CN111781409A - Electronic component performance testing device - Google Patents

Electronic component performance testing device Download PDF

Info

Publication number
CN111781409A
CN111781409A CN202010835016.XA CN202010835016A CN111781409A CN 111781409 A CN111781409 A CN 111781409A CN 202010835016 A CN202010835016 A CN 202010835016A CN 111781409 A CN111781409 A CN 111781409A
Authority
CN
China
Prior art keywords
seat
electronic component
cavity seat
direction sliding
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010835016.XA
Other languages
Chinese (zh)
Inventor
潘辉
喻大鹏
周健
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guiyang Sunlord Xunda Electronic Component Co ltd
Original Assignee
Guiyang Sunlord Xunda Electronic Component Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Guiyang Sunlord Xunda Electronic Component Co ltd filed Critical Guiyang Sunlord Xunda Electronic Component Co ltd
Priority to CN202010835016.XA priority Critical patent/CN111781409A/en
Publication of CN111781409A publication Critical patent/CN111781409A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention discloses an electronic element performance testing device which comprises a bottom plate, a testing seat, an X-direction sliding block, a Y-direction sliding block and a pressing device, wherein the rear side of the bottom plate is connected to the pressing device sequentially through a Y-direction sliding rail and an X-direction sliding rail, the testing seat is fixedly connected to the front side of the upper end face of the Y-direction sliding rail, a PCB and a limiting plate are fixedly connected to the bottom from bottom to top, a limiting groove for placing an electronic element is arranged in the middle of the limiting plate, and the PCB is connected to performance monitoring equipment through a cable. According to the invention, the surface-mounted electronic element is placed in the limiting groove, the compactor is adopted to compact the electronic element, the test performance monitoring equipment is started to measure various parameters of the electronic element, the measurement can be realized rapidly, the time and labor are saved, the positioning is accurate, the electric connection is reliable, the data accuracy is high, the test reliability is improved, the rapid movement in the X direction and the Y direction can be realized by adopting the bidirectional slide rail, the accurate positioning is rapidly realized, the measurement accuracy is improved, and the rapid conversion of different measurement devices is conveniently realized.

Description

Electronic component performance testing device
Technical Field
The invention relates to a device for testing the performance of an electronic element, belonging to the technical field of surface mount type electronic element performance testing equipment.
Background
With the increasing development of research personnel in China, the continuous improvement and progress of research technology, and with the continuous innovation of electronic technology, the reliability requirement of electronic products is higher and higher, the miniaturization of structures and the superiority of performance become the trend of manufacturing industry, and the microwave magnetic device is required to be developed towards the direction of short, small, light, thin, high electrical performance and high reliability. At present, manual testing is adopted for testing the performances of direct-current resistance, inductance, S parameters and the like of a surface mount electronic element, so that the efficiency is low, time and labor are wasted, the data is inaccurate, and the data reliability is poor.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: the utility model provides an electronic component capability test device to solve the technical problem that exists among the prior art.
The technical scheme adopted by the invention is as follows: a performance testing device for electronic elements comprises a bottom plate, a testing seat, an X-direction sliding block, a Y-direction sliding block and a pressing device, wherein a Y-direction sliding rail is arranged on the bottom plate, the testing seat is fixedly connected to the front side of the upper end face of the Y-direction sliding rail, the testing seat is of a U-shaped structure, a PCB and a limiting plate are fixedly connected to the bottom from bottom to top, a limiting groove for placing the electronic elements is arranged in the middle of the limiting plate, pins of the electronic elements can abut against conductive contact points on the PCB after being embedded into the limiting groove, the PCB is connected to performance monitoring equipment through cables, the Y-direction sliding block is slidably connected to the Y-direction sliding rail and locked through Y-direction locking screws, the Y-direction sliding block is of a T-shaped structure, an X-direction guide rail is arranged in the X-direction of the upper side, a guide groove at the lower side of the X-direction sliding, and the through hole I of the Y-direction sliding block, through which the Y-direction locking screw penetrates, and the through hole II of the X-direction sliding block, through which the X-direction locking screw penetrates, are strip-shaped through holes.
Preferably, above-mentioned collet is including the L type cavity seat of handstand, telescopic link and operation handle board, L type cavity seat vertical section lower extreme fixed connection is on X is to the slider, the vertical activity of telescopic link passes L type cavity seat horizontal segment and is close to the tip, cup joint reset spring on the telescopic link, the reset spring upper end supports and leans on at L type cavity seat upside inner wall, the lower extreme supports and leans on the holding ring, holding ring detachably fixed connection is on the telescopic link, operation handle board is bar structure, it articulates at L type cavity seat corner to be close to the middle part, one end activity embolias telescopic link and upper end adoption spacing ring spacing, operation handle board embolias telescopic link department and sets up the bar through-hole, the operation handle board other end extends L type cavity seat.
Preferably, above-mentioned clamp plate is V type obtuse angle plate structure, and the inboard is towards L type cavity seat, and the operation handle board other end keeps the contained angle with the vertical section of L type cavity seat, and articulated department sets up supports the ears, and on the ears pressed from both sides and hits L type cavity seat both sides back and be connected to L type cavity seat through the pivot, ears one side set up the extension piece, and L type cavity seat detachably that the extension piece corresponds has inserted the location bolt.
Preferably, the telescopic rod is fixedly connected with a wear-resistant guide sleeve, and the wear-resistant guide sleeve movably extends out of the lower side wall of the L-shaped cavity seat.
Preferably, the other end of the operating handle plate and the vertical section of the L-shaped cavity seat keep an angle of 40-65 degrees.
Preferably, the test socket is provided with connectors at both sides thereof, and the connector cores are electrically connected to the PCB.
Preferably, above-mentioned bottom plate bottom is provided with the square blind hole, and square blind hole upside sets up the round through-hole, installs the dynamometer in the square blind hole, and the push rod of dynamometer stretches out round through-hole rear end face and flushes with electronic component upper surface place horizontal plane, and test seat detachably connects on the bottom plate, and PCB board and limiting plate detachably connect on the test seat.
The invention has the beneficial effects that: compared with the prior art, the invention has the following effects:
(1) the electronic component is placed in the limiting groove, the electronic component is compressed by the compactor, the test performance monitoring equipment is started, various parameters of the electronic component are measured, the measurement can be quickly realized, the time and labor are saved, the positioning is accurate, the electric connection is reliable, the data accuracy is high, the test reliability is improved, the rapid movement in the X direction and the Y direction can be realized by adopting the bidirectional slide rail, the accurate positioning is quickly realized, the measurement precision is improved, and the rapid conversion of different measurement devices is also convenient to realize;
(2) the tail end of the operating handle is pressed to rotate under the action of the hinge shaft, so that the telescopic rod is driven to be placed on the platform, the pressing part at the lower end of the telescopic rod is quickly separated from the limiting groove, electronic elements are better or mounted, the pressing operation is simple, the pressing is pressed by the elasticity of the return spring, the pressing is reliable and stable, the spring has a buffering effect, the electronic elements are prevented from being damaged, the L-shaped cavity seat is stable and reliable in support, good in guidance performance, and convenient to move up and down on the telescopic rod due to the detachable positioning ring structure, so that the pressure is adjustable;
(3) the rotating operating handle is limited by the positioning bolt, so that the lifted telescopic rod is positioned, the electronic element is convenient to mount and replace, the test operation is convenient, and the test efficiency is improved;
(4) the wear-resistant guide sleeve is adopted for guiding and stretching, so that the stretching and positioning precision of the stretching rod is improved, and the test stability is improved;
(5) the installation dynamometer is measured, conveniently knows the pressure size of telescopic link, avoids too big electronic component damage that causes, or the undersize leads to electrically conductive reliability poor, measures convenient and fast, and the push rod of dynamometer stretches out circular through-hole rear end face and flushes with electronic component upper surface place horizontal plane, is convenient for realize the precision measurement to in time adjust the pressure size of telescopic link.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic view of a top-down connection structure of a Y-direction slider;
FIG. 3 is a schematic view of the connection structure after the operating handle is rotationally positioned;
FIG. 4 is a schematic view of a force measurement configuration.
Detailed Description
The invention is further described with reference to the accompanying drawings and specific embodiments.
Example 1: as shown in figures 1-4, an electronic component performance testing device comprises a base plate 1, a testing seat 2, an X-direction slide block 3, a Y-direction slide block 4 and a pressing device 5, wherein the base plate 1 is provided with a Y-direction slide rail 6, the testing seat 2 is fixedly connected with the front side of the upper end surface of the Y-direction slide rail 6, the testing seat 2 is of a U-shaped structure, the bottom part is fixedly connected with a PCB 7 and a limiting plate 8 from bottom to top, the middle part of the limiting plate 8 is provided with a limiting groove 9 for placing an electronic component, the pin of the electronic component can abut against a conductive contact point on the PCB 7 after being embedded into the limiting groove 9, the PCB 7 is connected to a performance monitoring device through a cable, the Y-direction slide block 4 is slidably connected with the Y-direction slide rail 6 and locked by a Y-direction locking screw 10, the Y-direction slide block 4 is of a T-shaped structure, the upper side X-direction guide rail 11, the compactor 5 is installed on X is to slider 3, and can compress tightly the electronic component who puts into spacing groove 9, and Y passes Y to locking screw 10 and is bar through-hole to first 13 of slider 4 and X passes X to two 14 through-holes that slider 3 to locking screw 12, and four sides of spacing groove 9 set up the arc breach, make things convenient for tweezers to take out electronic component, and test seat 2 adopts the copper product preparation, improves the test accuracy nature.
Preferably, the compactor comprises an inverted L-shaped cavity seat 15, a telescopic rod 16 and an operating handle plate 17, the lower end of the vertical section of the L-shaped cavity seat 15 is fixedly connected to the X-direction sliding block 3, the telescopic rod 16 vertically and movably penetrates through the horizontal section of the L-shaped cavity seat 15 to be close to the end part, a reset spring 18 is sleeved on the telescopic rod 16, the upper end of the reset spring 18 abuts against the inner wall of the upper side of the L-shaped cavity seat 15, the lower end of the reset spring abuts against a positioning ring 19, the positioning ring 19 is detachably and fixedly connected to the telescopic rod 16, the operating handle plate 17 is of a strip-shaped structure and is hinged to the corner of the L-shaped cavity seat 15 close to the middle part, one end of the operating handle plate 17 is movably sleeved into the telescopic rod 16, the upper end of the reset spring is limited by a limiting ring 20, a positioning pin (an open, the other end of the operating handle plate 17 extends out of the L-shaped cavity seat 15.
Preferably, above-mentioned clamp plate 10 is V type obtuse angle plate structure, and inboard towards L type cavity seat 15, and the operation handle board 17 other end keeps the contained angle with the vertical section of L type cavity seat 15, and articulated department sets up supports ears 22, and ears 22 are connected to L type cavity seat 15 through pivot 23 after nipping L type cavity seat 15 both sides, and ears 22 one side sets up extension piece 24, and L type cavity seat 15 detachably that extension piece 24 corresponds has inserted location bolt 25.
Preferably, the telescopic rod 16 is fixedly connected with a wear-resistant guide sleeve 26, and the wear-resistant guide sleeve 26 movably extends out of the lower side wall of the L-shaped cavity seat 15.
Preferably, the other end of the operating handle plate 17 and the vertical section of the L-shaped cavity seat 15 keep an angle of 40-65 degrees.
Preferably, the test socket 2 is provided with connectors 27 at both sides thereof, and the connectors 27 are electrically connected to the PCB board 7.
Preferably, above-mentioned bottom plate 1 bottom is provided with square blind hole 28, and square blind hole 28 upside sets up circular through hole 29, installs dynamometer 30 in the square blind hole 28, and dynamometer 30's push rod stretches out circular through hole 29 rear end face and the horizontal plane of electronic component upper surface place and flushes, and test socket 2 detachably connects on the bottom plate, and PCB board 7 and limiting plate 8 detachably connect on test socket 2.
The X-direction sliding block and the Y-direction sliding block can flexibly move in the X direction and the Y direction at different positions in the test seat according to products and products with different sizes, the position of the telescopic rod is adjusted, the end of the telescopic rod (pressure rod) can be accurately abutted to the surface stress position of an element to be tested, in addition, the positioning ring can be used for adjusting the pressure generated by the telescopic rod (pressure rod) (the pressure is generated by a spring), the adjusting mode is that the position of the spring pressed on the positioning ring is adjusted on the telescopic rod to generate different pressure effects, the test device disclosed by the invention can be used for actually testing a resistor, and also can be used for testing inductance, capacitance, S parameters and the like, and the measurement of different performance indexes can be realized as long as test instrument equipment with.
The above description is only an embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive of changes or substitutions within the technical scope of the present invention, and therefore, the scope of the present invention should be determined by the scope of the claims.

Claims (7)

1. An electronic component performance testing device, characterized by: comprises a bottom plate (1), a test seat (2), an X-direction sliding block (3), a Y-direction sliding block (4) and a pressing device (5), wherein the bottom plate (1) is provided with a Y-direction sliding rail (6), the test seat (2) is fixedly connected with the front side of the upper end face of the Y-direction sliding rail (6), the test seat (2) is of a U-shaped structure, the bottom of the test seat is fixedly connected with a PCB (7) and a limiting plate (8) from bottom to top, the middle part of the limiting plate (8) is provided with a limiting groove (9) for placing an electronic element, the pin of the electronic element can abut against a conductive contact point on the PCB (7) after being embedded into the limiting groove (9), the PCB (7) is connected with a performance monitoring device through a cable, the Y-direction sliding block (4) is slidably connected on the Y-direction sliding rail (6) and locked by a Y-direction locking screw (10), the, the X is to X to guide rail (11) and adopt X to locking screw (12) locking to the guide way activity card of slider (3) downside, and collet (5) are installed on X to slider (3), and can compress tightly the electronic component of putting into spacing groove (9), and Y is to through Y to through-hole one (13) of slider (4) and X to through-hole two (14) that X passed to slider (3) to locking screw (12) and are the bar through-hole to locking screw (10).
2. The apparatus for testing the performance of an electronic component of claim 1, wherein: the compactor comprises an inverted L-shaped cavity seat (15), telescopic link (16) and operation handle board (17), the vertical section lower extreme fixed connection of L type cavity seat (15) is on X is to slider (3), the vertical activity of telescopic link (16) passes L type cavity seat (15) horizontal segment and is close to the tip, cup joint reset spring (18) on telescopic link (16), reset spring (18) upper end is supported and is leaned on L type cavity seat (15) upside inner wall, the lower extreme supports and leans on holding ring (19), holding ring (19) detachably fixed connection is on telescopic link (16), operation handle board (17) are bar structure, it articulates at L type cavity seat (15) corner to be close to the middle part, it is spacing that one end activity embolias telescopic link (16) and upper end adopts spacing ring (20), operation handle board (17) embolia telescopic link (16) department and set up bar through-hole (21), operation handle board (17) other end extends L type cavity seat (15).
3. The apparatus for testing the performance of an electronic component of claim 2, wherein: pressing plate (10) are V type obtuse angle plate structure, it is inboard towards L type cavity seat (15), operation handle board (17) other end keeps the contained angle with the vertical section of L type cavity seat (15), articulated department sets up supports ears (22), ears (22) are connected to L type cavity seat (15) through pivot (23) after nipping L type cavity seat (15) both sides, ears (22) one side sets up extension piece (24), L type cavity seat (15) detachably that extension piece (24) correspond has inserted location bolt (25).
4. The apparatus for testing the performance of an electronic component of claim 2, wherein: the telescopic rod (16) is fixedly connected with a wear-resistant guide sleeve (26), and the wear-resistant guide sleeve (26) movably extends out of the lower side wall of the L-shaped cavity seat (15).
5. The apparatus for testing the performance of an electronic component of claim 2, wherein: the other end of the operating handle plate (17) and the vertical section of the L-shaped cavity seat (15) keep an angle of 40-65 degrees.
6. The apparatus for testing the performance of an electronic component of claim 1, wherein: the test seat (2) is provided with connectors (27) on two sides, and the inner core of each connector (27) is electrically connected to the PCB (7).
7. The apparatus for testing the performance of an electronic component of claim 1, wherein: bottom plate (1) bottom is provided with square blind hole (28), and square blind hole (28) upside sets up round through-hole (29), installs dynamometer (30) in square blind hole (28), and the push rod of dynamometer (30) stretches out round through-hole (29) rear end face and electronic component upper surface place horizontal plane and flushes, and test seat (2) detachably connects on the bottom plate, and PCB board (7) and limiting plate (8) detachably connect on test seat (2).
CN202010835016.XA 2020-08-19 2020-08-19 Electronic component performance testing device Pending CN111781409A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010835016.XA CN111781409A (en) 2020-08-19 2020-08-19 Electronic component performance testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010835016.XA CN111781409A (en) 2020-08-19 2020-08-19 Electronic component performance testing device

Publications (1)

Publication Number Publication Date
CN111781409A true CN111781409A (en) 2020-10-16

Family

ID=72762826

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010835016.XA Pending CN111781409A (en) 2020-08-19 2020-08-19 Electronic component performance testing device

Country Status (1)

Country Link
CN (1) CN111781409A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113933548A (en) * 2021-10-15 2022-01-14 南方电网科学研究院有限责任公司 Chip test fixture

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113933548A (en) * 2021-10-15 2022-01-14 南方电网科学研究院有限责任公司 Chip test fixture

Similar Documents

Publication Publication Date Title
CN107817388B (en) Direct current resistance quick detection device
CN109374932B (en) Pin clamping device of capacitance detection system
CN212008838U (en) PCB detection device
CN111781409A (en) Electronic component performance testing device
CN210775019U (en) Push-pull force tester
CN215548129U (en) Clamp for EMC test
CN104502642A (en) Differential probe rod capable of replacing test wire rods
CN102539978A (en) Three-dimensional low-frequency receiving antenna comprehensive detection device
CN212514710U (en) Electronic component performance test equipment
CN211453865U (en) PCB function test device
CN219122280U (en) Circuit board testing device
CN218037189U (en) PCB testing tool
CN209000548U (en) A kind of SSD Testing device of electrical parameter
CN217425653U (en) Hall effect measures with sample platform of taking probe
CN212781107U (en) Circuit board function test equipment
CN213023242U (en) PCB mainboard ageing testing calibration device
CN212965015U (en) ICT test function tool
CN213543444U (en) Coaxiality gauge
CN211905439U (en) Novel computer mainboard test carrier
CN209296830U (en) A kind of power device detection jig
CN208580129U (en) A kind of fixture for PCB test
CN209280875U (en) With the PCB brush sweep test machine for stablizing fixed function
CN219302603U (en) Detection machine for detecting conduction performance of circuit board
CN204269693U (en) A kind of differential probe of replaceable test wire rod
CN219625562U (en) Comprehensive tester for power supply high-voltage package

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination