CN214667546U

CN214667546U - Integrated structure convenient for quick alignment measurement

Info

Publication number: CN214667546U
Application number: CN202121110745.5U
Authority: CN
Inventors: 王章鹏; 邢雪冰; 方磊; 朱国山; 胡召意; 查根胜
Original assignee: Anhui Huachuang Hongdu Photoelectric Technology Co ltd
Current assignee: Anhui Huachuang Hongdu Photoelectric Technology Co ltd
Priority date: 2021-05-24
Filing date: 2021-05-24
Publication date: 2021-11-09
Anticipated expiration: 2031-05-24

Abstract

The utility model relates to a laser survey technical field specifically is an integrated form is convenient for aim at measuring structure fast, the device comprises a device body, the device body includes the optics bottom plate, be equipped with light beam quality analyzer on the optics bottom plate, install the speculum through the damping pivot on the optics bottom plate of light beam quality analyzer one side, install the polaroid through the damping pivot on the optics bottom plate of speculum one side, install the light beam collector on the optics bottom plate of polaroid one side. The utility model discloses a be provided with speculum, polaroid, light beam collector and half-wave plate, utilize adjustable speculum and polaroid to realize changing the polarization state of incident light like this, and then the control gets into the power size of light beam quality analysis appearance, has just so reduced the process of making a round trip to add attenuator control incident power to reach rapid debugging, let the measurement of efficiency of this device higher, this device simple structure, easy and simple to handle simultaneously, the staff of being convenient for more operates.

Description

Integrated structure convenient for quick alignment measurement

Technical Field

The utility model relates to a laser survey technical field specifically is an integrated form is convenient for aim at measuring structure fast.

Background

With the continuous development of laser technology, the application of laser has spread to the fields of science and technology, military, social development and the like, and meanwhile, how to measure the parameters of the laser has become a hot problem in the research of laser technology.

Through the widening of the application of laser technology, an advanced laser beam quality analyzer has become the key of the laser application field, the existing beam quality analyzer has various structures, the beam quality analyzer with a simple structure and more measurement parameters has high market price, the product with a lower price has the problems of slow alignment measurement and the like, and the light needs to be attenuated to a certain degree when the beam quality analyzer is used, so that the measurement difficulty of workers is increased, the debugging time is too long, the measurement efficiency is influenced, and therefore, an integrated structure convenient for rapid alignment measurement needs to be designed.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide an integrated form is convenient for aim at measuring structure fast, to solve present light beam quality analysis instrument structure variety that proposes in the above-mentioned background art, wherein the more light beam quality analysis appearance market price of simple structure measurement parameter is high, and the lower product of price has but to aim at and measure slow scheduling problem, and need carry out the decay to a certain extent to light when using light beam quality analysis appearance, staff's the measurement degree of difficulty has not only been increased, and the debugging time overlength, the problem of measurement efficiency has been influenced.

In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides an integrated form is convenient for aim at measuring structure fast, includes the device body, the device body includes the optics bottom plate, be equipped with beam quality analyzer on the optics bottom plate, install the speculum through the damping pivot on the optics bottom plate of beam quality analyzer one side, install the polaroid through the damping pivot on the optics bottom plate of speculum one side, install the light beam collector on the optics bottom plate of polaroid one side, install the half-wave plate through the damping pivot on the optics bottom plate of polaroid opposite side.

Preferably, screw holes are uniformly formed in the optical bottom plate, the distance between every two screw holes is 2.5cm, M6 screws are inserted into the screw holes in the four vertexes of the optical bottom plate, and the specification of the M6 screws is matched with that of the screw holes.

Preferably, the beam quality analyzer and the beam collector are installed through a pressing block and an M6 screw, and the specification of the M6 screw is matched with that of the pressing block.

Preferably, the optical bottom plate and the pressing block are made of aluminum, and the size of the optical bottom plate is 40 × 60 cm.

Preferably, the initial installation angle of the reflector and the polarizer is 45 °, and the diameter of the polarizer and the reflector is 50 mm.

Preferably, the beam quality analyzer and the optical bottom plate on the inner side of the reflector are provided with attenuation sheet racks, one end of each attenuation sheet rack is provided with attenuation sheet grooves, and the number of the attenuation sheet grooves is three.

Compared with the prior art, the beneficial effects of the utility model are that:

1. through being provided with speculum, polaroid, beam collector and half-wave plate, utilize adjustable speculum and polaroid to realize changing the polarization state of incident light like this, and then the control gets into the power size of beam quality analysis appearance, just so reduced and made a round trip to add the process that attenuator controlled incident power to reach the rapid debugging, let the measurement of this device efficiency higher, this device simple structure, easy and simple to handle simultaneously, the staff of being convenient for more operates.

2. Through being provided with a plurality of screws and M screw, rotatory M screw just can highly promote this device is whole like this to make light beam quality analyzer's light inlet highly just with the light source highly uniform that awaits measuring, and then increased the suitability and the practical scene of this device, let this device more practical and receive the restraint of environment littleer.

3. Through being provided with decay piece frame and three decay piece groove, make the staff still can make the light attenuation piece allocate under specific conditions like this, increased the variety when this device is allocated, further promoted the application scope of this device to and can cooperate suitably, let the staff can carry out multiple debugging mode and select, make this device more humanized.

Drawings

Fig. 1 is a schematic left side top perspective view of the structure of the present invention;

fig. 2 is a schematic top view of the back of the structure of the present invention;

fig. 3 is a perspective view of the M6 screw structure of the present invention;

fig. 4 is a perspective view of the attenuation sheet rack structure of the present invention.

In the figure: 1. a device body; 110. an optical backplane; 111. a beam quality analyzer; 112. a beam dump; 113. a mirror; 114. a polarizing plate; 115. a half-wave plate; 116. a screw hole; 117. an M6 screw; 118. an attenuation sheet holder; 119. an attenuation sheet groove.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-4, the present invention provides an embodiment:

an integrated structure convenient for rapid alignment measurement comprises a device body 1, wherein a beam quality analyzer 111 and a beam collector 112 used in the structure are directly available products on the market, the principle and the connection mode of the beam quality analyzer 111 and the beam collector 112 are well known in the prior art, so that the description is omitted, the device body 1 comprises an optical bottom plate 110, the beam quality analyzer 111 is arranged on the optical bottom plate 110, a reflecting mirror 113 is arranged on the optical bottom plate 110 on one side of the beam quality analyzer 111 through a damping rotating shaft, a polarizing plate 114 is arranged on the optical bottom plate 110 on one side of the reflecting mirror 113 through a damping rotating shaft, the beam collector 112 is arranged on the optical bottom plate 110 on one side of the polarizing plate 114, a half-wave plate 115 is arranged on the optical bottom plate 110 on the other side of the polarizing plate 114 through a damping rotating shaft, and thus the polarization state of incident light can be changed by utilizing the adjustable reflecting mirror 113 and the polarizing plate 114, and then the power size that control got into light beam quality analysis appearance 111, just so reduced the process of making a round trip to add attenuation piece control incident power to reach the rapid tuning, let the measuring efficiency of this device higher, this device simple structure, easy and simple to handle simultaneously, the staff of being convenient for more operates.

Further, screw 116 has evenly been seted up on optics bottom plate 110, and the distance between each screw 116 is 2.5cm, all inserted M6 screw 117 in the screw 116 on four summits of optics bottom plate 110, and the specification of M6 screw 117 and the specification looks adaptation of screw 116, rotatory M6 screw 117 just can wholly carry out high promotion with this device like this, thereby make the light inlet height of light beam quality analysis appearance 111 just with the light source highly uniform that awaits measuring, and then increased the suitability and the practical scene of this device, make this device more practical and receive the restraint of environment littleer.

Further, the beam quality analyzer 111 and the beam collector 112 are installed through a pressing block and an M6 screw 117, and the specification of the M6 screw 117 is matched with that of the pressing block, so that the beam collector 112 and the beam quality analyzer 111 are convenient to disassemble and replace, the installation is quicker, and the working efficiency of the device in measurement preparation is indirectly improved.

Furthermore, the optical bottom plate 110 and the briquetting are all made of aluminum, and the size and the model of the optical bottom plate 110 are 40 cm by 60cm, so that the optical bottom plate has a larger working panel, is lighter and convenient, and is convenient for workers to transport and carry.

Furthermore, the initial installation angle of the reflecting mirror 113 and the polarizing plate 114 is 45 degrees, and the diameters of the polarizing plate 114 and the reflecting mirror 113 are 50mm, so that light can be irradiated on the polarizing plate 114 more easily, the allocation process of workers when the device is used is quicker, and the alignment is more convenient.

Further, install attenuation piece frame 118 on the inboard optics bottom plate 110 of beam quality analysis appearance 111 and speculum 113, attenuation piece groove 119 has been seted up to attenuation piece frame 118's one end, and the quantity of attenuation piece groove 119 is three, make the staff still can make the attenuation piece allocate under specific conditions like this, the variety when having increased this device and having allocated, the application scope of this device has further been promoted, and can cooperate suitably, let the staff can carry out multiple debugging mode and select, make this device have the hommization more.

The working principle is as follows: when a worker enables the device, M6 screws 117 are screwed on four top corners of the optical bottom plate 110 respectively, then the beam quality analyzer 111 and the beam collector 112 are fixed on the optical bottom plate 110 through press blocks, an adjustable reflecting mirror 113 is installed in front of the beam quality analyzer 111 after the installation is finished, a space capable of attenuating a sheet frame 118 is reserved in front of the reflecting mirror 113 to the beam quality analyzer 111, then a polarizing plate 114 is installed at the horizontal position of the reflecting mirror 113, and finally a half-wave plate 115 is installed in front of the polarizing plate 114 and the beam collector 112 is fixed on one side of the polarizing plate 114.

When the worker wants to test the beam quality of light with different heights, the worker only needs to rotate the M6 screw 117 to change the insertion degree into the screw hole 116 to lift the whole device.

It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Claims

1. An integrated structure facilitating rapid alignment measurement, comprising a device body (1), characterized in that: the device body (1) comprises an optical bottom plate (110), a beam quality analyzer (111) is arranged on the optical bottom plate (110), a reflecting mirror (113) is installed on the optical bottom plate (110) on one side of the beam quality analyzer (111) through a damping rotating shaft, a polarizing plate (114) is installed on the optical bottom plate (110) on one side of the reflecting mirror (113) through the damping rotating shaft, a beam collector (112) is installed on the optical bottom plate (110) on one side of the polarizing plate (114), and a half-wave plate (115) is installed on the optical bottom plate (110) on the other side of the polarizing plate (114) through the damping rotating shaft.

2. An integrated structure for facilitating rapid alignment measurements, as claimed in claim 1, wherein: screw holes (116) are uniformly formed in the optical bottom plate (110), the distance between every two screw holes (116) is 2.5cm, M6 screws (117) are inserted into the screw holes (116) at the four vertexes of the optical bottom plate (110), and the specification of the M6 screws (117) is matched with that of the screw holes (116).

3. An integrated structure for facilitating rapid alignment measurements, as claimed in claim 2, wherein: the beam quality analyzer (111) and the beam collector (112) are installed through a pressing block and an M6 screw (117), and the specification of the M6 screw (117) is matched with that of the pressing block.

4. An integrated structure for facilitating rapid alignment measurements, as claimed in claim 3, wherein: the optical bottom plate (110) and the pressing block are made of aluminum, and the size of the optical bottom plate (110) is 40 cm by 60 cm.

5. An integrated structure for facilitating rapid alignment measurements, as claimed in claim 1, wherein: the initial installation angles of the reflector (113) and the polaroid (114) are both 45 degrees, and the diameters of the polaroid (114) and the reflector (113) are 50 mm.

6. An integrated structure for facilitating rapid alignment measurements, as claimed in claim 1, wherein: the optical bottom plate (110) on the inner side of the beam quality analyzer (111) and the reflector (113) is provided with an attenuation sheet frame (118), one end of the attenuation sheet frame (118) is provided with attenuation sheet grooves (119), and the number of the attenuation sheet grooves (119) is three.