CN215768974U

CN215768974U - Wafer type limiting device for debugging and detecting frequency response of oscilloscope

Info

Publication number: CN215768974U
Application number: CN202121821749.4U
Authority: CN
Inventors: 柳典龙; 张润锋; 张媛婷
Original assignee: Shenzhen Youtest Technology Co ltd
Current assignee: Shenzhen Youtest Technology Co ltd
Priority date: 2021-08-05
Filing date: 2021-08-05
Publication date: 2022-02-08
Anticipated expiration: 2031-08-05

Abstract

The utility model provides a wafer type limiting device for debugging and detecting the frequency response of an oscilloscope, which comprises: the device comprises a clamp, a rubber pad, a damping rotating shaft, a rotary seat, a sliding cavity, a spring, a sliding block, a pressure rod, a finger plate, a probe, an electrical joint, a contact pin and a lock hole; the clamp is in an A-shaped clamp shape, and a rubber pad is adhered to the clamping surface of the clamp; a linear damping rotating shaft is embedded in the middle of the top end of the clamp and is in threaded connection with the clamp; a cylindrical swivel base is embedded at the top end of the damping rotating shaft and is in threaded connection with the damping rotating shaft; the wafer type limiting probe rod for debugging and detecting the frequency response of the oscilloscope has the advantages of reasonable structure, larger measurement range, better use convenience and more convenient operation by improving the wafer type limiting probe rod for debugging and detecting the frequency response of the oscilloscope, thereby effectively solving the problems and the defects in the existing device.

Description

Wafer type limiting device for debugging and detecting frequency response of oscilloscope

Technical Field

The utility model relates to the technical field of testers, in particular to a wafer type limiting device for debugging and detecting frequency response of an oscilloscope.

Background

An oscilloscope is an electronic measuring instrument with wide application, is used for measuring signal waveforms of alternating current or pulse current waves, and is often required to be used for measuring signals of a circuit board in order to verify whether various signals on a designed circuit are normal or not.

The probe contact signal point of the oscilloscope probe is usually used during the debugging and detection of the oscilloscope frequency response, the wafer type limit probe is a structural form of the existing probe, the probe is fixed on a circuit board through a clamp during the detection so as to improve the stability of the probe and improve the contact effect, the detection range of the wafer type limit probe for the debugging and detection of the oscilloscope frequency response is mostly smaller, the use convenience is not enough, and therefore, the improvement space exists.

In view of the above, the present invention provides a wafer-type position-limiting device for detecting and debugging the frequency response of an oscilloscope, which is developed and improved to solve the problems and improve the practical value.

SUMMERY OF THE UTILITY MODEL

The utility model aims to provide a wafer type limiting device for debugging and detecting the frequency response of an oscilloscope, which aims to solve the problems and the defects in the background technology.

In order to achieve the above object, the present invention provides a wafer-type position-limiting device for debugging and detecting the frequency response of an oscilloscope, which is achieved by the following specific technical means:

the utility model provides an oscilloscope frequency response debugs and detects and uses wafer formula stop device, includes: the device comprises a clamp, a rubber pad, a damping rotating shaft, a rotary seat, a sliding cavity, a spring, a sliding block, a pressure rod, a finger plate, a probe, an electrical joint, a contact pin and a lock hole; the clamp is in an A-shaped clamp shape, and a rubber pad is adhered to the clamping surface of the clamp; a linear damping rotating shaft is embedded in the middle of the top end of the clamp and is in threaded connection with the clamp; a cylindrical swivel base is embedded at the top end of the damping rotating shaft and is in threaded connection with the damping rotating shaft; a round hole-shaped sliding cavity is formed in the rotary seat, and a spring is embedded in the bottom of the sliding cavity; the spring is in clearance fit with the sliding cavity, and a cylindrical sliding block is arranged at the top end of the spring; the sliding block is in sliding fit with the inside of the sliding cavity, and a cylindrical pressing rod is welded in the middle of the top end of the sliding block; the top end of the pressure lever upwards penetrates through the top end of the rotary seat to the outside, and a circular plate-shaped fingerboard is welded on the top end of the pressure lever; the middle position of the side part of the sliding block is provided with an oblong lock hole which is communicated from left to right; a probe rod of a circular rod penetrates through the left side and the right side of the inner side of the lock hole, and the probe rod is in clearance fit with the lock hole; the probe penetrates through the side part of the rotary seat from left to right, and the probe is in sliding fit with the rotary seat; a cylindrical electrical connector is welded at the right end of the probe rod; round rod-shaped contact pins penetrate through the left side and the right side of the axis of the probe rod, and the contact pins and the electrical joint are fixed in a hot melting mode; the right end of the contact pin is fixedly connected with the left end of the electrical connector through tin soldering.

As a further optimization of the technical scheme, the wafer type limiting device for the frequency response debugging and detecting of the oscilloscope is provided, and the swivel base is a horizontal rotation device.

As a further optimization of the technical solution, in the wafer-type limiting device for detecting the frequency response of the oscilloscope, the slide block is a vertical sliding device, and the slide block is a locking device of the probe rod.

As a further optimization of the technical scheme, in the wafer-type limiting device for debugging and detecting the frequency response of the oscilloscope, the pressure lever is an elastic telescopic device.

As a further optimization of the technical scheme, in the wafer-type limiting device for debugging and detecting the frequency response of the oscilloscope, the probe is a left-right translation device.

As a further optimization of the technical scheme, according to the wafer-type limiting device for detecting the frequency response of the oscilloscope, the left end of the contact pin is bent downwards in an L shape, and the contact pin is made of a low-impedance elastic metal material.

Due to the application of the technical scheme, compared with the prior art, the utility model has the following advantages:

1. according to the utility model, the rotary seat is a horizontal rotating device, and the probe is a left-right translation device, so that the measuring range is conveniently enlarged, and the convenience in use is improved.

2. According to the utility model, the slide block is used as the locking device of the probe, and the pressure rod is used as the elastic telescopic device, so that the probe can be conveniently translated and fixed, and the operation is more convenient.

3. The utility model has the advantages of reasonable structure, larger measurement range, better use convenience and more convenient operation by improving the wafer type limit probe for debugging and detecting the frequency response of the oscilloscope, thereby effectively solving the problems and the defects of the utility model in the background technology.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this application, illustrate embodiments of the utility model and, together with the description, serve to explain the utility model and not to limit the utility model. In the drawings:

FIG. 1 is a schematic structural view of the present invention;

FIG. 2 is a schematic side view of the present invention;

fig. 3 is a partial structural schematic diagram of the present invention.

In the figure: the clamp comprises a clamp 1, a rubber pad 2, a damping rotating shaft 3, a rotary seat 4, a sliding cavity 5, a spring 6, a sliding block 7, a pressure lever 8, a finger plate 9, a probe 10, an electrical joint 11, a contact pin 12 and a lock hole 701.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.

It is to be noted that, in the description of the present invention, "a plurality" means two or more unless otherwise specified; the terms "upper", "lower", "left", "right", "inner", "outer", "front", "rear", "head", "tail", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are only for convenience in describing and simplifying the description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed in a particular orientation, and be operated, and thus, should not be construed as limiting the utility model.

Meanwhile, in the description of the present invention, unless otherwise explicitly specified or limited, the terms "connected" and "connected" should be interpreted broadly, for example, as being fixedly connected, detachably connected, or integrally connected; the connection can be mechanical connection or electrical connection; may be directly connected or indirectly connected through an intermediate. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Referring to fig. 1 to 3, the present invention provides a specific technical embodiment of a wafer-type position-limiting device for debugging and detecting the frequency response of an oscilloscope:

the utility model provides an oscilloscope frequency response debugs and detects and uses wafer formula stop device, includes: the device comprises a clamp 1, a rubber pad 2, a damping rotating shaft 3, a rotary seat 4, a sliding cavity 5, a spring 6, a sliding block 7, a pressure lever 8, a finger plate 9, a probe 10, an electrical joint 11, a contact pin 12 and a lock hole 701; the clamp 1 is in an A-shaped clamp shape, and a rubber pad 2 is adhered to the clamping surface of the clamp 1; a linear damping rotating shaft 3 is embedded in the middle of the top end of the clamp 1, and the damping rotating shaft 3 is in threaded connection with the clamp 1; a cylindrical swivel mount 4 is embedded at the top end of the damping rotating shaft 3, and the swivel mount 4 is in threaded connection with the damping rotating shaft 3; a round hole-shaped sliding cavity 5 is formed in the rotary seat 4, and a spring 6 is embedded in the bottom of the sliding cavity 5; the spring 6 is in clearance fit with the sliding cavity 5, and a cylindrical sliding block 7 is arranged at the top end of the spring 6; the sliding block 7 is in sliding fit with the inside of the sliding cavity 5, and a cylindrical compression bar 8 is welded in the middle of the top end of the sliding block 7; the top end of the pressure lever 8 upwards penetrates through the top end of the rotary seat 4 to the outside, and a circular plate-shaped fingerboard 9 is welded on the top end of the pressure lever 8; a long round locking hole 701 is formed in the middle of the side of the sliding block 7, and the locking hole 701 is through from left to right; a round bar probe 10 penetrates through the left side and the right side of the inner side of the lock hole 701, and the probe 10 is in clearance fit with the lock hole 701; the probe 10 penetrates through the side part of the rotary seat 4 from left to right, and the probe 10 is in sliding fit with the rotary seat 4; the right end of the probe 10 is welded with a cylindrical electrical connector 11; round rod-shaped contact pins 12 penetrate through the left and right sides of the axis of the probe 10, and the contact pins 12 are fixed with the electrical connectors 11 in a hot melting manner; the right end of the contact pin 12 is fixedly connected to the left end of the electrical contact 11 by soldering.

Specifically, referring to fig. 1, the rotary base 4 is a horizontal rotation device.

Specifically, referring to fig. 2, the slider 7 is configured as a vertical sliding device, and the slider 7 is configured as a locking device for the probe 10, the spring 6 pushes the slider 7 upward, the lock hole 701 moves upward, and the probe 10 is abutted.

Specifically, referring to fig. 2, the pressing rod 8 is an elastic telescopic device, the finger plate 9 is pressed, the pressing plate 8 slides downward to push the sliding block 7 to move downward, the spring 6 is compressed, and after the pressing is released, the spring 6 rebounds to push the sliding block 7, the pressing plate 8 and the finger plate 9 to move upward to the initial position.

Specifically, referring to fig. 1, the probe 10 is configured as a left-right translation device, and presses the finger plate 9 to move the lock hole 701 downward, and the probe 10 is pulled left and right to change the measurement position of the stylus 12, thereby increasing the measurement range.

Specifically, referring to fig. 1, the left end of the contact pin 12 is bent downward in an L shape, and the contact pin 12 is made of a low-impedance elastic metal material.

The method comprises the following specific implementation steps:

the finger plate 9 is pressed to move the lock hole 701 downward, the probe 10 is horizontally rotated while being pulled left and right, the stylus 12 is brought into contact with the measured position, the pressing is released, the lock hole 701 is moved upward by the spring 6, the probe 10 is abutted, and the adjusted position of the probe 10 is fixed.

In summary, the following steps: according to the wafer type limiting device for debugging and detecting the frequency response of the oscilloscope, the rotary seat is arranged to be the horizontal rotating device, and the probe is arranged to be the left and right translation device, so that the measuring range is conveniently enlarged, and the convenience in use is improved; the slide block is a locking device of the probe, and the pressure rod is an elastic telescopic device, so that the probe can be conveniently translated and fixed, and the operation is more convenient; the wafer type limiting probe rod for debugging and detecting the frequency response of the oscilloscope has the advantages of reasonable structure, larger measurement range, better use convenience and more convenient operation by improving the wafer type limiting probe rod for debugging and detecting the frequency response of the oscilloscope, thereby effectively solving the problems and the defects in the existing device.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides an oscilloscope frequency response debugs and detects and uses wafer formula stop device, includes: the device comprises a clamp (1), a rubber pad (2), a damping rotating shaft (3), a rotary seat (4), a sliding cavity (5), a spring (6), a sliding block (7), a pressing rod (8), a finger plate (9), a probe (10), an electrical connector (11), a contact pin (12) and a lock hole (701); the method is characterized in that: the clamp (1) is in an A-shaped clamp shape, and a rubber pad (2) is adhered to the clamping surface of the clamp (1); a linear damping rotating shaft (3) is embedded in the middle of the top end of the clamp (1), and the damping rotating shaft (3) is in threaded connection with the clamp (1); a cylindrical swivel base (4) is embedded at the top end of the damping rotating shaft (3), and the swivel base (4) is in threaded connection with the damping rotating shaft (3); a round hole-shaped sliding cavity (5) is formed in the rotary seat (4), and a spring (6) is embedded in the bottom of the sliding cavity (5); the spring (6) is in clearance fit with the sliding cavity (5), and a cylindrical sliding block (7) is arranged at the top end of the spring (6); the sliding block (7) is in sliding fit with the inside of the sliding cavity (5), and a cylindrical pressing rod (8) is welded in the middle of the top end of the sliding block (7); the top end of the pressure lever (8) upwards penetrates through the top end of the rotary seat (4) to the outside, and a circular plate-shaped fingerboard (9) is welded on the top end of the pressure lever (8); the middle position of the side part of the sliding block (7) is provided with an oblong lock hole (701), and the lock hole (701) is communicated left and right; a round rod probe (10) penetrates through the left side and the right side of the inner side of the lock hole (701), and the probe (10) is in clearance fit with the lock hole (701); the probe (10) penetrates through the side part of the rotary seat (4) from left to right, and the probe (10) is in sliding fit with the rotary seat (4); the right end of the probe (10) is welded with a cylindrical electrical connector (11); round rod-shaped contact pins (12) penetrate through the left side and the right side of the axis of the probe (10), and the contact pins (12) are fixed with the electric joint (11) in a hot melting mode; the right end of the contact pin (12) is fixedly connected with the left end of the electrical connector (11) through soldering.

2. The wafer-type limiting device for detecting the frequency response debugging of the oscilloscope according to claim 1, wherein: the rotary seat (4) is a horizontal rotating device.

3. The wafer-type limiting device for detecting the frequency response debugging of the oscilloscope according to claim 1, wherein: the sliding block (7) is a vertical sliding device, and the sliding block (7) is a locking device of the probe (10).

4. The wafer-type limiting device for detecting the frequency response debugging of the oscilloscope according to claim 1, wherein: the pressure lever (8) is an elastic telescopic device.

5. The wafer-type limiting device for detecting the frequency response debugging of the oscilloscope according to claim 1, wherein: the probe (10) is a left-right translation device.

6. The wafer-type limiting device for detecting the frequency response debugging of the oscilloscope according to claim 1, wherein: the left end of the contact pin (12) is bent downwards in an L shape, and the contact pin (12) is made of a low-impedance elastic metal material.