CN214335089U - Test circuit, test device and electronic equipment - Google Patents
Test circuit, test device and electronic equipment Download PDFInfo
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- CN214335089U CN214335089U CN202023126017.1U CN202023126017U CN214335089U CN 214335089 U CN214335089 U CN 214335089U CN 202023126017 U CN202023126017 U CN 202023126017U CN 214335089 U CN214335089 U CN 214335089U
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- 238000012360 testing method Methods 0.000 title claims abstract description 149
- 230000002159 abnormal effect Effects 0.000 claims abstract description 29
- 230000002265 prevention Effects 0.000 claims description 14
- 230000000087 stabilizing effect Effects 0.000 claims description 6
- 238000000034 method Methods 0.000 description 14
- 238000013522 software testing Methods 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 2
- 230000006641 stabilisation Effects 0.000 description 2
- 238000011105 stabilization Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
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Abstract
The utility model discloses a test circuit, device and electronic equipment belongs to test technical field. The utility model discloses a test circuit includes anti-disassembly group, host system and indicating module, and anti-disassembly group includes at least two anti-disassembly lines, and host system connects each anti-disassembly line respectively, and host system is used for obtaining the operating condition of test circuit; the indicating module is connected with the main control module; the indicating module is connected with the main control module. The main control module is used for sending the working state to the indicating module; the working state comprises a normal state; the indicating module is used for indicating the normal state or the abnormal state of the disconnection-preventing circuit when the test circuit is in the normal state. The test circuit is simple in test, can realize quick test of the anti-wire-disconnecting, and improves the test efficiency.
Description
Technical Field
The utility model relates to a test technical field especially relates to a test circuit, device and electronic equipment.
Background
At present, the test process of preventing the wire from being disconnected in the product is comparatively complicated, influences efficiency of software testing, therefore, how to provide a simple test circuit, realizes improving efficiency of software testing to preventing the quick test of wire from being disconnected, becomes the problem that awaits a urgent need to solve.
SUMMERY OF THE UTILITY MODEL
The utility model discloses aim at solving one of the technical problem that exists among the prior art at least. Therefore, the utility model provides a test circuit, the test is simple, can realize improving efficiency of software testing to preventing the quick test of tear-open line.
The utility model discloses still provide a testing arrangement who has above-mentioned test circuit.
The utility model discloses still provide an electronic equipment who has above-mentioned testing arrangement.
According to utility model's first aspect embodiment's test circuit, include:
the anti-dismantling line group comprises at least two anti-dismantling lines;
the main control module is respectively connected with each anti-disconnection wire, and is used for acquiring the working state of the test circuit;
the indicating module is connected with the main control module;
the main control module is used for sending the working state to the indicating module; the working state comprises a normal state; the indicating module is used for indicating the normal state or the abnormal state of the disconnection prevention line when the test circuit is in the normal state.
According to the utility model discloses test circuit has following beneficial effect at least: the test circuit obtains the working state of the test circuit through the main control module, and the indicating module can indicate the normal state or the abnormal state of each anti-disconnection of the anti-disconnection group when receiving a control instruction according to the working state of the test circuit, so that the test process is simple, the rapid test of the anti-disconnection can be realized, and the test efficiency is improved.
According to some embodiments of the invention, the indication module comprises:
the anode of each light emitting diode is connected with the main control module, and the cathode of each light emitting diode is grounded.
According to some embodiments of the invention, the indication module further comprises:
the first end of each resistor is connected with the cathode of the corresponding light emitting diode, the resistors are in one-to-one correspondence with the light emitting diodes, and the second end of each resistor is grounded.
According to some embodiments of the invention, the indication module further comprises:
the single chip microcomputer is connected with the main control module and used for detecting the normal state or the abnormal state of the anti-disconnecting wire;
the first display screen is connected with the output end of the single chip microcomputer and used for displaying the normal state or the abnormal state of the anti-disconnecting link.
According to some embodiments of the present invention, the model of the single chip microcomputer is STC89C516 RD.
According to some embodiments of the present invention, the test circuit further comprises a power module, the power module comprising:
the voltage stabilizing IC chip is connected with the anti-disassembling wire group and used for supplying power.
According to some embodiments of the present invention, the model of the voltage stabilization IC chip is LM 317.
According to some embodiments of the present invention, the main control module comprises:
and the capacitive touch IC chip is used for inputting a control instruction to acquire the working state of the test circuit.
According to the utility model discloses a testing arrangement of second aspect embodiment includes the test circuit according to the first aspect embodiment.
According to the utility model discloses testing arrangement has following beneficial effect at least: the testing device adopts the testing circuit, the working state of the testing circuit is obtained through the main control module, the indicating module can indicate the normal state or the abnormal state of each anti-disconnecting line of the anti-disconnecting group when receiving the control instruction according to the working state of the testing circuit, the testing process is simple, the rapid testing of the anti-disconnecting lines can be realized, and the testing efficiency is improved.
According to the utility model discloses an electronic equipment of third aspect embodiment includes the testing arrangement according to the second aspect embodiment.
According to the utility model discloses electronic equipment has following beneficial effect at least: the electronic equipment adopts the testing device, the testing circuit in the testing device obtains the working state of the testing circuit through the main control module, and the indicating module can indicate the normal state or the abnormal state of each anti-disconnection of the anti-disconnection group when receiving a control instruction according to the working state of the testing circuit, so that the testing process is simple, the rapid testing of the anti-disconnection can be realized, the testing efficiency is improved, and the use stability of the electronic equipment is ensured.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The invention will be further described with reference to the following drawings and examples, in which:
fig. 1 is a schematic structural diagram of a test circuit according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a test circuit according to another embodiment of the present invention;
fig. 3 is a schematic structural diagram of a test circuit according to another embodiment of the present invention.
Reference numerals: 100. a power supply module; 200. the anti-dismantling line group; 300. an indication module; 400. a main control module; 110. a voltage stabilization IC chip; 210. a first anti-ravel seam; 220. second anti-ravel stitches; 310. a single chip microcomputer; 320. a first display screen; 410. a capacitive touch IC chip; 420. and a second display screen.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary only for the purpose of explaining the present invention, and should not be construed as limiting the present invention.
In the description of the present invention, it should be understood that the orientation or positional relationship indicated with respect to the orientation description, such as up, down, front, rear, left, right, etc., is based on the orientation or positional relationship shown in the drawings, and is only for convenience of description and simplification of description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention.
In the description of the present invention, a plurality of means is one or more, a plurality of means is two or more, and the terms greater than, less than, exceeding, etc. are understood as not including the number, and the terms greater than, less than, within, etc. are understood as including the number. If the first and second are described for the purpose of distinguishing technical features, they are not to be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present invention, unless there is an explicit limitation, the words such as setting, installation, connection, etc. should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above words in combination with the specific contents of the technical solution.
In the description of the present invention, reference to the description of the terms "one embodiment," "some embodiments," "an illustrative embodiment," "an example," "a specific example," or "some examples" or the like means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
In a first aspect, referring to fig. 1, a test circuit according to an embodiment of the present invention includes a detachment prevention set 200, an indication module 300, and a main control module 400, where the detachment prevention set 200 includes at least two detachment prevention lines; the main control module 400 is respectively connected with each anti-disconnection wire, and the main control module 400 is used for acquiring the working state of the test circuit; the indication module 300 is connected to the main control module 400, wherein the main control module 400 is configured to send the working state to the indication module 300; the working state comprises a normal state; the indication module 300 is used for indicating a normal state or an abnormal state of the disconnection prevention circuit when the test circuit is in the normal state. In the process of testing the anti-disconnection wires, the main control module 400 is respectively connected with each anti-disconnection wire, the indicating module 300 is connected with the main control module 400, the main control module 400 acquires the working state of the testing circuit, when the test circuit is in a normal state, the indication module 300 indicates a normal state or an abnormal state of the anti-detach wire according to the control command of the main control module 400, the indication module 300 can test the anti-detach wire in the anti-detach wire set 200, detects a normal state or an abnormal state of each detachment prevention thread in the detachment prevention group 200 and indicates the normal state or the abnormal state of the detachment prevention thread, thereby representing the test result, having simple test process, realizing the rapid test of the anti-dismounting wire, improving the test efficiency, meanwhile, a plurality of anti-disassembly lines in the product are concentrated in the anti-disassembly line set 200 for testing, so that the testing time can be saved, and the testing efficiency is further improved.
Referring to fig. 2, in some embodiments, the indication module 300 includes at least two light emitting diodes, an anode of each light emitting diode is connected to the main control module 400, and a cathode of each light emitting diode is grounded. In some specific testing processes, the indicating module 300 includes at least two light emitting diodes, an anode of each light emitting diode is connected to the main control module 400, and a cathode of each light emitting diode is grounded, it should be noted that each light emitting diode in the indicating module 300 is in one-to-one correspondence with each anti-detachment line in the anti-detachment group 200, so that the main control module 400 obtains an operating state of the testing circuit, when the testing circuit is in a normal state, the indicating module 300 can indicate a normal state or an abnormal state of the anti-detachment line according to a control command of the main control module 400, for example, the indicating module 300 includes two light emitting diodes, i.e., a first light emitting diode D1 and a second light emitting diode D2, the first light emitting diode D1 corresponds to the first anti-detachment line 210 in the anti-detachment group 200, the second light emitting diode D2 corresponds to the second anti-detachment line 220 in the anti-detachment group 200, when the first anti-disconnection 210 in the anti-disconnection group 200 has a fault, the first light emitting diode D1 corresponding to the anti-disconnection does not emit light due to the open circuit of the circuit, so that the normal state or the abnormal state of each anti-disconnection can be conveniently judged according to the light emitting state of each light emitting diode.
Referring to fig. 2, in some embodiments, the indication module 300 further includes at least two resistors, a first end of each resistor is connected to a cathode of a corresponding light emitting diode, the resistors are in one-to-one correspondence with the light emitting diodes, and a second end of each resistor is grounded. In order to improve the working safety of the test circuit, the indication module 300 further includes at least two resistors, a first end of each resistor is connected to a cathode of a corresponding led, the resistors correspond to the leds one-to-one, and a second end of each resistor is grounded. For example, the detection module 300 includes two resistors, namely a first resistor R1 and a second resistor R2, wherein a first end of the first resistor R1 is connected to the cathode of the first light emitting diode D1, a second end of the first resistor R1 is grounded, a first end of the second resistor R2 is connected to the cathode of the second light emitting diode D2, a second end of the second resistor R2 is grounded, the first resistor R1 can play a role of current limiting protection for the first light emitting diode D1, and the second resistor R2 can play a role of current limiting protection for the second light emitting diode D2. Therefore, each resistor can play a role in current limiting protection on each corresponding light emitting diode, and the working safety of the test circuit is improved.
Referring to fig. 3, in some embodiments, the indication module 300 further includes a single chip microcomputer 310 and a first display screen 320, the single chip microcomputer 310 is connected to the main control module 400, and the single chip microcomputer 310 is configured to detect a normal state or an abnormal state of the disconnection prevention. The first display screen 320 is connected with the output end of the single chip microcomputer 310, and the first display screen 320 is used for displaying the normal state or the abnormal state of the wire disconnection prevention. In order to accurately and conveniently test the normal state or the abnormal state of the disconnection prevention, the indicating module 300 further comprises a single chip microcomputer 310 and a first display screen 320, the single chip microcomputer 310 is connected with the main control module 400, the first display screen 320 is connected with the output end of the single chip microcomputer 310, in the process of testing the anti-disconnection wire, the main control module 400 obtains the working state of the test circuit, when the test circuit is in a normal state, the indication module 300 indicates that the test circuit is in a normal state according to the control command of the main control module 400, and outputs a test instruction to the single chip microcomputer 310, the single chip microcomputer 310 can test the anti-disassembly wire in the anti-disassembly wire set 200, detect a normal state or an abnormal state of the anti-disassembly wire, and output the test result to first display screen 320 and characterize, first display screen 320 can show the normal condition or the abnormal state of preventing taking out stitches, and the test procedure is simple, can realize preventing taking out stitches quick test, improves efficiency of software testing.
It should be noted that the first display screen 320 may receive an output instruction of the single chip microcomputer 310, and represent a normal state or an abnormal state of each tested anti-detach line, for example, when a certain anti-detach line is in the normal state, the first display screen 320 may represent a test result by displaying "OK", and when a certain anti-detach line is in the abnormal state, the first display screen 320 may represent the test result by displaying "NG", so that the anti-detach line of the product may be replaced in time. It should be noted that the first display screen 320 may be a liquid crystal display screen or other types of display screens, and is not limited.
In some embodiments, the single chip microcomputer 310 is model STC89C516 RD. The single chip microcomputer 310 with the model is small in size, low in power consumption and high in anti-interference performance, electromagnetic interference can be reduced, and the single chip microcomputer 310 with the model of STC89C516RD is used as a part of the indicating module 300, so that the working stability and the testing accuracy of the testing circuit can be further guaranteed. It should be noted that, in other specific embodiments, other types of the single chip microcomputer 310 may also be used, and is not limited thereto.
Referring to fig. 1 and 2, in some embodiments, the test circuit further includes a power module 100, the power module 100 includes a voltage-stabilizing IC chip 110, the voltage-stabilizing IC chip 110 is connected to the detachment prevention line set 200, and the voltage-stabilizing IC chip 110 is used for supplying power. In the test circuit, the voltage-stabilizing IC chip 110 of the power module 100 is connected to the anti-disconnection group 200, the whole test circuit is powered by the voltage-stabilizing IC chip 110, the main control module 400 obtains the working state of the test circuit, when the test circuit is in a normal state, the indicating module 300 indicates the normal state or abnormal state of the anti-disconnection according to the control instruction of the main control module 400, the indicating module 300 can test the anti-disconnection in the anti-disconnection group 200, detect the normal state or abnormal state of each anti-disconnection in the anti-disconnection group 200 and indicate the normal state or abnormal state of the anti-disconnection, so as to represent the test result, the test process is simple, the rapid test of the anti-disconnection can be realized, the test efficiency is improved, and the working stability of the test circuit can be ensured.
In some embodiments, the regulator IC chip 110 has a model LM 317. The voltage stabilizing IC chip 110 of the type has better voltage stabilizing performance, wider voltage regulating range, low noise and other performances, so that the voltage stabilizing IC chip 110 of the type LM317 is adopted as one part of the power supply module 100, stable test current can be provided for a test circuit, and the working stability of the test circuit is ensured. It should be noted that, in some other embodiments, other types of the voltage stabilizing IC chip 110 may also be selected, and is not limited thereto.
Referring to fig. 2 and 3, in some embodiments, the main control module 400 includes a capacitive touch IC chip 410, and the capacitive touch IC chip 410 is configured to input a control instruction to obtain an operating state of the test circuit. In the test process, the capacitance touch IC chip 410 is respectively connected with the anti-disconnection group 200 and the indication module 300, the working state of the test circuit can be conveniently acquired by operating the capacitance touch IC chip 410, the indication module 300 indicates the normal state or the abnormal state of the anti-disconnection group 200, the test process is simple, the rapid test of the anti-disconnection can be realized, the control instruction is directly input on the capacitance touch IC chip 410, the operation is convenient, and the test efficiency can be improved.
Referring to fig. 2 and 3, in some embodiments, the main control module 400 further includes a second display screen 420, the second display screen 420 is connected to the capacitive touch IC chip 410 and the indication module 300, the second display screen 420 can visually display an input control instruction and acquire a working state of the test circuit, where the working state information may include a normal state or a shutdown state of the test circuit, and such a test process is simple, and can implement a quick test on a disconnection prevention, improve test efficiency, and clearly observe a working condition of the test circuit.
In a second aspect, embodiments of the present invention further provide a testing apparatus, including the testing circuit shown in the first aspect.
The testing device adopts the testing circuit, the testing circuit obtains the working state of the testing circuit through the main control module 400, and according to the working state of the testing circuit, the indicating module 300 can indicate the normal state or the abnormal state of each anti-disconnecting line of the anti-disconnecting line group 200 when receiving a control instruction, the testing process is simple, the rapid testing of the anti-disconnecting line can be realized, and the testing efficiency is improved.
In a third aspect, embodiments of the present invention further provide an electronic device, including the testing apparatus shown in the second aspect.
The electronic equipment adopts the testing device, the testing circuit in the testing device acquires the working state of the testing circuit through the main control module 400, and according to the working state of the testing circuit, the indicating module 300 can indicate the normal state or abnormal state of each anti-disconnecting line of the anti-disconnecting line group 200 when receiving a control instruction, the testing process is simple, the rapid testing of the anti-disconnecting lines can be realized, the testing efficiency is improved, and the use stability of the electronic equipment is ensured.
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made without departing from the spirit of the present invention within the knowledge of those skilled in the art. Furthermore, the embodiments of the present invention and features of the embodiments may be combined with each other without conflict.
Claims (10)
1. A test circuit, comprising:
the anti-dismantling line group comprises at least two anti-dismantling lines;
the main control module is respectively connected with each anti-disconnection wire, and is used for acquiring the working state of the test circuit;
the indicating module is connected with the main control module;
the main control module is used for sending the working state to the indicating module; the working state comprises a normal state; the indicating module is used for indicating the normal state or the abnormal state of the disconnection prevention line when the test circuit is in the normal state.
2. The test circuit of claim 1, wherein the indication module comprises:
the anode of each light emitting diode is connected with the main control module, and the cathode of each light emitting diode is grounded.
3. The test circuit of claim 2, wherein the indication module further comprises:
the first end of each resistor is connected with the cathode of the corresponding light emitting diode, the resistors are in one-to-one correspondence with the light emitting diodes, and the second end of each resistor is grounded.
4. The test circuit of claim 1, wherein the indication module further comprises:
the single chip microcomputer is connected with the main control module and used for detecting the normal state or the abnormal state of the anti-disconnecting wire;
the first display screen is connected with the output end of the single chip microcomputer and used for displaying the normal state or the abnormal state of the anti-disconnecting link.
5. The test circuit of claim 4, wherein the single-chip microcomputer is of the type STC89C516 RD.
6. The test circuit of claim 1, further comprising a power module, the power module comprising:
the voltage stabilizing IC chip is connected with the anti-disassembling wire group and used for supplying power.
7. The test circuit of claim 6, wherein the regulator IC chip is of type LM 317.
8. The test circuit of any one of claims 1 to 7, wherein the master control module comprises:
and the capacitive touch IC chip is used for inputting a control instruction to acquire the working state of the test circuit.
9. Test apparatus, characterized in that it comprises a test circuit according to any one of claims 1 to 8.
10. Electronic device, characterized in that it comprises a test apparatus according to claim 9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023126017.1U CN214335089U (en) | 2020-12-22 | 2020-12-22 | Test circuit, test device and electronic equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023126017.1U CN214335089U (en) | 2020-12-22 | 2020-12-22 | Test circuit, test device and electronic equipment |
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| Publication Number | Publication Date |
|---|---|
| CN214335089U true CN214335089U (en) | 2021-10-01 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202023126017.1U Active CN214335089U (en) | 2020-12-22 | 2020-12-22 | Test circuit, test device and electronic equipment |
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| CN (1) | CN214335089U (en) |
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- 2020-12-22 CN CN202023126017.1U patent/CN214335089U/en active Active
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Denomination of utility model: Testing circuits, devices, and electronic equipment Granted publication date: 20211001 Pledgee: Guanlan Sub Branch of Shenzhen Rural Commercial Bank Co.,Ltd. Pledgor: SHENZHEN BEILIJIA ELECTRONIC TECHNOLOGY CO.,LTD. Registration number: Y2024980010887 |