CN215067240U

CN215067240U - Hall element three-dimensional magnetic field testing device

Info

Publication number: CN215067240U
Application number: CN202120269234.1U
Authority: CN
Inventors: 茹建成
Original assignee: Shaoxing Qianxin Electronic Technology Co ltd
Current assignee: Shaoxing Qianxin Electronic Technology Co ltd
Priority date: 2021-01-29
Filing date: 2021-01-29
Publication date: 2021-12-07
Anticipated expiration: 2031-01-29

Abstract

The utility model discloses a three-dimensional magnetic field testing arrangement of hall element, including support and testboard, the support is used for supporting the testboard, is equipped with three group's coils on the testboard, and three group's coils are X axle coil assembly respectively, Y axle coil assembly and Z axle coil assembly, X axle coil assembly, the magnetic field direction of Y axle coil assembly and Z axle coil assembly is mutually perpendicular in the space, is equipped with the cushion cap between X axle coil assembly and the Y axle coil assembly, and the cushion cap is used for placing the component that needs the test, is equipped with the circuit board on the testboard, and the circuit board is located the below of coil assembly, and the circuit board is used for feeding back the test result, the utility model discloses rational in infrastructure, constitute a three-dimensional magnetic field through three group's coils, put into the cushion cap with the original paper after, can test the magnetic field of the three direction of chip promptly, need not to carry out a lot of tests, improves detection efficiency.

Description

Hall element three-dimensional magnetic field testing device

Technical Field

The utility model relates to a hall element testing arrangement field, in particular to three-dimensional magnetic field testing arrangement of hall element.

Background

The Hall element is a magnetic sensor based on Hall effect, and has the advantages of small volume, simple and convenient use, high measuring accuracy, capability of measuring alternating and direct current magnetic fields and the like, so that the Hall element is widely used for measuring the magnetic fields and is matched with other devices for physical measurement and automatic control of positions, displacements, rotating speeds, angles and the like.

When the existing tower crane tests the Hall element, the three groups of magnetic fields are divided into two groups of devices to test the Hall element, so that the testing efficiency is reduced. In view of the above problems, a solution is proposed as follows.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing a three-dimensional magnetic field testing arrangement of hall element has and combines a testing arrangement with three magnetic fields of group, forms a three-dimensional magnetic field on a testing arrangement to the performance test in the magnetic field to the chip can be accomplished once to the messenger, improves detection efficiency's advantage.

The above technical purpose of the present invention can be achieved by the following technical solutions:

the utility model provides a three-dimensional magnetic field testing arrangement of hall element, includes support and testboard, the support is used for supporting the testboard, be equipped with three group's coils on the testboard, three groups the coil is X axle coil assembly, Y axle coil assembly and Z axle coil assembly respectively, the magnetic field direction mutually perpendicular in the space of X axle coil assembly, Y axle coil assembly and Z axle coil assembly, be equipped with the cushion cap between X axle coil assembly and the Y axle coil assembly, the cushion cap is used for placing the component that needs the test, be equipped with the circuit board on the testboard, the circuit board is located the below of coil assembly, the circuit board is used for feeding back the test result.

Preferably, the inner side of the Z-axis coil group is provided with an installation block, and the X-axis coil group and the Y-axis coil are both positioned in the installation block and matched with the installation block.

Preferably, one side of the support is provided with a lifting device, the lifting device comprises a fixed plate and a lifting plate, the fixed plate is fixedly connected with one side of the support, the lifting plate is fixedly connected with one side of the test board, a cylinder is arranged in the fixed plate, and the cylinder is used for driving the lifting plate to move.

Preferably, one side of the bracket is provided with a lower sensor for limiting the lowest position of the test bench.

Preferably, the lower end of one side of the test board is provided with an inserting plate, the lower sensor is provided with an inserting groove, the inserting plate is in inserting fit with the inserting groove, and the inserting plate is used for limiting the lowest position of the test board.

Preferably, the bracket is provided with two magnetic switches, the two magnetic switches are an upper magnetic switch and a lower magnetic switch respectively, the lifting plate is fixedly provided with a limiting block, the limiting block is located between the upper magnetic switch and the lower magnetic switch, and the upper magnetic switch and the lower magnetic switch are used for limiting the moving position of the limiting block.

Preferably, the support is L-shaped, and a plurality of connecting holes are formed in the bottom surface of the support and used for fixing the support.

Preferably, the bearing platform is provided with a placement groove, and the placement groove is used for placing the chip.

Preferably, the circuit board comprises a daughter circuit board and a mother circuit board, the daughter circuit board is located right below the bearing platform, and the daughter circuit board is electrically connected with the mother circuit board.

The utility model has the advantages that: the X-axis coil group, the Y-axis coil group and the Z-axis coil group form a three-dimensional magnetic field, when an external turret machine pushes an element to be tested downwards, the cylinder drives the lifting plate to move upwards, so that the bearing platform moves upwards, the element on the turret machine is placed into the placement groove of the bearing platform, and the parameter test of the element in the magnetic field environment is realized.

Drawings

FIG. 1 is a schematic structural diagram of an embodiment;

FIG. 2 is a side view of the embodiment;

FIG. 3 is a top view of the embodiment;

fig. 4 is a sectional view of the embodiment.

Reference numerals: 1. a support; 2. a test bench; 3. an X-axis coil assembly; 4. a Y-axis coil assembly; 5. a Z-axis coil assembly; 6. a bearing platform; 7. mounting blocks; 8. a fixing plate; 9. a lifting plate; 10. a cylinder; 11. a lower sensor; 12. inserting plates; 13. a slot; 14. an upper magnetic switch; 15. a lower magnetic switch; 16. a limiting block; 17. a placing groove; 18. a sub-circuit board; 19. a mother circuit board.

Detailed Description

The following is only the preferred embodiment of the present invention, the protection scope is not limited to this embodiment, and all technical solutions belonging to the idea of the present invention should belong to the protection scope of the present invention. In which like parts are designated by like reference numerals. It should be noted that as used in the following description, the terms "front," "back," "left," "right," "upper," and "lower" refer to directions in the drawings, and the terms "bottom" and "top," "inner," and "outer" refer to directions toward and away from, respectively, the geometric center of a particular component.

As shown in fig. 1, the three-dimensional magnetic field testing device for the hall element comprises a support 1 and a testing table 2. The support 1 is L-shaped, a plurality of connecting holes are formed in the bottom surface of the support 1, and the fastening piece penetrates through the connecting holes and is connected with an external turret machine.

As shown in fig. 1 and 4, a lifting device is disposed on one side of the support 1, the lifting device includes a fixed plate 8 and a lifting plate 9, the fixed plate 8 is fixedly connected to one side of the support 1, and the lifting plate 9 is fixedly connected to one side of the test bench 2. Be equipped with cylinder 10 in the fixed plate 8, cylinder 10 is used for driving lift plate 9 and removes. The cylinder 10 is activated to drive the lifting plate 9 to move, and the lifting plate 9 drives the test platform 2 to move upwards. The test station 2 and the turret machine are moved in both directions to place the component into the test station 2 for testing.

As shown in fig. 1, the support 1 is used for supporting the test table 2, and three groups of coils are arranged on the test table 2, and are respectively an X-axis coil group 3, a Y-axis coil group 4 and a Z-axis coil group 5. The inner side of the Z-axis coil group 5 is provided with an installation block 7, and the X-axis coil group 3 and the Y-axis coil are both positioned in the installation block 7.

As shown in fig. 1, the X-axis coil assembly 3, the Y-axis coil assembly 4, and the Z-axis coil assembly 5 form a magnetic field in a three-dimensional space, and when a component is placed on the test table 2, parameters of the component in the magnetic field in each direction can be tested.

As shown in fig. 1 and 3, a bearing platform 6 is provided between the X-axis coil assembly 3 and the Y-axis coil assembly 4, a placement groove 17 is provided on the bearing platform 6, and a component on the turret machine is placed in the placement groove 17 for detection.

As shown in fig. 1 and 4, the test platform 2 is provided with a circuit board, the circuit board includes a sub circuit board 18 and a mother circuit board 19, the sub circuit board 18 is located right below the support platform 6, pins on the installation groove 17 are connected with circuits on the sub circuit board 18, and the sub circuit board 18 is electrically connected with the mother circuit board 19, so that the circuit board can complete feedback of a chip test result.

After the detection, the cylinder 10 will drive the lifting plate 9 to move downwards. An upper magnetic switch 14 and a lower magnetic switch 15 are arranged on the bracket 1, a limiting block 16 is fixedly arranged on the lifting plate 9, and the limiting block 16 is positioned between the upper magnetic switch 14 and the lower magnetic switch 15. The limiting block 16 can only move between the upper magnetic switch 14 and the lower magnetic switch 15, and when the limiting block 16 moves to be in contact with the upper magnetic switch 14, the chip is sent into the placing groove 17 by the rotating tower machine for testing. When the plate of restriction is moved into contact with the lower magnetic switch 15, the turret machine continues to start rotating.

As shown in fig. 1 and 2, a lower sensor 11 is disposed on one side of the bracket 1, the lower sensor 11 can sense the position of the lifting block, an insertion plate 12 is disposed at the lower end of one side of the test platform 2, an insertion slot 13 is disposed on the lower sensor 11, when the lifting block moves to the lowest end, the insertion plate 12 is inserted into the insertion slot 13, the lower sensor 11 feeds back the position information, and at this time, the turret machine can continue to rotate, thereby preventing the device from being damaged.

The working principle is as follows: the turret machine rotates to send the element to be tested to the upper end of the test platform 2, the turret machine drives the element to move downwards, meanwhile, the cylinder 10 drives the test platform 2 to move upwards, the element can smoothly enter the placing groove 17 of the bearing platform 6, and the three groups of coils form a three-dimensional magnetic field around the placing groove 17 to test the element.

After the test is finished, the air cylinder 10 drives the lifting plate 9 to move downwards until the lifting plate moves to the lowest position, the lower position sensor 11 feeds back signals, and the turret machine can not rotate continuously to perform the next test.

The above-mentioned embodiments further explain in detail the technical problems, technical solutions and advantages solved by the present invention, and it should be understood that the above only is a specific embodiment of the present invention, and is not intended to limit the present invention, and any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the scope of the present invention.

Claims

1. The utility model provides a three-dimensional magnetic field testing arrangement of hall element, includes support (1) and testboard (2), its characterized in that, support (1) is used for supporting testboard (2), be equipped with three group's coils on testboard (2), three groups the coil is X axle coil group (3), Y axle coil group (4) and Z axle coil group (5) respectively, the magnetic field direction mutually perpendicular in the space of X axle coil group (3), Y axle coil group (4) and Z axle coil group (5), be equipped with cushion cap (6) between X axle coil group (3) and Y axle coil group (4), cushion cap (6) are used for placing the component that needs the test, be equipped with the circuit board on testboard (2), the circuit board is located the below of coil group, the circuit board is used for feeding back the test result.

2. The Hall element three-dimensional magnetic field testing device according to claim 1, wherein a mounting block (7) is arranged inside the Z-axis coil set (5), and the X-axis coil set (3) and the Y-axis coil are both located inside the mounting block (7) and are matched with the mounting block (7).

3. The Hall element three-dimensional magnetic field testing device according to claim 1, wherein a lifting device is arranged on one side of the support (1), the lifting device comprises a fixed plate (8) and a lifting plate (9), the fixed plate (8) is fixedly connected with one side of the support (1), the lifting plate (9) is fixedly connected with one side of the test bench (2), a cylinder (10) is arranged in the fixed plate (8), and the cylinder (10) is used for driving the lifting plate (9) to move.

4. The Hall element three-dimensional magnetic field testing device according to claim 1, wherein one side of the bracket (1) is provided with a lower sensor (11), and the lower sensor (11) is used for limiting the lowest position of the testing platform (2).

5. The Hall element three-dimensional magnetic field testing device according to claim 4, wherein an inserting plate (12) is arranged at the lower end of one side of the testing platform (2), a slot (13) is arranged on the lower position sensor (11), the inserting plate (12) is in inserting fit with the slot (13), and the inserting plate (12) is used for limiting the lowest position of the testing platform (2).

6. The Hall element three-dimensional magnetic field testing device according to claim 3, wherein the bracket (1) is provided with two magnetic switches, the two magnetic switches are respectively an upper magnetic switch (14) and a lower magnetic switch (15), the lifting plate (9) is fixedly provided with a limit block (16), the limit block (16) is located between the upper magnetic switch (14) and the lower magnetic switch (15), and the upper magnetic switch (14) and the lower magnetic switch (15) are used for limiting the moving position of the limit block (16).

7. The Hall element three-dimensional magnetic field testing device according to claim 1, wherein the support (1) is L-shaped, and a plurality of connecting holes are formed in the bottom surface of the support (1) and used for fixing the support (1).

8. The Hall element three-dimensional magnetic field testing device according to claim 1, wherein a placement groove (17) is formed in the bearing platform (6), and the placement groove (17) is used for placing a chip.

9. The Hall element three-dimensional magnetic field testing device according to claim 1, wherein the circuit board comprises a sub circuit board (18) and a mother circuit board (19), the sub circuit board (18) is located right below the bearing platform (6), and the sub circuit board (18) is electrically connected with the mother circuit board (19).