CN213340291U - High-density storage integrated chip performance detection equipment - Google Patents
High-density storage integrated chip performance detection equipment Download PDFInfo
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- CN213340291U CN213340291U CN202022088117.3U CN202022088117U CN213340291U CN 213340291 U CN213340291 U CN 213340291U CN 202022088117 U CN202022088117 U CN 202022088117U CN 213340291 U CN213340291 U CN 213340291U
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- out test
- check out
- sucking disc
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- 238000001514 detection method Methods 0.000 title claims description 36
- 238000012360 testing method Methods 0.000 claims abstract description 34
- 230000010354 integration Effects 0.000 claims abstract description 5
- 238000007789 sealing Methods 0.000 claims description 7
- 230000002349 favourable effect Effects 0.000 abstract description 26
- 230000009286 beneficial effect Effects 0.000 description 13
- 241000252254 Catostomidae Species 0.000 description 7
- 230000000694 effects Effects 0.000 description 5
- 239000000463 material Substances 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 240000007594 Oryza sativa Species 0.000 description 1
- 235000007164 Oryza sativa Nutrition 0.000 description 1
- 230000001174 ascending effect Effects 0.000 description 1
- 235000013339 cereals Nutrition 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 235000009566 rice Nutrition 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
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Abstract
The utility model discloses a high density storage integration chip performance check out test set, including the check out test set main part, the upper end surface of check out test set main part is provided with outer clamshell, outer clamshell's upper end surface is provided with top cap and hank seat, one side surface of hank seat is provided with the fastener. Set up the outer housing through the upper end surface at the check out test set main part, the upper end surface at the outer housing sets up the top cap, the upper end of top cap and the surface are provided with the fastener, be favorable to check out test set to be in comparatively inclosed environment, make the data that detect more accurate, lower extreme surface through carrying the dish No. one sets up electric telescopic handle, slide and slide rail, the upper end surface that carries the dish No. one sets up parts such as sucking disc and slide bar, be favorable to the user to put the chip from the top cap on carrying the dish No. one, later carry the dish to take the chip to come the sucking disc below, the sucking disc is again with the chip inhale to No. two of detecting instrument department carry the dish on, be favorable to realizing automatic feeding.
Description
Technical Field
The utility model relates to a chip check out test set field, in particular to high density storage integration chip performance check out test set.
Background
The chip detection device tests the mixed signal chip by using a test technology based on digital signal processing and has many advantages compared with the traditional test technology, the sampling of the chip test device is used for converting a signal from a continuous signal to a discrete signal, and the reconstruction is used for realizing the opposite process, the chip detection device mainly aims at the appearance detection of the chip on the wafer after cutting, such as the size, the damage, the grains, the air holes, the cracks, the poor nickel layer and the like, so the chip detection device is also called as a wafer cutting detection device and realizes the detection by machine vision, the chip detection device shoots the wafer by a camera, the picture is transmitted to software, the appearance of the product is analyzed by a characteristic algorithm, and good products and defective products are automatically sorted. The prior patent publication CN208188269U only aims at improving the chip carrier, but the tightness of the chip detection device is not changed, and the chip needs to be manually placed on the first carrier tray for detection.
SUMMERY OF THE UTILITY MODEL
The utility model discloses a main aim at provides high density storage integration chip performance check out test set, can effectively solve the problem in the background art.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
the high-density storage integrated chip performance detection device comprises a detection device main body, wherein an outer shell cover is arranged on the outer surface of the upper end of the detection device main body, a controller is arranged on the outer surface of the front end of the outer shell cover, a top cover and a twisting seat are arranged on the outer surface of the upper end of the outer shell cover, a fastener is arranged on the outer surface of one side of the twisting seat, a hinge and a handle are arranged on the outer surface of the upper end of the top cover, a first sliding rail is arranged on the outer surface of the inner side of the outer shell cover, a sliding plate is arranged on the outer surface of the upper end of the first sliding rail, an electric telescopic rod is arranged on the outer surface of the upper end of the sliding plate, a first carrying disc is arranged on the outer surface of the upper end of the first carrying disc, a connecting plate is arranged, the outer surface of the lower end of the sliding rod is provided with a second load disk, the outer surface of the lower end of the second load disk is provided with a second sliding rail, and the outer surface of the upper end of the second sliding rail is provided with a detection instrument.
Preferably, the bi-polar surface of hinge is provided with the fixed screw, the quantity of fixed screw is a plurality of groups, the fixed screw is the array and arranges, the top cap passes through hinge and outer clamshell swing joint, the junction of top cap and outer clamshell is provided with the sealing washer, be fixed connection between sealing washer and the top cap.
By adopting the technical scheme, the following technical effects can be achieved: the fixed screw is favorable to fixing the hinge on outer clamshell and top cap, and the hinge is favorable to swing joint between top cap and the outer clamshell.
Preferably, the quantity of a slide rail is two sets of, a slide rail is the array and arranges, the junction of slide and a slide rail is provided with the spout, be corresponding relation between spout and a slide rail, the slide passes through to be swing joint between spout and a slide rail, the shape of slide is the rectangle.
By adopting the technical scheme, the following technical effects can be achieved: a slide rail and slide cooperation are used, are favorable to a year dish to transport the chip to the sucking disc below.
Preferably, electric telescopic handle's quantity is two sets of, electric telescopic handle is the array and arranges, electric telescopic handle's shape is cylindrical, the shape of carrying the dish for one number is the rectangle, the upper end surface of carrying the dish for one number is provided with the spacing groove, the size of spacing groove is identical with the size of required detection chip, the lower extreme surface of check out test set main part is provided with the supporting legs, be fixed connection between supporting legs and the check out test set main part, the quantity of supporting legs is a plurality of groups, the supporting legs is the array and arranges.
By adopting the technical scheme, the following technical effects can be achieved: electric telescopic handle is favorable to rising a year dish and connects the material in top cap department, descends a year dish to sucking disc below, and the supporting legs is array arrangement supporting legs and is favorable to supporting 1 steadily of check out test set main part and detect to still be favorable to preventing 1 bottom plate of check out test set main part from weing.
Preferably, the quantity of sucking discs is two sets of, the sucking discs are the array and arrange, be fixed connection between sucking disc and the vacuum exhaust tube, the vacuum exhaust tube runs through the connecting plate, the sucking disc set up with the lower extreme surface of connecting plate, and with the connecting plate between be fixed connection.
By adopting the technical scheme, the following technical effects can be achieved: the suction cup is beneficial to sucking the chip, thereby being beneficial to moving the chip.
Preferably, the number of the vacuum exhaust pipes is two, the vacuum exhaust pipes are arranged in an array, the vacuum exhaust pipes are fixedly connected with the suckers, the number of the slide bars is two, the slide bars are arranged in an array, the slide bars penetrate through the slide blocks, the slide blocks are rectangular, and the number of the slide blocks is two and arranged in an array.
By adopting the technical scheme, the following technical effects can be achieved: the vacuum exhaust tube is favorable for exhausting gas between the sucker and the chip and better sucking the chip by the sucker.
Compared with the prior art, the utility model discloses following beneficial effect has: the outer shell cover is arranged on the outer surface of the upper end of the detection equipment main body, the top cover is arranged on the outer surface of the upper end of the outer shell cover, the clamping piece is arranged on the upper end of the top cover, the top cover is opened by controlling the position of the clamping piece, and the sealing ring is arranged at the joint of the top cover and the outer shell cover, which is favorable for leading the main body of the detection equipment to be in a completely closed environment when the top cover is closed and the clamping piece is buckled, is favorable for leading the detection equipment to be in a relatively closed environment, leading the detected data to be more accurate, set up electric telescopic handle, slide and slide rail through the lower extreme surface that carries the dish No. one, the upper end surface that carries the dish No. one sets up parts such as sucking disc and slide bar, is favorable to the user to put the chip from the top cap on carrying the dish No. one, later carries the dish to take the chip to come to the sucking disc below, and the sucking disc is again inhaled the chip to detecting instrument department No. two and is carried the dish on, is favorable to realizing automatic feeding.
Drawings
FIG. 1 is a schematic view of the overall internal structure of the high-density storage integrated chip performance testing apparatus of the present invention;
FIG. 2 is a general view of the external structure of the high-density storage integrated chip performance testing apparatus of the present invention;
FIG. 3 is an enlarged view of A in FIG. 2 of the high density storage integrated chip performance inspection apparatus of the present invention;
FIG. 4 is a partially exploded view of the high-density integrated chip performance testing apparatus of the present invention;
FIG. 5 is a side sectional view of the high-density storage integrated chip performance testing apparatus of the present invention;
fig. 6 is a partial front view of the high-density storage integrated chip performance testing apparatus of the present invention.
In the figure: 1. detecting an apparatus main body; 2. a housing cover; 3. a controller; 4. a top cover; 5. a hinge; 6. A twisting seat; 7. a fastener; 8. a handle; 9. fixing screws; 10. a first slide rail; 11. an electric telescopic rod; 12. a first number carrying disc; 13. a suction cup; 14. a connecting plate; 15. a slider; 16. a slide bar; 17. a vacuum exhaust tube; 18. a slide board.
Detailed Description
In order to make the technical means, creation features, achievement purposes and functions of the present invention easy to understand, the present invention is further described below with reference to the following embodiments.
The first embodiment is as follows:
as shown in fig. 1, 2, 3, 6, the high-density storage integrated chip performance testing apparatus comprises a testing apparatus main body 1, an outer casing 2 is arranged on the outer surface of the upper end of the testing apparatus main body 1, a controller 3 is arranged on the outer surface of the front end of the outer casing 2, the controller 3 is beneficial to controlling and detecting the responsibility sending and organizing main body 1, and the testing apparatus main body 1 is more convenient and simpler to operate, a top cover 4 and a hinge base 6 are arranged on the outer surface of the upper end of the outer casing 2, the hinge base 6 is beneficial to movably buckling the top cover 4 by the fastener 7, a fastener 7 is arranged on the outer surface of one side of the hinge base 6, a hinge 5 and a handle 8 are arranged on the outer surface of the upper end of the top cover 4, the handle 8 is beneficial to pulling open the top cover 4, a first slide rail 10 is arranged on the outer surface of the inner side of the outer casing 2, the outer surface of the upper end of the sliding plate 18 is provided with an electric telescopic rod 11, the electric telescopic rod 11 is favorable for supporting a first carrying disc 12 to rise to a top cover 4 to receive materials, the outer surface of the upper end of the electric telescopic rod 11 is provided with the first carrying disc 12, the first carrying disc 12 is favorable for receiving chips, the outer surface of the upper end of the first carrying disc 12 is provided with a sucker 13, the sucker 13 is favorable for sucking the chips so as to move the chips to the lower part of a detection instrument 21 for detection, the outer surface of the upper end of the sucker 13 is provided with a connecting plate 14, the outer surface of the upper end of the connecting plate 14 is provided with a sliding block 15 and a vacuum exhaust tube 17, the vacuum exhaust tube 17 is favorable for the sucker 13 to better suck the chips, a second slide rail 20 is arranged on the outer surface of the lower end of the second carrying disc 19, and a detection instrument 21 is arranged on the outer surface of the upper end of the second slide rail 20; slider 15 is favorable to driving connecting plate 14 machine sucking disc 13 and slides on slide bar 16, the bi-polar surface of hinge 5 is provided with set screw 9, the quantity of set screw 9 is a plurality of groups, set screw 9 is the array and arranges, top cap 4 is provided with the sealing washer with outer clamshell 2's junction, be fixed connection between sealing washer and the top cap 4, the ground rice goes to be favorable to guaranteeing to be totally airtight between top cap 4 and the outer clamshell 3, top cap 4 passes through hinge 5 and outer clamshell 2 swing joint, be favorable to opening top cap 4 and receive and release the material to check out test set main part 1, set screw 9 is favorable to fixing hinge 5 on outer clamshell 3 and top cap 4, hinge 5 is favorable to swing joint between top cap 4 and the outer clamshell 3.
Example two:
as shown in fig. 1, 4, 5, and 6, the number of the first slide rails 10 is two, the first slide rails 10 are arranged in an array, a sliding groove is arranged at the joint of the sliding plate 18 and the first slide rails 10, the sliding groove corresponds to the first slide rails 10, the sliding plate 18 is movably connected with the first slide rails 10 through the sliding groove, the sliding plate 18 is rectangular, and the first slide rails 10 and the sliding plate 18 are used in cooperation, so that the first carrier plate 12 can transport the chip to the lower side of the suction cup 13; the number of the electric telescopic rods 11 is two, the electric telescopic rods 11 are arranged in an array mode, the electric telescopic rods 11 are cylindrical, the first carrying disc 12 is rectangular, a limiting groove is formed in the outer surface of the upper end of the first carrying disc 12 and is beneficial to containing chips, the size of the limiting groove is matched with the size of a chip to be detected, the electric telescopic rods 11 are beneficial to ascending the first carrying disc 12 to receive materials at the top cover 4 and descending the first carrying disc 12 to the position below a sucker, supporting legs are arranged on the outer surface of the lower end of the detection device main body 1 and are fixedly connected with the detection device main body 1, the number of the supporting legs is multiple, the supporting legs are arranged in an array mode and are beneficial to supporting the detection device main body 1 to stably detect, and a bottom plate of the detection device main body 1 is also beneficial; the number of the suckers 13 is two, the suckers 13 are arranged in an array, the suckers 13 are fixedly connected with the vacuum exhaust tube 17, the suckers 13 are beneficial to sucking the chips on the first carrier plate 12, so that the chips are moved to the lower end of the detection equipment main body 1 for detection, the vacuum exhaust tube 17 penetrates through the connecting plate 14, the suckers 13 are arranged on the outer surface of the lower end of the connecting plate 14 and are fixedly connected with the connecting plate 14, and the suckers 13 are beneficial to sucking the chips, so that the chips are beneficial to moving; the quantity of vacuum exhaust tube 17 is two sets of, and vacuum exhaust tube 17 is the array and arranges, is fixed connection between vacuum exhaust 17 and sucking disc 13, and the quantity of slide bar 16 is two sets of, and slide bar 16 is the array and arranges, and slide bar 16 runs through slider 15, and the shape of slider 15 is the rectangle, and the quantity of slider 15 is two sets of, and is the array and arranges, and vacuum exhaust tube 17 is favorable to taking out the gas between sucking disc 13 and the chip, is favorable to sucking disc 13 to hold the chip better.
It should be noted that, the utility model discloses a high density storage integration chip performance check out test set, when using, the user pulls open top cap 4 through handle 8, put the chip on carrying a dish 12, upper end surface through at housing cover 2 sets up the top cap, guarantee check out test set main part 1's that not only can be better seal, make the equipment that detects more accurate, still make things convenient for the feeding, later, it descends to carry a dish 12 to drive through controller 3 control electric telescopic handle 11, make slide 18 go forward on a slide rail, it comes sucking disc 13 below to carry a dish 12, carry a dish 17 to carry out the evacuation to sucking disc 13 through controller 3 control vacuum exhaust tube 17, make sucking disc 13 take the chip to get into No. two of check out test set 21 below and carry the dish 19 go up and detect, be favorable to realizing 1 automatic feeding of check out test set main part.
The basic principles and the main features of the invention and the advantages of the invention have been shown and described above. It will be understood by those skilled in the art that the present invention is not limited to the above embodiments, and that the foregoing embodiments and descriptions are provided only to illustrate the principles of the present invention without departing from the spirit and scope of the present invention. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (6)
1. High density storage integration chip performance check out test set, including check out test set main part (1), its characterized in that: the outer cover (2) is arranged on the outer surface of the upper end of the detection device main body (1), the controller (3) is arranged on the outer surface of the front end of the outer cover (2), the top cover (4) and the twisting seat (6) are arranged on the outer surface of the upper end of the outer cover (2), the fastener (7) is arranged on the outer surface of one side of the twisting seat (6), the hinge (5) and the handle (8) are arranged on the outer surface of the upper end of the top cover (4), the first sliding rail (10) is arranged on the outer surface of the inner side of the outer cover (2), the sliding plate (18) is arranged on the outer surface of the upper end of the first sliding rail (10), the electric telescopic rod (11) is arranged on the outer surface of the upper end of the sliding plate (18), the first carrying plate (12) is arranged on the outer surface of the upper end of the first carrying plate (12), the sucking disc (, the outer surface of the upper end of the connecting plate (14) is provided with a sliding block (15) and a vacuum exhaust tube (17), the outer surface of the inner side of the sliding block (15) is provided with a sliding rod (16), the outer surface of the lower end of the sliding rod (16) is provided with a second carrying disc (19), the outer surface of the lower end of the second carrying disc (19) is provided with a second sliding rail (20), and the outer surface of the upper end of the second sliding rail (20) is provided with a detection instrument (21).
2. The high-density storage integrated chip performance detection device according to claim 1, wherein: the double-end surface of hinge (5) is provided with set screw (9), the quantity of set screw (9) is a plurality of groups, set screw (9) are the array and arrange, top cap (4) are through hinge (5) and outer clamshell (2) swing joint, the junction of top cap (4) and outer clamshell (2) is provided with the sealing washer, be fixed connection between sealing washer and top cap (4).
3. The high-density storage integrated chip performance detection device according to claim 1, wherein: the quantity of a slide rail (10) is two sets of, a slide rail (10) is the array and arranges, the junction of slide (18) and a slide rail (10) is provided with the spout, be corresponding relation between spout and a slide rail (10), slide (18) are swing joint through being between spout and a slide rail (10), the shape of slide (18) is the rectangle.
4. The high-density storage integrated chip performance detection device according to claim 1, wherein: the quantity of electric telescopic handle (11) is two sets of, electric telescopic handle (11) are the array and arrange, the shape of electric telescopic handle (11) is cylindrically, the shape of carrying dish (12) No. one is the rectangle, the upper end surface of carrying dish (12) No. one is provided with the spacing groove, the size of spacing groove is identical with the size of required detection chip, the lower extreme surface of check out test set main part (1) is provided with the supporting legs, be fixed connection between supporting legs and check out test set main part (1), the quantity of supporting legs is a plurality of groups, the supporting legs is the array and arranges.
5. The high-density storage integrated chip performance detection device according to claim 1, wherein: the quantity of sucking disc (13) is two sets of, sucking disc (13) are the array and arrange, be fixed connection between sucking disc (13) and vacuum exhaust tube (17), vacuum exhaust tube (17) run through connecting plate (14), sucking disc (13) set up with the lower extreme surface of connecting plate (14), and with connecting plate (14) between be fixed connection.
6. The high-density storage integrated chip performance detection device according to claim 1, wherein: the quantity of vacuum exhaust tube (17) is two sets of, vacuum exhaust tube (17) are the array and arrange, be fixed connection between vacuum exhaust tube (17) and sucking disc (13), the quantity of slide bar (16) is two sets of, slide bar (16) are the array and arrange, slide bar (16) run through slider (15), the shape of slider (15) is the rectangle, the quantity of slider (15) is two sets of, and is the array and arranges.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022088117.3U CN213340291U (en) | 2020-09-22 | 2020-09-22 | High-density storage integrated chip performance detection equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022088117.3U CN213340291U (en) | 2020-09-22 | 2020-09-22 | High-density storage integrated chip performance detection equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN213340291U true CN213340291U (en) | 2021-06-01 |
Family
ID=76065504
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202022088117.3U Expired - Fee Related CN213340291U (en) | 2020-09-22 | 2020-09-22 | High-density storage integrated chip performance detection equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN213340291U (en) |
-
2020
- 2020-09-22 CN CN202022088117.3U patent/CN213340291U/en not_active Expired - Fee Related
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| Date | Code | Title | Description |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20210601 |