CN214474957U

CN214474957U - Production test burning system for one-to-eight Bluetooth product

Info

Publication number: CN214474957U
Application number: CN202120590030.8U
Authority: CN
Inventors: 吴远栋; 曾世奇
Original assignee: All Core Microelectronics Technology Shenzhen Co Ltd
Current assignee: All Core Microelectronics Technology Shenzhen Co Ltd
Priority date: 2021-03-23
Filing date: 2021-03-23
Publication date: 2021-10-22
Anticipated expiration: 2031-03-23

Abstract

The utility model discloses a production test burns record system for bluetooth product drags eight, its master control MCU module is connected with outside PC, and switch circuit module is connected with the master control MCU module, and USB _ HUB module is connected with switch circuit module and PC, and USB serial ports conversion module is connected with USB _ HUB module, and level conversion module is connected with USB serial ports conversion module, and eight bluetooth products that are surveyed all are connected with level conversion module. The frequency calibration module is connected with the master control MCU module and the eight tested Bluetooth products, the current and voltage sampling circuit module is connected with the master control MCU module and the eight tested Bluetooth products, and the data return module is connected with the master control MCU module and the eight tested Bluetooth products. The utility model has the advantages that: the production efficiency is greatly improved, the productivity is improved, the labor cost is reduced, the consistency and the stability of test data are improved, and the problems that a chip or a circuit is damaged when a client carries out production burning test and the like are solved.

Description

Production test burning system for one-to-eight Bluetooth product

Technical Field

The utility model relates to a technical field of bluetooth product production, in particular to production test burns record system that is used for bluetooth product to drag eight.

Background

At present, when bluetooth products (such as bluetooth headsets) are produced, burning tests of a production line need to occupy more than two stations and labor, only one bluetooth product can be burned and tested at a time, and when the bluetooth products are burned and tested, multiple tests such as the RF performance, the electrical performance, the audio curve and the functions of the complete machine of the headset need to be tested, so that the burning test efficiency is too low, and the production and processing costs of customers are increased.

SUMMERY OF THE UTILITY MODEL

The problem that exists to prior art, the utility model aims at providing a production test burns record system for bluetooth product drags eight, and it is too low to aim at solving the current problem that is used for bluetooth product production test to burn record system efficiency of software testing, has increased customer's production and processing cost.

In order to achieve the above object, the utility model provides a production test burns record system for bluetooth product drags eight, include: the USB serial port conversion device comprises a master control MCU module, a switch circuit module, a USB _ HUB module, a USB serial port conversion module, a level conversion module, a frequency correction module, a current and voltage sampling circuit module and a data return module. The master control MCU module is connected with an external PC through a USB interface, the switch circuit module is connected with the master control MCU module, the USB _ HUB module is connected with the switch circuit module and the PC, the USB serial port conversion module is connected with the USB _ HUB module, the level conversion module is connected with the USB serial port conversion module, and eight tested Bluetooth products are all connected with the level conversion module. The frequency calibration module is connected with the master control MCU module and the eight tested Bluetooth products, the current and voltage sampling circuit module is connected with the master control MCU module and the eight tested Bluetooth products, and the data return module is connected with the master control MCU module and the eight tested Bluetooth products. The data return module and the eight tested Bluetooth products are connected with an external Bluetooth tester through signals.

Preferably, the main control MCU module adopts a single chip microcomputer with the model number of STM32F101 ZE.

Preferably, the switch circuit module adopts an analog switch with the model number of ADG 728.

Preferably, the USB _ HUB module adopts a control chip with model number FE1.1-AQFP 48A.

Preferably, the USB serial port conversion module includes: and the two USB serial port conversion chips are in signal connection with the USB _ HUB module, and the models of the two USB serial port conversion chips are both FT4232 HL.

Preferably, the level conversion module includes: two types of level conversion chips are LSF0108 PWR. The input ends of the two level conversion chips are connected with the output ends of the two USB serial port conversion chips, and the output ends of the two level conversion chips are connected with the eight tested Bluetooth products.

Preferably, the current and voltage sampling circuit module comprises MAX9938 current detection amplifier chips which are connected with the eight tested Bluetooth products one by one, and the other ends of the MAX9938 current detection amplifier chips are connected with the main control MCU module.

Preferably, the data backhaul module comprises: the model of being connected one by one with eight bluetooth products that are surveyed selects the chip for the level of FSUSB42, and the other end of level selection chip is connected with main control MCU module.

Compared with the prior art, the beneficial effects of the utility model reside in that: the beneficial effects of the utility model reside in that: the system can test and program burn eight Bluetooth products at a time, greatly improves the efficiency of producing the Bluetooth products, and improves the production capacity of customers. The labor cost of burning tests can be reduced when the customer product is produced and assembled, so that the investment of customers on product testing equipment is reduced, and meanwhile, the consistency and the stability of product testing data can be improved. Meanwhile, the system can reduce the problems of chip failure or circuit damage and the like caused by improper operation during production burning test by adding the current and voltage sampling circuit module.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.

Fig. 1 is an overall working schematic diagram of an embodiment of the present invention;

fig. 2 is a schematic circuit diagram of a single chip microcomputer according to an embodiment of the present invention;

fig. 3 is a schematic circuit diagram of an analog switch according to an embodiment of the present invention;

fig. 4 is a schematic circuit diagram of a control chip according to an embodiment of the present invention;

fig. 5 is a schematic circuit diagram of a serial port conversion chip according to an embodiment of the present invention;

fig. 6 is a schematic circuit diagram of another serial port conversion chip in an embodiment of the present invention;

fig. 7 is a schematic circuit diagram of a level shift chip according to an embodiment of the present invention;

fig. 8 is a schematic circuit diagram of another level shift chip according to an embodiment of the present invention;

fig. 9 is a schematic circuit diagram of a current sense amplifier chip according to an embodiment of the present invention;

fig. 10 is an electrical schematic diagram of a frequency calibration module according to an embodiment of the present invention;

fig. 11 is a schematic circuit diagram of a level selection chip according to an embodiment of the present invention;

the purpose of the present invention is to provide a novel and improved method and apparatus for operating a computer.

Detailed Description

The utility model provides a production test burns record system that is used for bluetooth product to drag eight.

Referring to fig. 1-11, fig. 1 is a schematic diagram of the overall operation of an embodiment of the present invention, fig. 2 is a schematic diagram of a circuit of a single chip microcomputer in an embodiment of the present invention, fig. 3 is a schematic diagram of an analog switch in an embodiment of the present invention, fig. 4 is a schematic diagram of a circuit of a control chip in an embodiment of the present invention, fig. 5 is a schematic diagram of a series of serial port conversion chips in an embodiment of the present invention, fig. 6 is a schematic diagram of a circuit of another serial port conversion chip in an embodiment of the present invention, fig. 7 is a schematic diagram of a circuit of a level conversion chip in an embodiment of the present invention, fig. 8 is a schematic diagram of a circuit of another level conversion chip in an embodiment of the present invention, fig. 9 is a schematic diagram of a circuit of a current detection amplifier chip in an embodiment of the present invention, fig. 10 is an electrical schematic diagram of a frequency calibration module in an embodiment of the present invention, fig. 11 is a schematic circuit diagram of a level selection chip according to an embodiment of the present invention.

As shown in fig. 1, in the embodiment of the present invention, the production test burning system for bluetooth product with one drive eight includes: the USB interface comprises a main control MCU module 100, a switch circuit module 200, a USB _ HUB module 300, a USB serial port conversion module 400, a level conversion module 500, a frequency calibration module 600, a current and voltage sampling circuit module 700, and a data return module 800.

The main control MCU module 100 in the system is connected with an external PC 910 through a USB interface, and the external PC 910 sends a CBC instruction to the main control MCU module 100 in the system through the USB interface. Specifically, as shown in fig. 2, in this embodiment, the master MCU module 100 is a single chip microcomputer of the model STM32F101 ZE.

The switch circuit module 200 is connected to the MCU module 100, and the MCU module 100 receives the CBC command and then establishes a handshake connection with an external PC 910 through the switch circuit module 200. Specifically, as shown in fig. 3, in the present embodiment, the switch circuit module 200 employs an analog switch of model ADG 728.

The USB _ HUB module 300 is connected to the switch circuit module 200 and the PC 910, the switch circuit module is connected to the external PC 910 through the USB _ HUB module 300, the master MCU module 100 is connected to the external PC 910 after the handshake connection, the master MCU module 100 controls the output of the USB _ HUB module 300, and at this time, the data of the test signal of the software built in the PC 910 is transmitted to the USB _ HUB module 300 through the USB cable. Specifically, as shown in fig. 4, in the present embodiment, the USB _ HUB module 300 employs a control chip with a model number FE1.1-AQFP 48A.

The USB serial port conversion module 400 is connected to the USB _ HUB module 300, and specifically, as shown in fig. 5 to 6, in this embodiment, the USB serial port conversion module 400 includes: and the two USB serial port conversion chips are in signal connection with the USB _ HUB module 300, and the models of the two USB serial port conversion chips are both FT4232 HL. After receiving the data of the test signal of the software built in the PC 910, the USB _ HUB module 300 transmits the data of the test signal to the two USB serial port conversion chips. Wherein, every USB serial ports conversion chip can realize the data with test signal by the conversion of single-chip to 4 way serial ports, and two USB serial ports conversion chips can realize by the conversion of single-chip to 8 way serial ports.

The level shift module 500 is connected to the USB serial port shift module 400, and the eight tested bluetooth products are all connected to the level shift module 500, specifically, as shown in fig. 7 to 8, in this embodiment, the level shift module 500 includes: two level conversion chips with the model number of LSF0108 PWR. The input ends of the two level conversion chips are connected with the output ends of the two USB serial port conversion chips, so that the level of each path of test signal is converted from 3.3V to 1.8V. The output ends of the two level conversion chips are connected with the eight tested Bluetooth products, and the test connection with the eight Bluetooth products is realized simultaneously.

The current and voltage sampling circuit module 700 is connected to the main control MCU module 100 and the eight tested bluetooth products, specifically, as shown in fig. 9, in this embodiment, the current and voltage sampling circuit module 700 includes a MAX9938 current detection amplifier chip connected to the eight tested bluetooth products one by one, and the other end of the MAX9938 current detection amplifier chip is connected to the main control MCU module 100. The main control MCU module 100 controls each MAX9938 current-detecting amplifier chip to collect the current and voltage of each bluetooth product to be tested, so as to determine whether the bluetooth product can work normally.

The current detection resistor can be directly connected to the RS + end and the RS-end of the MAX9938 current detection amplifier chip, the operational amplifier in the device restores the differential voltage at the two ends of the current detection resistor to the differential voltage at the two ends of the RG1, then, the internal current mirror carries OUT level conversion and amplification on the current, the generated output voltage is output to the MCU single chip microcomputer through the OUT pin, and the MCU single chip microcomputer analyzes the voltage data provided by the MAX9938 output pin.

The MAX9938 current detection amplifier chip adopts an external resistor to set voltage gain, and design flexibility is greatly improved. The MAX9938 has the function of battery reverse (error) connection protection, and also has-20V to +40V induction voltage and transient protection, and the input common mode range of the MAX9938 is 4V to 28V, and is independent of VCC power supply voltage (2.7V to 5.5V). When VCC is 5V, the supply current is as low as 20 μ a. When VCC is 0V, the input bias current on the current sensing resistor is only 1 μ a to minimize battery drain during ECU shut down. The voltage gain is set by the voltage division ratio of two external resistors, and the precision is related to the resistors. The input offset Voltage (VOS) is very small, only ± 1.2mV (maximum).

After the MCU singlechip analyzes that the current and the voltage of the tested Bluetooth products are normal, software built in the PC 910 performs software batch burning on the eight tested Bluetooth products, and after program burning is completed, the software built in the PC 910 issues items to be tested to each tested Bluetooth product through a protocol command. And enabling the tested Bluetooth product to enter a test mode.

The frequency calibration module 600 is connected with the main control MCU module 100 and the eight bluetooth products to be tested, and the structure of the frequency calibration module 600 is shown in fig. 10.

After the tested Bluetooth product enters a to-be-tested mode, the system can start to enter a frequency calibration process: the frequency calibration module 600 in the system firstly sends out corresponding radio frequency power by connecting eight different bluetooth device addresses, and performs bluetooth 2.4G frequency calibration through the frequency calibration module 600 in the system. And configuring output PWM square waves of 8 Bluetooth products to be frequency-corrected through a debugging interface, wherein the frequency of the square waves is 2441Hz, calculating the average frequency of the PWM square waves, and judging whether the average frequency of the square waves is within a test standard range. If the standard range is within the standard range, jumping to the next step to perform a Bluetooth RF test; otherwise, adjusting the crystal oscillator adjustable capacitance of the tested equipment through the debugging interface, and skipping to the frequency correction function to correct the frequency again.

The data return module 800 is connected with the main control MCU module 100 and the eight tested bluetooth products. The data returning module 800 and the eight tested bluetooth products are also connected with the external bluetooth tester 920 through signals.

After the frequency calibration of the tested bluetooth product is completed, the main control MCU module 100 in the system automatically initiates a bluetooth signal connection to the external bluetooth tester 920 through the data backhaul module 800, and searches for bluetooth services. Meanwhile, the data returning module 800 establishes bluetooth connection with eight bluetooth products to be tested. At this time, the MCU 100 will detect and determine whether the bluetooth link is successfully established, and after the connection is successful, the MCU 100 will control the bluetooth tester 920 to automatically perform the bluetooth RF test. If a tested item Fail occurs in the testing process, the main control MCU module 100 records that the tested bluetooth product of Fail is abnormal, screens out and skips the Fail abnormal content, and performs the bluetooth RF testing item of the next tested bluetooth product.

After the Bluetooth RF test is completed, the system can transmit the data measured by the tested instrument back to the PC end through the system to generate a corresponding test document, so that convenience is brought to a user to check the quality of each tested Bluetooth product, and the convenience is brought to the user to select good products and defective products.

Specifically, as shown in fig. 11, in the present embodiment, the data returning module 800 includes: the model of the level selection chip connected with the eight tested Bluetooth products one by one is FSUSB42, and the other end of the level selection chip is connected with the main control MCU module 100 and used for level conversion when the tested Bluetooth products are connected with the main control MCU module 100. Each level selection chip is further in signal connection with an external bluetooth tester 920, and is used for level conversion when the bluetooth tester 920 is connected with the main control MCU module 100.

Compared with the prior art, the beneficial effects of the utility model reside in that: the system can test and program burn eight Bluetooth products at a time, greatly improves the efficiency of producing the Bluetooth products, and improves the production capacity of customers. The labor cost of burning tests can be reduced when the customer product is produced and assembled, so that the investment of customers on product testing equipment is reduced, and meanwhile, the consistency and the stability of product testing data can be improved. Meanwhile, the system can reduce the problems of chip failure or circuit damage and the like caused by improper operation during production burning test by adding the current and voltage sampling circuit module 700.

The above only be the preferred embodiment of the utility model discloses a not consequently restriction the utility model discloses a patent range, all are in the utility model discloses a conceive, utilize the equivalent structure transform of what the content was done in the description and the attached drawing, or direct/indirect application all is included in other relevant technical field the utility model discloses a patent protection within range.

Claims

1. The utility model provides a production test burns record system for bluetooth product drags eight, its characterized in that includes: the device comprises a main control MCU module, a switch circuit module, a USB _ HUB module, a USB serial port conversion module, a level conversion module, a frequency correction module, a current and voltage sampling circuit module and a data return module; the master control MCU module is connected with an external PC (personal computer) through a USB (universal serial bus) interface, the switch circuit module is connected with the master control MCU module, the USB _ HUB module is connected with the switch circuit module and the PC, the USB serial port conversion module is connected with the USB _ HUB module, the level conversion module is connected with the USB serial port conversion module, and eight tested Bluetooth products are connected with the level conversion module; the frequency calibration module is connected with the master control MCU module and the eight tested Bluetooth products, the current and voltage sampling circuit module is connected with the master control MCU module and the eight tested Bluetooth products, and the data return module is connected with the master control MCU module and the eight tested Bluetooth products; the data return module and the eight tested Bluetooth products are connected with an external Bluetooth tester through signals.

2. The one-eight production test burning system for the Bluetooth product as claimed in claim 1, wherein the master MCU module is a single chip microcomputer with a model number of STM32F101 ZE.

3. The one-eight production test burning system for the Bluetooth product as claimed in claim 1, wherein the switch circuit module is an analog switch with model number ADG 728.

4. The one-eight production test burning system for the Bluetooth product as claimed in claim 1, wherein the USB _ HUB module employs a control chip with a model number FE1.1-AQFP 48A.

5. The system of claim 1, wherein the USB serial port conversion module comprises: and the two USB serial port conversion chips are in signal connection with the USB _ HUB module, and the models of the two USB serial port conversion chips are both FT4232 HL.

6. The one-eight production test burning system for the Bluetooth product as claimed in claim 5, wherein the level shifting module comprises: two types of level conversion chips are LSF0108 PWR; the input ends of the two level conversion chips are connected with the output ends of the two USB serial port conversion chips, and the output ends of the two level conversion chips are connected with the eight tested Bluetooth products.

7. The system of claim 1, wherein the current and voltage sampling circuit module comprises a MAX9938 current-sensing amplifier chip connected to the eight bluetooth products to be tested, and the other end of the MAX9938 current-sensing amplifier chip is connected to the main MCU module.

8. The system of claim 1, wherein the data return module comprises: and the level selection chip is connected with the eight tested Bluetooth products one by one and has the model of FSUSB42, and the other end of the level selection chip is connected with the master control MCU module.