plate (1 a) with all be provided with a plurality of on adjusting plate (1 b) probe (3), a plurality of connect on fixed plate (1 a) probe (3) are used for switching on of core circuit, a plurality of on adjusting plate (1 b) the position of probe (3) corresponds the contact position setting of test module.

5. A novel faller bar construction as claimed in claim 4 wherein: the fixing plate (1 a) and the adjusting plate (1 b) are both connected with at least one positioning pin (8).

6. A novel faller bar construction as claimed in claim 1 wherein: the lower needle plate (2) is also provided with a plurality of guide pins (9) matched with the edges of products to be connected.