CN214974127U - Liquid helium-free ultralow-temperature testing device with temperature of 1K - Google Patents
Liquid helium-free ultralow-temperature testing device with temperature of 1K Download PDFInfo
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- CN214974127U CN214974127U CN202023199985.5U CN202023199985U CN214974127U CN 214974127 U CN214974127 U CN 214974127U CN 202023199985 U CN202023199985 U CN 202023199985U CN 214974127 U CN214974127 U CN 214974127U
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Abstract
The utility model provides a no liquid helium ultra-low temperature test device of 1K temperature, includes refrigerator, instrument skirt, vacuum casing, its characterized in that: the refrigerator, the instrument skirt and the vacuum shell are sequentially connected from top to bottom; the vacuum shell is provided with a helium inlet, a helium outlet and a needle valve knob, the needle valve knob penetrates through the upper surface of the vacuum shell and is connected with a needle valve in the vacuum shell, and the needle valve performs throttling cooling on precooled normal-pressure helium; the vacuum shell is internally provided with a heat exchanger, a needle valve, a 1K tank, a heat anchor and a gas circuit and used for refrigerating and throttling the helium from a helium inlet so as to cool the helium to 1K, the ultralow-temperature helium at 1K and the liquid helium generated by helium cooling are gathered in the 1K tank to stabilize the 1K temperature of the test environment and then discharged from a helium outlet. Based on the technical scheme of the invention, the ultralow temperature liquid helium testing environment with the temperature as low as 1K can be realized, and the liquid helium testing device is used for sample testing or thermometer calibration, saves cost, and is simple and convenient.
Description
Technical Field
The invention relates to the field of low-temperature physical experiment devices, in particular to a liquid helium-free ultralow-temperature testing device with a temperature of 1K.
Background
At present, with the development of low temperature technology, the technology of a liquid helium-free secondary refrigerator is developed quite mature, the liquid helium temperature of about 4K can be obtained under the condition of not consuming liquid helium, and the normal operation of the refrigerator for a long time is kept. However, commercial two-stage refrigerators are generally only capable of achieving a minimum limit temperature of around 3K, and dilution or adiabatic demagnetization refrigerators are used in combination if a temperature of the order of 1K or less is to be achieved. This adds significantly to the acquisition costs of the ultra-low temperature testing environment.
In addition, the ultralow temperature of the liquid helium can be realized by pumping the liquid helium by using a vacuum pump and reducing the saturation vapor pressure of the liquid helium, but the method consumes a large amount of liquid helium, is difficult to continue, and the consumed liquid helium needs to be refilled, so that the steps are complicated. Moreover, since liquid helium is expensive, the cost of obtaining ultra-low temperatures using this method is also high.
The technique of throttling expansion is also known as Joule-Thomson (J-T) expansion, i.e. the process of adiabatic expansion of a fluid at a higher pressure through a throttle valve in the direction of a lower pressure. According to the thermodynamic principle, pressure causes a change in temperature, also known as the J-T effect. Helium exhibits a positive J-T effect at ambient temperatures above the joule-thomson transition temperature, i.e. the gas temperature increases as the pressure decreases; helium exhibits a negative J-T effect at ambient temperatures below the joule-thomson conversion temperature, i.e. the gas temperature decreases with decreasing pressure. The throttle expansion technology can be used for obtaining about 1K ultralow temperature condition by using a 4K refrigerator commonly used in the prior art under the condition of not consuming a large amount of liquid helium, however, a method and a device for realizing ultralow temperature by using the throttle expansion technology do not appear in the prior art.
Therefore, a simple and convenient 1K ultra-low temperature testing environment acquisition device with low cost is needed.
Disclosure of Invention
In order to solve the defects in the prior art, the invention aims to provide a liquid helium-free ultralow temperature testing device with the temperature of 1K, which is based on a throttling expansion technology and realizes an ultralow temperature testing environment with the temperature of 1K through a common secondary refrigerator.
The invention adopts the following technical scheme. A liquid helium-free ultralow temperature testing device with the temperature of 1K comprises a refrigerator 1, an instrument skirt 2 and a vacuum shell 6, wherein the refrigerator 1, the instrument skirt 2 and the vacuum shell 6 are sequentially connected from top to bottom; the vacuum shell 6 is provided with a helium inlet 3, a helium outlet 4 and a needle valve knob 5, the needle valve knob 5 penetrates through the upper surface of the vacuum shell 6 and is connected with a needle valve 17 inside the vacuum shell 6, and the needle valve 17 is used for throttling and cooling precooled normal-pressure helium; the vacuum casing 6 is internally provided with a heat exchanger, a needle valve 17, a 1K tank 18, a heat anchor 16 and an air path 21, and is used for refrigerating and throttling the helium from the helium inlet 3 so as to cool the helium to 1K, the ultralow-temperature helium of 1K and the liquid helium generated by helium cooling are collected in the 1K tank 18 to stabilize the 1K temperature of the test environment and then discharged from the helium outlet 4.
Preferably, refrigerator 1 is a G-M refrigerator or a pulse tube refrigerator.
Preferably, the main part of the refrigerator 1, which comprises the primary 9 and secondary 13 coldheads, is arranged inside the vacuum housing 6 via the instrument skirt 2.
Preferably, the first-stage cold joint 9 is provided with a first-stage cold joint adapter 10, the second-stage cold joint 13 is provided with a second-stage cold joint adapter 14, and the first-stage cold joint 9 and the second-stage cold joint 13 are connected from top to bottom; and, be provided with activated carbon canister 22 and 40K heat exchanger 11 on the first-order cold junction switching 10, be provided with 4K heat exchanger 15 on the second grade cold junction switching 14, be provided with 10K heat exchanger 12 between first-order cold junction switching 10 and the second grade cold junction switching 14.
Preferably, the primary cold joint adapter 10 is provided with a cold shield 19, and the cold shield is a cavity made of oxygen-free copper or aluminum.
Preferably, the gauge skirt 2 is provided with a safety valve 7, a vacuum through electrical connector 8 and a vacuum valve 23.
Preferably, the cold screen 9, the secondary cold head adapter 14 and the 1K tank 18 are respectively provided with a thermometer 25, and the 1K tank 18 is provided with a heater 24.
Preferably, the 1K tank 18 and the needle valve 17 are sequentially connected to the helium outlet 4 and the needle valve knob 5 outside the vacuum housing 6 through the second-stage cold junction adapter 14 and the first-stage cold junction adapter 10, and are fixed by the hot anchor 16 while passing through the second-stage cold junction adapter 14 and the first-stage cold junction adapter 10.
Preferably, the thermal anchor 16 is an oxygen-free copper block for reducing thermal radiation in the ultra-low temperature region.
Preferably, the 1K pot 18 is used to fix the sample to be tested; the 1K tank 18 is an indium-sealed detachable structure for testing a sample in a low-temperature exchange gas environment or an external sample holder for testing a sample in a low-temperature vacuum environment or calibrating a thermometer.
Compared with the prior art, the liquid helium-free ultralow temperature testing device with the temperature of 1K can obtain the ultralow temperature testing environment with the temperature of 1K through a common secondary refrigerator based on the throttling expansion technology. Therefore, the invention only needs to modify the equipment on the basis of the mature secondary refrigerator in the prior art. Therefore, the invention has the advantages of simple realization, low cost, stable effect, energy saving and environmental protection.
Drawings
FIG. 1 is a schematic perspective view of a 1K temperature ultra-low temperature testing apparatus without liquid helium in accordance with the present invention;
FIG. 2 is a top view of a 1K temperature ultra-low temperature testing apparatus without liquid helium in accordance with the present invention;
FIG. 3 is a cross-sectional view of a 1K temperature ultra-low temperature testing apparatus without liquid helium in accordance with the present invention.
Reference numerals:
1-refrigerating machine
2-instrument skirt
3-helium gas inlet
4-helium gas outlet
5-needle valve knob
6-vacuum housing
7-safety valve
8-vacuum penetration electrical connector
9-first-stage cold head
10-first order cold junction adapter
11-40K heat exchanger
12-10K heat exchanger
13-two-stage cold head
14-two stage cold junction adapter
15-4K heat exchanger
16-heat anchor
17-needle valve
18-1K pot
19-Cold Screen
20-cold shield support plate
21-internal gas circuit
22-activated carbon canister
23-vacuum valve
24-heater
25-thermometer
Detailed Description
The present application is further described below with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and the protection scope of the present application is not limited thereby.
FIG. 1 is a schematic perspective view of a 1K temperature ultra-low temperature testing apparatus without liquid helium in accordance with the present invention; FIG. 2 is a top view of a 1K temperature ultra-low temperature testing apparatus without liquid helium in accordance with the present invention; FIG. 3 is a cross-sectional view of a 1K temperature ultra-low temperature testing apparatus without liquid helium in accordance with the present invention. As shown in figures 1-3, the liquid helium-free ultralow temperature testing device with the temperature of 1K comprises a refrigerator 1, an instrument skirt 2 and a vacuum shell 6. The refrigerator 1, the instrument skirt 2 and the vacuum shell 6 are sequentially connected from top to bottom; the vacuum shell 6 is provided with a helium inlet 3, a helium outlet 4 and a needle valve knob 5, the needle valve knob 5 penetrates through the upper surface of the vacuum shell 6 and is connected with a needle valve 17 inside the vacuum shell 6, and the needle valve 17 is used for throttling and cooling precooled normal-pressure helium; the vacuum casing 6 is internally provided with a heat exchanger, a needle valve 17, a 1K tank 18, a heat anchor 16 and an air path 21, and is used for refrigerating and throttling the helium from the helium inlet 3 so as to cool the helium to 1K, 1K ultralow-temperature helium and liquid helium generated by helium cooling are collected in the 1K tank 18 to stabilize the 1K temperature of the test environment and then discharged from the helium outlet 4.
It should be noted that, generally, after entering the inside of the testing device, the helium gas may sequentially pass through a plurality of heat exchangers to be fully precooled stage by stage. And cooling to 4K after passing through the last 4K heat exchanger. At the moment, the helium is further cooled to 1K after passing through a needle valve to generate J-T effect. At this point, part of the helium gas liquefies into liquid helium and falls to the bottom of the 1K tank. At the same time, a large amount of helium gas was collected in the upper part of the 1K tank. In this way, the temperature inside the 1K tank can be kept relatively constant over a period of time. At this time, it is possible to perform a test on a relevant sample using the inside or the periphery of the 1K tank as a test environment and to calibrate an ultra low temperature thermometer. Because a certain time is needed for completing the test, the temperature of the helium gas and the liquid helium in the 1K tank can be gradually increased due to the heat load brought by the sample and the lead thereof, the heat radiation of other elements with higher temperature in the vacuum tank and the like in the period of time, and the liquid helium is further converted into the helium gas along with the temperature increase. Thereby, the helium gas gradually enters the gas path 21 connected to the helium gas outlet 4 and is discharged from the helium gas outlet 4. In addition, the one gas path 21 connected to the helium gas outlet 4 may be a bellows. The bellows may be secured by a hot anchor 16 as it passes through the primary cold head transition 10 and the secondary cold head transition 14. Therefore, before the helium gas gradually passes through the corrugated pipe to reach the helium gas outlet 4, the helium gas is subjected to heat exchange with the heat anchor 16, gradually heated to normal temperature, and then discharged from the helium gas outlet 4.
In one embodiment of the invention, the refrigerator 1 is attached to the instrument skirt 2 and then fixed to the vacuum enclosure 6. The vacuum shell 6 is provided with a helium inlet 3, a helium outlet 4 and a needle valve knob 5.
Preferably, the refrigerator 1 may be a G-M (gifpod/McMahon, gifford-McMahon) refrigerator or a Pulse tube (Pulse tube refrigerator) refrigerator, which are commonly used in the art. Also, the refrigerator may be a two-stage 4K refrigerator. In one embodiment of the present invention, the main portion of the refrigerator 1 is disposed in the vacuum enclosure 6 through the instrument skirt 2, and the main portion thereof includes a primary cold head 9 and a secondary cold head 13.
Preferably, the first-stage cold joint 9 is provided with a first-stage cold joint adapter 10, the second-stage cold joint 13 is provided with a second-stage cold joint adapter 14, and the first-stage cold joint 9 and the second-stage cold joint 13 are connected from top to bottom; and, be provided with activated carbon canister 22 and 40K heat exchanger 11 on the first-order cold junction switching 10, be provided with 4K heat exchanger 15 on the second grade cold junction switching 14, be provided with 10K heat exchanger 12 between first-order cold junction switching 10 and the second grade cold junction switching 14.
The 40K heat exchanger 11, the 10K heat exchanger 12 and the 4K heat exchanger 15 are all made by densely coiling oxygen-free copper thin tubes and filling soldering tin in gaps. The normal temperature helium gas can sequentially flow through each heat exchanger and precool step by step so as to reduce the temperature below the J-T transition temperature.
Preferably, the primary cold joint adapter 10 is provided with a cold shield 19, and the cold shield 19 is a cavity made of oxygen-free copper or aluminum. The cold screen 19 is fixed on the first-stage cold joint adapter 10, the external portion is wrapped with a plurality of layers of Mylar films which can be used for isolating thermal radiation, and the internal portion comprises various stages of equipment for refrigeration, such as an activated carbon tank 22, a 40K heat exchanger 11, a 10K heat exchanger 12, a 4K heat exchanger 15, a needle valve 17, a 1K tank 18 and the like.
Preferably, the gauge skirt 2 is provided with a safety valve 7, a vacuum through electrical connector 8 and a vacuum valve 23. Generally, the vacuum valve 23 can be connected to a molecular pump and a vacuum gauge to perform a vacuum pumping operation on the device and a detection operation on the degree of vacuum in the device, respectively. The vacuum through electrical connection 8 can be connected to a temperature controller to accurately control the temperature within the device. In addition, various interfaces matched with instrument equipment can be added on the instrument skirt 2 according to specific test requirements.
Preferably, the cold screen 19, the secondary cold head adapter 14 and the 1K tank 18 are respectively provided with a thermometer 25, and the 1K tank 18 is provided with a heater 24. The thermometers 25 may be used to measure the temperature of the different elements, respectively, and the heaters 24 may be used to control the temperature inside the device. In an embodiment of the present invention, the 1K tank may further include a temperature control block, and the temperature control block includes two parts, namely a thermometer 25 and a heater 24. Meanwhile, a temperature control instrument is arranged outside the testing device and is connected with the device through an instrument skirt 2. It can be understood that the external temperature controller can control the temperature inside the device through the thermometer 25 and the heater 24, thereby realizing accurate temperature control with fluctuation less than ± 50 mK.
Preferably, the needle valve 17 passes through the second-stage cold junction adapter 14 and the first-stage cold junction adapter 10 in sequence to be connected to the helium outlet 4 and the needle valve knob 5 outside the vacuum housing 6 respectively, and is fixed by the hot anchor 16 when passing through the second-stage cold junction adapter 14 and the first-stage cold junction adapter 10. Wherein, the 1K tank 18 can also be connected with the helium outlet 4 through the air path 21. It should be noted that this air path 21 between the helium outlet 4 and the 1K canister 18 may be a bellows that in turn passes through the secondary cold head adapter 14 and the primary cold head adapter 10 and is secured by the hot anchor 16. In addition, the heat anchor 16 is an oxygen-free copper clamp block, and can be used for isolating heat radiation in an ultra-low temperature area and reducing heat radiation caused by heat leakage in the area.
When the device starts to work, a molecular pump is connected in through a vacuum valve 23 on the instrument skirt 2, the device is vacuumized, and then the vacuum degree in the device is monitored by using a vacuum gauge. Generally, if the vacuum degree is not enough, the helium can be cooled, but the cooling efficiency may be low, and frosting may occur on the outside of the vacuum shell 6, and the temperature cannot be reduced to the minimum. Thus, it may be set when the degree of vacuum satisfies a condition, for example, when the degree of vacuum reaches 10～4And when the mbar is higher than the mbar, the refrigerating machine is started to cool the equipment.
When the temperature of the cold screen is monitored to be reduced to 40K through the thermometer, and the temperature of the secondary cold head is reduced to 4K, high-purity helium is introduced into a helium inlet 3 on the vacuum shell 6, and at the moment, the interface air pressure of the helium inlet 3 and the interface air pressure of the helium outlet 4 are different to a certain extent. The pressure at the helium inlet 3 is higher than the pressure at the helium outlet 4. Therefore, helium gas can enter the vacuum shell 6 through the helium gas inlet 3 and is discharged from the helium gas outlet 4 after passing through the activated carbon tank 22, the 40K heat exchanger 11, the 10K heat exchanger 12, the 4K heat exchanger 15, the needle valve 17 and the 1K tank in sequence.
The above elements are connected by an air passage 21. Helium flows in the gas path 21, is gradually cooled and throttled by a needle valve to be cooled to 1K, is gradually heated to be close to room temperature through the gas path 21 after a refrigeration test is finished, and leaves from the helium outlet 4. The gas circuit 21 is made of stainless steel and an oxygen-free copper material, and preferably, the part of the gas circuit 21 connected with the heat exchanger, the activated carbon tank, the needle valve, the 1K tank and the like is a hollow thin tube or a corrugated tube made of oxygen-free copper, so that helium can better exchange heat when flowing through the part. The remaining line sections are typically hollow stainless steel tubes or corrugated tubing to avoid heat exchange between the various temperature components.
Wherein, the activated carbon canister 22 is fixed on the bottom surface of the first-stage cold joint adapter 10, the shell of the activated carbon canister is made of oxygen-free copper material, the inside of the activated carbon canister can be filled with particles of activated carbon, and the top and the bottom of the canister are respectively provided with a helium inlet and a helium outlet which are mainly used for adsorbing impurity gas in helium. After passing through the activated carbon canister 22, the helium is reduced to a temperature of about 4K by passing through the 40K heat exchanger 11, the 10K heat exchanger 12 and the 4K heat exchanger 15, respectively.
And then the helium enters the needle valve 17, the pressure at the two sides of the needle valve 17 is different due to the fact that the air pressure at the helium inlet 3 is higher than the air pressure at the helium outlet 4, the helium with relatively high pressure flows out after throttling of the needle valve and reaches a low-pressure area, so that the J-T effect is generated, and the temperature of the helium is further reduced by properly adjusting the flow rate of the needle valve 17 to enable the low-temperature helium which is fully precooled to throttle and expand due to the fact that the temperature of 4K is lower than the transition temperature of the helium. Generally, the pressure of the helium inlet 3 can be maintained at about one atmosphere, and the helium outlet 4 can be maintained at a low pressure by using a vacuum pump. Thus, the temperature of the helium can be reduced to about 1K through the throttling effect. At this time, part of the ultralow temperature helium gas is liquefied to become liquid helium, and the ultralow temperature helium gas and the liquid helium flow into the 1K tank to cool the sample. Then, the helium gas which completes the refrigeration action passes through the gas path, the temperature is gradually increased, and the helium gas is discharged from the helium gas outlet 4.
High-purity helium (with purity of more than 99.999%) can be connected to the air pump through the helium inlet 3 and the helium outlet 4 respectively outside the device, so that the high-purity helium has a closed-loop circulation gas path, the low air pressure of the helium outlet 4 can be maintained through pumping so that the helium enters the internal gas path 21 and flows together, and meanwhile, the formed closed-loop gas path can repeatedly use the helium for refrigeration without consuming additional helium. By replacing the vacuum pump with a higher pumping speed and a higher vacuum degree, the pressure of the helium inlet 3 can be further increased or the pressure of the helium outlet 4 can be reduced within a proper range, so that the temperature can be further reduced.
Preferably, the 1K tank 18 is used to provide a cryostat environment down to 1K temperature required for sample testing. By externally connecting the sample holder to the 1K tank, various tests of samples in a vacuum state can be realized, and the application fields comprise material research, electronic transport test, superconduction and the like. The temperature controller controls the output power of the heater 24 on the 1K tank 18 to accurately control the environmental temperature of the sample, so that various samples from 1K to 500K under vacuum can be tested. In addition, for samples with poor heat conductivity, such as powder or liquid, the 1K tank can be set to be of an indium seal detachable structure, and a vacuum penetrating electrical connector of the indium seal is arranged on the wall of the tank, so that the sample to be tested can be placed into the 1K tank, and the test of the temperature range of 1K to 350K is realized in the atmosphere of flowing helium.
Preferably, the sample to be measured may be a thermometer to be calibrated. Because the environmental temperature of the ultra-low temperature environment in the temperature controller can be accurately controlled, the temperature controller can be used for calibrating and testing a high-precision ultra-low temperature thermometer which is not calibrated.
Compared with the prior art, the liquid helium-free ultralow temperature testing device with the temperature of 1K can realize the ultralow temperature testing environment with the temperature as low as 1K through a common secondary refrigerator based on the throttling expansion technology. Therefore, the invention only needs to modify the equipment on the basis of the mature secondary refrigerator in the prior art. Therefore, the invention has the advantages of simple realization, low cost, stable effect, energy saving and environmental protection.
The present applicant has described and illustrated embodiments of the present invention in detail with reference to the accompanying drawings, but it should be understood by those skilled in the art that the above embodiments are merely preferred embodiments of the present invention, and the detailed description is only for the purpose of helping the reader to better understand the spirit of the present invention, and not for limiting the scope of the present invention, and on the contrary, any improvement or modification made based on the spirit of the present invention should fall within the scope of the present invention.
Claims (10)
1. The utility model provides a no liquid helium ultra-low temperature test device of 1K temperature, includes refrigerator (1), instrument skirt (2), vacuum casing (6), its characterized in that:
the refrigerator (1), the instrument skirt (2) and the vacuum shell (6) are sequentially connected from top to bottom;
the vacuum shell (6) is provided with a helium inlet (3), a helium outlet (4) and a needle valve knob (5), the needle valve knob (5) penetrates through the upper surface of the vacuum shell (6) and is connected with a needle valve (17) inside the vacuum shell (6), and the needle valve (17) is used for throttling and cooling precooled normal-pressure helium;
vacuum casing (6) inside heat exchanger, needle valve (17), 1K jar (18), heat anchor (16) and gas circuit (21) of being provided with for will come from helium import (3) helium refrigerate and throttle cooling, so that helium cooling to 1K, 1K's ultra-low temperature helium, by the liquid helium that the helium cooling generated gathers in 1K jar (18) with the 1K temperature of stable test environment, discharges from helium export (4) afterwards.
2. A 1K temperature liquid helium free ultra low temperature test apparatus as claimed in claim 1, wherein:
the refrigerator (1) is a G-M refrigerator or a pulse tube refrigerator.
3. A 1K temperature liquid helium-free ultra-low temperature test apparatus as set forth in claim 2, wherein:
the main body part of the refrigerator (1) is arranged in the vacuum shell (6) through the instrument skirt (2), and comprises a primary cold head (9) and a secondary cold head (13).
4. A 1K temperature liquid helium-free ultra-low temperature test apparatus as set forth in claim 3, wherein:
a primary cold joint adapter (10) is arranged on the primary cold joint (9), a secondary cold joint adapter (14) is arranged on the secondary cold joint (13), and the primary cold joint (9) and the secondary cold joint (13) are connected from top to bottom; and the number of the first and second electrodes,
the hot-water boiler is characterized in that an activated carbon tank (22) and a 40K heat exchanger (11) are arranged on the first-stage cold joint adapter (10), a 4K heat exchanger (15) is arranged on the second-stage cold joint adapter (14), and a 10K heat exchanger (12) is arranged between the first-stage cold joint adapter (10) and the second-stage cold joint adapter (14).
5. The 1K temperature liquid helium-free ultra-low temperature test device as set forth in claim 4, wherein:
and a cold screen (19) is arranged on the primary cold joint adapter (10), and the cold screen is a cavity formed by oxygen-free copper or aluminum.
6. A 1K temperature liquid helium free ultra low temperature test apparatus as claimed in claim 1, wherein:
the instrument skirt (2) is provided with a safety valve (7), a vacuum penetration electrical connector (8) and a vacuum valve (23).
7. The 1K temperature liquid helium-free ultra-low temperature test device as set forth in claim 5, wherein:
the cold screen (19), the secondary cold joint adapter (14) and the 1K tank (18) are respectively provided with a thermometer (25), and the 1K tank (18) is provided with a heater (24).
8. A 1K temperature liquid helium free ultra low temperature test apparatus as claimed in claim 1, wherein:
the needle valve (17) sequentially penetrates through the second-stage cold joint adapter (14) and the first-stage cold joint adapter (10) to be respectively connected to a helium outlet (4) outside the vacuum shell (6) and a needle valve knob (5), and is fixed by a hot anchor (16) when penetrating through the second-stage cold joint adapter (14) and the first-stage cold joint adapter (10);
the 1K tank (18) is connected with the helium outlet (4) through a gas path (21), and the gas path (21) sequentially penetrates through the second-stage cold joint adapter (14) and the first-stage cold joint adapter (10) and is fixed through the hot anchor (16).
9. A 1K temperature liquid helium free ultra low temperature test apparatus as claimed in claim 8, wherein:
the gas circuit (21) is a hollow thin tube or a corrugated tube, the part connected with other elements is made of oxygen-free copper materials, the non-connected part is made of stainless steel materials, and the gas circuit (21) connecting the 1K tank (18) and the helium outlet (4) is made of the corrugated tube;
the thermal anchor (16) is an oxygen-free copper clamp block for reducing thermal radiation in the ultra-low temperature region.
10. A 1K temperature liquid helium free ultra low temperature test apparatus as claimed in claim 8, wherein:
the 1K tank (18) is used for fixing a sample to be detected;
the 1K tank (18) is an indium-sealed detachable structure or an external sample holder, the indium-sealed detachable structure is used for testing samples in a low-temperature gas exchange environment, and the external sample holder is used for testing samples in a low-temperature vacuum environment or calibrating a thermometer.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN114909818A (en) * | 2022-07-18 | 2022-08-16 | 南方科技大学 | Tin separating and combining device for nuclear heat insulation demagnetization refrigeration system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN114909818A (en) * | 2022-07-18 | 2022-08-16 | 南方科技大学 | Tin separating and combining device for nuclear heat insulation demagnetization refrigeration system |
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