CN202057596U - Comparison-type reflectivity measuring instrument - Google Patents
Comparison-type reflectivity measuring instrument Download PDFInfo
- Publication number
- CN202057596U CN202057596U CN2011201041176U CN201120104117U CN202057596U CN 202057596 U CN202057596 U CN 202057596U CN 2011201041176 U CN2011201041176 U CN 2011201041176U CN 201120104117 U CN201120104117 U CN 201120104117U CN 202057596 U CN202057596 U CN 202057596U
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- reflectivity
- light source
- receiver
- objective table
- measuring instrument
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Abstract
The utility model discloses a comparison-type reflectivity measuring instrument, which comprises an incidence light source, an objective table, a receiver, a standard reflectivity plate and a partition screen, wherein the standard reflectivity plate and a metal sample are arranged on the objective table; the partition screen is arranged between the standard reflectivity plate and the metal sample; and the incidence light source and the receiver are correspondingly arranged above the objective table. The measuring instrument disclosed by the utility model is convenient and simple in use and has low requirement on an environment condition, i.e. as long as the change of the environment condition is not large, a measuring result is very accurate; the sample reflectivity at any reflection angles can be measured; and the reflectivity of visible light with any wavelength on a sample to be measured can be measured. The comparison-type reflectivity measuring instrument has low manufacturing cost and convenience in use and is suitable for the measurement of production fields.
Description
Technical field:
The utility model belongs to the optical measurement field, relates to a kind of device of measuring the metal sample surface reflectivity, especially compares formula albedo measurement instrument.
Background technology:
Checkout equipment commonly used both at home and abroad now is relatively harsher for environmental requirement usually, need the professional test personnel in special control laboratory, to measure, and utilize integrating sphere homogenize environmental light intensity, measure the reflectivity that certain decides angle, or the instrument price is high, or complicated operation, the online quick measurement of incompatibility, also be inconvenient to carry, be not easy to be connected with on-the-spot peripherals.
The utility model content:
Surveying instrument of the present utility model has solved surveying instrument of the prior art, the shortcoming that heaviness is not easy to carry, and have higher precision, can carry out on-line measurement.
The utility model provides comparison formula albedo measurement instrument, comprise incident light source, objective table, receiver, standard reflectivity plate and divide shield, standard reflectivity plate and metal sample all are arranged on the objective table, are provided with the branch shield between standard reflectivity plate and the metal sample; Described objective table top correspondence is provided with incident light source and receiver.
Described incident light source and receiver correspondence are arranged on the top, both sides of standard reflectivity plate.Described receiver is CCD or light power meter.Described incident light source is monochromatic source or secondary color light source.The optical filter slot is installed on the described receiver or is connected with spectrophotometer.Described objective table rotates, and places the multi-disc testing sample on the objective table simultaneously.
Surveying instrument of the present utility model has following characteristics:
Easy to use, less demanding to environmental baseline, as long as changes in environmental conditions is little, then measurement result is very accurate; Can measure the sample reflectivity under any reflection angle; Can measure the reflectivity of visible light on testing sample of any wavelength; If incident light uses the secondary color light source, then can measure the spectrum under certain reflection angle and the corresponding spectrogram of reflectivity; Can external microcomputer, on receiver 3, utilize CCD to carry out opto-electronic conversion, by microcomputer take a sample, the corresponding spectrogram of data analysis, drafting spectrum and reflectivity; Can place the multi-disc testing sample on the objective table, in process of production, it is nonconforming to detect which sheet sample reflectivity immediately; Cost of manufacture is low, and is easy to use, is fit to the measurement of production scene.
Description of drawings:
Fig. 1 is the fundamental diagram of the utility model surveying instrument;
Fig. 2 is the structural representation of the utility model surveying instrument;
Wherein: 1 is incident light source; 2 is objective table; 3 is receiver; 4 is the standard reflectivity plate, and 5 for dividing shield; 6 is testing sample.
Embodiment:
Below in conjunction with accompanying drawing the utility model is done and to be described in further detail:
Referring to Fig. 1 and Fig. 2, the surveying instrument of a kind of measurement metal (pottery, optical element etc.) sample surfaces reflectivity, its principle of work is as follows: when the light directive objective table that light source sends, be placed with standard reflectivity plate and testing sample on the rotatable objective table.Adjust incident light earlier through standard model reflection, the light intensity intensity E after can obtaining reflecting
0, adjust incident light irradiation testing sample again, can obtain catoptrical light intensity is E
X, if the reflectivity of standard reflectivity plate when certain angle is A, then can obtain the reflectivity B of testing sample,
B＝A×(E
x/E
0)
1 is incident light source among Fig. 1, can be one-wavelength laser, also polychromatic light.Incident angle can be adjusted arbitrarily, to satisfy the albedo measurement under the different incidence angles degree.Rotate objective table 2 earlier, make the incident light irradiation on standard reflectivity plate 4, be received device 3 through light reflected and accept.The reflected light light intensity E0. that can obtain from the receiver under certain reflection angle rotates objective table, make incident light irradiation testing sample again, can obtain the reflective light intensity EX after the testing sample reflection this moment from the receiver 3, thereby calculate testing sample at certain incident angle parasitic light, a branch shield is arranged between standard reflectivity plate and testing sample.
Need to prove, if use polychromatic light simply to measure, the optical filter slot is installed on receiving device 3 then, or is connected spectrophotometer, can obtain the intensity of reflected light under any wavelength in 3 backs.
Above content is to further describing that the present invention did in conjunction with concrete preferred implementation; can not assert that the specific embodiment of the present invention only limits to this; for the general technical staff of the technical field of the invention; without departing from the inventive concept of the premise; can also make some simple deduction or replace, all should be considered as belonging to the present invention and determine scope of patent protection by claims of being submitted to.
Claims (5)
1. compare formula albedo measurement instrument, it is characterized in that: comprise incident light source, objective table, receiver, standard reflectivity plate and divide shield, standard reflectivity plate and metal sample all are arranged on the objective table, are provided with the branch shield between standard reflectivity plate and the metal sample; Described objective table top correspondence is provided with incident light source and receiver.
2. compare formula albedo measurement instrument according to claim 1, it is characterized in that: described incident light source and receiver correspondence are arranged on the top, both sides of standard reflectivity plate.
3. compare formula albedo measurement instrument according to claim 1, it is characterized in that: described receiver is CCD or light power meter.
4. compare formula albedo measurement instrument according to claim 1, it is characterized in that: described incident light source is monochromatic source or secondary color light source.
5. compare formula albedo measurement instrument according to claim 1, it is characterized in that: the optical filter slot is installed on the described receiver or is connected with spectrophotometer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011201041176U CN202057596U (en) | 2011-04-11 | 2011-04-11 | Comparison-type reflectivity measuring instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011201041176U CN202057596U (en) | 2011-04-11 | 2011-04-11 | Comparison-type reflectivity measuring instrument |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202057596U true CN202057596U (en) | 2011-11-30 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011201041176U Expired - Fee Related CN202057596U (en) | 2011-04-11 | 2011-04-11 | Comparison-type reflectivity measuring instrument |
Country Status (1)
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|---|---|
| CN (1) | CN202057596U (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105527252A (en) * | 2016-01-13 | 2016-04-27 | 中国工程物理研究院激光聚变研究中心 | Optical element reflectivity measurement instrument |
| CN105651494A (en) * | 2016-03-21 | 2016-06-08 | 北京航天时代光电科技有限公司 | Testing method for reflectivity of multimode optical fiber reflector |
| CN108489937A (en) * | 2018-03-30 | 2018-09-04 | 哈尔滨工业大学 | A kind of solid material bidirectional reflectance distribution function measuring device |
| CN108801981A (en) * | 2018-06-22 | 2018-11-13 | 集美大学 | Trace quantity liquid refractivity measuring device based on self-mixed interference and measurement method |
| CN110044490A (en) * | 2019-05-21 | 2019-07-23 | 上海航天测控通信研究所 | A kind of fast switch type emissivity measurement device and measurement method |
| CN110763657A (en) * | 2019-11-20 | 2020-02-07 | 江苏赛诺格兰医疗科技有限公司 | Photoelectric digital conversion system for reflective material reflectivity test system |
| CN113008833A (en) * | 2021-02-02 | 2021-06-22 | 中国人民解放军国防科技大学 | High-precision method and device for measuring transmissivity or reflectivity of optical film |
-
2011
- 2011-04-11 CN CN2011201041176U patent/CN202057596U/en not_active Expired - Fee Related
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105527252A (en) * | 2016-01-13 | 2016-04-27 | 中国工程物理研究院激光聚变研究中心 | Optical element reflectivity measurement instrument |
| CN105651494A (en) * | 2016-03-21 | 2016-06-08 | 北京航天时代光电科技有限公司 | Testing method for reflectivity of multimode optical fiber reflector |
| CN105651494B (en) * | 2016-03-21 | 2017-11-28 | 北京航天时代光电科技有限公司 | A kind of method of testing of multimode fibre reflectance of reflector |
| CN108489937A (en) * | 2018-03-30 | 2018-09-04 | 哈尔滨工业大学 | A kind of solid material bidirectional reflectance distribution function measuring device |
| CN108801981A (en) * | 2018-06-22 | 2018-11-13 | 集美大学 | Trace quantity liquid refractivity measuring device based on self-mixed interference and measurement method |
| CN110044490A (en) * | 2019-05-21 | 2019-07-23 | 上海航天测控通信研究所 | A kind of fast switch type emissivity measurement device and measurement method |
| CN110044490B (en) * | 2019-05-21 | 2021-07-23 | 上海航天测控通信研究所 | Fast switching type emissivity measuring device and measuring method |
| CN110763657A (en) * | 2019-11-20 | 2020-02-07 | 江苏赛诺格兰医疗科技有限公司 | Photoelectric digital conversion system for reflective material reflectivity test system |
| CN113008833A (en) * | 2021-02-02 | 2021-06-22 | 中国人民解放军国防科技大学 | High-precision method and device for measuring transmissivity or reflectivity of optical film |
| CN113008833B (en) * | 2021-02-02 | 2023-09-29 | 中国人民解放军国防科技大学 | High-precision optical film transmissivity/reflectivity measurement method and device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20111130 Termination date: 20140411 |