CN213878016U - Diameter-variable columnar sample stage for scanning electron microscope - Google Patents
Diameter-variable columnar sample stage for scanning electron microscope Download PDFInfo
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- CN213878016U CN213878016U CN202022988280.5U CN202022988280U CN213878016U CN 213878016 U CN213878016 U CN 213878016U CN 202022988280 U CN202022988280 U CN 202022988280U CN 213878016 U CN213878016 U CN 213878016U
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Abstract
The utility model discloses a columnar sample platform for reducing scanning electron microscope belongs to scanning electron microscope technical field, and its characterized in that includes from bottom to top in proper order: the sample table comprises a sample table base, metal blades and a movable cylindrical ring, wherein the sample table base comprises a cylindrical base body, a circular groove is formed in the center of the upper surface of the base body, and 2N straight blind holes are uniformly distributed in the upper surface of the base body; a threaded hole for connecting a fastening screw B is formed in the center of the lower surface of the base body; the number of the metal blades is 2N, and the lower surface of each metal blade is fixedly provided with a fixed pin matched with the straight blind hole, and the upper surface of each metal blade is fixedly provided with a movable pin; the inner side of the upper surface of the movable columnar ring is provided with a sliding track matched with the movable pin, the outer side wall of the movable columnar ring is provided with a horizontal threaded hole, a fastening screw A is installed in the horizontal threaded hole, and the inner diameter of the movable columnar ring is larger than the outer diameter of the sample table base.
Description
Technical Field
The utility model belongs to the technical field of the scanning electron microscope, concretely relates to diameter-variable columnar sample platform for scanning electron microscope.
Background
Under the rapid development of science and technology, a scanning electron microscope is widely applied in various fields due to the characteristics of simplicity, high efficiency, high resolution and the like. Scanning electron microscopy is one of the most widely used material characterization devices. The device has the imaging capability of larger depth of field, wider amplification range and nanoscale or even sub-nanoscale high resolution, can be used for imaging and size measurement of complex and rough surface morphology, and can be used for analyzing the component distribution of some materials by matching with a back scattering electron probe.
When a sample is used as a scanning electron microscope, the sample needs to be fixed on a sample table and then placed in a sample bin for observation. However, the upper end face and the lower end face of the existing sample are often uneven, and the end faces of the sample are smaller relative to the length of the sample, so that the sample is inconvenient to fix and is not firm to fix, and the observation of the sample is influenced.
SUMMERY OF THE UTILITY MODEL
The utility model provides a column sample platform for a variable-diameter scanning electron microscope, which solves the technical problems existing in the prior art.
The utility model aims at providing a column sample platform for reducing scanning electron microscope includes from bottom to top in proper order:
the sample stage base (3) comprises a cylindrical base body, a circular groove is formed in the center of the upper surface of the base body, 2N straight blind holes (3-2) are uniformly distributed in the upper surface of the base body, and N is a natural number; a threaded hole for connecting a fastening screw B (3-1) is formed in the center of the lower surface of the base body;
the number of the metal blades (2) is 2N, a fixed pin (2-1) matched with the straight blind hole (3-2) is fixed on the lower surface of each metal blade (2), and a movable pin (2-2) is fixed on the upper surface of each metal blade (2);
the movable column type sample platform comprises a movable column type ring (1), a sliding track (1-2) matched with a movable pin (2-2) is arranged on the inner side of the upper surface of the movable column type ring (1), a horizontal threaded hole is formed in the outer side wall of the movable column type ring (1), a fastening screw A (1-1) is installed in the horizontal threaded hole, and the inner diameter of the movable column type ring (1) is larger than the outer diameter of a sample platform base (3).
Preferably, the sliding track (1-2) is an arc track.
The utility model has the advantages and positive effects that:
by adopting the sample stage formed by the technical scheme, the aperture formed by the combined metal blade can be adjusted only by rotating the cover body when the sample stage is used, the sample stage is rotated to the position where the combined metal blade can clamp the sample, and the cover body is fixed by screwing the fastening bolt on the side wall of the cover body, so that columnar samples with different diameters can be fixed, and the application range is wide; the second fastening bolts at the bottom of the base can be provided with second fastening bolts with different lengths according to the height of the columnar sample to be supported; the utility model discloses the structural design is ingenious, and convenient to use is convenient for operate, and the column sample of adaptable different diameter sizes's is fixed, has improved work efficiency greatly, is fit for popularizing and applying.
Drawings
FIG. 1 is an exploded view of a preferred embodiment of the present invention;
FIG. 2 is a top view of a preferred embodiment of the present invention;
wherein: 1. a movable cylindrical ring; 1-1, fastening a screw A; 1-2, a sliding track; 2. a metal blade; 2-1, fixing the pin; 2-2, movable pins; 3. a sample stage base; 3-1, fastening a screw B; 3-2, straight blind holes.
Detailed Description
For further understanding of the contents, features and effects of the present invention, the following embodiments are exemplified and will be described in detail with reference to the accompanying drawings:
in the description of the present invention, it is to be understood that the terms "upper", "lower", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the present invention.
As shown in fig. 1, the technical solution of the present invention is:
the utility model provides a columnar sample platform for reducing scanning electron microscope includes from bottom to top in proper order:
the sample stage base 3 comprises a cylindrical base body, a circular groove is formed in the center of the upper surface of the base body, 2N straight blind holes 3-2 are uniformly distributed in the upper surface of the base body, and N is a natural number; a threaded hole for connecting a fastening screw B3-1 is formed in the center of the lower surface of the base body;
the number of the metal blades 2 is 2N, and fixed pins 2-1 matched with the straight blind holes 3-2 are fixed on the lower surface of each metal blade 2, and movable pins 2-2 are fixed on the upper surface of each metal blade 2;
the device comprises a movable cylindrical ring 1, wherein a sliding track 1-2 matched with a movable pin 2-2 is formed in the inner side of the upper surface of the movable cylindrical ring 1, a horizontal threaded hole is formed in the outer side wall of the movable cylindrical ring 1, a fastening screw A1-1 is installed in the horizontal threaded hole, and the inner diameter of the movable cylindrical ring 1 is larger than the outer diameter of a sample table base 3.
The sliding track 1-2 is an arc track.
The preferred embodiment mainly comprises a sample table base 3, metal blades 2 and a movable cylindrical ring 1, wherein the sample table base is of a cylindrical hollow structure, even number of round holes are uniformly distributed at the top of a cylindrical side wall, a vertical threaded hole is formed in the center of the bottom of the sample table base, and fastening screws B3-1 with different lengths can be matched with the sample table base for supporting cylindrical samples with different heights; placing metal blades on a base of the sample platform, wherein the metal blades comprise fixed pins 2-1 and movable pins 2-2, the fixed pins are inserted into circular holes of the base of the sample platform, the movable pins are inserted into sliding tracks corresponding to the movable cylindrical rings, and the metal blades are sequentially inserted to form combined metal blades as shown in figure 2; the movable cylindrical rings are placed on the combined metal blades, sliding tracks which are the same as the sample table base are uniformly distributed at the tops of the movable cylindrical rings, movable pins above the combined metal blades are inserted into the sliding tracks one by one, a horizontal threaded hole is formed in the side wall of each movable cylindrical ring, and a fastening screw A1-1 is correspondingly arranged in the horizontal threaded hole and used for adjusting the movable cylindrical rings and further adjusting the diameter of a round hole formed by the combined metal blades so as to adapt to the cylindrical samples with different sizes and can be screwed up to a proper position to fix the cylindrical samples.
The sample table base 3 comprises a sample table base body and an even number of uniformly distributed straight blind holes 3-2 at the top of the base body, the straight blind holes are uniformly distributed on the sample table base, the aperture size of the straight blind holes is suitable for the size of a fixing pin 2-1 of a metal blade 2, a vertical threaded hole is arranged in the center of the bottom of the sample table base 3, and the vertical threaded hole corresponds to fastening screws 3-1 with different lengths and is used for supporting columnar samples with different heights; the number of the metal blades 2 corresponds to the number of 3-2 straight blind holes in the sample table base, the size of the metal blades is suitable for the size of the sample table base, and each metal blade 2 consists of a lower fixed pin 2-1 and an upper movable pin 2-2; the movable cylindrical ring 1 comprises sliding rails 1-2 which are uniformly distributed on the top, horizontal threaded holes on the side wall and fastening screws A1-1 corresponding to the horizontal threaded holes, the size of the aperture of each sliding rail 1-2 is suitable for the size of a movable pin 2-2 of a metal blade 2, the fixed pin 2-1 of the metal blade and the movable pin are respectively and correspondingly inserted into a straight blind hole 3-2 of a sample stage base and the sliding rail 1-2 of the movable cylindrical ring, the metal blades are combined one by one as shown in figure 2, the total size of the movable cylindrical ring is larger than the size of the sample stage base and can be wrapped in the sample stage base, the aperture of an opening of the combined metal blade can be adjusted through the fastening screws A1-1, and the fastening screws can be screwed to abut against the side wall of the sample stage base when the movable cylindrical ring is adjusted to a proper position, so that the purpose of fixing is achieved. The sliding tracks distributed on the movable metal circular ring can be lengthened or designed into arc tracks according to actual requirements.
The above description is only for the preferred embodiment of the present invention, and is not intended to limit the present invention in any way, and all the modifications and equivalents of the technical spirit of the present invention to any simple modifications of the above embodiments are within the scope of the technical solution of the present invention.
Claims (2)
1. A columnar sample stage for a variable-diameter scanning electron microscope; the device is characterized by comprising the following components from bottom to top in sequence:
the sample stage base (3) comprises a cylindrical base body, a circular groove is formed in the center of the upper surface of the base body, 2N straight blind holes (3-2) are uniformly distributed in the upper surface of the base body, and N is a natural number; a threaded hole for connecting a fastening screw B (3-1) is formed in the center of the lower surface of the base body;
the number of the metal blades (2) is 2N, a fixed pin (2-1) matched with the straight blind hole (3-2) is fixed on the lower surface of each metal blade (2), and a movable pin (2-2) is fixed on the upper surface of each metal blade (2);
the movable column type sample platform comprises a movable column type ring (1), a sliding track (1-2) matched with a movable pin (2-2) is arranged on the inner side of the upper surface of the movable column type ring (1), a horizontal threaded hole is formed in the outer side wall of the movable column type ring (1), a fastening screw A (1-1) is installed in the horizontal threaded hole, and the inner diameter of the movable column type ring (1) is larger than the outer diameter of a sample platform base (3).
2. The cylindrical sample stage for a variable-diameter scanning electron microscope according to claim 1, wherein the slide rails (1-2) are arc rails.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022988280.5U CN213878016U (en) | 2020-12-10 | 2020-12-10 | Diameter-variable columnar sample stage for scanning electron microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022988280.5U CN213878016U (en) | 2020-12-10 | 2020-12-10 | Diameter-variable columnar sample stage for scanning electron microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN213878016U true CN213878016U (en) | 2021-08-03 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202022988280.5U Active CN213878016U (en) | 2020-12-10 | 2020-12-10 | Diameter-variable columnar sample stage for scanning electron microscope |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN213878016U (en) |
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2020
- 2020-12-10 CN CN202022988280.5U patent/CN213878016U/en active Active
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