CN214225344U - Magnetic suction pressing plate type probe holder - Google Patents
Magnetic suction pressing plate type probe holder Download PDFInfo
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- CN214225344U CN214225344U CN202120288882.1U CN202120288882U CN214225344U CN 214225344 U CN214225344 U CN 214225344U CN 202120288882 U CN202120288882 U CN 202120288882U CN 214225344 U CN214225344 U CN 214225344U
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Abstract
The utility model relates to a magnetic suction pressing plate type probe holder, including magnetism inhale formula bracket component, EVA magnetic metal glue paste subassembly, probe test subassembly and measured circuit board, magnetism is inhaled formula bracket component below installation probe test subassembly and is gone up horizontal rotation at probe test subassembly, and magnetism is inhaled formula bracket component and is adopted magnetism to inhale the mode actuation of inhaling on EVA magnetic metal glue paste subassembly, and EVA magnetic metal glue paste subassembly is installed on being surveyed the circuit board. This probe frame relies on magnet and the actuation of inhaling the magnetism sheetmetal to fix magnetism and inhales formula bracket component and probe test subassembly, but through adjusting suitable magnet adsorption capacity size quick adsorption fixed magnetism formula bracket component, through adjusting the test contact on the test probe reliable contact measured circuit board that probe test subassembly is last highly made in the probe compression, realizes exempting from the welding test.
Description
Technical Field
The utility model belongs to the technical field of the integrated circuit board test, a probe test of integrated circuit board is related to, especially a clamp plate formula probe holder is inhaled to magnetism.
Background
With the rapid development of technology, various types of integrated circuit boards (PCBs) are rapidly developed, and the probe test work related to the integrated circuit boards is also increased. Particularly, for testing in a complex circuit with elements, the technical requirement is very high, the universality is strong, welding is avoided, and the probe testing assembly is required to be conveniently replaced according to the mode of testing contacts of different circuits; currently, the test contacts of different types of probe test assemblies at different positions cannot be directly connected. In the PCB probe testing industry, the applicant has not found a method and apparatus that can solve the above problems.
Through the search of published patent documents, two patent documents relevant to the present patent application are found as follows:
1. a test probe holder mechanism (CN207782756U) comprises a probe row fixing frame arranged on a fixing seat, wherein two sides of the probe row fixing frame are provided with grooves, locking bolts are inserted into the grooves, and the probe row locking mechanism is used for adjusting the positions of the grooves on the two sides of the probe row fixing frame and is fixed by the locking bolts in the grooves; the locking mechanism of the probe row is composed of a locking support and a trapezoidal wedge block, the locking mechanism is grooved, the trapezoidal wedge block is placed in the groove of the locking support, the probe row is placed in the right-angle surface of the trapezoidal wedge block and the right-angle surface of the trapezoidal groove of the locking support, and through the downward locking force of the locking screw at the upper end of the trapezoidal wedge block, the ladder surface of the trapezoidal wedge block respectively has the extrusion force and the downward locking force in the direction of the probe row, so that the fixation of the probe row and the fixation of the probe locking mechanism are realized.
2. The utility model provides a probe frame (CN104155479B) for modular scanning probe microscope, includes the support, has circuit board and installation probe's holding frame on the support, circuit board and support between be the slot-in type and be connected, holding frame and support between be split type and in the holding frame inserts the support, holding frame and support form mosaic structure. The probe holder for the modular scanning probe microscope has the advantages of simple operation, good clamping effect, accurate probe positioning, improved testing precision and efficiency and low manufacturing cost.
Through comparison of technical characteristics, the two published patent documents are different from and similar to the technical scheme and the invention purpose of the patent application, so that the creativity and the novelty of the patent application are not damaged.
Disclosure of Invention
An object of the utility model is to overcome prior art's weak point, provide a clamp plate formula probe holder is inhaled to magnetism, this probe holder is through adjusting suitable probe compression height and magnet adsorption capacity size, can guarantee test probe and the reliable contact of being surveyed on the circuit board test contact and do not damage the probe again, can realize exempting from the welding test fast in the circuit board.
The purpose of the utility model is realized like this:
the utility model provides a pressing plate formula probe holder is inhaled to magnetism, includes magnetism and inhales formula bracket component, probe test subassembly, EVA magnetic metal glues and pastes subassembly and circuit board under test, magnetism is inhaled formula bracket component below installation probe test subassembly and horizontal rotation on probe test subassembly, magnetism and inhale the formula bracket component and adopt magnetism to inhale the mode actuation of inhaling on EVA magnetic metal glues and pastes the subassembly, EVA magnetic metal glues and pastes the subassembly and installs on being surveyed the circuit board.
The magnetic attraction type support assembly is composed of two parallel and symmetrical hand-screwed screw rods, a nylon clamping ring, a magnet disc and a pressing plate, and the two hand-screwed screw rods are connected by the pressing plate; a nylon snap ring is coaxially and fixedly arranged in the middle of each hand screw rod and is used for being clamped in open clamping grooves formed in the two side ends of the pressure plate; the lower end of each hand-screwed screw rod is coaxially provided with a magnet disc, the lower end of each hand-screwed screw rod is provided with an external screw thread, the magnet disc is provided with a nut, and the external screw thread on the hand-screwed screw rod and the magnet disc with the nut are coaxially and fixedly arranged by the hand-screwed screw rod in a thread meshing mode.
And, a pivot is adorned admittedly to the pressure plate that exerts on the formula bracket component is inhaled to magnetism, and this pivot is coaxial to be inlayed and to be adorned in a round hole that probe test component made, realizes that the formula bracket component is inhaled to magnetism 360 degrees horizontal rotation on probe test component.
Moreover, the EVA magnetic metal adhesive component is composed of an EVA sponge adhesive and a magnetic-absorbing metal sheet fixedly arranged on the EVA sponge adhesive.
The utility model has the advantages that:
1. this probe frame relies on magnet and the actuation of inhaling the magnetism sheetmetal to fix magnetism and inhales formula bracket component and probe test subassembly, but through adjusting suitable magnet adsorption capacity size quick adsorption fixed magnetism formula bracket component, through adjusting the test contact on the test probe reliable contact measured circuit board that probe test subassembly is last highly made in the probe compression, realizes exempting from the welding test.
2. The clamping groove structure of the pressing plate of the magnetic attraction type bracket assembly of the probe holder is matched with the nylon clamping ring, so that the structure is quick, simple, convenient and reliable to install, and the universality is high; the rotating shaft structure fixedly installed on the pressure applying plate is embedded into the round hole made by the probe testing component, so that the magnetic type bracket component can horizontally rotate for 360 degrees on the probe testing component.
3. The EVA magnetic metal adhesive component of the probe holder is adhered to a tested circuit board with components, and the elasticity of the EVA sponge makes up the problem of uneven surface of the tested circuit board; meanwhile, the magnetic-attracting metal sheet on the magnetic-attracting type bracket component ensures that the magnetic disc on the magnetic-attracting type bracket component is firmly and reliably attracted, and can realize quick fixation and test in a complex circuit with elements.
Drawings
FIG. 1 is a front view of the structure of the present invention;
FIG. 2 is a top view of FIG. 1;
FIG. 3 is a schematic sectional view taken along line A-A of FIG. 2;
fig. 4 is a schematic perspective view of the present invention.
Detailed Description
The embodiments of the present invention will be further explained with reference to the accompanying drawings: the following examples are illustrative and not intended to be limiting, and the scope of the present invention is not limited by the following examples.
The utility model provides a formula probe stand is pressed to magnetism, refers to fig. 1, 2, 3, includes magnetism and inhales formula bracket component, probe test subassembly, EVA magnetism metal glues and pastes subassembly and circuit board under being tested, magnetism is inhaled formula bracket component below installation probe test subassembly and can be at probe test subassembly horizontal rotation, magnetism and inhale formula bracket component and adopt magnetism to inhale the mode actuation of inhaling on EVA magnetism metal glues the subassembly, EVA magnetism metal glues the subassembly and installs on circuit board 9 under being tested.
The magnetic type support assembly is composed of two parallel and symmetrical hand-screwed screw rods 4, a nylon clamping ring 5, a magnet disc 6 and a pressing plate 1, and the hand-screwed screw rods are connected by the pressing plate; a nylon snap ring is coaxially and fixedly arranged in the middle of each hand-screwed screw rod and is used for being clamped in the open clamping grooves 10 formed in the two side ends of the pressing plate, so that the hand-screwed screw rods and the pressing plate can be quickly clamped; the lower end of each hand-screwed screw rod is coaxially provided with a magnet disc, the lower end of the hand-screwed screw rod is provided with an external thread, the magnet disc is provided with a nut, and the external thread on the hand-screwed screw rod and the magnet disc with the nut are coaxially and fixedly arranged in a thread meshing mode.
A rotating shaft 2 is fixedly installed on a pressure applying plate on the magnetic type support assembly, and the rotating shaft is coaxially embedded into a round hole formed in the probe testing assembly 3, so that 360-degree horizontal rotation of the magnetic type support assembly on the probe testing assembly is achieved, and the probe testing assembly can be replaced according to different tested circuit board patterns.
The EVA magnetic metal adhesive component consists of an EVA sponge adhesive 7 and a magnetic-absorbing metal sheet 8 fixedly mounted on the EVA sponge adhesive, and the upper surface of the magnetic-absorbing metal sheet is flat and smooth, so that the firmness and reliability of the adsorption of the magnet disc are ensured; the EVA sponge adhesive has elasticity and thickness, so that unevenness of components on the surface of the circuit board to be tested can be compensated, and reliable adsorption of the magnet disc is ensured.
The utility model discloses a theory of operation is:
the magnet disc below the magnetic type support assembly and the magnetic type metal sheet adhered to the EVA magnetic metal adhesive assembly on the tested circuit board are fixed through magnetic attraction, the pressing plate in the magnetic type support assembly enables the probes on the probe testing assembly to be compressed, the testing probes are in stressed contact with the testing points on the tested circuit board, and finally welding-free rapid testing is achieved.
Claims (4)
1. The utility model provides a magnetic suction pressing plate type probe holder which characterized in that: inhale formula bracket component, probe test subassembly, EVA magnetism metal and glue subassembly and circuit board under and including magnetism, inhale formula bracket component below installation probe test subassembly and horizontal rotation on probe test subassembly, magnetism is inhaled the formula bracket component and is adopted magnetism to inhale the mode actuation on EVA magnetism metal glues the subassembly, and EVA magnetism metal glues the unit mount on being surveyed the circuit board.
2. The magnetic suction plate type probe holder according to claim 1, characterized in that: the magnetic attraction type support assembly is composed of two parallel and symmetrical hand-screwed screw rods, nylon clamping rings, magnet discs and pressing plates, and the hand-screwed screw rods are connected by the pressing plates; a nylon snap ring is coaxially and fixedly arranged in the middle of each hand screw rod and is used for being clamped in open clamping grooves formed in the two side ends of the pressure plate; the lower end of each hand-screwed screw rod is coaxially provided with a magnet disc, the lower end of each hand-screwed screw rod is provided with an external screw thread, the magnet disc is provided with a nut, and the external screw thread on the hand-screwed screw rod and the magnet disc with the nut are coaxially and fixedly arranged by the hand-screwed screw rod in a thread meshing mode.
3. The magnetic suction plate type probe holder according to claim 1, characterized in that: the pressure applying plate on the magnetic type support component is fixedly provided with a rotating shaft, and the rotating shaft is coaxially embedded into a round hole made by the probe testing component, so that the magnetic type support component can horizontally rotate for 360 degrees on the probe testing component.
4. The magnetic suction plate type probe holder according to claim 1, characterized in that: the EVA magnetic metal adhesive component is composed of an EVA sponge adhesive and a magnetic-absorbing metal sheet fixedly arranged on the EVA sponge adhesive.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120288882.1U CN214225344U (en) | 2021-02-02 | 2021-02-02 | Magnetic suction pressing plate type probe holder |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120288882.1U CN214225344U (en) | 2021-02-02 | 2021-02-02 | Magnetic suction pressing plate type probe holder |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214225344U true CN214225344U (en) | 2021-09-17 |
Family
ID=77691867
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202120288882.1U Active CN214225344U (en) | 2021-02-02 | 2021-02-02 | Magnetic suction pressing plate type probe holder |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214225344U (en) |
-
2021
- 2021-02-02 CN CN202120288882.1U patent/CN214225344U/en active Active
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