CN217181134U - Integrated circuit testing device based on radio frequency testing head - Google Patents

Integrated circuit testing device based on radio frequency testing head Download PDF

Info

Publication number
CN217181134U
CN217181134U CN202220056927.7U CN202220056927U CN217181134U CN 217181134 U CN217181134 U CN 217181134U CN 202220056927 U CN202220056927 U CN 202220056927U CN 217181134 U CN217181134 U CN 217181134U
Authority
CN
China
Prior art keywords
integrated circuit
radio frequency
fixedly connected
testing
circuit board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202220056927.7U
Other languages
Chinese (zh)
Inventor
高晶晶
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jiaxing Jingxuntong Electronic Technology Co ltd
Original Assignee
Jiaxing Jingxuntong Electronic Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jiaxing Jingxuntong Electronic Technology Co ltd filed Critical Jiaxing Jingxuntong Electronic Technology Co ltd
Priority to CN202220056927.7U priority Critical patent/CN217181134U/en
Application granted granted Critical
Publication of CN217181134U publication Critical patent/CN217181134U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The utility model provides an integrated circuit testing arrangement based on radio frequency test head is used belongs to integrated circuit board testing arrangement technical field. The utility model provides an integrated circuit testing arrangement based on radio frequency test head uses, includes the test box, top one side of test box articulates there is the case lid, top fixedly connected with tester in the case lid. The utility model discloses a set up fixture, the position of adjusting L type grip block through two can stabilize the centre gripping fixed to unidimensional integrated circuit board, two grip blocks of cooperation are further fixed integrated circuit board simultaneously, the inconvenient quick fixed problem of current integrated circuit board when the test has been solved, avoid causing integrated circuit board to take place the skew and lead to the test result inaccurate in the integrated circuit board test procedure, and simultaneously, one side at L type grip block sets up pressure sensor, the grip block is to integrated circuit board's clamp force when convenient monitoring presss from both sides tightly, avoid the too big integrated circuit board damage that leads to of dynamics.

Description

Integrated circuit testing device based on radio frequency testing head
Technical Field
The utility model relates to an integrated circuit board testing arrangement technical field particularly, relates to an integrated circuit testing arrangement based on radio frequency test head is used.
Background
An integrated circuit board is a microelectronic device or component. The transistor, the resistor, the capacitor, the inductor and other elements and wires required in a circuit are interconnected together by adopting a certain process, are manufactured on a small or a plurality of small semiconductor wafers or medium substrates, and are then packaged in a tube shell to form a micro structure with the required circuit function; all the elements are structurally integrated, so that the electronic elements are greatly miniaturized, low in power consumption, intelligent and high in reliability.
However, the existing integrated circuit board testing device has a large structure and is inconvenient to move; the fixing effect on the integrated circuit board is poor, the operation process is complicated, and a tester is inconvenient to carry out large-scale test on the integrated circuit board when the test device is used, so that the accuracy of the test is influenced by a small sample.
SUMMERY OF THE UTILITY MODEL
In order to remedy the above deficiencies, the present invention provides an integrated circuit testing device for use with a radio frequency test head that overcomes or at least partially solves the above mentioned problems.
The utility model discloses a realize like this:
the utility model provides an integrated circuit testing arrangement based on radio frequency test head uses, including the test box, top one side of test box articulates there is the case lid, top fixedly connected with tester in the case lid, one side electrically connected with connecting wire of tester, the one end electrically connected with radio frequency test head body that the tester was kept away from to the connecting wire, it is equipped with the go-between to be close to the fixed cover in top on the radio frequency test head body, inside one side fixedly connected with connecting rod of test box, the one end fixedly connected with sleeve of connecting rod, telescopic inside is located to radio frequency test head body cover, the bottom is provided with fixture in the test box.
In a preferred scheme fixture includes two electric putter, two electric putter respectively fixed connection is in the inner wall both sides of test box, two electric putter's the equal fixedly connected with L type grip block of piston rod end.
In a preferred scheme, one side of each L-shaped clamping plate is fixedly connected with a pressure sensor, and one side of each pressure sensor is fixedly connected with two springs.
In a preferred scheme, one end of each of the two springs is fixedly connected with a clamping plate, and each clamping plate is arranged on the corresponding L-shaped clamping plate in a sliding mode.
In a preferred scheme, the bottom of each L-shaped clamping plate is fixedly connected with a sliding column, and the bottom of each sliding column is fixedly connected with a sliding plate.
In a preferred scheme, the bottom in the test box is provided with a sliding groove, and the two sliding plates are both connected inside the sliding groove in a sliding manner.
The utility model provides a pair of integrated circuit testing arrangement based on radio frequency test head is used, its beneficial effect including:
1. by arranging the clamping mechanism, integrated circuit boards with different sizes can be stably clamped and fixed by adjusting the positions of the L-shaped clamping plates, and the integrated circuit boards are further fixed by matching the two clamping plates, so that the problem that the existing integrated circuit boards are inconvenient to quickly fix during testing is solved, the integrated circuit boards are prevented from being deviated in the testing process of the integrated circuit boards, and the testing result is inaccurate;
2. through setting up radio frequency test head body, connecting rod, sleeve and go-between cooperation and using, it is fixed that convenient taking in to radio frequency test head body, prevents that radio frequency test head body from depositing at will and lead to damaging.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
Fig. 1 is a first perspective view provided in an embodiment of the present invention;
fig. 2 is a second perspective view provided in the embodiment of the present invention;
fig. 3 is a perspective view of a case cover according to an embodiment of the present invention;
fig. 4 is a schematic view of a front view cross-sectional structure according to an embodiment of the present invention.
In the figure: 101. a test box; 102. a box cover; 103. a tester; 104. a connecting wire; 105. a radio frequency test head body; 106. a connecting ring; 107. a connecting rod; 108. a sleeve; 109. a handle; 110. a rubber sleeve; 111. a heat sink; 112. a support pillar; 200. a clamping mechanism; 201. an electric push rod; 202. an L-shaped clamping plate; 203. a pressure sensor; 204. a spring; 205. a clamping plate; 206. a sliding post; 207. a slide plate; 208. a chute.
Detailed Description
To make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the drawings of the embodiments of the present invention are combined to clearly and completely describe the technical solutions of the embodiments of the present invention, and obviously, the described embodiments are some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "upper", "lower", "left", "right", "inner", "outer", "top/bottom", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
Examples
Referring to fig. 1-4, the present invention provides a technical solution: an integrated circuit testing device based on a radio frequency testing head comprises a testing box 101, one side of the top of the testing box 101 is hinged with a box cover 102, a tester 103 is fixedly connected to the top in the box cover 102, one side of the tester 103 is electrically connected with a connecting wire 104, one end, far away from the tester 103, of the connecting wire 104 is electrically connected with a radio frequency testing head body 105, a connecting ring 106 is fixedly sleeved on the radio frequency testing head body 105 close to the top, a connecting rod 107 is fixedly connected to one side of the inside of the testing box 101, one end of the connecting rod 107 is fixedly connected with a sleeve 108, the radio frequency testing head body 105 can be hung and sleeved inside the sleeve 108 by arranging the connecting ring 106 and the sleeve 108 to be used in a matched mode, the radio frequency testing head body 105 is convenient to store and fix, and the radio frequency testing head body 105 is prevented from being damaged due to random storage; the radio frequency test head body 105 is sleeved inside the sleeve 108, and a clamping mechanism 200 is arranged at the bottom inside the test box 101.
In a preferred embodiment, the clamping mechanism 200 includes two electric push rods 201, the two electric push rods 201 are respectively and fixedly connected to two sides of the inner wall of the test box 101, and the piston rod ends of the two electric push rods 201 are both fixedly connected with an L-shaped clamping plate 202.
In a preferred embodiment, one side of each L-shaped clamping plate 202 is fixedly connected with a pressure sensor 203, one side of each pressure sensor 203 is fixedly connected with two springs 204, one end of each spring 204 is fixedly connected with a clamping plate 205, each clamping plate 205 is slidably arranged on the corresponding L-shaped clamping plate 202, the springs 204 and the clamping plates 205 are arranged to be matched for use, when the integrated circuit board is clamped, the springs 204 are compressed when the integrated circuit board contacts the two clamping plates 205, at this time, the pressure sensors 203 detect pressure through the springs 204, when the pressure reaches a certain range, the electric push rod 201 stops working, and damage to the integrated circuit board caused by overlarge force is avoided.
In a preferred embodiment, the bottom of each L-shaped clamping plate 202 is fixedly connected with a sliding column 206, the bottom of each sliding column 206 is fixedly connected with a sliding plate 207, a sliding groove 208 is formed in the bottom of the test box 101, the two sliding plates 207 are slidably connected inside the sliding groove 208, and the sliding plates 207 and the sliding groove 208 are arranged to cooperate with each other, so that the stability of the two L-shaped clamping plates 202 in the moving process is improved.
In a preferred embodiment, a handle 109 is fixedly connected to one side of the surface of the case cover 102, a rubber sleeve 110 is fixedly sleeved on the handle 109, and the comfort of holding the handle 109 is increased by the rubber sleeve 110.
In a preferred embodiment, a plurality of heat dissipation slots 111 are equidistantly formed on both sides of the test box 101 and the box cover 102, and support columns 112 are fixedly mounted at four corners of the bottom of the test box 101.
Specifically, the working process or working principle of the integrated circuit testing device based on the radio frequency testing head is as follows: when the integrated circuit board clamping device is used, firstly, the box cover 102 is opened by pulling the handle 109, then, the two electric push rods 201 are started according to the specification of the integrated circuit board, the piston rod ends of the two electric push rods 201 extend out or retract, so that the two L-shaped clamping plates 202 are driven to move to be close to or away from each other, the integrated circuit board is arranged between the two L-shaped clamping plates 202, so that the integrated circuit board is convenient to support, the integrated circuit board is further clamped through the two clamping plates 205 while the two L-shaped clamping plates 202 move towards the middle, the integrated circuit board is contacted with the two clamping plates 205 during clamping, the spring 204 is compressed, the pressure sensor 203 detects pressure through the spring 204, when the pressure reaches a certain range, the electric push rods 201 stop working, meanwhile, the electric telescopic rod 12 drives the contact block 18 to be contacted with contacts on the integrated circuit board, so that the integrated circuit boards with different sizes can be clamped and fixed, the integrated circuit board can be tested by the tester 103 and the radio frequency test head body 105.
It should be noted that the tester 103, the rf test head body 105, the electric push rod 201, and the pressure sensor 203 are devices or apparatuses existing in the prior art or devices or apparatuses that can be realized by the prior art, and power supply, specific components, and principles thereof will be clear to those skilled in the art, and therefore, detailed descriptions thereof are omitted.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (8)

1. An integrated circuit testing device based on a radio frequency testing head comprises a testing box (101), it is characterized in that one side of the top of the test box (101) is hinged with a box cover (102), the inner top of the box cover (102) is fixedly connected with a tester (103), one side of the tester (103) is electrically connected with a connecting wire (104), one end of the connecting wire (104) far away from the tester (103) is electrically connected with a radio frequency test head body (105), a connecting ring (106) is fixedly sleeved on the radio frequency test head body (105) close to the top, one side in the test box (101) is fixedly connected with a connecting rod (107), one end fixedly connected with sleeve (108) of connecting rod (107), the inside of sleeve (108) is located in radio frequency test head body (105) cover, bottom is provided with fixture (200) in test box (101).
2. The integrated circuit testing device based on the radio frequency testing head as claimed in claim 1, wherein the clamping mechanism (200) comprises two electric push rods (201), the two electric push rods (201) are respectively and fixedly connected to two sides of the inner wall of the testing box (101), and the piston rod ends of the two electric push rods (201) are both fixedly connected with an L-shaped clamping plate (202).
3. The integrated circuit testing device based on the radio frequency testing head as recited in claim 2, characterized in that a pressure sensor (203) is fixedly connected to one side of each L-shaped clamping plate (202), and two springs (204) are fixedly connected to one side of each pressure sensor (203).
4. The integrated circuit testing device based on the radio frequency testing head as claimed in claim 3, wherein one end of the two springs (204) is fixedly connected with a clamping plate (205), and each clamping plate (205) is slidably arranged on the corresponding L-shaped clamping plate (202).
5. The integrated circuit testing device based on the radio frequency testing head as claimed in claim 4, wherein a sliding column (206) is fixedly connected to the bottom of each L-shaped clamping plate (202), and a sliding plate (207) is fixedly connected to the bottom of each sliding column (206).
6. The device for testing the integrated circuit based on the radio frequency test head as recited in claim 5, characterized in that a sliding groove (208) is formed at the bottom of the test box (101), and both of the sliding plates (207) are slidably connected to the inside of the sliding groove (208).
7. The integrated circuit testing device based on the radio frequency testing head as claimed in claim 1, wherein a handle (109) is fixedly connected to one side of the surface of the box cover (102), and a rubber sleeve (110) is fixedly sleeved on the handle (109).
8. The integrated circuit testing device based on the radio frequency testing head as recited in claim 1, wherein a plurality of heat dissipation grooves (111) are formed in the two sides of the testing box (101) and the box cover (102) at equal intervals, and support columns (112) are fixedly mounted at four corners of the bottom of the testing box (101).
CN202220056927.7U 2022-01-11 2022-01-11 Integrated circuit testing device based on radio frequency testing head Active CN217181134U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202220056927.7U CN217181134U (en) 2022-01-11 2022-01-11 Integrated circuit testing device based on radio frequency testing head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202220056927.7U CN217181134U (en) 2022-01-11 2022-01-11 Integrated circuit testing device based on radio frequency testing head

Publications (1)

Publication Number Publication Date
CN217181134U true CN217181134U (en) 2022-08-12

Family

ID=82732739

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202220056927.7U Active CN217181134U (en) 2022-01-11 2022-01-11 Integrated circuit testing device based on radio frequency testing head

Country Status (1)

Country Link
CN (1) CN217181134U (en)

Similar Documents

Publication Publication Date Title
CN211697879U (en) Button cell fixture and battery testing arrangement
CN217181134U (en) Integrated circuit testing device based on radio frequency testing head
CN110824334B (en) PCB detection jig with positioning function
CN218121659U (en) Detection apparatus is used in condenser production
CN215415793U (en) Storage battery detection device and storage battery detection equipment
CN211318498U (en) Automatic clamping device for formation foil performance detection sample
CN212872767U (en) Chip function test fixture
CN215179565U (en) PCB flaw inspection equipment
CN208443994U (en) A kind of specimen holder device for the test of magneto-electric coupled coefficient
CN108286956B (en) Automatic diameter measuring device for copper wire for photovoltaic transformer
CN209992619U (en) Integrated circuit test equipment
CN210376600U (en) Flexible circuit board rapid detection device for precision electromechanical product research and development
CN215640543U (en) Portable product torsion test clamping device
CN219831143U (en) Frock clamp for battery delivery detection
CN218099315U (en) Mutual inductor detection by means of tool clamps
CN209819104U (en) Instrument support for optical measurement
CN212845754U (en) Semiconductor testing machine device
CN221349945U (en) Single lamp tube tester
CN219084978U (en) Integrated circuit tester
CN215575258U (en) Capacitor detection clamp
CN220552895U (en) Direct-insert type power semiconductor module test fixture
CN216900624U (en) Power adapter production line is with multi-functional pneumatic valve control test jig
CN214409142U (en) Quick detection tool of heavy current terminal
CN214539882U (en) Integrated circuit tester convenient to overhaul
CN217879279U (en) MOSFET-based semiconductor device detection equipment

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant