CN212845754U - Semiconductor testing machine device - Google Patents
Semiconductor testing machine device Download PDFInfo
- Publication number
- CN212845754U CN212845754U CN202021019911.6U CN202021019911U CN212845754U CN 212845754 U CN212845754 U CN 212845754U CN 202021019911 U CN202021019911 U CN 202021019911U CN 212845754 U CN212845754 U CN 212845754U
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- plate
- fixedly connected
- base
- sliding
- barrel
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Abstract
The utility model discloses a semiconductor testing machine device, which comprises a box body, wherein a probe and a base are arranged in the box body, the base is fixedly connected with the box body, the bilateral symmetry of the base is provided with a first limiting device and a second limiting device, one side of the base is provided with a sliding plate, one side of the sliding plate is provided with a backing plate, the backing plate is fixedly connected with the sliding plate, one side of the backing plate is provided with a second rubber pad, the second rubber pad is fixedly connected with a second transverse plate, the second transverse plate is fixedly connected with the backing plate, one side of the backing plate is provided with a first transverse plate, one side of the first transverse plate is fixedly connected with a first rubber pad, the other side of the first transverse plate is fixedly connected with a handle, the bilateral symmetry of the first transverse plate is provided with a second telescopic device and a first telescopic device, the limit of a detected chip can, the displacement generated when the probe is contacted with the chip is avoided, and the surface of the chip is prevented from being scratched by the needle tip.
Description
Technical Field
The utility model relates to a test machine device specifically is a semiconductor test machine device.
Background
A chip is an integrated circuit that fabricates circuits on the surface of a semiconductor chip, and the test classification of integrated circuit chips includes: the wafer test is a test after the wafer is cut and thinned into independent chips, generally, the chip is placed on a test platform, a probe is used for probing a predetermined test point in the chip, and the probe can be used for testing various electrical parameters through direct current and alternating current signals.
The chip is required to be placed and fixed in the process of detecting the chip, so that the subsequent test is carried out, the chip forms a fixed pivot after the test probe contacts the chip in the test process, the chip can jump randomly, the probe is caused to have offset, the test efficiency is influenced, and the surface of the chip is easily scratched by the needle point.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a semiconductor tester device to solve the problem that proposes among the above-mentioned background art.
In order to achieve the above object, the utility model provides a following technical scheme:
the utility model provides a semiconductor test machine device, includes the box, be provided with probe and base in the box, base and box fixed connection, the bilateral symmetry of base is provided with first stop device and second stop device, one side of base is provided with the sliding plate, one side of sliding plate is provided with the backing plate, backing plate and sliding plate fixed connection, one side of backing plate is provided with the second rubber pad, second rubber pad fixedly connected with second diaphragm, second diaphragm and backing plate fixed connection, one side of backing plate is provided with first diaphragm, one side fixedly connected with first rubber pad of first diaphragm, the opposite side fixedly connected with handle of first diaphragm, the bilateral symmetry of first diaphragm is provided with second telescoping device and first telescoping device.
As a further aspect of the present invention: the second limiting device comprises a screw rod and a supporting plate, the supporting plate is sleeved outside the screw rod, the screw rod is in threaded connection with the supporting plate, the supporting plate is fixedly connected with the base, and the structures of the first limiting device and the second limiting device are the same as the specifications of all the parts.
As a further aspect of the present invention: the base is fixedly connected with two sliding blocks, the sliding plate is provided with a sliding groove, and the sliding blocks are arranged in the sliding groove formed in the sliding plate.
As a further aspect of the present invention: the surface of the sliding plate is provided with a groove.
As a further aspect of the present invention: the backing plate is provided with an arc groove.
As a further aspect of the present invention: the filter plate sets up the inner chamber at the jar body is run through to the one end of connecting rod, first telescoping device is including retracting spring, the body of rod and barrel, barrel and backing plate fixed connection, the body of rod is established to the barrel endotheca, the one end fixedly connected with that the body of rod cover is established in the barrel retracts the spring, retract the one end and the barrel fixed connection of spring, the body of rod cover is established on the outer one end surface of barrel and first diaphragm fixed connection, the structure of second telescoping device and first telescoping device and the specification of each part are all the same.
Compared with the prior art, the beneficial effects of the utility model are that:
1. through box, base, first stop device, second stop device, sliding plate, backing plate, second rubber pad, second diaphragm, first rubber pad, second telescoping device and first telescoping device, the cooperation of above parts is used and can be realized spacing to being detected the chip, produces the displacement when avoiding probe and chip contact, avoids needle point fish tail chip surface, improves detection efficiency and quality.
2. The adjustment of the position of the detected chip can be realized by matching the box body, the base, the first limiting device, the second limiting device, the sliding plate and the sliding block, and the detection quality of the chip is improved.
Drawings
Fig. 1 is a schematic structural diagram of a semiconductor tester device.
Fig. 2 is a front view of a semiconductor tester apparatus.
Fig. 3 is a partial structural diagram of a semiconductor tester device.
Shown in the figure: the probe comprises a box body 1, a probe 2, a retraction spring 3, a handle 4, a rod body 5, a base 6, a screw rod 7, a first limiting device 8, a support plate 9, a sliding block 10, a barrel body 11, a sliding plate 12, a first transverse plate 13, a second limiting device 14, an arc groove 15, a first rubber pad 16, a second rubber pad 17, a second transverse plate 18, a second telescopic device 19, a base plate 20, a first telescopic device 21 and a groove 22.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1 to 3, in an embodiment of the present invention, a semiconductor testing machine device includes a box body 1, a probe 2, a retraction spring 3, a handle 4, a rod body 5, a base 6, a lead screw 7, a first position-limiting device 8, a support plate 9, a slider 10, a cylinder body 11, a sliding plate 12, a first transverse plate 13, a second position-limiting device 14, an arc groove 15, a first rubber pad 16, a second rubber pad 17, a second transverse plate 18, a second telescopic device 19, a backing plate 20, a first telescopic device 21 and a groove 22, wherein the box body 1 is internally provided with the probe 2 and the base 6, the base 6 is fixedly connected with the box body 1, the first position-limiting device 8 and the second position-limiting device 14 are symmetrically arranged on two sides of the base 6, the second position-limiting device 14 includes the lead screw 7 and the support plate 9, the lead screw 7 is externally sleeved with the support plate 9, the support plate 9 is in threaded connection with the support plate 9, the support plate 9 is fixedly connected with the, the base 6 is fixedly connected with two sliding blocks 10, one side of the base 6 is provided with a sliding plate 12, the sliding plate 12 is provided with a sliding groove, the sliding blocks 10 are arranged in the sliding groove formed in the sliding plate 12, the surface of the sliding plate 12 is provided with a groove 22, one side of the sliding plate 12 is provided with a base plate 20, the base plate 20 is fixedly connected with the sliding plate 12, the base plate 20 is provided with an arc groove 15, one side of the base plate 20 is provided with a second rubber pad 17, the second rubber pad 17 is fixedly connected with a second transverse plate 18, the second transverse plate 18 is fixedly connected with the base plate 20, one side of the base plate 20 is provided with a first transverse plate 13, one side of the first transverse plate 13 is fixedly connected with a first rubber pad 16, the other side of the first transverse plate 13 is fixedly connected with a handle 4, two sides of the first transverse plate 13 are symmetrically, the barrel 11 is fixedly connected with the backing plate 20, the barrel 11 is sleeved with the rod body 5, one end of the rod body 5 sleeved in the barrel 11 is fixedly connected with the retraction spring 3, one end of the retraction spring 3 is fixedly connected with the barrel 11, the rod body 5 is sleeved on one end surface outside the barrel 11 and is fixedly connected with the first transverse plate 13, and the structures of the second expansion device 19 and the first expansion device 21 are the same as the specifications of all the parts.
The utility model discloses a theory of operation is:
during the use, pulling handle 4, further drive first diaphragm 13 and move toward the direction of handle 4, further place the chip that needs the test on backing plate 20, further loosen handle 4, further retract spring 3 and retract, further retract spring 3 drives the body of rod 5 and removes toward barrel 11, thereby drive first diaphragm 13 and move toward arc groove 15's direction, until first rubber pad 16 and chip contact, further realized the spacing of the chip that needs to test, further rotatory lead screw 7, further slider 10 that sliding plate 12 followed removes, thereby realize the adjustment of sliding plate 12 position, further drive the chip adjusting position on the backing plate 20, further probe 2 begins to test the chip, after the test finishes, pulling handle 4, thereby relieve the spacing to the chip, further take out the chip from arc groove 15's position, and is simple and convenient to operate.
Although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments or portions thereof without departing from the spirit and scope of the invention.
Claims (6)
1. A semiconductor tester device, includes box (1), its characterized in that: the probe (2) and the base (6) are arranged in the box body (1), the base (6) is fixedly connected with the box body (1), a first limiting device (8) and a second limiting device (14) are symmetrically arranged on two sides of the base (6), a sliding plate (12) is arranged on one side of the base (6), a base plate (20) is arranged on one side of the sliding plate (12), the base plate (20) is fixedly connected with the sliding plate (12), a second rubber pad (17) is arranged on one side of the base plate (20), a second transverse plate (18) is fixedly connected with the second rubber pad (17), the second transverse plate (18) is fixedly connected with the base plate (20), a first transverse plate (13) is arranged on one side of the base plate (20), a first rubber pad (16) is fixedly connected with one side of the first transverse plate (13), and a handle (4) is fixedly connected with the other side of the first transverse plate (13), and a second telescopic device (19) and a first telescopic device (21) are symmetrically arranged on two sides of the first transverse plate (13).
2. The semiconductor tester device of claim 1, wherein: the second limiting device (14) comprises a screw rod (7) and a support plate (9), the support plate (9) is sleeved outside the screw rod (7), the screw rod (7) is in threaded connection with the support plate (9), the support plate (9) is fixedly connected with the base (6), and the structures of the first limiting device (8) and the second limiting device (14) and the specifications of all the parts are the same.
3. The semiconductor tester device of claim 1, wherein: the base (6) is fixedly connected with two sliding blocks (10), the sliding plate (12) is provided with a sliding groove, and the sliding blocks (10) are arranged in the sliding groove formed in the sliding plate (12).
4. The semiconductor tester device of claim 1, wherein: the surface of the sliding plate (12) is provided with a groove (22).
5. The semiconductor tester device of claim 1, wherein: the backing plate (20) is provided with an arc groove (15).
6. The semiconductor tester device of claim 1, wherein: first telescoping device (21) is including retracting spring (3), the body of rod (5) and barrel (11), barrel (11) and backing plate (20) fixed connection, the body of rod (5) are established to barrel (11) endotheca, the one end fixedly connected with that the barrel (11) was established to the body of rod (5) cover is retracted spring (3), retract spring (3) one end and barrel (11) fixed connection, the body of rod (5) cover is established at the outer terminal surface of barrel (11) and first diaphragm (13) fixed connection, the structure of second telescoping device (19) and first telescoping device (21) and the specification of each part are all the same.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021019911.6U CN212845754U (en) | 2020-06-05 | 2020-06-05 | Semiconductor testing machine device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021019911.6U CN212845754U (en) | 2020-06-05 | 2020-06-05 | Semiconductor testing machine device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN212845754U true CN212845754U (en) | 2021-03-30 |
Family
ID=75170789
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202021019911.6U Expired - Fee Related CN212845754U (en) | 2020-06-05 | 2020-06-05 | Semiconductor testing machine device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN212845754U (en) |
-
2020
- 2020-06-05 CN CN202021019911.6U patent/CN212845754U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20210330 |