CN213633513U - Crystal test mounting base - Google Patents
Crystal test mounting base Download PDFInfo
- Publication number
- CN213633513U CN213633513U CN202022456803.1U CN202022456803U CN213633513U CN 213633513 U CN213633513 U CN 213633513U CN 202022456803 U CN202022456803 U CN 202022456803U CN 213633513 U CN213633513 U CN 213633513U
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- China
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- plate
- probe
- fixedly connected
- main body
- crystal test
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Abstract
The utility model provides a crystal test mount pad, crystal test mount pad includes: a main body, a probe plate; the main body includes: the mounting plate is fixedly mounted on the main body, the placing part is fixedly connected with the main body, and a placing groove is formed in the placing part; the first plate and the second plate are vertically arranged, the first plate is fixedly connected with the second plate, the first plate is movably connected with the mounting plate, the detection plate is placed on the second plate and is fixedly connected with the second plate, and the detection plate further comprises a first probe and a second probe; the mounting panel swing joint on first board and the pedestal, second board and probe plate fixed connection, first probe, second probe and probe plate fixed connection make the structure of crystal test mount pad simpler, and the installation accuracy is lower.
Description
Technical Field
The utility model belongs to the technical field of the test equipment and specifically relates to a crystal test mount pad.
Background
Along with the popularization of electronic equipment, the crystal is often used as an electrode on a circuit board, and because the crystal is very difficult to detect by naked eyes of a small human body, and meanwhile, the existing crystal testing instrument is very complex to install and needs high precision during installation, a crystal testing installation seat which is simple in structure and convenient to install is urgently needed.
SUMMERY OF THE UTILITY MODEL
In order to solve the problem, the utility model provides a crystal test mount pad.
The utility model discloses a following technical scheme realizes:
the utility model provides a crystal test mount pad, crystal test mount pad includes: a main body, a probe plate;
the main body includes: the mounting plate is fixedly mounted on the main body, the placing part is fixedly connected with the main body, and a placing groove is formed in the placing part;
the first plate and the second plate are vertically arranged, the first plate and the second plate are fixedly connected, the first plate is movably connected with the mounting plate, the detection plate is placed on the second plate and fixedly connected with the second plate, the detection plate further comprises a first probe and a second probe, the first probe and the second probe are both positioned above the placing groove, and the first probe and the second probe both penetrate through the detection plate and are fixedly connected with the detection plate;
the first plate can slide in the vertical direction relative to the mounting plate, and drives the detection plate to slide in the vertical direction.
Further, the detection plate is partially placed on the second plate, and the first probe and the second probe are both installed at positions where the detection plate extends out of the second plate.
Further, the crystal test mounting base further comprises two fixing columns, one ends of the fixing columns are fixedly connected with the second plate, the other ends of the fixing columns penetrate through the detection plate, and the two fixing columns are symmetrically arranged on the second plate.
Furthermore, the first plate further comprises a gripper rod, the gripper rod is arranged on one side, away from the first probe, of the first plate, and one end of the gripper rod is fixedly connected with the first plate.
Further, the first probe and the second probe are electrically connected with the probe plate.
The utility model has the advantages that:
the utility model provides a pedestal and the fixed connection of portion of placing of crystal test mount pad, mounting panel swing joint on first board and the pedestal, second board and probe plate fixed connection, first probe, second probe and probe plate fixed connection make the structure of crystal test mount pad simpler, and the installation accuracy is lower.
Drawings
Fig. 1 is a perspective view of the crystal test mounting base of the present invention.
Detailed Description
For a more clear and complete description of the technical solution of the present invention, the following description is made with reference to the accompanying drawings.
Referring to fig. 1, the present invention provides a crystal testing mounting base, which includes: a body 10, a probe plate 14;
the main body 10 includes: the device comprises a placing part 11, a mounting plate 12, a first plate 131 and a second plate 132, wherein the mounting plate 12 is fixedly mounted on the main body 10, the placing part 11 is fixedly connected with the main body 10, and a placing groove 111 is formed in the placing part 11;
the first plate 131 and the second plate 132 are vertically arranged, the first plate 131 and the second plate 132 are fixedly connected, the first plate 131 is movably connected with the mounting plate 12, the detection plate 14 is placed on the second plate 132 and is fixedly connected with the second plate 132, the detection plate 14 further includes a first probe 141 and a second probe 142, the first probe 141 and the second probe 142 are both located above the placing groove 111, and the first probe 141 and the second probe 142 both penetrate through the detection plate 14 and are fixedly connected with the detection plate 14;
the first plate 131 can slide in the vertical direction relative to the mounting plate 12, and drives the detection plate 14 to slide in the vertical direction.
In this embodiment, the mounting plate 12 is fixedly mounted on the body 10, the first plate 131 is fixedly connected to the second plate 132, the first plate 131 is movably connected to the mounting plate 12, the probe plate 14 is placed on the second plate 132 and fixedly connected to the second plate 132, the probe plate 14 further includes a first probe 141 and a second probe 142, the first probe 141 and the second probe 142 are both located above the placing groove 111, and the first probe 141 and the second probe 142 both penetrate through the probe plate 14 and are fixedly connected to the probe plate 14, so that the crystal testing mounting base has a simpler structure and lower mounting accuracy.
Further, the detection plate 14 is partially placed on the second plate 132, and the first probe 141 and the second probe 142 are mounted at positions where the detection plate 14 extends out of the second plate 132.
In the present embodiment, the first probe 141 and the second probe 142 on the probe plate 14 are used for testing a crystal.
Further, the crystal test mounting base further comprises two fixing columns 15, one end of each fixing column 15 is fixedly connected with the second plate 132, the other end of each fixing column 15 penetrates through the probe plate 14, and the two fixing columns 15 are symmetrically arranged on the second plate 132.
In the present embodiment, the fixing posts 15 mount the probe board 14 on the second board 132, which reduces the mounting accuracy of the crystal test mounting base.
Further, the first plate 131 further comprises a gripper rod 133, the gripper rod 133 is disposed on a side of the first plate 131 away from the first probe 141, and one end of the gripper rod 133 is fixedly connected with the first plate 131; the first probe 141 and the second probe 142 are electrically connected to the probe plate 14.
In the present embodiment, the first probe 141 and the second probe 142 are electrically connected to the probe plate 14, the probe plate 14 is electrically connected to an external power source, the first probe 141 and the second probe 142 are mounted on the probe plate 14, the detection plate 14 is fixedly connected to the second plate 132, the second plate 132 is fixedly connected to the first plate 131, the first plate 131 is slid with respect to the mounting plate 12 by the grab bar 133, thereby driving the second plate 132 and the probe plate 14 to move relative to the mounting plate 12, so that the structure of the crystal test mounting seat is simpler, the mounting precision is lower, when in use, a crystal is placed in the placing groove 111, the first plate 131 is moved toward the crystal by the gripper bar 133, so that said first probe 141 and said second probe 142 are both in abutment with the crystal for testing the crystal.
Of course, the present invention can also have other various embodiments, and based on the embodiments, those skilled in the art can obtain other embodiments without any creative work, and all of them belong to the protection scope of the present invention.
Claims (5)
1. A crystal test mount, comprising: a main body, a probe plate;
the main body includes: the mounting plate is fixedly mounted on the main body, the placing part is fixedly connected with the main body, and a placing groove is formed in the placing part;
the first plate and the second plate are vertically arranged, the first plate and the second plate are fixedly connected, the first plate is movably connected with the mounting plate, the detection plate is placed on the second plate and fixedly connected with the second plate, the detection plate further comprises a first probe and a second probe, the first probe and the second probe are both positioned above the placing groove, and the first probe and the second probe both penetrate through the detection plate and are fixedly connected with the detection plate;
the first plate can slide in the vertical direction relative to the mounting plate, and drives the detection plate to slide in the vertical direction.
2. The crystal test mount of claim 1 wherein the probe plate is partially disposed on the second plate, the first probe and the second probe each being mounted on the probe plate at a location where the probe plate extends beyond the second plate.
3. The crystal test mounting base of claim 1, further comprising two fixing posts, one end of each fixing post is fixedly connected with the second board, the other end of each fixing post penetrates through the probe board, and the two fixing posts are symmetrically arranged on the second board.
4. The crystal test mount of claim 1, wherein the first plate further comprises a gripper bar disposed on a side of the first plate remote from the first probe, the gripper bar having one end fixedly connected to the first plate.
5. The crystal test mount of claim 1, wherein the first probe and the second probe are each electrically connected to the probe plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022456803.1U CN213633513U (en) | 2020-10-29 | 2020-10-29 | Crystal test mounting base |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022456803.1U CN213633513U (en) | 2020-10-29 | 2020-10-29 | Crystal test mounting base |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN213633513U true CN213633513U (en) | 2021-07-06 |
Family
ID=76628436
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202022456803.1U Active CN213633513U (en) | 2020-10-29 | 2020-10-29 | Crystal test mounting base |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN213633513U (en) |
-
2020
- 2020-10-29 CN CN202022456803.1U patent/CN213633513U/en active Active
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| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |