CN209296830U - A kind of power device detection jig - Google Patents

A kind of power device detection jig Download PDF

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Publication number
CN209296830U
CN209296830U CN201821770608.2U CN201821770608U CN209296830U CN 209296830 U CN209296830 U CN 209296830U CN 201821770608 U CN201821770608 U CN 201821770608U CN 209296830 U CN209296830 U CN 209296830U
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power device
telescopic rod
console
column
detection
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陈明
蔡少峰
李科
李力
邓波
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SICHUAN LIPTAI ELECTRONIC CO Ltd
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SICHUAN LIPTAI ELECTRONIC CO Ltd
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Abstract

本实用新型公开了一种功率器件检测治具,包括基座,所述基座上设置有立柱和检测台,所述立柱上端固定设置有控制台,所述控制台上交接有调节板,控制台下端设置有与滑座相连的伸缩杆,所述伸缩杆与调节板之间铰接有连杆,伸缩杆的另一端连接有滑座;且滑座底面与检测台的顶面设置有相互配合的卡槽和检测探针;本实用新型通过调节板的运动带动,从而实现待测功率器件与检测探针的接触和分离,与现有技术相比,其不需要频繁插拔功率器件,从而避免了功率器件管脚上的镀锡层被刮伤,提高产品的外观良品率。

The utility model discloses a power device detection jig, which comprises a base, a column and a detection table are arranged on the base, a console is fixedly arranged on the upper end of the column, and an adjustment plate is connected to the console to control The lower end of the table is provided with a telescopic rod connected with the sliding seat, a connecting rod is hinged between the telescopic rod and the adjustment plate, and the other end of the telescopic rod is connected with a sliding seat; The card slot and the detection probe; the utility model is driven by the movement of the adjustment plate, thereby realizing the contact and separation of the power device to be tested and the detection probe. Compared with the prior art, it does not need to frequently insert and pull out the power device, thereby This prevents the tin-plated layer on the pins of the power device from being scratched, and improves the appearance yield of the product.

Description

一种功率器件检测治具A power device testing fixture

技术领域technical field

本实用新型涉及电子元件检测装置技术领域,具体涉及一种功率器件检测治具。The utility model relates to the technical field of electronic component detection devices, in particular to a power device detection jig.

背景技术Background technique

功率器件在出厂前都需要进行质量检测,以保证出厂产品的合格率,现有技术中,常常通过将功率器件安装在检测治具上进行检测,其在上述检测步骤中往往需要频繁的插拔功率器件,从而导致功率器件的管脚镀锡层被检测治具刮伤,影响功率器件的外管合格率,同时对产品性能造成不必要的损伤。Power devices need to undergo quality inspection before leaving the factory to ensure the qualified rate of the products. In the prior art, power devices are often tested by installing them on the inspection fixture, which often requires frequent plugging and unplugging in the above inspection steps. As a result, the tin-plated layer of the pins of the power device is scratched by the inspection fixture, which affects the qualification rate of the outer tube of the power device and causes unnecessary damage to the product performance.

公开号为CN206311636U的中国实用新型专利于2017年7月7日公开了一种翻盖式芯片检测治具,包括载台、支撑板、盖板和基板,所述盖板前端通过一连接销和位于基板上的卡座活动连接,所述载台安装于基板上,所述盖板一侧具有一缺口槽,一扳扣安装于所述盖板的缺口槽内,位于缺口槽正下方的所述基板一侧设置有一与扳扣对应的扣座部,一转轴嵌入盖板、扳扣各自的转轴通孔内,从而使得所述扳扣在缺口槽中可绕转轴旋转,所述扳扣的卡钩部用于与扣座部扣接,所述基板上开有一安装孔,所述载台嵌入安装孔内,所述支撑板安装于基板下表面并载台下表面接触。本实用新型通过其盖板上扳扣的设置,灵活方便,便于待测芯片的取放,盖板下表面凸起部的设置可以对待测芯片起到很好的压紧固定作用,提高检测的准确性和灵敏性。The Chinese utility model patent with the publication number CN206311636U disclosed a clamshell-type chip detection fixture on July 7, 2017, including a stage, a support plate, a cover plate and a base plate. The deck on the base plate is movably connected, the carrier is installed on the base plate, a notch groove is provided on one side of the cover plate, and a toggle is installed in the notch groove of the cover plate, and the One side of the substrate is provided with a buckle seat corresponding to the toggle, and a rotating shaft is embedded in the through holes of the respective rotating shafts of the cover plate and the toggle, so that the toggle can rotate around the shaft in the notch groove, and the snap of the toggle The hook part is used to buckle with the buckle seat part, a mounting hole is opened on the base plate, the stage is inserted into the mounting hole, and the support plate is installed on the lower surface of the base plate and contacts the lower surface of the stage. The utility model is flexible and convenient through the setting of the pull button on the cover plate, and is convenient for taking and placing the chip to be tested. accuracy and sensitivity.

发明内容Contents of the invention

针对现有技术中存在的功率器件管脚镀锡层易被刮花的缺陷,本实用新型公开了一种功率器件检测治具,采用本实用新型能够对功率器件的管脚进行有效保护,避免检测过程中镀锡层被刮花,提高产品外观的良品率。Aiming at the defect that the tin-plated layer of the power device pins is easily scratched in the prior art, the utility model discloses a power device detection jig, which can effectively protect the pins of the power device and avoid The tin-plated layer is scratched during the inspection process, which improves the yield rate of product appearance.

本实用新型通过以下技术方案实现上述目的:The utility model realizes above-mentioned object through following technical scheme:

一种功率器件检测治具,包括基座,所述基座上设置有检测台和立柱,其特征在于:所述立柱上端固定设置有控制台,控制台的上端铰接有调节板,控制台下端滑动设置有伸缩杆,所述伸缩杆与调节板之间通过连杆连接;所述伸缩杆的另一端固定连接有滑座;所述滑座底面和检测台顶面设置于相互配合的卡槽和检测探针。A power device testing jig, comprising a base, on which a testing table and a column are arranged, and is characterized in that: a console is fixedly arranged on the upper end of the column, an adjustment plate is hinged on the upper end of the console, and an adjusting plate is hinged on the lower end of the console. A telescopic rod is slidably arranged, and the telescopic rod is connected to the adjustment plate through a connecting rod; the other end of the telescopic rod is fixedly connected with a sliding seat; the bottom surface of the sliding seat and the top surface of the detection table are arranged in a card slot that cooperates with each other and detection probes.

所述基座上还设置有限位滑杆,所述滑座套置于限位滑杆上。A limit slide bar is also arranged on the base, and the slide seat is placed on the limit slide bar.

所述探针共有6个,且每个探针连接有独立的测试导线。There are 6 probes in total, and each probe is connected with an independent test wire.

所述立柱上设置有安装槽,所述安装槽内设置有用于固定控制台的紧固螺栓。An installation groove is arranged on the column, and fastening bolts for fixing the console are arranged in the installation groove.

所述伸缩杆与控制台之间设置有直线运动轴承。A linear motion bearing is arranged between the telescopic rod and the console.

所述限位滑杆上丝扣连接有限位螺母,所述限位螺母上设置有缓冲垫片。A limit nut is connected with a screw on the limit slide bar, and a buffer washer is arranged on the limit nut.

与现有技术相比,本实用新型具有以下有益效果:Compared with the prior art, the utility model has the following beneficial effects:

1、本实用新型在立柱的上端固定设置有控制台,所述控制台上交接有调节板,控制台下端设置有与滑座相连的伸缩杆,所述伸缩杆与调节板之间铰接有连杆,伸缩杆的另一端连接有滑座;且滑座底面与检测台的顶面设置有相互配合的卡槽和检测探针;本实用新型使用时将待测芯片放置于卡槽内,再通过调节板带动伸缩杆向下运动,进而使滑座向检测台运动,使待测芯片与探针接触,从而完成芯片测试,检测过程中无需频繁插拔管脚,从而避免管脚镀锡层被刮花,提高产品的外管良品率。1. In the utility model, a console is fixedly arranged on the upper end of the column, and an adjustment plate is connected to the console, and a telescopic rod connected with a sliding seat is arranged at the lower end of the console, and a connecting rod is hinged between the telescopic rod and the regulating board. The other end of the telescopic rod is connected with a sliding seat; and the bottom surface of the sliding seat and the top surface of the detection table are provided with a card slot and a detection probe that cooperate with each other; when the utility model is used, the chip to be tested is placed in the card slot, and then The adjustment plate drives the telescopic rod to move downward, and then the sliding seat moves to the testing table, so that the chip to be tested is in contact with the probe, so as to complete the chip test. During the testing process, there is no need to frequently plug and unplug the pins, thereby avoiding tin plating on the pins. To be scratched, improve the yield rate of the outer tube of the product.

2、本实用新型还在基座上设置有限位滑杆,所述滑座套置于限位滑杆上,限制滑座的位置,避免滑座与偏离,同时保证滑座始终处于正确的工位上,保证检测治具的可靠性和稳定性。2. The utility model is also equipped with a limit slide bar on the base, and the slide seat is placed on the limit slide bar to limit the position of the slide seat, avoiding the deviation of the slide seat and ensuring that the slide seat is always in the correct working position. position, to ensure the reliability and stability of the detection fixture.

3、本实用新型的探针共设置有6个,且每个探针连接有独立的测试导线,分别用于检测待测芯片的BV、BI、EV、EI、CV、CI值,避免因共用3. There are 6 probes in this utility model, and each probe is connected with an independent test wire, which is used to detect the BV, BI, EV, EI, CV, and CI values of the chip to be tested, so as to avoid

测试导线而增大导线电阻导致测试结果出现较大偏差,提高检测的准确性。The increase of the resistance of the test lead leads to a large deviation of the test result and improves the accuracy of the test.

4、本实用新型在立柱上设置有安装槽,所述安装槽内设置有紧固螺栓,方便根据需要调整控制台的位置,从而保证伸缩杆的运动能够将待测芯片转运到最佳的测试位置,从而提高测试的可靠性和准确性。4. The utility model is provided with a mounting groove on the column, and fastening bolts are arranged in the mounting groove, which is convenient for adjusting the position of the console as required, thereby ensuring that the movement of the telescopic rod can transfer the chip to be tested to the best test position, thereby increasing the reliability and accuracy of the test.

5、本实用新型的伸缩杆与控制台之间设置有直线运动轴承,降低伸缩杆的运动阻力,保证伸缩杆运动顺畅,同时减小伸缩杆的磨损,延长设备的使用寿命。5. A linear motion bearing is arranged between the telescopic rod and the console of the utility model, which reduces the movement resistance of the telescopic rod, ensures smooth movement of the telescopic rod, reduces the wear of the telescopic rod, and prolongs the service life of the equipment.

6、本实用新型在限位滑杆上丝扣连接有限位螺母,所述限位螺母上设置有缓冲垫片,限制画作向下的运动距离,避免因伸缩杆过度运动导致探针挤压待测芯片,加强对芯片管脚的保护,提高产品外观的合格率。6. In the utility model, the limit nut is threaded on the limit slide rod, and the limit nut is provided with a buffer gasket to limit the downward movement distance of the painting and avoid the probe from being squeezed due to excessive movement of the telescopic rod. Test chips, strengthen the protection of chip pins, and improve the pass rate of product appearance.

附图说明Description of drawings

图1为本实用新型结构示意图;Fig. 1 is a structural representation of the utility model;

图2为本实用新型所述滑座结构示意图;Fig. 2 is a schematic diagram of the structure of the sliding seat described in the utility model;

图3为本实用新型A-A线剖视图;Fig. 3 is the sectional view of line A-A of the present utility model;

附图标记:1、基座,2、检测台,3、立柱,4、控制台,5、调节板,6、伸缩杆,7、连杆,8、滑座,9、卡槽,10、检测探针,11、限位滑杆,12、安装槽,13、紧固螺栓,14、直线运动轴承,15、限位螺母,16、缓冲垫片。Reference signs: 1, base, 2, detection platform, 3, column, 4, console, 5, adjustment plate, 6, telescopic rod, 7, connecting rod, 8, sliding seat, 9, card slot, 10, Detection probe, 11, limit slide bar, 12, installation groove, 13, fastening bolt, 14, linear motion bearing, 15, limit nut, 16, buffer gasket.

具体实施方式Detailed ways

下面将通过具体实施例对本实用新型作进一步说明:The utility model will be further described below by specific embodiment:

实施例1Example 1

本实施例作为本实用新型的最佳实施例,其公开了一种功率器件检测治具,具体结构如图1所示,包括基座1,所述基座1上固定设置有检测台2和立柱3,立柱3的上端设置有安装槽12,所述安装槽12内设置有紧固螺栓13,所述紧固螺栓13将控制台4固定安装与立柱3的上部;所述控制台4的上端铰接有调节板5,控制台4的下端通过直线运动轴承14滑动设置有伸缩杆6,伸缩杆6与调节板5之间设置有连杆7,且连杆7的两端分别铰接与调节板5和伸缩杆6上;所述滑座8的底面与检测台2的顶面设置有相互配合的卡槽9和检测探针10,检测探针10共设置有6个,且每个均连接有独立的测试导线;所述伸缩杆6下端固定连接有滑座8,基座1上设置有限位滑杆11,所述滑座8滑动套置于限位滑杆11上;所述限位滑杆11上丝扣连接有用于限定滑座8位置的限位螺母15,所述限位螺母15的顶面设置有缓冲垫片16。This embodiment, as the best embodiment of the present utility model, discloses a power device testing jig, the specific structure is shown in Figure 1, including a base 1 on which a testing platform 2 and Column 3, the upper end of column 3 is provided with installation groove 12, is provided with fastening bolt 13 in described installation groove 12, and described fastening bolt 13 is fixedly installed with the top of column 3 with console 4; The upper end is hinged with an adjustment plate 5, and the lower end of the console 4 is slidingly provided with a telescopic rod 6 through a linear motion bearing 14, and a connecting rod 7 is arranged between the telescopic rod 6 and the adjusting plate 5, and the two ends of the connecting rod 7 are respectively hinged and adjusted. On the plate 5 and the telescopic rod 6; the bottom surface of the slide seat 8 and the top surface of the detection table 2 are provided with a card slot 9 and a detection probe 10 that cooperate with each other, and there are 6 detection probes 10 in total, and each Connected with independent test wires; the lower end of the telescopic rod 6 is fixedly connected with a sliding seat 8, and the base 1 is provided with a limit slide bar 11, and the sliding sleeve of the slide seat 8 is placed on the limit slide bar 11; A limit nut 15 for limiting the position of the slide seat 8 is connected with a threaded thread on the position slide bar 11 , and a buffer washer 16 is arranged on the top surface of the limit nut 15 .

本实用新型的工作过程:首先将需要检测的功率芯片放置于滑座底面的卡槽内,向下按压调节板,通过调节板的运动带动连杆和伸缩杆向下运动,进而将滑座推向检测台,当滑座到达运动的终点时检测探针与功率芯片相接触,完成对芯片的检测,检测完成后向上扳动调节板,带动滑座向上运动,从而将待测芯片与检测探针分离,此时更换待测芯片重复上述步骤即可实现对待测芯片的连续检测;本实用新型通过检测探针与待测芯片关节的直接接触进行检测,与现有技术相比,管脚与检测探针的接触和分离简单、且不需要频繁的插拔功率芯片,从而较好的保护了管脚上的镀锡层,提高了芯片的外管良品率;且本实用新型所述的检测治具还具有结构简单,操作简便,推广应用成本较低等优点。The working process of the utility model: first, place the power chip to be detected in the slot on the bottom surface of the sliding seat, press the adjusting plate downward, and the movement of the adjusting plate drives the connecting rod and the telescopic rod to move downward, and then pushes the sliding seat When the sliding seat reaches the end of the movement, the detection probe contacts the power chip to complete the detection of the chip. After the detection is completed, the adjustment plate is pulled upward to drive the sliding seat to move upward, so that the chip to be tested and the detection probe are connected. Needle separation, at this time, replace the chip to be tested and repeat the above steps to realize the continuous detection of the chip to be tested; the utility model detects through the direct contact between the detection probe and the joint of the chip to be tested. The contact and separation of the detection probe is simple, and does not require frequent plugging and unplugging of the power chip, thereby better protecting the tin-plated layer on the pin and improving the yield of the outer tube of the chip; and the detection described in the utility model The jig also has the advantages of simple structure, easy operation, and low cost for popularization and application.

Claims (6)

1.一种功率器件检测治具,包括基座(1),所述基座(1)上设置有检测台(2)和立柱(3),其特征在于:所述立柱(3)上端固定设置有控制台(4),控制台(4)的上端铰接有调节板(5),控制台(4)下端滑动设置有伸缩杆(6),所述伸缩杆(6)与调节板(5)之间通过连杆(7)连接;所述伸缩杆(6)的另一端固定连接有滑座(8);所述滑座(8)底面和检测台(2)顶面设置有相互配合的卡槽(9)和检测探针(10)。1. A power device testing jig, comprising a base (1), on which a testing platform (2) and a column (3) are arranged, characterized in that: the upper end of the column (3) is fixed A console (4) is provided, the upper end of the console (4) is hinged with an adjustment plate (5), and the lower end of the console (4) is slidingly provided with a telescopic rod (6), and the telescopic rod (6) and the adjustment plate (5) ) are connected by a connecting rod (7); the other end of the telescopic rod (6) is fixedly connected with a sliding seat (8); the bottom surface of the sliding seat (8) and the top surface of the detection table (2) are provided with mutual card slot (9) and detection probe (10). 2.根据权利要求1所述的一种功率器件检测治具,其特征在于:所述基座(1)上还设置有限位滑杆(11),所述滑座(8)套置于限位滑杆(11)上。2. A power device testing jig according to claim 1, characterized in that: the base (1) is also provided with a limit slide bar (11), and the slide seat (8) is sleeved on the limit position on the slider (11). 3.根据权利要求1所述的一种功率器件检测治具,其特征在于:所述探针(10)共有6个,且每个探针(10)连接有独立的测试导线。3 . The fixture for testing power devices according to claim 1 , characterized in that: there are 6 probes ( 10 ) in total, and each probe ( 10 ) is connected with an independent test wire. 4 . 4.根据权利要求1所述的一种功率器件检测治具,其特征在于:所述立柱(3)上设置有安装槽(12),所述安装槽(12)内设置有用于固定控制台(4)的紧固螺栓(13)。4. A power device testing jig according to claim 1, characterized in that: the column (3) is provided with a mounting groove (12), and the mounting groove (12) is provided with a (4) fastening bolts (13). 5.根据权利要求1所述的一种功率器件检测治具,其特征在于:所述伸缩杆(6)与控制台(4)之间设置有直线运动轴承(14)。5. A power device testing jig according to claim 1, characterized in that: a linear motion bearing (14) is arranged between the telescopic rod (6) and the console (4). 6.根据权利要求2所述的一种功率器件检测治具,其特征在于:所述限位滑杆(11)上丝扣连接有限位螺母(15),所述限位螺母(15)上设置有缓冲垫片(16)。6. A power device testing jig according to claim 2, characterized in that: the limit slider (11) is threaded to connect the limit nut (15), and the limit nut (15) is A buffer gasket (16) is provided.
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110988411A (en) * 2019-12-20 2020-04-10 成都频岢微电子有限公司 Acoustic surface filter test bench
CN111624464A (en) * 2020-05-18 2020-09-04 马鞍山芯海科技有限公司 A chip testing device and chip testing method
CN116413569A (en) * 2023-03-22 2023-07-11 贵州雅光电子科技股份有限公司 A test device for power module working condition simulation

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110988411A (en) * 2019-12-20 2020-04-10 成都频岢微电子有限公司 Acoustic surface filter test bench
CN111624464A (en) * 2020-05-18 2020-09-04 马鞍山芯海科技有限公司 A chip testing device and chip testing method
CN116413569A (en) * 2023-03-22 2023-07-11 贵州雅光电子科技股份有限公司 A test device for power module working condition simulation

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