CN217639225U - Floating jig for testing solder ball carrier plate - Google Patents
Floating jig for testing solder ball carrier plate Download PDFInfo
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- CN217639225U CN217639225U CN202220500464.9U CN202220500464U CN217639225U CN 217639225 U CN217639225 U CN 217639225U CN 202220500464 U CN202220500464 U CN 202220500464U CN 217639225 U CN217639225 U CN 217639225U
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Abstract
The utility model discloses a floating jig for solder ball support plate test, which comprises a dial, a wire coil protection box and a bottom plate, wherein the middle part of the dial fixing plate is provided with a perforation, the wire coil is arranged in the perforation, the wire coil is connected with a plurality of probes, the probes pass through the dial and the needle heads can expose out of the dial panel, and the connecting wires of the wire coil pass through a fixed supporting plate and enter the wire coil protection box; a first floating structure is arranged between the dial and the fixed supporting plate; and a second floating structure is arranged between the dial fixing plate and the fixed supporting plate. The utility model provides a test of tin ball support plate is with tool that floats is applicable to the test of tin ball technology support plate, overcomes the shortcoming of the difficult management and control of ordinary support plate tool test, pin mark and the little flexible needle of pin diameter.
Description
Technical Field
The utility model belongs to circuit board test fixture field, concretely relates to floating fixture is used in test of tin ball support plate.
Background
With the rapid development of the electronic industry, the types and kinds of carrier boards are changed differently, and more importantly, the quality requirements are more and more strict, and the density of the carrier boards is more and more dense due to the addition of a solder ball process on the basis of a common carrier board, so that the test difficulty of the solder ball carrier boards is more and more high, the test stability requirement is higher and more strict, the requirement on the pin marks is more and more strict, and the like, and the conventional carrier board jig cannot meet the requirements. The traditional carrier plate test is all tested by using a normal wire needle jig, the probe is higher than the surface of a dial face plate in a normal state, an upper die and a lower die of the jig are respectively arranged on special test equipment, and the carrier plate is tested by the pressing motion of the upper die and the lower die of the equipment, but the requirement of the tin ball carrier plate jig on the needle mark is higher, and the traditional carrier plate jig can not meet the test requirement in a manufacturing mode that the probe firstly contacts the carrier plate.
SUMMERY OF THE UTILITY MODEL
The utility model provides a technical problem that mainly solves provides a test of tin ball support plate is with tool that floats, is applicable to the test of tin ball technology support plate, overcomes the shortcoming of the difficult management and control of ordinary support plate tool test unstability, pin mark and the little flexible needle of pin diameter.
In order to solve the technical problem, the utility model discloses a technical scheme be: the floating jig comprises a needle dial, a wire coil protection box and a bottom plate, wherein the needle dial is connected to a needle dial fixing plate, a through hole is formed in the middle of the needle dial fixing plate, the wire coil is arranged in the through hole, the wire coil is connected with a plurality of probes, the probes penetrate through the needle dial, needle heads can expose out of a needle dial panel, a connecting wire of the wire coil penetrates through a fixed supporting plate and enters the wire coil protection box, the wire coil protection box is fixedly connected to the bottom plate, and the fixed supporting plate is fixedly connected to the wire coil protection box;
a first floating structure is arranged between the dial and the fixed supporting plate and comprises a plurality of first spring type guide pins, one ends of the first spring type guide pins are fixedly connected to the fixed supporting plate, and the other ends of the first spring type guide pins penetrate through the wire coil and are connected with the dial;
the dial fixed plate with be equipped with second floating structure between the fixed bolster, second floating structure includes a plurality of second spring guide pins, the one end fixed connection of second spring guide pin is in fixed bolster and syringe needle connection dial fixed plate.
The utility model can change the existing mode, the needle dial panel contacts the tin ball support plate firstly during the test, the tin ball on the tin ball support plate is contacted behind the probe, the indentation caused by the direct contact of the probe to the tin ball can be avoided, meanwhile, the diameter of the needle with the diameter of 40 mu m or less is small, and the needle bending phenomenon caused by the stress of the probe contacting the support plate firstly is avoided; the utility model discloses the test is stable, efficient, can solve the vexation that the customer pricked the trace to the tin ball, and the difficult looper of test probe can reduce cost simultaneously.
In order to solve the technical problem, the utility model discloses a further technical scheme be:
further say, still be equipped with the limit structure who restricts dial displacement range, limit structure includes that the cross-section is the limiting plate of L type, the limiting plate locate the fixed bolster the periphery and with the fixed bolster encloses into spacing chamber, dial base plate, dial fixed plate and the drum all locates spacing intracavity, the dial fixed plate with between the fixed bolster and the dial base plate with all leave the space between the dial fixed plate.
Furthermore, a guide structure is arranged between the dial fixing plate and the fixed support plate and comprises a guide pillar and a guide bearing which are coaxially arranged, the guide bearing is arranged on the fixed support plate, one end of the guide pillar is fixedly connected to the dial fixing plate, the other end of the guide pillar is located in the guide bearing, and the guide pillar can slide in the guide bearing.
The dial comprises a dial panel and a dial base plate, and the dial base plate is connected with the dial fixing plate in a specific structure that one of the dial base plate and the dial fixing plate is provided with a slot, and the other is provided with a bolt.
Further, the dial includes a dial face plate and the dial base plate, and the needle of the first spring type lead needle contacts the dial base plate.
Further, the fixed connection is a screw thread connection.
Furthermore, the diameter of the probe is less than or equal to 40 mu m.
The utility model has the advantages that:
the utility model can change the existing mode, the needle dial panel contacts the tin ball carrier plate firstly during the test, the tin ball on the tin ball carrier plate is contacted after the probe, the indentation caused by the direct contact of the probe to the tin ball can be avoided, and the diameter of the needle with the diameter of 40 μm or less is thin, the needle bending phenomenon caused by the stress of the probe contacting the carrier plate firstly is avoided; the utility model discloses the test is stable, efficient, can solve the vexation that the customer pricked the trace to the tin ball, and the difficult looper of test probe can reduce cost simultaneously.
Drawings
FIG. 1 is a schematic view of the present invention;
the parts in the drawings are marked as follows:
the wire coil protection device comprises a bottom plate 1, a wire coil 2, a wire coil protection box 3, a dial 4, a dial panel 41, a dial base plate 42, a dial fixing plate 5, a plug pin 6, a probe 7, a first spring type guide pin 8, a second spring type guide pin 9, a limiting plate 10, a guide pillar 11 and a guide bearing 12.
Detailed Description
The following description of the preferred embodiments of the present invention will be provided with reference to the accompanying drawings, so that the advantages and features of the present invention can be easily understood by those skilled in the art, and the scope of the present invention can be clearly and clearly defined.
Example (b): a floating jig for testing a solder ball carrier plate is shown in figure 1 and comprises a dial 4, a wire coil 2, a wire coil protection box 3 and a bottom plate 1, wherein the dial comprises a dial panel 41 and a dial substrate 42, the dial substrate is connected with a dial fixing plate 5, and the dial substrate is connected with the dial fixing plate in a specific structure that one of the dial substrate and the dial fixing plate is provided with a slot and the other is provided with a bolt 6, the middle part of the dial fixing plate is provided with a through hole which is round or square, the wire coil is arranged in the through hole and is connected with a plurality of probes 7, the probes penetrate through the dial and the needles can expose the dial panel, a connecting wire of the wire coil penetrates through a fixed supporting plate 13 to enter the wire coil protection box, the wire coil protection box is fixedly connected (in a screw thread connection mode) with the bottom plate, and the fixed supporting plate is fixedly connected (in a screw thread connection mode) with the wire coil protection box; the floating jig is connected to the upper part of the testing equipment through the bottom plate, the tin ball carrier plate is placed below the floating jig, the testing equipment drives the floating jig to downwards contact the tin ball carrier plate, and the tin ball carrier plate is tested by using a probe on the floating jig.
The dial base plate with be equipped with first floating structure between the fixed bolster, first floating structure includes a plurality of evenly distributed's first spring guide pin 8, the one end fixed connection of first spring guide pin in fixed bolster, the other end passes drum and syringe needle and connects the dial base plate.
The dial fixed plate with be equipped with second floating structure between the fixed bolster, second floating structure includes a plurality of evenly distributed's second spring guide pin 9, the cylinder fixed connection of second spring guide pin is in fixed bolster and syringe needle connection dial fixed plate.
Still be equipped with the limit structure who restricts the dial displacement range, limit structure includes that the cross-section is the limiting plate 10 of L type, the limiting plate locate the fixed bolster the periphery and with the fixed bolster encloses into spacing chamber, dial base plate, dial fixed plate and the drum is all located spacing intracavity, the dial fixed plate with between the fixed bolster and the dial base plate with all leave the space between the dial fixed plate.
A guide structure is arranged between the dial fixing plate and the fixed supporting plate, the guide structure comprises a guide pillar 11 and a guide bearing 12 which are coaxially arranged, the guide bearing is arranged on the fixed supporting plate, one end of the guide pillar is fixedly connected to the dial fixing plate, the other end of the guide pillar is located in the guide bearing, and the guide pillar can slide in the guide bearing.
In the present embodiment, it is preferable that the diameter of the probe is 40 μm or less.
The utility model discloses a theory of operation does:
the floating jig is connected above the testing equipment through the bottom plate, the tin ball support plate is placed below the floating jig, the testing equipment drives the floating jig to downwards contact the support plate, the dial panel is in contact with the tin ball support plate and is stressed, the dial downwards extrudes the stress to enable the first spring type guide pin and the second spring type guide pin to shrink, the whole dial and the dial fixing block are downwards extruded, and the probe is in contact with the tin ball on the tin ball support plate and is tested.
The utility model discloses the test is stable, efficient, can solve the vexation that the customer pricked the trace to the tin ball, and the difficult looper of test probe can reduce cost simultaneously.
The above only is the embodiment of the present invention, not limiting the scope of the present invention, all the equivalent structure changes made in the specification and the attached drawings or directly or indirectly applied to other related technical fields are included in the same principle as the present invention.
Claims (7)
1. A floating jig for testing a solder ball carrier plate is characterized in that: the novel wire coil comprises a needle dial, a wire coil protection box and a bottom plate, wherein the needle dial is connected to a needle dial fixing plate, a through hole is formed in the middle of the needle dial fixing plate, the wire coil is arranged in the through hole, the wire coil is connected with a plurality of probes, the probes penetrate through the needle dial, needle heads can expose out of a needle dial panel, connecting wires of the wire coil penetrate through a fixed supporting plate and enter the wire coil protection box, the wire coil protection box is fixedly connected to the bottom plate, and the fixed supporting plate is fixedly connected to the wire coil protection box;
a first floating structure is arranged between the dial and the fixed supporting plate and comprises a plurality of first spring type guide pins, one ends of the first spring type guide pins are fixedly connected to the fixed supporting plate, and the other ends of the first spring type guide pins penetrate through the wire coil and are connected with the dial;
the dial fixed plate with be equipped with second floating structure between the fixed bolster, second floating structure includes a plurality of second spring guide pins, the one end fixed connection of second spring guide pin is in fixed bolster and syringe needle connection dial fixed plate.
2. The floating jig for testing solder ball carrier boards of claim 1, wherein: still be equipped with the limit structure who restricts dial displacement range, limit structure includes that the cross-section is the limiting plate of L type, the limiting plate locate the peripherad of fixed support board and with fixed support board encloses into spacing chamber, dial base plate, dial fixed plate and drum all locate spacing intracavity, the dial fixed plate with between the fixed support board and the dial base plate with all leave the space between the dial fixed plate.
3. The floating jig for testing solder ball carrier boards of claim 1, wherein: the needle dial fixing plate is characterized in that a guide structure is arranged between the needle dial fixing plate and the fixed supporting plate, the guide structure comprises a guide pillar and a guide bearing which are coaxially arranged, the guide bearing is arranged on the fixed supporting plate, one end of the guide pillar is fixedly connected to the needle dial fixing plate, the other end of the guide pillar is located in the guide bearing, and the guide pillar can slide in the guide bearing.
4. The floating jig for testing solder ball carrier boards of claim 2, wherein: the dial comprises a dial panel and a dial base plate, and the dial base plate is connected with the dial fixing plate in a specific structure that one of the dial base plate and the dial fixing plate is provided with a slot, and the other is provided with a bolt.
5. The floating jig for testing solder ball carrier boards of claim 2, wherein: the dial comprises a dial panel and a dial base plate, and the needle head of the first spring type guide needle is in contact with the dial base plate.
6. The floating jig for testing solder ball carrier of claim 1, wherein: the fixed connection is screw thread connection.
7. The floating jig for testing solder ball carrier of claim 1, wherein: the diameter of the probe is less than or equal to 40 mu m.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220500464.9U CN217639225U (en) | 2022-03-09 | 2022-03-09 | Floating jig for testing solder ball carrier plate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220500464.9U CN217639225U (en) | 2022-03-09 | 2022-03-09 | Floating jig for testing solder ball carrier plate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217639225U true CN217639225U (en) | 2022-10-21 |
Family
ID=83643920
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202220500464.9U Active CN217639225U (en) | 2022-03-09 | 2022-03-09 | Floating jig for testing solder ball carrier plate |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217639225U (en) |
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2022
- 2022-03-09 CN CN202220500464.9U patent/CN217639225U/en active Active
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