CN212625491U

CN212625491U - Test bench for semiconductor performance detection

Info

Publication number: CN212625491U
Application number: CN202021695326.8U
Authority: CN
Inventors: 陈长贵
Original assignee: Taizhou Haitian Electronic Technology Co ltd
Current assignee: Taizhou Haitian Electronic Technology Co ltd
Priority date: 2020-08-14
Filing date: 2020-08-14
Publication date: 2021-02-26
Anticipated expiration: 2030-08-14

Abstract

The utility model discloses a testboard for semiconductor performance detects, including detection mechanism, supporting mechanism, detection mechanism includes workstation, tool holder, detection panel, install the workstation inboard the tool holder, install the workstation up end detect the panel, it is provided with electrostatic precipitator net to detect the panel rear portion, it installs the display screen to detect panel one side, it is provided with the support to detect the panel top, temperature scanner is installed to the support inboard. The utility model discloses simple structure, reasonable in design, low in production cost can detect a plurality of semiconductor simultaneously, very big improvement work efficiency, make things convenient for adjusting device's height simultaneously, and the practicality is high.

Description

Test bench for semiconductor performance detection

Technical Field

The utility model relates to a semiconductor testing field especially relates to a testboard that is used for semiconductor performance to detect.

Background

The semiconductor is a substance with conductivity between an insulator and a conductor, and the conductivity of the semiconductor is easy to control and can be used as an element material for information processing. Semiconductors are very important from the viewpoint of technological or economic development. The core elements of many electronic products, such as computers, mobile phones, and digital recorders, utilize the conductivity change of semiconductors to process information. Common semiconductor materials are silicon, germanium, gallium arsenide, etc., and silicon is the most influential of various semiconductor materials in commercial applications.

In the semiconductor production process, need detect its performance, include to the semiconductor detection of generating heat, detect the platform and once can only detect single semiconductor at present most, work efficiency is low, inconvenient height-adjusting moreover, and the practicality is lower.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing a testboard that is used for semiconductor performance to detect for solving above-mentioned problem.

The utility model discloses a following technical scheme realizes above-mentioned purpose:

a testboard for semiconductor performance detects, including detection mechanism, supporting mechanism, detection mechanism includes workstation, toolbox, detection panel, install the workstation inboard the toolbox, install the workstation up end the detection panel, detection panel rear portion is provided with electrostatic precipitator net, the display screen is installed to detection panel one side, detection panel top is provided with the support, the temperature scanner is installed to the support inboard.

As a further aspect of the present invention, the support mechanism includes a base, a movable wheel, an electric telescopic column, the end face is installed under the base to move the movable wheel, the end face is installed on the base to electrically telescopic column.

As a further scheme of the utility model, supporting mechanism includes the base, removes wheel, mounting bracket, the terminal surface is installed under the base remove the wheel, the base up end is provided with the mounting bracket, the motor is installed to the mounting bracket inboard, the mounting bracket top is provided with the smooth rod, smooth rod one side is provided with the lead screw, install the seat that goes up and down on the lead screw.

As a further aspect of the present invention, the tool box is slidably mounted inside the workbench, and the detection panel is mounted on the upper end surface of the workbench through bolts.

As a further scheme of the utility model, the temperature scanner passes through the bolt to be installed the support is inboard, it places the mounting groove of semiconductor to be provided with a plurality of on the detection panel.

As a further scheme of the utility model, electronic flexible post passes through the bolt to be installed the base up end, it is provided with brake pedal on the wheel to remove.

As a further aspect of the present invention, the motor may be coupled to the lead screw, and the lifting seat may be slidably coupled to the slide bar.

Compared with the prior art, the beneficial effects of the utility model are that:

1. the arrangement of the detection mechanism can detect a plurality of semiconductors simultaneously, so that the working efficiency is greatly improved;

2. the supporting mechanism is convenient to adjust the height of the device, and the practicability is high.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.

Fig. 1 is a perspective view of an embodiment 1 of the test bench for semiconductor performance testing according to the present invention;

fig. 2 is a front view of an embodiment 1 of the test bench for semiconductor performance testing according to the present invention;

fig. 3 is a top view of an embodiment 1 of the test bench for semiconductor performance testing according to the present invention;

fig. 4 is a right side view of an embodiment 1 of the test bench for semiconductor performance testing according to the present invention;

fig. 5 is a front view of embodiment 2 of the test bench for semiconductor performance testing according to the present invention.

The reference numerals are explained below:

1. a detection mechanism; 2. a support mechanism; 101. a work table; 102. a tool box; 103. detecting a panel; 104. an electrostatic dust removal screen; 105. a display screen; 106. a support; 107. a temperature scanner; 201. a base; 202. a moving wheel; 203. an electric telescopic column; 204. a mounting frame; 205. a motor; 206. a slide bar; 207. a lead screw; 208. a lifting seat.

Detailed Description

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are used merely for convenience of description and for simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention. Furthermore, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first," "second," etc. may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless otherwise specified.

In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art through specific situations.

The present invention will be further explained with reference to the accompanying drawings.

Example 1

As shown in fig. 1, fig. 2, fig. 3 and fig. 4, the utility model provides a technical solution: a testboard for semiconductor performance detects, including detection mechanism 1, supporting mechanism 2, detection mechanism 1 includes workstation 101, tool holder 102, detection panel 103, and tool holder 102 is installed to workstation 101 inboard, and detection panel 103 is installed to workstation 101 up end, and detection panel 103 rear portion is provided with electrostatic precipitator net 104, and display screen 105 is installed to detection panel 103 one side, and detection panel 103 top is provided with support 106, and temperature scanner 107 is installed to support 106 inboard.

On the basis of the above-described embodiment: the supporting mechanism 2 comprises a base 201, a moving wheel 202 and an electric telescopic column 203, wherein the moving wheel 202 is arranged on the lower end surface of the base 201, and the electric telescopic column 203 is arranged on the upper end surface of the base 201; the tool box 102 is slidably mounted inside the workbench 101, and the detection panel 103 is mounted on the upper end surface of the workbench 101 through bolts; the temperature scanner 107 is installed on the inner side of the bracket 106 through bolts, and a plurality of mounting grooves for placing semiconductors are arranged on the detection panel 103; the electric telescopic column 203 is installed on the upper end face of the base 201 through bolts, and a brake pedal is arranged on the movable wheel 202.

The working principle is as follows: can be through removing wheel 202 mobile device, when needing adjusting device's height, electronic flexible post 203 drives workstation 101 and goes up and down, adjust its height, tool holder 102 can the placement tool, install the semiconductor that needs to detect in the mounting groove on detecting panel 103, can install a plurality of semiconductor on detecting panel 103, semiconductor work generates heat, the semiconductor of below can be scanned to temperature scanner 107, thermal imaging picture shows on display screen 105, and the temperature data of each semiconductor can show, the worker is through observing the data on the display screen 105, the condition of generating heat of each semiconductor of analysis, simultaneously electrostatic precipitator net 104 work, dust around the reduction device, prevent that the adhesion dust from influencing its quality on the semiconductor.

Example 2

As shown in fig. 5, the difference between embodiment 2 and embodiment 1 is that the supporting mechanism 2 includes a base 201, a moving wheel 202, and a mounting frame 204, the moving wheel 202 is mounted on the lower end surface of the base 201, the mounting frame 204 is disposed on the upper end surface of the base 201, a motor 205 is mounted inside the mounting frame 204, a sliding bar 206 is disposed above the mounting frame 204, a lead screw 207 is disposed on one side of the sliding bar 206, and a lifting seat 208 is mounted on the lead screw 207.

The electric telescopic column 203 drives the workbench 101 to ascend and descend, the motor 205 drives the screw rod 207 to rotate, and the lifting seat 208 drives the workbench 101 to ascend and descend along the sliding bar 206.

The foregoing illustrates and describes the principles, general features, and advantages of the present invention. It will be understood by those skilled in the art that the present invention is not limited to the above embodiments, and that the foregoing embodiments and descriptions are provided only to illustrate the principles of the present invention without departing from the spirit and scope of the present invention.

Claims

1. A testboard for semiconductor performance detects which characterized in that: including detection mechanism (1), supporting mechanism (2), detection mechanism (1) includes workstation (101), toolbox (102), detection panel (103), install workstation (101) inboard toolbox (102), install workstation (101) up end detection panel (103), detection panel (103) rear portion is provided with electrostatic precipitator net (104), display screen (105) are installed to detection panel (103) one side, detection panel (103) top is provided with support (106), temperature scanner (107) are installed to support (106) inboard.

2. A test bench for semiconductor performance testing according to claim 1, wherein: the supporting mechanism (2) comprises a base (201), a moving wheel (202) and an electric telescopic column (203), wherein the moving wheel (202) is installed on the lower end face of the base (201), and the electric telescopic column (203) is installed on the upper end face of the base (201).

3. A test bench for semiconductor performance testing according to claim 1, wherein: supporting mechanism (2) include base (201), remove wheel (202), mounting bracket (204), the terminal surface is installed under base (201) remove wheel (202), base (201) up end is provided with mounting bracket (204), motor (205) are installed to mounting bracket (204) inboard, mounting bracket (204) top is provided with smooth pole (206), smooth pole (206) one side is provided with lead screw (207), install lift seat (208) on lead screw (207).

4. A test bench for semiconductor performance testing according to claim 1, wherein: the tool box (102) is slidably mounted inside the workbench (101), and the detection panel (103) is mounted on the upper end face of the workbench (101) through bolts.

5. A test bench for semiconductor performance testing according to claim 1, wherein: the temperature scanner (107) is installed on the inner side of the support (106) through bolts, and a plurality of installation grooves for placing semiconductors are formed in the detection panel (103).

6. A test bench for semiconductor performance testing according to claim 2, wherein: the electric telescopic column (203) is installed on the upper end face of the base (201) through a bolt, and a brake pedal is arranged on the movable wheel (202).

7. A test bench for semiconductor performance testing according to claim 3, wherein: the motor (205) is connected with the lead screw (207) through a coupler, and the lifting seat (208) is connected with the sliding bar (206) in a sliding mode.