CN215031323U - Pressure testing mechanism of integrated circuit testing and sorting machine - Google Patents
Pressure testing mechanism of integrated circuit testing and sorting machine Download PDFInfo
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- CN215031323U CN215031323U CN202120153922.1U CN202120153922U CN215031323U CN 215031323 U CN215031323 U CN 215031323U CN 202120153922 U CN202120153922 U CN 202120153922U CN 215031323 U CN215031323 U CN 215031323U
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Abstract
The utility model provides an integrated circuit test sorter presses and surveys accredited testing organization, including detecting the fixed plate and being located a plurality of detection chip pressing mechanism that detect fixed plate the place ahead, every chip pressing mechanism corresponds the preceding test seat of detection fixed plate, chip pressing mechanism includes the fixed block, the fixed block middle part is equipped with the whereabouts groove that is used for the chip whereabouts along fixed block length direction, whereabouts groove both sides are equipped with the fluting that stretches out the fixed block for the pin of chip both sides, the fixed block is preceding to be equipped with and to insert the whereabouts inslot and be used for supporting the separation blade of whereabouts chip, the fixed block is preceding to be equipped with and to be used for promoting the fixed block towards the drive assembly who detects the fixed plate direction and remove for test the pin of chip and the contact of detection seat contact. The utility model relates to a rationally, simple structure, convenient to use makes chip whereabouts to separation blade, thereby tests the pin of chip and the contact of detecting seat contact, has the practicality.
Description
Technical Field
The utility model relates to an integrated circuit test sorter presses survey accredited testing organization.
Background
After the semiconductor device is manufactured, the semiconductor device needs to be detected and sorted, and unqualified chips are selected; the traditional test method generally adopts manual test, wastes time and labor and has low efficiency.
SUMMERY OF THE UTILITY MODEL
The utility model discloses improve above-mentioned problem, promptly the to-be-solved technical problem of the utility model is to provide an integrated circuit test sorter presses and surveys accredited testing organization, simple structure and high efficiency.
The utility model discloses a constitute like this, it is including detecting the fixed plate and being located a plurality of detection chip pressing mechanism in detection fixed plate the place ahead, and every chip pressing mechanism corresponds the preceding test seat of detection fixed plate, chip pressing mechanism includes the fixed block, the fixed block middle part is equipped with the whereabouts groove for the chip whereabouts along fixed block length direction, whereabouts groove both sides are equipped with the fluting that stretches out the fixed block for the pin of chip both sides, the fixed block is preceding to be equipped with and to insert the separation blade that falls the inslot and be used for supporting the chip that falls, the fixed block is preceding to be equipped with and to promote the fixed block towards the drive assembly who detects the fixed plate direction and remove for test the pin of chip and the contact of detection seat contact.
Further, the driving assembly comprises a vertical plate, a U-shaped sliding block capable of moving along the length direction of the vertical plate is arranged on the side portion of the vertical plate, a pressing plate is arranged on the side portion of the U-shaped sliding block, the rear portion of the pressing plate is connected with the fixed block, and the front end of the pressing plate is connected with a driving cylinder used for driving the fixed block to press towards the direction of the detection seat.
Furthermore, a pressing block is arranged on the side portion of the pressing plate, the separation blade is fixed behind the pressing block, a separation blade cylinder used for driving the pressing block and the separation blade to move back and forth is arranged on the front portion of the pressing plate, and the separation blade cylinder is fixed on the front end portion of the pressing plate.
Furthermore, the middle part of the vertical plate is provided with a sliding groove along the length direction of the vertical plate, the U-shaped sliding block is sleeved in the sliding groove and moves along the sliding groove, and the driving cylinder is fixed at the front end part of the vertical plate.
Furthermore, the fixed block is provided with an insertion hole for the baffle sheet to penetrate into the falling groove from front to back.
Further, the material guide blocks are arranged above and below the fixed block, and the middle of each material guide block is provided with a falling groove communicated with the falling groove for the chips to fall through.
Furthermore, the front end of the baffle is U-shaped.
Compared with the prior art, the utility model discloses following beneficial effect has: the device has simple structure, reasonable design and convenient use, and improves the working efficiency; when the testing device works, the separation blade cylinder drives the separation blade to extend into the falling groove, the chip moves to the position of the separation blade through the falling groove, the separation blade is used for supporting the driving assembly to drive the fixed block and chip pins extending out of the fixed block to be in contact with the detecting seat contact piece, and the chip pins correspond to the testing seat contact piece one by one to complete testing; after detection is finished, the blocking piece resets, and the chip is conveyed continuously along the falling groove.
Drawings
FIG. 1 is a perspective view of an embodiment of the present invention;
FIG. 2 is a schematic structural view of a pressing mechanism of a detection chip according to an embodiment of the present invention;
FIG. 3 is an exploded view of the pressing mechanism of the chip according to the embodiment of the present invention;
fig. 4 is a schematic structural diagram of a driving assembly according to an embodiment of the present invention;
fig. 5 is a schematic structural view of a fixing block according to an embodiment of the present invention;
FIG. 6 is an enlarged view of a portion of FIG. 2 at A;
fig. 7 is a sectional view of a fixing block according to an embodiment of the present invention;
in the figure: 1-detection fixing plate, 2-detection chip pressing mechanism, 21-fixing block, 211-falling groove, 212-slotting, 213-jack, 22-baffle, 3-test seat, 4-driving component, 41-vertical plate, 411-sliding groove, 42-U-shaped sliding block, 43-pressing plate, 44-driving cylinder, 45-pressing block, 46-baffle cylinder, 5-chip, 6-guide block and 7-position sensor.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.
Example (b): as shown in fig. 1 to 7, in the present embodiment, a pressure testing mechanism for an integrated circuit testing sorter is provided, which includes a testing fixing plate 1 and four testing chip pressing mechanisms 2 located in front of the testing fixing plate, wherein four testing seats 3 are arranged in front of the testing fixing plate, each chip pressing mechanism corresponds to the testing seat 3 in front of the testing fixing plate, each chip pressing mechanism includes a fixing block 21, a dropping slot 211 for dropping a chip is arranged in the middle of the fixing block along the length direction of the fixing block, open slots 212 for extending pins at both sides of the chip out of the fixing block are arranged at both sides of the dropping slot, a catch 22 for inserting into the dropping slot and supporting the dropped chip is arranged in front of the fixing block, a driving assembly 4 for pushing the fixing block to move towards the testing fixing plate is arranged in front of the fixing block, so as to test the pins of the chip 5 in contact with the contact pads of the testing seats, and distinguishing qualified chips from unqualified chips.
In this embodiment, the driving assembly includes a vertical plate 41, a U-shaped slider 42 capable of moving along the vertical plate in the length direction is disposed on the side of the vertical plate, a pressing plate 43 is disposed on the side of the U-shaped slider, the rear of the pressing plate is connected to the fixing block, and the front end of the pressing plate is connected to a driving cylinder 44 for driving the fixing block to press the detection seat.
The middle of the vertical plate is provided with a sliding groove 411 along the length direction of the vertical plate, the U-shaped sliding block is sleeved in the sliding groove and moves along the sliding groove, and the driving cylinder is fixed at the front end of the vertical plate.
In this embodiment, a pressing block 45 is arranged on the side portion of the pressing plate, the baffle is fixed behind the pressing block, a baffle cylinder 46 for driving the pressing block and the baffle to move back and forth is arranged on the front portion of the pressing plate, and the baffle cylinder is fixed on the front end portion of the pressing plate.
In this embodiment, the fixing block is provided with a jack 213 for the blocking piece to penetrate into the falling groove from front to back, so as to stretch the blocking piece into the falling groove, so that the chip falls on the blocking piece, and the chip is conveniently aligned with the detection seat for detection.
In this embodiment, the material guiding blocks 6 are arranged above and below the fixing block, and the middle of each material guiding block is provided with a falling groove communicated with the falling groove for the chip to fall through.
In this embodiment, the front end of the blocking piece is U-shaped, so as to ensure that the chip is kept stable and not inclined, and ensure that the chip pins correspond to the contact pieces of the test socket one to one.
In this embodiment, the side of the chip pressing mechanism is provided with a position sensor 7 for monitoring whether the chip falls on the stopper.
In the embodiment, when the testing device works, the separation blade cylinder drives the separation blade to extend into the falling groove, so that the chip falls on the separation blade, and meanwhile, the pins of the chip are ensured to be in one-to-one correspondence with the contact pieces of the testing seat; the driving cylinder is started to drive the fixed block and the chip pins extending out of the fixed block to be in contact with the contact pieces of the detection seat, and testing is carried out; after the test is finished, the driving cylinder resets, the catch cylinder resets, the tested chip continues to move downwards along the falling groove, and the subsequent qualified chips and unqualified chips are sorted; in addition, the four detection chip pressing mechanisms can operate simultaneously.
Any technical solution disclosed in the present invention is, unless otherwise stated, disclosed a numerical range if it is disclosed, and the disclosed numerical range is a preferred numerical range, and any person skilled in the art should understand that: the preferred ranges are merely those values which are obvious or representative of the technical effect which can be achieved. Because numerical value is more, can't be exhaustive, so the utility model discloses just disclose some numerical values with the illustration the technical scheme of the utility model to, the numerical value that the aforesaid was enumerated should not constitute right the utility model discloses create the restriction of protection scope.
Also, above-mentioned the utility model discloses if disclose or related to mutually fixed connection's spare part or structure, then, except that other the note, fixed connection can understand: a detachable fixed connection (for example using bolts or screws) is also understood as: non-detachable fixed connections (e.g. riveting, welding), but of course, fixed connections to each other may also be replaced by one-piece structures (e.g. manufactured integrally using a casting process) (unless it is obviously impossible to use an integral forming process).
In addition, the terms used in any aspect of the present disclosure as described above to indicate positional relationships or shapes include similar, analogous, or approximate states or shapes unless otherwise stated.
The utility model provides an arbitrary part both can be assembled by a plurality of solitary component parts and form, also can be the solitary part that the integrated into one piece technology was made.
Finally, it should be noted that the above embodiments are only used for illustrating the technical solutions of the present invention and not for limiting the same; although the present invention has been described in detail with reference to preferred embodiments, it should be understood by those skilled in the art that: the invention can be modified or equivalent substituted for some technical features; without departing from the spirit of the present invention, it should be understood that the scope of the claims is intended to cover all such modifications and variations.
Claims (7)
1. The utility model provides an integrated circuit test separator presses surveys accredited testing organization, a serial communication port, including detecting the fixed plate and being located a plurality of detection chip pressing mechanism that detect the fixed plate the place ahead, every chip pressing mechanism corresponds the preceding test seat that detects the fixed plate, chip pressing mechanism includes the fixed block, the fixed block middle part is equipped with the whereabouts groove that is used for the chip whereabouts along fixed block length direction, whereabouts groove both sides are equipped with the fluting that stretches out the fixed block for the pin of chip both sides, the fixed block is preceding to be equipped with and to insert the separation blade that falls the inslot and be used for supporting the chip that falls, the fixed block is preceding to be equipped with and to promote the fixed block towards the drive assembly who detects the fixed plate direction and remove for test the pin of chip and detect the contact piece contact.
2. The pressure testing mechanism of integrated circuit testing sorting machine according to claim 1, wherein the driving component comprises a vertical plate, a U-shaped slider capable of moving along the length direction of the vertical plate is arranged on the side portion of the vertical plate, a pressing plate is arranged on the side portion of the U-shaped slider, the rear portion of the pressing plate is connected with a fixed block, and the front end of the pressing plate is connected with a driving cylinder for driving the fixed block to press towards the direction of the detection seat.
3. The pressure testing mechanism of integrated circuit testing separator according to claim 2, wherein the side of the pressure plate is provided with a pressing block, the baffle is fixed at the rear of the pressing block, the front of the pressure plate is provided with a baffle cylinder for driving the pressing block and the baffle to move back and forth, and the baffle cylinder is fixed at the front end of the pressure plate.
4. The pressure testing mechanism of the integrated circuit testing and sorting machine according to claim 2, wherein a sliding groove is formed in the middle of the vertical plate along the length direction of the vertical plate, the U-shaped sliding block is sleeved in the sliding groove and moves along the sliding groove, and the driving cylinder is fixed to the front end portion of the vertical plate.
5. The pressure testing mechanism of claim 1, wherein the fixing block is provided with a hole for inserting the stopper into the drop chute from front to back.
6. The pressure testing mechanism of claim 1, wherein a material guiding block is disposed above and below the fixing block, and a dropping slot connected to the material guiding block is disposed in the middle of the material guiding block for the chip to drop through.
7. The integrated circuit testing handler of claim 1, wherein the front end of the blocking blade is U-shaped.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120153922.1U CN215031323U (en) | 2021-01-20 | 2021-01-20 | Pressure testing mechanism of integrated circuit testing and sorting machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120153922.1U CN215031323U (en) | 2021-01-20 | 2021-01-20 | Pressure testing mechanism of integrated circuit testing and sorting machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215031323U true CN215031323U (en) | 2021-12-07 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202120153922.1U Active CN215031323U (en) | 2021-01-20 | 2021-01-20 | Pressure testing mechanism of integrated circuit testing and sorting machine |
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| CN (1) | CN215031323U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114535148A (en) * | 2022-01-17 | 2022-05-27 | 广东气派科技有限公司 | Pressure measuring device suitable for gravity separator |
-
2021
- 2021-01-20 CN CN202120153922.1U patent/CN215031323U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114535148A (en) * | 2022-01-17 | 2022-05-27 | 广东气派科技有限公司 | Pressure measuring device suitable for gravity separator |
| CN114535148B (en) * | 2022-01-17 | 2024-02-09 | 广东气派科技有限公司 | Pressure measurement device suitable for gravity type separator |
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