CN214380818U - PL detecting system and line scanning PL detecting equipment - Google Patents
PL detecting system and line scanning PL detecting equipment Download PDFInfo
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- CN214380818U CN214380818U CN202023343313.7U CN202023343313U CN214380818U CN 214380818 U CN214380818 U CN 214380818U CN 202023343313 U CN202023343313 U CN 202023343313U CN 214380818 U CN214380818 U CN 214380818U
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Abstract
The utility model relates to a PL detecting system. It includes: a laser assembly, the laser assembly comprising: the laser light source is used for irradiating the crystalline silicon cell; the laser controller is electrically connected with the laser light source and used for controlling the on-off of the laser light source, and meanwhile, the laser controller can also control the laser power and the flash frequency of the laser light source; the image processing assembly comprises an industrial camera and an image processor, wherein the industrial camera is provided with a high exposure mode and a low exposure mode which can be mutually switched, the industrial camera is used for acquiring a low exposure picture by adopting the low exposure mode when a laser light source is started and acquiring a high exposure picture by adopting the high exposure mode when laser is closed, and the image processor is used for superposing and compounding the received low exposure picture and the received high exposure picture of the industrial camera into a picture. The high exposure photo can display photoluminescence phenomena on the battery piece, defects of the battery piece are judged through the luminous effect, and the low exposure photo can display grid breaking conditions of the battery piece.
Description
Technical Field
The utility model relates to a crystalline silicon cell PL detection device especially relates to a PL detecting system and line are swept PL check out test set.
Background
In the solar cell industry, the crystalline silicon cell needs to be subjected to printing defect detection. The conventional detection method mainly comprises PL (Photoluminescence) and EL (xx; electroluminescence), wherein PL is an effective method for detecting raw materials, light with the forbidden bandwidth larger than that of a semiconductor silicon wafer is used as an excitation means to excite carriers in silicon, electrons in an excited state belong to a metastable state after a light source is removed, the electrons return to a ground state in a short time, photons with the wavelength of 1100nm are released in the process, and the photons are captured by a sensitive CCD camera to obtain a radiation composite image of the silicon wafer. However, the conventional PL detection device still has insufficient precision on detecting poor printing of finished battery pieces, and is not easy to detect broken grid defects because the detected defects of the finished battery pieces are missed.
Disclosure of Invention
The utility model provides a PL detection system with higher detection precision; the problem of exist among the prior art to finished product battery piece detection precision not enough is solved.
The above technical problem of the present invention can be solved by the following technical solutions: a PL detection system is used for detecting a crystalline silicon battery piece, and is characterized in that: the method comprises the following steps:
A laser assembly, the laser assembly comprising:
the laser light source is used for irradiating the crystalline silicon cell;
the laser controller is electrically connected with the laser light source and used for controlling the on-off of the laser light source, and meanwhile, the laser controller can also control the laser power and the flash frequency of the laser light source;
an image processing component, including an industrial camera and an image processor,
the industrial camera is provided with a high exposure mode and a low exposure mode which can be switched mutually, and is used for acquiring a low exposure picture by adopting the low exposure mode when the laser light source is started and acquiring a high exposure picture by adopting the high exposure mode when the laser is closed,
and the image processor is used for superposing and compounding the received low exposure picture and the received high exposure picture of the industrial camera into one picture.
The industrial camera of the utility model has two shooting modes of a high exposure mode and a low exposure mode, for example, when the laser is turned on, the shooting environment brightness is high, and in order to avoid overexposure, the shooting is carried out in the low exposure mode; after the laser is turned off, the brightness of the shooting environment is low, the self luminescence of the photoluminescence phenomenon of the battery piece is weak, and in order to clearly shoot the luminescence phenomenon, the high exposure mode needs to be adopted for shooting. Correspondingly, the low exposure picture obtained in the low exposure mode displays more details on the battery piece, such as broken gate defects, due to high shooting brightness; the high exposure picture obtained in the high exposure mode can clearly show the photoluminescence display of the battery piece, and the defects of the battery piece are judged according to the light emitting condition. The utility model discloses last output is the synthetic picture after will highly expose the picture and lowly expose the picture synthesis, can show multiple defect simultaneously.
Further, the industrial camera is a line scan camera, and the frequency of turning on and off the laser light source is 500Hz to 8000 Hz. The shooting principle of the line scanning camera is as follows: the image formed by one scanning shot is linear, and multiple scanning shots are needed to form a plane view by the linear graph. The laser light source is required to continuously flash, the line scanning camera adopts a low exposure mode to shoot when the laser is turned on every time, and the line scanning camera adopts a high exposure mode to shoot when the laser is turned off every time.
After the cell slice finishes one-time scanning and photographing, the line scanning camera can synthesize all the line scanning pictures obtained in each high exposure mode into a complete high exposure image, and synthesize all the line scanning pictures obtained in each low exposure mode into a complete low exposure image. The line scanning camera has a better imaging effect compared with a common industrial camera, is good at shooting objects in motion, and is more suitable for assembly line shooting operation.
Further, the industrial camera is an indium gallium arsenic CCD camera, which is one of line scan cameras. The defect type light of the cell excited by the laser is in the wavelength region of 808-. The general response wavelength range of the silicon material is from ultraviolet to about 1000nm, and the detection range of the indium gallium arsenic CCD camera is 800nm-1550nm, so that the silicon material is more suitable.
Further, the image processor includes: the video acquisition card is used for receiving the low exposure picture and the high exposure picture and converting the low exposure picture and the high exposure picture into data; and the upper computer is used for receiving the data of the video acquisition card and is electrically connected with the industrial camera, and the upper computer can be used for controlling the shooting of the industrial camera. The image output port of the industrial camera is in data connection with the video acquisition card, the upper computer is electrically connected with the industrial camera, and the upper computer is internally provided with image processing software for comparing the low exposure image, the high exposure image and the corresponding sample sheet, marking the defect part, and finally combining the two images into one image for output.
Further, the utility model discloses still include: inductor and industrial computer, the inductor is used for sensing the battery piece time with signal of telecommunication send for the industrial computer, and the industrial computer is used for receiving the signal of telecommunication of inductor and gives laser controller and host computer with this signal transmission, and the steerable laser light source of laser controller received behind the signal of industrial computer opens the closure, and steerable industrial camera shoots after the signal of industrial computer is received to the host computer, and the effect of industrial computer lies in control industrial camera and laser light source synchronous operation.
The utility model also discloses a PL check out test set is swept to line, its characterized in that: the PL detection system as described above, comprising a transport device, the transport device comprising:
The conveyor belt is used for conveying the crystalline silicon battery pieces,
the PL detection system is arranged on the mounting frame, the laser light source and the industrial camera are located on the upper portion of the conveying belt and form an acquisition area on the conveying belt, and the sensor is used for sensing that the battery piece enters the acquisition area, transmitting signals to the laser controller and the upper computer through the industrial personal computer, and enabling the laser light source and the industrial camera to be controlled to be started. Since the above-described PL detection system has the above-described technical effects, the line-scanning PL detection apparatus having the PL detection system also has the same technical effects. The utility model discloses come in with the conveyer belt integration, this is unanimous by the conveyer belt transportation with actual well battery piece, makes the utility model discloses have fine suitability with current production line.
Furthermore, the moving speed of the conveyor belt is 100-400 mm/s. The moving speed of the conveyor belt is not higher than 400mm/s, otherwise, a virtual image is generated on a picture shot by the line scanning camera, and the definition of the picture is influenced; and the moving speed of the conveyor belt is lower than 100mm/s, so that the overall detection efficiency is influenced.
Further, the exposure time of the low exposure mode of the industrial camera is 80 to 150 microseconds, and the exposure time of the high exposure mode is 800 to 2000 microseconds. The exposure time is too long, the picture is overexposed, the exposure time is too short, the picture is too dark, and the exposure time is set reasonably so that a clear picture can be obtained.
Further, the flicker frequency of the laser light source is 500 to 8000Hz, and the flicker space ratio of the laser light source is 20 to 80 percent. The flicker frequency and the duty ratio of the laser light source actually correspond to a laser light-emitting time interval and a laser closing time interval, and the lower limit of the two time intervals is determined by the time consumption of a low exposure mode and a high exposure mode of the camera, namely the laser light-emitting time interval is larger than the exposure time of the low exposure mode, and the laser closing time interval is larger than the exposure time of the high exposure mode.
Furthermore, the wavelength of the laser light source is 800-1100 nm, and the laser in the range can better excite the battery piece to generate photoluminescence.
Furthermore, an optical filter with the wavelength of 900nm is arranged in front of the high-speed line scanning camera lens and used for filtering the influence of visible light.
Therefore, compared with the prior art, the utility model has the following characteristics: 1. because the utility model discloses a shoot the battery piece under the different luminance through two kinds of exposure modes of height, finally output height exposes to the sun the picture and exposes to the sun the picture, and height exposes to the sun the picture and can show that the battery piece removes the defect beyond the disconnected bars, and the low disconnected bars condition that exposes to the sun the picture can show the battery piece, guarantees that the testing result is accurate more reliable.
Drawings
Fig. 1 is a schematic structural diagram of the present invention.
Detailed Description
The technical solution of the present invention is further specifically described below by way of examples and with reference to the accompanying drawings.
Through research, although small broken grid defects on the cell can be captured by a camera theoretically, the defects can be found only under the condition of extremely high contrast and low exposure, the phenomenon of photoluminescence of the cell cannot be observed under the environment, and corresponding defects cannot be found, namely, the shooting conditions required by different defects on the cell are mutually contradictory.
Example 1: referring to fig. 1, a PL detection system for detecting a crystalline silicon cell, includes:
a laser assembly, the laser assembly comprising:
the laser light source 1 is used for irradiating the crystalline silicon cell 7;
the laser controller 11 is electrically connected with the laser light source and used for controlling the on-off of the laser light source, and meanwhile, the laser controller can also control the laser power and the flash frequency of the laser light source;
an image processing assembly, comprising an industrial camera 2 and an image processor,
the industrial camera is provided with a high exposure mode and a low exposure mode which can be switched mutually, the industrial camera is used for collecting a low exposure picture by adopting the low exposure mode when a laser light source is started and collecting a high exposure picture by adopting the high exposure mode when the laser is closed,
And the image processor is used for superposing and compounding the received low exposure pictures and the high exposure pictures of the industrial camera into one picture.
The industrial camera 2 is a line scan camera, and the frequency of turning on and off the laser light source 1 is 500HZ to 8000 HZ. The shooting principle of the line scanning camera is as follows: the image formed by one scanning shot is linear, and multiple scanning shots are needed to form a plane view by the linear graph. The laser light source is required to continuously flash, the line scanning camera adopts a low exposure mode to shoot when the laser is turned on every time, and the line scanning camera adopts a high exposure mode to shoot when the laser is turned off every time.
After the cell slice finishes one-time scanning and photographing, the line scanning camera can synthesize all the line scanning pictures obtained in each high exposure mode into a complete high exposure image, and synthesize all the line scanning pictures obtained in each low exposure mode into a complete low exposure image. The line scanning camera has a better imaging effect compared with a common industrial camera, is good at shooting objects in motion, and is more suitable for assembly line shooting operation.
The industrial camera 2 is an indium gallium arsenic CCD camera, which is one of line scan cameras. The defect type light of the cell excited by the laser is in the wavelength region of 808-. The general response wavelength range of the silicon material is from ultraviolet to about 1000nm, and the detection range of the indium gallium arsenic CCD camera is 800nm-1550nm, so that the silicon material is more suitable.
Referring to fig. 1, the image processor includes: a video capture card 51 for receiving and converting low exposure pictures and high exposure pictures into data; and the upper computer 5 is used for receiving the data of the video acquisition card 51 and electrically connected with the industrial camera, and can be used for controlling the shooting of the industrial camera. The image output port of the industrial camera is in data connection with the video acquisition card, the upper computer is electrically connected with the industrial camera, and the upper computer is internally provided with image processing software for comparing the low exposure image, the high exposure image and the corresponding sample sheet, marking the defect part, and finally combining the two images into one image for output.
Referring to fig. 1, the present embodiment further includes: inductor 6 and industrial computer 8, inductor 6 is used for sensing the battery piece time with signal of telecommunication send for the industrial computer, the industrial computer is used for receiving the signal of telecommunication of inductor and gives laser controller and host computer with this signal transmission, the steerable laser light source of laser controller receipt industrial computer after the signal opens the closure, the steerable industrial camera of host computer receipt industrial computer after the signal shoots, the effect of industrial computer lies in control industrial camera and laser light source synchronous operation.
The embodiment also discloses a line scanning PL detection device, which comprises the PL detection system and a conveying device, wherein the conveying device comprises:
A conveyor belt 3 for conveying the crystalline silicon battery pieces,
the sensor is used for sensing that the battery piece enters the acquisition area, transmitting a signal to the laser controller and the upper computer through the industrial personal computer, and controlling the laser light source and the industrial camera to be started. Since the above-described PL detection system has the above-described technical effects, the line-scanning PL detection apparatus having the PL detection system also has the same technical effects.
The speed of movement of the conveyor belt was 200 mm/s.
The exposure time of the low exposure mode of the industrial camera is 100 microseconds, and the exposure time of the high exposure mode is 1200 microseconds.
The flicker frequency of the laser light source is 500-8000 Hz, and the flicker space ratio of the laser light source is 20-80%. The flicker frequency and the duty ratio of the laser light source actually correspond to a laser light-emitting time interval and a laser closing time interval, and the lower limit of the two time intervals is determined by the time consumption of a low exposure mode and a high exposure mode of the camera, namely the laser light-emitting time interval is larger than the exposure time of the low exposure mode, and the laser closing time interval is larger than the exposure time of the high exposure mode.
The wavelength of the laser light source is 800-1100 nm, and the laser in the range can better excite the battery piece to generate photoluminescence.
Referring to fig. 1, a filter 21 with a wavelength of 900nm is disposed in front of the lens of the high-speed line scanning camera for filtering the influence of visible light.
The invention may be modified in many ways which will be obvious to a person skilled in the art, and such modifications are not to be considered as a departure from the scope of the invention. All such modifications as would be obvious to one skilled in the art are intended to be included within the scope of this claim.
Claims (10)
1. A PL detection system is used for detecting a crystalline silicon battery piece, and is characterized in that: the method comprises the following steps:
a laser assembly, the laser assembly comprising:
the laser light source (1) is used for irradiating the crystalline silicon battery piece;
a laser controller (11) electrically connected with the laser light source and used for controlling the on-off of the laser light source,
an image processing assembly comprising an industrial camera (2) and an image processor,
the industrial camera is provided with a high exposure mode and a low exposure mode which can be switched mutually, and is used for acquiring a low exposure picture by adopting the low exposure mode when the laser light source is started and acquiring a high exposure picture by adopting the high exposure mode when the laser is closed,
And the image processor is used for superposing and compounding the received low exposure picture and the received high exposure picture of the industrial camera into one picture.
2. A PL detection system as claimed in claim 1, wherein: the industrial camera (2) is a line scanning camera, and the frequency of the on and off of the laser light source (1) is 500HZ to 8000 Hz.
3. A PL detection system as claimed in claim 2, wherein: the industrial camera (2) is an indium gallium arsenic CCD camera, and the image processor comprises: the video acquisition card (51) is used for receiving the low exposure picture and the high exposure picture and converting the low exposure picture and the high exposure picture into data; and the upper computer (5) is used for receiving the data of the video acquisition card (51) and is electrically connected with the industrial camera, and the upper computer can be used for controlling the shooting of the industrial camera.
4. A PL detection system as claimed in any one of claims 1 to 3, wherein: further comprising: inductor (6) and industrial computer (8), when inductor (6) are used for sensing the battery piece with signal of telecommunication send for the industrial computer, the industrial computer is used for receiving the signal of telecommunication of inductor and gives laser controller and host computer with this signal transmission.
5. A PL check out test set is swept to line which characterized in that: comprising a PL detection system as claimed in any one of claims 1 to 4.
6. The line scan PL detection apparatus of claim 5, wherein: comprising a transfer device comprising:
a conveyor belt (3) for conveying the crystalline silicon battery pieces,
the PL detection system is arranged on the mounting frame, the laser light source and the industrial camera are located on the upper portion of the conveying belt and form an acquisition area on the conveying belt, and the sensor is used for sensing that the battery piece enters the acquisition area, transmitting signals to the laser controller and the upper computer through the industrial personal computer, and enabling the laser light source and the industrial camera to be controlled to be started.
7. The line scan PL detection apparatus of claim 6, wherein: the speed of the conveyor belt is 100-400 mm/s.
8. The line scan PL detection apparatus of claim 7, wherein: the exposure time of the low exposure mode of the industrial camera is 80 to 150 microseconds, and the exposure time of the high exposure mode is 800 to 2000 microseconds.
9. The line scan PL detection device of claim 8, wherein: the wavelength of the laser light source (1) is 800 to 1100 nm.
10. The line scan PL detection apparatus of claim 5, wherein: an optical filter (21) with the wavelength of 900nm is arranged in front of the lens of the industrial camera (2).
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| Application Number | Priority Date | Filing Date | Title |
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| CN202023343313.7U CN214380818U (en) | 2020-12-31 | 2020-12-31 | PL detecting system and line scanning PL detecting equipment |
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| CN202023343313.7U CN214380818U (en) | 2020-12-31 | 2020-12-31 | PL detecting system and line scanning PL detecting equipment |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114914166A (en) * | 2022-06-07 | 2022-08-16 | 波粒（北京）光电科技有限公司 | Device for online detection of perovskite battery by photoluminescence |
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2020
- 2020-12-31 CN CN202023343313.7U patent/CN214380818U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114914166A (en) * | 2022-06-07 | 2022-08-16 | 波粒（北京）光电科技有限公司 | Device for online detection of perovskite battery by photoluminescence |
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