CN210221874U - Electronic probe sample seat capable of adjusting sample height and angle - Google Patents
Electronic probe sample seat capable of adjusting sample height and angle Download PDFInfo
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- CN210221874U CN210221874U CN201920398380.7U CN201920398380U CN210221874U CN 210221874 U CN210221874 U CN 210221874U CN 201920398380 U CN201920398380 U CN 201920398380U CN 210221874 U CN210221874 U CN 210221874U
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Abstract
The utility model relates to an electron probe sample seat of adjustable sample height and angle, including the screw thread lift ball seat, be the cavity in screw thread lift ball seat upper end, put into in the cavity one rather than assorted ball joint, screw thread lift ball seat bottom is then installed in a screw thread base, and both realize fixing mutually through helicitic texture, and the screw thread lift ball seat can reciprocate through twisting the realization, and the screw thread base passes through set screw fixed mounting on the sample bench. The analysis surface is ensured to keep horizontal and proper height by adjusting the angle and height of the plane of the ball head; the secondary processing of the sample is omitted, so that the sample can be quickly placed on the sample seat for electronic probe analysis, the sample loading time of the electronic probe can be saved, and the analysis working efficiency of the electronic probe is improved.
Description
Technical Field
The utility model belongs to the technical field of the electronic probe, a but electronic probe sample seat of adjustment sample height and angle is related to.
Background
The electron probe microscopic analysis is an important micro-area component analysis means, successfully combines the micro-area morphology and the component analysis, can also carry out fracture morphology analysis and high power tissue observation, and has irreplaceable effect in the field of steel metallurgy.
The electron probe principle is that a focused electron beam moving at high speed is used for irradiating the surface of a sample, a spectrometer and an energy spectrometer are used for collecting characteristic X rays excited by the sample to carry out micro-area component analysis, and a back scattering probe and a secondary electron probe are used for collecting back scattering electrons and secondary electron signals to carry out morphology analysis. The spectrometer is the most main component of the electronic probe, can analyze the components of micron-sized areas on the surface layer of a sample, can analyze trace elements and light elements, has high quantitative analysis precision, and is widely applied to various fields needing precise component analysis.
The Japanese Shimadzu electronic probe EPMA-1720 can only load a sample with the diameter of 32mm at most on the sample table, and cannot meet the analysis of large-size and irregular samples.
SUMMERY OF THE UTILITY MODEL
In order to overcome the above disadvantages of the prior art, the present invention provides an electronic probe sample holder capable of adjusting the height and angle of a sample, which can ensure that the analysis surface maintains horizontal and proper height by adjusting the angle and height of a ball head plane when the analysis sample is a large-sized irregular sample; the secondary processing of the sample is omitted, so that the sample can be quickly placed on the sample seat for electronic probe analysis, the sample loading time of the electronic probe can be saved, and the analysis working efficiency of the electronic probe is improved.
The utility model provides a technical scheme that its technical problem adopted is: the utility model provides an electron probe sample seat of adjustable sample height and angle, includes the screw thread lift ball seat, is the cavity in screw thread lift ball seat upper end, has put into in the cavity one rather than assorted ball universal joint, and screw thread lift ball seat bottom is then installed in a screw thread base, and both realize fixing mutually through helicitic texture, and the screw thread lift ball seat can reciprocate through the realization of twisting back, and the screw thread base passes through set screw fixed mounting on the sample platform.
Furthermore, the ball joint can rotate in the concave cavity and then be fixed through screws.
Further, a sample is placed within the ball and socket joint.
Further, the sample is fixed on the ball-and-socket joint by a conductive adhesive.
Furthermore, threaded holes are respectively formed in the positions, corresponding to the sample table, of the threaded base.
Furthermore, in order to analyze the sample, the parallel distance between the sample analysis plane and the bottom of the threaded base is 50mm-52mm by adjusting the threaded lifting ball seat.
The utility model has the advantages that: when the analysis sample is a large-size irregular sample, the horizontal and proper height of the analysis surface can be ensured by adjusting the angle and the height of the plane of the ball head; the secondary processing of the sample is omitted, so that the sample can be quickly placed on the sample seat for electronic probe analysis, the sample loading time of the electronic probe can be saved, and the analysis working efficiency of the electronic probe is improved.
Drawings
FIG. 1 is a schematic structural view of the present invention;
fig. 2 is a schematic view of the work of the push measuring table of the present invention.
In the figure: 1 set screw, 2 threaded base, 3 screw thread lifting ball seats, 4 ball universal joints, 5 samples, 6 sample stages and 7 measuring stages.
Detailed Description
In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "up," "down," "front," "back," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are based on the orientations and positional relationships illustrated in the drawings and are used merely for convenience in describing the present invention and to simplify the description, and are not intended to indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and are not to be construed as limiting the present invention unless otherwise specified.
The present invention will be further explained with reference to the drawings and examples.
Referring to fig. 1 and 2, an electron probe sample seat of adjustable sample height and angle, includes screw thread lift ball seat 3, is the cavity in 3 upper ends of screw thread lift ball seat, installs one in the cavity rather than assorted ball joint, and screw thread lift ball seat 3 bottoms then installs in a screw thread base 2, and both realize fixing mutually through helicitic texture, and screw thread lift ball seat 3 can reciprocate through twisting the realization, and screw thread base 2 passes through set screw 1 fixed mounting on sample platform 6.
Furthermore, the ball joint 4 can rotate in the concave cavity and then be fixed by the bolt.
Further, a sample 5 is placed inside the ball joint 4.
Further, the test piece 5 is fixed to the ball joint 4 by a conductive adhesive.
Furthermore, threaded holes are respectively formed in the positions of the threaded base 2 corresponding to the sample stage 6.
Furthermore, in order to analyze the sample 5, the threaded lifting ball seat 3 is adjusted to make the sample analysis plane parallel to the bottom of the threaded base 2 within a distance of 50mm-52 mm.
In actual use, the sample table 6 with the electronic probe sample seat is pushed into the measuring table 7, and the parallel distance between the sample analysis plane and the bottom of the threaded base 2 is 50-52 mm by adjusting the threaded lifting ball seat 3, so that the sample table can be taken out of the measuring table and put in an electronic probe for analysis.
The present invention is not limited to the above-described embodiments, and various modifications and variations of the present invention are intended to be included within the scope of the claims and the equivalent technology of the present invention if they do not depart from the spirit and scope of the present invention.
Claims (6)
1. The utility model provides an electron probe sample seat of adjustable sample height and angle which characterized in that: including screw thread lift ball seat, be the cavity in screw thread lift ball seat upper end, put into in the cavity one rather than assorted spherical universal joint, screw thread lift ball seat bottom is then installed in a screw thread base, and both realize fixing mutually through helicitic texture, and screw thread lift ball seat can reciprocate through the realization of twisting back, and screw thread base passes through set screw fixed mounting at the sample bench.
2. The adjustable height and angle electronic probe sample holder of claim 1, wherein: the spherical universal joint can rotate in the concave cavity and is fixed through screws.
3. The adjustable height and angle electronic probe sample holder of claim 1, wherein: and a sample is placed in the ball universal joint.
4. The adjustable height and angle electronic probe sample holder of claim 3, wherein: the sample is fixed on the ball-and-socket joint through conductive adhesive.
5. The adjustable height and angle electronic probe sample holder of claim 1, wherein: and threaded holes are respectively formed in the positions, corresponding to the sample table, of the threaded base.
6. The adjustable height and angle electronic probe sample holder of claim 1, wherein: in order to analyze the sample conveniently, the parallel distance between the sample analysis plane and the bottom of the threaded base is 50-52 mm by adjusting the threaded lifting ball seat.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920398380.7U CN210221874U (en) | 2019-03-27 | 2019-03-27 | Electronic probe sample seat capable of adjusting sample height and angle |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920398380.7U CN210221874U (en) | 2019-03-27 | 2019-03-27 | Electronic probe sample seat capable of adjusting sample height and angle |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210221874U true CN210221874U (en) | 2020-03-31 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920398380.7U Active CN210221874U (en) | 2019-03-27 | 2019-03-27 | Electronic probe sample seat capable of adjusting sample height and angle |
Country Status (1)
| Country | Link |
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| CN (1) | CN210221874U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115266795A (en) * | 2022-07-29 | 2022-11-01 | 中国核动力研究设计院 | Method for representing diffusion behavior of fission gas product of strong radioactive fuel element |
-
2019
- 2019-03-27 CN CN201920398380.7U patent/CN210221874U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115266795A (en) * | 2022-07-29 | 2022-11-01 | 中国核动力研究设计院 | Method for representing diffusion behavior of fission gas product of strong radioactive fuel element |
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